6 bjt basic properties
TRANSCRIPT
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It is clear that current lE flows into theemitter of a properly biased p-n-p
transistor and that lc flows out at the
collector, since the direction of hole flow isfrom emitter to collector.
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However, the base current IB requires abit more thought. In a good transistor the
base current will be very small since IE is
essentially hole current, and the collectedhole current Ic is almost equal to IE.
There must be some base current,however, due to requirements of electron
flow into the n-type base region .
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We can account for lBphysically by threedominant mechanisms.
(a) There must be some recombination ofinjected holes with electrons in the base,
even with Wb
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(b) Some electrons will be injected from nto p in the forward-biased emitter junction,
even if the emitter is heavily doped
compared to the base. These electronsmust also be supplied by IB.
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(c) Some electrons are swept into thebase at the reverse-biased collector
junction due to thermal generation in the
collector. This small current reduces IB bysupplying electrons to the base
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BJT FABRICATION
The first transistor invented by Bardeenand Brattain in 1947 was thepoint contact
transistor. In this device two sharp metal
wires, or "cat's whiskers," formed an"emitter" of carriers and a "collector" of
carriers.
These wires were simply pressed onto a
slab of Ge which provided a "base" or
mechanical support, through which the
injected carriers flowed
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Let us review a simplified version of howto make a double polysilicon, self-aligned
n-p-n Si BJT. This is the most commonly
used, state-of-the-art technique for makingBJTs for use in an IC
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MINORITY CARRIER DISTRIBUTIONS AND
TERMINALCURRENTS
we examine the operation of a BJT inmore detail. We begin our analysis by
applying the techniques of previous
chapters to the problem of hole injectioninto a narrow n-type base region.
The mathematics is very similar to thatused in the problem of the narrow base
diode.
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We shall at first simplify the calculations bymaking several assumptions:
1. Holes diffuse from emitter to collector;
drift is negligible in the base region.
2. The emitter current is made up entirely
of holes; the emitter injection efficiency is= 1.
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3. The collector saturation current isnegligible.
4. The active part of the base and the two
junctions are of uniform cross sectionalarea A; current flow in the base is
essentially one-dimensional from emitter
to collector.
5. All currents and voltages are steady
state.
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Solution of the Diffusion Equation in the Base
Region
Since the injected holes are assumed toflow from emitter to collector by diffusion,
we can evaluate the currents crossing the
two junctions. Neglecting recombination in the two
depletion regions, the hole current
entering the base at the emitter junction is
the current IE, and the hole current leaving
the base at the collector is Ic.
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We shall consider the simplified geometryof Fig. a, in which the base width is Wb
between the two depletion regions, and
the uniform cross-sectional area is A.
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In equilibrium, the Fermi level is flat, andthe band diagram corresponds to that for
two back-to-back p-n junctions.
But, for a forward-biased emitter and a
reverse-biased collector (normal active
mode), the Fermi level splits up into quasi-Fermi levels, as shown in fig b
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The barrier at the emitter-base junction isreduced by the forward bias, and that at
the collector-base junction is increased by
the reverse bias.
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The excess hole concentration at the edgeof the emitter depletion region pEand the
corresponding concentration on the
collector side of the base pc
are
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If the emitter junction is strongly forwardbiased (VEB>> kTlq) and the collector
junction is strongly reverse biased (VCB
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We can solve for the excess holeconcentration as a function of distance inthe base p(xn) by using the proper
boundary conditions in the diffusionequation
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The solution is very similar to that of thenarrow base diode problem.
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The excess hole distribution is given by
E l ti f th T i l
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Evaluation of the Terminal
Currents
Having solved for the excess holedistribution in the base region, we can
evaluate the emitter and collector currents
from the gradient of the hole concentration
at each depletion region edge
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Similarly, if we neglect the electronscrossing from collector to base in the
collector reverse saturation current, Ic is
made up entirely of holes entering the
collector depletion region from the base.
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Evaluating Eq , xn= Wbwe have thecollector current
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When the parameters C1 and C2 are substituted from the emitter
and collector currents take a form that is most easily written in terms of
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Now we can obtain the value of IBby acurrent summation, noting that the sum of
the base and collector currents leaving the
device must equal the emitter current
entering. If IE= IEpfor =1,
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Current Transfer Ratio
The value of lE calculated thus far in thissection is more properly designated IEp,
since we have assumed that = 1 (the
emitter current due entirely to hole
injection).
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Actually, there is always some electroninjection across the forward-biased emitter
junction in a real transistor, and this effect
is important in calculating the current
transfer ratio.
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The emitter injection efficiency of a p-n-ptransistor can be written in terms of the
emitter and base properties:
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In this equation we use superscripts toindicate which side of the emitter-base
junction is referred to.
The base transport factor B is
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GENERALIZED BIASING
The terminal currents of the transistor, ifthe device geometry and other factors are
consistent with the assumptions.
Real transistors may deviate from these
approximations.
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The collector and emitter junctions maydiffer in area, saturation current, and other
parameters, so that the proper description
of the terminal currents may be more
complicated.
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if the roles of emitter and collector arereversed, these equations predict that the
behavior of the transistor is symmetrical.
Real transistors, on the other hand, are
generally not symmetrical between emitter
and collector.
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This is a particularly importantconsideration when the transistor is not
biased in the usual way.
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Normal biasing (sometimes called thenormal active mode), in which the emitter
junction is forward biased and the collector
is reverse biased.
In some applications, particularly in
switching, this normal biasing rule isviolated.
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We shall develop a generalized approachwhich accounts for transistor operation in
terms of a coupled-diode model, valid for
all combinations of emitter and collector
bias.
This model involves four measurableparameters that can be related to the
geometry and material properties of the
device.
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The Coupled-Diode Model
If the collector junction of a transistor isforward biased, we cannot neglect pc;
instead, we must use a more general hole
distribution in the base region.
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Figure illustrates a situation in which the emitter and
collector junctions are both forward biased, so that pE
andpc are positive numbers.
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One component Fig. accounts for the holes injected by
the emitter and collected by the collector
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The component of the hole distribution illustrated by Fig.
results in currents IEI and ICI which describe injection in
the inverted mode of injection from collector to emitter
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For symmetrical transistor
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These relations were derived by J. J.Ebers and J. L. Moll and are referred to as
the Ebers-Moll equations.
Although we shall not prove it here, it is
possible to show by reciprocity argumentsthat NIES= IICS
even for nonsymmetrical transistors.
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An interesting feature of the Ebers-Mollequations is that IEand Ic are described by
terms resembling diode relations (IEN and
ICI), plus terms which provide coupling
between the properties of the emitter and
collector.
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The Ebers-Moll equations in terms of emitter and collector current
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BJT F b i ti
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ECE 663
BJT Fabrication
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ECE 663
PNP BJT Electrostatics
El
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ECE 663
PNP BJT Electrostatics
NPN Transistor Band
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ECE 663
NPN Transistor BandDiagram: Equilibrium
PNP Transistor Active Bias
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ECE 663
PNP Transistor Active BiasMode
Most holesdiffuse tocollector
Large injectionof Holes
Collector Fields drive holesfar away where they cant
return thermionically
Few recombinein the base
VEB> 0
VCB> 0
PNP Transistor Active Bias
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ECE 663
PNP Transistor Active BiasMode
Most holesdiffuse tocollector
Large injectionof Holes
Collector Fields drive holesfar away where they cant
return thermionically
Few recombinein the base
VEB> 0
VCB> 0
Forward Active minority carrier distribution
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ECE 663
P+ N P
nE(x)
nE0
pB0
pB(x)
nC0
nC(x)
y
PNP Ph si l C nts
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PNP Physical Currents