angular resolved uv-vis nir measurements on architectural ...€¦ · ability to do angular...

Post on 11-Jun-2020

5 Views

Category:

Documents

0 Downloads

Preview:

Click to see full reader

TRANSCRIPT

Angular Resolved UV-Vis –NIR

Measurements on Architectural

Glass

1

Dr. Mark Fisher

UV-Vis Application Engineer

Agilent Technologies

April 30, 2015

Overview

• Why Make the Measurements

• Design of the Universal Measurement

Accessory (UMA)

• Data from Glass Samples

• Questions

April 30, 2015

Confidentiality Label

2

Why Make the Measurement?

Recent developments in composite products and specialty coating

technology has allowed glass products to be tailored to very specific

functional needs, environmental conditions and lighting demands.

Developers and users today are equally focused on the energy efficiency of

the product and the fit-for-purpose general requirements to:

• block UV radiation

• transmit visible light

• repel thermal radiation (heat) in summer

• retain heat in winter

Nationally and internationally recognized standards have been developed to

ensure measurement and classification of glass products is performed in a

controlled and comparable manner.

3

Why Make the Measurement ? (Continued)

1) Historically

a) Measurement done on an Integrating Sphere (DRA)

b) Angle of Incidence (AOI) is near normal

c) Very difficult to measure non-near normal AOI’s

d) Sample must be moved from transmission port to

reflectance port

April 30, 2015

Confidentiality Label

4

Why Make the Measurement ? (Continued)

2) With Introduction of UMA, new measurement capabilities

have become possible

a) Possible to make %T and %R measurements at user

defined AOI’s

b) Sample does not have to be moved

c) Effect of Polarized Light can be Examined

d) Data Collection is automated

e) Multiple Samples can be run using AutoSampler

accessory

April 30, 2015

Confidentiality Label

5

External Diffuse Reflectance Accessory (DRA)

April 30, 2015

Confidentiality Label

6

Optical Layout of External DRA

April 30, 2015

Confidentiality Label

7

Sample Mounted on the Transmission Port of

External DRA

April 30, 2015

Confidentiality Label

8

Sample Mounted on Reflectance Port of External

DRA

April 30, 2015

Confidentiality Label

9

Universal Measurement Accessory

(UMA)

April 30, 2015

Confidentiality Label

10

Cary UMS Schematic

Performance

Absolute reflection and

transmission by definition –

the only difference between

baseline and measurement

is the sample itself.

Incident light is fixed in

shape, and position, at the

sample ensuring %T and

%R are collected from the

same point on the sample.

The detector has a pure

line of sight of the sample.

This unique Direct View

provides the highest signal-

to-noise improving

accuracy, reproducibility

and productivity

Productivity

Automated independent

control of polarization (s or

p), detector (D) position, and

sample rotation.

One baseline is needed for

all %R and %T

measurements, at all angles

for a given polarization –

dramatically reducing total

collect time.

Perform all %R, %T

measurements on a single

system eliminating

accessory change over, or

reconfiguration time.

D

Cary UMS Measurement Modes

6 Modes

1 System

Perform all these

measurements

on the Cary

7000 UMS

Instrumentation

13

• Agilent Cary 7000 Universal Measurement Spectrophotometer

• A highly automated UV-Vis-NIR spectrophotometer system. It performs

variable angle absolute specular reflectance and transmittance

measurements with full software control of the sample, detector and

polarizer positions.

Agilent Cary 7000 UV-Vis-NIR spectrophotometer

• The linearly polarized beam that is

incident on the sample can be used to

measure transmission, and by rotating

the detector assembly about an axis

through the sample and perpendicular

to the plane of incidence, in reflection.

Enabling Technology

Sandwich Detector, Wire Grid Polarizer, High

Resolution Optical Encoder

15

Chemical Analysis Group

Agilent Confidential

Agilent Cary – Universal Measurement Spectrophotometer

Unique Detector Technology Silicon/InGaAs Sandwich

Unique Polarizer Technology Wire Grid

16

Chemical Analysis Group

Agilent Confidential

Agilent Cary – Universal Measurement Spectrophotometer

Unique Detector Technology Silicon/InGaAs Sandwich

Unique Polarizer Technology Wire Grid

Feature Advantage Benefit

Si/InGaAs Sandwich Detector Combined UV-Vis and NIR detector. No

moving parts, ie. no beam shift, at detector changeover.

Consistent, full wavelength range, data.

Direct Detector Illumination All reflective, high efficiency, alumina optics

maintains high signal level and signal quality from source to detector

Productivity – saves time

Wire Grid Polarizer High contrast ratio 10000:1. High quality and

control of S and P polarized light.

Superior Data Quality

Wire Grid Polarizer

Large acceptance angle allows polarization of

full beam without compromise

Unmatched signal to noise

17

Chemical Analysis Group

Agilent Confidential

Agilent Cary – Universal Measurement Spectrophotometer

Unique High Resolution Optical Encoder

Feature Advantage Benefit

High Resolution Optical

Encoder

Fine angular control of sample rotation and

detector position to 0.02 deg.

Robustness/Reliability - system never

misses a step and permits precise sample characterization

UMS – Beam Apertures

Chemical Analysis Group

Agilent Confidential

Vertical Aperture Horizontal Aperture Aperture sets;

Used to control the degree

of divergence (collimation)

of the beam

Used to control the patch

size at the sample

User changeable parts

SNR is proportional to

beam patch area

+3 deg

-3 deg Nominal Angle

Sample Mounted and Detector in the Transmission

Measurement Position (180 deg)

April 30, 2015

Confidentiality Label

19

Sample Mounted and Detector in Reflectance

Position

April 30, 2015

Confidentiality Label

20

Sample Mounted and Detector in Reflectance

Position (Sample has moved to different angle)

April 30, 2015

Confidentiality Label

21

Setting Up UMA for Data Collection

April 30, 2015

Confidentiality Label

22

Collection Choices

April 30, 2015

Confidentiality Label

23

Measurement Mode Selection

April 30, 2015

Confidentiality Label

24

Absorptance Measurement Mode

April 30, 2015

Confidentiality Label

25

Angle and Polarization Selection

April 30, 2015

Confidentiality Label

26

Review of Sample Measurement Details

April 30, 2015

Confidentiality Label

27

Post Measurement Data Analysis

April 30, 2015

Confidentiality Label

28

Analysis of Data

April 30, 2015

Confidentiality Label

29

Calculation Results ISO 13837 calculations

30

Solar UV Transmittance TUV(400), Solar Direct Transmittance TDS(1.5),

Solar UV Transmittance TUV(380), Solar Direct Transmittance TDS(1.0)

Figure 5. Example of a ISO 13837 test report generated for an automotive glass sample

Another Available Analysis EN 410 calculations

31

Color Rendering, Light Reflectance, Light Transmittance, Total Solar Energy Transmittance

(Solar Factor) and Shading Coefficients, UV Transmittance

Figure 1a. Example of a EN 410 test report

generated for an architectural glass sample

Figure 1b. Transmission, reflection and the associated absorptance

spectra (A=1-T-R) for an architectural glass sample (2 mm thick). Both s-

and p-polarized spectral data were collected at 60° angle of incidence

Description of Samples

Actual Samples were after Market Films Applied to Glass

Four Different Samples were Selected to Highlight Different

Transmission and Reflection

Sample size was 2 ½ x 4 inches

Samples were run on both External DRA and UMA

April 30, 2015

Confidentiality Label

32

Sample Results on External DRA

April 30, 2015

Confidentiality Label

33

Transmission Results Sample 1 External DRA

April 30, 2015

Confidentiality Label

34

Overlay %T of Samples 1-4 on External DRA

April 30, 2015

Confidentiality Label

35

Reflection Results Sample 1 External DRA

April 30, 2015

Confidentiality Label

36

Overlay %R of Samples 1-4 on External DRA

April 30, 2015

Confidentiality Label

37

Sample 1 Results of 100-%T-%R External DRA

April 30, 2015

Confidentiality Label

38

Overlay of Sample 1-4 External DRA (100-%T-%R)

April 30, 2015

Confidentiality Label

39

Overlay of Sample 1 Results

April 30, 2015

Confidentiality Label

40

Sample Results on UMA

April 30, 2015

Confidentiality Label

41

Graphics at the End of Data Collection

April 30, 2015

Confidentiality Label

42

Cutting Down Some of the Forest

April 30, 2015

Confidentiality Label

43

Overlay of S-Polarization for Sample 1

AOI= 10-80 deg

April 30, 2015

Confidentiality Label

44

Overlay of S-Polarization for Sample 4

AOI= 6,10-80 deg

April 30, 2015

Confidentiality Label

45

Two Dimensional Contour Plot for

Sample 4 S-Polarization

April 30, 2015

Confidentiality Label

46

Overlay Sample 1 %T and %R on UMA AOI=6 deg

April 30, 2015

Confidentiality Label

47

Results for Sample 1 100-%T-%R (%A)

April 30, 2015

Confidentiality Label

48

Sample 1 Overlay of S&P Polarization AOI= 80 deg

April 30, 2015

Confidentiality Label

49

Overlay of %T for Sample 2 from UMA and DRA

April 30, 2015

Confidentiality Label

50

Overlay of %T for Sample 2 from UMA and DRA

Expanded in Visible Region

April 30, 2015

Confidentiality Label

51

Conclusions

It’s all done with Smoke and Mirrors

April 30, 2015

Confidentiality Label

52

Conclusions

The Cary 7000 UMS is a powerful, productive and ideal turn-key solution for routine QA/QC testing, and research and development of glass, glazing, and film products.

Each set of data was collected automatically and unattended, highlighting the true productivity benefit provided by the Cary 7000 UMS.

After the initial configuration and baseline collect, each collection was set and executed in < 4 minutes. Because collection can be completed unattended, user is free to do over work.

Ability to do angular measurements allows one to mimic the path of the sun in a manner not done before.

Cary 7000 UMS or Cary 5000 with UMA makes it possible to make measurements previously not possible.

April 30, 2015

Confidentiality Label

53

The End

Thank you for your Patience and Good Humor

Questions ?

April 30, 2015

Confidentiality Label

54

top related