1 surface plasmons devices and leakage radiation microscopy a.drezet (isis- univ. louis pasteur,...
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1Surface Plasmons devices and leakage Surface Plasmons devices and leakage radiation microscopy radiation microscopy
A.Drezet
(ISIS- Univ. Louis Pasteur, Strasbourg, France)
A. Hohenau, D. Koller, F. R. Aussenegg, J.R Krenn
Nano - Optics Group ● Institute of Physics ● Univ. Graz, Austria
nanooptics.uni-graz.at
Marseille , 1.10. 2007
2
Surface Plasmon polaritons (SPPs) at a single interface
Dielectric(Air,SiO2)
Metal (Au,Ag)
E,B
z
Raether, Surface Plasmons (Springer, Berlin, 1988).Genet and Ebbesen, Nature 445, 39 (2007).Drezet et al., Micron 38, 427 (2007).
SPP
100nm
10nm
Hy
md
mdSPP ck
3
SPP dispersion relation on a 70 nm thick gold film
Au/glass
Au/air
1Re mkx
12 m
Johnson and Christy, PRB 6, 4370 (1972).
Total Internalreflection
KSPP
4
Au/glass
Au/air
12 m
mLSPP
SPP dispersion relation on a 70 nm thick gold film
"21
xSPP kL
5
Leakage Radiation (LR) SPP modes
air
metalglass
SPP
LRLR
z
Air side
Glass side
LR
Hecht et al., PRL 77 ,1889 (1986).A. Bouhelier et al., PRB 63, 155404 (2001).
m
mLR
1
Resinn glass
6
"sin2
xLRglass kn
LR cone
H. J Simon, J. K. Guha, Opt. Comm. 18, 391 (1976).
SPP
LR2
LR cone
22//
// )''()'(
1)(
kkkkI
Leakage Radiation cone
Rough Ag surface
7
IO
Au
LR
SPP
CCD
LRO2
SPP
Lens
NSOM (near field scanning optical microscope)
Polar.
15 µm
8
Quantum dots (CdTe/ZnTe)
=514 nm
SPP
NSOM
Brun et al., Europhys. Lett. 64 , 634 (2003)
Rdistance hole-tip (nm)
Addressing a nanoobject with SPP
R
eI
SPPLR /
4.2 K
9
Leakage Radiation Microscopy (LRM)
Stepanov et al., Optics Letters 30, 1524 (2005).Hohenau et al., Optics Letters 30 ,893 (2005).
LRM on 50 nm Au film
=800 nm
IO
Au
LR
SPP
CCD
laser
O1
LRO2
SPP
Lensµm 20SPPL
10
2SPPP
Bragg condition:
SPP 2D Bragg reflectors
Drezet et al., Europhys.Lett. 74, 693 (2006)
11
SPP interferometer
V=1, R= 0.95
2D dipole model
12
LRM: Imaging the direct and the Fourier space
Drezet et al., APL 89, 091117 (2006).
13
A) SPP dispersion in the direct space
(A)
L R20 µm
T
Bragg mirror (out of resonance)
)cos(2 in
SPPP
Bragg condition:
nmP
nm
nm
inSPP
555
45 ,785
800
65 800 innm
14
10 20 30 40
1
00
(B)In
tens
ity (
arbi
trar
y un
its)
x (µm)
0.5
10 µm
µmk
LSPP
SPP 202
1"
SPP decay in the direct space
15
LRM (Fourier)
k (1/µm)
Inte
nsity
(ar
bitr
ary
units
)
0
1
8.0 8.27.8
(A)
0.5
L
Drezet et al., Appl.Phys.Lett. 89, 091117 (2006).
2"2'//
1
SPPSPP kkkI
µmk
LSPP
SPP 202
1"
B) SPP dispersion in the Fourier space
16
(a)
(A)
L R20 µm
T
T
(C) T (D)
RLL
C) SPP Fourier optics
(B)
R
T
L
C
17
Reflectance 90%
Appl.Phys.Lett. 86, 074104 (2005) Interferences
SPP in plane elliptical cavity
18
Phase difference
Inte
nsi
ty (
a. u
.)
D1
D2
Braggmirror
ridge
Ditlbacher et al.,APL. 81, 1762 (2002).Drezet et al., Plasmonics (2006).
SEM
SPP in plane interferometry
15 µm
LRM
Phase difference
19
SPP in plane demultiplexer-plasmonic crystal
b
3
a
e1e2
550 nm
=750 nm
=800 nm
Drezet et al., Nanolett. (pub. on line15 mai 2007).
30 µm
21,
1SPPd
2
2,2
SPPd
LRM
SPPAu
Plasmonic crystal
20
SPP in plane Tritter = beam splitter 3 inputs-3outputs
15 µm
e1
e2
500nm
32 SPPa 3
SPPd
21 finalorinc kfk
LRM (direct) (Fourier)
d
(Ewald sphere)
21
SPP in plane reflection microscope (M=3)
10 µm
10 µm
F1F2
10 µm
2 µm
SPP
Drezet et al. Submitted to Optics letters (2007).
400 nm
theory
LRM
22
10 µm
Inte
nsity
(ar
b.un
its)
X (µm)
2 µm
1 µm
500 nm
1.4 µm
3 µm
6 µm
23
• LRM is a straightforward and reliable technique
for probing SPP fields in direct and Fourier space.
•LRM allows precise quantitative analysis of SPP
propagations.
•Fast method: alternative to PSTM, NSOM, NFO
Summary
24
http://nanooptics.uni-graz.at
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