bare board tester catalogueallenwoodsgroup.com/pdf/microcraftemma2016.pdf06.2016 bare board tester...

06.2016

Bare Board Tester Catalogue

“EMMA” – Innovation of PCB TestingComplete Machine Lineup Capable of Addressing Your Needs

E8M6151 F2S3325 F2M9172SH2

E4S3325

Headquarters630-2 Tanaka, Kita-ku, Okayama 700-0951 JAPANTEL: +81-86-241-6681 FAX: +81-86-241-7052

Tokyo1-2-14 Tamagawa, Ohta-ku, Tokyo 146-0095 JAPANTEL: +81-3-5732-3700 FAX: +81-3-3756-9601

Tanaka Factory617-17 Tanaka, Kita-ku, Okayama, 700-0951 JAPANTEL: +81-86-805-8825 FAX: +81-86-244-8876

E-mail: [email protected]

Technical Support and Service Centers

MicroCraft K.K.

Distributors

Printed in Japan 1606-MM (SKKYI160601E)

Machine speci�cation may not be met entirely due to the environment in which MicroCraft product or products are placed. MicroCraft shall not be responsible for any failure and/or loss caused using such products for production and/or testing.

Speci�cations valid as of June 2016. Speci�cations are subject to change without notice. The product names are generally registered trademarks of each manufacturer.

Mainland ChinaTEL: +86-21-6818-3770

India#29/30, Ground Floor Shantha Krishna, Subramanyapura Main Road, Uttrahalli Bangalore 560061TEL: +91-80-26393254 /74 FAX: +91-80-26393267

MicroCraft K.K. Shanghai Regional Office

MicroCraft K.K. India Regional Office

KoreaA-1504, Gunpo IT Valley,17, Gosan-ro 148beon-gil, Gunpo-si, Gyeonggi-do, 15850, KoreaTEL: +82-31-452-6546 FAX: +82-31-452-6548

MicroCraft Korea Co., Ltd.

U.S.A.1941 E. Miraloma Ave Suite A Placentia, CA 92870.TEL: +1-714-482-2550 FAX: +1-714-993-3258

USA MicroCraft, Inc.

BrazilR.Jose de Carvalho 226, 04714-020 San Paulo-SP-BrazilTEL: +55-11-5182-9229 FAX: +55-11-5182-5552

Pa�aro C S Ltda.

Taiwan / Mainland ChinaNo. 250, Sec. 1, Nan-San Rd., Lu-Chu, Taoyuan, Taiwan 338TEL: +886-3-212-8668 FAX: +886-3-212-7668

Jensys Corporation

Taiwan / Mainland China10F, No. 155, Dayou Rd., Taoyuan Dist., Taoyuan City 330, TaiwanTEL: +886 3 331 2188 FAX: +886-3-3311-877

ISMART TECHNOLOGY CO., LTD.

Singapore / Malaysia / Thailand51, Bukit Batok Crescent #08-41/42, Unity Centre Singapore 658077TEL: +65-6261-1933 FAX: +65-6261-1938

PCB GRAPHTECH PTE LTD.

UKUnit 15, Bordon Trading Estate, Old Station Way, Bordon, Hampshire GU35 9HHTEL: +44 (0)1420 485960 FAX: +44 (0)1420 488233

Viking Test Services

SpainAvda. Madrid,19-Naves 7-8 Pol. Ind. Albresa 28342 Valdemoro. Madrid SpainTEL: +34 918083170 FAX: +34 918083171

Comercial Electronica Feijoo, S.L.

RussiaVolodarskogo Street 49A, 305000 Kursk RussiaTEL: +7-4712-545417 FAX: +7-4712-708885

Sovtest ATE

GermanyGewerbestr. 4 D - 83043 Bad Aibling GermanyTEL: +49 80 61-35 06 0 FAX: +49 80 61-35 06 29www.sat.eu

SAT - Electronic Vertriebs GmbH

Moving Probe Tester EMMA

6,000 Test Points/mins.

9,000 Test Points/mins

Min. Pad Size 10µm

Max. stackable boards: 200 Boards

MicroCra�’s EMMA Series have revolutionized the entire Bare Board Testing Industry. Ever since its release in 1994, MicroCra� has been successfully improving its EMMA through continuously implementing innovative technology.

EMMA (First Generation)

First Popular Model

Evolvement to EMX Model

Evolvement to E4M Model

Super High Accuracy ModelF2 Series8 probe system evolved to E8 Series

Vertical Automation Model

EMMA continues to be the Industry’s Top Brand a�er decades from its initial release

Ever Improving Speed & AccuracyTogether with Abundant Lineup

EVOLUTIONHISTORY

Installation and Customer Support Structure Abundant Line-up

With its innovative technical advancements, MicroCra�s EMMA has been recorded to have the top speed in the industry. When the �rst model was released testing 350 test-points/mins MicroCra� was viewed as an innovative technical breakthrough. Since then EMMA series had continued to make signi�cant improvements through implementing new technologies. Contact probes used in EMMA are now up to Type 7 / Type 8 which allows for quick tip change over and an easy to use pressure knob adjuster. �e current standard model E4M6151 tests 6,000 points /mins, and our 8 probe machine tests with 9,000 test points/mins. Together with rapidly increasing speed, testing accuracy has also been improved as our high accuracy model is capable of testing minimum pad size of 10µm. Furthermore, options of using series of external measurement devices are now available to o�er even greater variety of testing, together with alternative of full automation and various custom models to address speci�c needs of our customers. MicroCra� will continue to innovate our EMMA series to o�er most suitable solution to your testing �oor.

EMMA Installation by LocationsEMMA Series with Superior Testing Speed and Accuracy

High Speed Testing with 4 Probes

High Accuracy Test with Phase Di�erent Measurement

Full Automation allows 24hrs unattended testing

Customer Support Structure

USA China

Taiwan

S. Korea

GermanyRussia

Others

Japan (Okayama) MicroCraft K.K. (Headquarter)Japan (Tokyo) MicroCraft K.K. (Tokyo)U.S.A. U.S.A. MicroCraft, Inc.Korea MicroCraft Korea Co., Ltd.China MicroCraft K.K. Shanghai Regional. O�ceIndia MicroCraft K.K. India Regional. O�ce

Technical Support & Service Center Distributors

Taiwan, Mainland China Jensys Corporation / ISMART TECHNOLOGY CO., LTD.Singapore, Malaysia, Thailand PCB GRAPHTECH PTE LTD.UK Viking Test ServicesGermany SAT - Electronic Vertriebs GmbHSpain Comercial Electronica Feijoo, S.L.Russia Sovtest ATEBrazil Pattaro C S Ltda.

Over 1,600Machines Installed

Worldwideas of April 2016

18%15%

3%1.5%

EMMA is a �xtureless �ying probe continuity tester that conducts continuity and isolation test to both top and bottom sides of the board at the same time with its unique contact probes. One of the prevalent advantages of EMMA is that it does not require a �xture jig for either continuity or isolation test. �is has allowed decrease in testing preparation time. �e EMMA ensures shorter testing process even for the boards in small lots or �ne pitch multilayer boards. Installation of EMMA have decreased the number of faulty boards in the production, and have contributed to custom-ers in increasing their productivity. Ever since its initial release in 1994, EMMA had quickly became the Bare Board Tester industry’s leading brand and continues to be innovated with MicroCra�’s latest technologies. To this day, EMMA continues to satisfy custom-ers and with over 1,600 testers sold throughout the world, we are proud of this achievement. MicroCra� has strategically placed quali�ed technical sta� experts that are willing and ready to assist every customer no matter where the location. Given the time sensitive industry, we are here to assist customers at anytime and will always perform above customers expectations.

19941999

20012012

Moving Probe Tester EMMA

6,000 Test Points/mins.

9,000 Test Points/mins

Min. Pad Size 10µm

MicroCra�’s EMMA Series have revolutionized the entire Bare Board Testing Industry. Ever since its release in 1994, MicroCra� has been successfully improving its EMMA through continuously implementing innovative technology.

EMMA (First Generation)

First Popular Model

Evolvement to EMX Model

Evolvement to E4M Model

Super High Accuracy ModelF2 Series8 probe system evolved to E8 Series

Vertical Automation Model

EMMA continues to be the Industry’s Top Brand a�er decades from its initial release

Ever Improving Speed & AccuracyTogether with Abundant Lineup

EVOLUTIONHISTORY

Installation and Customer Support Structure Abundant Line-up

With its innovative technical advancements, MicroCra�s EMMA has been recorded to have the top speed in the industry. When the �rst model was released testing 350 test-points/mins MicroCra� was viewed as an innovative technical breakthrough. Since then EMMA series had continued to make signi�cant improvements through implementing new technologies. Contact probes used in EMMA are now up to Type 7 / Type 8 which allows for quick tip change over and an easy to use pressure knob adjuster. �e current standard model E4M6151 tests 6,000 points /mins, and our 8 probe machine tests with 9,000 test points/mins. Together with rapidly increasing speed, testing accuracy has also been improved as our high accuracy model is capable of testing minimum pad size of 10µm. Furthermore, options of using series of external measurement devices are now available to o�er even greater variety of testing, together with alternative of full automation and various custom models to address speci�c needs of our customers. MicroCra� will continue to innovate our EMMA series to o�er most suitable solution to your testing �oor.

EMMA Installation by LocationsEMMA Series with Superior Testing Speed and Accuracy

High Accuracy Test with Phase Di�erent Measurement

Full Automation allows 24hrs unattended testing

Customer Support Structure

USA China

Taiwan

S. Korea

GermanyRussia

Others

Japan (Okayama) MicroCraft K.K. (Headquarter)Japan (Tokyo) MicroCraft K.K. (Tokyo)U.S.A. U.S.A. MicroCraft, Inc.Korea MicroCraft Korea Co., Ltd.China MicroCraft K.K. Shanghai Regional. O�ceIndia MicroCraft K.K. India Regional. O�ce

Technical Support & Service Center Distributors

Taiwan, Mainland China Jensys Corporation / ISMART TECHNOLOGY CO., LTD.Singapore, Malaysia, Thailand PCB GRAPHTECH PTE LTD.UK Viking Test ServicesGermany SAT - Electronic Vertriebs GmbHSpain Comercial Electronica Feijoo, S.L.Russia Sovtest ATEBrazil Pattaro C S Ltda.

Over 1,600Machines Installed

Worldwideas of April 2016

18%15%

3%1.5%

EMMA is a �xtureless �ying probe continuity tester that conducts continuity and isolation test to both top and bottom sides of the board at the same time with its unique contact probes. One of the prevalent advantages of EMMA is that it does not require a �xture jig for either continuity or isolation test. �is has allowed decrease in testing preparation time. �e EMMA ensures shorter testing process even for the boards in small lots or �ne pitch multilayer boards. Installation of EMMA have decreased the number of faulty boards in the production, and have contributed to custom-ers in increasing their productivity. Ever since its initial release in 1994, EMMA had quickly became the Bare Board Tester industry’s leading brand and continues to be innovated with MicroCra�’s latest technologies. To this day, EMMA continues to satisfy custom-ers and with over 1,600 testers sold throughout the world, we are proud of this achievement. MicroCra� has strategically placed quali�ed technical sta� experts that are willing and ready to assist every customer no matter where the location. Given the time sensitive industry, we are here to assist customers at anytime and will always perform above customers expectations.

19941999

20012012

L Series

�e EMMA lineup has the ability to test a variety of products from �ne-pitch and �exible to boards in larger size

Budget Model

High Accuracy Model

Super High Accuracy Model

E4S6151/E4S3325

E4L6151 E4H6151/E4H3325

E4L6151

E4H6151/E4H3325

E4S6151/E4S3325

Large Size Model

Standard Model

E4M6151

E4M6151/E4M6151L/

E4M6151L

E4M8161

Extra Large Size Model

EMX12181/EMX15281

EMX15281

EMX12181/EMX15281

Standard Model

Budget Model

E8M6151

E8L6151

E8M6151/E8L6151

M Series

M Series S SeriesL Series E8 Series

H Series

Core Model in EMMA LineupCorresponds to various test floor needs

Developed to test larger size boards (burn-in, backplane, and back boards). One of the significant advantages comes from implementing Dual-Servo Drive for movement along horizontal axis. This has achieved conducting high speed testing in this extra-large size without limitation.

Standard Model in EMMA Series with test speed of 6,000 Points/Min. Corresponds to testing various types of boards, from large size to high density and FPC boards.

Inexpensive Model developed based on E4M6151. Manual clamp used in this model allows operators to smoothly attach/remove the testing boards.

Model best suitable for testing larger size boards (burn-in and backplane boards). Despite its greater size, high speed testing is still secured with higher alignment accuracy.

Offers Extreme High Accuracy Testing through Type8 Probe

Extreme high accuracy testing was achieved by Type8 usage. E4S6151 corresponds to testing standard sized board with up to min. pad size of 15µm and min. pad pitch of 45µm. Whereas E4S3325 is specifically designed for testing package boards like general CSP and Flip-Chip with up to min. pad size of 10µm and min. pad pitch of 40µm.

Developed based on E4M6151Offers Great Cost Performance

Worldwide bestselling budget model o�ers high speed testing with simplified clamp system

Dramatically improved probing accuracy achieved testing high density fine pitch boards that were not testable with the standard model. E4H6151 corresponds to testing standard sized board with up to min. pad size of 20µm and min. pad pitch of 50µm. Whereas E4H3325 is specifically designed for testing high density general module and mother boards with up to min. pad size of 15µm and min. pad pitch of 45µm.

Accomplishes greater probing accuracy compared to standard modelSuitable for testing high-density and fine-pitch boards

Revolutionizing E8 SeriesExponential High Speed Testing with 9,000 Test-Points/min.

Four probes mounted on the each side of the tester moves freely to record exponentially high test speed. Over 9,000 Test-Points/min. was accomplished by the combination of increasing probe e�iciency and polished software control. While maintaining the fastest test speed, resolution of 2µm and repeatable accuracy of ±4µm is capable.

Cost e�icient budget model for 8 probe system. Test Speed is equivalent of E8M6151.

H Series E8 SeriesS Series

Enhanced Rigidity of Probe

New controlling method and servo motor

Type 8 Probe is a probe exclusive to E4S/F2S and combines “low witness mark”, “precise positioning” and “high speed” in greater level.

Equipping servo motor and utilizing new controlling method have allowed dramatic increased in the range of deceleration control when probing. Thus, now it is

possible to softly contact the target at high speed while suppressing the vibration, resulting in extremely low witness mark

compared to conventional probe.

Probe is the final part to complete the precise positioning, however it is also the part that is influenced by numerous external factor. For example, temperature is one of these factor. MicroCraft have reconsidered all material and modified the design of the parts used to build the probe in order to enhance the rigidity and thus be insulates from the influence of external factor.

Type8 Probe

Max. Test Area: 24 x 20” (610 x 510mm) Max. Test Area: 24 x 20” (610 x 510mm) / 13 x 9.8” (330 x 250mm)

Max. Test Area: 24 x 20” (610 x 510mm) / 13 x 9.8” (330 x 250mm)

Max. Test Area: 32 x 24” (810 x 610mm)

Max. Test Area: 47 x 31.5” (1200 x 800mm) / 59.8 x 31.8” (1520 x 810mm)

Witness mark when contacting 20µm pad

L Series

�e EMMA lineup has the ability to test a variety of products from �ne-pitch and �exible to boards in larger size

Budget Model

High Accuracy Model

E4S6151/E4S3325

E4L6151 E4H6151/E4H3325

E4L6151

E4H6151/E4H3325

E4S6151/E4S3325

Large Size Model

Standard Model

E4M6151

E4M6151/E4M6151L/

E4M6151L

E4M8161

Extra Large Size Model

EMX12181/EMX15281

EMX15281

EMX12181/EMX15281

Standard Model

Budget Model

E8M6151

E8L6151

E8M6151/E8L6151

M Series

M Series S SeriesL Series E8 Series

H Series

Core Model in EMMA LineupCorresponds to various test floor needs

Developed to test larger size boards (burn-in, backplane, and back boards). One of the significant advantages comes from implementing Dual-Servo Drive for movement along horizontal axis. This has achieved conducting high speed testing in this extra-large size without limitation.

Standard Model in EMMA Series with test speed of 6,000 Points/Min. Corresponds to testing various types of boards, from large size to high density and FPC boards.

Inexpensive Model developed based on E4M6151. Manual clamp used in this model allows operators to smoothly attach/remove the testing boards.

Model best suitable for testing larger size boards (burn-in and backplane boards). Despite its greater size, high speed testing is still secured with higher alignment accuracy.

Offers Extreme High Accuracy Testing through Type8 Probe

Extreme high accuracy testing was achieved by Type8 usage. E4S6151 corresponds to testing standard sized board with up to min. pad size of 15µm and min. pad pitch of 45µm. Whereas E4S3325 is specifically designed for testing package boards like general CSP and Flip-Chip with up to min. pad size of 10µm and min. pad pitch of 40µm.

Developed based on E4M6151Offers Great Cost Performance

Worldwide bestselling budget model o�ers high speed testing with simplified clamp system

Dramatically improved probing accuracy achieved testing high density fine pitch boards that were not testable with the standard model. E4H6151 corresponds to testing standard sized board with up to min. pad size of 20µm and min. pad pitch of 50µm. Whereas E4H3325 is specifically designed for testing high density general module and mother boards with up to min. pad size of 15µm and min. pad pitch of 45µm.

Accomplishes greater probing accuracy compared to standard modelSuitable for testing high-density and fine-pitch boards

Revolutionizing E8 SeriesExponential High Speed Testing with 9,000 Test-Points/min.

Four probes mounted on the each side of the tester moves freely to record exponentially high test speed. Over 9,000 Test-Points/min. was accomplished by the combination of increasing probe e�iciency and polished software control. While maintaining the fastest test speed, resolution of 2µm and repeatable accuracy of ±4µm is capable.

Cost e�icient budget model for 8 probe system. Test Speed is equivalent of E8M6151.

H Series E8 SeriesS Series

Enhanced Rigidity of Probe

New controlling method and servo motor

Type 8 Probe is a probe exclusive to E4S/F2S and combines “low witness mark”, “precise positioning” and “high speed” in greater level.

Equipping servo motor and utilizing new controlling method have allowed dramatic increased in the range of deceleration control when probing. Thus, now it is

possible to softly contact the target at high speed while suppressing the vibration, resulting in extremely low witness mark

compared to conventional probe.

Probe is the final part to complete the precise positioning, however it is also the part that is influenced by numerous external factor. For example, temperature is one of these factor. MicroCraft have reconsidered all material and modified the design of the parts used to build the probe in order to enhance the rigidity and thus be insulates from the influence of external factor.

Type8 Probe

Max. Test Area: 24 x 20” (610 x 510mm) Max. Test Area: 24 x 20” (610 x 510mm) / 13 x 9.8” (330 x 250mm)

Max. Test Area: 47 x 31.5” (1200 x 800mm) / 59.8 x 31.8” (1520 x 810mm)

Witness mark when contacting 20µm pad

Shuttle B sets up the next board while waiting the test on

Shuttle A to complete Test (Shuttle A)

Shuttle A Shuttle BMoving Probe Tester

Test(Shuttle A)

SetPanel

Shuttle A returns to original position after test is complete.

Meanwhile Shuttle B starts the test and Shuttle A sets up

the next board.

Changeover

Test(Shuttle B)

Loader UnloaderMoving Probe Tester

Loader UnloaderMoving Probe Tester Unloader

PASS FAIL

AL Series

Together with High Speed and Accuracy Testing, EMMA Corresponds to Full Automation

Standard Model with Full Automation

High Accuracy Model with Full Automation

Super High Accuracy Model with Full Automation

F2S6151/F2S3325

High Accuracy Model

F2H6151/F2H3325Medium and High Volume Production Model with Full Automation

Max. Test Area: 15.7 x 13” (400 x 330mm)

F4H4033AL

F2 Series

Corresponds to testing touch panel, film material, and flexible board. Boards without Netlist can also be tested by comparing the value from Phase Difference Measurement with recorded value from the good board.

Extreme High Accuracy Testing is made possible through the use of Type8 Probe. F2S6151 corresponds to testing standard sized board with up to min. pad size of 15µm and min. pad pitch of 45µm. Whereas F2S3325 is specifically designed for testing general package boards such as CSP and Flip Chip up to min. pad size of 10µm and min. pad pitch of 40µm. * Door design may defer depending on the specification.

High accuracy model from F2 Series. F2H6151 corresponds to testing standard sized board with up to min. pad size of 20µm and min. pad pitch of 50µm. Whereas F2H3325 is specifically designed for testing general module board and high density mother board with up to min. pad size of 15µm and min. pad pitch of 45µm.* Door design may defer depending on the specification.

Fully Automated 24hrs unattended testing now possible with AL series

EMMA with vertical type full automation. With newly developed auto loader/unloader on the side 24 hours unattended testing is now possible. Once the boards are stacked on the loader, suction pads automatically conveys the boards to the test area. Once the test is complete, boards are speedily transferred to unloader, and segregated to white and black boards.

High accuracy testing with full automation is available in this model. Instead of using robotic picking method for board transfer, inline conveyer-belt is implemented. By correctly adjusting the height and speed of conveyer it gives the option of connecting our full automation to other inline equipment from other manufactures. Also, by using the optional Automatic Size Adjustment Function, necessary size information for conveyer rail in test area and location of suction pad can be preprogrammed to o�er unattended 24 hours testing.

F2H6151/F2H3325F2S6151/F2S3325

F2M9172/F2M9172SH/F2M9172SH2 F4H4033ALE4M6151AL/E4H6151AL/E4S6151AL

Large Size Model

Max. Test Area: 35.8 x 28.3” (910 x 720mm)

F2M9172

Shuttle Table Model

F2M9172SH/F2M9172SH2

Larger Size Model corresponds to larger board, touch panel, and glass boards. * Door design may defer depending on the specification.

Larger Size Model connected to the shuttle table achieved dramatic increase in throughput production. SH stands for single shuttle (shuttle x1) and SH2 stands for dual shuttle (shuttle x2).* Door design may defer depending on the specification.

E4M6151AL

E4H6151AL

E4S6151AL

Boards Transfer Method: Conveyer Method

*Multiple boards with di�erent size may be stacked at same time.

*PASS/FAIL stacker may be installed indi�erent place to separate into white/black.

*Conventional E4M. E4H, and E4S cannot be connected to full automation

Max. Stackable Boards

Autoloader: 200 pcs (when board thickness is 1.6mm. Max. stackable weight: 80kg)

Unloader: PASS Boards 200 pcs, FAIL Boards 60 pcs

(when board thickness is 1.6mm. Max. stackable weight: 80kg)

Inclusion of stamp unit is available (Optional). Supports multi-image boards

F2 Series AL Series

* Picture is of F2M9172SH2

TopView

Type 8 Probe is a probe exclusive to E4S/F2S and combines “low witness mark”, “precise positioning” and “high speed” in greater level.(Refer P4 for detail)

Type8 Probe

TopView

Shuttle B sets up the next board while waiting the test on

Shuttle A to complete Test (Shuttle A)

Shuttle A Shuttle BMoving Probe Tester

Test(Shuttle A)

SetPanel

Shuttle A returns to original position after test is complete.

Meanwhile Shuttle B starts the test and Shuttle A sets up

the next board.

Changeover

Test(Shuttle B)

Loader UnloaderMoving Probe Tester

Loader UnloaderMoving Probe Tester Unloader

PASS FAIL

AL Series

Together with High Speed and Accuracy Testing, EMMA Corresponds to Full Automation

Standard Model with Full Automation

High Accuracy Model with Full Automation

Super High Accuracy Model with Full Automation

F2S6151/F2S3325

High Accuracy Model

F2H6151/F2H3325Medium and High Volume Production Model with Full Automation

Max. Test Area: 15.7 x 13” (400 x 330mm)

F4H4033AL

F2 Series

Corresponds to testing touch panel, film material, and flexible board. Boards without Netlist can also be tested by comparing the value from Phase Difference Measurement with recorded value from the good board.

Extreme High Accuracy Testing is made possible through the use of Type8 Probe. F2S6151 corresponds to testing standard sized board with up to min. pad size of 15µm and min. pad pitch of 45µm. Whereas F2S3325 is specifically designed for testing general package boards such as CSP and Flip Chip up to min. pad size of 10µm and min. pad pitch of 40µm. * Door design may defer depending on the specification.

High accuracy model from F2 Series. F2H6151 corresponds to testing standard sized board with up to min. pad size of 20µm and min. pad pitch of 50µm. Whereas F2H3325 is specifically designed for testing general module board and high density mother board with up to min. pad size of 15µm and min. pad pitch of 45µm.* Door design may defer depending on the specification.

Fully Automated 24hrs unattended testing now possible with AL series

EMMA with vertical type full automation. With newly developed auto loader/unloader on the side 24 hours unattended testing is now possible. Once the boards are stacked on the loader, suction pads automatically conveys the boards to the test area. Once the test is complete, boards are speedily transferred to unloader, and segregated to white and black boards.

High accuracy testing with full automation is available in this model. Instead of using robotic picking method for board transfer, inline conveyer-belt is implemented. By correctly adjusting the height and speed of conveyer it gives the option of connecting our full automation to other inline equipment from other manufactures. Also, by using the optional Automatic Size Adjustment Function, necessary size information for conveyer rail in test area and location of suction pad can be preprogrammed to o�er unattended 24 hours testing.

F2H6151/F2H3325F2S6151/F2S3325

F2M9172/F2M9172SH/F2M9172SH2 F4H4033ALE4M6151AL/E4H6151AL/E4S6151AL

Large Size Model

F2M9172

Shuttle Table Model

F2M9172SH/F2M9172SH2

Larger Size Model corresponds to larger board, touch panel, and glass boards. * Door design may defer depending on the specification.

Larger Size Model connected to the shuttle table achieved dramatic increase in throughput production. SH stands for single shuttle (shuttle x1) and SH2 stands for dual shuttle (shuttle x2).* Door design may defer depending on the specification.

E4M6151AL

E4H6151AL

E4S6151AL

*Conventional E4M. E4H, and E4S cannot be connected to full automation

F2 Series AL Series

* Picture is of F2M9172SH2

TopView

Type 8 Probe is a probe exclusive to E4S/F2S and combines “low witness mark”, “precise positioning” and “high speed” in greater level.(Refer P4 for detail)

Type8 Probe

TopView

EMX12181 EMX15281

E4M6151E4M6151L

E4M8161

E8M6151E8L6151

F2M9172 F2M9172SH2F2H/S6151F2H/S3325

F4H4033ALE4M6151ALE4H6151ALE4S6151AL

57 (1460) 28.8 (731)

2(51)68

66 (1670) 28.9 (734)

91.3 (2320) 30 (750)

36.4 (910)

103 (2620) 30 (750)

36.4 (910)

2.7~3.1 (70~80)

3.5~3.9 (90~100)

4.2 (107)

2.7~3.1 (70~80)

4.3~4.7 (110~120)

E4L6151

57 (1460) 28.8 (731)

2(51)68

2.7~3.1 (70~80)

E4H6151E4H3325

57 (1460) 28.8 (731)

2(51)68

2.7~3.1 (70~80)

E4S6151E4S3325

57 (1460) 28.8 (731)

2(51)68

2.7~3.1 (70~80)

2.1(54)

74.8 (1900) 28.9 (734)155.5 (3950)

48.2 (1225) 57.5 (1460) 48.2 (1225)

151.2 (3840)

31.5 (800) 56.7 (1440) 63 (1600)

51.5 (1310) 54.3 (1380)

3.5~3.9 (90~100)

4.3~4.7 (110~120)

3.1~3.5 (80~90)

2.1(54)

49.1 (1260) 43.2 (1097) 61.8 (1570) 52.1 (1325) 61.8 (1570)43.5 (1105) 43.5 (1105)

148.8 (3780)

56.9 (1446)

F2M9172SH

61.8 (1570)43.5 (1105)

105.3 (2675)

2.4 x 2.6”(60 x 65mm)

4.0mil §7

(100µm)1.2mil §10

(30µm)

PneumaticClamp

0.5MPa0.12ft3/min.(3.5ℓ/min.)

24 x 20”(610 x 510mm)

2 Front, 2 Rear

0.354”(9mm)

――

1mm from edge of clamp area±0.16mil(±4µm)0.08mil(2µm)

2 Front, 2 RearExternal

2425lbs.(1100kg)

Continuity Test: 0~10V Isolation Test: 250V (500/1000V Option)Continuity Test: 2.5µA~150mA

[System Requirement] 1) Control PC & Monitor, 2) PC & Monitor for Test Data Editing. *1) and 2) can be completed in one PC. *Please inquire our sales for PC specification. [Software] EMMA2010 for Control PC is included, but all other software is optional (supporting OS are Windows 7/ Windows 8/ Windows 10).

[Probe Type] Di�erent types of probes were designed to address specific needs. Please contact our sales for more information on each probe types in selecting ideal probe.[Operating Conditions] 21~24°C(70~75°F), 30~70% relative humidity. * Do not use under the environment that has heavy condensing, dust, vibration, and/or corrosive gas.

24 x 20”(610 x 510mm)

24.4 x 20.4”(620 x 520mm)2 Front, 2 Rear

2.4 x 3.9” §2

(60 x 100mm)3.9 x 3.9”

(100 x 100mm)0.02~0.2” §3

(0.5~5.0mm)6.6lbs. (3kg) §5

0.12~0.39” (3.0~10mm)

±0.16mil(±4µm)0.08mil(2µm)

4.0mil §7

(100µm)1.2mil §10

(30µm)

PneumaticClamp

2 Front, 2 RearExternal0.5MPa

5.3ft3/min.(150ℓ/min.)

4982lbs.(2260kg)

24 x 20”(610 x 510mm)

24.4 x 20.4”(620 x 520mm)2 Front, 2 Rear

2.4 x 3.9” §2

(60 x 100mm)3.9 x 3.9”

(100 x 100mm)0.02~0.2” §3

(0.5~5.0mm)6.6lbs. (3kg) §5

0.12~0.39” (3.0~10mm)

±0.16mil(±4µm)0.08mil(2µm)

2.0mil §7

(50µm)0.8mil §10

(20µm)

PneumaticClamp

5093lbs.(2310kg)

24 x 20”(610 x 510mm)

24.4 x 20.4”(620 x 520mm)2 Front, 2 Rear

2.4 x 3.9” §2

(60 x 100mm)3.9 x 3.9”

(100 x 100mm)0.02~0.2” §3

(0.5~5.0mm)6.6lbs. (3kg) §5

0.12~0.39” (3.0~10mm)

±0.08mil(±2µm)0.04mil(1µm)

2.0mil §7

(50µm)0.6mil §10

(15µm)

PneumaticClamp

5093lbs.(2310kg)

1mm from edge of clamp area §6

15.7 x 13”(400 x 330mm)

16.5 x 13.4”(420 x 340mm)

2 Upper, 2 Under2 x 2” §2

(50 x 50mm)3.9 x 3.5”

(100 x 90mm)0.02~0.12” §4

(0.5~3.0mm)2.2 lbs. (1kg)0.12” (3.0mm)

±0.12mil(±3µm)±0.08mil(±2µm)2.4mil §7

(60µm)1.2mil §10

(30µm)

PneumaticClamp

2 Upper, 2 UnderInternal0.5MPa

10.6ft3/min.(300ℓ/min.)

5622lbs.(2550kg)

32 x 24” §1

(810 x 610mm)―

2 Front, 2 Rear2.4 x 2.6”

(60 x 65mm)―

0.354”(9mm)

――

4.8mil §7

(120µm)1.2mil §10

(30µm)

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

3131 lbs.(1420kg)

24 x 20”(610 x 510mm)

2 Front, 2 Rear2.4 x 3”

(60 x 75mm)―

0.354”(9mm)

――

7.0mil §7

(180µm)3.2mil §10

(80µm)

Manual(Tension Clamp)2 Front, 2 Rear

ExternalN/AN/A

1676lbs.(760kg)

4.8mil §7

(120µm)

2206lbs.(1000kg)

35.8 x 28.3”(910 x 720mm)

2 Upper2 x 2”

(50 x 50mm)―

0.4”(10mm)

―――

±0.16mil(±4µm)0.08mil(2µm)

2.4mil §7

(60µm)

VacuumPlate

2 UpperExternal0.5MPa

0.02ft3/min.(0.6ℓ/min.)

24 x 20”(610 x 510mm)

(60 x 75mm)―

0.354”(9mm)

――

3mm from edge of clamp area ±0.16mil(±4µm)0.08mil(2µm)

4.0mil §9

(100µm)2.0mil §11

(50µm)

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

4740lbs.(2150kg)

24 x 20”(610 x 510mm)

(60 x 75mm)―

0.354”(9mm)

――

7.0mil §9

(180µm)3.2mil §11

(80µm)

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

5952lbs.(2700kg)

47 x 31.5”(1200 x 800mm)

3682lbs.(1670kg)

(60 x 65mm)―

0.511”(13mm)

――

7.0mil §7

(180µm)3.2mil §10

(80µm)

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

Series/Type

Exterior Image

ModelMax. Test Area

Max. Transferable Panel Size

Number of ProbesMin. Board Size

Min. Transferable Panel Size

Max. Board Thickness

Max. Transferable WeightClamp MarginUntestable AreaRepeatable Accuracy

Resolution

Min. Pad Pitch

Min. Pad Size

Test VoltageTest CurrentClamp System

CCD CameraPrinterAir Requirement (Pressure) Air Requirement (Volume) Power Supply(Single Phase AC200-240V 50/60Hz)

Weight

Required System

E4M6151 E4M6151L

M Series

M Series F2 Series

AL SeriesL Series H Series S Series E8 Series

L Series H Series S Series E8 Series F2 Series AL Series

E4S6151 E4S3325E4H6151 E4H3325E4M8161 EMX12181 EMX15281 E4L6151 E8L6151E8M6151 F2S6151 F2S3325F2H6151 F2H3325 F2M9172 E4S6151ALE4M6151AL E4H6151AL F4H4033AL

4.8mil §7

(120µm)

59.8 x 31.8”(1520 x 810mm)

3968lbs.(1800kg)

±0.08mil(±2µm)0.04mil(1µm)

1.8mil §8

(45µm)0.6mil §8

(15µm)

24 x 20”(610 x 510mm)

2.4 x 2.6”(60 x 65mm)

±0.16mil(±4µm)0.08mil(2µm)

2.0mil §8

(50µm)0.8mil §8

(20µm)

2535lbs.(1150kg)

2 Front, 2 Rear

0.354”(9mm)

――

1mm from edge of clamp area

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

13 x 9.8”(330 x 250mm)

24 x 20”(610 x 510mm)

2.4 x 2.6”(60 x 65mm)

±0.08mil(±2µm)0.04mil(1µm)

1.8mil §8

(45µm)0.6mil §8

(15µm)

2535lbs.(1150kg)

2 Front, 2 Rear

0.354”(9mm)

――

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

13 x 9.8”(330 x 250mm)

1.6 x 1.4”(40 x 35mm)

2646lbs.(1200kg)

±0.04mil(±1µm)0.04mil(1µm)

1.6mil §8

(40µm)0.4mil §8

(10µm)

1.6 x 1.4”(40 x 35mm)

2646lbs.(1200kg)

N/AN/A

±0.08mil(±2µm)0.04mil(1µm)

1.8mil §8

(45µm)0.6mil §8

(15µm)

24 x 20”(610 x 510mm)

±0.16mil(±4µm)0.08mil(2µm)

2.0mil §8

(50µm)0.8mil §8

(20µm)

1587lbs.(720kg)

2 Upper2 x 2”

(50 x 50mm)―

0.4”(10mm)

―――

VacuumPlate

2 UpperExternal

13 x 9.8”(330 x 250mm)

1543lbs.(700kg)

N/AN/A

±0.04mil(±1µm)0.04mil(1µm)

1.6mil §8

(40µm)0.4mil §8

(10µm)

24 x 20”(610 x 510mm)

±0.08mil(±2µm)0.04mil(1µm)

1.8mil §8

(45µm)0.6mil §8

(15µm)

1587lbs.(720kg)

2 Upper2 x 2”

(50 x 50mm)―

0.16”(4mm)

―――

VacuumPlate

2 UpperExternal

13 x 9.8”(330 x 250mm)

1543lbs.(700kg)

Manual(Tension Clamp)

N/AN/A

2.4 x 3” (60 x 75mm)

1.6mil §10

(40µm)

F2M9172SHF2M9172SH2

7.0mil §7

(180µm)

§1 Area will be 770x610mm when using side clamp (optional). §2 Size that can directly be put to test area without conveyed by autoloader. §3 Warpage (vertical): to be within 5mm including board thickness. Min. board thickness apply only for the board that is free of warpage when held perpendicular to the clamp §4 Warpage (horizontal): 0.4mm or less over the distance of 100mm, when board is held parallel and clamped on each side. §5 Autoloader pickup can be applied when ten or more suction pads can contact the board.

§6 With needle probe. Figure will be differ with other probes. §7 With T96MC-PB-0R40 probe. §8 With T98MC-PB-0R80 probe. §9 With TIPRB-PB-N110, TIPRB-PB-N111 probe §10 With T96MC-PB-0B00 probe §11 With TIPRB-PB-B210, TIPRB-PB-B211 probe §12 There may be cases where inrush current equivalent of 10 times of the regular current flow when the power is initially turned ON. Please choose the breaker that will not cause any malfunction under such inrush current.

E4M EMX E4L E4H E4S E8LE8M F2H F2S F2M E4M E4H E4S F4H

SH: 3307lbs.(1500kg)

SH2: 4409lbs.(2000kg)

Speci�cations

Dimension Unit: inch (mm)

EMX12181 EMX15281

E4M6151E4M6151L

E4M8161

E8M6151E8L6151

F2M9172 F2M9172SH2F2H/S6151F2H/S3325

F4H4033ALE4M6151ALE4H6151ALE4S6151AL

57 (1460) 28.8 (731)

2(51)68

66 (1670) 28.9 (734)

91.3 (2320) 30 (750)

36.4 (910)

103 (2620) 30 (750)

36.4 (910)

2.7~3.1 (70~80)

3.5~3.9 (90~100)

4.2 (107)

2.7~3.1 (70~80)

4.3~4.7 (110~120)

E4L6151

57 (1460) 28.8 (731)

2(51)68

2.7~3.1 (70~80)

E4H6151E4H3325

57 (1460) 28.8 (731)

2(51)68

2.7~3.1 (70~80)

E4S6151E4S3325

57 (1460) 28.8 (731)

2(51)68

2.7~3.1 (70~80)

2.1(54)

74.8 (1900) 28.9 (734)155.5 (3950)

48.2 (1225) 57.5 (1460) 48.2 (1225)

151.2 (3840)

31.5 (800) 56.7 (1440) 63 (1600)

51.5 (1310) 54.3 (1380)

3.5~3.9 (90~100)

4.3~4.7 (110~120)

3.1~3.5 (80~90)

2.1(54)

49.1 (1260) 43.2 (1097) 61.8 (1570) 52.1 (1325) 61.8 (1570)43.5 (1105) 43.5 (1105)

148.8 (3780)

56.9 (1446)

F2M9172SH

61.8 (1570)43.5 (1105)

105.3 (2675)

2.4 x 2.6”(60 x 65mm)

4.0mil §7

(100µm)1.2mil §10

(30µm)

PneumaticClamp

24 x 20”(610 x 510mm)

2 Front, 2 Rear

0.354”(9mm)

――

2 Front, 2 RearExternal

2425lbs.(1100kg)

24 x 20”(610 x 510mm)

24.4 x 20.4”(620 x 520mm)2 Front, 2 Rear

2.4 x 3.9” §2

(60 x 100mm)3.9 x 3.9”

(100 x 100mm)0.02~0.2” §3

(0.5~5.0mm)6.6lbs. (3kg) §5

0.12~0.39” (3.0~10mm)

±0.16mil(±4µm)0.08mil(2µm)

4.0mil §7

(100µm)1.2mil §10

(30µm)

PneumaticClamp

4982lbs.(2260kg)

24 x 20”(610 x 510mm)

24.4 x 20.4”(620 x 520mm)2 Front, 2 Rear

2.4 x 3.9” §2

(60 x 100mm)3.9 x 3.9”

(100 x 100mm)0.02~0.2” §3

(0.5~5.0mm)6.6lbs. (3kg) §5

0.12~0.39” (3.0~10mm)

±0.16mil(±4µm)0.08mil(2µm)

2.0mil §7

(50µm)0.8mil §10

(20µm)

PneumaticClamp

5093lbs.(2310kg)

24 x 20”(610 x 510mm)

24.4 x 20.4”(620 x 520mm)2 Front, 2 Rear

2.4 x 3.9” §2

(60 x 100mm)3.9 x 3.9”

(100 x 100mm)0.02~0.2” §3

(0.5~5.0mm)6.6lbs. (3kg) §5

0.12~0.39” (3.0~10mm)

±0.08mil(±2µm)0.04mil(1µm)

2.0mil §7

(50µm)0.6mil §10

(15µm)

PneumaticClamp

5093lbs.(2310kg)

15.7 x 13”(400 x 330mm)

16.5 x 13.4”(420 x 340mm)

2 Upper, 2 Under2 x 2” §2

(50 x 50mm)3.9 x 3.5”

(100 x 90mm)0.02~0.12” §4

(0.5~3.0mm)2.2 lbs. (1kg)0.12” (3.0mm)

±0.12mil(±3µm)±0.08mil(±2µm)2.4mil §7

(60µm)1.2mil §10

(30µm)

PneumaticClamp

2 Upper, 2 UnderInternal0.5MPa

10.6ft3/min.(300ℓ/min.)

5622lbs.(2550kg)

32 x 24” §1

(810 x 610mm)―

(60 x 65mm)―

0.354”(9mm)

――

4.8mil §7

(120µm)1.2mil §10

(30µm)

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

3131 lbs.(1420kg)

24 x 20”(610 x 510mm)

(60 x 75mm)―

0.354”(9mm)

――

7.0mil §7

(180µm)3.2mil §10

(80µm)

Manual(Tension Clamp)2 Front, 2 Rear

ExternalN/AN/A

1676lbs.(760kg)

4.8mil §7

(120µm)

2206lbs.(1000kg)

35.8 x 28.3”(910 x 720mm)

2 Upper2 x 2”

(50 x 50mm)―

0.4”(10mm)

―――

±0.16mil(±4µm)0.08mil(2µm)

2.4mil §7

(60µm)

VacuumPlate

2 UpperExternal0.5MPa

0.02ft3/min.(0.6ℓ/min.)

24 x 20”(610 x 510mm)

(60 x 75mm)―

0.354”(9mm)

――

3mm from edge of clamp area ±0.16mil(±4µm)0.08mil(2µm)

4.0mil §9

(100µm)2.0mil §11

(50µm)

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

4740lbs.(2150kg)

24 x 20”(610 x 510mm)

(60 x 75mm)―

0.354”(9mm)

――

7.0mil §9

(180µm)3.2mil §11

(80µm)

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

5952lbs.(2700kg)

47 x 31.5”(1200 x 800mm)

3682lbs.(1670kg)

(60 x 65mm)―

0.511”(13mm)

――

7.0mil §7

(180µm)3.2mil §10

(80µm)

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

Series/Type

Exterior Image

ModelMax. Test Area

Max. Transferable Panel Size

Number of ProbesMin. Board Size

Min. Transferable Panel Size

Max. Board Thickness

Max. Transferable WeightClamp MarginUntestable AreaRepeatable Accuracy

Resolution

Min. Pad Pitch

Min. Pad Size

Test VoltageTest CurrentClamp System

CCD CameraPrinterAir Requirement (Pressure) Air Requirement (Volume) Power Supply(Single Phase AC200-240V 50/60Hz)

Weight

Required System

E4M6151 E4M6151L

M Series

M Series F2 Series

AL SeriesL Series H Series S Series E8 Series

L Series H Series S Series E8 Series F2 Series AL Series

E4S6151 E4S3325E4H6151 E4H3325E4M8161 EMX12181 EMX15281 E4L6151 E8L6151E8M6151 F2S6151 F2S3325F2H6151 F2H3325 F2M9172 E4S6151ALE4M6151AL E4H6151AL F4H4033AL

4.8mil §7

(120µm)

59.8 x 31.8”(1520 x 810mm)

3968lbs.(1800kg)

±0.08mil(±2µm)0.04mil(1µm)

1.8mil §8

(45µm)0.6mil §8

(15µm)

24 x 20”(610 x 510mm)

2.4 x 2.6”(60 x 65mm)

±0.16mil(±4µm)0.08mil(2µm)

2.0mil §8

(50µm)0.8mil §8

(20µm)

2535lbs.(1150kg)

2 Front, 2 Rear

0.354”(9mm)

――

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

13 x 9.8”(330 x 250mm)

24 x 20”(610 x 510mm)

2.4 x 2.6”(60 x 65mm)

±0.08mil(±2µm)0.04mil(1µm)

1.8mil §8

(45µm)0.6mil §8

(15µm)

2535lbs.(1150kg)

2 Front, 2 Rear

0.354”(9mm)

――

PneumaticClamp

0.12ft3/min.(3.5ℓ/min.)

13 x 9.8”(330 x 250mm)

1.6 x 1.4”(40 x 35mm)

2646lbs.(1200kg)

±0.04mil(±1µm)0.04mil(1µm)

1.6mil §8

(40µm)0.4mil §8

(10µm)

1.6 x 1.4”(40 x 35mm)

2646lbs.(1200kg)

N/AN/A

±0.08mil(±2µm)0.04mil(1µm)

1.8mil §8

(45µm)0.6mil §8

(15µm)

24 x 20”(610 x 510mm)

±0.16mil(±4µm)0.08mil(2µm)

2.0mil §8

(50µm)0.8mil §8

(20µm)

1587lbs.(720kg)

2 Upper2 x 2”

(50 x 50mm)―

0.4”(10mm)

―――

VacuumPlate

2 UpperExternal

13 x 9.8”(330 x 250mm)

1543lbs.(700kg)

N/AN/A

±0.04mil(±1µm)0.04mil(1µm)

1.6mil §8

(40µm)0.4mil §8

(10µm)

24 x 20”(610 x 510mm)

±0.08mil(±2µm)0.04mil(1µm)

1.8mil §8

(45µm)0.6mil §8

(15µm)

1587lbs.(720kg)

2 Upper2 x 2”

(50 x 50mm)―

0.16”(4mm)

―――

VacuumPlate

2 UpperExternal

13 x 9.8”(330 x 250mm)

1543lbs.(700kg)

Manual(Tension Clamp)

N/AN/A

2.4 x 3” (60 x 75mm)

1.6mil §10

(40µm)

F2M9172SHF2M9172SH2

7.0mil §7

(180µm)

§1 Area will be 770x610mm when using side clamp (optional). §2 Size that can directly be put to test area without conveyed by autoloader. §3 Warpage (vertical): to be within 5mm including board thickness. Min. board thickness apply only for the board that is free of warpage when held perpendicular to the clamp §4 Warpage (horizontal): 0.4mm or less over the distance of 100mm, when board is held parallel and clamped on each side. §5 Autoloader pickup can be applied when ten or more suction pads can contact the board.

§6 With needle probe. Figure will be differ with other probes. §7 With T96MC-PB-0R40 probe. §8 With T98MC-PB-0R80 probe. §9 With TIPRB-PB-N110, TIPRB-PB-N111 probe §10 With T96MC-PB-0B00 probe §11 With TIPRB-PB-B210, TIPRB-PB-B211 probe §12 There may be cases where inrush current equivalent of 10 times of the regular current flow when the power is initially turned ON. Please choose the breaker that will not cause any malfunction under such inrush current.

E4M EMX E4L E4H E4S E8LE8M F2H F2S F2M E4M E4H E4S F4H

SH: 3307lbs.(1500kg)

SH2: 4409lbs.(2000kg)

Speci�cations

Dimension Unit: inch (mm)

Special Moving Probe Conduct High Speed / High Accuracy Testing to Detect Faults on both sides of the Board

High voltage signal input

(250V)

High voltage stress is applied between adjacent NETs.

Detects high resistance isolation defect between NETs.

TransientCharacteristicTesting

Two types of probe tips are available: “Blade” type is suitable for standard boards allowing stable probing with through holes, while “Needle” type is suitable for fine pitch bards such as BGAs.

For low resistance measurements, Kelvin probes are also available. Kelvin probe needle tips achieve 20 micron pitch between the two contacts and allows testing of the C4 bumps on package boards.

With our new cartridge design, users can now easily change tips as required to achieve optimum results. Most importantly the touch down sensor which allows unparalleled performance in testing flexible boards, highly warped PCB’s, cavities and di�erent heights on surface.

Probe pressure is adjusted by simple turn of a knob located on the rear of the probe unit. Compared to the adjustment with mechanical screw in the existing unit, the fine tuning adjustment in the new unit is much easier.

Type 7 probe is meticulously redesigned to its detailed composition parts with light weight material to support high speed testing. Furthermore,

drive speed of the motor is adjusted to maximize the capacity of torque e�iciency in order to realize the high speed probing.

Multi frame has been developed in order to minimize loading/unloading time during testing multiple small PCBs. Usually, this frame is used when there are more than one PCB to test.

Piece Frame is an easy-to-use frame to test small and package type PCBs. The spring loaded holding feature allows fast and easy loading and unloading of PCBs being tested.

The vacuum plate system allows you to easily test flexible, thin core, and even die cut FPC circuits. Through a “one-touch” process, the operator can quickly load and unload product.

Probe Tip Kelvin Probe Tip

Mechanical Units

Multi Frame Piece Frame Vacuum Plate

KelvinBlade Probe

KelvinNeedle ProbeBlade Probe

One Screw Replacement Fine Tuning Probe Pressure

Needle Probe

A 4 wire, 4 points measurement method by Kelvin probe allows high accuracy testing by low resistance. Furthermore, measuring Buried Resistance and saving the measured values are also included.

In order to improve isolation test accuracy, this feature enables users to verify probes are correctly in contact with the pad prior to testing. This contact check function e�ectively assist the user during pad search.

Precision Resistance Measurement Unit

Contact Check in Isolation Test

Min. Resolution: 0.001mΩAlso can check probe contact error

As to maximum applicable voltage with standard isolation resistance measurement is 250V, this o�ers the option of applying maximum of 500V/1000V for highly reliable high resistance isolation test.

Kelvin Probe

Latent test is the highest fault detection technology. Latent not only detects the existing defects, but also is capable of fining dormant ones having the possibility of becoming a permanent defect in the near future. This testing method enhances the product reliability.

LATENT Test

Measurement System

Phase Di�erence Measurement (PDM) High Speed and High Accuracy Moving Probe Unit

Probe Tip Lineup

Optional Frames

MicroCraft’s independently developed testing method which exponentially speeds up both continuity/ isolation tests. This method is most suitable for medium size production quantity.

Phase Di�erence Measurement Unit (PDM) sends high frequency signal between the reference line (plane) and signal line to measure di�erences between these phases, which will cut down unnecessary isolation tests within the net. With fewer test points and test cycle compared to ordinary isolation test, the test speed have increased dramatically.

Phase Difference Measurement (PDM) Unit

HVS (High Voltage Stress Test) is a measurement system that is capable of detecting high resistance isolation defect which was undetectable with Phase Di�erence Measurement (PDM). HVS is conducted by applying high voltage pulses between signal lines to detect high resistance defect. HVS similar to PDM, inspects each net once, thus achieves much faster test speed compared to ordinary isolation test by resistance measurement. This revolutionary testing method can be upgraded as an option to our EMMA series.

Micro Short Detection

Sudden application of high voltage in isolation test may result in burning out of parts containing Micro Short. This is caused by carbonized residue possibly reacting with moisture in the air or gases in the factory, which causes the element to relapse as high resistance short error after the test is complete. Our Micro-short test avoids such damage and trouble by applying a low voltage (less than 30V) before gradually increasing the applying voltage. Again, high resistance short between multiple layers of a broad may possess the characteristics of semiconductor and capacitors. These errors can also be detected in our test by reversing the polarity of high voltage.

In conjunction with MicroCraft’s standard measuring electronics, external specialized meters can be accommodated by GPIB interface and USB connection. Examples are such as measuring extreme isolation and high voltage up to 1TOhm (1012Ohm), and LCR and diode support as well.

Connection with External Meter

§1 Applicable for E4 and F2 models in our EMMA lineup.

This is an option to detect super high resistance isolation defect by applying lower test voltage. he usage of low voltage allows users to conduct super high resistance test without adding high stress on the tested boards.

HVS (High Voltage Stress Test)

High Voltage Isolation Resistance Measurement Unit

Super High Resistance Isolation Measurement Unit

Type7 Probe

Type8 Probe is specifically designed to be used for E4S/F2S Models (Super High Accuracy Model). Utilizing the touchdown sensor that was impossible with simple servo motor is now used for controlling the probe has allowed us to combine “low witness mark”, “precise positioning” and “high speed” in greater level.

Type8 Probe

* Refer P4 for detail

Optional Optional

Optional

Test Voltage

Test range

Max. 10GΩ

Max. 100GΩ

Optional

List of External meter currently supportedKeysight Technologies (formerly Agilent Technologies)

34410A Digital Multimeter (USB)34420A Micro-Ohm Meter (GPIB)3458A Digital Multimeter (GPIB)4284A LCR Meter (GPIB)4285A LCR Meter (GPIB)E4980A LCR Meter (USB)4339B High Resistance Meter (GPIB)Keithley Instruments Inc.6487 Picoammeter (GPIB)

Range Resolution Measurable range Current Application

4mΩ 0.001mΩ 0.4-3mΩ 150mA Kelvin Probe

40mΩ 0.01mΩ 2-30mΩ 125mA Kelvin Probe

4Ω 1mΩ 0.3-3Ω 125mA Kelvin Probe

10Ω 2.5mΩ 0.5-8Ω 10mA

100Ω 25mΩ 5-80Ω 10mA

1000Ω 250mΩ 50-800Ω 2.5mA

10kΩ 2.5Ω 500-8kΩ 0.25mA

100kΩ 25Ω 5k-80kΩ 25µA Buried Resistance

1MΩ 250Ω 50k-800kΩ 2.5µA Buried Resistance

Contact Check Pad Search

Optional

The pattern with “latent” or dormant defect, when applied with high current will induce temperature rise causing the output resistance to become nonlinear. This change shall be detected at high speed and accuracy and thus detect Latent defect.

Detectable Latent

Optional

Optional Optional Optional