automotive days 2015 by interlatin &

Automotive Seminar México 2015

May 18th to May 22th

June 1st to June 5th

AGENDA:

Introduction

Name, Role in the company

Electrical & functional testing challenges in your

company

BOX ICT : Electrical Test

B BOX x1149 : Boundary Scan Solution

VIPER : Functional Test - How to take advantage of

Modular Test Systems

AGENDA:

Introduction


Challenges for electrical & functional testing in your

company



VIPER : Functional Test

What would your selection be?

Why?

Covering your needs?

And … stakeholders needs?

What if you include more context?

3070 3170 3170

We can assist you in the selection

i1000 off line

TS-5400VenturiSeries III

TS-5020Lincoln

TS-5040Mercury

TS-8989VipeR

3070inline

BBOXMini ICT

BOX ICT

i1000 inline

Body Electronics - Comfort / Convenience- Instrument Cluster- Remote Keyless Entry- Climate Control

Power Train & Hybrid - Engine Management - Braking System - Power Steering - EV and HV

Infotainment & Communications- Audio Systems- Multimedia Systems - Rear Seat Entertainment

Safety and Driver Assistance - Adaptive Cruise Control - Collision Warning -Tire pressure Monitoring - Airbag

Start point:

AGENDA:

Introduction for members in the meeting


Electrical & functional testing challenges in your

company




Electrical & Functional testing challenges in your Company

AGENDA:




company




Basic ICT Concept

• Insufficient• Poor welding• Marginal Joints• Voids• Excess

• Shorts• Opens• Invisible

parts

• Missing• Gross Shorts• Lifted Leads• Bent Leads•Excess

•Bridging•Tombstone•Misalignment

•Orientation• Missing Non-Elec.• Bypass Caps, L’s• Extra Parts• Mark Inspection

• Inverted

•Polarity

•Missing Socketed Parts

• Dead Part

• Wrong Part

• Bad Part

• PCB Short/Open

• Functionally Bad

Solder Solder

PlacementPlacement

ElectricalElectrical

AOI

ICT AXI

ICT: In-circuit TestAXI: Automated X-ray Inspection

AOI: Automated Optical Inspection

Why In-Circuit Test?

Keysight available solutions

ICT Low pin count applications?

2 cylinders engine

GO Modular…

GO Small…

GO Flexible…

GO Parallel…

Mini ICTGo…

How about a Full Featured Compact version that

fits in your rack?

Don’t want aFull Sized ICT system?

Full ICT Feature:•RLC analog measurement•Voltage measurement•Boundary Scan Test•Cover Extend Technology•On Board Programming•Digital Library Test •SPI or I2C Programming•Client-Server Software

API

The New Keysight mICTCompact ICT system with Built-in PC ControllerSupports both Analog and Hybrid CardsProvides up to 512 test channels

Customizable in Footer 17

What if we set the rest of the car?

Box In-Circuit Test (BICT)POWER SUPPLY

FIXTURE INTERFACE

USER INTERFACE

ALL INTERCONNECTED

CASSETTES TECHNOLOGY

Box In-Circuit Test (BICT)

You don’t need vacuum pump or air

compressor

Full ICT Feature:

•RLC analog measurement•Voltage measurement•Boundary Scan Test•Cover Extend Technology•On Board Programming•Digital Library Test •SPI or I2C Programming•Client-Server Software

API

SpecificationsProduct Features Benefits

Diagnostics Test Set

Powerful desktop form factorBoundary scan & on board digital testsEasy & flexible deployment

Modular Power system

The flexibility to mix and match from over 30 different DC power modules to create from 1 to 4-channel DC power system optimized to meet specific test requirements

Fixtures Interchange cassettes

Flashing (optional)

Nodes for connection available

i1000D Diagnostic Test Set SpecProduct Features High-performance module

Max node count 512Max digital driver/receiver channels 256SCPI Command Support Yes, thru LANExternal power supply control Yes, thru Agilent IO LibraryKeysight VTEP 2.0 Powered YesOn Board Programming YesBoundary Scan Yes, native with interconnect capabilitiesDigital Test Library Support Agilent VCLAnalog component test Resistors, Capacitors, Inductors, Diodes, FET, and

Jumpers.Voltage measurement Max 100VFrequency measurement 200Mhz, 12 sets, with frequency mux cardDigital Driver/Receiver characteristics Mutiplexing 1:1, UnmuxedPer-pin Programmable receiver 0 to 4.85 V

Per-pin Programmable driver 0 to 5 VMax sink current Peak 500 mAMax source current Peak 500 mAPattern rate Max 2 MPSProgrammable vector cycle ProgrammableProgrammable vector cycle resolution 50 nsProgrammable receive delay ProgrammableProgrammable receive delay resolution 10 ns

Options for N6700

N6751A High-performance module Autorange 50V, 5A, 50W

N6761A Precision DC Power Module, 50V, 1.5A, 50W

N678XA Source Measure Units (SMUs) Up to 20V, 8A, 80W

Fixture customizing

• Standard Replacement Kit with Intermediate Interface Frame (basic unit)

• Customizable for fixture

• 2 weeks for customizing

Options for Transfer blocks

Reader unit Option

P04-000072-01 and P04-000073-01

STS TRANSFER SIGNAL PCB SIDE and STS TRANSFER SIGNAL TEST SYSTEM SIDE (one pair basic unit)

P04-000070-01 and P04-000071-01

STS TRANSFER POWER PCB SIDE and STS TRANSFER POWER TEST SYSTEM SIDE (one pair basic unit)

P04-000082-01 andP04-000083-01

BOX ICT TRANSFER SIGNAL PCB SIDE and BOX ICT TRANSFER SIGNAL TEST SYSTEM SIDE(five pair basic unit)

Types of products

• Usable area: 295mmx250mm MAX PCB size

Training

• 1. Training name: Box In-Circuit Test Training• 2. Training manual: Box In-Circuit Test

training manual• 3. Slides for Training : Slides• 4. hand-on Labs: Develop Labs; Board

Demo, • 5. Certificate Instructor• 6. Certificate of Achievement.• 7. Duration: 3 days

Live DEMOPXI INSTRUMENTATION CARD

IN CIRCUIT TESTING

Delivery Time

• If stock: 2 weeks (time for hardware configuration)

• No stock: 8 weeks (time for fabrication and hardware configuration)

AGENDA:




company




Test Access challenges

INTENSE COST PRESSURE• Fierce competition in the global

market• Customers expecting more

functionality, better quality and at lower cost

• Lower equipment cost• Lower deployment cost • Lower cost of ownership

Page 37

General ICT Challenges in the Industry LOST OF TEST ACCESS

• Increased board functionality

• Highly dense board and design complexity

• No layout space for targets

• Finer trace-spacing routing

• Higher frequencies

0%

20%

40%

60%

80%

100%

1990 1995 2000 2005 2010 2015

In Traditional ICT, Lost of Access = Lost of Test Coverage

Test Access (%) over the years

The problem: Loss of testpoints

• Reasons:1) Embedded vias2) Embedded layers3) 3D ICs4) PCBA density5) High speed signals

38

Suite of Test Point Accessibility Technology

Keysight Technology to increase coverage!!

The solution: Boundary Scan• Bscan is one of the most effective standards to

regain test access.1) It is a standard2) New standards are continously developed

a) Test DDR memoriesb) Functional (embedded) testc) Analog test

3) IC test requires only a fraction of the test access.

The success of Bscan implementation in mass production test is directly

dependent on DFT

40

INTRODUCTION TO …KEYSIGHT X1149 BOUNDARY SCAN ANALYZER

41

BOUNDARY SCAN

IEEE 1149.6

IEEE 1149.1

IEEE 1581

JTAGTCK TMS

TDITDO

TRST

What is …

42

What is boundary scan?A Typical IC

• Testing requires knowledge of the device functionality

101010

101010

101010

101010

101010

101010

CoreLogic

101010

101010

101010

101010

101010

101010

43

What is boundary scan? A Typical IC … adding boundary scan

• Core logic is isolated

TEST ACCESS PORT

CONTROLLER

CoreLogic

Test Data Out (TDO)

Test Clock (TCK)

Test Data In (TDI)

Test Mode Select (TMS)

Boundary Scan Cells

44

What is boundary scan? A Typical IC … testing with boundary scan

• Serial Data In

TEST ACCESS PORT

CONTROLLER

CoreLogic

0

0

0

1

1

1

10010 1Test Data Out (TDO)

Test Clock (TCK)

Test Data In (TDI)


45


• Serial Data Out

TEST ACCESS PORT

CONTROLLER

CoreLogic

0

0

0

1

1

11

0

0

1

0

1

Test Data Out (TDO)

Test Clock (TCK)

Test Data In (TDI)


46


• Parallel Data Out to PCB traces

TEST ACCESS PORT

CONTROLLER

CoreLogic

0

0

0

1

1

1

Test Data Out (TDO)

Test Clock (TCK)

Test Data In (TDI)


1

0

0

1

0

1

47

What is boundary scan? Boundary Scan Interconnect (1149.1)

• Testing in a chain

TEST ACCESS PORT

CONTROLLER

CoreLogic

0

0

0

1

1

1

TDO

TCK

TDI

TMS

48


TEST ACCESS PORT

CONTROLLER

CoreLogic

0

0

0

1

1

1

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

49


TEST ACCESS PORT

CONTROLLER

CoreLogic

0

0

0

1

1

1

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

0

0

0

1

1

1

TDO

TCK

TDI

TMS

1

0

0

1

0

1

50


• One port controls the tests in the chain

TEST ACCESS PORT

CONTROLLER

CoreLogic

0

0

0

1

1

1

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

0

0

0

1

1

1

TDO

TCK

TDI

TMS

1

0

0

1

0

1

51

• For High-speed Differential signals, with AC coupling caps

++

− −


TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

0

1

0

1

01

0

1 0

1

53

• Testing each driver separately

What is boundary scan? Buswire

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

1 1

1

1 1

++

− −

54

• Testing each driver seperately

What is boundary scan? Buswire

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

1

1

1

1

1

++

− −

55

• Opens test: Expect “natural” state

What is boundary scan? Pull Up/Down Resistors

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

1

0

1

++

− −

GND

VCC

high

low0

56

• Opens Fault


TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

0

0

0

++

− −

GND

low0

low

VCC

57

• Shorts test: Expect driven state


TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

0

1

++

− −

GND

VCC

high

low

0

1

0

1

0

1

58

• Shorts fault


TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

1

1

++

− −

GND

high

low

0

1

VCC

1

0

1

1

59

What is boundary scan?Silicon Nails Test

• Testing non-Boundary Scan ICs

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

++

− −

GND

VCC

01

1

0

111

0

1

60

What is boundary scan?Cover-Extend Technology (CET)

• Testing non-Boundary Scan ICs; Vectorless test method

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

TEST ACCESS PORT

CONTROLLER

CoreLogic

TDO

TCK

TDI

TMS

++

− −

GND

VCC

1

0

1

61

APPLICATIONS OF KEYSIGHT X1149 BOUNDARY SCAN ANALYZER

70

U1

TDI

TDO

U4

TDI

TDO

U5

TDI

TDO

U3

TDI

TDO

What if … ?• Normal circuit

board• Select the Bscan

components• Wire the Bscan

components into same voltage levels chains

U2

J1

U6

J2

J3

3.3V

5V

71

U1

TDI

TDO

U4

TDI

TDO

U5

TDI

TDO

U3

TDI

TDO

What if … ?• Normal circuit

board• Select the Bscan

components• Wire the Bscan

components into same voltage levels chains

• Interconnected nodes can be tested even without testpoints

U2

J1

U6

J2

J3

3.3V

5V

72

• Add a test box controlled by PC

U4

TDI

TDO

U1

TDI

TDO

U6U5

TDI

TDO

U3

TDI

TDO

What if … ? … Then we …

U2

J1

J2

J3

3.3V

5V

TAP 1

CET

TAP 2

73

• Test box outputs clear failure messages for simple failure diagnosis

U4

TDI

TDO

U1

TDI

TDO

U6U5

TDI

TDO

U3

TDI

TDO


U2

J1

J2

J3

3.3V

5V

Board Failed#1 Open Failure at U4.62Expected: 10011010Actual: 00000000

#2 Voltage Failure on “3.3V”Measured: 0.0VHigh: 3.4VLow: 3.2V

Expected:

Actual:

TAP 1

CET

TAP 2

74

• Add voltage monitoring

• Add vectorless testing

U4

TDI

TDO

U1

TDI

TDO

U6U5

TDI

TDO

U3

TDI

TDO

U2

J1

J2

J3

3.3V

5V



Expected:

Actual:

TAP 1

CET

TAP 2

75

• … we have the solution

• NOW

U4

TDI

TDO

U1

TDI

TDO

U6U5

TDI

TDO

U3

TDI

TDO


U2

J1

J2

J3

3.3V

5V



Expected:

Actual:

TAP 1

CET

TAP 2

76

• X1149.6• CET

U4

TDI

TDO

U1

TDI

TDO

U6U5

TDI

TDO

U3

TDI

TDO

Maximizing coverage

U2

J1

J2

J3

3.3V

5V



Expected:

Actual:

TAP 1

CET

TAP 2

77

Boundary Scan Test Coverage Example

Possible: Test Coverage > 50% of total nodes tested

Total Nodes tested

%

Interconnect 3094 31.9

Interconnect dot6

516 5.3

Bus wire 727 7.5

Pull up / down resistors

200 2.1

Silicon Nails 1800 18.6

Cover-Extend 100 1.0

Total 6237 64.3

Network Communications board9700 nodes

1800 18.6

78

COMPLETE BUNDLE AVAILABLE.• PC Controlled (Ethernet).• Four TAP/IO Boxes.

- 1x TAP Port.- 4x Digital input ports.- 5x Digital output ports.

• One Diagnostic Clip.• Add-on Cover-Extend Technology capability

- Vectorless testing of ICs or Connectors through boundary scan

• Scan Path Linker- Connecting physically separated chains to test

the interconnecting nets

Keysight x1149 Boundary Scan Analyzer

Controller

TAP I/O Boxes

DiagnosticClip

x1149 CET Mux

Power AdaptorLAN to PC

x1149 TAP/IO

x1149 Controller

No test access

Cover Extend Technology uses Boundary Scan as the stimulus to test non-Boundary Scan components having no test access.

VTEP amplifier, sensor plate and a Cover-Extend Mux is required to complete the metrology.

x1149 Cover Extend Technology

1149.1 TAP

BENEFIT : Add test coverage without test access

VTEP amplifier & sensor plate

x1149 *Simple and Effective GUI

Graphical view of the selected chain. Mouse over to retrieve the TAP information.

All information of the devices in the chain at a glance.

BENEFIT : Efficient graphical user interface

Process OutlineGuides user through test development and debug.

Project ExplorerNavigate to sections of the test at a click.

Click to select chain.

Generate Multi-ChainScan Path Linker combines chains at a click.

Configure/Reconfigure ChainAutomatically sets up chains using board’s net information.

x1149 Test Debug Screens

BENEFIT : Enables fast release of test to production

View the failing test in Waveform Viewer or the Frame Debugger to view the expected vs actual.

View failure as a waveform




Vector view of frame

Undocked view of the waveform




Undocked view of the frame

x1149 has Great Diagnostics

BENEFIT : Pin level diagnostics saves time

OutputShows the results of all the tests for the chain(s).

Results of tests are highlighted in colors. Test results can be sorted by clicking on the title tab.

Repair TicketPin-level failure reporting and possible cause.

x1149 has Great Diagnostics

BENEFIT : Pin level diagnostics saves time

OutputShows the results of all the tests for the chain(s).

Results of tests are highlighted in colors. Test results can be sorted by clicking on the title tab.

Repair TicketPin-level failure reporting and possible cause.

Board with injected open faults (Dot6 test)

CET test failures

x1149 ‘Transportable’ licenses

BENEFIT : Lowers cost of ownership

‘Standard’ Boundary Scan Test• Board designs can have boundary scan chains

physically separated (not connected).• Such boundary chains will be generated and

tested as separate chains.

Scan Path Linker• Boundary scan test coverage can be increased by

the number of interconnect nets if boundary scan chains can be ‘connected’ during testing and revert to its original design after testing.

• x1149 Scan Path Linker connects two or more boundary scan chains by linking the TDO to the TDI of these chains inside the controller.

• Automated logic level management

x1149 Scan Path Linker

BENEFIT : Easily increase interconnect nets coverage

IC IC

IC IC

TDI

TDI TDO

TDO

No test coverage

IC IC

IC IC

TDI

TDI TDO

TDO

Nets tested

Integrated STAPL Player

• STAPL (Standard Test and Programming Language)

• JEDEC standard : JEDEC-JESD71• Enables programming of various CPLD/FPGA devices from different vendors like Xilinx, Altera, Lattice, Actel (Microsemi) and more.

• The compiler accepts various formats : STAPL, jam, jbc, svf files

x1149 STAPL Player

BENEFIT : CPLD/FPGA programming

USING X1149 IN ALL STAGES OF THE PRODUCT LIFE CYCLE

92

x1149 throughout the Product Cycle

Design R&D• Quick test turn on• Test high-value ICs• Diagnostics during design verification

Warranty Repair• Field Repair• Fixtureless, portable

Prototyping NPI• Quick test turn on• Test high-value ICs• Test development enhancements

Mass Production Production• Leverage from NPI• ICT or Standalone integration• Savings on fixturing

Debug Repair• Short test time • Pin level diagnostics

Product Life Team Benefits

93

Conclusion• Boundary Scan is the most effective method to

reduce the issues regarding loss of test access on the product.

• Boundary Scan requires DFT to be more effective• Keysight produces an easy to use, manufacturing

ready boundary scan tester for your production

Keysight x1149Boundary Scan Analyzer

Get it NOW

94

AGENDA:




company



VipeR : Functional Test

How to take advantage of Modular Test Systems

What is PXI? The PCI eXtensions for Instrumentation (PXI) modular instrumentation architecture delivers a rugged, PC-based, and high-performance measurement and automation system.

The PXI Systems Alliance (PXISA) is an industry consortium that promotes and maintains the PXI Standard.

VXI or PXI?Description PXIe VXI Benefit to YOU

Data transfer rate

up to 8GB/s (to system slot)up to 4GB/s (slot to slot)PXI-5 PXI Express hardware specification

up to 320Mb/s(VXIbus Spec, Rev 1.4)

Larger bandwidth for future applications support(e.g. infotainment, telematics, radar)

Mainframe size 4U (M9018A) 8U (E8401A)

More rack space in system for other instruments(e.g. 2 PXI chassis in the future, more power supplies)

No. of slots in mainframe

18 slots (M9018A) 13 slots (up to C-Size)

More instruments can be added to chassis improving instrument density in system

Why to use Modular Instrumentation in ATE Systems?

Users standardize cards and card cages, so they can configure systems as needed.

Based on the PC architecture, so software is readily available.

Lots of development work is currently under way on PXI cards.

PXI is fast and costs less than VXI.

A Typical Production Line Structure

The right solution for right application

Complexity100 Pins 200 Pins

Price

Body ControlDashboard

EPB

Fuel Control

Telematics

LED Driver

Sensor

ABS

SensorDoor

LED Driver

TelematicsEPB

ClustersFuel Control

Transmission Control

Power Train ECU

Body Control

Key

Simple BCM

Immobilizer ECU

RKE Immobilizer

TS-8989VipeR

TS-5040Mercury

TS-5020Lincoln

TS-5400Venturi SIII

Brushless Motor Controller

LightingInfotainment

102

PXI , GPIB, LXI Instruments support

Switch Load Unit

U8989AVipeR

Lead time: 8 weeksWarranty period: 1 years

U8989A (TS8989 VipeR)

World’s only INTEGRATED HIGH-CURRENT SWITCH WITH PXI-BASED MEASUREMENT SYSTEM IN A BOX!

Integrated PXI Chassis and Switch/Load platform

Up to 104 pin countsSuitable for Functional test of Mechatronics applications with high Current and voltage ranges (ideal for Automotive)Up to 40A current loadsNo Rack: It can be setup as bench top system or integrated into a Rack & Stack systemTS-5000 Embedded PC controller - Core i7 2.1GHz processor, 8GB S-DIMM, 500GB HDD SATA, 2x Gigabit Ethernet ports, 4x USB 2.0 ports and 2x USB 3.0 ports with Built-in GPIB controller,

Windows 7, Keysight IO 64-bit, TxSL v7 and TS-5000 v7

VIPER CONCEPT DESIGN

FIXTURE INTERFACE

VIPER INSTRUMENTATION

POWER SUPPLY

Agilent PXI , GPIB & LXI Instruments

Switch Load Unit

Modular Power SuppliesMacpanel Bocks & Cabling

U8972A

N3300 E-Load

Lead time: 8 weeksWarranty period: 1 years

Up to 464 pin countsUp to 40A current loads2.0m rack with solid door and extractor fan3-Phase only PDU with EMO switchPower Distribution Unit (PDM)ThermistorIPC backplane, CPU i5-2400, RAM 8GB, HDD 500GBWindows 7, Keysight IO, TestExec SL 7.1, TS-5000 7.1210 pin & 64 hi-power ICA blocks & cablingN3300A eLoad mainframe & modules1kW, 2kW and 400W Modular Power Supplies

U8972A (TS5400 Venturi-SIII)

Electronic Control Unit (ECU)

CPU

InputBuffers

OutputDriver

s

OutputDriver

s

OutputDriver

sOutputDriver

Driver

InputBuffers

Inputs:Sensors, &

switch inputs

Outputs:Actuators, motors, lamps and others

CAN, LIN, K-LINE, and others

Motors

Motors

Lamps

Lamps

Relays

Relays

Other ECU’s

sensor

sensor

sensor

sensor

sensor

switch

switch

switch

switch

Position sensor

Force Sensor

Wheel Speed Sensor

DUT communication

Actuators

Motors

Lamps

Knock Sensor

Actuators

Actuators

Electronic Control Unit (ECU) (EPB, Simple BCM, Steering Control Unit)

Statistic shows that 1 out of 4 stolen vehicles are stolen by professional thieves. The majority of vehicles are stolen by opportunistic thieves relying on finding older vehicles that have ineffective security or no security at all.

Immobilizers have been mandatory in all new cars sold in Germany since 1 January 1998United Kingdom since 1 October 1998Finland since 1998Australia since 2001Canada since 2007

Example #1 - Immobilizer

Prevent - Hot Wire Prevent - Duplicate Key

Application#1 - Immobilizer

Pin Matrix + DMM

• Relay Switching for test nodes

• Internal Voltage Measurement

• Coil Output Frequency Measurement

• Current Measurement

Load Card + Power Supply

• Relay Switching for power supply input and GND

• Battery Supply to Immobilizer

VBatt

Gnd

Voutput

Signal Input

Data Code

1A 5V

HV-DAQ

• Data Acquisition of data line

output from Immobilizer

131kHz

Example #2 – Simple Body Control

Body control module is responsible for monitoring and controlling various electronic accessories in a vehicle's body.

The BCM communicates with other on-board computers and its main application is controlling load drivers – actuating relays that in turn perform actions in the vehicle such as locking the doors or dimming the salon overhead lamp.

Application#2 – Simple Body Control

Gnd

VBatt

Switches Input

Cargo/Room Lamps etc…

Door/Window Locks…

Wiper/Washer Motors…

8A

5A

4A

40A

1A

Pin Matrix + DMM

• Switching for all test nodes

• All Voltage/Current Measurement

• All Resistance Measurement

Load Card 40A + TITAN Power Supply

• Relay Switching for power supply

• Battery Supply to Body Control Module

Various Load Card

• Different load card for external load connection (E6176A 7.5A, U7179A 15A etc…)

• Pull Up/Down Passive Load to Vbatt or GND

2A Load Card

• Low current load card for discrete input (example U7177A or N9377A)

• Pull Up/Down Passive Load to Vbatt or GND

Value Proposition

Signal Conditionin

g

Value #1 – Large Voltages PXI Instrument

M9186A PXI Voltage / Current Source (2 slot)•LARGE V/I RANGE: 100V output, 200mA output which is suitable for automotive application

•SENSE INPUT: highly accurate voltage / current output with sense line

•No external amplification needed!

M9185A PXI D/A Converter (2 & 3 slot)•HIGH RANGE with REMOTE SENSE: 16V output, 20mA output with better output accuracy

•ISOLATED CHANNELS: independent channels and able to stack up to achieve higher voltages.

•Application examples: Static Analog Input

M9188A PXI Dynamic D/A Converter (1 slot) (Ship on Q3 15)•16 bits resolution up to 500kSa/s output waveform update rate

•Output unipolar voltage up to +30V•Output current up to +20mA•SIMULTANEOUS 16 Channels isolated banks per 4 channels

•Application examples: Dynamic Analog Input (voltage/current)

+100V

+16V

+30V

30V for truck application

16V for most vehicle application

Value #2 – System can Accept PXI Standard Cards from different Vendors

Value #3 – Heavy Duty Switch Load Unit & Loadcards

Matrix Card

Switching speed as fast as 300us

Auxiliary or direct row access relays on each row for DIO or DAC input

Independently switchable series resistance protection on each row.

Value #3 – Continue…

Supports currents up to 40A

Every card allows connection to defined load internally/externally

High current load cards with fuse and fly-back protection for each channel

Single load / Multi-load configuration) for multiple loads application

Load Card

DUT

40A

DUT

Aux

Inst

Value #4 – Keysight Differentiators: Mature Platform (+20 Years), Standardization and Global Support for SW and HW Sustaining

Value #5 –KEYSIGHT Test Exec SL Integration supporting C#, .NET, LabView,

LabWindos/CVI Code

Graphical User Interface

IVI-C Drivers VISA Instrument Specific DLL

PXI Modules (eg M9183A, M9185A)

Standalone Instrument (eg N67xx Power Supplies, e-load)

Switch/Load Unit (eg E6198B,

E6176A)

PC

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us

LA

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GP

IB

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B

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Value #6 – Functional Test Automation Turn Key Integration & Training by Interlatin

Hardware Software

Fixture DevelopmentSW & HW Integration

+

TS-54XX Training

People

VipeR-CAN

Live Demo

Direct connect between system to simple BCM for Bench Top development.

We are sending in real time commands to the BCM to enter the diagnostic mode and to activate a motor output with a resistive load to simulate the real motor,

QUESTIONS?

Thank you