Agilent 5400 AFM/SPM

Data Sheet

Features and benefits

• Scientific-grade instrumentdelivers atomic resolution

• Cost-effective platform offerssimple upgrade path

• Intelligent design providesexcellent ease of use

• Excellent educationalinstrument with coursecurriculum

• Modular options enhanceAFM/SPM flexibility

Applications

• Materials science

• Polymers

• General surfacecharacterization

• Adhesion• Elasticity• Friction

• Nanolithography

Figure 1. The NEW Agilent 5400 AFM/SPM

Overview

The new Agilent 5400SPM/Atomic Force Microscope(AFM) is a high-precision instru-ment engineered to providesuperb ease of use and versatility.This scientific-grade microscopedelivers atomic-scale resolutionat a remarkably affordable price,making it an outstanding choicefor education as well as research.

In fact, the Agilent 5400 offerseducators an unprecedentedopportunity to introduce theirstudents to powerful AFM tech-niques. The microscope will bedelivered with an undergraduatecourse curriculum with samplesfor teaching labs. Furthermore,the Agilent 5400 provides a sim-ple upgrade path to the sophisti-cated Agilent 5500 AFM.

Figure 2. Atomic resolution of Mica. Scan size 14 nm

IntroducingThe Agilent Technologies5400 Scanning ProbeMicroscope (SPM)

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System components

The Agilent 5400 AFM/SPMmicroscope is a modular labora-tory solution that includes anopen-loop X-Y & Z scanner (twoscan ranges available: 9 µm or90 µm), a controller, contactmode, acoustic AC mode, phaseimaging, a computer, and two monitors.

For a lower mechanical noisefloor, the Agilent 5400 is builtwith rigid materials and a rigidframe. Its compact scanneremploys a patented balanced-pendulum design to minimize X-Ycoupling, significantly reducingcreep and hysteresis. The scannercan also be repositioned in Z toaccommodate larger samples upto 21 mm in thickness.

The Agilent 5400 utilizes alow-coherence laser with a smallspot size for low-interferenceimaging. The positioning of thelaser on the scanner ensures thatthe laser is always focused on thesame spot on the cantilever, pro-viding absolute accuracy in verysensitive measurements (e.g.,force measurements) and helpseliminate imaging artifacts.

The microscope’s controller usesstate-of-the-art electronics and anadvanced design to minimizenoise and optimize functionality.The controller has two 32-bitDSPs, five 24-bit DACs for X-Y & Zscan-axis positioning, ten 16-bitdata acquisition channels, andfour 24-bit DAC outputs.

Software

Agilent’s new 32-bit Windows®-based PicoView is a highly stablesoftware package that offersreal-time 3D rendering capabili-ties. PicoView, along withuser-level scripting (C++,Microsoft® Visual Basic®,National Instruments LabVIEW),allows complete control of allscanning parameters and pro-vides the flexibility required formore complex experiments. Anintegrated script editor and sam-ple scripts are also included.

Ease of use

The open access to the scanner(Figure 4) and sample plates(Figure 5), and easy alignment ofoptics simplify use of the Agilent5400 AFM/SPM microscope. Thescanner mounts easily and is heldinto place with a clamp closure.In addition, the scanner’s easy-to-load nose cones mean thatswitching imaging modes is quickand convenient. These nose conesare made from PEEK polymers,have low chemical reactivity, andcan be used in a wide range ofsolvents. Their straight-forwardinterchangeability providestremendous flexibility.

The Agilent 5400 scans at speedsup to 48 Hz and can scan as manyas 8 images simultaneously (4096x 4096 pixels). USB standard con-nectivity allows the microscope tobe run from a laptop computer.

Figure 4. Easy to mount scanners

Figure 3. A thin film of porous aluminumconsists of hexagonal hollow cells formedby vertical partitions. The cell pitch isaround 100 nm in size. This surfacenanostructure can be readily revealedfrom high-resolution imaging usingAgilent’s 5400 under a contact mode.

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Figure 5. Open access to sample plates

Options

Several performance-enhancingoptions are available for theAgilent 5400 microscope, includ-ing a closed-loop X-Y & Z scannerthat provides optimum controlover the position of the AFM/SPMprobe. For high-resolution imag-ing in liquid, Agilent’s patentedmagnetic AC mode (MAC Mode) isoffered. MAC Mode, an extraordi-narily gentle non-contact AFMimaging technique, enables electric force microscopy (EFM),magnetic force microscopy(MFM), and force modulation. To meet the requirements of intricate experiments, precisiontemperature control can beadded. Scanning tunnelingmicroscopy (STM) and currentsensing AFM are also offered.

Figure 6. AFM has been widely used as a powerful characterization tool in materialscience by imaging surface structures with a superior spatial resolution. Isotacticpolypropylene usually exhibits a fiber structure with its chains stretched out straight andlined up next to each other. Although the sizes of the fibers in this delicate sample are atthe nanometer scale, the individual ones have been clearly resolved from Agilent’s 5400under an AAC mode in topography, amplitude and phase images. (The simple use of RMSas the feedback loop signal instead of amplitude from a lock-in amplifier, the 5400 stillmaintains the capability to achieve high resolution.)

Topography

Scan size: 3 µm

Scan size: 1.5 µm

Amplitude

Scan size: 3 µm

Scan size: 1.5 µm

Phase

Scan size: 3 µm

Scan size: 1.5 µm

High-resolution imaging of polymer Celgard (isotactic polypropylene PETcomposite), AAC mode

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Product specifications and descriptions

in this document subject to change

without notice.

© Agilent Technologies, Inc. 2006

Printed in USA, November 8, 2006

5989-5842EN

Specifications

Noise 0.16 Å

Scan range 90 µm x 90 µm x 8 µm

ScannersNote: Specifications shown are for open-loop operation. Closed-loop scanners are also available.

Large multi-purpose scannerScanning range 90 µm x 90 µm Z range 8 µm Vertical noise 0.5 Å RMS

Small scannerScanning range 9 µm x 9 µm Z range 2 µmVertical noise < 0.2 Å RMS

Sample plate sizes

Kinematic mount translatable plate 4mm x 4mm

Controller

Input Ten 16-bit channels

Drive 5 channels ± 215 V, 24-bit

Output Four 24-bit channels, ± 10 V

Interface USB

Power 100 - 120 V AC or 220 - 240 V AC 1A; 50 - 60 Hz

Facilities specifications

Acoustic noise Less the 75dBc

Temperature variation Does not exceed ± 2° F

Humidity variation Does not exceed ± 20% RH

AFM instrumentation from Agilent Technologies

Agilent offers high-precision, modular AFM solutions for research,industry, and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel.

Agilent’s leading-edge R&D laboratories are dedicated to the timelyintroduction and optimization of innovative and easy-to-use AFM technologies.

www.agilent.com/find/afm