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Complete Semiconductor test Solutions

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COMPANY OVERVIEW

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CARROS (F) - 1985

Lincoln (UK) – 1997

Toulouse (F) – 1998

Casablanca (M) – 1999

Seoul-PCB (KR) – 2002

Meyreuil-Probe (F) – 2004

Phoenix (US) - 2005

Seoul-Probe (KR) – 2004

Singapore - 2006

Dallas (US) - 2006

Philippines - 2007

Munich (D) - 2008

Colombe (F) - 2008

Santa Clara (US) - 2009

Meyreuil-Test (F) - 2009

Milan (I) - 2011

Munich-Probe-(D) - 2010

Group History

Merge Synergie & CAD Etudes – 1995

Hsinchu (TW) - 2013

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Global Support

Europe • Carros (Headquarter) FRA

• Colombe FRA

• Toulouse FRA

• Meyreuil FRA

• Munich GER

• Lincoln UK

• Casablanca MAR

• Milan IT

Design centers: 11

R&D centers: 3

Production centers: 6

Test House: 2

Asia • Singapore

• Korea

• Philippines

•Taiwan

North America • Dallas

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Innovative Test Interface Products

Example 0.4/0.35mm Final Test Board

Example 0.4mm BGA Burn-In- Board

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Capabilities

PCB Design Engineering PCB

Manufacture

Component

Assembly/Test

Probe Card and

Socket Design,

Assembly & Test

TEST &

TEST Development

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Services

under one management and control

Design

Engineering

Manufacture

Assembly

PCB

Custom Sockets

Simulation

Applications

Probe Solutions Schematic entry

Support

Project Management

Test Development

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PCB Design

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Simulation

Advantest 93K 9.5” Vertical Probecard, 32 Layer

Transmission and Return Loss Transient Simulation

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Semiconductor Testing Services

MBAV8+ : LF,HF and VHF Mixed Signal communications including LTE Advanced, 802.11ac, WiMAX

DPS128 : DC Scale DPS128 High voltage and High Current power with fast sequencer control.

PS1600 : Digital 1.6G 1mV accuracy universal pin.

The Advantest V93000 C-Class Smart scale 712 pin tester is based at our facility in Munich and has been loaded with the following instruments;

With our in-house Advantest and Teradyne tester platforms we aim to support customers hardware verification, test program development and test platform transfer. Working closely with the Probe team we have access to 200mm and 300mm wafer probe handlers. ATE Systems are available for customers to access, supported development or remote access. We can support Qualification & Characterisation electrical testing.

The two Teradyne J750 IGXL version V3.40.09 / V3.40.14 are based at our facility near Marseille and have been loaded with the following instruments;

J750 #1 : 384 Channels, 4M LVM J750 #2 : 512 Channels, 4M LVM 32 DPS 10V/1A each can be ganged. Flexibilty to configure head with 128 channels at 8M.

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Tester Platform Experience

Preferred Supplier

Preferred Supplier in Europe

Preferred Supplier and Development Partner

Global Preferred Supplier and Development Partner

Development Partner in Germany

Preferred Supplier in Korea

VLCT Development Partner

Development Partner

Ando Electric Co., Ltd more than 5000 BIBs manufactured

Preferred Supplier and Development Partner

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PCB Manufacturing

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Assembly

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ISO Certification

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Technology Example I

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Technology Example II

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Technology Example III

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Test Sockets

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Test Sockets

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Burn-In Systems

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Probe Cards Solutions PROBE SOLUTION

DESCRIPTION SPEC

VERTI - P DIRECT PROBING ON WAFER PAD. SHORT PROBE LENGTHS. GOOD PERFORMANCE AT HIGH FREQUENCY.

100µM PITCH

VERTI - B DIRECT PROBING ON BUMPED SILICON. NO BUMP DAMAGE. GOOD PERFORMANCE AT HIGH FREQUENCY.

100µM PITCH

VERTI - T DIRECT PROBING ON WAFER. LOW FREQUENCY. FINE PITCH.

60µM PITCH

EPOXY STANDARD CANTILEVER USED FOR LOGIC, ANALOG AND MEMORY TEST. MULTI-SITE UPTO 256 DUTS

FINE PITCH 35µM

CANTIIMAGER FOR CCD SEMICONDUCTOR APPLICATIONS

RF SHORT CANTILEVER ASSEMBLY COMBINED WITH PCB DESIGN TO MINIMISE RESISTIVITY AND NOISE

UPTO 5GHz

PARAMETRIC EXCELS IN APPLICATIONS REQUIRING LOW LEAKAGE, HIGH FREQUENCY AND HIGH TEMPERATURE.

< 1pA/V UPTO 200oC

BLADES EXCELS IN APPLICATIONS REQUIRING LOW LEAKAGE, HIGH FREQUENCY AND HIGH TEMPERATURE.

< 1pA/V UPTO 200oC

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Probe-Depth depends of Probe Length.

Probe-Depth depends on Probe Length.

Verti-B Direct-Attach Solution

PITCH MINI = 140 µm

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Verti-B Direct-Attach Solution

PCB 3D View

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Global Turn-Key Test Solutions

DESIGN DEVELOP SIMULATE MANUFACTURE TEST

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Thank You