ccf customer demo

CCF Customer DemoTeam 3 - Ducks

Cycle 1 Product Features

Create initial change version and header

Create updated (defect fix, enhancement, new version) change header.

Show change information

Display program listing

Display program listing with line numbers

CCF Demo

Quality MetricsGoals

>50% defects found in Documentation

Provide proper records of our work

Moderate and Record >90% of inspections

No Compile Defects

Actuals

~60% defects found in Documentation

Meeting minutes created for every meeting

100% of inspections moderated and recorded

No Compile Defects

Design, Code, Testing Quality

Design, Code and Testing Quality Goals

Design time > Code time

Code review time is at least half Code authoring time

Review less than 200 lines per hour

Find more than 3 defects per hour

0 defects found during compile

Design

Total DLD Authoring time: 226 minutes

Total Code Authoring time: 181 minutes (80% of DLD time)

Total Code Review time:145 minutes (80% of

Authoring time)

Average LOC review rate: 115 lines/hour (less than 200/hour)

Average Defect rate: 5.7 defects/hour (more than 3/hour)

Total Defects in Compile:0

Total Defects in Unit Testing: 1

Detailed, Code and Testing metrics all indicate a high quality product!

Cycle 2 Plans

LOC count functionality will filter commented lines

Count added and deleted LOC when comparing program versions

Java, C++ and C# Support

Include Line Label References

Questions?

Backup

Cycle 1 Defects

Inspection ResultsSRS Document

13 defects in 13 pages

Injected: Authoring of SRS

SDS Document

Inspection 1

15 defects in 21 pages

Injected: Authoring of SDS

Inspection 2

6 defects in 16 pages

Injected: Original Authoring of SDS

Author Unavailable for meetings

Required complete Rework

New Document required New Inspection

Integration and System Testing

Integration Testing

Two defects found

Both defects involved inconsistencies in method names

System Testing

One defect found

All Integration and System Test defects were traced back to failings in the High Level Design (HLD)

Process changes focused on the HLD