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    IICCMM 22001100

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    Advance Program

    December 19-22, 2010

    Sofitel Elgezirah, Cairo, Egypt

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    ICM 2010 Welcome Message

    2

    Welcome to the 2010 IEEE/ICM International Conference on Microelectronics (ICM 2010). This year's conference marks the 22ndanniversary of ICM, which is progressing at an excellent rate both in terms of quality and quantity. ICM 2010 will be held at TheSofitel Cairo El Gezirah, Cairo. Sofitel Cairo El Gezirah is the luxury hotel of Cairo, is located on the Nile River, in the heart of thecity.

    ICM 2010 offers a unique forum for researchers and practitioners from academia, industry and government to share their expertiseand research findings in all areas of microelectronics and its applications. This year's conference includes an outstanding technicalprogram, distinguished keynote speakers, and insightful tutorials. ICM2010's technical program consists of several parallel tracks

    every day and it will last for four days including Sunday that is dedicated for tutorials. Each track consists of several sessions of topquality papers. The topics covered in the program include analog and RF circuit design techniques, Digital Signal and dataprocessing, Wireless communication systems, Nonlinear circuits, Systems on Chip (SoCs), VLSI for signal and Image processing,Simulation (process, device, circuit, logic, timing, functional), Layout Parallel embedded systems, Micro / Nanoelectronics, Devicecharacterization and modeling, Device physics and novel structures, Process technology, MEMS Devices among others.

    We received this year a large number of high quality papers. Only high quality papers have been accepted with an acceptance ratiois around 45%. This speaks a lot about the diligent work of the technical program committee chairs, track chairs, technical programcommittee and reviewers. The accepted papers come from over 40 countries with representation from academia, industry, andgovernment.

    Many individuals have contributed to the success of ICM 2010. Our sincere appreciations go to all authors including those whosepapers were not included in the program. Many thanks to our distinguished keynote speakers and tutorial instructors for their

    valuable contribution to the conference. Special thanks to the technical program committee chairs, Prof. M. Alioto and Prof. M.Elgamal. Many thanks go to the track chairs, technical program committee members and reviewers for their timely work and efforts.We thank the excellent work by the Chair of the organizing committee; Prof. Nabil Sabry for taking care of the local arrangement.Our honorary Chair, Prof. Medhat Haroun, Dean of the School of Sciences and Engineering at the American University in Cairo,has supported us in every way possible. Thanks to Prof. M. Sawan and Prof. E. Alarcon for putting together an excellent tutorialprogram. Special thanks go to the publication chair, Eng. Amr Abdelzaher, for his outstanding work and dedication.

    Finally, we would like to thank all of our sponsors: Ministry of Communications and Information Technology, Mentor GraphicsEgypt, Vodafone Egypt, Silicon Vision, MEMS Vision, and the American University in Cairo.

    On behalf of the 2010 IEEE International Conference on Microelectronics, ICM 2010, we welcome you in Egypt. Enjoy the programand your stay.

    Mohab Anis and Mohamed ElmasryGeneral Chairs, ICM 2010

    .

    Mohab Anis Mohammad Elmasry

    ICM 2009 General Chairs

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    Conference Committees

    3

    Honorary Chairs

    Medhat Haroun, Dean of School of Sciences and Engineering, The American University in Cairo

    General Chairs

    M. Anis, The American University in Cairo, Egypt M. Elmasry, University of Waterloo, Canada

    Technical Program Committee Chairs

    M. Alioto, University of Siena, Italy M. Elgamal, McGill University, Canada

    Organizing Committee Chair

    M. Sabry, Mansoura university, Egypt

    Tutorials Chairs

    M. Sawan, EPM, Canada E. Alarcon, UPC, Spain

    Publication Chair

    A. AbdelZaher, Cairo University, Egypt

    Sponsorship Chair

    M. Anis, The American University in Cairo, Egypt

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    Technical Program Committee

    4

    Karim Abd-Meraim, University of Sharjah, UAE B. Soudan, University of Sharjah, UAE Esam Abdelraheem, University of Windsor, Canada Mohamed Abid, National Engineering School of Sfax, Tunisia Zine-Eddine Abid, University of Western Ontario, Canada Hassan Aboushady, University of Paris VI, France

    Mohamed Abu-rahma, Qualcomm Corp. Mohammed Abuelma'ati, King Fahd University of Petroleum and Minerals, Saudi Arabia Massimo Alioto, University of Siena, Italy Wael Badawy, University of Calgary, Canada

    Sergio Callegari, University of Bologna, Italy Masud Chowdhury, University of Illinois at Chicago, USA

    Bernard Courtois, TIMA, France

    Mohamed Dessouky, Ain Shams University, Egypt Mourad El-Gamal, McGill University, Canada

    Ahmed Eltawil, University of California-Irvine, USA

    Mohamed Essaaidi, Abdelmalek Essaadi University, Morocco Wael Fikry, Ain Shams University, Egypt

    Zbigniew Galias, AGH-University of Science and Technology, Poland

    Fayez Gebali, University of Victoria, Canada Hani Ghali, Ain Shams University, Egypt

    Anas Hamoui, McGill University, Canada

    Hassan Hassan, University of Waterloo, Canada Mona Hella, Rensselaer Polytechnic Institute, USA

    Shiyan Hu, Michigan Technological University, USA

    Diaa Khalil, Ain Shams University, Egypt Nabil Khachab, Kuwait University, Kuwait

    Marie Meverve Louerat, LIP6, France

    Henry Leung, University of Calgary, Canada Mourad Loulou, LETI-Sfax, Tunisia

    Len MacEachern, Carlton University, Canada

    Abdalla Naem, National Semiconductor, USA Yoshifumi Nishio, Tokushima University, Japan

    Serdar Ozoguz, Istanbul Technical University, Turkey

    Mohamed-Nabil Sabry, Mansoura University, Egypt Khaled Salama, Rensselaer Polytechnic Institute, USA

    Ashraf Salem, Ain Shams University, Egypt

    Mohamed Sawan, Ecole Polytechnic de Montreal, Canada Sherif Sedky, AUC, Egypt

    Khaled Sharaf, Ain Shams University, Egypt

    Khaled Shehata, AAST, Egypt Wallace Tang, City University of Hong Kong, China

    Tetsushi Ueta, Tokushima University, Japan

    Mohamed Zahran, City University of New York, USA Shawki Areibi, University of Guelph, Canada

    Serag Habib, University of Cairo, Egyp

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    Track Chairs

    5

    Analog Circuits Chairs

    Mohamed Dessouky, Mentor Graphics, Egypt

    Frederic Nabki, University of Quebec at Montreal, Canada

    Device Modeling and Characterization Chair

    Hani Ragai, French University in Egypt

    Wirelessand RF Circuits and Systems Chair

    Mona Hella, Rensselaer Polytechnic Institute, USA

    Architectures & VLSI Systems Chair

    Sergio Bampi, Federal University of Rio Grande do Sul, Brazil

    CAD for VLSI Chair

    Ricardo Reis, Federal University of Rio Grande do Sul, Brazil

    Digital Circuits Chair

    Masud Chowdhury, University of Illinois at Chicago, USA

    MEMS and Emerging Devices Chair

    Frederic Nabki, University of Quebec at Montreal, Canada

    Nanoelectronics Chair

    Volkan Kursun ,The Hong Kong University of Science and Technology, Hong Kong

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    Social Program: Banquet

    6

    Date: Tuesday December 21

    Time: 18:45-22:30

    Location: Beit ElSehemy, Old Cairo

    Departure at 18:45 by bus

    Return to Sofitel El Gezirah Hotel: 23:00 by bus

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    Conference Center at Sofitel Elgezirah

    7

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    Conference Sponsors

    8

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    ICM 2010 Program

    9

    Day Time

    Sun 09:30-12:30 Tutorial 1 Tutorial 2 Tutorial 3

    14:30-17:30 Tutorial 4 Tutorial 5 Tutorial 6

    Mon 09:00-09:45 Opening Ceremony

    09:45-10:45 Keynote address 1

    11:15-13:00ession 1: Analog-to-Digital

    Converters

    ession 2: Leakage and

    Energy Efficiency in High

    Performance Integrated

    Circuits

    ession 3: Devices, Modeling

    nd Characterization

    14:45-16:30ession 4: Improved Design

    Techniques for Arithmetic

    Circuits

    ession 5: Timing Circuits

    nd Optical Links

    ession 6: System Design

    ethodologies I

    16:45-18:15

    Panel: Challenges of NanoElectronics Industry Ecosystem

    in the Arab Region

    Tue 09:30-10:30 Keynote address 2

    11:00-12:45ession 7: Sensing Systems and

    EMS

    Session 8: Multicore and

    Embedded Systems

    Session 9: RF Design,

    Analysis and Techniques

    14:30-16:15 ession 10: Voltage Regulatorsnd Analog Techniques

    ession 11: Advances in

    Graphene and Carbonanotube Device and Wire

    Technologies

    ession 12: Special Session

    Networks-on-Chip/System

    on-Chip Design, Optimization

    nd Validation

    16:30-18:15

    ession 13: Special Session

    Networks-on-Chip/System-on-

    Chip Design, Optimization and

    Validation

    ession 14: Modeling and

    Design with Emerging

    Devices

    ession 15: Special Session

    Crypto-Biometric

    Hardware

    Wed 09:30-10:30 Keynote address 3

    11:00-12:45ession 16: Analog Techniques

    I Session 17: CAD Toolsession 18: Advanced Memory

    Design

    14:30-16:15ession 19: Special Session

    Processor Design

    ession 20: Innovative

    Design and Analysis

    Techniques for DSM

    Technology II

    ession 21: VLSI Systems

    Design

    16:30-18:15ession 22: System Design

    ethodologies II

    ession 23: Device

    odeling

    ession 24: VLSI Systems and

    pplications

    18:15-18:30 Closing Remarks

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    ICM 2010 Keynote Speakers

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    Delivering 10x Design Improvements

    Walden C. Rhines(Chief Executive Officer and Chairman of the Board of Directors,Mentor Graphics)

    Walden C. Rhines is Chairman and Chief Executive Officer of Mentor Graphics, a leader inworldwide electronic design automation with revenue of $789 million in 2008. During his tenure at MentorGraphics, revenue has more than doubled, growth rate since 1999 has been number one among the Big 3EDA companies and Mentor has grown the industry's number one market share solutions in physicalverification, design concept-through-functional verification and printed circuit board design. Prior to joiningMentor Graphics, Rhines was Executive Vice President of Texas Instruments Semiconductor Group, sharingresponsibility for TI's Components Sector, and having direct responsibility for the entire semiconductorbusiness with more than $5 billion of revenue and over 30,000 people. During his 21 years at TI, Rhinesmanaged TI's thrust into digital signal processing and supervised that business from inception with the TMS320 family of DSP's through growth to become the cornerstone of TI's semiconductor technology. He was

    also responsible for development of the first TI speech synthesis devices (used in Speak & Spell) and is co-inventor of the GaN blue-violet light emitting diode (now important for DVD players). He was President ofTI s Data Systems Group and held numerous other semiconductor executive management positions. Rhinesis currently in his fourth term as Chairman of the Electronic Design Automation Consortium. He is also aboard member of the Semiconductor Research Corporation, Lewis and Clark College and the PortlandClassic Wines Auction. He has previously served as chairman of the Semiconductor Technical AdvisoryCommittee of the Department of Commerce, as an executive committee member of the board of directors ofthe Corporation for Open Systems and as a board member of the Computer and Business EquipmentManufacturers' Association (CBEMA), SEMI-Sematech/SISA, Electronic Design Automation Consortium(EDAC), University of Michigan National Advisory Council and Sematech. Dr. Rhines holds a Bachelor ofScience degree in metallurgical engineering from the University of Michigan, a Master of Science and Ph.D.

    in materials science and engineering from Stanford University, a master of business administration fromSouthern Methodist University and an Honorary Doctor of Technology degree from Nottingham TrentUniversity.

    Delivering 10X Design Improvements

    Today, the exponential rise in complexity has quickened its pace as the semiconductor industrymoves from adoption of 28 nm to 20 nm and below, enabling tens of billions of transistors per chip. Dr.Wally Rhines will discuss how in the next five years, 10X improvements in design methodologies areneeded. He will provide a roadmap for the next wave of changes needed to successfully negotiate risingcomplexity, highlighting where they will most likely occur and the impact it will have on the emerging

    semiconductor industry in the Middle East.

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    ICM 2010 Keynote Speakers

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    Engineering Education for Enhanced Innovation

    Adel Sedra (Dean of Faculty of Engineering, University of Waterloo)

    .

    Adel Sedra received a BSc degree from Cairo University, Egypt, in 1964, and MASc and PhDdegrees from the University of Toronto, Canada, in 1968 and 1969 respectively, all in ElectricalEngineering. Dr. Sedra joined the faculty of the University of Toronto in 1969, rising to the rank ofProfessor in 1978. During 1986-1993, he served as Chair of the Department of Electrical Engineering (nowElectrical and Computer Engineering). On July 1, 1993 he assumed the position of Vice-President, Provost,and Chief Academic Officer of the University of Toronto and served in this capacity for nine years, leadingthe University through two major long-range planning cycles, in 1994 and 1999. On July 1, 2003, Prof.Sedra joined the University of Waterloo as Dean of the Faculty of Engineering where he led the Vision 2010academic planning process. Professor Sedra specializes in the area of microelectronics. He has co-authoredabout 150 papers and three textbooks, including Microelectronic Circuits, which is now in its fifth editionand in ten languages, with over one million copies in print. Dr. Sedra currently serves on the ResearchCouncil of the Canadian Institute of Advanced Research (CIFAR), and has just completed thirteen years ofservice as a delegate to Oxford University Press. Awards and honours include: FIEEE (1984), FCAE (1999),FRSC (2003), Education Medal of the IEEE (1996), Award of Excellence of Ontario Professional Engineers(2002), D.Sc. (Hon.) Queen=s University (2003), LLD (Honoris Causa) University of Toronto (2005), D.Sc. (Honoris Causa) McGill University (2007).

    Engineering Education for Enhanced Innovation

    As nations deal with the economic challenges of the early twenty-first century, the need for engineersremains as critical or even more so than it was over the second half of the twentieth century. Clearly,advances in technology have changed the nature of the work of engineers. Some of what engineers used todo fifty years ago, has been greatly simplified by the advances in computer-aided design and modeling andsimulation. As a result, the engineers of the future will be called upon to contribute at a higher level on theinnovation axis. They will have to deal with more complex problems that in many cases aremultidisciplinary, with some of the disciplines being outside what has been normally the domain ofengineering, e.g. the life sciences. While the need for engineers with a broader and deeper outlook and skillsets has been increasing, the structure of the engineering curriculum has remained virtually unchanged. Aswell, in some countries, notably the USA, the production of engineers per capita has been diminishing. Thisdoes not bode well for the hoped for enhancements in productivity, standard of living, and quality of life ingeneral. This presentation will examine these issues in some detail and will propose some ideas for

    educating the innovative engineer.

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    ICM 2010 Keynote Speakers

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    Millimeter Scale Sensor Node Design using Low Voltage Operation

    David Blaauw (Professor, University of Michigan - Ann Arbor)

    David Blaauw received the B.S. degree in physics and computer science from Duke University,Durham, NC, in 1986, and the Ph.D. degree in computer science from the University of Illinois, Urbana, in1991. Until August 2001, he worked for Motorola, Inc., Austin, TX, where he was the manager of the HighPerformance Design Technology group. Since August 2001, he has been on the faculty at the University ofMichigan where he is a Professor. His work has focused on VLSI design with particular emphasis on ultra-low-power and high-performance design. Dr. Blaauw was the Technical Program Chair and General Chairfor the International Symposium on Low Power Electronic and Design. He was also the Technical ProgramCo-Chair of the ACM/IEEE Design Automation Conference and a member of the ISSCC Technical ProgramCommittee.

    Millimeter Scale Sensor Node Design using Low Voltage Operation

    Miniaturized sensor nodes are increasingly in demand for applications ranging from structuralmonitoring (such as bridges and buildings) to implantable medical devices, such as intra-occular pressuremonitoring. In current systems, form factor is dominated by the size of the battery and/or the energyharvesting unit, making energy consumption the fundamental barrier to miniaturization. We first present anumber of application areas that become accessible with mm-scale sensing. We then present an ultra-lowpower sensor design, including a 30pW sensor processor, low power timers, memories, power management,solar harvesting and communication that can operate on a sub-mm3 battery for months to years. The key toour low power approach is to operate circuits at low supply voltages (300 - 400mV). We discuss the gainsand hurdles involved in 1mm3 designs and present our design of a 1mm3 sensor.

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    ICM 2010 Tutorials

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    Tutorial 1: Sunday December 19, 9:30 - 12:30

    Embedded Memory Design in Nanometer TechnologiesMohamed H. Abu-Rahma (Qualcomm, USA)

    Baker Mohammad (Qualcomm, USA)

    With technology scaling, the requirements of higher density and lower power embedded SRAMs areincreasing exponentially. Nowadays, a large percentage of microprocessors and SoC die areas are occupiedby memories, and this percentage is expected to increase substantially in the future. This increase is drivenby the high demand for low-power mobile systems, which integrate a wide range of functionality such asdigital cameras, 3-D graphics, MP3 players, and other applications. However, technology scaling whichenables packing millions of transistors on the same die also brings many new design challenges due to theincrease in leakage and variability combined with requirement for lower supply voltage operation. Thistutorial is aimed at providing a comprehensive look at SRAM-based memory design challenges innanometer technologies (45nm and below). Attendees will see how state-of-the-art SRAMs are designed

    starting from the bitcell design aspects and macro level, to the microprocessor architecture interactions andrequirements. The tutorial will also cover topics related SRAM design robustness and statistical designmethodologies which are of utmost importance in nanometer technologies.

    Mohamed H. Abu-Rahmareceived the B.Sc. degree (with honors) in electronics and communicationengineering from Ain Shams University, Cairo, Egypt, the M.Sc. degree in electronics and communicationengineering from Cairo University, Egypt, and the Ph.D. degree in electrical engineering from theUniversity of Waterloo, ON, Canada. From 2001 to 2004, he was with Mentor Graphics, where he workedon MOSFET compact models development and extraction. He joined Qualcomm Incorporated in 2005,

    where he has been engaged in the research and development of low-power embedded SRAM and CMOScircuits. He has authored and co-authored several technical papers in refereed international conferences and

    journals. He holds 1 patent, with several patents filed (pending). His research interests include low-powerdigital circuits, variation-tolerant memory design, and statistical design methodologies.

    Baker Mohammadis a Senior staff Engineer/Manager at Qualcomm, Austin where he is engaged indesigning high performance, and low power DSP processor used for communication and multi-mediaapplication. Prior to joining Qualcomm he worked on a wide range of micro-processors design at IntelCorporation from high performance, server chips > 100Watt (IA-64) , to mobile embedded processor lowpower sub 1 watt (xscale). He has over 15 years experience in processor design with emphasis on memory,circuit and physical design. He earned his PhD from University of Texas at Austin in Electrical andComputer Engineering. His research area is in low power high yield SRAM-based memory .He received hisM.S. degree from Arizona State University, Tempe , and BS degree from the University of New Mexico,Albuquerque, both in electrical engineering.

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    ICM 2010 Tutorials

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    Tutorial 2: Sunday December 19, 9:30 - 12:30

    TRENDS AND CHALLENGES IN THE DESIGN OF Sigma-Delta MODULATORS:

    STATE-OF-THE-ART SURVEY AND APPLICATION TO SOFTWARE DEFINEDRADIO

    Jose M. de la Rosa (Institute of Microelectronics of Seville, IMSE-CNM(CSIC/University of Seville, Spain)

    The road to future Software-Defined-Radio (SDR) mobile terminals will require System-on-Chip (SoC)transceiver solutions, implemented using mainstream nanometer CMOS processes as the base technologyand embedding digitally-assisted adaptive analog front-ends. One of the key elements of these systems is theAnalog-to-Digital Converter (ADC), since increasingly more signal processing is moving from the analog to

    the digital side, taking advantage thus, of programmability, firmware upgrading and technology down-scaling. State-of-the-art multi-standard, multi-mode ADCs have been mainly implemented using Sigma-Delta Modulators. Based on the combination of oversampling and advanced architectural and circuitaltechniques to shape the quantization noise, Sigma-Delta ADCs achieve a high degree of flexibility as well asrobustness with respect to physical-level effects. However, the design of nanometer CMOS Sigma-DeltaADCs involves a number of practical issues and trade-offs that must be taken into account in order tooptimize their performance in terms of power consumption, silicon area and time-to-market deployment.This has motivated that, during the last few years, significant efforts and contributions have been made todecrease the power budget of Sigma-Delta Modulators and to increase their range of applications in theresolution-vs-bandwidth plane whereas keeping compatibility with low-voltage supply. This tutorialpresents a comprehensive description of Sigma-Delta Modulators, their basic operation, trends and

    challenges at both architectural and circuital levels going from system-level design considerations tophysical implementation, packaging and measurements with emphasis on nanometer CMOS realizationand their application to the next generation of SDR mobile terminals.

    Jose M. de la Rosareceived the M.S. degree on Electronics Physics in 1993 and the Ph.D. degree in 2000,both from the University of Seville, Spain. Since 1994, he has been working at the Institute ofMicroelectronics of Seville (IMSE-CNM, CSIC), of the Spanish Microelectronics Center. He is also withthe Department of Electronics and Electromagnetism of the University of Seville, where he is currently anAssociate Professor. His main research interests are in the field of mixed-signal integrated circuits,

    especially high-performance data converters including analysis, behavioral modeling and design automationof such circuits. In this topic, Prof. de la Rosa has participated in a number of National and European R&Dprojects and has co-authored 3 books and over 130 international papers, including journal and conferencepapers and book chapters.

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    ICM 2010 Tutorials

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    Tutorial 3: Sunday December 19, 9:30 - 12:30

    Power-Aware Testing and Test Strategies for Low-Power DevicesPatrick GIRARD (University of Montpellier, France)

    Nicola NICOLICI (McMaster University, Canada)

    Xiaoqing WEN (Kyushu Institute of Technology, Japan)Managing the power consumption of circuits and systems is now considered as one of the most important

    challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling,clock gating or power gating techniques, are used today to control the power dissipation during functionaloperation. The usage of these strategies has various implications on manufacturing test, and power-aware

    test is therefore increasingly becoming a major consideration during design-for-test and test preparation forlow-power devices. This tutorial provides the fundamental and advanced knowledge in this area. It isorganized into three main parts. The first one gives necessary background and discusses issues arising fromexcessive power dissipation during manufacturing test. The second part provides comprehensive knowledgeof structural and algorithmic solutions that can be used to alleviate such problems. The last part surveys low-power design techniques and shows how low-power circuits and systems can be tested safely withoutaffecting yield and reliability. Electronic Design Automation (EDA) solutions for testing low-power devicesare also covered in the last part of the tutorial.

    Patrick GIRARDreceived a M.S. degree in Electrical Engineering and a Ph.D. degree in Microelectronicsfrom the University of Montpellier, France, in 1988 and 1992 respectively. He is currently ResearchDirector at CNRS (French National Center for Scientific Research), and Head of the MicroelectronicsDepartment of the LIRMM (Laboratory of Informatics, Robotics and Microelectronics of Montpellier -France). His research interests include all aspects of digital testing and memory testing, with emphasis oncritical constraints such as timing and power. From 2006 to 2010, Patrick Girard was Vice-Chair of theEuropean Test Technology Technical Council (ETTTC) of the IEEE Computer Society. He has served onnumerous conference committees including ACM/IEEE Design Automation Conference (DAC),ACM/IEEE Design Automation and Test in Europe (DATE), IEEE International Test Conference (ITC),IEEE International Conference on Computer Design (ICCD), IEEE VLSI Test Symposium (VTS), IEEEEuropean Test Symposium (ETS), IEEE Asian Test Symposium (ATS), and ACM/IEEE InternationalSymposium on Low Power Electronic Design (ISLPED). Patrick Girard is the founder and Editor-in-Chief

    of the ASP Journal of Low Power Electronics (JOLPE). He is an Associate Editor of the IEEE Transactionson VLSI Systems and the Journal of Electronic Testing Theory and Applications (JETTA -Springer). From2005 to 2009, he was an Associate Editor of the IEEE Transactions on Computers. He is a co-editor of thebook Power-Aware Testing and Test Strategies for Low Power Devices, Springer, 2009, and a coauthorof the book Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection inNanoscale Technologies, Springer, 2009. Patrick Girard has been involved in several European researchprojects (ESPRIT III ATSEC, EUREKA MEDEA, MEDEA+ ASSOCIATE, IST MARLOW, MEDEA+NanoTEST, CATRENE TOETS) and has managed industrial research contracts with major companies likeInfineon Technologies, Atmel, STMicroelectronics, etc. He has supervised 22 PhD dissertations and haspublished 6 books or book chapters, 34 journal papers, and more than 110 conference and symposiumpapers on these fields. He received two Best Paper Awards (ETS 2004 and DDECS 2005). Patrick Girard is

    a Senior Member of IEEE.

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    ICM 2010 Tutorials

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    Nicola NICOLICIis an Associate Professor in the Department of Electrical and Computer Engineering atMcMaster University, Canada. He received the Dipl. Ing. degree in Computer Engineering from thePolitehnica University of Timisoara, Romania (1997), and a Ph.D. in Electronics and Computer Sciencefrom the University of Southampton, U.K. (2000). His research interests are in the area of computer-aideddesign and test. He has authored over seventy research papers and one book in this area and received the

    IEEE TTTC Beausang Award for the Best Student Paper at the International Test Conference (ITC 2000)and the Best Paper Award at the IEEE/ACM Design Automation and Test in Europe Conference (DATE2004). He served on the technical program committees for DATE, IEEE/ACM Design AutomationConference (DAC), IEEE European Test Symposium (ETS), IEEE Defect and Fault Tolerance Symposium(DFT), IEEE Asian Test Symposium (ATS), IEEE International Conference on Computer Design (ICCD),IEEE/ACM International Symposium on Networks-on-Chip (NOCS), IEEE Symposium on Design andDiagnostics of Electronic Circuits and Systems (DDECS), IEEE Workshop on Silicon Debug and Diagnosis(SDD), and he served as the Co-Founder, Program Co-Chair and General Chair for the Diagnostic Servicesin Network-on-Chips Workshop. He was the guest co-editor for a special issue on Silicon Debug andDiagnosis (published by IETProceedings on Computers and Digital Techniques in November 2007) and aspecial issue on Low Power Test (published by for the Journal of Electronic Testing Theory and

    Applications in August 2008). He currently serves on the Editorial Boards of JETTA, IET Computers andDigital Techniques and Integration, the VLSI Journal. He is a member of the ACM SIGDA, the IET and theIEEE Computer and Circuits and Systems Societies.

    Xiaoqing WENreceived a B.E. degree from Tsinghua University, Beijing, China, in 1986, a M.E. degreefrom Hiroshima University, Hiroshima, Japan, in 1990, and a Ph.D degree from Osaka University, Osaka,Japan, in 1993. From 1993 to 1997, he was a Lecturer at Akita University, Akita, Japan. He was a VisitingResearcher at University of Wisconsin, Madison, U.S.A., from October 1995 to March 1996. He joinedSynTest Technologies, Inc., U.S.A., in 1998, and served as its CTO until 2003. In January 2004, he joined

    the Kyushu Institute of Technology, Iizuka, Japan, where he is currently a Professor. He was the ProgramCommittee Co-Chair of the Sixteenth IEEE Asian Test Symposium and the Eighth IEEE Workshop on RTLand High Level Testing. In addition, he served on the program committees of IEEE Asian Test Symposium(ATS), IEEE/ACM Asian and South Pacific Design Automation Conference (ASPDAC), IEEE IntlSymposium on Electronic Design, Test, & Applications (DELTA), IEEE Int'l Conf. on Design & Test ofIntegrated Systems in Nanoscale Technology (DTIS), IEEE Int'l Test Conference (ITC), IEEE Workshop onRTL and High Level Testing (WRTLT), and IEEE Workshop on Defect-Based Testing (DBT). His researchinterests include low-power test generation, high-quality test generation, test compression, fault diagnosis,and testable design. He is the Co-Editor of the book VLSI Test Principles and Architectures: Design forTestability (Elsevier, 2006), 32 journal papers, and 60 conference and symposium papers. He is a seniormember of the IEEE, a member of the IEICE, and a member of the REAJ.

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    ICM 2010 Tutorials

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    Tutorial 4: Sunday December 19, 14:30 - 17:30

    Power Management Systems on Chip (SoC) for Mobile Applications

    Gabriel A. Rincn-Mora (Georgia Institute of Technology, USA)Emerging feature-dense mobile devices pose several design hurdles, from demanding high performance

    and extended battery life in a single miniaturized system-on -chip (SoC) platform to supplying multiplesystem components that demand vastly diverse and application-specific requirements. Maintainingaccuracy performance and power losses in check while biasing, managing, and regulating multiple loads in ahighly integrated environment is an inherently arduous undertaking, especially when considering sensitiveanalog microelectronics share their common substrate with noisy switching supplies. As a result, in light ofthe increasing proliferation of highly integrated supplies in portable consumer, biomedical, andreconnaissance products, this tutorial introduces, illustrates, and explains how to understand, develop, anduse semiconductor devices to design power integrated circuits (ICs) and systems for mobile applications. To

    that end, after briefly reviewing the requirements that portable systems impose on their constituentsubsystems, this seminar illustrates by way of examples how to design basic bias circuits, bandgap-voltagereferences, low-dropout (LDO) regulators, switched-inductor dc-dc converters, and lithium-ionchargers. The tutorial ultimately seeks to furnish the participant with a physical and intuitive view ofpower-management circuits that transcends rigorous mathematical and algebraic formulations, empoweringhim or her with the tools necessary to understand, analyze, and design power-supply ICs.

    Gabriel A. Rincn-Morareceived the B.S., M.S., and Ph.D. degrees in electrical engineering and workedfor Texas Instruments in 19942003, was appointed Adjunct Professor for Georgia Tech in 19992001, andbecame a full-time faculty member at Georgia Tech in 2001. His scholarly products include 7 books, 1 bookchapter, over 125 scientific publications, 27 patents, over 26 commercial power management chip designs,and over 42 international speaking engagements. He received the National Hispanic in Technology Award,the Charles E. Perry Visionary Award, a Commendation Certificate from the Lieutenant Governor ofCalifornia, IEEE CASS MWSCASs Service Award, and Robins Air Force Bases Orgullo Hispano andHispanic Heritage awards. He was inducted into Georgia Techs Council of Outstanding Young EngineeringAlumni, elected IEEE CASS Distinguished Lecturer for 20092010, elevated to IET Fellow, and featuredon the cover of Hispanic Business magazine as one of The 100 Most Influential Hispanics, La Fuente(Dallas publication), and three times on Nuevo Impacto (Atlanta magazine). He is an Associate Editor forIEEEs TCAS II, Editorial Board Member for JOLPE, was General Chair for SRCs Energy and Power

    Workshop in 2009, Circuit Design Vice Chair for IEEEs 2008 ICCDCS, Chairman of Atlantas joint IEEESSCS-CASS, IEEEs CASS ASP Technical Committee member, Steering Committee Member for IEEEsMWSCAS, Technical Program Chair for IEEEs 2007 MWSCAS-NEWCAS, and Technical Program Co-Chair for IEEEs 2006 MWSCAS.

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    Tutorial 5: Sunday December 19, 14:30 - 17:30

    BioMEMS: An Enabling Technology

    Hisham Mohamed (Egyptian Nanotechnology Center, Egypt)

    James N. Turner (Binghamton University, USA)Recent progress in microfabrication technology, developed and used by the integrated circuits (ICs)

    industry, is being applied to biomedical applications. It became a relatively new field of research known asBioMEMS. Microfabricated devices have been used in a broad range of biomedical and biologicalapplications. In the last decade, microchips have been used in many biological applications such as inmicroscale sensors for surgical instruments, monitoring physiological activities, in microfluidicsapplications such as drug discovery and delivery, cell sorting, DNA amplification, and electrophoresis.BioMEMS is a multi-disciplinary research field that requires the integration of knowledge and techniques

    from many disciplines such as engineering, biology, physics, and/or chemistry to develop a device withbiological utility. Microfabricated devices are used to study and generate new insights into how biologicalsystems work. On the other hand, researchers learn from biology to create new micro-nanoscale devices tobetter understand life processes at the nanoscale. BioMEMS is a challenging field due to the vastly diversearray of materials and chemical systems important to biological applications. Thus new fabrication processesmust be developed for use with biologically relevant material systems while keeping the ability toeffectively address dimensions at the molecular scale. The first objective of this tutorial is to present anoverview of the available technology, its strengths and current limitations, and current and potentialapplications with examples from the literature and the instructors laboratories. The second objective is tointroduce engineers and life scientists to basic terminologies and concepts to facilitate the initiation of joint,multidisciplinary projects.

    Hisham Mohamedreceived the B.S. degree in electrical engineering from Ain Shams University, Cairo,Egypt, in 1993, and the M.S. and the Ph.D. degrees in biomedical engineering from the University ofMinnesota, Minneapolis, Minnesota, USA, in 1997 and 2000, respectively. He performed his postdoctoraltraining at the Wadsworth, Center New York State Department of Health, Albany New York, USA. Dr.Mohamed is currently a Senior Research Scientist at the Egyptian Nanotechnology Center (EGNC) and avisiting Scientist at IBM, Watson Research Laboratories in Yorktown Heights, NY. His research interestsare in photovoltaic devices, applications of carbon based materials such as carbon nanotubes and graphenefor electronic devices, in the implementation of microelectromechanical systems (MEMS) for biomedicalapplications and in the areas of rare cell fractionation, on-chip filtration, and rapid prototyping for

    microfluidics and biochips. He has developed BioMEMS devices for cell separation and DNA isolation andpurification.

    James N. Turnerreceived a B.S. degree in engineering science and a Ph.D. degree in biophysics from theState University of New York, Buffalo, New York, USA, in 1968 and 1973, respectively. He did NationalInstitutes of Health (NIH) and National Science Foundation (NSF) Postdoctoral Fellowships at the RoswellPark Memorial Institute, Buffalo, New York. He Directed the Three-Dimensional Light Microscopy Facilityand the Nanobiotechnology Program at the Wadsworth Center, New York State Department of Health,Albany, and was a Platform Leader and Executive Committee Member of the Nanobiotechnology Center, anNSF-sponsored Science and Technology Center led by Cornell University, Ithaca, NY. He was alsoProfessor of Biomedical Engineering at Rensselaer Polytechnic Institute, Troy, NY, and Professor of

    Biomedical Sciences, School of Public Health, University at Albany, Albany, NY. He is currently aResearch Scientist in the Small-Scale Systems Integration and Packaging Center of Binghamton University,Binghamton, NY with responsibility for developing a program in biological applications for BioMEMsespecially those utilizing flexible electronics. He has served on numerous NIH advisory panels.

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    Tutorial 6: Sunday December 19, 14:30 - 17:30

    New Trends in Testing Analogue and RF Integrated Circuits: Is BIST an

    Option?Jos L. Huertas (University of Seville, Spain)This tutorial aims to present a full picture of the existing and emerging techniques for testing integrated

    circuits in which coexist analogue, mixed-signal and RF parts. These techniques are grouped into categories,which prove to be valid for baseband and RF circuitry. Their potential usefulness for implementing BIST isalso studied in depth, determining metrics to qualify every category. This tutorial is organized into 5 mainSections. The first one gives an introduction to the increasing importance of analogue and RF circuitry bythemselves and when embedded into complex integrated systems. Examples are given to motivate theaudience and to convince it on the need for offering complete solutions combining design and test as awhole. Mainly based on relative cost figures, design and test efforts are compared and their evolution isforeseen. As a consequence, the adaptation of BIST (Built-In-Self-Test) to non-digital circuits is presentedand its difficulty discussed. A target example, a complex SoC provided with wireless functionalities, isintroduced as a vehicle to understand problems and propose solutions along the tutorial. Second Section isdevoted to offer the attendees with an insight on the demanding problems arisen for the coexistence ofheterogeneous circuitry (digital, analogue, RF) in the same integrated system. Testing in this context is verycomplex, but solutions are emerging to comply with the existing needs. External and embedded testtechniques are presented, identifying their benefits and pointing out the main issues to look for in every case.In essence, the two main categories of these techniques are described, namely, specification-based andfunctional-based test, working out in detail their benefits and penalties. For each of these two categories,feasibility of BIST for circuits with non-digital components is discussed, qualifying the problematic for bothtest application and test interpretation phases, and giving figures on the requirements to impose on accuracy,

    linearity, frequency, etc. Third Section is focused on describing the available techniques for testing basebandcircuits as a typical example of how the application context must be taken in account when deciding on theuse of BIST. This Section is mainly targeting A/D converters since they are always needed and reflect thesignificant aspects of testing mixed-signal integrated circuits. The main parameters to be tested are describedas well as the difficulty of performing the related measurements, making a distinction between classicalstatic and dynamic test metrics. Then, test techniques in use are reviewed under the scope of classifyingthem into four main categories, determining how suitable everyone is for BIST. In summary, the focus is todescribe these techniques, discussing to what extent signal requirements could be relaxed for on-chipgeneration and/or measurement. Emphasis is on the introduction of the so-called alternate test methods asthey offer interesting features by themselves and in connection to BIST. A fourth Section is centered on testtechniques for RF circuitry. This is considered in connection to the overall testing of a complete transceiver

    and takes into account the categories introduced in Section 3, to prove that most RF techniques fall into oneof them. A main difference is the kind of parameter to be tested, which are also reviewed in this Section.Loop-back, embedded sensors, defect-based, model-based and envelope test techniques are described andtheir pros and cons discussed. Then, their potentiality in terms of providing simplified signatures at lowerfrequency is studied as it is probably the more efficient way of testing simultaneously at RF and basebandfrequencies. Examples are extensively considered, trying to give FoM for any of them. Finally, some recentBIST cases are also introduced. A final Section aims to provide with a general discussion on what is a realityalready, what is promising and what should be needed to come up with something practical, and what israther difficult to improve. Emphasis is put on combining together different test methods in complex chipswhere digital, analogue and RF may coexist. Some additional considerations are also given about theextension of some of the methods described in previous Sections to cope with integrated sensors as well.

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    Detailed Program

    Sunday, December 19, 2010

    Registration (9:30-12:30, 14:30-17:30)

    (9:30-12:30) Tutorial T1 Embedded Memory Design in Nanometer Technologies

    (Room: Champs-Elyses 1)

    (9:30-12:30) Tutorial T2 Trends and Challenges in the Design Of Modulators: State-of-the-Art

    Survey and Application to Software Defined Radio

    (Room: Champs-Elyses 2)

    (9:30-12:30) Tutorial T3 Power-Aware Testing and Test Strategies for Low-Power Devices

    (Room: Opera 2)

    (14:30-17:30) Tutorial T4 Power Management Systems on Chip (SoC) for Mobile Applications

    (Room: Opera 2)

    (14:30-17:30) Tutorial T5 BioMEMS: An Enabling Technology

    (Room: Champs-Elyses 1)

    (14:30-17:30) Tutorial T6 New Trends in Testing Analogue and RF Integrated Circuits: Is BIST an

    Option?

    (Room: Champs-Elyses 2)

    Monday, December 20, 2010

    Keynote 1 (9:45-10:45): Delivering 10X Design Improvements, Walden C. Rhines - Chief Executive

    Officer and Chairman of the Board of Directors, Mentor Graphics

    (Room: Opera 2)

    (8:00-9:00) Registration

    (9:00-9:45) Opening Ceremony

    (10:45-11:15)Coffee Break

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    Session 1: Analog-to-Digital Converters (11:15-13:00)

    (Room: Champs-Elyses 1)

    Session Chair: Mohamed Dessouky (Mentor Graphics - Egypt)

    Session co-Chair: Ahmed Nader (Cairo University - Egypt)

    1) Least Mean Square calibration method for VCO non-linearityHariprasath Venkatram (Oregon State University - USA);Rajesh Inti (Oregon State University - USA); Un-

    Ku Moon (Oregon State University - USA)

    2) ENOB Calculation for ADCs with Input-Correlated Quantization Error Using a Sine-WaveTest

    Skyler Weaver (Oregon State University - USA);Benjamin Hershberg (Oregon State University -

    USA); Un-Ku Moon (Oregon State University - USA)

    3) Measurement of Continuous-Time Sigma Delta Modulators: Implications of Using

    Spectrum Analyzer

    Ahmed Ashry(Laboratoire d'informatique de Paris 6);Ahmed El-Shennawy (SiWare Egypt);Mohammad A. Elbadry (University of Minnesota USA);Ayman Elsayed(SiWare

    Egypt);Hassan Aboushady(Laboratoire d'informatique de Paris 6)

    4) An Energy Recovery Approach for a Charge Redistribution Successive Approximation

    ADC

    Howard Tang (Nanyang Technological University - Singapore);Liter Siek(Nanyang Technological

    University - Singapore)

    5) Two-Phase Correlated Level Shifting Switched-Capacitor Techniques

    Amr Essam (Mentor Graphics Egypt);Mohamed Dessouky (Mentor Graphics Egypt)

    6) Analog Digital Conversion Specifications for WiMAX

    Jihene Mallek(ENIS, LETI - Tunisia);Hassene Mnif(University of Sfax - Tunisia);Mourad Loulou

    (University of Sfax - Tunisia)

    Session 2: Leakage and Energy Efficiency in High Performance Integrated Circuits (11:15-13:00)

    (Room: Opera 2)

    Session Chair: Faiz ul Hassan (University of Glasgow - UK)

    Session co-Chair: Sarma Vrudhula (Arizona State University - USA)

    1) Optimization of On-chip Communication Link Performance under Area, Power and

    Variability Constraints

    Faiz ul Hassan (University of Glasgow - UK); Wim Vanderbauwhede (University of Glasgow - United

    Kingdom); Fernando Rodriguez-Salazar(University of Glasgow - United Kingdom)

    2) Design of a robust, high performance standard cell threshold logic family for DSM

    technology

    Samuel Leshner(Arizona State University - USA); Krzysztof Berezowski (TIMA Laboratory -

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    France);Niranjan Kulkarni; Sarma Vrudhula (Arizona State University USA)

    3) Reducing the Leakage of Memory blocks Aggressively

    Dalia A.F. El-Dib (University of Victoria - Canada);Heba A. Shawkey (Elecronic Research Institute -

    Egypt);Zine-Eddine Abid(University of Western Ontario - Canada)

    4) Physical Design Aware Selection of Energy-Efficient and Low-Energy Nanometer Flip-

    Flops

    Massimo Alioto (University of Siena - Italy and currently also with BWRC, UCBerkeley USA);Elio

    Consoli (University of Catania - Italy); Gaetano Palumbo (University of Catania - Italy)

    5) A Transregional Model for Near-Threshold Circuits with Application to Minimum-Energy

    Operation

    David Harris (Harvey Mudd College - USA);Ben Keller(Harvey Mudd College - USA)

    6) VSECURE: Active & Standby Subthreshold Leakage Current Reduction Technique

    Vaibhav Neema (Devi Ahilya university - India); Sanjiv Tokekar(Devi Ahilya university - India)

    Session 3: Devices, Modeling and Characterization (11:15-13:00)

    (Room: Champs-Elyses 2)

    Session Chair: Hisham Haddara (Si-Ware Systems - Egypt)

    Session co-Chair: Wael Fikry (Ain Shams University - Egypt)

    1) Compact Model for Short and Ultra thin Symmetric Double Gate

    Ahmed Abo-Elhadeed(Mentor Graphics Egypt)

    2) Physical Parametric Analysis of 16nm N-Channel Carbon-Nanotube Transistors for

    Manufacturability

    Yanan Sun (HKUST - Hong Kong); Volkan Kursun (HKUST - Hong Kong)

    3) Fabrication and Characterization of a Ferroelectric-Gate FET with a ITO/PZT/SRO/PtStacked Structure

    Tue Phan; Trinh Bui;Miyasako Takaaki; Shimoda Tatsuya (Japan Advanced Institute of Science and

    Technology - Japan); Tokumitsu Eisuke (Tokyo Institute of Technology - Japan)

    4) Improved Efficiency of CMOS Light Emitters in Punch Through with Field Oxide

    Manipulation

    Petrus Venter;Monuko du Plessis (University of Pretoria - South Africa);Marius Goosen (INSiAVA

    (Pty) Ltd - South Africa);Hannetjie Nell;Alfons W Bogalecki (University of Pretoria - South Africa)

    5) Magneto-thermopower properties in Spin Field-Effect Transistors

    George S. Kliros (Hellenic Air-Force Academy - Greece)

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    6) Unified Drain Current Model for Independently Driven Double Gate MOSFETs

    Binit Syamal (Jadavpur University, India - India); Pradipta Dutta (KIIT University - India);

    N Mohankumar(SKP Engineering College - India);Chandan K. Sarkar(Jadavpur University - India)

    Session 4: Improved Design Techniques for Arithmetic Circuits (14:45-16:30)

    (Room: Champs-Elyses 1)

    Session Chair: Adly T. Fam (University at Buffalo - USA)

    Session co-Chair: Noha Younis Ahmed (Cairo University - Egypt)

    1) The Interlaced Carry-Arrest Adder

    Adly T. Fam (University at Buffalo - USA)

    2) Design and Evaluation of High-Speed Energy-Aware Carry Skip Adders

    Marco Lanuzza; Fabio Frustaci;Raffaele De Rose (University of Calabria - Italy)

    3) MOS Current Mode Logic Realization of Digital Arithmetic Circuits

    Ahmed H. Madian (Egyptian atomic energy authority, NCRRT - Egypt); Yassmeen El-Hariry (Germany

    University in Cairo Egypt)

    4) Nanometer Flip-Flops Design in the E-D Space

    Massimo Alioto (University of Siena - Italy and currently also with BWRC, UCBerkeley USA);

    Elio Consoli; Gaetano Palumbo (University of Catania - Italy)

    5) On the modulo 2n+1 subtract units for weighted operands

    Costas Efstathiou;Ioannis Voyiatzis (Technological Education Institute of Athens - Greece)

    Session 5: Timing Circuits and Optical Links (14:45-16:30)

    (Room: Champs-Elyses 2)

    Session Chair: Emad Hegazy (Ain Shams University - Egypt)

    Session co-Chair: Ayman Ahmed (Si-Ware Systems - Egypt)

    1) Power-Aware Design for High Data Rate Free Space Optical Receivers

    Behrooz Nakhkoob;Mona Hella (RPI - USA)

    2) An Integrated Optical Receiver for 2.5Gbit/s Using 4-PAM Signaling

    Mohamed Atef(Vienna University of Technology - Austria);Robert Swoboda (A3PICs Electronics

    Development GmbH - Austria);Horst Zimmermann (Vienna University of Technology - Austria)

    (13:00-14:45) Lunch

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    3) A 0.8-6.3 GHz Spread Spectrum Clock Generator for SerDes Transmitter Clocking

    Rania Hassan Mekky (MEMS Vision - Egypt);Mohamed Dessouky (Mentor Graphics Egypt)

    4) A Technique for Robust Division Ratio Switching in Multi Modulus Dividers with Modulus

    Extension

    Mohamed Hussein Eissa;Mohammed El-Shennawy (Silicon Vision LLC - Egypt)

    5) Modeling of Spread-Spectrum Clock Generation System using Simulink

    Walaa Ayoub;Mohamed Dessouky (Mentor Graphics Egypt); Khaled Sharaf(Ain Shams University -

    Egypt)

    6) ESD protection circuits with low triggering voltage, low leakage current and fast turn-

    on

    Yong-Seo Koo (DanKook University - Korea); Kwang-Yeob Lee;Hyun-Duck Lee; Tae-Ryoung

    Park;Jae- Chang Kwak(Seokyeong University - Korea); Yil-Suk Yang (ETRI - Korea)

    Session 6: System Design Methodologies I (14:45-16:30)

    (Room: Opera 2)

    Session Chair: Rafik Guindi (Nile University - Egypt)

    Session co-Chair: Ahmed Elhossini (University of Guelph - Canada)

    1) A Hardware/Software Co-design Architecture for Packet Classification

    Omar F. Ahmed; Karanvir Chattha; Shawki Areibi (University of Guelph - Canada)

    2) Accelerated Exploration of Cost-Performance Tradeoffs for Multi Objective VLSI designs

    Reza Sedaghat;Anirban Sengupta (Ryerson University - Canada)

    3) A Generic MP-SoC Design Methodology for the Fast Prototyping of Embedded Image

    Processing

    Alexis Landrault;Loc Sieler;Jean-Pierre Derutin (University Blaise Pascal - France);Lionel DAMEZ

    (LASMEA - France)

    4) Behavioral Modeling of the Static Transfer Function of ADCs Using INL Measurement

    Rafik Guindi (Nile University Egypt);Nehal Saada (Mentor Graphics Egypt)

    5) Raster-Scanned Wave-Digital Filter Architectures for Multi-Beam 2D IIR BroadbandBeamforming

    Arjuna Madanayake (University of Akron - USA);Leonard T. Bruton (University of Calgary -

    Canada); Chamith Wijenayake (University of Moratuwa - Sri Lanka);Nilanka T. Rajapaksha

    (University of Akron - USA)

    6) Generalized Power Efficient Technique for Polyphase Comb Filter in Multi-Rate DigitalReceivers

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    Noha Younis Ahmed(Cairo University - Egypt)

    (16:45 18:15) Panel: Challenges of Nano Electronics Industry Ecosystem in the Arab Region

    (Room: Opera 2)

    Tuesday, December 21, 2010

    Keynote 2 (9:30-10:30) Engineering Education for Enhanced Innovation, Adel Sedra - Dean of

    Faculty of Engineering, University of Waterloo

    (Room: Opera 2)

    Session 7: Sensing Systems and MEMS (11:00-12:45)

    (Room: Champs-Elyses 1)

    Session Chair: Hani Ragai (French University in Egypt - Egypt)

    Session co-Chair: Bassam El-Saadany (Si-Ware Systems - Egypt)

    1) The Phase Noise of an Oscillator Employing a Dual MEMS Resonator Temperature

    Compensation Scheme

    Seyed Ali Gorji Zadeh;Mourad N. El-Gamal (McGill University - Canada); Frederic Nabki (Universit

    du Qubec Montral - Canada)

    2) A Temperature Compensated Architecture for Integrated, Low Power, Frequency

    Domain Sensors

    Karim Allidina; Tanmoy Saha;Mourad N. El-Gamal (McGill University - Canada)

    3) Integrated Optical Light Directing Structures in CMOS to Improve Light Extraction

    Efficiency

    Alfons W Bogalecki;Monuko du Plessis; Petrus Venter(University of Pretoria - South Africa);Marius

    Goosen (INSiAVA (Pty) Ltd - South Africa);Hannetjie Nell (University of Pretoria - South Africa)

    4) Design of a Low-Cost MEMS Monolithically-Integrated Relative Humidity Sensor

    Paul-Vahe Cicek; Tanmoy Saha (McGill University - Canada);Bichoy Waguih (Ain Shams University -

    Egypt);Frederic Nabki (Universit du Qubec Montral - Canada);Mourad N. El-Gamal (McGill

    University - Canada)

    5) Blood Glucose Optical Bio-Implant: Preliminary Design Guidelines

    Abdelaziz Trabelsi;Mounir Boukadoum; Christian Jesus B Fayomi (Universit du Qubec Montral -

    Canada);El Mostapha Aboulhamid(University of Montreal Canada)

    (16:30-16:45)Coffee Break

    (10:30-11:00) Coffee Break

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    Aimad El Mourabit(National School of Applied Sciences of Tangier LabTic - Morocco); Guo-Neng Lu

    (University of Lyon - France);Ming Zhang (IEF, University Paris - France); Patrick Pittet

    (University of Lyon - France);Birjali Youness; Fouad Lahjoumri (LabTic, National School of

    applied sciences of Tangier - Morocco)

    4) A Continuous Analysis of the Oscillation Amplitude in MOS LC-VCOsBassem Fahs (Universit de Caen - France); Patrice Gamand(NXP Semiconductors -

    France);Berland Corinne ( Lamips NXP-CRISMAT Caen France - France)

    5) A 2nd Derivative Gaussian UWB Pulse Transmitter Design using a Cross Inductor

    Luiz Moreira (Catholic University of Santos - Brazil); Wilhelmus Van Noije (University of So Paulo -

    Brazil)

    6) A novel High-Speed Multi-phase Oscillator Using Self-Timed Rings

    Oussama Elissati (ST-Ericsson - France);Eslam Yahya (Banha University - Egypt); Sbastien Rieubon(ST-Ericsson - France);Laurent Fesquet(TIMA - France)

    Session 10: Voltage Regulators and Analog Techniques (14:30-16:15)

    (Room: Champs-Elyses 1)

    Session Chair: AbdelHalim Zekry (Ain Shams University - Egypt)

    Session co-Chair: Ahmed Emira (Cairo University - Egypt)

    1) A CMOS Low Drop Out Voltage Regulator

    Paulo Crepaldi; Tales C Pimenta;Robson Moreno (Universidade Federal de Itajuba - Brazil)

    2) Practical Design Considerations on Adaptive Controllers for PWM DC/DC Converters

    Davide Della Giustina; Valentino Liberali (Universit degli Studi di Milano - Italy)

    3) An Ultra-Low Power Voltage Regulator for Wireless Sensor Nodes

    Stefan Gruber;Hannes Reinisch;Hartwig Unterassinger(Graz University of Technology -

    Austria);Martin Wiessflecker; Gnter Hofer(Infineon Technologies Austria AG -

    Austria); Wolfgang Pribyl (Graz University of Technology - Austria); Gerald Holweg (Senior

    Manager - Austria)

    4) New 0.75 V Low Voltage Low Power CMOS Current Conveyor

    Hesham Hamed;El-Sayed Hasaneen;Ahmed Abolila (El-Minia University - Egypt)

    5) Digitally Controlled Variable Gain-Amplifier Based on Current Conveyor with Opampand Inverters Only

    Fathi Farag; Yaser Khalaf(Zagazig University - Egypt)

    (12:45-14:30) Lunch

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    6) Novel High Efficiency Low Ripple Charge Pump Using Variable Frequency Modulation

    Chen Mingyang;Xiaobo Wu;Menglian Zhao (Zhejiang University - China)

    Session 11: Advances in Graphene and Carbon Nanotube Device and Wire Technologies (14:30-16:15)

    (Room: Champs-Elyses 2)

    Session Chair: George Kliros (Hellenic Air-Force Academy - Greece)

    Session co-Chair: TBD

    1) Large Area CVD Monolayer Graphene for Nanoelectronics: Device Performance and

    Analysis

    Osama Nayfeh;Madan Dubey (United States Army Research Laboratory - USA)

    2) Modeling of Carrier Density and Quantum Capacitance in Graphene Nanoribbon FETs

    George S. Kliros (Hellenic Air-Force Academy - Greece)

    3) Scaling Issues for p-i-n Carbon Nanotube FETs: A Computational Study

    Salah El-DIn Gamal;Mahmoud Ossaimee (Ain Shams University - Egypt)

    4) Modeling of Electronic Transport in Metallic Carbon Nanotube Interconnects

    Ashok K Goel; Vidur Parkash (Michigan Tech University - USA)

    5) Semiconductor Nanostructures in Crystalline Rare Earth Oxide for Nanoelectronic

    Device Applications

    Apurba Laha (Senior Research Scientist - Germany)

    6) A Novel Partially Insulated Schottky Source/Drain MOSFET: Short Channel and self

    heating effects

    Ganesh Patil; Shafi Qureshi (Indian Institute of Technology Kanpur - India)

    Session 12: Special Session Networks-on-Chip/System-on-Chip Design, Optimization and Validation

    (14:30-16:15)

    (Room: Opera 2)

    Session Chair: Magdy A. El-Moursy (Mentor Graphics Corporation - Egypt)

    1) Asynchronous Switching for Low-Power Octagon Network-On-Chip

    Magdy A. El-Moursy (Mentor Graphics - Egypt);Heba A. Shawkey (Elecronic Research Institute -Egypt)

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    2) A Design Space Exploration Methodology for Allocating TPG to Multi-core System

    Architectures

    Hassan Youness (Minia University - Egypt);Mohamed Hassan;Ashraf M Salem (Mentor Graphics

    Egypt)

    3) Ecosystems for the Development of Multi-Core and Many-Core SoC Models

    Amr Wassal (Cairo University Egypt);Moataz A Abdelfattah; Yehea Ismail (Nile Uuniversity Egypt)

    4) 3D/TSV Enabling Technologies for SOC/NOC: Modeling and Design Challenges

    Khaled Mohamed(Mentor Graphics - Egypt);Alaa El Rouby (Cairo University Egypt);Hani Ragai

    (Ain Shams Univeristy Egypt); Yehea Ismail (Nile University Egypt)

    5) SSMC: An On-Chip Source-Synchronous Multi-Cycle Interconnect Scheme

    Maged Ghoneima (NVIDIA Corporation - USA); Yehea Ismail (Nile Univeristy - Egypt); Vivek

    De;Muhammad Khellah (CRL, Intel Corporation - USA)

    Session 13: Addressing Fault-Tolerance, Reliability and Robustness in Integrated Circuits (16:30-

    18:15)

    (Room: Opera 2)

    Session Chair: Saeed Kharouf (American University of Beirut - Lebanon)

    Session co-Chair: Ahmed H. Madian (NCRRT - Egypt)

    1) Built-In-Current-Sensor for Testing Short and Open Faults in CMOS Digital Circuits

    Rania Ahmed(Egypt);Ahmed H. Madian (Egyptian atomic energy authority - Egypt);Ahmed G.

    Radwan;Ahmed M Soliman (Cairo University Egypt)

    2) An Analysis of SEU Robustness of C-Element Structures Implemented in Bulk CMOS

    and SOI Technologies

    Ziyad AL Tarawneh; Gordon Russell;Alex Yakovlev (Newcastle University - United Kingdom)

    3) On the mathematical modeling of Memristors

    Ahmed G. Radwan (Cairo University - Egypt);Mohammed Affan Zidan; Khaled N Salama (KAUST -

    Saudi Arabia)

    4) Time domain oscillating poles: Stability redefined in Memristor based Wien-oscillators

    Abdul Talukdar(KAUST - Saudi Arabia);Ahmed G. Radwan (Cairo University Egypt); Khaled N

    Salama (KAUST - Saudi Arabia)

    (16:15-16:30) Coffee Break

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    Session 14: Modeling and Design with Emerging Devices (16:30-18:15)

    (Room: Champs-Elyses 1)

    Session Chair: Massimo Alioto (University of Siena - Italy and currently also with BWRC, UCBerkeley USA)

    Session co-Chair: TBD

    1) Memristor based STDP Learning Network for position Detection

    Pinaki Mazumder(University of Michigan - USA)

    2) Low-Standby Current 4T FinFET Buffers: Analysis and Evaluation below 45 nm

    Massimo Alioto (University of Siena - Italy and currently also with BWRC, UCBerkeley USA);David

    Esseni;Davide Baccarin (University of Udine - Italy)

    3) Electron Mobility in Gate All Around Cylindrical Silicon Nanowires: A Monte Carlo Study

    Salah El-DIn Gamal;Mahmoud Ossaimee (Ain Shams University - Egypt)

    4) Partial-Coupled Mode Space for Quantum Transport Simulation in Nanoscale Double-

    Gate MOSFETs

    Mohammed El-Banna; Yasser Sabry (Ain Shams University - Egypt);Wael Fikry (Mentor Graphics -

    Egypt); Omar Omar(Ain Shams University - Egypt)

    5) A Single Electron ANN Majority Logic Gate (MLG)

    Sameh Ebrahim Rehan (Mansoura University - Egypt)

    Session 15: Special Session Crypto-Biometric Hardware (16:30-18:15)

    (Room: Champs-Elyses 2)

    Session Chair: Antonio J. Acosta (IMSE-CNM/University of Seville Spain)

    1) An Improved Differential Pulldown Network Logic Configuration for DPA Resistant

    Circuits

    Javier Castro; Pilar Parra;Antonio Acosta (University of Seville - Spain)

    2) High Radix Implementation of Montgomery Multipliers with CSA

    Gashaw Teshome; Carlos Jess Jimnez;Manuel Valencia (University of Seville - Spain)

    3) Hardware authentication based on PUFs and SHA-3 2nd round candidates

    Susana Eiroa (National Center of Microelectronics - Spain);Iluminada Baturone (University of Seville

    - Spain)

    4) Microelectronics Implementation of Directional Image-based Fuzzy Templates for

    Fingerprints

    Iluminada Baturone;Rosario Arjona; Santiago Snchez-Solano (University of Seville - Spain)

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    Wednesday, December 22, 2010

    Keynote 3 (9:30-10:30) Millimeter Scale Sensor Node Design using Low Voltage Operation, David

    Blaauw - Professor, University of Michigan - Ann Arbor

    (Room: Opera 1)

    Session 16: Analog Techniques I (11:00-12:45)

    (Room: Champs-Elyses 1)

    Session Chair: Manuel Delgado Restituto (Instituto de Microelectrnica de Sevilla - Spain)

    Session co-Chair: Amr Hafez (Cairo University - Egypt)

    1) A Comparative Study of Low-Noise Amplifiers for Neural Applications

    Jesus Ruiz-Amaya (University of Seville - Spain)

    2) Design Considerations for Analog Blocks in Mixed-Signal CMOS ICs

    Valentino Liberali; Gabriella Trucco (Universit degli Studi di Milano - Italy)

    3) Impact of Technology Shrink on Audio CODEC Performance

    Amir Owzar(Stericsson - Switzerland)

    4) Bult-In Current Sensor for Testing Current Feedback Operational Amplifier

    Rania Ahmed(Egypt);Ahmed H. Madian (Egyptian atomic energy authority, NCRRT - Egypt);Ahmed

    G. Radwan;Ahmed M Soliman (Cairo University - Egypt)

    5) A Low-Voltage CMOS Bandgap Reference Circuit with Improved Power Supply Rejection

    Ahmed Mohieldin (Cairo University - Egypt);Haidi Elbahr(Sysdsoft Inc. - Egypt);Emad Hegazi (Ain

    Shams University - Egypt);Marwa Mostafa (Sysdsoft Inc. - Egypt)

    Session 17: CAD Tools (11:00-12:45)

    (Room: Champs-Elyses 2)

    Session Chair: Mounir Boukadoum (Universite du Quebec a Montreal)

    Session co-Chair: Shawki Areibi (University of Guelph)

    1) SplitPro: A Tool to Overcome SystemC Scheduling Inefficiencies

    Rafik Guindi (Nile University - Egypt); Youssef Naguib (Cairo University - Egypt)

    2) Spicedim - A CAD Tool for Supporting Circuit Sizing of Analog CMOS Circuits

    Daniel Batas;Horst Fiedler; Stefan Knaak(Technische Universitaet Dortmund - Germany)

    (10:30-11:00)Coffee Break

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    3) Rapid Exploration of Power-Delay Tradeoffs using Hybrid Priority Factor and Fuzzy

    Search

    Reza Sedaghat;Anirban Sengupta (Ryerson University - Canada)

    4) Parallel TLM Simulation of MPSoC on SMP Workstations: Influence of CommunicationLocality

    Isaac Pessoa (Laboritoire d'informatique de Paris 6 - France)

    5) A Hashing Mechanism for Rule-Based Decomposition in Double Patterning

    Photolithography

    Amr Wassal;Hoda Shagar; Yasmine Badr;Hoda Darwish; Yasmine Arafa (Cairo University

    Egypt)

    Session 18: Advanced Memory Design (11:00-12:45)

    (Room: Etoile)

    Session Chair: Ahmed H. Madian (NCRRT Egypt)

    Session co-Chair: Khawar Sarfraz (LUMS Pakistan)

    1) Comparison of two SRAM matrix leakage reduction techniques in 45nm technology

    Khawar Sarfraz (Lahore University of Management Sciences - Pakistan)

    2) Process Variations in Sub-Threshold SRAM Cells in 65nm CMOS

    Farshad Moradi;Dag Wisland; Yngvar Berg; Snorre Aunet; Tuan Vu Cao (University of Oslo -

    Norway)

    3) A Multi-Megarad, Radiation Hardened by Design 512 kbit SRAM in CMOS Technology

    Cristiano Calligaro (RedCat Devices srl - Italy); Valentino Liberali;Alberto Stabile (Universit degli

    Studi di Milano - Italy);Marta Bagatin;Simone Gerardin;Alessandro Paccagnella (Universit degli

    Studi di Padova - Italy)

    4) A 1.5 GHz Robust SRAM Array optimized for cell area

    Saeed Kharouf;Lama Chatila;Mohammad M. Mansour;Ali Chehab (American University of Beirut -

    Lebanon)

    5) Effective screening for NBTI effect on SRAM-based Memory

    Baker Mohammad; Percy Dadabhoy (Qualcomm Incorporated - USA)

    6) On the Design of Low-Power Cache Memories for Homogeneous Multi-Core Processors

    Abu S Asaduzzaman (Wichita State University - USA);Manira Rani (Florida Atlantic University -

    USA); Fadi Sibai (UAE University - UAE)

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    Session 19: Special Session Processor Design (14:30-16:15)

    (Room: Champs-Elyses 1)

    Session Chair: Serag E. D. Habib (Cairo University - Egypt)

    1) CUSPARC IP Processor: Design, Characterization and Applications

    Ezz El-Din O. Hussein; Shoukry I. Shams;Mohammed I Ali;Amr Suleiman; Khaled ElWazeer;Ehab A.

    Sobhy;Ahmad Atef Ibrahim;Ahmed Gamal Ibrahim;Muhammad S Khairy;Mohamed F. Fouda;Al-

    Hussein El-Shafie;Ahmed H. Hareedy;ElSayed A. Ahmed;Ahmed Ragab Zakaria; Khalid El-

    Galaind;Amr El Sherief; Serag E. -D Habib (Cairo University Egypt)

    2) ASIC Implementation of Cairo University SPARC "CUSPARC" Embedded Processor

    Amr Suleiman;Alhassan F. Khedr; Serag E. -D Habib (Cairo University Egypt)

    3) Decimal Floating Point for future processors

    Hossam A. H. Fahmy; Tarek Eldeeb; Mahmoud Hassan; Yasmin Farouk; Ramy Eissa (CairoUniversity , SilMinds, LLC - Egypt)

    4) Scalability Investigation of Mat-Core Processor

    Abdulmajid Al-Junaid(Assiut university - Egypt);Mostafa Soliman (South Valley University -Egypt)

    Session 20: Innovative Design and Analysis Techniques for DSM Technology II (14:30-16:15)

    (Room: Champs-Elyses 2)

    Session Chair: Otmane Ait Mohamed (Concordia University - Canada)

    Session co-Chair: Mohammed Alshaikh (Newcastle University - UK)

    1) Implementation of a Colorimetric Algorithm for Portable Blood Gas Analysis

    Jaideep Chandran (Victoria University - Australia);Alex Stojcevski (Swinburne University of

    Technology - Australia);Aladin Zayegh; Thinh Nguyen (Victoria University - Australia)

    2) A Synchronizer Design Based on Wagging

    Mohammed Alshaikh;David Kinniment;Alex Yakovlev (Newcastle University - United Kingdom)

    3) An Automated SAT Encoding-Verification Approach for Efficient Model Checking

    Khaza Anuarul Hoque; Otmane Mohamed(Concordia University - Canada); Sa'ed Abed(TheHashemite University - Jordan);Mounir Boukadoum (Universit du Qubec Montral - Canada)

    (12:45-14:30)Lunch

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    4) Hardware Implementation of DES Using Pipelining Concept with Time-Variable Key

    Karim Moussa Ali;Hesham Hamed(ElMinia University - Egypt)

    5) A Novel N-bit SAR Implementation for All-Digital DLL Circuits

    Al-Hussein El-Shafie; Serag E. -D Habib (Cairo University Egypt)

    6) Towards Design of a Bridge to Enable High Speed Image Sensors for Random Access

    Tareq Hasan Khan; Khan A Wahid(University of Saskatchewan - Canada)

    Session 21: VLSI Systems Design (14:30-16:15)

    (Room: Etoile)

    Session Chair: Amr Wassal (Nile University Egypt)

    Session co-Chair: TBD

    1) Systolic-Array based regularized QR-Decomposition for IEEE 802.11n Compliant Soft-

    MMSE Detection

    Christian Senning;Andreas Burg (ETH Zurich - Switzerland)

    2) Implementation of optimized Triple-Mode Digital Down Converter for WCDMA,CDMA2000 and GSM of SDR

    Emad Samuel Malki (Russian University - Egypt); Khaled Ali Shehata (Arab Academy for Science and

    Technology - Egypt)

    3) A Novel SAR Fast-Locking DPLL: Behavioral Modeling and Simulations Using VHDL-AMS

    Mahmoud Wagdy;Anurag Nannaka (California State university,Long Beach - USA)

    4) A New Datapath-oriented Tree-based FPGA Architecture

    Umer Farooq (Laboritoire d'informatique de Paris 6- France)

    5) Experimental Implementation of 2ODPA attacks on AES design with flash-based FPGA

    Technology

    Najeh Masmoudi Kamoun (High school of telecom in Tunis SUP'COM - Tunisia);Lilian Bossuet

    (University of Bordeaux - France);Adel Ghazel (SUPCOM - Tunisia)

    (16:15-16:30) Coffee Break

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    Session 22: System Design Methodologies II (16:30-18:15)

    (Room: Champs-Elyses 1)

    Session Chair: Ahmed Elhossini (University of Guelph - Canada)

    Session co-Chair: Reza Sedaghat (Ryerson University - Canada)

    1) An Efficient Scheduling Methodology for Heterogeneous Multi-core Processor Syste

    Ahmed Elhossini;John Huissman;Basil Debowski;Shawki Areibi;Robert D. Dony (University of Guelph -

    Canada)

    2) Towards an automated framework for task scheduling

    Martin Dubois;Mounir Boukadoum (Universit du Qubec Montral - Canada)

    3) SystemC-AMS Modeling of a PCR-CE Lab-on-Chip for Multithreaded DNA analysis

    Amr Habib (Laboratoire d'informatique de Paris 6 - France); Francois Pecheux (University of Pierreand Marie Curie - France);Marie-Minerve Louerat(Laboratoire d'informatique de Paris 6 -

    France)

    4) Multi-objective Network-on-Chip Synthesis with Transaction Level Simulation

    Xinyu Li; Omar Hammami (ENSTA ParisTech - France)

    5) Voltage-Mode Balanced-Outputs Quadrature Oscillator Using FB-VDBAsJosef Bajer;Dalibor Biolek; Viera Biolkova;Zdenek Kolka (Brno University of Technology - Czech Republic)

    Session 23: Device Modeling (16:30-18:15)

    (Room: Champs-Elyses 2)

    Session Chair: Salah Gamal (Ain Shams University - Egypt)

    Session co-Chair: Pravin N Kondekar (Indian Institute of Information Technology - India)

    1) Analytical Modeling and Simulation of High Voltage Super-junction Drift layer for Power

    MOSFET

    Pravin Kondekar(PDPM IIIT DM Jabalpur - India)

    2) A Modified PSPICE Model for the Power PIN Diode

    Ahmed Shaker;Abdelhaliem Zekry (Ain Shams University - Egypt)

    3) Parametric Reduction of Jacobian Matrix for Fault Analysis

    Zdenek Kolka;Dalibor Biolek; Viera Biolkova;Zdenek Kincl (Brno University of Technology -

    Czech Republic)

    4) An Accurate Large-signal SPICE Model For Resonant Tunneling Diode

    Sherif Fathi Nafea (Suez Canal University - Egypt);Ahmed Dessouki (Egypt)

    5) Modeling of GaN MESFETs at High Temperature

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    B. N. Shashikala (Visvesvaraya Technological University - India);B. S. Nagabhushana ( Info Tech Pvt.

    Ltd. - India)

    Session 24: VLSI Systems and Applications (16:30-18:15)

    (Room: Etoile)

    Session Chair: TBD

    Session co-Chair: TBD

    1) Scanned-Array Audio Beamforming using 2nd- and 3rd-Order 2D IIR Beam Filters on

    FPGA

    Arjuna Madanayake (University of Akron - USA);Leonard T. Bruton (University of Calgary -

    Canada);Ranga Rodrigo;Nuwan Ganganath; Prabhath Ilangakoon; Gayan Attanayake; Thilina

    Yapa Bandara (University of Moratuwa - Sri Lanka)

    2) A Reconfigurable Architecture for Real Time Vision Systems on FPGA

    Ahmed Elhossini;Medhat Moussa (University of Guelph - Canada)

    3) Pipelined Architecture for Discrete Wavelet Transform Implementation on FPGA

    Mohammed Bahoura;Ezzadi Hassan (University of Quebec at Rimouski - Canada)

    4) Hardware Realization of DC Embedding Video Watermarking Technique based on FPGA

    Ahmed H. Madian (Egyptian atomic energy authority, NCRRT - Egypt); Wessam Elaraby;Mahmoud

    Ashour;Abdel M. Wahdan (Radiation Engineering Dept. - Egypt)

    5) OpenCV compatible real time processor for background foreground identification

    Mariangela Genovese;Ettore Napoli;Nicola Petra (University of Naples "Federico II" - Italy)

    6) Optimization of Recursive Sorting Algorithms for Implementation in Hardware

    Dmitri Mihhailov (Tallinn University of Technology - Estonia); Valery Sklyarov;Iouliia Skliarova

    (University of Aveiro - Portugal);Alexander Sudnitson (Tallinn University of Technology - Estonia)

    (18:15-18:30)Closing Remarks