datasheet - irfz46n
TRANSCRIPT
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IRFZ46NHEXFETPower MOSFET
01/24/01
Absolute Maximum Ratings
Parameter Typ. Max. Units
RJC Junction-to-Case 1.4
RCS Case-to-Sink, Flat, Greased Surface 0.50 C/W
RJA Junction-to-Ambient 62
Thermal Resistance
www.irf.com 1
VDSS= 55V
RDS(on)= 16.5m
ID= 53AS
D
G
TO-220AB
Advanced HEXFETPower MOSFETs from International
Rectifier utilize advanced processing techniques to achieveextremely low on-resistance per silicon area. This benefit,combined with the fast switching speed and ruggedizeddevice design that HEXFET power MOSFETs are wellknown for, provides the designer with an extremely efficientand reliable device for use in a wide variety of applications.
The TO-220 package is universally preferred for all
commercial-industrial applications at power dissipationlevels to approximately 50 watts. The low thermal
resistance and low package cost of the TO-220 contributeto its wide acceptance throughout the industry.
Advanced Process Technology Ultra Low On-Resistance Dynamic dv/dt Rating 175C Operating Temperature Fast Switching Fully Avalanche Rated
Description
PD-91277
Parameter Max. UnitsID@ TC= 25C Continuous Drain Current, VGS@ 10V 53
ID@ TC= 100C Continuous Drain Current, VGS@ 10V 37 A
IDM Pulsed Drain Current 180
PD @TC= 25C Power Dissipation 107 W
Linear Derating Factor 0.71 W/ C
VGS Gate-to-Source Voltage 20 V
IAR Avalanche Current 28 A
EAR Repetitive Avalanche Energy 11 mJ
dv/dt Peak Diode Recovery dv/dt 5.0 V/ns
TJ Operating Junction and -55 to + 175
TSTG Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
C
Mounting torque, 6-32 or M3 srew 10 lbfin (1.1Nm)
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S
D
G
Parameter Min. Typ. Max. Units Conditions
IS Continuous Source Current MOSFET symbol
(Body Diode)
showing the
ISM Pulsed Source Current integral reverse
(Body Diode)
p-n junction diode.
VSD Diode Forward Voltage 1.3 V TJ= 25C, IS= 28A, VGS= 0V
trr Reverse Recovery Time 67 101 ns TJ= 25C, IF= 28A
Qrr Reverse Recovery Charge 208 312 nC di/dt = 100A/s
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Source-Drain Ratings and Characteristics
53
180
A
Starting TJ = 25C, L = 389H
RG = 25, IAS = 28A. (See Figure 12)
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Notes:
ISD 28A, di/dt 220A/s, VDD V(BR)DSS,
TJ 175CPulse width 400s; duty cycle 2%.
This is a typical value at device destruction and represents
operation outside rated limits.
This is a calculated value limited to TJ= 175C.
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 55 V VGS= 0V, ID= 250A
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient 0.057 V/C Reference to 25C, ID= 1mA
RDS(on) Static Drain-to-Source On-Resistance 16.5 m VGS= 10V, ID= 28A
VGS(th) Gate Threshold Voltage 2.0 4.0 V VDS= VGS, ID= 250A
gfs Forward Transconductance 19 S VDS= 25V, ID= 28A
25A
VDS= 55V, VGS= 0V
250 VDS= 44V, VGS= 0V, TJ= 150C
Gate-to-Source Forward Leakage 100 VGS= 20V
Gate-to-Source Reverse Leakage -100nA
VGS= -20V
Qg Total Gate Charge 72 ID= 28A
Qgs Gate-to-Source Charge 11 nC VDS= 44V
Qgd Gate-to-Drain ("Miller") Charge 26 VGS= 10V, See Fig. 6 and 13td(on) Turn-On Delay Time 14 VDD= 28V
tr Rise Time 76 ID= 28A
td(off) Turn-Off Delay Time 52 RG= 12
tf Fall Time 57 VGS= 10V, See Fig. 10
Between lead,
6mm (0.25in.)
from package
and center of die contact
Ciss Input Capacitance 1696 VGS= 0V
Coss Output Capacitance 407 VDS= 25V
Crss Reverse Transfer Capacitance 110 pF = 1.0MHz, See Fig. 5
EAS Single Pulse Avalanche Energy 583 152 mJ IAS = 28A, L = 389H
nH
Electrical Characteristics @ TJ= 25C (unless otherwise specified)
LD Internal Drain Inductance
LS Internal Source Inductance S
D
G
IGSS
ns
4.5
7.5
IDSS Drain-to-Source Leakage Current
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Fig 4. Normalized On-ResistanceVs. Temperature
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
1
10
100
1000
0.1 1 10 100
20s PULSE WIDTHT = 25 CJ
TOP
BOTTOM
VGS15V10V8.0V7.0V6.0V5.5V5.0V4.5V
V , Drain-to-Source Voltage (V)
I
,Drain-to-SourceCurrent(A)
DS
D
4.5V
1
10
100
1000
0.1 1 10 100
20s PULSE WIDTHT = 175 CJ
TOP
BOTTOM
VGS15V10V8.0V7.0V6.0V5.5V5.0V4.5V
V , Drain-to-Source Voltage (V)
I
,Drain-to-SourceCurrent(A)
DS
D
4.5V
1
10
100
1000
4 5 6 7 8 9 10 11
V = 25V20s PULSE WIDTH
DS
V , Gate-to-Source Voltage (V)
I
,Drain-to-SourceCurrent(A)
GS
D
T = 25 CJ
T = 175 CJ
-60 -40 -20 0 20 40 60 80 100 120 140 160 1800.0
0.5
1.0
1.5
2.0
2.5
3.0
T , Junction Temperature ( C)
R
,Drain-to-SourceOnResistance
(Normalized)
J
DS(on)
V =
I =
GS
D
10V
53A
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Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 9. Maximum Drain Current Vs.Case Temperature
0.01
0.1
1
10
0.00001 0.0001 0.001 0.01 0.1 1
Notes:
1. Duty factor D =t / t
2. Peak T =P x Z + T1 2
J DM thJC C
P
t
t
DM
1
2
t , Rectangular Pulse Duration (sec)
ThermalResponse(Z
)
1
thJC
0.010.02
0.05
0.10
0.20
D = 0.50
SINGLE PULSE(THERMAL RESPONSE)
25 50 75 100 125 150 1750
10
20
30
40
50
60
T , Case Temperature ( C)
I
,DrainCurrent(A)
C
D
VDS
90%
10%
VGS
td(on) tr td(off) tf
VDS
Pulse Width 1 sDuty Factor 0.1 %
RD
VGS
RG
D.U.T.
VGS
+
-VDD
Fig 10a. Switching Time Test Circuit
Fig 10b. Switching Time Waveforms
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QG
QGS QGD
VG
Charge
D.U.T. VDS
IDIG
3mA
VGS
.3F
50K
.2F12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-VGS
Fig 13b. Gate Charge Test CircuitFig 13a. Basic Gate Charge Waveform
Fig 12b. Unclamped Inductive Waveforms
Fig 12a. Unclamped Inductive Test Circuit
tp
V(BR)DSS
IAS
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
R G
IA S
0.01tp
D.U.T
LV D S
+
-VD D
DRI V E R
A
1 5V
20 V
25 50 75 100 125 150 1750
50
100
150
200
250
300
350
Starting T , Junction Temperature( C)
E
,SinglePulseAvalancheEnergy(mJ)
J
AS
IDTOP
BOTTOM
11A20A28A
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Peak Diode Recovery dv/dt Test Circuit
P.W. Period
di/dt
Diode Recoverydv/dt
Ripple 5%
Body Diode Forward Drop
Re-AppliedVoltage
ReverseRecoveryCurrent
Body Diode ForwardCurrent
VGS=10V
VDD
ISD
Driver Gate Drive
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
D =P.W.
Period
+
-
+
+
+-
-
-
RGVDD
dv/dt controlled by RG ISDcontrolled by Duty Factor "D" D.U.T. - Device Under Test
D.U.T*Circuit Layout Considerations Low Stray Inductance Ground Plane Low Leakage Inductance Current Transformer
* Reverse Polarity of D.U.T for P-Channel
VGS
[ ]
[ ]
***VGS= 5.0V for Logic Level and 3V Drive Devices
[ ] ***
Fig 14. For N-channel HEXFETpower MOSFETs
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LEAD ASSI GNM ENT S
1 - GAT E
2 - DRAIN
3 - SOURCE
4 - DRAIN
- B -
1.32 (.052)1.22 (.048)
3X0.55 (.022)0.46 (.018)
2.92 (.115)2.64 (.104)
4.69 (.185)4.20 (.165)
3X0.93 (.037)0.69 (.027)
4.06 (.160)3.55 (.140)
1.15 (.045) MIN
6.47 (.255)6.10 (.240)
3.78 (.149)3.54 (.139)
- A -
10.54 (.415)10.29 (.405)2.87 (.113)
2.62 (.103)
15.24 (.600)14.84 (.584)
14.09 (.555)13.47 (.530)
3X1.40 (.055)1.15 (.045)
2.54 (.100)
2X
0.36 (.014) M B A M
4
1 2 3
N O T E S :
1 D I M ENSI ONING & T OLERANCI NG PER ANSI Y14 . 5M , 1982 . 3 OUT LI NE CONF ORM S TO JEDEC OUT LI NE T O-220AB.
2 CONT ROLLI NG DI M ENSION : I NCH 4 HEAT SI NK & LEAD M EASUREM EN T S DO NOT I NCLUDE BURRS.
TO-220AB Part Marking Information
TO-220AB Package OutlineDimensions are shown in millimeters (inches)
PART NUMBERINTERNATIONAL
RECTIFIER LOGO
EXAMPLE : THIS IS AN IRF1010WITH ASSEMBLYLOT CODE 9B1M
A S S E M B L Y
LOT CODE
DATE CODE
( Y Y W W )
YY = YEAR
W W = W E E K
9246IRF1010
9B 1M
A
IR WORLD HEADQUARTERS:233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903Visit us at www.irf.com for sales contact information.12/00
Data and specifications subject to change without notice.This product has been designed and qualified for the automotive [Q101] market.
Qualification Standards can be found on IRs Web site.