semiconductor package synthetic models provide:
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Analysis of Thermal Transient Data www.analysistech.com 1
Semiconductor Package Synthetic Models Provide:
• Insight into the thermal performance of various package designs and improvements
“Why isn’t the performance of this new package much better than that of the old design?”
“Why has the change in die size had such a large effect on package ‘A’ and so little effect on package ‘B’?”
Analysis of Thermal Transient Data www.analysistech.com 2
Semiconductor Package Synthetic Models Provide:
• The basis for intelligent selection of alternate package thermal enhancement approaches
“Would a heat spreader or heat sink provide greater package enhancement?”
“Would a different die attachment provide significant enhancement?”
Analysis of Thermal Transient Data www.analysistech.com 3
Semiconductor Package Synthetic Models Provide:
• The basis for estimation of probable results for proposed enhanced package-designs
“What is the greatest improvement in thermal performance that can be expected from this new package enhancement?”
Analysis of Thermal Transient Data www.analysistech.com 4
Semiconductor Package Synthetic Models Provide:
• Direct simulation of the thermal behavior of devices to non-steady or cyclic powering conditions
“What is the thermal impedance of this device for a 50 hertz power waveform?”
“What is the peak junction temperature expected during the high-power start-up and initializing cycle?”
Analysis of Thermal Transient Data www.analysistech.com 5
Mock Empirical Data from Hypothetical Mechanical System
Analysis of Thermal Transient Data www.analysistech.com 6
Selected Candidate Model for Mechanical System Example
Optimal Assignments Based on Response Data:
• MASS: 0.03 grams• SPRING: 10 dynes/cm• DAMPER: 0.02 dynes/cm/sec
Analysis of Thermal Transient Data www.analysistech.com 7
Junction Temperature Step-ResponsePlotted Using Linear-Time Axis
Analysis of Thermal Transient Data www.analysistech.com 8
Junction Temperature Step-ResponsePlotted Using Log-Time Axis
Analysis of Thermal Transient Data www.analysistech.com 9
Candidate Thermal Model forSemiconductor Packages, Third Order
Analysis of Thermal Transient Data www.analysistech.com 10
Model Step-Response Expressed asImpedance Versus Log-Time
Analysis of Thermal Transient Data www.analysistech.com 11
Test Response of Plastic 24 Lead DIPwith Overlaid Synthesized Model
Analysis of Thermal Transient Data www.analysistech.com 12
Test Response of Ceramic 24 LeadDIP with Overlaid Synthesized Model
Analysis of Thermal Transient Data www.analysistech.com 13
Comparison of Plastic Packagevs. Ceramic Package
Analysis of Thermal Transient Data www.analysistech.com 14
Assumed Segmentation Boundaries
Analysis of Thermal Transient Data www.analysistech.com 15
Heat Capacity ComparisonEstimated Heat Capacities Relative to Synthetic Model Values
Analysis of Thermal Transient Data www.analysistech.com 16
Test Response of 208 Lead Copper-SlugPackage with Overlaid Model
(good die attachment, second order model)
Analysis of Thermal Transient Data www.analysistech.com 17
Conditions Indicative of Model Degeneration:
• The multiple between two time constants is less than 3 - 4• One constituent resistance or heat capacitance is
insignificantly small• One time constant is larger than the duration spanned by the
test data
Solutions for Model Degeneration
• Reduce the order of the candidate model (number of RC pairs)
• Expand the test duration
Analysis of Thermal Transient Data www.analysistech.com 18
Test Response of 208 Lead Copper-SlugPackage with Overlaid Model
(failed die attachment, third order model)
Analysis of Thermal Transient Data www.analysistech.com 19
Test Response of 208 Lead Copper-SlugPackage with Overlaid Model
(failed die attachment, second order model)
Analysis of Thermal Transient Data www.analysistech.com 20
Comparison of Failed Die Attachto Good Die Attach
Analysis of Thermal Transient Data www.analysistech.com 21
TO-247 Test Response, Junction-to-Case,Thermocouple Under Tab
Analysis of Thermal Transient Data www.analysistech.com 22
Junction-to-Case Candidate Model
Analysis of Thermal Transient Data www.analysistech.com 23
Model Response of Junction & ThermocoupleNodes, Junction-to-Case Model
Analysis of Thermal Transient Data www.analysistech.com 24
TO-247 Test Response, Junction-to-Case,With Overlaid Synthetic Model
(thermocouple on center lead)
Analysis of Thermal Transient Data www.analysistech.com 25
Junction-to-Case Synthetic ModelOverlaid on TO-247 Test Response Data
(thermocouple under tab)
Analysis of Thermal Transient Data www.analysistech.com 26
TO-247 Test Response with Alternate Synthetic Model which Excludes the Bump Anomaly
Analysis of Thermal Transient Data www.analysistech.com 27
Model Response for Square Waves of Various Periods and Duty Cycles
Analysis of Thermal Transient Data www.analysistech.com 28
Test Response of Device #1 with Overlaid Model(3 Time Constants, Linear-Log Plot)
Analysis of Thermal Transient Data www.analysistech.com 29
Test Response of Device #1 with Overlaid Model (3 Time Constants, Log-Log Plot)
Analysis of Thermal Transient Data www.analysistech.com 30
Test Response of Device #1 with Overlaid Model(4 Time Constants, Linear-Log Plot)
Analysis of Thermal Transient Data www.analysistech.com 31
Test Response of Device #1 with Overlaid Model (4 Time Constants, Log-Log Plot)
Analysis of Thermal Transient Data www.analysistech.com 32
Test Response of Device #2 with Overlaid Model (3 Time Constants, Linear-Log Plot)
Analysis of Thermal Transient Data www.analysistech.com 33
Test Response of Device #2 with Overlaid Model (4 Time Constants, Linear-Log Plot)
Analysis of Thermal Transient Data www.analysistech.com 34
Test Response of Device #2 with Overlaid Model (4 Time Constants, Log-Log Plot)
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