6 bjt basic properties

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    It is clear that current lE flows into theemitter of a properly biased p-n-p

    transistor and that lc flows out at the

    collector, since the direction of hole flow isfrom emitter to collector.

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    However, the base current IB requires abit more thought. In a good transistor the

    base current will be very small since IE is

    essentially hole current, and the collectedhole current Ic is almost equal to IE.

    There must be some base current,however, due to requirements of electron

    flow into the n-type base region .

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    We can account for lBphysically by threedominant mechanisms.

    (a) There must be some recombination ofinjected holes with electrons in the base,

    even with Wb

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    (b) Some electrons will be injected from nto p in the forward-biased emitter junction,

    even if the emitter is heavily doped

    compared to the base. These electronsmust also be supplied by IB.

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    (c) Some electrons are swept into thebase at the reverse-biased collector

    junction due to thermal generation in the

    collector. This small current reduces IB bysupplying electrons to the base

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    BJT FABRICATION

    The first transistor invented by Bardeenand Brattain in 1947 was thepoint contact

    transistor. In this device two sharp metal

    wires, or "cat's whiskers," formed an"emitter" of carriers and a "collector" of

    carriers.

    These wires were simply pressed onto a

    slab of Ge which provided a "base" or

    mechanical support, through which the

    injected carriers flowed

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    Let us review a simplified version of howto make a double polysilicon, self-aligned

    n-p-n Si BJT. This is the most commonly

    used, state-of-the-art technique for makingBJTs for use in an IC

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    MINORITY CARRIER DISTRIBUTIONS AND

    TERMINALCURRENTS

    we examine the operation of a BJT inmore detail. We begin our analysis by

    applying the techniques of previous

    chapters to the problem of hole injectioninto a narrow n-type base region.

    The mathematics is very similar to thatused in the problem of the narrow base

    diode.

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    We shall at first simplify the calculations bymaking several assumptions:

    1. Holes diffuse from emitter to collector;

    drift is negligible in the base region.

    2. The emitter current is made up entirely

    of holes; the emitter injection efficiency is= 1.

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    3. The collector saturation current isnegligible.

    4. The active part of the base and the two

    junctions are of uniform cross sectionalarea A; current flow in the base is

    essentially one-dimensional from emitter

    to collector.

    5. All currents and voltages are steady

    state.

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    Solution of the Diffusion Equation in the Base

    Region

    Since the injected holes are assumed toflow from emitter to collector by diffusion,

    we can evaluate the currents crossing the

    two junctions. Neglecting recombination in the two

    depletion regions, the hole current

    entering the base at the emitter junction is

    the current IE, and the hole current leaving

    the base at the collector is Ic.

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    We shall consider the simplified geometryof Fig. a, in which the base width is Wb

    between the two depletion regions, and

    the uniform cross-sectional area is A.

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    In equilibrium, the Fermi level is flat, andthe band diagram corresponds to that for

    two back-to-back p-n junctions.

    But, for a forward-biased emitter and a

    reverse-biased collector (normal active

    mode), the Fermi level splits up into quasi-Fermi levels, as shown in fig b

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    The barrier at the emitter-base junction isreduced by the forward bias, and that at

    the collector-base junction is increased by

    the reverse bias.

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    The excess hole concentration at the edgeof the emitter depletion region pEand the

    corresponding concentration on the

    collector side of the base pc

    are

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    If the emitter junction is strongly forwardbiased (VEB>> kTlq) and the collector

    junction is strongly reverse biased (VCB

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    We can solve for the excess holeconcentration as a function of distance inthe base p(xn) by using the proper

    boundary conditions in the diffusionequation

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    The solution is very similar to that of thenarrow base diode problem.

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    The excess hole distribution is given by

    E l ti f th T i l

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    Evaluation of the Terminal

    Currents

    Having solved for the excess holedistribution in the base region, we can

    evaluate the emitter and collector currents

    from the gradient of the hole concentration

    at each depletion region edge

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    Similarly, if we neglect the electronscrossing from collector to base in the

    collector reverse saturation current, Ic is

    made up entirely of holes entering the

    collector depletion region from the base.

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    Evaluating Eq , xn= Wbwe have thecollector current

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    When the parameters C1 and C2 are substituted from the emitter

    and collector currents take a form that is most easily written in terms of

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    Now we can obtain the value of IBby acurrent summation, noting that the sum of

    the base and collector currents leaving the

    device must equal the emitter current

    entering. If IE= IEpfor =1,

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    Current Transfer Ratio

    The value of lE calculated thus far in thissection is more properly designated IEp,

    since we have assumed that = 1 (the

    emitter current due entirely to hole

    injection).

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    Actually, there is always some electroninjection across the forward-biased emitter

    junction in a real transistor, and this effect

    is important in calculating the current

    transfer ratio.

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    The emitter injection efficiency of a p-n-ptransistor can be written in terms of the

    emitter and base properties:

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    In this equation we use superscripts toindicate which side of the emitter-base

    junction is referred to.

    The base transport factor B is

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    GENERALIZED BIASING

    The terminal currents of the transistor, ifthe device geometry and other factors are

    consistent with the assumptions.

    Real transistors may deviate from these

    approximations.

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    The collector and emitter junctions maydiffer in area, saturation current, and other

    parameters, so that the proper description

    of the terminal currents may be more

    complicated.

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    if the roles of emitter and collector arereversed, these equations predict that the

    behavior of the transistor is symmetrical.

    Real transistors, on the other hand, are

    generally not symmetrical between emitter

    and collector.

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    This is a particularly importantconsideration when the transistor is not

    biased in the usual way.

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    Normal biasing (sometimes called thenormal active mode), in which the emitter

    junction is forward biased and the collector

    is reverse biased.

    In some applications, particularly in

    switching, this normal biasing rule isviolated.

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    We shall develop a generalized approachwhich accounts for transistor operation in

    terms of a coupled-diode model, valid for

    all combinations of emitter and collector

    bias.

    This model involves four measurableparameters that can be related to the

    geometry and material properties of the

    device.

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    The Coupled-Diode Model

    If the collector junction of a transistor isforward biased, we cannot neglect pc;

    instead, we must use a more general hole

    distribution in the base region.

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    Figure illustrates a situation in which the emitter and

    collector junctions are both forward biased, so that pE

    andpc are positive numbers.

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    One component Fig. accounts for the holes injected by

    the emitter and collected by the collector

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    The component of the hole distribution illustrated by Fig.

    results in currents IEI and ICI which describe injection in

    the inverted mode of injection from collector to emitter

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    For symmetrical transistor

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    These relations were derived by J. J.Ebers and J. L. Moll and are referred to as

    the Ebers-Moll equations.

    Although we shall not prove it here, it is

    possible to show by reciprocity argumentsthat NIES= IICS

    even for nonsymmetrical transistors.

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    An interesting feature of the Ebers-Mollequations is that IEand Ic are described by

    terms resembling diode relations (IEN and

    ICI), plus terms which provide coupling

    between the properties of the emitter and

    collector.

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    The Ebers-Moll equations in terms of emitter and collector current

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    BJT F b i ti

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    ECE 663

    BJT Fabrication

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    ECE 663

    PNP BJT Electrostatics

    El

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    ECE 663

    PNP BJT Electrostatics

    NPN Transistor Band

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    ECE 663

    NPN Transistor BandDiagram: Equilibrium

    PNP Transistor Active Bias

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    ECE 663

    PNP Transistor Active BiasMode

    Most holesdiffuse tocollector

    Large injectionof Holes

    Collector Fields drive holesfar away where they cant

    return thermionically

    Few recombinein the base

    VEB> 0

    VCB> 0

    PNP Transistor Active Bias

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    ECE 663

    PNP Transistor Active BiasMode

    Most holesdiffuse tocollector

    Large injectionof Holes

    Collector Fields drive holesfar away where they cant

    return thermionically

    Few recombinein the base

    VEB> 0

    VCB> 0

    Forward Active minority carrier distribution

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    ECE 663

    P+ N P

    nE(x)

    nE0

    pB0

    pB(x)

    nC0

    nC(x)

    y

    PNP Ph si l C nts

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    PNP Physical Currents