bottom-up solutions to plasma synthesis of …mipse.umich.edu/files/sankaran_presentation.pdfni, 2.0...
TRANSCRIPT
R. Mohan Sankaran
George B. Mayer Assistant Professor of EngineeringDepartment of Chemical Engineering
Case Western Reserve UniversityCleveland, OH 44106-7217Email: [email protected]
http://microplasma.case.edu
Bottom-up solutions to plasma synthesis of nanomaterials
•
High purity•
High fidelity pattern transfer•
Low temperature processing•
Large volume (large area)
Applied Materials, Inc.
Plasma etching of Si
Plasma-enhanced CVD of amorphous Si
Xunlight, Inc.
1 µm
Plasma processing of materials
Powered electrode
Substrate
PLASMAA+ A+
A+
A·
e-
e-
e-
e- A·
50 nm 30 nm 10 nm 5 nmSi nanowire CNT
Chau et al., Intel (2007)
From top-down approaches to…
2007
2010
?
Manufacturing
Research
Development
…to bottom-up approaches to materials synthesis
Stoffels et al., J. Vac. Sci. Technol. A , Vol. 17, 3385 (1999)
Methane particles1 Å
1 nm
10 nm
0.1 μm
1 μm
Atoms, molecules,
radicals
Polycarbons
Clusters
Agglomerates
Powder
A new direction for plasma synthesis of materials
Wafer
Vacuum pump
Electrodes
Conventional plasma
•
Large volume, batch•
Low pressure (10-5-1 Torr)•
Non-thermal [> 10,000 K]•
Plasma-surface interactions
100 mm 5 mm
Microplasma
•
Microscale, continuous-flow•
High pressure (10-1000
Torr)•
Non-thermal [> 10,000 K]•
Gas-phase interactions
Gas flow
Microplasmas are a versatile source for nanomaterials synthesis
Gas-phase nucleation of nanoparticles
Non-lithographic micro/nanofabricationCatalytic growth of well-defined CNTS
Plasma-liquid electrochemistry
10 nm
2 nm
Chiang et al.,
JPCC 112, 17920 (2008)Chiang et al., Diam. Rel. Mater. 18, 946 (2009)Chiang et al., Nature Mater. 8, 882 (2009)Chiang et al., ACS Nano, ASAP online
Chiang et al., APL 91, 121503 (2007)Chiang et al., Adv. Mater 20, 4857
(2008)
Chiang et al., APL 91, 021501 (2007)Lee et al., in preparation
Richmonds et al., APL 93, 131501 (2008)Chiang et al., PSST, in press
Typical operating conditions (for single discharge): ►100 sccm Ar►Vplasma
=450 V DC, Iplasma
=5 mA►Dhole
=180 m, L=2 mm
4 mm
Microplasmas operate stably and continuously at atmospheric pressure
U.S. Patent No. 6,700,329 (Issued 3/2/04)
Continuous atmospheric-operation in Ar gas flow for at least 100 hrs!
0 200 400 600 800 1000 1200190
200
210
220
230
240
250
260
Pressure 50 Torr 100 Torr 200 Torr 500 Torr 760 Torr
Vol
tage
(Vol
ts)
Current (A)
RB
Gas
L
- +
Metal capillary tube(CATHODE)
Dhole
Counter electrode(ANODE)
Gas-phase nucleation of nanoparticles
Batch vs. continuous-flow synthesis of nanoparticles: The example of CdSe
Yen et al., Adv. Mater., Vol. 15, 1858 (2003)
Batch Continuous-flow
Talapin et al., J. Phys. Chem. B, Vol. 105, 12278 (2001)
Kinetic-control Reaction-control
Continuous-flow microreactors based on microplasmas
Characteristics of process
•
Non-thermal dissociation of reactive precursor molecules (EID)
•
Short residence times (10-3-10-6
seconds)
•
In situ monitoring (kinetic studies)
•
Generic –
precursor can be chosen to grow different materials
Microplasma
Inert gas (Ar) +
Vapor precursor
Nanoparticles1-3 nm
15-20% std. dev.- +
DC
Continuous-flow synthesis and in situ size classification of nanoparticles
INERT GAS+
VAPOR PRECURSOR
MICROPLASMA
CATHODE ANODE
PARTICLE COUNTER
SIZE CLASSIFIER N2►Continuous-flow, steady-state
►Atmospheric-pressure
►In situ
monitoring
Cylindrical differential mobility analyzer (TSI, Inc.)Detects particles 2 nm < Dp
< 100 nm
NANOPARTICLES
QUARTZ TUBE
0.1 1 10 100104
105
106
107
Dp (nm)
dN
/d(lo
gDp) (
cm-3)
0.1 1 10 100104
105
106
107
dN/d
(logD
p) (cm
-3)
Dp (nm)
Aerosol measurements of Fe and Ni nanoparticles
0.1 1 10 100104
105
106
107
dN/d
(logD
p) (cm
-3)
Dp (nm)
2.6 ppmDpg
=3.11
nm σg
=1.16
5.2 ppmDpg
=4.74
nm σg
=1.22
Fe NPs
0.1 1 10 100104
105
106
107
dN/d
(logD
p) (cm
-3)
Dp (nm)
1.5 ppmDpg
=2.89
nm σg
=1.14
3.0 ppmDpg
=4.52
nm σg
=1.20
4.5 ppmDpg
=6.82
nm σg
=1.28
Ni NPs
Mechanism for nucleation and growth of NPs from vapor-phase precursors
Molecular fragments from electron impact dissociation
(EID)
Fe
Fe
Microplasma volume
►For constant plasma parameters, Dp
is a function of precursor concentration
and enthalpy of dissociation►ΔHD
(ferrocene) ~ 662 kcal/mol; ΔHD
(nickelocene) ~ 686 kcal/mol
+ Vapor
5 nm 5 nm 5 nm2 nm
(220),0.127 nm
(111),0.203 nm
2.0 ppm 2.6 ppm 5.2 ppm
HRTEM analysis of as-grown Ni nanoparticles deposited by electrostatic precipitation
0 5 100
5
10
15
20
N=48
Cou
nts
Particle diameter (nm)
Mean diameter = 2.15 nmStandard deviation = ±0.60 nm
0 5 10
0
5
10
15
20
Particle diameter (nm)
Cou
nts
Mean diameter = 5.11 nmStandard deviation = ±2.01 nm
N=76
0 5 100
5
10
15
20
N=46
Cou
nts
Particle diameter (nm)
Mean diameter = 3.70 nmStandard deviation = ±0.75 nm
Dp
=5.1 nm ±2.0 nmDp
=3.7 nm ±0.75 nmDp
=2.2 nm ±0.60 nm
0.1 1 10 100104
105
106
107
Dp (nm)
Ni Ni0.88Fe0.12 Ni0.67Fe0.33
Ni0.27Fe0.73
dN
/d(lo
gDp) (
cm-3)
Compositionally-controlled growth of bimetallic (alloyed) nanoparticles
0.1 1 10 100104
105
106
107
dN/d
(logD
p) (cm
-3)
Dp (nm)
2.2 ppmDpg
=3.5 nm σg
=1.18
2.6 ppmDpg
=3.9
nm σg
=1.19
2.9 ppmDpg
=4.5 nm σg
=1.22
73%
27%
Dimensional tuning: Ni0.27
Fe0.73 Compositional tuning
EDS of as-grown Nix
Fe1-x
bimetallic nanoparticles
0 5 100
1x103
2x103
3x103
4x103
Cou
nts
(A.U
.)
Energy (keV)
C
O
NiNi
SiCu
NiCu
Ni Ni
NiFe
Fe
Ni NiNi
Fe
Fe
Ni
Ni0.67
Fe0.33
Ni0.27
Fe0.73
► Final atomic composition corresponds to relative metallocene concentration
3.0 nm
0 20 40 60 80 100
0
20
40
60
80
100 Experimental data Cm=Ca
Ni a
tom
ic c
once
ntra
tion
(Ca) (
%)
Nickelocene concentration (Cm) (%)
XRD of as-grown Nix
Fe1-x
bimetallic nanoparticles
40 45 50 55 60 65 70 75 800
50
100
150
200
Inte
nsity
(A. U
.)
2(degree)
(111)
(200)(220)
(111)
(200)
(220)
(111)
(200)
(220)
*
*
Ni
Ni0.67
Fe0.33
Ni0.27
Fe0.73
3.0 nm►Bulk Fe is bcc (α); bulk Ni is fcc (γ)
►NiFe alloys exhibit new distorted crystal structure
F. A. Shunk, Constitution of Binary Alloys (1991)
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.50
1
2
3
4
5
6
Fe Ni Ni0.67Fe0.33
Ni0.27Fe0.73
Dg(n
m)
Cm (ppm)
(111), 0.20 nm
(111), 0.20 nm
(111), 0.21 nm
(111), 0.21 nm
2 nm 2 nm
5 nm 5 nm
2 nm 2 nm
5 nm 5 nm
Ni,
3.2
nm
Ni,
2
nm Ni0.27
Fe0.73
, 2 nm
Ni0.27
Fe0.73
, 3.2 nm
A priori design and synthesis of dimensionally-
and compositionally-tuned bimetallic nanoparticles
Catalytic growth of carbon nanotubes
Conventional approaches to catalyst preparation for carbon nanotube growth
1. Floating catalyst method
2. Substrate growth
Catalyst precursor+
Hydrocarbon gas
Plasma
Yoshida et al., Nano Lett., Vol. 8, 2082 (2008)
A new two step, sequential process for catalytic growth of CNTs
INERT GAS+
METALLOCENE
MICROPLASMA
CATHODE ANODE
PARTICLE COUNTER
SIZE CLASSIFIER
TUBE FURNACE
SEED NANOPARTICLES
CNTS
N2
H2
+ C2
H2
Cylindrical differential mobility analyzer (TSI, Inc.)Detects particles 2 nm < Dp
< 100 nm
QUARTZ TUBE
►Continuous-flow, steady-state
►Atmospheric-pressure
►Independent control of growth parameters
►In situ
monitoring
0.1 1 10 100103
104
105
106
107
dN/d
log(
Dm) (
parti
cles
/cm
3 )
Dm (nm)
•700 oC + no catalyst C NPs
•Ni NPs room temp.
•500 oC CNTs?
•700 oC CNTs, C NPs?
<700 oC only catalytic CNT growth!
Aerosol monitoring of reactor effluent
CNTs?C NPs?
200 300 1000 1200 1400 1600 1800
Inte
nsity
(A. U
.)
Raman shift (cm-1)
Diameter-controlled growth of CNTs –
Towards high-purity synthesis of SWCNTs
3 nm
Ni 2.5 nm / DWCNTs
Ni 3.1 nm / MWCNTs
10 nm
5 nm
Ni 2.2 nm / SWCNTs
Ni 2.6 nm / TWCNTs
3 nm
CNT diameter1.6 nm.….....0.8 nm
D GRBM
2.2 nm
2.5 nm
2.6 nm
3.1 nm
75% purity!
metallic (m): n-m=3isemiconducting (s): n-m≠3i
s m m s m
(n,m) chirality
/
structure of SWCNTs (electronic type)
1 cm
Glassy
fiber
filter SWCNT dispersion
►
0.17
mg/hr (no
purification) (for
single microplasma
reactor)
► Sodium dodecyl sulfate (SDS)+ D2
O
Sonication (24 hrs)+
Ultracentrifuging (38000g, 2 hrs)
Collecting and dispersing SWCNTs for optical characterization
400 600 800 1000 1200 1400
Nor
mal
ized
Abs
orba
nce
(A.U
.)Wavelength (nm)
Ni, 2.0 nm Ni, 2.6 nm
S11S22M11
►
Relative peak intensities in UV-
Vis-NIR spectra are identical
400 600 800 1000 1200 14000.0
0.1
0.2
Abs
orba
nce
Wavelength (nm)
Ni, 2.0 nm Ni, 2.2 nm Ni, 2.4 nm Ni, 2.6 nm
Decreasing Dp
►Overall yield (absorbance) of SWCNTs decreases with increasing particle size
UV-Vis-NIR absorbance: Effect of catalyst size
S11S22M11
Increasing Fe
Dp
=2.0 nm
UV-Vis-NIR: Effect of catalyst composition
Lower metallic content in nanotubes catalyzed by nanoparticles with higher Fe at%Significant changes in semiconducting population distribution as
the nanocatalyst composition is varied
400 600 800 1000 1200 1400
Nor
mal
ized
Abs
orba
nce
(A.U
.)
Wavelength (nm)
Ni Ni0.80Fe0.20
Ni0.67Fe0.33
Ni0.50Fe0.50
Ni0.27Fe0.73
Ni0.20Fe0.80
Photoluminescence spectroscopy of SWCNTs
1.0
0.0
0.5
Pho
tolu
min
esce
nce
inte
nsity
(A.U
.)
900 950 1000 1050 1100 1150 1200 1250 1300 1350 1400500
550
600
650
700
750
800
850
(10,2)
Exci
tatio
n W
avel
engt
h (n
m)
Emission Wavelength (nm)
Ni0.27Fe0.73
(8,3)(7,5) (7,6)
(8,4)(6,5)
900 950 1000 1050 1100 1150 1200 1250 1300 1350 1400500
550
600
650
700
750
800
850
(9,4)
Emission Wavelength (nm)
(10,2)
(6,5)
Exci
tatio
n W
avel
engt
h (n
m) Ni
(8,3)(7,5) (7,6)
(8,4)
(10,3)
(8,6)
(9,5)
(8,7)
900 950 1000 1050 1100 1150 1200 1250 1300 1350 1400500
550
600
650
700
750
800
850
(9,4)
Emission Wavelength (nm)
(6,5)
Exci
tatio
n W
avel
engt
h (n
m) Ni0.67Fe0.33
(8,3)(7,5) (7,6)
(8,4)
(10,3)
(8,6)
(9,5)
(8,7)(10,2)
900 950 1000 1050 1100 1150 1200 1250 1300 1350 1400500
550
600
650
700
750
800
850
(10,2)
(6,5)
Emission Wavelength (nm)
Exci
tatio
n W
avel
engt
h (n
m) Ni0.5Fe0.5
(8,3)(7,5) (7,6)
(8,4)
Fe
Relative abundance of different semiconducting chiralities changes with nanocatalyst composition
(6,5) (8,3) (7,5) (8,4) (10,2) (7,6) (9,4) (10,3) (8,6) (9,5) (8,7)0
5
10
15
20
25
30
35
40
45
50
A
bund
ance
(%)
CNT Chirality
Ni0.27Fe0.73
Ni0.5Fe0.5
Ni0.67Fe0.37
Ni
Decreasing SWCNT diameter
0.90 nm
0.83 nm
Model for SWCNT growth based on lattice matching (epitaxial growth)
S. Reich et al., Chem. Phys. Lett., Vol. 421, 469 (2006)
Ni(111) bond length: 0.249 nmGraphene lattice constant: 0.248 nm
0 20 40 60 80 1000.28
0.29
0.30
fcc
latti
ce c
onst
ant (
nm)
bcc
latti
ce c
onst
ant (
nm)
Ni (%)
0.34
0.35
0.36
Crystal structure of Nix
Fe1-x
nanocatalysts
Catalyst
fcc bcc Diffraction peak
(degree) afcc (nm)
Bond length (nm)
Diffraction peak (degree) abcc
(nm)
Bond length (nm) (111) (200) (220) (110) (200)
Ni 44.67 52.86 75.98 0.3507 0.2480 - - - - Ni0.67Fe0.33 44.20 51.16 75.38 0.3563 0.2519 - - - - Ni0.27Fe0.73 43.86 50.88 75.32 0.3578 0.2530 45.40 65.60 0.2836 0.2456
Fe - - - - - 44.76 - 0.2888 0.2501
Multi line excitation micro Raman spectroscopy of SWCNTs
488 nm
514 nm
M11 S22
150 200 250 300 350
HiPCO
633 nm
Nor
mal
ized
inte
nsity
(A.U
.)
Raman shift (cm-1)
Ni
Ni0.27Fe0.73
Diameter (nm) 1.4 1.2 1.1 1.0 0.9 0.8 0.7
633 nm
100 150 200 250 300 350
1.8 1.6 1.4 1.2 1.1 1.0 0.9 0.8 0.7
Ni
488 nm
Nor
mal
ized
inte
nsity
(A.U
.)
Raman shift (cm-1)
Ni0.27Fe0.73
Diameter (nm)
HiPCO
M11S33
100 150 200 250 300 350
Nor
mal
ized
inte
nsity
(A.U
.)
Raman shift (cm-1)
514 nm
Ni
Ni0.27Fe0.73
Diameter (nm) 1.8 1.6 1.4 1.2 1.1 1.0 0.9 0.8 0.7
HiPCO
M11S33
Relative amount of semiconducting and metallic nanotubes changes with catalyst composition
Excitation
wavelength (nm)
Temperature
(oC) Catalyst % semiconducting % metallic
FWHM of G-band
intensity (cm-1)
633 HiPCO 62.9 37.1 --
600 Ni 66.8 33.2 --
600 Ni0.27
Fe0.73 90.5 9.5 --
700 Ni0.27
Fe0.73 55.5 44.5 --
488 HiPCO 62.9 37.1 --
600 Ni 63.4 36.6 --
600 Ni0.27
Fe0.73 85.5 14.5 --
514 HiPCO 62.9 37.1 40
600 Ni 60.2 39.8 39
600 Ni0.27
Fe0.73 84.2 15.8 25
Fabrication of thin film SWCNT-based FETs
100 m 0.5 m
Si
SiO2
SWCNT
film
Al/Ti Al/Ti
2 μm
200 μm60 μm
Schematic of single device:
SEM of multiple devices fabricated in parallel:
Metal pads
Bottom -gate FET Source-Drain
Electrical characterization of SWCNT-based FETs
<1 1-2 2-3 >30
10
20
30
40
50
60
70
80
90
100
Perc
enta
ge (%
)
log(Ion/Ioff)
Ni0.27Fe0.73, N=25 Ni, N=22 HiPCO, N=30
Drain current vs. Gate voltage Overall statistics of on/off ratio
-10 -8 -6 -4 -2 0 2 4 6 8 1010-9
10-8
10-7
10-6
10-5
10-4
I ds (A
)
Vg (V)
HiPCO Ni Ni0.27Fe0.73
Vds=1V
p-type semiconductor
Plasma-liquid electrochemistry
A hybrid microplasma-based electrochemical cell
1.
Anodic dissolution of metal foil
2.
Reduction of metal ions at microplasma
3.
Nucleation, growth, and capping of particles
Microplasma-assisted electrochemical synthesis of colliodal Ag nanoparticles from bulk precursor
t=5 min t=7 min t=9 min
►Atmospheric-pressure, near room temperature
►Gas conduit for current flow (contact-less)
►Rapid reduction of aqueous metal cations
►Versatile (metal precursor, stabilizer molecule)
µplasma
Ag foil
Efficiency of cell operated with microplasma
2 3 4 50
10
20
30
Wei
ght l
ost (
mg)
Plasma current (mA)
Experimental data Theoretical (based on 100%)
Ag+
+ e-
Ag
2 3 4 50
5
10
Wei
ght l
ost (
mg)
Plasma current (mA)
Experimental data Theoretical (based on 100%)
Cu2+
+ 2e-
Cu
300 400 500 600 700 8000.00
0.05
0.10
0.15
0.20
0.25
Abso
rban
ce
Wavelength (nm)
Increasing timeTime (min)
Ag Au
300 400 500 600 700 8000.0
0.5
1.0
1.5
2.0
2.5
3.0
Abso
rban
ce
Wavelength (nm)
Increasing time
5 10 15X 0.5
Time (min)
10 15 30
SPR
SPR
UV-visible absorbance of Ag and Au nanoparticle colloids
TEM of Ag and Au nanoparticles
0.20 nm
100 nm 5 nm
5 nm100 nm
Ag
Au
Microplasma reduction of metal salts –
Pt anode/HAuCl4
300 400 500 600 700 8000.0
0.1
0.2
0.3
0.4
0.5
1 min 2 min 3 min 4 min 5 min 10 min
Abs
orba
nce
Wavelength (nm)
Time (min)
0.0001 M HAuCl4
in water
Synthesis of Ag nanoparticle colloids for point-of-use SERS applications
AgNO3CV
Pt Anode
Crystal violet:
PlasmaCathode
Ar
400 600 800 1000 1200 14000
500
1000
1500
2000
2500
3000
3500
Inte
nsity
(A.U
.)
Raman shift cm-1
441 799 916 1176 1376 cm-1
10-7
M
5 min
10 min
15 min
20 min
Non-lithographic fabrication of patterned nanoparticle films
►Atmospheric-pressure, near room temperature
►~100 micron lateral resolution
►Polymer and metal salt are interchangeable
►Particle size depends on metal salt concentration
500 µm
~200 µm
AgNO3
+PVA
Reduction of wide range of metal salts is possible
30 40 50 60 70 80 90
2 (Degree)
Rel
ativ
e In
tens
ity (A
.U.)
Pt
Au
Ag
Ag NPsLow salt conc.
Pt NPs
10 nm 10 nm
50 nm
XRD spectra of thin films: TEM of NPs:
10 nm
Au NPs
Ag NPsHigh salt conc.
Flexible polymeric films with patterned metal nanoparticles
Acknowledgments
Funding:
Metal nanoparticle synthesis and characterization
•Amir Avishai (Materials Science)
•Prof. Frank Ernst (Materials Science)
Carbon nanotube characterization
•Regan Silvestri (Macromolecular Science)
•Prof. Jack Koenig (Macromolecular Science)
•Prof. Liming Dai (Chemical Engineering)
•Prof. Ken Singer (Physics)
FET fabrication and testing
•Mohammed Sakr (Physics)
•Prof. Xuan Gao (Physics)
Mentors
•C.C. Liu
•John Angus
Past group members
•Dr. Wei-Hung Chiang (Post Doc, AIST, Japan)
•Matthew Cochey (Product engineer, Venture Lighting)
•Christopher Carach (Ph.D. candidate, UCSB)
Current group members
•Pin Ann Lin (Ph.D. candidate)
•Seung Whan Lee (Ph.D. candidate)
•Carolyn Richmonds
•Tessie Panthani
•Raymond Rodgers
•Trent Hovis
•Megan Witzke
•Albert Xue
410 420 430 440 450 460 470 480 490
* ******
Inte
nsity
(A.U
.)
Wavelength (nm)
Microplasmas contain a high concentration of energetic electrons (> 10 eV)
d=178 m d=500 m
760 Torr Ar10 mA
200 sccm in d=180 μm hole
200 sccm in d=500 μm hole
450 460 470 480 490
* ******
Differential mobility analysis of aerosol nanoparticles
Bipolar charger (85Kr)Polydisperse particles
Sheath flow
High voltage rod-
-
--
-
-
-
-
-
-
-
-
-
-
--ExhaustParticle counter
+
+
+
+
+ --
-
+
Emerging applications of nanomaterials
Roy, Mater. Lett. (2006)Avouris, ACS Nano (2008)
Sailor, Nature Materials (2009)
Atwater, APL (2007)
Nanoelectronics: Catalysis: Nanomedicine:
Solar energy conversion:
0.1 1 10 100103
104
105
106
dN/d
log(
Dm) (
parti
cles
/cm
3 )
Dm (nm)
Aerosol size classification of CNTs catalyzed by Fe and Ni NPs
Fe catalyzed Ni catalyzed
Fe NPs
500 oC
600 oC
0.1 1 10 100103
104
105
106
dN/d
log(
Dm) (
parti
cles
/cm
3 )
Dm (nm)
Ni NPs
400 oC
500 oC600 oC
HRTEM analysis of carbon nanostructures
5 nm
50 nm
20 nm
20 nm
Fe catalyzed Ni catalyzed
500 oC
600 oC
Extracting kinetic parameters for CNT growth from aerosol measurements
CNT length calculation:
DA
Dt
Lt
t
mDDπ
tL 4
2
=
►Electrical mobility diameter (Dm
) corresponds to projected area diameter (DA
)
S.H. Kim et al., J. Aerosol Sci., Vol. 38, 823 (2007)