carrier transport ndc f'15 (1)

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1

Lecture 1: Semiconductor Crystals

ECE5590: Nanoscale Devices and circuitsMostafizur Rahman

rahmanmo@umkc.edu

ECE 663

• So far, we looked at equilibrium charge distributions. Theend result was np = ni

2

• When the system is perturbed, the system tries to restoreitself towards equilibrium through recombination-generation

R-G processes

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Outline

• Recombination Generation• Drift• Diffusion• Conclusions

ECE5590 Fall 2015 MR

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Real spaceEnergy space

Direct Band-to-band recombination

The direct annihilation of a conduction band electron and a valence band hole, the electron falling from an allowed conduction band state into a vacant valence band state; Radiative. Exampels: Lasers, LEDs

ECE5590 Fall 2015 MR 5

R-G Center Recombination

• Defects give rise to deep-level states– Introduces new energy level in the midgap region

• Both carriers get attracted to mid-level; electrons are annhilated

ECE5590 Fall 2015 MR 6

Recombination via Shallow Levels

• Like R-G centers, donors and acceptor sites can also function as intermediaries in the recombination process

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Energy space

Direct Excitonic Recombination

Organic Solar cells, CNTs, wires (1-D systems)

• Electron and a hole can bound together into a hydrogen-atom-like arrangement which moves as a unit in response to applied forces. This coupled electron-hole pair is called an exciton.

• Excitons can be trapped in Shallow-level sites.

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Phonon

Energy space

Auger Recombination

Solar Cells, Junction Lasers, LEDs

X

• Band-Band recombination or trapping at a band center occurs simultaneously with the collision between two like carriers.

ECE5590 Fall 2015 MR 9

Generation

ECE5590 Fall 2015 MR 10

Band to Band Generation

• Opposite process to Recombination

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Recombination

ECE5590 Fall 2015 MR 11

R-G Center Generation

ECE5590 Fall 2015 MR 12

Impact Ionization

• Collision results in electron-hole pair generation. • Occurs in the high field regions

• Ex. Avalanche breakdown in pn junctions.

• Equilibrium distribution of charges in a semiconductor

np = ni2, n ~ ND for n-type

• The system tries to restore itself back to equilibrium when perturbed, through RG processes

R = (np - ni2)/[tp(n+n1) + tn(p+p1)]

• Next-> The processes that drive the system away from equilibrium.• Electric forces will cause drift, while thermal forces (collisions)

will cause diffusion.

Recap

ECE5590 Fall 2015 MR 14

Drift

• Charge carrier motion in response to an applied electric field• When E is applied, +q charges move in the positive

direction, -q in the opposite• Carrier motion is interrupted by scattering, ionized

impurities, thermally agitated lattice, or other scattering centers

ECE5590 Fall 2015 MR 15ECE5590 Fall 2015 MR 15

Drift

• Microscopic drifting of single carrier is complex• Macroscopic observable: drift velocity (vd); averages over all

electrons or holes at the same time.

ECE5590 Fall 2015 MR 16ECE5590 Fall 2015 MR 16

Drift Current

• Drift Current

What is the equation of Current?

ECE5590 Fall 2015 MR 17

Drift Current

Where is the contribution from Electric field?

The hole mobility, is the constant of proportionality between Vd and E

ECE5590 Fall 2015 MR 18

Mobility

Central parameter determining performance of many devices

Electron mobility in Si?Hole mobility in Si?

GaAs electron mobility?GaAs hole mobility?

1360460

8000320

Mobility is a measure of the ease of carrier motion within a semiconductor crystal. The lower the mobility of carriers within a given semiconductor, the greater the number of motion-impeding collisions

Scattering Events

• Phonon Scattering• Ionized Impurity Scattering• Neutral Atom/Defect Scattering• Carrier-Carrier Scattering• Piezoelectric Scattering

ECE5590 Fall 2015 MR 20

Impact of Scattering• Phonon Scattering- collision between the carriers and thermally

agitated lattice atoms. (good/bad?)• Ionized Impurity Scattering- Coulombic attraction/repulsion

between charged carriers and ionized donors/acceptors (good/bad?)

• Neutral Atom/Defect Scattering (bad/bad)• Carrier-Carrier Scattering-collision between same carrier

(good/bad/doesn’t matter)– Randomizes carrier

• Piezoelectric Scattering- displacement of the component atoms from lattice site gives rise to electric field (Good/Bad)

ECE5590 Fall 2015 MR 21

Mobility

For µi, Increasing temperature reduces time spent near vicinity of ionized donor; increasing mobility

ECE5590 Fall 2015 MR 22

Temperature Dependence

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Phonon Scattering~T-3/2

Ionized Imp~T3/2

Piezo scattering

Temperature Dependence

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Doping dependence of mobility

ECE5590 Fall 2015 MR 25

Revisiting Drift Velocity

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Velocity saturation ~ 107cm/s for n-Si (hot electrons)Velocity reduction in GaAs

ECE5590 Fall 2015 MR 26

High Field Effects

Velocity Saturation:• Drift velocity of carrier reaches field independent constant

value– Analogous to free falling object

• Intervalley Carrier Transfer

ECE5590 Fall 2015 MR 26

ECE5590 Fall 2015 MR 27

Ballistic Transport

Velocity Overshoot:• If the total length a carrier travels is shorter than mean

distance between scattering events– No Scattering – Ballistic transport

• Ballistic transport was supposed to be seen at L~0.1um

• Can we engineer these properties?

• What changes at the nanoscale?

Diffusion

Diffusion is a process whereby particles tend to spread out or redistribute as a result of their random thermal motion, migrating on a macroscopic scale from regions of high particle concentration into regions of low particle concentration

SIGNS

EC

E

Jn = qnmnEdrift

Jp = qpmpEdrift

vn = mnEvp = mpE

Opposite velocitiesParallel currents

SIGNS

Jn = qDndn/dxdiff

Jp = -qDpdp/dxdiff

dn/dx > 0 dp/dx > 0

Parallel velocitiesOpposite currents

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In Equilibrium, Fermi Level is Invariant

e.g. non-uniform doping

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Einstein Relationship

m and D are connected !!

Jn + Jn = qnmnE + qDndn/dx = 0diff drift

n(x)= Nce-[EC(x) - EF]/kT = Nce-[EC -EF - qV(x)]/kT

dn/dx = -(qE/kT)n

qnmnE - qDn(qE/kT)n = 0Dn/mn = kT/q

ECE5590 Fall 2015 MR 33

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Einstein Relationship

mn = qtn/mn*

Dn = kTtn/mn*

½ m*v2 = ½ kT

Dn = v2tn = l2/tn

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• We know how to calculate fields from charges (Poisson)

• We know how to calculate moving charges (currents) from fields (Drift-Diffusion)

• We know how to calculate charge recombination and generation rates (RG)

• Let’s put it all together !!!

So…

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Relation between current and charge

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Continuity Equation

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The equations

At steady state with no RG

.J = q.(nv) = 0

Let’s put all the maths together…

Thinkgeek.com

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All the equations at one place

(n, p)

E

J

Simplifications

• 1-D, RG with low-level injection

rN = Dp/tp, rP = Dn/tn

• Ignore fields E ≈ 0 in diffusion region

JN = qDNdn/dx, JP = -qDPdp/dx

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Minority Carrier Diffusion Equations

∂Dnp ∂2Dnp

∂t ∂x2

Dnp

tn= DN - + GN

∂Dpn ∂2Dpn

∂t ∂x2

Dpn

tp= DP - + GP

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Example 1: Uniform Illumination

∂Dnp ∂2Dnp

∂t ∂x2

Dnp

tn= DN - + GN

Why? Dn(x,0) = 0Dn(x,∞) = GNtn

Dn(x,t) = GNtn(1-e-t/tn)

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Example 2: 1-sided diffusion, no traps

∂Dnp ∂2Dnp

∂t ∂x2

Dnp

tn= DN - + GN

Dn(x,b) = 0

Dn(x) = Dn(0)(b-x)/b

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Example 3: 1-sided diffusion with traps

∂Dnp ∂2Dnp

∂t ∂x2

Dnp

tn= DN - + GN

Dn(x,b) = 0

Dn(x,t) = Dn(0)sinh[(b-x)/Ln]/sinh(b/Ln)

Ln = Dntn

Numerical techniques

2

Numerical techniques

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At the ends…

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Overall Structure

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In summary

• While RG gives us the restoring forces in a semiconductor, DD gives us the perturbing forces.

• They constitute the approximate transport eqns (and will need to be modified in 687)

• The charges in turn give us the fields through Poisson’s equations, which are correct (unless we include many-body effects)

• For most practical devices we will deal with MCDE

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