psi test report april 2011

PSI test REPORT APRIL 2011

G. Spiezia, P. Peronnard (EN/STI/ECE)

Outline

Devices under testsExperimental setupBeam setup and resultsConclusions

Devices under testDUT name DUT type HFE0 Ic Vce0

BCP56 NPN Transistor 63-250 1A 80V

DUT name DUT type HFE0 Ic Vce0

BSR17A NPN Transistor 30-300 200mA 40V

DUT name DUT type HFE0 Ic Vce0

BCP53 PNP Transistor 25-250 1A 80V

DUT name DUT type HFE0 Ic Vce0

BSR18A PNP Transistor 30-300 200mA 40V

DUT name DUT type If - Emitter Io - Detector Supply voltage

HCPL2601 Optocoupler 50mA 50mA 5V

DUT name DUT type Sampling rate Input range Supply voltage

MAX11046 16-bit 8ch ADC 250ksps +-5V 5V analog – 3V3 digital

SetupPIF facility at PSI

230 MeV proton beamFlux: up to 1.65E+08 p/cm2/s

Experiment Power supply E3633A for the input signal and the

supply voltage to monitor the Single Event Latch up (SEL)

Power supply E3648A (double output) for powering the DUT

Tektronix DPO7254 oscilloscope (2.5GHz, 40GS/s) to monitor Single Event Transient (SET)

Data Acquistion Switch Unit Agilent 34970A for monitoring the DUT outputs. 8 channels were sequentially monitored (up to 32).

Setup

GUI interface for remote control and logging

GPIB Instruments

Ethernet to GPIB

DUT Ethernet switch

BEAM Actel Evaluation Board for digital DUT

RS232 serial link

Schematics

BCP56/BSR17 – 8 transistors on the test board

Schematics

BCP53/BSR18A – 8 transistors on the test board

Schematics

HCPL2601

Schematics

MAX11046

Test methodology for the ADCAn off-line calibration is done

For each channel, the min and max values are stored in a register file

The beam is enabledThe FPGA checks if a sample is outbound, if yes, the

sample is sent to the control PCChannels 0 to 3 were set to 2.5V with a power supply

(use of a calibrator would be better but not practical)Channels 4 to 7 were set to 0V with a short-circuit

NB: no external memory is available on the evaluation board. It is not yet possible to get an histogram of the samples. The obtained results are preliminary.

Beam RunRun # DUT id

Energy [MeV]

Flux Fluence TID (Gy)

1 BCP53 230 1.6E+08 2.00E+11 260

2 BSR17A 230 1.6E+08 1.70E+11 201

3 BSR18A 230 1.64E+08 2.00E+10 200

4 BCP56 230 1.6E+08 3.80E+11 200

5 HCPL2601 230 1.57E+08 3E+11 165

6 HCPL2601 60 7.1E+07 4.86E+10 65

7 MAX11046 230 1.6E+08 4.82E+11 256

Results – Overview

no SET were observed with our test setup

Drift observed on the gain of the transistors and the reference output of the ADC

No destruction for the transistorNo events observed on the optocouplerThe ADC stopped to work after 200Gy

Results – BCP53

Results – BCP56

Results – BSR17A

Results – BSR18A

Results – MAX11046Channe

lMin Max Difference Calibration

0 0xC000 (0xC01B) 0xC07F (0xC021) 19,38mV 920µV

1 0xC02C (0xC01A) 0xC051 (0xC022) 5.624mV 1220µV

2 0xC02C (0xC01B) 0xC07F (0xC022) 12.616mV 1070µV

3 0xC029 (0xC01B) 0xC0E0 (0xC022) 27.816mV 1070µV

4 0x4043 (0x8000) 0xC044 (0x8004) 4.98V 610µV

5 0x4047 (0x8000) 0x800B (0x8004) 2.48V 610µV

6 0x7FED (0x8000) 0x8015 (0x8005) 6.08mV 760µV

7 0x7FF0 (0x7FFF) 0x800B (0x8004) 4.104mV 762µV

A drift of 4mV was measured on the reference pin

Conclusions No destruction and no SET were

observed for the transistors with our test setup

Drifts were observed on the gain of the transistors

The preliminary results of the ADC shown that it is sensible to SEE and it is susceptible to break after 200Gy (read values are always 0x0000 or 0xFFFF)