16.40 o5 p murmu
DESCRIPTION
Research 4: P MurmuTRANSCRIPT
P.P. Murmu
NZIP 2011 Wellington, New Zealand
Investigation of structural, electronic and magnetic properties of Gd implanted ZnO single crystals
GNS ScienceMacDiarmid Institute VUW
ZnO applications
GNS ScienceMacDiarmid Institute VUW
• II-VI compound semiconductor
• Direct band gap semiconductor, EB ~ 3.37eV
• Transparent conducting oxide
• Has n-type conductivity, due to zinc-interstitials and oxygen vacancies
• Availability of high quality bulk substrate (low defect densities) for homo-epitaxial film growth
• Suitable host material for spintronic applications ?
• ZnO based dilute magnetic semiconductors
c
a
Oxygen
ZincZnO properties
Spintronics cartoon courtesy to T. Jungwirth
GNS ScienceMacDiarmid Institute VUW
Magnetic ions Cation Anion
H. Toyosaki et al. Nat. Mater. 3, 221 (2004)
Dilute Magnetic Semiconductors (DMSs)
• Semiconductor doped with magnetic elements (e.g. GaAs:Mn, GaN:Mn, GaN:Gd, TiO2:Co)
• Applications: Magnetic RAM, Spin FET, Spin LED etc.
• Room temperature ferromagnetism
• Origin: Metallic clusters / secondary phases ??
• Highly sensitive to defects
Datta and Das, APL 56, 665 (1990)
GNS ScienceMacDiarmid Institute VUW
ZnO- Rare earth (RE) doping
• Large magnetic moments e.g. 7.94 μB for Gd
• Very high magnetic moment (4000 μB/Gd) in GaN:Gd*
• Aim: to investigate the electronic and magnetic properties of ZnO:Gd prepared by ion implantation
* Dhar et al. PRL 94, 037205 (2005)
Calculated and measured effective Bohr magneton for rare-earth ions
GNS ScienceMacDiarmid Institute VUW
GNS ion implanter – New Zealand unique facility
Implantation parameters:
Energy: up to 100 keV
Ions: 12C+, 13C+, 14N+, 15N+,
&
Vacuum: < 2x10-7 mbar
Gd depth profiles calculated with DYNAMIC-TRIM for Gd implanted at 40 keV into ZnO in the fluence range from 6.7x1014 to 3.0x1016 ions.cm-2
0 5 10 15 20 25 30
0
2
4
6
8
10
12
14
F=6.7x1014 Gd.cm-2
F=3.9x1015 Gd.cm-2
F=6.4x1015 Gd.cm-2
F=1.1x1016 Gd.cm-2
F=3.0x1016 Gd.cm-2
Gd
conc
entr
atio
n (a
t.%
)Depth (nm)
GNS ScienceMacDiarmid Institute VUW
Rutherford Backscattering spectrometry (RBS)
E. Rutherford, Philos. Mag. 6, vol. 21 (1911) p. 669-688
He++
He++
H. Geiger (left) and E. Rutherford (right)
Au-foil
"The making of the Rutherford documentary" by Dr John Campbell , 10.45 am Wed 19th Oct
GNS ScienceMacDiarmid Institute VUW
Elastic interaction: RBS, channeling, recoiling ions
Inelastic interaction: X-rays, visible-UV photons, Nuclear reaction
RBS: kinematic factor, K α masscross section, σ α yieldenergy loss, ΔE α depth
RBS and channeling: drastic reduction in backscattered particles
Rutherford Backscattering spectrometry (RBS)
Schematic illustration of RBS mechanism
High energy light ion interaction with target atoms
GNS ScienceMacDiarmid Institute VUW
200 300 400 500 600 700 800 900
Channel
0
20
40
60
80
Nor
malized
Yield
1.0 1.5 2.0
Energy (MeV)
F=3e16 Gd/cm2 implanted ZnORUMP simulation
O Zn Gd
RBS performed with 2 MeV He+
Rutherford Universal Manipulation Program (RUMP) used to retrieve the composition, depth profile etc.
For the 1x1016 Gd cm-2 and higher fluence implantation, preferential sputtering occurs
Leads to a slightly lower retained dose for the implantation at higher fluences
0.0 5.0x1015 1.0x1016 1.5x1016 2.0x1016 2.5x1016 3.0x1016 3.5x1016
0.0
5.0x1015
1.0x1016
1.5x1016
2.0x1016
2.5x1016
3.0x1016
3.5x1016
fluence vs. reatained dose
Ret
ain
ed d
ose
(
ion
s.cm
-2 )
Fluence ( ions.cm-2 )
Zn
Gd
O
surface
3 MeV Particle Accelerator at GNS Science, Lower Hutt
RBS spectrum and RUMP fittingFluence vs. retained dose
Rutherford Backscattering spectrometry (RBS)
GNS ScienceMacDiarmid Institute VUW
RBS-Channeling
Random and <0001>-aligned RBS spectra of 3.9x1015 Gd cm-2 implanted and annealed ZnO (magnified Gd peaks in inset)
100 200 300 400 500 600 7000
100
200
300
400
500
600
560 570 580 590 600 610 620 630 6400
5
10
15
20
25
Gd peaks
Yie
ld (
arb
.u.)
Channel No.
Random Channeled
O
Gd
Zn
Yie
ld (
arb
.u.)
Channel No.
Random Channeled
Zn
RBS/C along <0001>
Zn minimum yield (ZnXmin) of ~7% indicates the high crystalline quality of un-doped ZnO
For 3.9x1015 Gd.cm-2, ZnXmin in as implanted ZnO is ~ 27%, which suggests the implantation causes only moderate structural damages
Vacuum annealing at 650 oC, the Xmin for Zn goes down to ~ 22%, which implies the annealing helps to regain the crystalline quality
GNS ScienceMacDiarmid Institute VUW
RBS-Channeling
Angular scan around <0001> for 3.9x1015 Gd cm-2 (a) as-implanted and (b) annealed ZnO
Angular scans around <0001>
Zn and Gd scans followed same trend, suggests both subjected to similar disorders
Split between the scans implies some of Gd atoms at random sites
Using, GdZn= (1-GdXmin) / (1-ZnXmin), around 60% Gd atoms estimated to occupy the substitutional lattice sites
A small fraction of interstitial Gd atoms align with <0001> (a shadow-effect)
GdZn reduces to 47 % up on annealing, possibly due to the diffusion of Gd atoms
-3 -2 -1 0 1 2 30.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
No
rmal
ized
Yie
ld
Angle (deg.)
Zn Gd
(a)
-3 -2 -1 0 1 2 30.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1(b)
No
rmal
ized
Yie
ld
Angle (deg.)
Zn Gd
GNS ScienceMacDiarmid Institute VUW
Raman Spectroscopy
• Raman effect: inelastic scattering of light (provides information about vibrational modes in a material)
• Discovered by C.V. Raman in 1928
• E2(high) and E2(low) modes from O and Zn vibrations
• 575 cm-1 attributed to the A1(LO) mode of ZnO
• A1(LO) mode primarily observed due to implantation induced disorder
• also correlated to the structural defects such as oxygen vacancies (Vo) and zinc interstitials (Zni) or their complexes
C.V. Raman demonstrating his Nobel Prize (1930) winning spectrometer
100 200 300 400 500 600 700
0.00
0.05
0.10
0.15
0.20
0.25
0.30
E2(low
)
2E2(M
)
A1(L
O)
E2(h
igh)
(a)
(b)
(a) as-implanted
(b) 650 oC (c) unimplanted ZnO
Norm
aliz
ed inte
nsi
ty
Raman shift (cm-1)
(c)
Raman spectra of unimplanted, 3.9x1015 Gd cm-2 implanted and annealed ZnO
GNS ScienceMacDiarmid Institute VUW
SQUID results
• Diagmagnetic response observed in unimplanted and as-implanted ZnO
• Annealing enhanced the ferromagnetism in low fluence Gd implanted and annealed ZnO
• Ferromagnetism at room temperature !!
• FC curve shows combination of ferromagnetic and paramagnetic ordering
• Clustering or secondary phases ??
• Zero field-cooled (ZFC) magnetisation curve suggests contribution from super-paramagnetic particles
Hysteresis loop of 3.9x1015 Gd cm-2 implanted and annealed ZnO at 5 K & 300 K
-12 -9 -6 -3 0 3 6 9 12-4
-3
-2
-1
0
1
2
3
4
5 K 300 K
Mo
men
t (1
0-3 e
mu
/cm
3 )
Field (k Oe)
0 50 100 150 200 250 300 350 400
0.0
1.0x10-4
2.0x10-4
3.0x10-4
4.0x10-4
5.0x10-4
100 Oe
ZFC
Mo
men
t (e
mu
/cm
3 )
Temperature (K)
FC
FC and ZFC magnetisation curves of 3.9x1015 Gd cm-2
implanted and annealed ZnO at 100 Oe
GNS ScienceMacDiarmid Institute VUW
SQUID results
• For 3.0x1016 Gd cm-2 implanted and annealed ZnO very small ferromagnetic ordering (even at 5 K)
• Ferromagnetism decreases at higher fluences
• Ferromagnetic interaction depends on the ions separation, and can have ferromagnetic or antiferromagnetic coupling
• Antiferromagnetic interaction among Gd atoms at high concentration may be responsible
(b) FC and ZFC magnetisation curves of 3.0x1016 Gd cm-2 implanted and annealed ZnO
0 50 100 150 200 250 300 350 400
-9.0x10-5
-6.0x10-5
-3.0x10-5
0.0
3.0x10-5
6.0x10-5
9.0x10-5
100 Oe
ZFC
Mom
ent (e
mu /cm
3)
Temperature (K)
FC
-12000 -9000 -6000 -3000 0 3000 6000 9000 12000
-4.0x10-3
-3.0x10-3
-2.0x10-3
-1.0x10-3
0.0
1.0x10-3
2.0x10-3
3.0x10-3
4.0x10-3
3.9x1015 Gd/cm2
3.0x1016 Gd/cm2
Mo
men
t (e
mu
/cm
3 )
Field (Oe)
(a) Hysteresis loops of 3.9x1015 & 3.0x1016 Gd cm-2 implanted and annealed ZnO at 5K
GNS ScienceMacDiarmid Institute VUW
XANES results
• O K-edge (~ 538 eV) observed due to electronic transition from O 2p states to conduction band
• A pre-edge feature appears in ZnO thin film
• Usually assigned to intrinsic defects such as oxygen vacancies and zinc interstitials
• Gd atoms in 3+ state
1170 1180 1190 1200 1210 1220
0
2
4
6
8
Inte
nsi
ty (
arb
. u
.)
Energy (eV)
Gd-metal (ref.) pm-71: 0.007 Gd pm-84: 0.033 Gd
525 530 535 540 545 550 555 560 565 570
0
1
2
3
4
5 Si-607: as-dep ZnO film pm-103: as-rec. ZnO pm-71: 0.007 Gd pm-84: 0.033 Gd
Inte
nsi
ty (
arb
. u
.)
Energy (eV)
(a) O K-edge for as-deposited ZnO film, un-implanted and Gd-implanted ZnO single crystals
(b) Gd M-edge for Gd-metal and Gd-implanted ZnO single crystals
GNS ScienceMacDiarmid Institute VUW
Conclusion
• RBS channeling along <0001> show ~60% Gd occupation in Zn sub-lattices
• A small fraction of the ions may be at interstitialy shadowed region aligned with <0001>
• Radiation damages related A1(LO) peak observed in Gd implanted ZnO
• Ferromagnetic ordering at room temperature
• Moment decreases at higher temperatures
• FC/ZFC curves suggest presence of small clusters
• O K-edge shows intrinsic defect related pre-edge feature
• Gd valency: 3+
GNS ScienceMacDiarmid Institute VUW
• Ministry of Science and Innovation
• MacDiarmid scholarship
• GNS Science scholarship
• Australian synchrotron
Acknowledgement
Funding
Supervisors
• Dr A. Markwitz (GNS, New Zealand)
• Dr G.V.M. Williams (VUW, New Zealand)
• Dr S. Grenville (IRL, New Zealand)
• Dr S. Rubanov (University of Melbourne, Australia)
• Dr A. Suvorova (UWA, Australia)
Collaborators
• Dr B.J. Ruck (VUW, New Zealand)
• Dr J. Kennedy (GNS, New Zealand)
GNS ScienceMacDiarmid Institute VUW
GNS ScienceMacDiarmid Institute VUW
RBS and channeling
(a) Random (b) planar and (c) axial