cmos technology
DESCRIPTION
CMOS Technology. Flow varies with process types & company N-Well CMOS Twin-Well CMOS Start with substrate selection Type: n or p Doping level, → resistivity Orientation, 100, or 101, etc Other parameters. A Twin-Well Process Flow. Initial cleaning Growth of SiO 2 layer - PowerPoint PPT PresentationTRANSCRIPT
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CMOS Technology
• Flow varies with process types & company– N-Well CMOS– Twin-Well CMOS
• Start with substrate selection– Type: n or p– Doping level, →resistivity– Orientation, 100, or 101, etc– Other parameters
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A Twin-Well Process Flow• Initial cleaning
• Growth of SiO2 layer
• Deposition of Si3N4 layer
• Spun photoresist layer
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• Apply mask 1
• Photo process
• Dry etch of unprotected area
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• Strip photoresist
• Grow field oxide
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• Etch out Si3N4, spin photoresist
• Apply mask 2, photo process, etch
• Boron implant, form P well for NMOS
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• Etch out photoresist, spin new layer
• Apply mask 3, photo process, etch
• N-type implant, form N well for PMOS
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• Etch out photoresist
• High temp drive-in to complete wells
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• Spin photoresist, apply mask 4
• Photo process, etch
• Boron implant to adjust N-channel VT
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• Spin new photoresist, apply mask 5
• Photo process, etch
• Arsenic implant to adjust P-channel VT
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• Remove photoresist, and thin oxide
• Grow gate oxide with precise thickness
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• Deposit polysilicon layer
• Phosphorous implant to heavily dope the poly
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• Spin photoresist
• Apply mask 6, photo process
• Plasma etch to remove poly
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• Remove old and spin new photoresist
• Apply mask 7, photo process
• N- -type implant
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• Remove old and spin new photoresist
• Apply mask 8, photo process
• P- -type implant
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• Remove photoresist
• Deposit a conformal layer of SiO2
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• Anisotropically etch SiO2 layer
• Form sidewall spacers by poly
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• Grow thin “screen” oxide• Spin photo resist, apply mask 9• Arsenic implant to form drain, source
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• Photoresist, mask 10
• Boron implant (P+) for PMOS’ S & D
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• High-temp drive-in to activate implanted dopants and diffuse junction to their final depth
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• Unmasked etch to remove oxide from drain, source, and gate tops
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• Deposit titanium layer by sputtering
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• Titanium reacts in N2 ambient
• Form TiSi2 when in contact with Si
• Elsewhere form TiN
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• Spin photoresist
• Mask 11 to protect local interconnects
• Etch remaining TiN
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• Remove photoresist
• Deposit conforming SiO2 layer
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• CMP (chemical-mechanical polish)
• Polish SiO2 and planarize wafer surface
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• Spin photoresist
• Mask 12 for contact holes
• Etch SiO2 to expose poly or TiN
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• Deposit a thin TiN barrier/adhesion
• Deposit a W layer
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• CMP
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• Deposit Al, spin photoresist• Mask 13• Plasma etch
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• Repeat several step for metal 2 with mask 14 and 15
• Passivation layer, mask 16 for bonding pads
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