basics of vlsi design and testtehranipoor.ece.ufl.edu/03 intro to vlsi design and test.pdf · vlsi...
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23 January 2018 1
Basics of VLSI Design and Test
M. Tehranipoor
Introduction to Hardware Security & TrustUniversity of Florida
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2
Nanoelectronics
• Power will continue to increase• Low-leakage / leakage-tolerance• Dynamic power management
• Process variation will be a key issue• Design for Manufac. (DFM), Reliability
• Arch. / design methods for new devices
Non-Silicon technology
Silicon Micro Electronics
I
V
• Carbon Nanotubes• Quantum computing• Molecular transistors etc.
Silicon Nano Electronics
1 µm 100 nm 10 nm
1970 1980 2000 2010 2020
• New Devices Emerge• SOI, FinFET, TriGate
5 µm
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3
VLSI Applications
• Different applications have different power-performance demands
POW
ER
PERFORMANCE
Ultralow power applications:medical, space, specific sensor network etc.
Portable applications:mobile computing, wireless, multimedia etc.
General purpose computing: internet server, database server, real-time jobs etc.
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IC Design and Test Flow
Fab
Assembly
Wafer test
Burn inPackage testCustomer
IC DesignDesign Spec.
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Nanoscale VLSI System
VLSI System (e.g. Baseband
Processor, DSP, ASIC)
Architectural blocks
Logic Blocks(Controller, Datapaths
Memory
System -> Architecture -> Logic ->Transistor
Interconnect
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Nanoscale Transistor
XJ
GATE
SOURCE DRAINTOX
LEFF
l Basic building block for the integrated circuit: both logic and memoryl Minimum feature size is now well below 100nm
GATE
SOURCE
BODY
DRAIN
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Exponential Growth in Computing Power
What is the key to the growth in computing power?
Pentium® Pro Architecture
Pentium® 4 Architecture
Pentium® Architecture
486386
2868086
Source: Intel 0.01
0.1
1
10
100
1000
10000
100000
1000000
1970 1980 1990 2000 2010
MIP
S
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8
Moore’s Law
“The complexity for minimum component costs has increased at a rate of roughly a factor of two per year ... Certainly over the short term this rate can be expected to continue, if not to increase. Over the longer term, the rate of increase is a bit more uncertain, although there is no reason to believe it will not remain nearly constant for at least 10 years. …”Electronics Magazine, 19 April 1965
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Technology Scaling
GATE
SOURCEBODY
DRAIN
Xj
Tox
GATESOURCE DRAIN
Leff
BODY
Dimensions scale down by 30% Doubles transistor density
Oxide thickness scales down Faster transistor, higher performance
Vdd & Vt scaling Lower active power
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23 January 2018 10
nMOS Transistor
• If the gate is “high”, the switch is on• If the gate is “low”, the switch is off
Drain
Source
Gate
g=1
g=0
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23 January 2018 11
pMOS Transistor
• If the gate is “low”, the switch is on• If the gate is “high”, the switch is off
Drain
Source
Gate
g=1
g=0
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23 January 2018 12
Solution: CMOS
• No static current flow• Less current means
less power
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23 January 2018 13
CMOS Inverter First-Order DC Analysis
Vin = 0Vin = VDD
• High noise margin• Ratioless• low output impedance• extremely high input impedance• no static power
Vin Vout
VDD
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23 January 2018 14
CMOS Inverter: Transient Response
Vin = VDD à0 Vin = 0 à VDD
Low-to-High High-to-Low
To reduce delay:• Reduce CL• Reduce Rp,n• Increase W/L ratio
Output:
CL is composed of the drain diffusion capacitances of the NMOS and PMOS transistors, the capacitance of connecting wires, and the input capacitance of the fan-out gates
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23 January 2018 15
• Interconnect delay
Performance Characterization
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23 January 2018 16
• Basic operatorsn AND
n OR
Boolean Algebra
BABABAf !=×=),(
BABABAf !=+=),(
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23 January 2018 17
• Basic operatorsn NAND
n NOR
Boolean Algebra
BABABAf !=×=),(
BABABAf !=+=),(
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23 January 2018 18
• Basic operatorsn XOR
Boolean Algebra
BABAf Å=),(
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23 January 2018 19
n DeMorgan’s Theorem
Boolean Algebra
BABA +=×
BABA ×=+
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23 January 2018 20
n Representation of the function to be realized
n Sum of Products representationq Sum of minterms
n Product of Sums representationq Product of maxterms
n Truth Tables
Boolean Algebra
CABCBACBACBACABF ++++=
)()()( CBACBACBAF ++×++×++=
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23 January 2018 21
CMOS Logic Implementations
• Inverter
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23 January 2018 22
CMOS Logic Implementations
• NOR
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23 January 2018 23
CMOS Logic Implementations
• NAND
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23 January 2018 24
CMOS Logic Implementations
• Multi-input NOR
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23 January 2018 25
CMOS Logic Implementations
• General CMOS combinational logic
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What is VLSI design?• The process of creating an integrated circuit
from specifications to fabrication
What is an integrated circuit?• A single integrated component that
contains all the primary elements of an electrical circuit: transistors, wiring, resistors, capacitors, etc.
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23 January 2018 27
VLSI Design Automationn Large number of componentsn Optimize requirements for higher performance
q Performance relates to speed, power and size.n Time to market competitionn Cost
q Using computer makes it cheaper by reducing time-to-market.
SystemSpecifications Chip
Manual
Automation
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23 January 2018 28
VLSI Design Cycle
System Specifications
Functional Design
Logic Design
Circuit Design
X=(AB*CD)+ …
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23 January 2018 29
VLSI Design Cycle
Physical Design
Fabrication
Packaging
IC Test
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23 January 2018 30
Semiconductor Processing
• How do we make a transistor?
• How do you control where the features get placed?n Photo lithography masks
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23 January 2018 31
Wafer Processing
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23 January 2018 32
Intel 4004
• First microprocessor• Designed in 1971• 2300 transistors• 10-um process• ~100 KHz
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23 January 2018 33
Intel Itanium Processor
• Released in 2005• 1.72 Billion transistors• 90-nm process• 2 GHz
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23 January 2018 34
Design Methodology
• Functional specificationn What does the chip do?
• Behavioral specificationn How does it do it? (abstractly)
• Logic designn How does it do it? (logically)
• Layoutn How does it do it? (physically)
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23 January 2018 35
Design Constraints
• Budgetn Total cost
• Silicon area• Power requirements
n Dynamicn Static
• Speedn Performance
• Schedule n Time to market
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23 January 2018 36
Functional Specification
• Full adderCin
X
Y
Cout
S
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23 January 2018 37
Behavioral Specification
• VHDL• Verilog
entity adder is-- i0, i1 and the carry-in ci are inputs of the adder. -- s is the sum output, co is the carry-out. port (i0, i1 : in bit; ci : in bit; s : out bit; co : out bit);
end adder; architecture rtl of adder is
begin -- This full-adder architecture contains two concurrent assignment.-- Compute the sum. s <= i0 xor i1 xor ci;
-- Compute the carry. co <= (i0 and i1) or (i0 and ci) or (i1 and ci);
end rtl;
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23 January 2018 38
Behavioral Specification
module fulladder (a,b,cin,sum,cout); input a,b,cin; output sum,cout;
reg sum,cout; always @ (a or b or cin) begin
sum <= a ^ b ^ cin; cout <= (a & b) | (a & cin) | (b & cin);
end endmodule
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23 January 2018 39
Logic Design
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23 January 2018 40
Transistor Schematic
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23 January 2018 41
Layout
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23 January 2018 42
Design Process is Iterative
Behavioral
Structural
Synthesis
PNR
Simulation-Based Verification
Simulation-Based Verification
Simulation-Based Verification
Simulation/Emulation-Based Verification
PNR: Placement and routing
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23 January 2018 43
VLSI Design Methodologies
• Full customn Design for performance-critical cellsn Very expensive
• Standard celln Faster n Performance is not as good as full custom
• Gate array• Field Programmable Gate Array
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23 January 2018 44
Comparison of Design Styles
Mass Production
Volume
Medium Production
Volume
Medium Production
Volume
Low Production
Volume
Production Volume:
Complexity: High Low
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23 January 2018 45
VLSI Chip Yieldn A manufacturing defect in the fabrication
process causes electrically malfunctioning circuitry.
n A chip with no manufacturing defect is called a good chip.q The defective ones are called bad chips.
n Percentage of good chips produced in a manufacturing process is called the yield.
n Yield is denoted by symbol Y.
n How to separate bad chips from the good ones?
TEST ALL CHIPS
# of good dieY =
# total manufactured die
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23 January 2018 4646
n In simple terms, TEST identifies the defective chips
n Some bad chips ( ) are easy to find
n Some other are difficult ( )n Test is associated with
q Cost q Return On Investment (ROI)
n ¥ € $ - Money
Why Does Test Matter ?
Wafer
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23 January 2018 47
Testing Principle
Digital Circuit
11010
01110
00001
10010
11000
10111
Input Patterns Output Patterns
Stored Correct
ResponseComparator
Test Result
Functional Test Method – Not very efficient
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23 January 2018 48
Contract between design house and fab vendor
n Design is complete and checked (verified)n Fab vendor: How will you test it?n Design house: I have checked it and …n Fab vendor: But, how would you test it?n Design house: Why is that important?n complete the story
n That is one reason for design-for-testability, test generation etc.
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23 January 2018 49
Contract between design …
Hence:n “Test” must be comprehensiven It must not be “too long”
Issues:n Model possible defects in the process
q Understand the processn Develop simulator and fault simulatorn Develop test generatorn Methods to quantify the test efficiency
q Fault coverage
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23 January 2018 50
Ideal Tests
n Ideal tests detect all defects produced in the manufacturing process.
n Ideal tests pass all functionally good devices.n Very large numbers and varieties of possible
defects need to be tested.n Difficult to generate tests for some real defects.
Defect-oriented testing is an open problem.
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23 January 2018 51
Real Tests
n Based on analyzable fault models, which may not map on real defects.
n Incomplete coverage of modeled faults due to high complexity.
n Some good chips are rejected. The fraction (or percentage) of such chips is called the yield loss.
n Some bad chips pass tests. The fraction (or percentage) of bad chips among all passing chips is called the defect level.
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Level of testing (1)
n Levelsq Chipq Boardq System
n Boards put togethern System-on-Chip (SoC)
q System in fieldn Cost – Rule of 10
q It costs 10 times more to test a device as we move to higher level in the product manufacturing process
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VLSI Defects
WaferDefects
Faulty chips
Good chips
Unclustered defectsWafer yield = 12/22 = 0.55
Clustered defects (VLSI)Wafer yield = 17/22 = 0.77
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Scan Flip-Flop
CK
TC Normal mode, D selected Scan mode, SD selected
Master open Slave opent
t
TC
SID
CK
Q D Q
CK
DD
CKCK
01
Flip-FlopScan Flip-Flop
(SFF)
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Adding Scan Structure
FF
FF
FF
Combinational
logic
PI PO
SCANOUT
SCANINTC or TCK Not shown: CK or
MCK/SCK feed allSFFs (scan Flip-flops).Scan Path
Also called Scan Chain
SFF
SFF
SFF
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Scan Design
Scan-out (SO)
Scan-in (SI)Scan Flip-Flop
Primary Inputs Primary
Outputs
Circuit-Under-Test (CUT)
0 1 0 0 1 0 1 1
1 0 1 0 0 0 1 011010111
11010111
Structural Test Method – Extremely efficient
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ADVANTEST Model T6682 ATE
Test Head
Testers are very expensive ($150K – $20M)
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Sub-WavelengthWYSINWYG
From: Cole et al., 2001
What You See Is Not What You Get
WYSINWYG
Process variationsNo two transistors have the same parameters