atml status april 2008 issue 15

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ATML Status

April 2008Issue 15

An overview of the ATML activity in the ATML focus group and as part of the IEEE

SCC20 sub-committees

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ATML• ATML’s mission is to define a collection of XML-based schemas that

allows ATE and test information to be exchanged in a common format adhering to the XML standard

• ATML defines a framework through which different architectures using XML can be implemented. – defines the components from which users can build their architectures,

whilst being interoperable with other compliant architectures.– Show examples of the net centric services by which this information can

be exchanged across different ATS platforms as part of a maintenance process.

– defines the XML format that these elements.• The ATML specifications will define:

– How to define XML schemas that represent ATE and test information.– A set of XML schemas supporting the exchange of specific ATE and

test information.• The ATML specifications will support:

– services that can be used for exchanging ATE and test information in a distributed net-centric environment.

– services supporting the exchange of specific ATE and test information in specific common areas.

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ATMLATML Overview and ArchitectureIEEE Std 1671-2006

Test Station (1671.6)

Instrument Description (1671.2)

Test Adapter (1671.5)

Test Configuration IEEE Std 1671.4-2008

Test Description (1671.1)

SIMICA Test Results and Session InformationIEEE Std 1636.1-2007

Diagnostics: AI-ESTATEIEEE Std 1232-2002

SIMICA Maintenance Action Information

(1636.2)

UUT Description IEEE Std 1671.3-2008

ATML Common, HardwareCommon, TestEquipment, and Capabilities (1671)

Key:

In IEEE Ballot Process

Draft of the Standard

Standard approved by the IEEE

Errata to Standard approved by the IEEE

Draft revision of a standard

Started

Signal Descriptions: STDIEEE Std 1641-2004

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SCC20 & ATML Organisations

• The IEEE SCC20 is the standards organisation through which the ATML components (i.e. schemas and documentation) will be published under various IEEE standards.

• The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML.– The ATML group provides draft schemas and associated

documents, examples, use cases, requirements and conducts trial use of any ATML components.

– Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components.

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SCC20 Organisation for 2008

Common, HardwareCommon,

TestEquipment

Key:

Synthetic Instruments:UpConverter,

DownConverter,ARB, Digitizer

Capabilities

SCC20Steering and Administrative

Chair: Mike Seavey (Northrop Grumman)Vice Chair: John Sheppard (Johns Hopkins University)

Secretary: Dave Droste (DRS-TEM)

LiaisonsJohn Sheppard (CS), Joe Stanco & Mark Kaufman (I&M),

Joe Stanco (AES), Bill Ross (DoD), Malcolm Brown (MoD), Les Orlidge (NDIA)

Administrative (ADMIN)Les Orlidge (AAI)

John Sheppard (Johns Hopkins University)

Hardware Interfaces (HI)Co-Chair: Mike Stora (SysIntech)

Co-Chair: Dave Droste (DRS-TEM)Secretary: Dave Droste (DRS-TEM)

Diagnostic and Maintenance Control (DMC)Co-Chair: Tim Wilmering (Boeing)

Co-Chair: Mark Kaufman (NWSC/Corona)Secretary: John Sheppard (Johns Hopkins

University)

Test and ATS Description (TAD)Co-Chair: Ashley Hulme (EADS)

Co-Chair: Ion Neag (Reston Software)Secretary:

Test Information Integration (TII)Co-Chair: Teresa Lopes (Teradyne)Co-Chair: Chris Gorringe (EADS)

Secretary: John Ralph (Northrop Grumman)

IEEE-1505Receiver Fixture Interface

(RFI)

IEEE-P1505.1Common Test Interface Pin

Map

IEEE-1522Testability and Diagnosability

IEEE-1232AI-ESTATE

IEEE-P1636SIMICA

IEEE-1636.1Test Results and Session

Information

IEEE-P1636.2MAI

IEEE-1546DTIF Guide

IEEE-1445DTIF

IEEE-1641STD

IEEE-716C/ATLAS

IEEE-771Guide to the use of ATLAS

IEEE-1641.1Guide to the use of STD

IEEE-P1671.1Test Description

IEEE-P1671.2Instrument Description

IEEE-1671ATML Overview and

Architecture

IEEE-1671.3UUT Description

IEEE-1671.4Test Configuration

IEEE-P1671.5Test Adapter

IEEE-P1671.6Test Station

ATML Component

Errata

Synthetic Instrument Annexes

IEEE-P1505.22-Tier RFI

IEEE Staff LiaisonSoo H. Kim ([email protected])

Pins, Ports & Connectors

Proposed ATML Users Guide

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ATML’s 2008 Objectives & Goals

• To have the P1671.2 (Instrument Description) Trial-Use Standard:– complete the formal ballot process by May 2008– to submit as a trial-use standard by Q3 2008

• To have the P1671.5 (Test Adapter) Trial-Use Standard:– complete the formal ballot process by Jul 2008– to submit as a trial-use standard by Q3 2008

• To have the P1671.6 (Test Station) Trial-Use Standard:– complete the formal ballot process by Jul 2008– to submit as a trial-use standard by Q3 2008

• To have the P1671.1 (Test Description) Trial-Use Standard:– written, reviewed and to start the formal ballot process by May 2008– Ready for publication Dec 2008– to submit as a trial-use standard by Q5 2008

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ATML’s 2008 Objectives & Goals (cont)

• Review associated candidate schemas for all ATML components– Q1

• Signal Description (STD - 1641) Errata v2

– Q3 • Update 1671-2006 & errata for draft full use standard

– Q4• Signal Description (STD - 1641) Dec 2008 Start Ballot• Review All IEEE Std 1671 ATML Components (P1671.1 thru

P1671.6 & P1636.1) in line with 1671 draft Full Use Standard

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Standards & Schema Revisions (1 of 2)

Project or Standard

Project or Standard Number

Document & Draft Number XML Schema Name

XML Schema Version Number

Common.xsd 2.01 (Note 1,3)HardwareCommon.xsd 2.02 (Note 1,3)

TestEquipment.xsd 0.16 (Note 3)Errata: Annex C

Draft 1.1Capabilities.xsd 0.04 (Note 2,3)

ATML Test Description

P1671.1 P1671.1 Draft 0.4 TestDescription.xsd 0.16

InstrumentDescription.xsd 0.25InstrumentInstance.xsd 0.04

UUTDescription.xsd 1.01UUTInstance.xsd 1.00

ATML Test Configuration

IEEE Std 1671.4™-2008

- TestConfiguration.xsd 1.01

TestAdapterDescription.xsd 0.10TestAdapterInstance.xsd 0.08

TestStationDescription.xsd 0.10TestStationInstance.xsd 0.08

IEEE Std 1671™-2006

ATML Overview and Architecture

Errata: Annex B Draft 10

P1671.5 Draft 5P1671.5ATML Test Adapter

P1671.6 Draft 5P1671.6ATML Test Station

P1671.2 Draft 8P1671.2ATML Instrument

DescriptionATML UUT Description

IEEE Std 1671.3™-2008

-

indicates project is a published standardindicates project is in the ballot process

Note 3: Annex B & C will be handled as Errata until next publication (~Jan 2009)

Note 1: Schema version 1.01 is posted on the IEEE download site (as of May 2007)Note 2: Capabilities will be included in next publication (~Jan 2009)

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Standards & Schema Revisions (2 of 2)

Project or Standard

Project or Standard Number

Document & Draft Number XML Schema Name

XML Schema Version Number

SIMICA Test Results and Session Information

IEEE Std 1636.1™-2007

- TestResults.xsd 2.03

SIMICA Maintenance Action Information

(MAI)P1636.2 Not Available

MAIDraft_102907_working-C.xsd

0.11

AI-ESTATEIEEE Std

1232™-2002Note 4 Note 5 -

STDIEEE Std

1641™-2004Note 6 Note 7 -

Note 5: XML schemas associated with the EXPRESS models are being developed

Note 7: The XML schemas included in STD are being updatedNote 6: STD (IEEE Std 1671-2004) is being updated, expected to go to ballot in 2008

indicates project is a published standardindicates project is in the ballot process

Note 4: AI-ESTATE (IEEE Std 1232-2002) is being updated, expected to go to ballot in 2008

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ATML Overview & Architecture (IEEE Std 1671-2006)

• IEEE Std 1671-2006– Published December 16, 2006– Common schema Version 1.01– HardwareCommon Version 1.01

• Errata Document to “replace” published Annex B– Presently at Draft 10– Errata until 2009; to be posted on IEEE Errata

web-site• Common schema Version 2.01• HardwareCommon schema Version 2.02• TestEquipment schema Version 0.16

– Published IEEE Std 1671™-2006 did not include Test Equipment

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ATML Overview & Architecture (cont)

• ATML Capabilities– Proposed as “new” Annex C

• Errata to IEEE Std 1671 until 2009; to be posted on IEEE Errata web-site

– Annex Document presently at Draft 1.1– Capabilities schema Version 0.04

• ATML Pins, Ports, Connectors– Material to be posted on the TII web-site

• Future ATML Users Guide

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ATML Test Description (P1671.1)

Task Date (month/day/year)

Draft Standard Draft 2.0 will be available for review on 5th May 08

Upload Draft Document to IEEE MEC

April 08

MEC Approval

Invitation to Ballot 11th April 08

Initiate Ballot May 08

Ballot Closed

Initial Ballot Results -

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ATML Instrument Description (P1671.2)Task Date (month/day/year)

Draft Standard Draft 6: 09/04/07 Incorporates Synthetic Instruments as Annexes: Up-converter, Down-Converter, ARB, Digitizer


09/04/07

MEC Approval 10/12/07

Invitation to Ballot 10/22/07 (Closed 11/15/07)

Initiate Ballot Draft 8: 11/28/07

Ballot Closed 01/14/08

Initial Ballot Results –Passed

Number of Balloters = 45

44 Responded 97.8% (≥ 75% of balloters)

Affirmative = 36

Negative = 4

Abstain = 4

Approval Rate 90.0% (≥ 75% of returned ballots)

Abstain Rate 9.1%

Number of Comments = 553 (572)

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ATML Instrument Description (cont)Task Date (month/day/year)

Ballot Resolution 01/15/08-TBD

Re-Circulation Ballot 17th April 2008

Re-Circulation Ballot Closes

2nd May 2008

Recirculation Ballot Results

No comments – thus far

IEEE RevCom Submittal Package

IEEE RevCom Meeting

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ATML UUT Description (IEEE Std 1671.3-2008)


Draft Standard Draft 3: 03/03/07


03/03/07


Invitation to Ballot 04/25/07



Initial Ballot Results - Passed



Affirmative = 40

Negative = 2

Abstain =3


Abstain Rate 6.7%

Number of Comments = 118

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ATML UUT Description (cont)Task Date (month/day/year)

Ballot Resolution 07/13/07-09/05/07 All 118 comments have been addressed Regardless of classification or vote

Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified.

Re-Circulation Ballot Draft 8: 09/05/07

Re-Circulation Ballot Closed

09/14/07

Recirculation Ballot Results - Passed



Affirmative = 44

Negative = 2

Abstain =2 (1 Lack of time, 1 Other)


Abstain Rate 4.2%

Number of Additional Comments = 22


10/09/07

IEEE RevCom Meeting - Approved

12/05/07 preliminary RevCom comments received/addressed November 2007

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ATML UUT Description (cont)Task Date (month/day/year)

Copy-Edited Review package due

01/30/08

Comments & Corrections due

02/20/08

Target IEEE Publication date

03/28/08

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ATML Test Configuration IEEE Std 1671.4-2008




03/03/07


Invitation to Ballot 04/25/07






Affirmative = 39

Negative = 2

Abstain =3


Abstain Rate 6.8%


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ATML Test Configuration (cont)Task Date (month/day/year)


Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified.

Re-Circulation Ballot Draft 9: 09/05/07


09/14/07




Affirmative = 44

Negative = 1

Abstain =2 (1 Lack of time, 1 Other)


Abstain Rate 4.3%

Number of Additional Comments = 1


10/02/07


12/05/07 preliminary RevCom comments received/addressed November 2007

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ATML Test Configuration (cont)Task Date (month/day/year)

Copy-Edited Review package due

03/05/08

Comments & Corrections due

03/26/08

Target IEEE Publication date

04/30/08

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ATML Test Adapter (P1671.5)




10/01/07



Initiate Ballot 13th Feb 2008

Ballot Closes 13th March 2008



31 Responded 97% (≥ 75% of balloters)

Affirmative = 24

Negative = 3

Abstain =4


Abstain Rate 12.9%




Re-Circulation Ballot





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ATML Test Station (P1671.6)




10/01/07



Initiate Ballot 13th Feb 2008

Ballot Closes 13th Mar 2008



31 Responded 97% (≥ 75% of balloters)

Affirmative = 24

Negative = 3

Abstain =4


Abstain Rate 12.9%




Re-Circulation Ballot





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ATML & SIMICA(IEEE-1636.1)

• SIMICA:Test Results and Session Information– IEEE Std 1636.1-2007– TestResults schema Version 2.03

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ATML & STD (IEEE-1641)

• STD: (Update to IEEE Std 1641-2004)– Draft updated standard under development– Draft updated schemas under development– Start Ballot December 2008

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Balloting - Spanning Calendar Years

• Clarification– Once the initial ballot begins, the ballot group

is set until all rounds of balloting are finished.

– Even if a ballotter does not renew his or her IEEE membership.

• myProject and myBallot accounts remain active only for activities selected while IEEE membership was active.

• myProject will indicate that IEEE membership has expired.

• All votes and comments are valid, and are to be handled as any other IEEE-SA member.

– The IEEE does not wish to re-establish balloting constituencies.

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GROOVEWork Space

Current

TII Web-site

Common.XSD (2.01)HardwareCommon.XSD (2.02)

TestEquipment (0.16)

IEEE Download site

1671-2006

IEEE Errata site

1671-2006

Annex B Change Pages

IEEE Interpretations site

1671-2006

Archive






Annex C Capabilities

Pins, Ports, Connectors

IEEE Std1671-2006 Schema & Document Locations

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2008 Meeting Schedule• Face-to-Face Meetings:

– Jan. 15-17; Orlando, FL (Lockheed Martin)

– Apr. 22nd-24th ; SCC20 08-1 St. Louis, MO (Boeing)

– Jul. TBA; Open - meeting presently planned for Santa Rosa

– 6-8th Sept.; SCC20 08-2 Salt Lake City, UT• In conjunction with AUTOTESTCON (Sept. 8-11)

– Oct./Nov. TBD; Open - no meeting presently planned

• Additionally:– Bi-Weekly Teleconferences– 4 Meetings a year plus additional break-out working groups as

necessary– Synchronise with SCC20 meetings

atml status april 2008 issue 15

Documents

trial use

xml standard atml

use of xml

atml common

atml group

atml specifications

atml activity

atml statusapril