2010 process drift chodankar
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PQRI-FDA Workshop onProcess Drift
Nandkumar Chodankar (Ph D Tech)Group CEO Pharma Business
Excel Industries Ltd.
Mumbai, India
Process Drift in theManufacturing of APIs
PQRI FDA
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Main Discussions
Background –
Validation & Deviation, Cause - Effect
Drift-
Definition,
Cause of drift,
Categories of drift,
Multiple Effects of Drift
Monitoring and Controlling Drift
Examples from the API Industry
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Background: Prerequisites for theConsistent Process Validation
Validation should be about overall systemicintegrity.
For consistent product quality and output,the critical process parameters should beidentified during process development.
Critical process parameters may be defined asprocess step(s), process condition(s), test(s)
requirement(s) or other relevant parameter(s) oritem(s) that must be controlled withinpredetermined criteria (range) to ensure that theproduct (API) meets the defined specs.
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Prerequisites for theProcess Validation
Qualification of the equipment & calibrationof the monitoring instruments – prior tovalidation.Qualification of the critical utility services
like water, steam, power, air, nitrogen, etc.Equipment cleaning process (validation)and sanitization.
All the documents relating to the processdevelopment, justification, critical stepsand parameters and relevant SOPs.Trained Personnel (Unit Process &Operations).
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Critical Process Parameters
DoE is important for developing robustprocess and to identify the dependent vs.independent factors/parameters (riskprobability).
If the process capability is properlydelineated, the process should consistentlystay within the defined limits of its criticalprocess parameters and product specs.
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Validated RangeDefined Limits
The variables due to chance cause usuallyremain within a defined narrow validatedrange and are controllable.
As long as these parameters vary withinthe normal or expected manner stablepattern of chance of variations develops.(normal curve or bell-shaped jar curve)
For example Temp. 90 ±2⁰C
+
-90⁰C 92⁰C88⁰C84⁰C 96⁰C
Target
T i m e
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Validated Range
Alert Range
Worst Case (?)
Parameter – Establishing theRange (Design Space?)
Target
+-
- +
90⁰C 92⁰C88⁰C
87⁰C
85⁰C
93⁰C
95⁰C
(90⁰C ±2)
(90⁰C ±3)
(90⁰C ±5)
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Working Range
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Validation rangeBatch
Number
Temp
C
Rate of
Add.
l/min
React.
Time-
min.
Molar
Prop.
1 mole:
Impurities % conve
rsion
%
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Deviation - Chance Cause
The possibilities of variations in any process aredue to the chance cause .
1. Quality of input material (specification range)
2. The equipment & instruments used (qualified)
3. The method of processing (unit operations)
4. The manufacturing conditions (parameters)
5. The method of testing (validated)6. The personnel involved (trained)
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Assignable Vs.Non-assignable
Assignable cause: The variation can betraced to a known cause, such as
“negligence” or not adhering to an
approved method, not following approvedparameter, etc.
Process is in “a state of control” when
assignable cause have been eliminated andonly chance cause of variation is present.
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Non-assignable cause A Concern
Non-assignable cause is a variation thatcannot be traced to a known cause.
When non-assignable cause is present in
addition to the chance cause the variationwill be excessive, and the process will beout of control . We need to reduce the non-assignable cause to control the process.
Non-assignable cause is the result ofincomplete study of the processrequirements.
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Drift – Definition The gradual departure from an intended course
due to external influences - over time. A Ship or plane may drift in its course due to
unexpected circumstances.
Trending is one of the methodologies to trackdrift
P a r a m e t e r
Working Upper Range
Time (Batch No. 1 Data)
Validated Upper Range
Working Lower Range
Validated Lower Range
Alert
Alert
Target
Target
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Process Drift & its Impact
“Process Drift” is the change of “NormalProcess Behavior” over time. This isobserved in most of the manufacturingprocesses.
Process drift may have a negative impact on
Quality of the product, yield, cost,reputation, etc.
Appropriate strategies must beimplemented to detect /monitor andaddress the process drift.
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Risk Analysis – What Can Go wrong?
After Validation of the critical processparameters, one needs to continuously reviewthe trend of the batches for any drift (process
parameters vis-à-vis quality parameters).The risk of any such drift on the quality
parameters of the drug product, like impurityprofile, efficacy and safety - needs to be
evaluated.Use of statistical methods, DoE, determining
probability factors may be the approaches.
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Risk Analysis – What Can Go wrong?
Risk analysis by asking questions.
1. What can go wrong?
2. If something goes wrong is there a way toknow that something has gone wrong, andbring the system back in compliance?
3. If there are no means to monitor or identify
this, what will be the effect on the quality ofthe product and the patient?
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Strategy to Monitor & Control
The methodology to detect the drift and itseffect on the quality parameters is mostimportant in the lifecycle of the product .
Use of PAT is good to control drift and eliminate
manual adjustments or process tuning?
This will depend on the type of the drift that isexpected (or experienced during trend analysis).
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What could be the causeof Process Drift?
Incomplete process development. Aging of the facility and the equipment.
Process pipeline scaling / contamination.
Out of calibration of the monitoringinstruments (Measuring- accuracy /sensitivity)
Fluctuations in the process parameters.
Changes in the raw material quality.
Indirect impact of the utilities & other factors.
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Process Parameter Drift
Working Upper Range
Validated Upper Range
Working Lower Range
Validated Lower Range
Alert
Alert
Time
T e m p e
r a t u r e
R a t e o f A d d i t i o n
R e f l u x R a t e
Target
Target
Target
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Multiple Parameters vs. Time
TargetWorking Upper Range
Validated Upper Range
Working Lower Range
Validated Lower Range
Alert
Alert
Multivariate Drift Effect
Time
P a r a
m e t e r s
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Can we categorize Drifts?
1. Changing conditions can cause cyclical drift
Lack of preventive maintenance can affect theequipment and instruments used.
Recycling of catalyst / solvents.
Seasonal changes.2. Changes in the equipment (equivalent, new)
or raw material specifications (new suppliers).
3. Irregular drifts due to changes in thepersonnel, SOPs, equipment wear & tear, etc.
4. Linear Drift is seen for catalyst/solvent recycle
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li i l if
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Cyclic, Linear, Irregular Drift Pattern
Time
Target
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TargetLinear Drift Pattern
Cyclic Drift Pattern
Target
Target
Irregular Drift Pattern
Comparison of Batches Trending
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Comparison of Batches - Trending
Batch no. 1 no. 2 no. 3 no. 4 no. 5 no. 6 no. 7 no. 8
T e m p e r a t u r e
R a t e o f A d
d i t i o n
R e f l u x R a
t e
Target
Target
Target
no. 9
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Combined /MultipleImpact of Drift
Many process variables mentioned maychange simultaneously and make itdifficult to evaluate their combined impact
on the quality. We need to generate dataof such drifts and their effect on thequality parameters (Risk Evaluation).
It is important to appropriately detect andclassify the type of drift so that correctivemeasures can be considered to counter /eliminate its effect.
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Multivariate Effect Because of the multivariate process behavior
“Univariate based statistical process control (SPC)technology” is less useful to appropriately detectand classify the drift.
Some of the drift impact can be minimized by
1. Adequate, meaningful and appropriate trending
2. Shorter cycles of preventive maintenance.
3. Detecting & correcting drifts quickly and
minimizing the risk of defects in the quality.4. During process development, besides critical
parameters, reviewing other variables which may
have indirect combined effect on the quality.Dec. 1st 2010 24/38Nandkumar Chodankar (Ph D Tech)
C bi d Eff t Q lit
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Combined Effect on Quality Aspect- Impurity Profile
0.2%
0.10%
0.05%0.025%
0.15%
Batch no. 1 no. 2 no. 3 no. 4 no. 5 no. 6 no. 7 no. 8 no. 9
Impurity -A Impurity -B Impurity -C Impurity –D- Unidentified
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Batch no. 1 no. 2 no. 3 no. 4 no. 5 no. 6 no. 7 no. 8
T e m p e r a t u r
e
R a t e o f A d d i
t i o n
R e f l u x R a t e
Target
no. 9
D l t f iti l
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Identify the following:1.Control Objective(s)
2.Input Variables: Classify as
a) Manipulated or b) Disturbance variablesInput may change continuously or at discreteintervals of time.
3.Output Variables: Classify asa) Measured or b) unmeasured variablesMeasurement may be continuous or at discrete intervalsof time
Development of criticalstrategy for process modeling
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D l t f iti l
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4. Constraints: Classify asa) Hard or b) Soft
5. Operating Characterization: Classify as
a) Continuous; b) Batch; or c) Semi-continuous6. Safety, Environmental and Economic
considerations
7. Control Structure: The controllers can be Feed-back or
Feed-forward in nature.
Development of criticalstrategy for process modeling
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Development of critical
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Development of criticalstrategy for process modeling
Process
Manipulated Inputs
Disturbance Inputs
Measured Outputs
Unmeasured Outputs
b) Control Representation
Process
Manipulated Inputs Measured Outputs
Unmeasured OutputsDisturbance Inputs
Controller
a) Input/Output Representation
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M it i &
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Monitoring &Control Strategy
PID Controller
PLC: Programmable Logic Controller, amicroprocessor-based electronic device for
implementing control algorithms.Time Domain
Ziegler-Nichols Tuning
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Control Categories
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Control CategoriesOperating Modes
Continuous
Batch
Semi-continuous
Operating Conditions
Start-up
Study state operation
Controlled shut down & Emergency shut down
Monitoring Maintenance
Optimization
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Control Design
Operator controlled
Automatic Control
Alarms
Interlocks
Data logging
Automatic Tuning
SequencingProgrammable Logic Control
Field Monitoring
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Study State Operation
System should be reliable with minimalsupervision
System should make “in-specification”
product routinelyMonitored by operator with a minimum
number of variables
Control loop interaction is automatic
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PAT: On-line Control of Drift A few of the parameters can be monitored and
controlled using PAT - online instrumentation(Cause effect- control). In API Manufacturingplants many of the utilities, flow rates, etc., arecontrolled using SCADA /PLC which can minimize
drifts in the set process parameters. Crystal growth, shape of crystals, polymorphs can
be monitored and controlled using moderninstruments like NIR, Raman Spectra, X-rayFluorometers, etc.
However, a time lag between testing andmonitoring signal generation can result in a drift.
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Ph t Chl i ti Pl t
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Photo Chlorination Plant
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Example 1- Impurity Profile DriftProduct 1-Two solvents system
Unidentified impurity (A)
I m p u r i t y –
( A )
%
Target 0.005
Working Upper Range
Batch Numbers
(Accepted Upper Range)
Detectable Lower Range
NMT 0.1%
0.02% Alert0.04%
0.01%
0.010.02 0.04
0.060.08
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Example 1- Impurity Profile Drift
Product 1; Unidentified impurity (A) - NMT 0.1%
Two solvents system Critical Parameters:
Carbon treatment (before and after treatment results)
Distillation temperature & Rate of distillation andvolume distilled
Final volume and content of each / ratio
RPM & Temperature and rate of cooling
Final temperature range before filtration Filtration lots, washing, etc.
Impurity was within the acceptable limit but wasdrifting towards 0.1%
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S
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SummaryMost important is to have a robust process which is
possible by perfecting DoE Using Quality by Design,
Risk analysis,
PAT.
Batch-to-batch meaningful “Trend Analysis” to identify &monitor drift can help in taking corrective measures tominimize the drift effect on the quality. This can lead tocontinuous “State of Control” in the product lifecycle
Drift may be monitored and controlled by using moderninstruments like NIR, Raman Spectra, X-ray Fluorometer, withrapid testing approach.
However, combined effect, a time lag between signal/ testingand controls can still result in drift.
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Thank [email protected]
mailto:[email protected]:[email protected]:[email protected]:[email protected]