cmp finite element analysis on dynam ic viscoelasticity of

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ํ•œ๊ตญ์ •๋ฐ€๊ณตํ•™ํšŒ์ง€ ์ œ 36 ๊ถŒ์ œ 2 ํ˜ธ pp. 177-181 February 2019 / 177 J. Korean Soc. Precis. Eng., Vol. 36, No. 2, pp. 177-181 https://doi.org/10.7736/KSPE.2019.36.2.177 ISSN 1225-9071 (Print) / 2287-8769 (Online) CMP ์—ฐ๋งˆํŒจ๋“œ์˜ ๋™์  ์ ํƒ„์„ฑ์— ๊ด€ํ•œ ์œ ํ•œ์š”์†Œํ•ด์„ Finite Element Analysis on Dynamic Viscoelasticity of CMP Polishing Pad ๋ฐ•๋ณ‘์ค€ 1 , ์ด๋‹ค์†” 1 , ์ •์„ ํ˜ธ 1 , ๊น€ํ˜„์ง„ 1 , ์ •ํ•ด๋„ 2,# Byeongjun Pak 1 , Dasol Lee 1 , Seonho Jeong 1 , Hyunjin Kim 1 , and Haedo Jeong 2,# 1 ๋ถ€์‚ฐ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› ๊ธฐ๊ณ„๊ณตํ•™๋ถ€ (School of Mechanical Engineering, Graduate School, Pusan National University) 2 ๋ถ€์‚ฐ๋Œ€ํ•™๊ต ๊ธฐ๊ณ„๊ณตํ•™๋ถ€ (School of Mechanical Engineering, Pusan National University) # Corresponding Author / E-mail: [email protected], TEL: +82-51-510-2463 ORCID: 0000-0003-1838-659X KEYWORDS: Chemical mechanical planarization ( ํ™”ํ•™์  ๊ธฐ๊ณ„์  ํ‰ํƒ„ํ™”), Viscoelasticity ( ์ ํƒ„์„ฑ), Finite element analysis ( ์œ ํ•œ์š”์†Œํ•ด์„), Dynamic material properties ( ๋™์  ์žฌ๋ฃŒ ๋ฌผ์„ฑ) Finite element analysis of CMP process was studied to understand uneven pressure distribution between polishing pad and wafer. Since WIWNU (Within wafer non-uniformity) is mainly influenced by dynamic viscoelastic properties of CMP polishing pad, the dynamic property of the polishing pad has to be understood first for dynamic finite element analysis of the process. To measure viscoelasticity of the polishing pad, time-dependent strain data by load were obtained using a viscoelasticity measurement system capable of measuring deformation by periodic load. Primary and secondary elastic modulus and relaxation time could be achieved for the behavior of the polishing pad by load. Finite element analysis was carried out under the same conditions as viscoelastic measurement. Material properties of the polishing pad were assumed based on results of experiments. By comparing experimental results with analytical results, material properties in the analytical model were modified and FEA was carried out again. It was confirmed that the behavior of the polishing pad by load in the experiment and FEA according to modified material properties were well matched. Through this process, viscoelastic properties of polishing pad were well defined for dynamic analysis of CMP process. Manuscript Received: July 23, 2018 / Revised: September 21, 2018 / Accepted: October 5, 2018 1. ์„œ๋ก  CMP (Chemical Mechanical Planarization) ๊ณต์ •์€ ๋ฐ˜๋„์ฒด ๊ณต ์ •์—์„œ ๋‹ค์ธต๊ตฌ์กฐํ˜•์„ฑ์„ ์œ„ํ•œ ๊ธฐํŒ์˜ ํ‰ํƒ„ํ™” ๊ธฐ์ˆ ๋กœ์จ, ์—ฐ๋งˆ ์Šฌ๋Ÿฌ ๋ฆฌ(Polishing Slurry) ์˜ ํ™”ํ•™์  ์„ฑ๋ถ„์— ์˜ํ•œ ํ™”ํ•™ ๋ฐ˜์‘ ํ•˜์—์„œ์˜ ์›จ์ดํผ ํ‘œ๋ฉด, ์—ฐ๋งˆํŒจ๋“œ, ์—ฐ๋งˆ ์Šฌ๋Ÿฌ๋ฆฌ ๋‚ด ์—ฐ๋งˆ ์ž…์ž๊ฐ„ ๋งˆ์ฐฐ์— ์˜ํ•ด ์žฌ๋ฃŒ ์ œ๊ฑฐ๊ฐ€ ๋ฐœ์ƒํ•œ๋‹ค. 1 CMP ๊ณต์ •์—์„œ ์—ฐ๋งˆํŒจ๋“œ๋Š” ์ค‘์š”ํ•œ ์†Œ๋ชจ ํ’ˆ ์ค‘ ํ•˜๋‚˜๋กœ ํ•˜๋ถ€์˜ ์ •๋ฐ˜์— ๋ถ€์ฐฉ๋˜์–ด ํšŒ์ „์šด๋™์„ ํ•œ๋‹ค. ๊ทธ์™€ ๋™ ์‹œ์— ์›จ์ดํผ๊ฐ€ ๋ถ€์ฐฉ๋œ ์ƒ๋‹จ์˜ ์—ฐ๋งˆํ—ค๋“œ๊ฐ€ ํšŒ์ „ํ•˜๊ณ , ์ด ๋•Œ ๋ฐœ์ƒํ•˜ ๋Š” ์ผ์ •ํ•œ ์ƒ๋Œ€์†๋„์™€ ๊ฐ€ํ•ด์ง€๋Š” ์••๋ ฅ์— ์˜ํ•ด ์—ฐ๋งˆ๊ฐ€ ์ง„ํ–‰๋œ๋‹ค. ์—ฌ ๊ธฐ์„œ ์žฌ๋ฃŒ์ œ๊ฑฐ์œจ์€ ์›จ์ดํผ์™€ ์—ฐ๋งˆํ—ค๋“œ ๊ฐ„์˜ ์ƒ๋Œ€์†๋„์™€ ์••๋ ฅ์˜ ๊ณฑ์— ๋น„๋ก€ํ•˜๋Š” ํ”„๋ ˆ์Šคํ†ค ๋ฐฉ์ •์‹(Preston Equation) ์— ์ง€๋ฐฐ์ ์ธ ์˜ ํ–ฅ์„ ๋ฐ›๋Š”๋‹ค. CMP ๊ณต์ •์—์„œ ์›จ์ดํผ ๋‚ด ๊ท ์ผํ•œ ์žฌ๋ฃŒ ์ œ๊ฑฐ๋ฅผ ์œ„ํ•ด ์„œ๋Š” ์ ‘์ด‰ ๋ฉด ์ „์ฒด๊ฐ€ ๊ท ์ผํ•œ ์••๋ ฅ์„ ๋ฐ›๋„๋ก ํ•˜๋Š” ๊ฒƒ์ด ์ด์ƒ์ ์ด ๋‚˜, ์—ฐ๋งˆํŒจ๋“œ์˜ ๋™์  ํŠน์„ฑ์˜ ์˜ํ–ฅ์œผ๋กœ ์ธํ•ด ์‹ค์ œ๋กœ๋Š” ์›จ์ดํผ์™€ ํŒจ ๋“œ์˜ ์ ‘์ด‰ ์˜์—ญ์—์„œ์˜ ๋ถˆ๊ท ์ผํ•œ ์••๋ ฅ๋ถ„ํฌ๊ฐ€ ๋ฐœ์ƒํ•˜๊ณ  ํŠนํžˆ ์›จ์ด ํผ ๊ฐ€์žฅ์ž๋ฆฌ ์˜์—ญ์—์„œ์˜ ๋น„์ •์ƒ์ ์ธ ์žฌ๋ฃŒ์ œ๊ฑฐ์œจ์ด ๋ฐœ์ƒํ•œ๋‹ค. 2 ์„ ํ–‰ ์—ฐ๊ตฌ์ž๋“ค์€ ์ด๋Ÿฌํ•œ ์›จ์ดํผ์˜ ์••๋ ฅ ๋ถˆ๊ท ํ˜• ๋ฌธ์ œ๋ฅผ ๊ฐœ์„ ํ•˜ ๊ธฐ ์œ„ํ•ด ์œ ํ•œ์š”์†Œํ•ด์„์„ ํ†ตํ•œ ๊ณต์ • ์กฐ๊ฑด์˜ ์ตœ์ ํ™”๋ฅผ ์œ„ํ•œ ์—ฐ๊ตฌ๋ฅผ ์ง„ํ–‰ํ•˜์˜€๋‹ค. 3 ๋Œ€๋ถ€๋ถ„์˜ ์—ฐ๊ตฌ๋Š” ์ •์  ์œ ํ•œ์š”์†Œํ•ด์„์„ ํ†ตํ•œ ์›จ์ดํผ ์••๋ ฅ๋ถ„ํฌ์˜ ์ตœ์ ํ™” ์ธก๋ฉด์—์„œ ์—ฐ๊ตฌ๋ฅผ ์ง„ํ–‰ํ•˜์˜€์œผ๋ฉฐ, ์‹ค์ œ ํŒจ๋“œ์— ์„œ ๋‚˜ํƒ€๋‚˜๋Š” ๋™์  ํŠน์„ฑ์„ ๊ณ ๋ คํ•˜์ง€ ์•Š์•˜๋‹ค. ๊ธฐ์กด ์—ฐ๊ตฌ์—์„œ ์œ ํ•œ์š” ์†Œํ•ด์„์„ ์œ„ํ•œ ๋ฌผ์„ฑ์˜ ์„ค์ •์„ ์œ„ํ•ด ์—ฌ๋Ÿฌ ๋ฐฉ๋ฒ•์„ ํ†ตํ•ด ์–ป์–ด์ง„ DMA (Dynamic Material Analysis) ๋ฅผ ์ด์šฉํ•˜์—ฌ ์—ฐ๋งˆํŒจ๋“œ์˜ ์ €์žฅ ํƒ„์„ฑ๊ณ„์ˆ˜์™€ ์†์‹คํƒ„์„ฑ๊ณ„์ˆ˜๋ฅผ ์ธก์ •ํ•˜๊ฑฐ๋‚˜, 4,5 ์ธ์žฅ์‹คํ—˜ ๋ฐ ์••์ถ•์‹คํ—˜ ์„ ํ†ตํ•ด ์—ฐ๋งˆํŒจ๋“œ์˜ ํƒ„์„ฑ๊ณ„์ˆ˜๋ฅผ ์ธก์ •ํ•˜๋Š” ๋ฐฉ๋ฒ•์„ ์‚ฌ์šฉํ•˜์˜€๋‹ค. 6,7 ๊ทธ๋Ÿฌ๋‚˜ ์ด๋Ÿฌํ•œ ๋ฐฉ๋ฒ•์— ์˜ํ•œ ์žฌ๋ฃŒ ๋ฌผ์„ฑ ์ •์˜ ์‹œ, ์œ ํ•œ์š”์†Œํ•ด์„์—์„œ ์˜ ์—ฐ๋งˆํŒจ๋“œ์˜ ํ•˜์ค‘์— ๋Œ€ํ•œ ์‹ค์ œ ๋ณ€ํ˜•๋ฅ ๊ณผ ์‹œ๊ฐ„์— ๋”ฐ๋ฅธ ๋™์  ๊ฑฐ Copyright ยฉ The Korean Society for Precision Engineering This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/ 3.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

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ํ•œ๊ตญ์ •๋ฐ€๊ณตํ•™ํšŒ์ง€ ์ œ 36๊ถŒ ์ œ 2ํ˜ธ pp. 177-181 February 2019 / 177

J. Korean Soc. Precis. Eng., Vol. 36, No. 2, pp. 177-181 https://doi.org/10.7736/KSPE.2019.36.2.177

ISSN 1225-9071 (Print) / 2287-8769 (Online)

CMP ์—ฐ๋งˆํŒจ๋“œ์˜ ๋™์  ์ ํƒ„์„ฑ์— ๊ด€ํ•œ ์œ ํ•œ์š”์†Œํ•ด์„

Finite Element Analysis on Dynamic Viscoelasticity of CMP Polishing Pad

๋ฐ•๋ณ‘์ค€1, ์ด๋‹ค์†”1, ์ •์„ ํ˜ธ1, ๊น€ํ˜„์ง„1, ์ •ํ•ด๋„2,#

Byeongjun Pak1, Dasol Lee1, Seonho Jeong1, Hyunjin Kim1, and Haedo Jeong2,#

1 ๋ถ€์‚ฐ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› ๊ธฐ๊ณ„๊ณตํ•™๋ถ€ (School of Mechanical Engineering, Graduate School, Pusan National University)

2 ๋ถ€์‚ฐ๋Œ€ํ•™๊ต ๊ธฐ๊ณ„๊ณตํ•™๋ถ€ (School of Mechanical Engineering, Pusan National University)

# Corresponding Author / E-mail: [email protected], TEL: +82-51-510-2463

ORCID: 0000-0003-1838-659X

KEYWORDS: Chemical mechanical planarization (ํ™”ํ•™์  ๊ธฐ๊ณ„์  ํ‰ํƒ„ํ™”), Viscoelasticity (์ ํƒ„์„ฑ), Finite element analysis (์œ ํ•œ์š”์†Œํ•ด์„),

Dynamic material properties (๋™์  ์žฌ๋ฃŒ ๋ฌผ์„ฑ)

Finite element analysis of CMP process was studied to understand uneven pressure distribution between polishing pad and

wafer. Since WIWNU (Within wafer non-uniformity) is mainly influenced by dynamic viscoelastic properties of CMP polishing

pad, the dynamic property of the polishing pad has to be understood first for dynamic finite element analysis of the

process. To measure viscoelasticity of the polishing pad, time-dependent strain data by load were obtained using a

viscoelasticity measurement system capable of measuring deformation by periodic load. Primary and secondary elastic

modulus and relaxation time could be achieved for the behavior of the polishing pad by load. Finite element analysis was

carried out under the same conditions as viscoelastic measurement. Material properties of the polishing pad were assumed

based on results of experiments. By comparing experimental results with analytical results, material properties in the

analytical model were modified and FEA was carried out again. It was confirmed that the behavior of the polishing pad by

load in the experiment and FEA according to modified material properties were well matched. Through this process,

viscoelastic properties of polishing pad were well defined for dynamic analysis of CMP process.

Manuscript Received: July 23, 2018 / Revised: September 21, 2018 / Accepted: October 5, 2018

1. ์„œ๋ก 

CMP (Chemical Mechanical Planarization) ๊ณต์ •์€ ๋ฐ˜๋„์ฒด ๊ณต

์ •์—์„œ ๋‹ค์ธต๊ตฌ์กฐํ˜•์„ฑ์„ ์œ„ํ•œ ๊ธฐํŒ์˜ ํ‰ํƒ„ํ™” ๊ธฐ์ˆ ๋กœ์จ, ์—ฐ๋งˆ ์Šฌ๋Ÿฌ

๋ฆฌ(Polishing Slurry)์˜ ํ™”ํ•™์  ์„ฑ๋ถ„์— ์˜ํ•œ ํ™”ํ•™ ๋ฐ˜์‘ ํ•˜์—์„œ์˜

์›จ์ดํผ ํ‘œ๋ฉด, ์—ฐ๋งˆํŒจ๋“œ, ์—ฐ๋งˆ ์Šฌ๋Ÿฌ๋ฆฌ ๋‚ด ์—ฐ๋งˆ ์ž…์ž๊ฐ„ ๋งˆ์ฐฐ์— ์˜ํ•ด

์žฌ๋ฃŒ ์ œ๊ฑฐ๊ฐ€ ๋ฐœ์ƒํ•œ๋‹ค.1 CMP ๊ณต์ •์—์„œ ์—ฐ๋งˆํŒจ๋“œ๋Š” ์ค‘์š”ํ•œ ์†Œ๋ชจ

ํ’ˆ ์ค‘ ํ•˜๋‚˜๋กœ ํ•˜๋ถ€์˜ ์ •๋ฐ˜์— ๋ถ€์ฐฉ๋˜์–ด ํšŒ์ „์šด๋™์„ ํ•œ๋‹ค. ๊ทธ์™€ ๋™

์‹œ์— ์›จ์ดํผ๊ฐ€ ๋ถ€์ฐฉ๋œ ์ƒ๋‹จ์˜ ์—ฐ๋งˆํ—ค๋“œ๊ฐ€ ํšŒ์ „ํ•˜๊ณ , ์ด ๋•Œ ๋ฐœ์ƒํ•˜

๋Š” ์ผ์ •ํ•œ ์ƒ๋Œ€์†๋„์™€ ๊ฐ€ํ•ด์ง€๋Š” ์••๋ ฅ์— ์˜ํ•ด ์—ฐ๋งˆ๊ฐ€ ์ง„ํ–‰๋œ๋‹ค. ์—ฌ

๊ธฐ์„œ ์žฌ๋ฃŒ์ œ๊ฑฐ์œจ์€ ์›จ์ดํผ์™€ ์—ฐ๋งˆํ—ค๋“œ ๊ฐ„์˜ ์ƒ๋Œ€์†๋„์™€ ์••๋ ฅ์˜

๊ณฑ์— ๋น„๋ก€ํ•˜๋Š” ํ”„๋ ˆ์Šคํ†ค ๋ฐฉ์ •์‹(Preston Equation)์— ์ง€๋ฐฐ์ ์ธ ์˜

ํ–ฅ์„ ๋ฐ›๋Š”๋‹ค. CMP ๊ณต์ •์—์„œ ์›จ์ดํผ ๋‚ด ๊ท ์ผํ•œ ์žฌ๋ฃŒ ์ œ๊ฑฐ๋ฅผ ์œ„ํ•ด

์„œ๋Š” ์ ‘์ด‰ ๋ฉด ์ „์ฒด๊ฐ€ ๊ท ์ผํ•œ ์••๋ ฅ์„ ๋ฐ›๋„๋ก ํ•˜๋Š” ๊ฒƒ์ด ์ด์ƒ์ ์ด

๋‚˜, ์—ฐ๋งˆํŒจ๋“œ์˜ ๋™์  ํŠน์„ฑ์˜ ์˜ํ–ฅ์œผ๋กœ ์ธํ•ด ์‹ค์ œ๋กœ๋Š” ์›จ์ดํผ์™€ ํŒจ

๋“œ์˜ ์ ‘์ด‰ ์˜์—ญ์—์„œ์˜ ๋ถˆ๊ท ์ผํ•œ ์••๋ ฅ๋ถ„ํฌ๊ฐ€ ๋ฐœ์ƒํ•˜๊ณ  ํŠนํžˆ ์›จ์ด

ํผ ๊ฐ€์žฅ์ž๋ฆฌ ์˜์—ญ์—์„œ์˜ ๋น„์ •์ƒ์ ์ธ ์žฌ๋ฃŒ์ œ๊ฑฐ์œจ์ด ๋ฐœ์ƒํ•œ๋‹ค.2

์„ ํ–‰ ์—ฐ๊ตฌ์ž๋“ค์€ ์ด๋Ÿฌํ•œ ์›จ์ดํผ์˜ ์••๋ ฅ ๋ถˆ๊ท ํ˜• ๋ฌธ์ œ๋ฅผ ๊ฐœ์„ ํ•˜

๊ธฐ ์œ„ํ•ด ์œ ํ•œ์š”์†Œํ•ด์„์„ ํ†ตํ•œ ๊ณต์ • ์กฐ๊ฑด์˜ ์ตœ์ ํ™”๋ฅผ ์œ„ํ•œ ์—ฐ๊ตฌ๋ฅผ

์ง„ํ–‰ํ•˜์˜€๋‹ค.3 ๋Œ€๋ถ€๋ถ„์˜ ์—ฐ๊ตฌ๋Š” ์ •์  ์œ ํ•œ์š”์†Œํ•ด์„์„ ํ†ตํ•œ ์›จ์ดํผ

์••๋ ฅ๋ถ„ํฌ์˜ ์ตœ์ ํ™” ์ธก๋ฉด์—์„œ ์—ฐ๊ตฌ๋ฅผ ์ง„ํ–‰ํ•˜์˜€์œผ๋ฉฐ, ์‹ค์ œ ํŒจ๋“œ์—

์„œ ๋‚˜ํƒ€๋‚˜๋Š” ๋™์  ํŠน์„ฑ์„ ๊ณ ๋ คํ•˜์ง€ ์•Š์•˜๋‹ค. ๊ธฐ์กด ์—ฐ๊ตฌ์—์„œ ์œ ํ•œ์š”

์†Œํ•ด์„์„ ์œ„ํ•œ ๋ฌผ์„ฑ์˜ ์„ค์ •์„ ์œ„ํ•ด ์—ฌ๋Ÿฌ ๋ฐฉ๋ฒ•์„ ํ†ตํ•ด ์–ป์–ด์ง„

DMA (Dynamic Material Analysis)๋ฅผ ์ด์šฉํ•˜์—ฌ ์—ฐ๋งˆํŒจ๋“œ์˜ ์ €์žฅ

ํƒ„์„ฑ๊ณ„์ˆ˜์™€ ์†์‹คํƒ„์„ฑ๊ณ„์ˆ˜๋ฅผ ์ธก์ •ํ•˜๊ฑฐ๋‚˜,4,5 ์ธ์žฅ์‹คํ—˜ ๋ฐ ์••์ถ•์‹คํ—˜

์„ ํ†ตํ•ด ์—ฐ๋งˆํŒจ๋“œ์˜ ํƒ„์„ฑ๊ณ„์ˆ˜๋ฅผ ์ธก์ •ํ•˜๋Š” ๋ฐฉ๋ฒ•์„ ์‚ฌ์šฉํ•˜์˜€๋‹ค.6,7

๊ทธ๋Ÿฌ๋‚˜ ์ด๋Ÿฌํ•œ ๋ฐฉ๋ฒ•์— ์˜ํ•œ ์žฌ๋ฃŒ ๋ฌผ์„ฑ ์ •์˜ ์‹œ, ์œ ํ•œ์š”์†Œํ•ด์„์—์„œ

์˜ ์—ฐ๋งˆํŒจ๋“œ์˜ ํ•˜์ค‘์— ๋Œ€ํ•œ ์‹ค์ œ ๋ณ€ํ˜•๋ฅ ๊ณผ ์‹œ๊ฐ„์— ๋”ฐ๋ฅธ ๋™์  ๊ฑฐ

Copyright ยฉ The Korean Society for Precision Engineering

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178 / February 2019 ํ•œ๊ตญ์ •๋ฐ€๊ณตํ•™ํšŒ์ง€ ์ œ 36๊ถŒ ์ œ 2ํ˜ธ

๋™์„ ๋‚˜ํƒ€๋‚ด๊ธฐ ํž˜๋“ค๋‹ค. CMP ๊ณต์ •์—์„œ ๋Œ€๋ถ€๋ถ„์˜ ์—ฐ๋งˆ ๊ท ์ผ๋„ ๋ฌธ

์ œ๋Š” ํŒจ๋“œ์˜ ๋™์  ์ ํƒ„์„ฑ ํŠน์„ฑ์— ์˜ํ•œ ๊ฒƒ์œผ๋กœ ์•Œ๋ ค์ ธ ์žˆ๋‹ค. ์‹ค์ œ

CMP์˜ ํ™˜๊ฒฝ์€ ์Šฌ๋Ÿฌ๋ฆฌ์™€ ๋งˆ์ฐฐ์ž…์ž๊ฐ€ ์กด์žฌํ•˜๋Š” ์Šต์‹ ์ƒํƒœ์—์„œ์˜

๋™์  ๋งˆ์ฐฐ ํ™˜๊ฒฝ์ด๋‚˜, ๋ณธ ์‹คํ—˜์—์„œ๋Š” ์ด์™ธ์˜ ์ธ์ž๋“ค์„ ๋ฌด์‹œํ•˜๊ณ  ๊ฑด

์‹ํ™˜๊ฒฝ์—์„œ์˜ ํŒจ๋“œ์˜ ๋™์  ํŠน์„ฑ๋งŒ์„ ํ™•์ธํ•˜์˜€๋‹ค. ์ด๋Ÿฌํ•œ ๋™์  ํŠน

์„ฑ์„ ๊ณ ๋ คํ•œ ์œ ํ•œ์š”์†Œํ•ด์„์„ ํ†ตํ•ด์„œ ์ถ”ํ›„ CMP ๊ณต์ •์„ ๋ช…ํ™•ํžˆ

์ดํ•ดํ•  ์ˆ˜ ์žˆ๋‹ค.

๋ณธ ์—ฐ๊ตฌ์—์„œ๋Š” ์ ํƒ„์„ฑ ์ธก์ •๊ธฐ๋ฅผ ์ด์šฉํ•˜์—ฌ ์—ฐ๋งˆํŒจ๋“œ์˜ ์ฃผ๊ธฐ์ 

์ธ ์••์ถ•-ํšŒ๋ณต ์‹คํ—˜์„ ์‹ค์‹œํ•˜๊ณ  ์ถ”์ถœ๋œ ๋ณ€ํ˜•๋ฅ  ๊ณก์„ ์„ ๋ถ„์„ํ•˜์—ฌ

์ ํƒ„์„ฑ ํŒŒ๋ผ๋ฏธํ„ฐ๋ฅผ ์–ป์—ˆ๋‹ค. ์—ฐ๋งˆํŒจ๋“œ์˜ ์••์ถ•-ํšŒ๋ณต ์‹คํ—˜์—์„œ์˜ ๋ณ€

ํ˜•๊ณผ ์œ ํ•œ์š”์†Œํ•ด์„์—์„œ ๋‚˜ํƒ€๋‚˜๋Š” ๋ณ€ํ˜•์„ ์„œ๋กœ ๋น„๊ตํ•˜์—ฌ ์ด๋ฅผ ํ†ต

ํ•ด ์—ฐ๋งˆํŒจ๋“œ์˜ ๋™์  ์ ํƒ„์„ฑ ๋ฌผ์„ฑ์„ ์ •์˜ํ•˜๋Š” ๋ฐฉ๋ฒ•์„ ์ œ์•ˆํ•˜์˜€๋‹ค.

2. ์ ํƒ„์„ฑ

ํผ(Form) ๋˜๋Š” ํŽ ํŠธ(Felt) ๊ตฌ์กฐ์˜ ๊ณ ๋ถ„์ž ์žฌ๋ฃŒ๋Š” ๊ทธ ๊ตฌ์กฐ๋กœ ์ธ

ํ•˜์—ฌ ํ•˜์ค‘์— ์˜ํ•ด ์ˆœ๊ฐ„์ ์œผ๋กœ ๋ณ€ํ˜•ํ•˜๋Š” ํƒ„์„ฑ๊ฑฐ๋™๊ณผ ์‹œ๊ฐ„์— ๋”ฐ๋ผ

์„œ์„œํžˆ ๋ณ€ํ˜•ํ•˜๋Š” ์ ์„ฑ๊ฑฐ๋™์ด ๋™์‹œ์— ๋‚˜ํƒ€๋‚œ๋‹ค. ์ด๋Ÿฌํ•œ ์žฌ๋ฃŒ์˜ ์„ฑ

์งˆ์„ ์ ํƒ„์„ฑ(Viscoelasticity)์ด๋ผ๊ณ  ํ•˜๋Š”๋ฐ ์ด๋Š” ์‹œ๊ฐ„ ์˜์กด์ ์ธ

๋™์  ์žฌ๋ฃŒ๋ฌผ์„ฑ์ด๋‹ค. CMP ์—ฐ๋งˆํŒจ๋“œ ๋˜ํ•œ ๋‹ค๊ณต์„ฑ์˜ ํด๋ฆฌ์šฐ๋ ˆํƒ„ ๋˜

๋Š” ํด๋ฆฌ์šฐ๋ ˆํƒ„ ํ•จ์นจ ํŽ ํŠธ๋กœ ๋งŒ๋“ค์–ด์ง€๋ฏ€๋กœ ๊ทธ์™€ ์œ ์‚ฌํ•œ ์ ํƒ„์„ฑ ๊ฑฐ

๋™์ด ๋‚˜ํƒ€๋‚œ๋‹ค. ์ด๋Ÿฌํ•œ CMP ์—ฐ๋งˆํŒจ๋“œ์˜ ์ ํƒ„์„ฑ์€ 4-Element

Burgerโ€™s Model์„ ํ†ตํ•ด ํ‘œํ˜„ํ•  ์ˆ˜ ์žˆ๋‹ค. 4-Element Burgerโ€™s Model

์€ ํ•˜์ค‘์— ๋Œ€ํ•ด ์ฆ‰์‹œ ๋ณ€ํ˜•ํ•˜๋ฉฐ ์ฆ‰์‹œ ํšŒ๋ณตํ•˜๋Š” ํƒ„์„ฑ ๊ฑฐ๋™์„ ๋‚˜ํƒ€

๋‚ด๋Š” ์Šคํ”„๋ง(Spring) ์š”์†Œ์™€ ์‹œ๊ฐ„์— ๋”ฐ๋ผ ์„œ์„œํžˆ ๋ณ€ํ˜•ํ•˜๊ณ  ์„œ์„œํžˆ

ํšŒ๋ณตํ•˜๋Š” ์ ํƒ„์„ฑ ๊ฑฐ๋™์„ ๋‚˜ํƒ€๋‚ด๋Š” ํฌํฌํŠธ(Voigt) ์š”์†Œ, ํ•˜์ค‘์— ์ œ

๊ฑฐ๋œ ํ›„์—๋„ ํšŒ๋ณต๋˜์ง€ ์•Š๋Š” ์˜๊ตฌ์ ์ธ ๋ณ€ํ˜•์„ ๋‚˜ํƒ€๋‚ด๋Š” ๋Œ€์‰ฌํฟ

(Dashpot) ์š”์†Œ๋ฅผ ๊ฐ€์ง€๊ณ  ์žˆ๋‹ค. ์ด ๋ชจ๋ธ์˜ ๊ตฌ์„ฑ๊ณผ ํ•˜์ค‘์— ๋Œ€ํ•œ ๊ฑฐ

๋™์˜ ๊ฐœ๋žต๋„๋Š” Fig. 2์— ๋‚˜ํƒ€๋‚˜ ์žˆ๋‹ค.

3. ์‹คํ—˜ ๋ฐฉ๋ฒ•

3.1 ์ ํƒ„์„ฑ ์ธก์ • ์‹คํ—˜

CMP ์—ฐ๋งˆํŒจ๋“œ์˜ ์ ํƒ„์„ฑ ๊ฑฐ๋™์„ ์ธก์ •ํ•˜๊ธฐ ์œ„ํ•˜์—ฌ ์ ํƒ„์„ฑ ์ธก์ •

๊ธฐ(Viscoelasticity Measurement System; G&P Technology)๋ฅผ ์‚ฌ

์šฉํ•˜์˜€๋‹ค. Fig. 3์— ๋‚˜ํƒ€๋‚˜ ์žˆ๋Š” ์ ํƒ„์„ฑ ์ธก์ •๊ธฐ๋Š” ์ธก์ • ์‹œํŽธ์— ์ฃผ

๊ธฐ์ ์œผ๋กœ ์ผ์ •ํ•œ ํ•˜์ค‘์„ ๊ฐ€ํ•˜์—ฌ ์‹œํŽธ์˜ ๋ฐ˜๋ณต์ ์ธ ์••์ถ• ๋ฐ ํšŒ๋ณต์—

์˜ํ•ด ๋ฐœ์ƒํ•˜๋Š” ๋‘๊ป˜ ๋ณ€ํ™”๋ฅผ ์ธก์ •ํ•œ๋‹ค. ์ด ๋•Œ ๋ฐœ์ƒํ•˜๋Š” ์—ฐ๋งˆํŒจ๋“œ์˜

๋‘๊ป˜ ๋ณ€ํ˜•๋Ÿ‰์„ 1 ยตm์˜ ์ธก์ • ์ตœ์†Œ๋‹จ์œ„๋ฅผ ๊ฐ–๋Š” ๋‹ค์ด์–ผ ๊ฒŒ์ด์ง€๋ฅผ

์ด์šฉํ•˜์—ฌ ์‹ค์‹œ๊ฐ„์œผ๋กœ ์ธก์ •ํ•˜์˜€๋‹ค. ์—ฐ๋งˆํŒจ๋“œ๋Š” ์ƒ์šฉํŒจ๋“œ์ธ SUBA

400, SUBA 600, SUBA 800 ํŒจ๋“œ๋ฅผ ์‚ฌ์šฉํ•˜์˜€๋‹ค. ๋ณธ ์‹คํ—˜์—์„œ๋Š”

14.4 N(300 g/cm2)์˜ ํ•˜์ค‘์กฐ๊ฑด์„ ๋ถ€์—ฌํ•˜์˜€๊ณ  1 ์ฃผ๊ธฐ ๋‹น ์••์ถ• 120

์ดˆ, ํšŒ๋ณต 120 ์ดˆ์˜ ์‹œ๊ฐ„์„ ๋‘๊ณ  15ํšŒ ๋ฐ˜๋ณตํ•˜์˜€๋‹ค.

3.2 ์œ ํ•œ์š”์†Œํ•ด์„

3.2.1 ํ•ด์„ ๋ชจ๋ธ ์ œ์ž‘

์œ ํ•œ์š”์†Œํ•ด์„์—์„œ์˜ ๋™์  ๋ฌผ์„ฑ์— ์˜ํ•œ ์—ฐ๋งˆํŒจ๋“œ์˜ ์ ํƒ„์„ฑ ๊ฑฐ

๋™์„ ํ™•์ธํ•˜๊ธฐ ์œ„ํ•ด ํ•ด์„ ๋ชจ๋ธ์„ ์ œ์ž‘ํ•˜์˜€๋‹ค. Fig. 4์— ๋‚˜ํƒ€๋‚œ ๊ฒƒ

๊ณผ ๊ฐ™์ด ์ ํƒ„์„ฑ ์ธก์ •๊ธฐ์™€ ๋™์ผํ•œ ์น˜์ˆ˜๋ฅผ ๊ฐ–๋Š” 3D ๋ชจ๋ธ์„ ์ œ์ž‘ํ•˜

์˜€๋‹ค. ์—ฐ๋งˆํŒจ๋“œ์˜ ํ•˜๋ถ€์—๋Š” ๊ณ ์ • ๊ตฌ์†์„ ๋ถ€์—ฌํ•˜์˜€์œผ๋ฉฐ ๊ฐ€์•• ์˜์—ญ

์€ ํ•˜์ค‘์กฐ๊ฑด์œผ๋กœ ๋Œ€์ฒดํ•˜์˜€๋‹ค. ๋˜ํ•œ ํ•ด์„์‹œ๊ฐ„์„ ์ค„์ด๊ธฐ ์œ„ํ•˜์—ฌ ์ „

์ฒด ๋ชจ๋ธ์˜ 1/4์„ ๋ชจ๋ธ๋ง ํ•˜๊ณ  ๋‹จ๋ฉด์— ๋Œ€์นญ ์กฐ๊ฑด์„ ๋ถ€์—ฌํ•˜์˜€๋‹ค. ํ•ด

์„์„ ์œ„ํ•ด ์ƒ์šฉ ์†Œํ”„ํŠธ์›จ์–ด์ธ ANSYS Workbench 18.0์„ ์‚ฌ์šฉํ•˜

์˜€์œผ๋ฉฐ ์‹œ๊ฐ„์— ๋”ฐ๋ฅธ ๋ณ€ํ˜•์„ ๋‚˜ํƒ€๋‚ด๊ธฐ ์œ„ํ•˜์—ฌ ํ”„๋กœ๊ทธ๋žจ ๋‚ด ๋™์ 

๊ตฌ์กฐํ•ด์„ ๋ฐฉ๋ฒ•์ธ ๊ณผ๋„ ๊ตฌ์กฐ ํ•ด์„(Transient Structure Analysis)์„

์ด์šฉํ•˜์˜€๋‹ค.

Fig. 1 Schematics of viscoelasticity measurement system in FEA

Fig. 2 Viscoelastic behavior of CMP polishing pad schematic

Fig. 3 Viscoelasticity measurement system

ํ•œ๊ตญ์ •๋ฐ€๊ณตํ•™ํšŒ์ง€ ์ œ 36๊ถŒ ์ œ 2ํ˜ธ February 2019 / 179

3.2.2 ์žฌ๋ฃŒ ๋ฌผ์„ฑ ์ •์˜

์œ ํ•œ์š”์†Œํ•ด์„์„ ์œ„ํ•ด ๋ชจ๋ธ์˜ ๋ถ€์†ํ’ˆ์ธ ์ƒ๋ถ€ ํ”Œ๋ ˆ์ดํŠธ์™€ ์—ฐ๋งˆ

ํŒจ๋“œ์˜ ์žฌ๋ฃŒ๋ฌผ์„ฑ์„ ์ •์˜ํ•˜์˜€๋‹ค. ์ƒ๋ถ€ ํ”Œ๋ ˆ์ดํŠธ์˜ ๋ฌผ์„ฑ์—๋Š” ์•Œ๋ ค

์ ธ ์žˆ๋Š” ์•Œ๋ฃจ๋ฏธ๋Š„์˜ ๋ฌผ์„ฑ์น˜๋ฅผ ๋ถ€์—ฌํ•˜์˜€๋‹ค. ์—ฐ๋งˆํŒจ๋“œ์˜ ๋ฌผ์„ฑ์„ ์ •์˜

ํ•˜๊ธฐ ์œ„ํ•ด ANSYS Workbench์˜ Engineering Data์—์„œ Isotropic

Elasticity์™€ Prony Volumetric Relaxation์„ ์ด์šฉํ•˜์˜€๋‹ค. Isotropic

Elasticity๋Š” ํ•˜์ค‘์— ๋Œ€ํ•œ ์—ฐ๋งˆํŒจ๋“œ์˜ ๋“ฑ๋ฐฉ์„ฑ ํƒ„์„ฑ๋ณ€ํ˜•์„ ๋‚˜ํƒ€๋‚ด๊ธฐ

์œ„ํ•œ ์žฌ๋ฃŒ๋ฌผ์„ฑ ์ •์˜ ๋ฐฉ๋ฒ•์ด๋ฉฐ, Prony Volumetric Relaxation์€ ์‘

๋ ฅ์ด์™„์œผ๋กœ ์ธํ•œ ํƒ„์„ฑ๊ณ„์ˆ˜์˜ ๊ฐ์†Œ๋ฅผ ๊ฐ์†Œ์œจ๊ณผ ์™„ํ™”์‹œ๊ฐ„์„ ๋ณ€์ˆ˜๋กœ

๊ฐ–๋Š” ์ง€์ˆ˜ํ•จ์ˆ˜ ํ˜•ํƒœ๋กœ ์ ํƒ„์„ฑ์„ ๋‚˜ํƒ€๋‚ด๊ธฐ ์œ„ํ•œ ์žฌ๋ฃŒ๋ฌผ์„ฑ ์ •์˜ ๋ฐฉ

๋ฒ•์ด๋‹ค. ์—ฐ๋งˆํŒจ๋“œ์˜ ๋ฌผ์„ฑ์€ ์ผ๋ฐ˜์ ์œผ๋กœ ์•Œ๋ ค์ ธ ์žˆ์ง€ ์•Š์œผ๋ฏ€๋กœ ๋ณธ

์—ฐ๊ตฌ์—์„œ๋Š” ์‹คํ—˜์„ ํ†ตํ•ด ์ธก์ •๋œ ์—ฐ๋งˆํŒจ๋“œ์˜ ์ ํƒ„์„ฑ ๋ฐ์ดํ„ฐ๋ฅผ ๋ฐ”

ํƒ•์œผ๋กœ ์ด๋ฅผ ์ •์˜ํ•˜์˜€๋‹ค.

3.2.3 ํ•˜์ค‘ ์กฐ๊ฑด

์œ ํ•œ์š”์†Œํ•ด์„์—์„œ์˜ ์‹œ๊ฐ„์— ๋”ฐ๋ฅธ ์—ฐ๋งˆํŒจ๋“œ์˜ ์ ํƒ„์„ฑ ๋ณ€ํ˜•์„

ํ™•์ธํ•˜๊ธฐ ์œ„ํ•ด ์ ํƒ„์„ฑ ์ธก์ • ์‹คํ—˜๊ณผ ๋™์ผํ•œ ํ•˜์ค‘์กฐ๊ฑด์„ ๋ถ€์—ฌํ•˜์˜€

๋‹ค. Fig. 4์™€ ๊ฐ™์ด ์ „์ฒด ๊ณผ์ •์„ ๊ฐ๊ฐ Loading, Load Creep,

Unloading, Recovery Creep์˜ 4๊ฐœ์˜ ๋‹จ๊ณ„๋กœ ๋‚˜๋ˆ„์–ด ํ•ด์„์„ ์ง„ํ–‰

ํ•˜์˜€๋‹ค. 0 - 1 ์ดˆ์˜ Loading ๋‹จ๊ณ„์—์„œ 14.4 N(300 g/cm2)์˜ ํ•˜์ค‘

์„ ๋ถ€์—ฌํ•˜์˜€๊ณ  1 - 120 ์ดˆ์˜ Load Creep ๋‹จ๊ณ„์—์„œ ์•ž์„œ ๋ถ€์—ฌ๋œ

ํ•˜์ค‘์„ ์œ ์ง€ํ•˜์˜€๋‹ค. 120 - 121 ์ดˆ์˜ Unloading ๋‹จ๊ณ„์—์„œ ํ•˜์ค‘์„

์ œ๊ฑฐํ•˜๊ณ  121 - 240 ์ดˆ์˜ Recovery Creep ๋‹จ๊ณ„์—์„œ ํ•˜์ค‘์ด ์ œ๊ฑฐ

๋œ ์ƒํƒœ๋ฅผ ์œ ์ง€ํ•˜์˜€๋‹ค. ์ด๋ฅผ ํ†ตํ•ด ํ•˜์ค‘์— ๋Œ€ํ•œ ์—ฐ๋งˆํŒจ๋“œ์˜ ์‹ค์ œ

๊ฑฐ๋™๊ณผ ์‹œ๋ฎฌ๋ ˆ์ด์…˜์—์„œ์˜ ๊ฑฐ๋™์„ ๋น„๊ตํ•˜์˜€๋‹ค.

4. ์‹คํ—˜๊ฒฐ๊ณผ ๋ฐ ํ† ์˜

4.1 ์ ํƒ„์„ฑ ์ธก์ • ๊ฒฐ๊ณผ

Fig. 6์€ ์ ํƒ„์„ฑ ์ธก์ •๊ธฐ์˜ ๋ฐ˜๋ณต ํ•˜์ค‘์— ์˜ํ•ด ๋ฐœ์ƒํ•˜๋Š” ์—ฐ๋งˆํŒจ

๋“œ์˜ ๋‘๊ป˜ ๋ณ€ํ™”๋ฅผ ๋‚˜ํƒ€๋‚ธ ๊ฒƒ์ด๋‹ค. ์—ฐ๋งˆํŒจ๋“œ์˜ ๋‘๊ป˜๋Š” ์ดˆ๊ธฐ ํ•˜์ค‘์—

๋Œ€ํ•ด ํฐ ๋ณ€ํ™”๋ฅผ ๋ณด์ด๋Š”๋ฐ ์‹คํ—˜์ด ์ง„ํ–‰๋จ์— ๋”ฐ๋ผ ์••์ถ•๊ณผ ํšŒ๋ณต์ด

๋ฐ˜๋ณต๋˜๋ฉด์„œ ํŒจ๋“œ ๋‚ด๋ถ€ ๊ตฌ์กฐ ๋˜๋Š” ํ‘œ๋ฉด์˜ ๋Œ๊ธฐ ๊ตฌ์กฐ์˜ ์˜๊ตฌ๋ณ€ํ˜•์œผ

๋กœ ์ธํ•ด ๋ณ€ํ˜•๋ฅ ์˜ ํญ์ด ์ผ์ •ํ•˜๊ฒŒ ์ˆ˜๋ ดํ•˜๋Š” ๊ฒƒ์„ ํ™•์ธํ•  ์ˆ˜ ์žˆ๋‹ค.

๋ณธ ์‹คํ—˜์—์„œ๋Š” ๋ฐ˜๋ณต์  ์••์ถ•/ํšŒ๋ณต์˜ 15 ๋ฒˆ ์งธ ์ฃผ๊ธฐ์—์„œ ๋‚˜ํƒ€๋‚˜๋Š”

์—ฐ๋งˆํŒจ๋“œ์˜ ๋‘๊ป˜ ๋ณ€ํ˜• ๋ฐ์ดํ„ฐ์—์„œ ์‹œ๊ฐ„์— ๋”ฐ๋ผ ๋ณ€ํ•˜๋Š” ์ดˆ๊ธฐ ๋‘๊ป˜

์— ๋Œ€ํ•œ ๋ณ€ํ˜•๋ฅ  ๋ฐ์ดํ„ฐ๋ฅผ ์–ป์—ˆ๋‹ค. ์ด ๋ฐ์ดํ„ฐ๋ฅผ ํ•˜์ค‘์— ๋Œ€ํ•œ ํƒ„์„ฑ

๋ณ€ํ˜•๊ณผ ์ ํƒ„์„ฑ ๋ณ€ํ˜•์„ ํ‘œํ˜„ํ•  ์ˆ˜ ์žˆ๋Š” ์‹(1)์— ํ”ผํŒ…ํ•˜๋ฉด Fig. 7๊ณผ

๊ฐ™์€ ๊ทธ๋ž˜ํ”„๋ฅผ ์–ป์„ ์ˆ˜ ์žˆ์œผ๋ฉฐ ํƒ„์„ฑ ๋ณ€ํ˜•๋ฅ  ฮต1๊ณผ ์ ํƒ„์„ฑ ๋ณ€ํ˜•๋ฅ 

ฮต2, ์ง€์—ฐ์‹œ๊ฐ„(Relaxation Time, ฯ„)์„ ์–ป์„ ์ˆ˜ ์žˆ๋‹ค. ๋˜ํ•œ ์‹(2), (3)

Fig. 4 Schematics of viscoelasticity measurement system in FEA

Fig. 5 Load condition for finite element analysis model

Fig. 6 Polishing pad thickness during 15 cycles of loading-recovery

test

Fig. 7 Strain-time graph of 15th cycle of loading-recovery test of

polishing pads

Table 1 Mechanical property data of polishing pad at 15th cycle of

loading-recovery test

Suba 400 Suba 600 Suba 800

E1 (kPa) 870.45 3541.46 4529.23

E2 (kPa) 9409.81 22394.06 18083.74

ฯ„ (sec) 19.37 15.03 19.08

180 / February 2019 ํ•œ๊ตญ์ •๋ฐ€๊ณตํ•™ํšŒ์ง€ ์ œ 36๊ถŒ ์ œ 2ํ˜ธ

์— ๋”ฐ๋ผ ํƒ„์„ฑ ๋ณ€ํ˜•๋ฅ ๊ณผ ์ ํƒ„์„ฑ ๋ณ€ํ˜•๋ฅ ์„ ์ด์šฉํ•ด ๊ฐ๊ฐ 1์ฐจ ํƒ„์„ฑ๊ณ„

์ˆ˜(Primary Elastic Modulus, E1)์™€ 2์ฐจ ํƒ„์„ฑ๊ณ„์ˆ˜(Secondary

Elastic Modulus, E2)๋ฅผ ์–ป์„ ์ˆ˜ ์žˆ๋‹ค. ์œ„ ๊ณผ์ •์„ ํ†ตํ•ด ์–ป์–ด์ง„ ๊ฐ

ํŒจ๋“œ์— ๋Œ€ํ•œ ๋ฌผ์„ฑ์€ Table 1์— ์ •๋ฆฌํ•˜์˜€๋‹ค.

(1)

(2)

(3)

4.2 ์œ ํ•œ์š”์†Œํ•ด์„ ๊ฒฐ๊ณผ

์—ฐ๋งˆํŒจ๋“œ์˜ ๋ฌผ์„ฑ์„ ์ •์˜ํ•˜๊ธฐ ์œ„ํ•˜์—ฌ ์ ํƒ„์„ฑ ์ธก์ • ๊ฒฐ๊ณผ๋ฅผ ํ†ตํ•ด

์–ป์–ด์ง„ ํŒŒ๋ผ๋ฏธํ„ฐ๋ฅผ ๋ฐ”ํƒ•์œผ๋กœ Table 2์™€ ๊ฐ™์ด ๊ฐ€์ •ํ•˜์˜€๋‹ค. Isotropic

Elasticity๋ฅผ ์ •์˜ํ•˜๊ธฐ ์œ„ํ•ด ์˜ ๋ฅ (Youngโ€™s Modulus)์€ 1์ฐจ ํƒ„์„ฑ

๊ณ„์ˆ˜๋ฅผ ์‚ฌ์šฉํ•˜์˜€๊ณ  ํ”„์™€์†ก ๋น„(Poissonโ€™s Ratio)๋Š” 0.35๋กœ ๋ชจ๋‘ ๋™

์ผํ•˜๊ฒŒ ํ•˜์˜€๋‹ค. Prony Volumetric Relaxation์„ ์ •์˜ํ•˜๊ธฐ ์œ„ํ•œ ๊ฐ’

์œผ๋กœ ์ƒ๋Œ€ ํƒ„์„ฑ๋ฅ (Relative Moduli)์€ ํƒ„์„ฑ๊ณ„์ˆ˜์˜ ๊ฐ์†Œ์œจ์„ ๋‚˜ํƒ€

๋‚ด๋Š” E1/(E1 + E2) ๊ฐ’์„ ์‚ฌ์šฉํ•˜์˜€๊ณ  ์ง€์—ฐ์‹œ๊ฐ„(Relaxation Time)์—

๋Š” ์ง€์ˆ˜ํ˜•ํƒœ์˜ ์‹์— ํ”ผํŒ…๋œ ์ง€์—ฐ์‹œ๊ฐ„(ฯ„) ๊ฐ’์„ ์‚ฌ์šฉํ•˜์˜€๋‹ค. ์•ž์„œ

์ •์˜๋œ ์ ํƒ„์„ฑ ์ธก์ • ์‹คํ—˜๊ณผ ๋™์ผํ•œ ํ•˜์ค‘์กฐ๊ฑด์— ๋”ฐ๋ผ ์œ ํ•œ์š”์†Œํ•ด

์„์„ ์ง„ํ–‰ํ•˜์˜€๊ณ  ํ•˜์ค‘์— ์˜ํ•ด ๋ฐœ์ƒํ•˜๋Š” ์‹œ๊ฐ„์— ๋”ฐ๋ฅธ ์—ฐ๋งˆํŒจ๋“œ์˜

๋‘๊ป˜ ๋ณ€ํ˜•์˜ ๊ฑฐ๋™์„ ํ™•์ธํ•˜์˜€๋‹ค. ์œ ํ•œ์š”์†Œ ํ•ด์„์„ ํ†ตํ•ด ๋‚˜ํƒ€๋‚œ ์—ฐ

๋งˆํŒจ๋“œ์˜ ๋‘๊ป˜๋ณ€ํ™”๋Š” Fig. 8์— ๋‚˜ํƒ€๋‚˜ ์žˆ๋‹ค. ์ด ๋•Œ์˜ ๋‘๊ป˜ ๋ณ€ํ˜•๋ฅ 

์€ ์‹คํ—˜์—์„œ ์–ป์–ด์ง„ ๋‘๊ป˜ ๋ณ€ํ™” ๊ทธ๋ž˜ํ”„์ธ Fig. 7๊ณผ ๋น„๊ตํ–ˆ์„ ๋•Œ ์ƒ

๋Œ€์ ์œผ๋กœ ์ž‘์€ ๋ณ€ํ˜•์ด ๋ฐœ์ƒํ•˜๋Š” ๊ฒƒ์„ ํ™•์ธํ•  ์ˆ˜ ์žˆ๋‹ค. ์—ฌ๊ธฐ์„œ ์ •

์˜ํ•œ ์žฌ๋ฃŒ๋ฌผ์„ฑ์€ ํ•˜์ค‘์— ๋Œ€ํ•œ ๋‘๊ป˜ ๋ณ€ํ˜•๋งŒ์„ ๊ณ ๋ คํ•˜์—ฌ ๊ฐ€์ •ํ•œ ํƒ„

์„ฑ๊ณ„์ˆ˜์ด๋ฏ€๋กœ 3-D ๋ชจ๋ธ์—์„œ ํ”„์™€์†ก ๋น„์— ๋”ฐ๋ฅธ ๋‹จ๋ฉด ๋ณ€ํ™”์˜ ์˜ํ–ฅ

์„ ๊ณ ๋ คํ•ด์•ผ ํ•œ๋‹ค. ์ด ๋•Œ๋ฌธ์— ๋™์ผํ•œ ๋ณ€ํ˜•๋ฅ ์„ ๋‚˜ํƒ€๋‚ด๊ธฐ ์œ„ํ•ด ์—ฐ

๋งˆํŒจ๋“œ์˜ ์žฌ๋ฃŒ๋ฌผ์„ฑ์„ ์ˆ˜์ •ํ•ด์•ผ ํ•˜๋ฉฐ ์ˆ˜์ •๋œ ๋ฌผ์„ฑ์€ Table 3์— ๋‚˜

ํƒ€๋‚˜ ์žˆ๋‹ค. ์ˆ˜์ •๋œ ๋ฌผ์„ฑ์„ ์ ์šฉํ•˜์—ฌ ๋‹ค์‹œ ์œ ํ•œ์š”์†Œํ•ด์„์„ ์‹ค์‹œ ํ•˜

์˜€์„ ๋•Œ Fig. 8๊ณผ ๊ฐ™์€ ๋ณ€ํ˜•๋ฅ ์ด ๋‚˜ํƒ€๋‚˜๋ฉฐ ์ด๋Š” ์‹คํ—˜์—์„œ ๋‚˜ํƒ€๋‚˜

๋Š” ํ•˜์ค‘์— ๋Œ€ํ•œ ์‹ค์ œ ํŒจ๋“œ์˜ ๋ณ€ํ˜•๋ฅ ๊ณผ ๋™์ผํ•œ ๊ฑฐ๋™์„ ๋ณด์ธ๋‹ค. ํ•ด

์„์„ ํ†ตํ•ด ์ˆ˜์ •๋œ ๋ฌผ์„ฑ์„ ํ†ตํ•ด ๋‚˜ํƒ€๋‚œ ์—ฐ๋งˆํŒจ๋“œ์˜ ๋ณ€ํ˜•๊ณผ ์‹ค์ œ

์••์ถ• ์‹คํ—˜์—์„œ ๋‚˜ํƒ€๋‚˜๋Š” ์—ฐ๋งˆํŒจ๋“œ์˜ ๋ณ€ํ˜•์˜ ๊ฑฐ๋™์ด ์ผ์น˜ํ•˜๋ฏ€๋กœ

์ด ๋•Œ์˜ ์žฌ๋ฃŒ๋ฌผ์„ฑ์ด ํ•ด์„์ƒ์—์„œ ์‹ค์ œ ๊ฑฐ๋™๊ณผ ๋™์ผํ•œ ๋ณ€ํ˜•์„ ๋‚˜ํƒ€

๋‚ด๋ฉฐ ์œ ํ•œ์š”์†Œํ•ด์„์— ์ ์šฉํ•  ์—ฐ๋งˆํŒจ๋“œ์˜ ๊ธฐ๊ณ„์  ๋ฌผ์„ฑ์œผ๋กœ ์‚ฌ์šฉ๋ 

์ˆ˜ ์žˆ๋‹ค.

5. ๊ฒฐ๋ก 

์ ํƒ„์„ฑ ์ธก์ •๊ธฐ๋ฅผ ํ†ตํ•ด ์–ป์€ CMP ์—ฐ๋งˆํŒจ๋“œ์˜ ๋ณ€ํ˜•๋ฅ ์„ ๋ฐ”ํƒ•์œผ

๋กœ ์œ ํ•œ์š”์†Œํ•ด์„์—์„œ์˜ ๋™์  ์ ํƒ„์„ฑ ๋ฌผ์„ฑ์„ ์ •์˜ํ•˜์˜€๋‹ค. ์—ฐ๋งˆํŒจ

๋“œ์˜ ํ•˜์ค‘์— ๋Œ€ํ•œ ๋ณ€ํ˜•๋ฅ ๋กœ๋ถ€ํ„ฐ 1์ฐจ ํƒ„์„ฑ๊ณ„์ˆ˜, 2์ฐจํƒ„์„ฑ๊ณ„์ˆ˜, ์™„ํ™”

์‹œ๊ฐ„ ๋ฐ์ดํ„ฐ๋ฅผ ์–ป์—ˆ๋‹ค. ์ด๋ฅผ ๋ฐ”ํƒ•์œผ๋กœ ์—ฐ๋งˆํŒจ๋“œ์˜ ํƒ„์„ฑ ์žฌ๋ฃŒ๋ฌผ์„ฑ

์ •์˜ ๋ฐฉ๋ฒ•์ธ Isotropic Elasticity๊ณผ ์ ํƒ„์„ฑ ์žฌ๋ฃŒ๋ฌผ์„ฑ ์ •์˜ ๋ฐฉ๋ฒ•์ธ

Prony Volumetric Relaxation์„ ์‚ฌ์šฉํ•˜์˜€๊ณ  ์‹คํ—˜๊ณผ ๋™์ผํ•œ ํ•˜์ค‘

์กฐ๊ฑด์—์„œ์˜ ์œ ํ•œ์š”์†Œํ•ด์„์„ ์‹ค์‹œํ•˜์˜€๋‹ค. ์œ ํ•œ์š”์†Œํ•ด์„์—์„œ ํ•˜์ค‘

์— ๋”ฐ๋ฅธ ์—ฐ๋งˆํŒจ๋“œ์˜ ์ ํƒ„์„ฑ ๊ฑฐ๋™์„ ํ™•์ธํ•˜์˜€์œผ๋‚˜ ์‹ค์ œ์— ๋น„ํ•ด ๋‚˜

ํƒ€๋‚œ ๋‘๊ป˜ ๋ณ€ํ˜•๋ฅ ์ด ์ž‘๊ฒŒ ๋‚˜ํƒ€๋‚ฌ๋‹ค. ์ด๋ฅผ ๋ณด์™„ํ•˜๊ธฐ ์œ„ํ•ด ์‹ค์ œ ๋ณ€

ํ˜•๋ฅ ๊ณผ ํ•ด์„์—์„œ ๋‚˜ํƒ€๋‚œ ๋ณ€ํ˜•๋ฅ ์„ ๋น„๊ตํ•˜์—ฌ ๋ฌผ์„ฑ์„ ์ˆ˜์ •ํ•˜์˜€๋‹ค.

๋‹ค์‹œ ์ง„ํ–‰ํ•œ ์œ ํ•œ์š”์†Œํ•ด์„์„ ํ†ตํ•ด ์ด ๋•Œ ์ •์˜๋œ ๋ฌผ์„ฑ์ด ์‹ค์ œ ๋ณ€

ฮต ฮต1

ฮต2

1 e t/ฯ„โ€“( )โ€“( )+=

E1

P

ฮต1

----=

E2

P

ฮต2

----=

Table 2 Material properties of polishing pad for FEA

Suba 400 Suba 600 Suba 800

Youngโ€™s modulus

(MPa)0.870 3.541 4.529

Poissonโ€™s ratio 0.35

Relative moduli 0.0847 0.137 0.200

Relaxation time 19.37 15.03 19.08

Fig. 8 Strain-time graph of finite element analysis model by

assumed material properties of polishing pad

Fig. 9 Strain-time graph of finite element analysis model by

modified material properties of polishing pad

Table 3 Modified material properties of polishing pad for FEA

Suba 400 Suba 600 Suba 800

Youngโ€™s modulus

(MPa)0.564 2.328 2.990

Poissonโ€™s ratio 0.35

Relative moduli 0.1298 0.2083 0.3089

Relaxation time 19.37 15.03 19.08

ํ•œ๊ตญ์ •๋ฐ€๊ณตํ•™ํšŒ์ง€ ์ œ 36๊ถŒ ์ œ 2ํ˜ธ February 2019 / 181

ํ˜•๊ณผ ์ž˜ ์ผ์น˜ํ•˜๋Š” ๊ฒƒ์„ ํ™•์ธํ•˜์˜€๋‹ค.

์ •์˜๋œ ๋™์  ์ ํƒ„์„ฑ ๋ฌผ์„ฑ์„ ํ†ตํ•ด ์œ ํ•œ์š”์†Œํ•ด์„์—์„œ ๋‚˜ํƒ€๋‚˜๋Š”

์—ฐ๋งˆํŒจ๋“œ ๋™์  ๊ฑฐ๋™์„ ๋‚˜ํƒ€๋‚ผ ์ˆ˜ ์žˆ์œผ๋ฉฐ ์–ป์–ด์ง„ ๋™์  ์ ํƒ„์„ฑ ๋ฌผ

์„ฑ์ด ์ถ”ํ›„ CMP ๊ณต์ •์˜ ๋™์  ํ•ด์„์— ํ™œ์šฉ๋  ์ˆ˜ ์žˆ์„ ๊ฒƒ์œผ๋กœ ์ƒ๊ฐ

๋œ๋‹ค

ACKNOWLEDGEMENT

์ด ๋…ผ๋ฌธ์€ ๋ถ€์‚ฐ๋Œ€ํ•™๊ต ๊ธฐ๋ณธ์—ฐ๊ตฌ์ง€์›์‚ฌ์—…(2๋…„)์— ์˜ํ•˜์—ฌ ์—ฐ๊ตฌ

๋˜์—ˆ์Œ.

REFERENCES

1. Bae, J.-H., Lee, H.-S., Park, J.-H., Nishizawa, H., Kinoshita, M.,

et al., โ€œEffect of Pad Thickness on Removal Rate and Within

Wafer Non-Uniformity in Oxide CMP,โ€ Journal of the Korean

Institute of Electrical and Electronic Material Engineers, Vol. 23,

No. 5, pp. 358-363, 2010.

2. Chen, K.-S., Yeh, H.-M., Yan, J.-L., and Chen, Y.-T., โ€œFinite-

Element Analysis on Wafer-Level CMP Contact Stress:

Reinvestigated Issues and the Effects of Selected Process

Parameters,โ€ The International Journal of Advanced

Manufacturing Technology, Vol. 42, Nos. 11-12, pp. 1118-1130,

2009.

3. Li, I., Forsthoefel, K. M., Richardson, K. A., Obeng, Y. S.,

Easter, W. G., et al., โ€œDynamic Mechanical Analysis (DMA) of

CMP Pad Materials,โ€ MRS Online Proceedings Library Archive,

Vol. 613, 2000.

4. Lu, H., Obeng, Y., and Richardson, K., โ€œApplicability of

Dynamic Mechanical Analysis for CMP Polyurethane Pad

Studies,โ€ Materials Characterization, Vol. 49, No. 2, pp. 177-186,

2002.

5. Kim, B. S., Tucker, M. H., Kelchner, J. D., and Beaudoin, S. P.,

โ€œStudy on the Mechanical Properties of CMP Pads,โ€ IEEE

Transactions on Semiconductor Manufacturing, Vol. 21, No. 3,

pp. 454-463, 2008.

6. Lee, D. and Lee, H., โ€œEstimating the Mechanical Properties of

Polyurethane-Impregnated Felt Pads,โ€ Journal of Mechanical

Science and Technology, Vol. 31, No. 12, pp. 5705-5710, 2017.

Byeongjun Pak

He received the M.S. degree in the Depart-

ment of Mechanical Engineering, Pusan

National University. His research interest is

simulation of chemical mechanical polishing

(CMP).

E-mail: [email protected]

Dasol Lee

Ph.D. candidate in the Department of

Mechanical Engineering, Pusan National Uni-

versity. Her research interest is chemical

mechanical polishing (CMP) of electronic

materials and manufacturing.

E-mail: [email protected]

Seonho Jeong

Ph.D. candidate in the Department of

Mechanical Engineering, Pusan National Uni-

versity. His research interest is chemical

mechanical polishing (CMP) of package sub-

strate.

E-mail: [email protected]

Hyunjin Kim

He received the M.S. degree in the Depart-

ment of Mechanical Engineering, Pusan

National University. His research interest is

chemical mechanical polishing (CMP) model-

ing.

E-mail: [email protected]

Haedo Jeong

Professor in the Department of Mechanical

Engineering, Pusan national University. His

research fields include chemical mechanical

polishing (CMP), grinding, polisher and con-

sumable design, and post-CMP cleaning.

E-mail: [email protected]