c3 / mapld2004lake1 radiation effects on the aeroflex radhard eclipse fpga ronald lake aeroflex...

C3 / MAPLD2004Lake 1

Radiation Effects on the Aeroflex RadHard Eclipse FPGA

Ronald Lake

Aeroflex Colorado Springs


RadHard Eclipse Radiation Effects Overview

• Test Techniques

• Single Event Effects Results

– Single Event Upset

– Single Event Latch-up

• Total Ionizing Dose

– DC Characteristics

– AC Characteristics

• TMR Effects on SEU

• Summary


Hardness Testing Conditions - SEE

• SEU - 25oC, 2.25V core and 3.0V I/O, in accordance with EIA/JESD57

• SEU - FPGA programmed (configured) with three data storage components

– Dynamic Shift Registers - Two at 560 bits

– Static Register File - 64 x 16 bits

– Static RAM - 55,296 bits

• SEL - 125oC, 2.7V core and 3.6V I/O, in accordance with EIA/JESD57

• 208-lead ceramic quad flat-pack (CQFP)


Hardness Testing Conditions - SEU

• Alternating ones and zeros data used for all three storage components of the FPGA

• National Instruments tester at 1MHz frequency

– Write/read shift register

– Read only register file and RAM

– After a cell upsets, the correct data is re-written to the cell

• Texas A&M University Cyclotron Institute

– Au, Kr, and Ar from 0o (normal incidence) to 60o


Heavy Ion Beam For SEU Analysis


Hardness Testing Conditions - SEL

• Devices statically biased during irradiation

– Supply currents monitored for latch-up

• Lawrence Berkeley National Laboratory

– Au at 41o

– Effective fluence at 1E7 ions/cm2

– Effective LET = 120 MeV-cm2/mg

• Devices functionally re-verified after irradiation


Heavy Ion Chamber for SEL Analysis


Hardness Testing Conditions - TID

• Irradiated under worst case temperature (25oC) and static bias conditions (max VDD) per MIL-STD-883E Method 1019

• FPGA programmed with 60 AC paths

• J.L. Shepherd model 81-22 Cobalt 60 gamma cell


Cobalt 60 Total Ionizing Dose System


Single Event Upset Data Plot

1.0E-10

1.0E-09

1.0E-08

1.0E-07

1.0E-06

0 20 40 60 80 100

LET (MeV-cm2/mg)

Cro

ss-s

ecti

on

(cm

2/b

it)

Register File

RegF Weibull

Shift Reg

ShiftR Weibull

RAM

RAM Weibull


Hardness Results - SEE

SEU - Error-rates - GEO orbit, Adam’s 90% WC

FPGAComponent

Temp(C)

VDDCore & I/O

(V)

Numberof storage

cells

WeibullShape

WeibullWidth

SaturatedX-section

(cm2/bit)

Onset LET

MeV-cm2/mgError-rate

(errors/bit-day)

RegF 25 2.25/3.00 1,024 1.4 90 2.0E-07 20 4.7E-09ShiftR 25 2.25/3.00 1,120 1.4 55 4.0E-07 14 3.6E-08RAM 25 2.25/3.00 55,296 1.95 125 9.0E-08 17.5 6.3E-10

SEL - No latch-up to 120 MeV-cm2/mgConditionsVDD I/O, VDD

Core, TempSN Ion

Normal LET, MeV-cm²/mg

Angledegrees

Flux

ions/cm2-sLatchup

Fluence (normal)

ions/cm2

Effective Fluence

ions/cm2

Effective LET MeV-cm²/mg

3.6, 2.7, 125C 24 Au 90.3 41 7.8E+04 0 1.3E+7 1.0E+7 1203.6, 2.7, 125C 10 Au 90.3 41 6.9E+04 0 1.3E+8 1.0E+8 1203.6, 2.7, 125C 22 Au 90.3 41 6.0E+04 0 1.3E+7 1.0E+7 1203.6, 2.7, 125C 2 Au 90.3 41 6.3E+04 0 1.3E+7 1.0E+7 120

TID - 113 rads(Si)/s

FPGA meets datasheet ACs and DCs post 300 krad(Si)


Hardness Results - TID - Supply Current DCs

Temp(C)

Test ConditionVDD

Core (V)VDD

I/O (V)Units Pre-rad

Post100k rad

Post300k rad

Delta100k - Pre

Delta300k - Pre

25 QIDD 2.7 3.6 mA 0.19 0.2 3.5 0.01 3.3125 AIDD 1 MHz 2.7 3.6 mA 198 203 631 5 43325 AIDD 5 MHz 2.7 3.6 mA 304 309 732 5 42825 AIDD 10 MHz 2.7 3.6 mA 437 442 860 5 42325 AIDD 20 MHz 2.7 3.6 mA 688 688 1110 0 42225 AIDD 50 MHz 2.7 3.6 mA 1393 1402 1770 9 37725 AIDD 100 MHz 2.7 3.6 mA 1660 1643 1813 -17 153

Most Shifted DCs - Post radiation minus Pre-rad


Hardness Results - 100 krad(Si) TID - ACs

5 most shifted ACs on each of 2 devicesPost 100 krad(Si) minus Pre irradiation

SN Temp TestVDD

Core (V)VDD


Post100 krad

Post-Pre%

Change25 25 TPLH_sr_16_2_a21 2.5 3 ns 7.73 7.66 -0.07 -0.9625 25 TPHL_sr_16_2_a21 2.5 3 ns 9.08 8.98 -0.09 -1.0225 25 TPLH_sr_16_2_f21 2.5 3 ns 7.47 7.38 -0.09 -1.2425 25 TPHL_sr_16_2_qb2 2.5 3 ns 5.62 5.54 -0.07 -1.3225 25 TPHL_sr_16_2_qa2 2.5 3 ns 5.57 5.50 -0.07 -1.3326 25 TPHL_sr_16_2_qa2 2.7 3.6 ns 5.14 5.13 -0.07 -1.2526 25 TPHL_sr_16_2_a21 2.5 3 ns 9.08 9.17 -0.12 -1.3026 25 TPHL_sr_16_2_f21 2.5 3 ns 8.55 8.71 -0.14 -1.5726 25 TPHL_sr_16_2_qb2 2.5 3 ns 5.62 5.67 -0.10 -1.7726 25 TPHL_sr_16_2_qa2 2.5 3 ns 5.57 5.56 -0.10 -1.80


Hardness Results - 300 krad(Si) TID - ACs

SN Temp TestVDD

Core (V)VDD


Post300 krad

Post-Pre%

Change25 25 TPLH_inv_ch_i3_t 2.5 3 ns 152.1 160.8 8.7 5.725 25 TPLH_inv_ch_i2_t 2.5 3 ns 155.4 164.3 8.9 5.725 25 TPHL_inv_ch_i1_t 2.5 3 ns 154.6 163.4 8.8 5.725 25 TPHL_nand16_o2 2.5 3 ns 52.8 55.7 2.9 5.525 25 TPHL_nand16_o0 2.5 3 ns 52.2 55.1 2.9 5.526 25 TPLH_inv_ch_i2_t 2.5 3 ns 156.7 163.8 7.1 4.526 25 TPHL_inv_ch_i1_t 2.5 3 ns 155.8 162.8 7.0 4.526 25 TPHL_sr_d_so 2.5 3 ns 5.9 6.1 0.3 4.426 25 TPLH_inv_ch_i3_t 2.5 3 ns 153.3 160.0 6.7 4.426 25 TPLH_inv_ch_i2_t 2.7 3.6 ns 144.4 150.0 5.7 3.9

5 most shifted ACs on 2 devicesPost 300 krad(Si) minus Pre irradiation


RadHard Eclipse Single Voter TMR

MUX4x0

S0S1

I722

I723

I724

I725

I726

I727

I728

I729

I730

I731

I732

I733

I734

I735

I736

I737

I738

I739

DFFPC

I713

CLR

D

PRE

Q

DFFPC

I714

CLR

D

PRE

Q

DFFPC

I715

CLR

D

PRE

Q

DFFPC

I51

CLR

D

PRE

Q

DFFPC

I61

CLR

D

PRE

Q

DFFPC

I71

CLR

D

PRE

Q

SHIFT_REG_TMR_200

6/19/2004 10:35:40 AM

UT6325_SEE_TOP

UT6325_SEE_TOP.I183

w_set w_set w_set w_setw_reset w_reset w_reset w_reset

N_1

w_dedclk w_dedclk w_dedclk w_dedclkw_set w_set w_set w_set

w_reset w_reset w_reset w_reset

N_1 .I183-q4

w_dedclk w_dedclk w_dedclk w_dedclkw_set w_set w_set w_set

w_reset w_reset w_reset w_reset

N_1

w_dedclk w_dedclk w_dedclk w_dedclk


RadHard Eclipse Single Voter Data

123ABMUX4x0S0S1I722I723I724I725I726I727I728I729I730I731I732I733I734I735I736I737I738I739DFFPCI713CLRDPREQDFFPCI714CLRDPREQDFFPCI715CLRDPREQDFFPCI51CLRDPREQDFFPCI61CLRDPREQDFFPCI71CLRDPREQSHIFT_REG_TMR_2006/19/200410:35:40 AMUT6325_SEE_TOPUT6325_SEE_TOP.I183w_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1w_dedclkw_dedclkw_dedclkw_dedclkw_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1 .I183-q4w_dedclkw_dedclkw_dedclkw_dedclkw_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1w_dedclkw_dedclkw_dedclkw_dedclk

* Estimate based on assumed onset LET of 100 and saturated x-section of 7E-9

FPGAComponent

Temp(C)

VDDCore & I/O

(V)

WeibullShape

WeibullWidth

SaturatedX-section

(cm2/bit)

Onset LET

MeV-cm2/mgError-rate

(errors/bit-day)

No TMR 25 2.25/3.00 1.4 55 4.0E-07 14 3.6E-08TMR Single Voter 25 2.25/3.00 1.8 25 7.0E-08 64 2.3E-10TMR Triple Voter * 25 2.25/3.00 1.8 25 7.0E-09 100 5.3E-15

1E-10

1E-9

1E-8

1E-7

1E-6

1E-5

0 20 40 60 80 100

LET (MeV-cm 2/mg)

Cro

ss S

ecti

on

(cm

2 /

bit

)

No TMR Shift Register

No TMR Weibull

TMR Single Voter

TMR SV Weibull

No errors at LET of 64

MeV-cm2/mg. Not tested between LET of 64 and 90 MeV-cm2/mg

Error-rates based on SpaceRadiation 4.0 Weibull analysis, Geo orbit, Adam’s 90% WC environment


RadHard Eclipse Single Voter Data

123ABMUX4x0S0S1I722I723I724I725I726I727I728I729I730I731I732I733I734I735I736I737I738I739DFFPCI713CLRDPREQDFFPCI714CLRDPREQDFFPCI715CLRDPREQDFFPCI51CLRDPREQDFFPCI61CLRDPREQDFFPCI71CLRDPREQSHIFT_REG_TMR_2006/19/200410:35:40 AMUT6325_SEE_TOPUT6325_SEE_TOP.I183w_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1w_dedclkw_dedclkw_dedclkw_dedclkw_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1 .I183-q4w_dedclkw_dedclkw_dedclkw_dedclkw_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1w_dedclkw_dedclkw_dedclkw_dedclk

1E-10

1E-9

1E-8

1E-7

1E-6

1E-5

0 20 40 60 80 100 120

LET (MeV-cm2/mg)

Cro

ss S

ecti

on

(cm

2 / b

it)

030927 BNL

Weibull

030927 QL BNL

031106 LBNL

031212 LBNL

040629 SN A

040629 SN B

040629 SN C

040629 SN D

040219 BNL

BNL QL FPGA

8/17/4 TMR2 Data : TAMU


Summary

• Completed RadHard Eclipse FPGA pre-qualification evaluation of radiation performance– Low Single Event Upset error rate (geosynchronous orbit,

Adams 90% worst case environment)– Single Event Latch-up immune to > 108 MeV-cm2/mg– Passes datasheet parameters to > 300 krad(Si) Total

Ionizing Dose– TMR design maps well to logic cell architecture

• Offered as a flight qualified QML Q & V RadHard Standard Microcircuit Drawing device

c3 / mapld2004lake1 radiation effects on the aeroflex radhard eclipse fpga ronald lake aeroflex...

Documents

o slide

kradsi slide

tamu slide

seu analysis slide

seu summary slide

sel analysis slide

pre irradiation slide

wc environment slide