a new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy
DESCRIPTION
A faster method for assessing electrolytic capacitor reliabilityTRANSCRIPT
1 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
A New Method for Testing
Electrolytic Capacitors to Compare
Life Expectancy 2013 IMAPS Device Packaging Conference
March 11-13, 2014
Stephani Gulbrandsen1, Ken Cartmill2, Joelle Arnold1,
Nicholas Kirsch1, Greg Caswell1
1 DfR Solutions, LLC – Beltsville, MD USA
301-474-0607 2LED Roadway Lighting – Halifax, NS Canada
877-533-5755
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001759
2 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001760
3 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001761
4 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Introduction
Al ECap 1
Al ECap 2
Datasheet lifetime
Test lifetime
Datasheet lifetime
Test lifetime
Time (hours)
Traditional life testing of Al ECaps indicates test lifetime can be slightly less
than or 2-3x greater than datasheet lifetime.
Industrial customer
communication interface
PCBA from Monico Inc.
Digital media player PCBA
from Shenzhen Sinetech
Electronic Co Ltd.
Automotive asset tracking PCBA
from Theta Engineering Inc.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001762
5 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Construction
Internal construction of an Al ECap with
equivalent circuit from Nippon Chemi-Con.
Different lead lengths distinguish
the anode (long) and the cathode
(short) leads.
The body consists
of an Al can
encased with a
plastic sleeve.
CT scan showing the
internal windings.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001763
6 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Construction
Non-hermetic seal between
bung and can allows for
evaporation of electrolyte
during operation.
A rubber bung
seals the Al can.
CT scan showing the
crimped seal
between the can
and the bung.
Smaller capacitors have
etched vents at can top.
These are designed so that
in the event of a failure,
leaking electrolyte is
directed away from the PCB.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001764
7 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Failure Criteria
Capacitance Change Within +/- 20% of initial value
Dissipation Factor Not more than 200% of the specified value
Leakage Current Initial specific value or less
Failure criteria defined in manufacturer datasheets.
Dissipation factor is proportional to equivalent
series resistance (ESR), so >200% increase in ESR is
classified as failed.
Increase in
leakage current
Increase in dissipation
factor (ESR);
Decrease in
capacitance
Detailed internal construction
of an Al ECap from EPCOS.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001765
8 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Failure Criteria
Capacitance Change Within +/- 20% of initial value
Dissipation Factor Not more than 200% of the specified value
Leakage Current Initial specific value or less
Failure criteria defined in manufacturer datasheets.
Dissipation factor is proportional to equivalent
series resistance (ESR), so >200% increase in ESR is
classified as failed.
Increase in
leakage current
Increase in dissipation
factor (ESR);
Decrease in
capacitance
Detailed internal construction
of an Al ECap from EPCOS.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001766
9 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Ripple Current
Rip
ple
Cur
rent
Lower Frequency
Rip
ple
Cur
rent
Lower frequencies allow the
capacitor to fully charge and
discharge.
Higher frequencies do not
allow the capacitor to fully
charge and discharge.
Larger amplitude and larger applied ripple currents
induce greater internal temperature rise.
Ripple Current
Tem
pera
ture
Higher Frequency
Rip
ple
Cur
rent
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001767
10 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Aluminum Electrolytic Capacitors – Wear-Out
Apply ripple
and bias
e-
e-
e-
e-
Heating of the capacitor
from applied ripple
current causes
evaporation of the
electrolyte.
Internal pressure increase
from electrolyte
evaporation facilitates
electrolyte egress
between the rubber bung
and Al case.
PCB PCB
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001768
11 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001769
12 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Apply rated
ripple and bias
at rated
temperature.
Oven and
ripple current
heating causes
electrolyte
evaporation.
Turn off
electricity and
cool to room
temperature.
Life Test – Traditional (& Accelerated: Rate of Weight Loss)
e-
e-
Did ESR have a
>200%
increase from
the initial
value?
No. Continue
testing.
Yes. Testing
is complete.
e-
e-
Weight: 1.432 g
Weigh.
Electrical
characterization.
PCB PCB PCB
Measure ESR
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001770
13 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Life Test – Trends in Traditional Data
Weig
ht L
oss
Time (hours) 4000 2000 3000 1000
Time (hours) 4000 2000 3000 1000
% Inc
rease
ESR
200%
400%
600%
800%
Variable Impact on Rate
of Weight Loss
Ambient temperature
Applied ripple current
Heat dissipation
Crimp between bung and can
Linear throughout entire test
lifetime of an Al ECap population. Exponential behavior that is relatively
constant until approach time to failure.
Variable Impact on Critical
Weight Loss
Electrolyte stability
Initial ESR measurement
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001771
14 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Puncture a hole
in the
capacitor.
Life Test– Accelerated: Critical Weight Loss
Did ESR have a
>200%
increase from
the initial
value?
No. Continue
testing.
Yes. Testing
is complete.
Weigh.
Electrical
characterization.
Weight: 1.432 g
Oven heating
causes
electrolyte
evaporation.
Turn off heat
and cool to
room
temperature.
Measure ESR
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001772
15 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
1. Critical weight loss at 200% increase in ESR is calculated
using the ESR-Weight Loss curve
2. Rate of weight loss is extrapolated to the critical weight
loss and the corresponding time is recorded as the
accelerated test lifetime
Life Test– Accelerated Calculations
W
eig
ht L
oss
Time (hours) 4000 2000 3000 1000
Weight Loss
% Inc
rease
ESR
200%
400%
600%
800%
Critical weight loss
Critical weight loss
Accelerated test lifetime
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001773
16 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Life Test – Accelerated Wear-Out Failure Mode
As-received
Dried out, off
white paper
indicative of
electrolyte
evaporation.
Grey paper
indicative of
electrolyte
saturation. Accelerated test
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001774
17 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Life Test – Traditional vs. Accelerated
Accelerated test time Al ECap 1
Al ECap 2
Traditional test time
Time (hours)
Al ECap 3
Accelerated test time
Traditional test time
Accelerated test time
Traditional test time
Applied Test Conditions*
Traditional (T) Accelerated (A)
Ripple Current (I) IT = IR 0 < IA ≤ IR
Bias Voltage (V) VT = VR 0 < VA ≤ VR
Temperature (T) TT = TR TA = TR
* Datasheet rating (R). All ripple applied at 120 Hz.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001775
18 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001776
19 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
o The accelerated test approached was used to compare the behavior of the following two pairs of Al ECaps.
Accelerated Life Test – Conditions
Supplier Capacitance
(mF)
Size
(mm)
Rated
Lifetime
(hrs)
Voltage
(V)
Test
Voltage
(V)
Rated
Ripple
Current
(mA RMS)
Test
Ripple
Current*
(mA RMS)
A 68 18 x 31.5 10,000 450 225 1575 300
B 68 18 x 40 >15,000 450 225 1517 300
C 2.2 10 x 20 10,175 450 225 43 20
D 2.2 10 x 20 5,000 450 225 29 15
* Ripple applied at 120 Hz.
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001777
20 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
o Supplier ARate of Weight Loss ≈ ½ Supplier BRate of Weight Loss
o Supplier A capacitors have a better seal between the can and bung
Accelerated Life Test – Suppliers A & B Rate of Weight Loss
450 V, 68 mF
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001778
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Accelerated Life Test – Suppliers A & B Critical Weight Loss
450 V, 68 mF
o Supplier ACritical Weight Loss ≈ Supplier BCritical Weight Loss
o Chemical stability of Supplier A and Supplier B electrolyte is comparable
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
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22 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
o Accelerated life test results indicate that the Supplier A Al
ECap is more reliable than Supplier B
o This is opposite of what the datasheet lifetimes suggest
Accelerated Life Test – Suppliers A & B Comparison
Supplier Minimum Accelerated
Lifetime (hours)
Maximum Accelerated
Lifetime (hours)
Datasheet
Lifetime (hours)
A 21,130 29,140 10,000
B 12,540 16,030 >15,000
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001780
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Accelerated Life Test – Suppliers C & D Rate of Weight Loss
450 V, 2.2 mF
o Supplier CRate of Weight Loss ≈ 2 Supplier DRate of Weight Loss
o Supplier C capacitors have a worse seal between the Al can and bung
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001781
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Accelerated Life Test – Suppliers C & D Critical Weight Loss
450 V, 2.2 mF
o Supplier CCritical Weight Loss ≈ 2.5 Supplier DCritical Weight Loss
o Supplier C capacitors have a more chemically stable electrolyte
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001782
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Supplier Minimum Accelerated
Lifetime (hours)
Maximum Accelerated
Lifetime (hours)
Datasheet
Lifetime (hours)
C 12,010 17,170 10,175
D 7,910 11,160 5,000
Accelerated Life Test – Suppliers C & D Comparison
o Accelerated life test results indicate that the Supplier C Al
ECap is more reliable than Supplier D
o This supports what the datasheet lifetimes suggest
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001783
26 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Overview
o Aluminum Electrolytic Capacitors
o Introduction
o Construction
o Failure Criteria
o Ripple Current
o Wear-Out
o Life Test
o Traditional
o Trends evident in data
o Accelerated
o Calculations
o Traditional vs. Accelerated
o Accelerated Life Test
o Conditions
o Suppliers A & B
o Suppliers C & D
o Conclusions
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001784
27 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
o The Al ECap accelerated life test approach is an effective
way to compare the reliability of the same capacitors
from different manufacturers under applied test conditions
o Test results indicated that datasheet lifetime values can be
inaccurate when compared to the reliability test results
Conclusions
Accelerated test time Al ECap 1
Al ECap 2
Traditional test time
Time (hours)
Al ECap 3
Accelerated test time
Traditional test time
Accelerated test time
Traditional test time
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001785
28 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com
Many thanks to Steph, who is the primary author, for letting me present her findings.
Our appreciation as well goes to our collaborators, LED Roadway, for allowing us to
publish the findings of this study.
Questions?
IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA
001786