2001 denver x-ray conference steamboat springs, colorado 50 years of progress & development
TRANSCRIPT
2001 Denver X-ray Conference
Steamboat Springs, Colorado
50 Years of Progress &
Development
50 Years of Progress &
Development
Sheraton Steamboat Resort and Conference Center
50th Annual Denver X-ray Conference
Steamboat Springs, Colorado
July 30 – August 3, 2001
346 Registrations
74% US26% non-US
Attendance Figures
Exhibit Figures
Exhibit Booths: 45Tabletops: 4
Exhibiting Companies: 37
Exhibitors: 200
15 Workshops
W-1 Cement Analysis (Broton/Anzelmo) W-2 Small Angle Scattering (Londono) W-3 Intro to XRF (Jenkins/Croke) W-4 Total Reflection (Zaitz/Wobrauschek) W-5 Absorption Analysis (Rosenfeld) W-6 Use of the Web as a Resource (Kottenhahn) W-7 Maintenance and Calibration of X-ray
Fluorescence Spectrometers (Croke/Jenkins)
Workshops (con’t)
W-8 Fundamental Parameters (Mantler) W-9 Industrial Rietveld Applications (Morton/Simon) W-10 Two-Dimensional XRD (Blanton/He) W-11 Neutron Diffraction of Polymers (Gardner) W-12 Specimen Preparation I (Broton/Anzelmo) W-13 Maintenance, Alignment & Standards (Noyan) W- 14 High Resolution XRD (Tanner) W-15 Specimen Preparation II (Broton/Anzelmo)
Plenary Session“Fifty Years of the Denver X-ray Conference”
Plenary Session“Fifty Years of the Denver X-ray Conference”
THE VERY EARLY YEARS OF THE DENVER X-RAY CONFERENCE W. Mueller, Colorado School of Mines, Golden, CO
THE DENVER X-RAY CONFERENCE: 1966 – 1979 J. B. Newkirk, Colorado Sports Equipment, Inc., Evergreen, CO
THE CHANGING YEARS: 1970 – 1980 C. Ruud, The Pennsylvania State University, University Park, PA
THE CHANGING YEARS: 1980 - 1997 P. K. Predecki, The University of Denver, Denver, CO
THE MODERN DENVER CONFERENCE R. Jenkins, Emeritus, ICDD, Newtown Square, PA
14 Sessions C-1 New Developments in XRD & XRF Instrumentation
(Commercial) (Buhrke) D-1 R.A. Young Rietveld Analysis (Stock/Snyder) D-2 Pharmaceuticals & Combinatorial (Kidd) F-1 John Criss Commemorative Session: Quantitative
XRF (Van Grieken/Gilfrich) C-2 Synchrotron Applications (Macrander) D-3 Industrial Applications – XRD (Chung) D-4 Polymers I: Multi-Probe Studies (Gardner/Murthy)
Sessions (con’t) F-2 Capillary Optics (Havrilla) C-3 Electron Beam (Goehner) D-5 Stress Analysis I (Goldsmith/Sasaki) D-6 Polymers II: 2DWAXS & SAXS Data Analysis / In Situ
Structure Development (Barton/Londono) F-3 TXRF (Zaitz) C-4 Microbeam Analysis (Janssens) D-7 Stress Analysis II (Goldsmith/Sasaki)
Awards Presented
Barrett Award
Paul Predecki presented the
to
David E. CoxEmeritus, Brookhaven National Laboratory
2001 Barrett Award
Jenkins Award
Bob Snyder
presented the
to
Ron JenkinsEmeritus, ICDD
2001 Jenkins Award
Hanawalt Award
Cam Hubbard presented the
to
Ray Goehner &
Joseph Michael Sandia National
Laboratory
Lecture: “Phase Identification Using Electron Backscatter Diffraction in the SEM: A Powerful Tool for
Materials Science”
Hanawalt Award
Distinguished Fellows Award
Julian Messick presented the
to
Ron Jenkins
ICDD Distinguished Fellows Award
Looking Ahead…
51st Annual Denver X-ray Conference– Colorado Springs, CO
– 29 July –2 August 2002, at the Antlers Adam’s Mark Hotel (Red Lion Hotel –overflow)
– Plenary Session: Applications of X-ray Analysis to Forensic Materials, chaired by David Rendle and Ron Jenkins
– Pick up your copy of the Call for Papers or see the DXC 2002 poster
Looking Ahead…
52nd Annual Denver X-ray Conference4-8 August 2003
Denver Tech Center Marriott, Denver, CO
Survey
Conducting a survey to better understand the impact that the choice of venue has on the conference attendees
Located on DXC website at http://www.dxcicdd.com/02/2002survey.htm
Tell us what you think!
Have an idea for a workshop or session?
Let us know! Send to [email protected]
The DXCOC plans the program in March/April of the year prior to the
conference.
