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1 TATA MOTORS LTD. Confidential. For discussion purpose only
Reliability Engineering*
Avinash Dharmadhikari
TATA MOTORS LIMITED
*Background material for presentation at BARC-7th Dec 2012
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29th July
JRD Quality awards: Tata Business Excellence Model
On 29th July 2007:
Mr. Tata ended his address by quoting the President of
Toyota Motor Corporation –
“What we want to be is the best motorcar
company, being the largest is incidental.”
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Quality
Customers perception of the product
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Reliability
Reliability: Quality over time “The ability of an item to perform a required function under stated conditions for a stated period of time”
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How do customers talk about reliability?
“A system that does what I want (function), when and where I want
to use it (conditions), for as long as I want to use it (time)”
“No surprises - no unscheduled downtime” “Get me up and running quickly when failures occur”
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Reliability: Stated in more precise measurable terms
“Probability that a system will perform its intended function
for a specified time t under stated operating conditions”
R(t): reliability at time t
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Design for reliability Process of building reliability into Design
Now
Target
Compliants!
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IDENTIFY DESIGN VALIDATE
VERIFY
ANALYSE
MONITOR AND CONTROL
CONCEPT DESIGN & DEVELOPMENT
MANUFACTURING AND FIELD
RELIABILITY MANAGEMENT
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IDENTIFY
The present status of reliability
Customers expectations
Environmental / usage conditions
Technology limitations / constraints
Required reliability
Gap
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Data sources: present status of reliability using:
•field failures •Internal / supplier rejections •Third party surveys
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IDENTIFY: TOOLS
HOUSE OF QUALITY-QFD,
BENCH MARKING
WARRANTY DATA ANALYSES
RELIABILITY EVALUATION
RELIABILITY APPORTIONMENT (ALLOCATION)
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A stage when detail design actions like drawings, circuit layouts,
supplier selection begin.
DESIGN
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DESIGN: Tools
•Fault Tree Analysis (Historical data support)
•DFMEAs: Product, system, subsystem, components
SEVERITY, OCCURANCE, DETECTION
RPN = S * O * D
AIAG FMEA - 2008
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ANALYSE
First cut rough estimates of product life / reliability / durability / serviceability
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ANALYSE: Tools
•Digital validation:
Strength, tolerance, thermal, NVH, durability
•Reliability block diagrams
•Reliability predictions:
based on historical data / standard data bases
DOE- Parameter design & Tolerance design at digital level
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VERIFY
• Manufacture: ‘PROTO’ as per drawing
• Verify does it meet designer’s intentions
(fitment, functions, performances)
Iterative process where the design weaknesses are to be captured
and re-designing and re-analyses are done where ever needed.
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VERIFY: Tools
Proto: Characteristic matrices, Process flow charts,
PFMEAs
Highly accelerated physical tests ( HALT)
Accelerated tests
Test till failure using customer cycle and environment
Degradation tests using customer cycle and
environment
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VERIFY: Statistical tools:
Sample size determination
DOE
Analyses of data
Prediction of reliability growth
DESIGN REVIEWS BASED ON TEST RESULTS (DRBTR)
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VALIDATION:
Ensure that products made at production rate using final drawings meet customer requirements
VALIDATION: Tools
•All tools of ‘verification’ stage
•Production PFDs, PFMEAs and Control plans
•comparative analysis
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MONITOR AND CONTROL
Assurance of quality over the period of time
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MONITOR AND CONTROL: Tools
•Acceptance sampling schemes,
•On line control charts,
•Audits / Ongoing reliability testing
•Cp, Cpk studies,
•8 D analyses based on field/ EOL complaints
•TGW /TGR leanings
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• Requirements flow from Vehicle down to Components
• Verification/Validation flow from Components up to Vehicle
Vehicle
Systems
components Rate of Production prototypes
Vehicle
Systems
VoC:QFD, Performance, Model, performance needs
VoB: HoQ, Functionals, assemblies Model, functional needs, Analysis
VoB: HoQ, material, dimensions, Model, fitment needs, Analysis
HALT,ALT Test to failure with degradation, screening DOE, Model Prediction
Systems
Functionals, assemblies Model, DOE with noise factors, predictions
Vehicle
Performance, Model, prediction of VoC
,ALT, Goal posts, Test to failure with degradation, correlations with proto, controls Model, Predict
Physical testing, Multiple samples Correlations with proto-systems, controls, Model, predictions
Controls, Performance in customer environment, Model prediction of VoC
Mass production:
controls
Concept, design, analysis, verify, validate, produce
Model: statistical & Engineering
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?
Reliability Modeling
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Data sources:
Digital Physical
OLD
NEW
Lab
Product
field
old product and new product
Establish correlations using old models, predict on new model
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Data types: Material, Dimensions/profiles Fitments,
Data types
1. Piece-to-piece variation
2. Changes to component
characteristics over time
3. Customer duty cycle
4. Climate & road conditions
5. Environment created by
neighboring components
in the system.
•Gaps/flushness
•Functions, NVH /BSR
•Thermals/electrical surge
•Performance
•Reliability
•Durability
•Repair/replacement times
•Life
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A look at Human Life Data: Unit- Age in years
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Bath-Tub Curve (of human mortality rate*)
*Source: National Vital Statistics Reports, Vol. 48, No.18
0.000
0.002
0.004
0.006
0.008
0.010
0.012
0.014
0.016
0.018
0.020
1 10 100 Age (years) - log. scale
Ha
za
rd
20 40
infant
mortality
hand-guns,
drugs,
automobiles,
childbirth
older age
healthy leaving
5
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Life of a Physical product
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Continuous
• Time
• Mileage
• Cycles
Discrete
• Number of spot welds in a frame
• Number of corrosion spots per unit area of sheet metal
Life Variables
Behavior of random variables is described by means of mathematical functions,
which include: density function, distribution function, reliability function, hazard
rate and cumulative hazard function
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Consider a histogram of failure times, t, for a large population of nominally identical parts.
t
f(t)
A mathematical model that approximates the behavior of this histogram is know as the density function and is denoted by f(t).
Distribution Function and Reliability Function
t=t0
t
F(t)
1
F(t0)
t=t0
The distribution function, F(t), represents a proportion of parts failing before a given time t.
F(t0)
The reliability function, R(t), represents a proportion surviving beyond a given time t.
R(t)
R(t0)
R(t0)
animation
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Schematic of the reliability definition
IPTV 100 at 150,000
kms
IPTV in first 6, 12 & 18 months
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Hazard Function
(Instantaneous Failure Rate)
The Hazard rate, h(t), describes the possibility to fail in the next small interval from t0 to t0+Dt, given the survival up to t0
, with an approximate probability of f(t0)*Dt.
Mathematically, the hazard rate is the ratio of the density function to the reliability function: h(t)= f(t)/R(t).
In simpler terms, the hazard rate:
number of part failures at a point in time number of parts at risk at that time
f(t)
t
R(t0)
t=t0
t
h(t)
Dt f(t0)
t=t0
h(t0)
animation
The Hazard (failure rate) can take various forms: increasing (IFR), decreasing (DFR), constant (CFR) and non-monotonous (e.g., first decreasing, then constant, then increasing). Shown on the left is an increasing failure rate (IFR) case.
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Bath-Tub Curve (of a mechanical part failure rate)
h(t)
t infant mortality
noise factor #1: piece-to-piece variation
DFR CFR IFR
Primarily manufacturing
issues
Design issues revealed
under random stress; also, most solid-
state electronics
Design issues related to
wear out or degradation
due to fatigue, corrosion,
wear, creep
random failures
noise factors #3,4,5: customer duty cycle, internal & external environment
wear out
noise factor #2: changes over time/mileage of design strength
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Reliability field
Reliability criteria
Nuclear Aerospace Automotive Medical
# units in the field 00’s 000’s 00000000’s 00000000’s
Quality of field records
Failed Units
Unfailed Units
excellent
excellent
excellent
excellent
fair
none
reasonable->good
none
Units lost to follow-up no no yes often
Noise space moderate moderate complicated complicated
Competing risks no no yes yes
Key reliability strategy redundancy,
intervention
redundancy,
intervention
robustness,
some intervention
intervention
Scientific context deductive deductive Deductive/inductive Deductive/inductive
Key reliability measure probability of
failure
probability of
failure
distance to failure
modes
Local: relative risk of
disease
Design improvement yes yes yes Yes to some extent
Reliability criteria
Is Automotive field closer to Medical or to Nuclear/Aerospace?
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Cumulative Hazard Function
In many cases, the hazard rate estimated from data is subject to “noise” fluctuations, which complicate the recognition of its trend (i.e., IFR, DFR, CFR, etc.) The Cumulative hazard function, H(t), is the integral of the hazard function and is used to “smooth out” the fluctuations of the hazard rate. 0.000
0.0010.0020.0030.0040.0050.0060.0070.0080.009
0 5 10 15 20
time, t
Haza
rd, h(t
)
0.000
0.020
0.040
0.060
0.080
0.100
0.120
Cum
Haza
rd, H
(t)
H(t) = t
0
h(u)du
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Cumulative Hazard Function (cont’d)
Cumulative hazard is always a non-decreasing function of time. If the cumulative hazard is concave, the respective failure rate is an DFR; if it’s convex - the respective failure rate is a IFR; if it’s linear – the respective failure rate is a CFR.
t
H(t)
t
h(t)
animation
IFR CFR
DFR
IFR
CFR
DFR
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Nature of the life data
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V IN F a ile d /S e rv ic e d
C o m p o n e n t
F a ilu re /S e rv ic eM ile a g e
X 0 0 9 B a tte ry 4 5 0 0 0X 0 1 8 F u e l p u m p 9 1 6 8 0X 0 2 1 B ra k e p a d s 7 8 4 7 0X 0 0 6 F ro n t w ip e rs 7 7 3 5 0X 0 2 8 H e a d la m p 4 0 0 7X 0 1 5 C lu tc h d is k s 1 5 0 4 0 0X 0 3 1 F ro n t w ip e rs 5 1 4 2 0X 0 0 3 Ig n . S w itc h 3 9 6 1X 0 1 3 B a tte ry 1 6 8 9 0X 0 0 7 F ro n t s tru ts 2 7 1 6 0X 0 2 6 B a tte ry 7 2 2 8 0X 0 3 1 B a tte ry 1 3 1 9 0 0X 0 2 7 D o o r lo c k 7 2 9 8X 0 1 7 F u e l p u m p 4 7 3 4X 0 2 3 B a tte ry 1 7 2 0 0X 0 2 5 B a tte ry 7 4 5 4X 0 1 4 H e a d la m p 2 3 0 6 0X 0 2 9 F ro n t s tru ts 1 0 1 9 0X 0 1 6 B a tte ry 6 9 0 4 0X 0 1 9 B a tte ry 5 2 4 8X 0 0 8 B ra k e p a d s 4 0 0 6 0X 0 1 2 B ra k e p a d s 6 1 9 6 0X 0 1 2 C lu tc h d is c s 1 0 5 7 0 0X 0 0 5 B a tte ry 4 9 3 9 0X 0 2 0 H e a d la m p 2 8 6 9 0X 0 1 1 F ro n t s tru ts 4 5 6 7 0X 0 2 5 B a tte ry 4 6 5 8 0X 0 2 2 D o o r lo c k 3 7 1 0 0X 0 1 0 C lu tc h d is k s 5 3 0 0 0X 0 0 2 B a tte ry 3 8 7 0 0X 0 2 4 F ro n t w ip e rs 6 0 5 4X 0 0 1 C lu tc h d is k s 6 9 6 3 0X 0 0 4 B ra k e p a d s 1 0 6 3 0 0X 0 3 0 F ro n t w ip e rs 6 7 0 0 0
D a ta A n a ly s is
C o m p lic a tio n s :
3 ) fa ilu re /c e n s o r in g
o n th e s a m e V IN
4 ) m u ltip le fa ilu re s
o n th e s a m e V IN
5 ) m u ltip le c e n s o r in g
o n th e s a m e V IN
2 ) v a ry in g ra te s o f
m ile a g e
a c c u m u la tio n
1 ) s ta g g e re d v e h ic le
s ta r t t im e
Censoring – Case study
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sr. no Failure_Mode Total1 Battery 102 Br_pads 33 clutch_disk 44 Door_Lock 25 Fr_strut 36 Fr_wiper 37 fuel_Pump 28 Head_lamp 39 Ignition_switch 1
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Method of analysis- depends upon size and nature of data -Non parametric -Parametric
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Example-1: Six proto types on test are monitored at 0, 500 and 1000 hrs. Each proto has two failure modes. Data is as shown in figure 1.
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500 hrs 1000 hrs 0 hrs
FM1
FM2
FM2
FM1
FM1
RUNOUT (survived)
Predict Hazard h(ti ), Cum Hazard H(t) and Reliability R(t) wrt FM-1
figure1: Six components on test: two potential failure modes
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Censoring
Typically, when test or field data are analyzed, some parts can be found unfailed, and
the only knowledge about their failure times is that these times are beyond (i.e., to
the right on the time axis of) the observation time. These data are said to be right
censored.
A failure time know only to be before (i.e., to the left on the time axis of) a given time
is said to be left censored. For example, a part is found to have already failed at the
time of its first examination.
Legend:
observation time
right censored observation
left censored observation
starting time
unknown failure time
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Right censoring and left censoring are special cases of interval censoring,
i.e., when a part is found Unfailed at the beginning of the observation period and
is found failed at the end of the observation period.
Most typical in engineering applications is the case of right censoring,
which may occur due to stopping a test at a predetermined run time,
breaking down of a test facility or
part failing due to a competing failure mode
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non parametric method: Based on data no statistical model
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500 hrs 1000 hrs 0 hrs
FM1
FM2
FM2
FM1
FM1
RUNOUT (survived)
figure1: Six components on test: two potential failure modes
Time (hrs) 0 500 1000
Number of parts at risk 6 6 2
Number of failures due to FM1 0 2 1
Number of failures due to FM2
0 0 2
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the hazard rate: h(t) =
number of part failures at a point in time
number of parts at risk at that time
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Nonparametric Hazard Analysis (wrt FM1):
500 hrs 1000 hrs 0 hrs
FM1
FM2
FM2
FM1
FM1
RUNOUT (censored)
Hazard h(ti ) 0 2/6 1/2
Cum Hazard H(t)=S h(ti ) 0 2/6 5/6
Reliability R(t)=exp{-H(ti )} 1 0.72 0.43
Six components on test: two
potential failure modes
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Example-2: seven proto types on test are monitored at 0, 250, 500,750 and 1000 hrs. Each proto has two failure modes. Data is as shown in figure 2.
What is reliability of the product at 1500 hrs?
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Predict reliability of the product at 1500 hrs
X
X
X
O
survived
O
X : Failure mode 1 O: Failure mode 2
Figure 2: seven components on test: two potential failure modes
Component-1
Component-2
Component-4
Component-3
Component-5
Component-6
Component-7
Component-8
Removed from the test
Hrs 0 250 400 500 750 1000 1500
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0 250 400 500 750 1000 1500number of
components at risk 8 8 6 5 4 3 2
number of componets failed due to FM1 0 2 0 1 0 0 0
number of componets failed due to FM2 0 0 0 0 1 1 0
number of components removed
from test0 0 1 0 0 0 0
Time in Hrs
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0 250 400 500 750 1000 1500h1(t): hazard_rate of
FM10 0.333 0 0.25 0 0 0
H1(t): cum
hazard_function of
FM1
0 0.333 0.333 0.583 0.583 0.583 0.583
R1(t): Reliability
function due to FM11 0.7165 0.7165 0.5580 0.5580 0.5580 0.5580
Time in Hrs
h1(t)= (row 2)/ (row 1)
H1(t)=Σ h1(u) u≤ t
R1(t)= Exp(-H(t))
0 250 400 500 750 1000 1500number of
components at risk 8 8 6 5 4 3 2
number of componets failed due to FM1 0 2 0 1 0 0 0
number of componets failed due to FM2 0 0 0 0 1 1 0
number of components removed
from test0 0 1 0 0 0 0
Time in Hrs
Reliability due to FM1
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Reliability due to FM2
0 250 400 500 750 1000 1500number of
components at risk 8 8 6 5 4 3 2
number of componets failed due to FM1 0 2 0 1 0 0 0
number of componets failed due to FM2 0 0 0 0 1 1 0
number of components removed
from test0 0 1 0 0 0 0
Time in Hrs
0 250 400 500 750 1000 1500h2(t): hazard_rate of
FM20 0 0 0 0.250 0.333333 0
H2(t): cum_hazard_
function of FM20 0 0 0 0.250 0.583 0.583
R2(t): Relibilty
function due to FM21 1 1 1 0.7165 0.4346 0.4346
Time in Hrs
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Component reliability would be: R1(t) * R2(t)
0 250 400 500 750 1000 1500R1(t): Reliability
function due to FM11 0.7788 0.7788 0.6376 0.6376 0.6376 0.6376
R2(t): Relibilty
function due to FM21 1 1 1 0.7165 0.4346 0.4346
Reliability of the
component1 0.7788 0.7788 0.6376 0.4569 0.2771 0.2771
Time in Hrs
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If root cause analysis of FM1 is done successfully and it is removed What would be improved reliability?
No new testing at this stage: Assume that component will not fail due to FM1: Revise the risk set
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0 250 400 500 750 1000 1500number of
components at risk8 8 7 6 5 4 2
h2(t): hazard_rate of
FM20 0 0 0 0.2 0.25 0
H2(t): cum
hazard_function of
FM2
0 0 0 0 0.2 0.45 0.45
R(t) due to FM2 only 1 1 1 1 0.8187 0.6376 0.6376
Time in Hrs
0 250 400 500 750 1000 1500number of
components at risk 8 8 6 5 4 3 2
number of componets failed due to FM1 0 2 0 1 0 0 0
number of componets failed due to FM2 0 0 0 0 1 1 0
number of components removed
from test0 0 1 0 0 0 0
Time in Hrs
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Limitations of non parametric methods
No extrapolations Less precision
Alternative: Parametric models for distribution function
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Distributions commonly used to model the life- variables
1. Exponential
2. Weibull
3. Ln normal
Exponential distribution is a special case of weibull distribution
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Density function, f (t )
Life Variable, T
b =0.5
b =1b =3
b =2
Reliability function, R (t )
0
1
Life Variable, T
b =0.5b =1
b =3b =2
Hazard function, h (t )
Life Variable, T
b =0.5b =1
b =3
b =2
Cumulative hazard function,
H (t )
Life Variable, T
b =0.5
b =1
b =3
b =2
Parametric Analysis:
Weibull Distribution
))/t(exp(tb)t(f bbb 1
})/(exp{)( bttR
scale parameter
b shape parameter
b>1: IFR
b=1: CFR
b<1: DFR
1 bbtb)t(h b)/t()t(H
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Run MINITAB file
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Parametric Analysis: Linearizing Weibull
As an example, consider the equation of Weibull unreliability function:
After rearranging and taking double log of both sides, we obtain the equation of a straight line (Y = Ax + B):
where the slope is the estimate of the Weibull shape parameter
and the intercept is the estimate of the Weibull scale parameter
})/t(exp{)t(R)t(F b 11
BxAY
))ln(b()tln()b())t(Rln(ln(
Ab̂
)A/Bexp(ˆ
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Use soft wear to estimate the parameters of weibull distribution
step 1: estimate R(t) for each t. step 2: use (t, R(t)) pairs to estimate parameters of the weibull distribution
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Reliability organization
Mind set
Engineering + statistics Stat
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Organization: Go back to slide # 4
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IDENTIFY DESIGN VALIDATE
VERIFY
ANALYSE
MONITOR AND CONTROL
CONCEPT DESIGN & DEVELOPMENT
MANUFACTURING AND FIELD
RELIABILITY MANAGEMENT
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Reliability engineer
Marketing + Customer service
Engineering + Manufacturing+ Assembly
Workshop on 'Reliability and Life Assessment of Electronic Systems - Methods & Techniques'
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Reliability Block Diagrams for System Reliability
A complex system is made up of sub-systems and components.
• Each component/subsystem has its own reliability that can be
modeled using various distributions
• We can use reliability block diagrams to estimate system
reliability
2.
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The combined reliability of blocks in series equals the
product of reliabilities of each block.
monitor R1= 0.9379
cpu R2 = 0.9979
mouse R3 = 0.9998
Series system: Personal computer
Rs = 0.9379 * 0.9979 * 0.9998 = 0.9357
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If reliability of PC has to be 0.9999 at mission time t
One way to select the component is
monitor R1= 0.999967
cpu R2 = 0.999967
mouse R3 = 0.999967
Rs = 0.99967 * 0.999967 * 0.999967 = 0.9999
72 TATA MOTORS LTD. Confidential. For discussion purpose only
If reliability of PC has to be 0.9990 and
best available supplier of CPU provides CPU with
reliability 0.999999, then,
monitor and mouse with reliabilities 0.99901,
are acceptable to achieve system reliability
0.999.
Workshop on 'Reliability and Life Assessment of Electronic Systems - Methods & Techniques'
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The combined unreliability (1- reliability) of blocks in
parallel equals the product of unreliability of each block.
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Parallel System
A document sorting machine requires a small light source
that is used to detect the presence of a document.
In order to increase Reliability two light sources are used.
Reliability diagram is
Light source 0.977
Light source 0.977
In this case the reliability would be
Rs = 1- (0.023 * 0.023) = 0.999
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75 TATA MOTORS LTD. Confidential. For discussion purpose only
Combination Series And Parallel Systems
The important thing to remember in a combined system is to solve the reliability of the parallel system First, Then use it in series to solve the series system reliability.
Example: Input Output
Formula: R2,3 parallel = 1 – U2 x U3 System = R1 x R2,3 x R4
= 1 – (0.10 x 0.10) = 0.95 x 0.99 x 0.99 = 1 – 0.10 = 0.93 = 0.99
R1 =0.95
R3 = 0.9
R2 = 0.9
R4 = 0.99
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