deconvolution methods for structured illumination...

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Deconvolution methods for structured illumination microscopy NADYA CHAKROVA,BERND RIEGER, AND SJOERD STALLINGA , * Imaging Physics Department, Delft University of Technology, Lorentzweg 1, 2628CJ Delft, The Netherlands *Corresponding author: [email protected] Received 23 February 2016; revised 7 April 2016; accepted 8 April 2016; posted 8 April 2016 (Doc. ID 259859); published 10 May 2016 We compare two recently developed multiple-frame deconvolution approaches for the reconstruction of structured illumination microscopy (SIM) data: the pattern-illuminated Fourier ptychography algorithm (piFP) and the joint RichardsonLucy deconvolution (jRL). The quality of the images reconstructed by these methods is compared in terms of the achieved resolution improvement, noise enhancement, and inherent artifacts. Furthermore, we study the issue of object-dependent resolution improvement by considering the modulation transfer functions derived from different types of objects. The performance of the considered methods is tested in experiments and benchmarked with a commercial SIM microscope. We find that the piFP method resolves periodic and isolated structures equally well, whereas the jRL method provides significantly higher resolution for isolated objects compared to periodic ones. Images reconstructed by the piFP and jRL algorithms are comparable to the images reconstructed using the generalized Wiener filter applied in most commercial SIM microscopes. An advantage of the discussed algorithms is that they allow the reconstruction of SIM images acquired under different types of illumination, such as multi-spot or random illumination. © 2016 Optical Society of America OCIS codes: (180.2520) Fluorescence microscopy; (100.1830) Deconvolution; (100.3190) Inverse problems. http://dx.doi.org/10.1364/JOSAA.33.000B12 1. INTRODUCTION The two main factors deteriorating image resolution in fluores- cence microscopy are noise and the fundamental limitation of the optical system posed by diffraction. The blurring of an object caused by the Abbe diffraction limit is mathematically described as a convolution of this object with the point spread function (PSF) of the microscope, which is limited in band- width to spatial frequencies smaller than 2 NAλ (where λ is the fluorescence wavelength and NA is the numerical aperture of the microscope objective). The process of partially inverting this blur is referred to as deconvolution. Deconvolution has long remained one of the most popular methods to improve the quality of fluorescence microscopy images. Since the 1980s, numerous deconvolution microscopy methods have been de- veloped, and extensive literature is available for their compari- son [13]. In practice, the improvement in image quality achieved by three-dimensional (3D) deconvolution of widefield images can be on par with the improvement achieved in con- focal microscopy. Recent developments in fluorescence microscopy have led to a number of super-resolution techniques, which can provide a substantially larger resolution improvement compared to wide- field deconvolution microscopy [4]. One of these advanced methods is structured illumination microscopy (SIM) [59]. SIM offers sectioning comparable to confocal microscopy and a resolution that is up to a factor of two better than the resolution in widefield microscopy. The set of raw images from which the final SIM image is reconstructed is generated by exposing the sample to a sequence of non-uniform illuminations. The ac- quired images are processed by a reconstruction algorithm, which depends on the type of applied non-uniform illumina- tion, for providing the final high-resolution SIM image. In this study, we compare two newly emerged recon- struction methods for SIM data: the joint RichardsonLucy deconvolution (jRL) [10,11] and pattern-illuminated Fourier ptychography (piFP) [12,13]. Both methods can process SIM data acquired under any type of structured illumination and widefield detection. However, here we focus solely on the two most frequently used types: sinusoidal (line) and multi-spot illumination. The sinusoidal excitation was used for the first demonstra- tion of SIM, and it still remains the most commonly used il- lumination mode due to its time efficiency. It provides the fastest SIM imaging, since only 15 sinusoidal illuminations are required for conventional 3D SIM reconstruction by the generalized Wiener filter. The accurate knowledge of the shift between the illuminations is essential for the generalized Wiener filter reconstruction [14]. Unfortunately, the noise B12 Vol. 33, No. 7 / July 2016 / Journal of the Optical Society of America A Research Article 1084-7529/16/070B12-09 Journal © 2016 Optical Society of America

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Page 1: Deconvolution methods for structured illumination microscopyhomepage.tudelft.nl/z63s8/Publications/Chakrova2016.pdf · numerous deconvolution microscopy methods have been de-veloped,

Deconvolution methods for structuredillumination microscopyNADYA CHAKROVA, BERND RIEGER,† AND SJOERD STALLINGA†,*Imaging Physics Department, Delft University of Technology, Lorentzweg 1, 2628CJ Delft, The Netherlands*Corresponding author: [email protected]

Received 23 February 2016; revised 7 April 2016; accepted 8 April 2016; posted 8 April 2016 (Doc. ID 259859); published 10 May 2016

We compare two recently developed multiple-frame deconvolution approaches for the reconstruction ofstructured illumination microscopy (SIM) data: the pattern-illuminated Fourier ptychography algorithm (piFP)and the joint Richardson–Lucy deconvolution (jRL). The quality of the images reconstructed by these methodsis compared in terms of the achieved resolution improvement, noise enhancement, and inherent artifacts.Furthermore, we study the issue of object-dependent resolution improvement by considering the modulationtransfer functions derived from different types of objects. The performance of the considered methods is testedin experiments and benchmarked with a commercial SIM microscope. We find that the piFP method resolvesperiodic and isolated structures equally well, whereas the jRL method provides significantly higher resolution forisolated objects compared to periodic ones. Images reconstructed by the piFP and jRL algorithms are comparableto the images reconstructed using the generalized Wiener filter applied in most commercial SIM microscopes. Anadvantage of the discussed algorithms is that they allow the reconstruction of SIM images acquired under differenttypes of illumination, such as multi-spot or random illumination. © 2016 Optical Society of America

OCIS codes: (180.2520) Fluorescence microscopy; (100.1830) Deconvolution; (100.3190) Inverse problems.

http://dx.doi.org/10.1364/JOSAA.33.000B12

1. INTRODUCTION

The two main factors deteriorating image resolution in fluores-cence microscopy are noise and the fundamental limitation ofthe optical system posed by diffraction. The blurring of anobject caused by the Abbe diffraction limit is mathematicallydescribed as a convolution of this object with the point spreadfunction (PSF) of the microscope, which is limited in band-width to spatial frequencies smaller than 2 NA∕λ (where λ isthe fluorescence wavelength and NA is the numerical apertureof the microscope objective). The process of partially invertingthis blur is referred to as deconvolution. Deconvolutionhas long remained one of the most popular methods to improvethe quality of fluorescence microscopy images. Since the 1980s,numerous deconvolution microscopy methods have been de-veloped, and extensive literature is available for their compari-son [1–3]. In practice, the improvement in image qualityachieved by three-dimensional (3D) deconvolution of widefieldimages can be on par with the improvement achieved in con-focal microscopy.

Recent developments in fluorescence microscopy have led toa number of super-resolution techniques, which can provide asubstantially larger resolution improvement compared to wide-field deconvolution microscopy [4]. One of these advancedmethods is structured illumination microscopy (SIM) [5–9].

SIM offers sectioning comparable to confocal microscopy anda resolution that is up to a factor of two better than the resolutionin widefield microscopy. The set of raw images from whichthe final SIM image is reconstructed is generated by exposingthe sample to a sequence of non-uniform illuminations. The ac-quired images are processed by a reconstruction algorithm,which depends on the type of applied non-uniform illumina-tion, for providing the final high-resolution SIM image.

In this study, we compare two newly emerged recon-struction methods for SIM data: the joint Richardson–Lucydeconvolution (jRL) [10,11] and pattern-illuminated Fourierptychography (piFP) [12,13]. Both methods can process SIMdata acquired under any type of structured illumination andwidefield detection. However, here we focus solely on the twomost frequently used types: sinusoidal (line) and multi-spotillumination.

The sinusoidal excitation was used for the first demonstra-tion of SIM, and it still remains the most commonly used il-lumination mode due to its time efficiency. It provides thefastest SIM imaging, since only 15 sinusoidal illuminationsare required for conventional 3D SIM reconstruction by thegeneralized Wiener filter. The accurate knowledge of the shiftbetween the illuminations is essential for the generalizedWiener filter reconstruction [14]. Unfortunately, the noise

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1084-7529/16/070B12-09 Journal © 2016 Optical Society of America

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in the images hampers precise estimation of this shift, whichoften leads to artifacts in the reconstructed image. Alternativereconstruction methods, which are based on a Bayesian treat-ment of the given inverse problem, may help to avoid the ar-tifacts associated with the inaccurate shift of the spectralcomponents [15–18]. The jRL and piFP algorithms appliedto SIM measurements also fit within the Bayesian inversionframework. In fact, if only two-dimensional (2D) imaging isconsidered, the piFP algorithm is identical to the maximuma posteriori probability image estimation algorithm describedin Ref. [17], with the only differences being the sequential in-stead of the simultaneous update of the images and the form ofapplied regularization.

SIM with multi-spot illumination requires a larger numberof excitation patterns; however, it provides better depth dis-crimination and thereby enables the imaging of thicker samples[19]. This variety of super-resolution SIM is closely related toimage scanning microscopy (ISM), a method that is based onthe combination of confocal microscopy and widefield detec-tion [20,21]. In order to speed up the acquisition and process-ing, ISM with multi-spot illumination was developed [19], andseveral different all-optical implementations of the ISM prin-ciple were realized [22–24]. In practice, ISM methods offer lat-eral resolution, which is about a factor of

ffiffiffi2

pbetter than the

resolution in widefield microscopy, although in principle, thespatial frequency bandwidth is increased by a factor of two.Deconvolution of the multi-spot SIM measurements by thejRL and piFP algorithms may be expected to yield the full fac-tor of 2 resolution improvement over widefield microscopy,which is comparable to SIM.

In this paper, we formulate the generalized maximum like-lihood estimation (MLE) treatment of the image reconstructionproblem in SIM. Furthermore, we consider several particularcases of MLE applied in SIM, including the above-mentionedjRL and piFP methods. The quality of the images reconstructedby thesemethods is compared in terms of the achieved resolutionimprovement, noise enhancement, and inherent artifacts. Oneof the major differences between the piFP and jRL is in theunderlying noise model: the piFP algorithm is derived assuminga read-out noise only model, whereas the jRL algorithm is de-rived assuming a shot-noise-only model. At the same time,the increasingly popular sCMOS cameras exhibit both typesof noise. We study which of the algorithms would be bestsuited for these cameras. Finally, we benchmark the perfor-mance of the jRL and piFP algorithms with the generalizedWiener reconstruction from a state-of-the-art commercial SIMmicroscope.

2. THEORY

A. Image Reconstruction in SIM with MLE

In SIM, an object x̂ is imaged under a number of non-uniformilluminations pi�i � 1…N �. We model the image formationin SIM as a linear, shift-invariant process occurring in thepresence of mixed Poisson–Gaussian noise. Each expecteddiffraction-limited image μi corresponding to illuminationpattern pi is described as follows:

μi � �x̂ · pi� ⊗ h; (1)

where h is the PSF of the microscope and ⊗ denotes the con-volution operator. The actual acquired image d i differs fromthe expected image by noise n:

d i � �x̂ · pi� ⊗ h� n: (2)

We assume that the PSF is normalized to unity and that thesum of all illumination patterns is uniform:

XNi�1

pi � 1: (3)

Image reconstruction in SIM can then be formulated as an in-verse problem, where a high-resolution object estimate x is cal-culated from a set of lower-resolution object observationsd i�i � 1…N �. The presence of noise and the finite spatial fre-quency bandwidth of the microscope’s optical transfer function(OTF) make this problem ill posed and, hence, the direct in-version of Eq. (2) does not lead to a unique solution. One of theways to handle such an ill-posed inverse problem is to apply astatistical approach in the form of MLE. MLE has been pre-viously used for SIM reconstruction under the assumption thatonly Gaussian noise [16–18] or only Poisson noise [11] ispresent in the acquired images. Here, we formulate a general-ized MLE treatment for the reconstruction in SIM, which takesinto account both Poisson and Gaussian noise.

According to Bayes’s theorem, the probability of an estimatex being the origin of the acquired data d i is given by

P�xjd 1; d 2;…; dN � �P�d 1; d 2;…; dN jx� · P�x�

P�d 1; d 2;…; dN �: (4)

The sought-for high-resolution SIM image is the estimate x,which maximizes this probability, or, equivalently, minimizesits negative logarithm:

E � − log P�d 1; d 2;…; dN jx� − log P�x� � L� F; (5)

where we have omitted the logarithm of P�d 1; d 2;…; dN �,since it does not depend on x. The first term of the error func-tion E is the log-likelihood function L, which we will derivefrom the corresponding probability distribution. The probabil-ity distribution can be calculated as a convolution of thePoisson distribution, representing the shot noise, and theGaussian distribution, representing the camera read-out noise.In order to simplify the calculations, we use an analyticalapproximation to the mixed noise probability distribution,which was proposed by Huang et al. [25]:

P�d jμ; σ2� � e−�μ�σ2��μ� σ2�d�σ2

Γ�d � σ2 � 1� : (6)

Equation (6) describes the probability of observing an image dgiven the expected image μ and the variance of the read-out noiseσ2.Γ�t� stands for the gamma function. Taking into account thewhole set of acquired images d i, the corresponding joint log like-lihood, which includes both noise types, is expressed as

L �XNi�1

��μi � σ2� − �d i � σ2� log�μi � σ2�

� log�Γ�d i � σ2 � 1���: (7)

The second term of Eq. (5) is the regularization function F ,which represents prior knowledge of the object. In practice, it

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is used to overcome the ill-posed nature of the optimizationproblem in view of the band-limited OTF. Regularization func-tions can take various forms, depending on the available priorinformation about the object.

In order to find the MLE x, the error function E is mini-mized by a local iterative algorithm according to the followingequation:

xk�1 � xk − βk∂E∂xk

: (8)

In the case F � 0, the derivative of the error function withrespect to x is calculated as

∂E∂x

� ∂L∂x

� 1 −XNi�1

�d i � σ2

μi � σ2⊗ hT · pi

�; (9)

where the sum of all illumination patterns is uniform and thePSF is normalized to unity. The transpose of the PSF is denotedas hT .

The general MLE approach presented above can be trans-formed into different reconstruction algorithms depending onthe noise characteristics of the acquired images, the choice ofthe regularization function F , and the update step β. Despitehaving a common origin, these algorithms give rise to consid-erably different reconstructions. In the following sections, wewill discuss several particular cases of MLE applied to SIMreconstruction, which are derived for different noise modelsand various forms of the update β. In this work, we restrictour considerations to non-regularized problems �F � 0� anduse early termination of the iterative reconstruction algorithmsto obtain regularization.

B. Pattern-Illuminated Fourier Ptychography

Under the assumption of Gaussian noise, the error function Etakes the simplified least-squares form:

E � 1

2σ2XNi�1

�d i − μi�2: (10)

The optimization of a least-squares function carried out accord-ing to Eq. (8) and using a constant step size β is nothing morethan the steepest descent method.

If the update step of the steepest descent algorithm is splitinto three separate steps and the object is updated sequentiallyfor each illumination pattern, one arrives at the piFP algorithm[12]. The sequential update is expected to accelerate the con-vergence of the algorithm by a factor of N [26,27]. In our ear-lier work, we explained the connection between the steepestdescent and the piFP algorithms and experimentally demon-strated the resolution improvement in 2D SIM by piFP [13].The piFP algorithm can be also seen as a particular case of theLandweber method [28], extended for the case of multiple-image deconvolution. As a non-regularized linear least-squaresmethod, piFP provides a computationally simple solution tothe given inverse problem.

C. Joint Richardson–Lucy Deconvolution

The Richardson–Lucy (RL) algorithm was originally developedfor the restoration of a single blurred image corrupted byPoisson noise [29,30]. An updated rule for the conventional

RL algorithm is obtained by taking the step size βRL equalto the local value of the sought-for object x:

xk�1 � xk ·�dμ⊗ hT

�: (11)

Recently, Ingaramo et al. proposed combining multiple imageswith complementary strengths through a joint Richardson–Lucy algorithm [10]. This multiple-image jRL deconvolutionwas first used to reconstruct images in multi-spot SIM byStröhl et al. [11].

The updated rule for the jRL algorithm in the case of mixedPoisson–Gaussian noise is found by setting βRL � x in Eqs. (8)and (9):

xk�1 � xk ·XNi�1

�d i � σ2

μi � σ2⊗ hT · pi

�: (12)

An advantage of using the mixed-noise model instead of thePoisson noise model becomes apparent when the acquired im-ages have small photon counts, i.e., d i ≪ σ2. In this case, theupdate step 12 becomes idle, and noise amplification for lowsignal levels is suppressed.

D. Newton–Raphson Updated Step

The step size β can be modified in order to improve theconvergence speed of the steepest descent method. Such an im-provement has been demonstrated in MLE SIM reconstructionby the Barzilai–Borwein [17] and Newton–Raphson (NR) [13]approaches. According to the NR rule, the step size should betaken as the inverse of the diagonal part of the Hessian matrix:βNR � H −1. In the case of mixed noise, the diagonal elementsof the Hessian matrix are as follows:

H � ∂2E∂x2

�XNi�1

�d i � σ2

�μi � σ2�2 ⊗ �hT �2 · p2i�: (13)

It is also possible to interpolate between the NR and jRL algo-rithms by choosing a diagonal update matrix that has differententries for each pixel:

βRLNR � xffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi1�H 2x2

p : (14)

In limiting cases, this mixed step size reduces to NR and jRLupdates:

βRLNR ��x � βRL; when Hx ≪ 1H −1 � βNR; when Hx ≫ 1

: (15)

The interpolation algorithm deliberately uses a smaller step sizethan the jRL algorithm. Therefore, this interpolation algorithmis anticipated to be slower than the jRL algorithm, but is ex-pected to outperform it in terms of noise suppression when theacquired images are highly distorted by both Poisson andGaussian noise.

3. SIMULATION RESULTS

In order to test the performance of various MLE algorithms insimulations, we use a resolution target of 512 × 512 pixels con-taining different objects, such as points, crossing lines, uniformareas, and periodic structures. The pixel size of the resolutiontarget is taken as equal to λ∕16 NA, where λ is the emission

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wavelength and NA is the numerical aperture of the objective.The simulation is performed using a vectorial PSF [31,32] thatwas calculated forNA � 1.4 and the excitation/emission wave-lengths of 488/518 nm.

Illumination patterns at the sample plane pi are obtained byconvolving the binary multi-spot patterns with the excitationPSF. A single binary multi-spot pattern is designed as an arrayof one-pixel spots arranged in a square lattice with periodicity of12 pixels, which corresponds to a spatial frequency that is 2/3times the widefield diffraction limit at 2 NA∕λ. This pattern istranslated in steps of one pixel in order to form the full set of144 multi-spot patterns and provide the uniform object illumi-nation. The total intensity accumulated over all illuminationsamounts to 2.5 × 104 photons per pixel. Gaussian read-outnoise with an equivalent variance of σ2 � 7 photons andPoisson noise corresponding to the photon counts are addedto each simulated image d i. A separate widefield image is usedas an initial estimate of the object under reconstruction. Wefound that a uniform object can also be used as the initial es-timate and leads to only minor changes in the outcome of thesimulations.

In order to regularize the considered MLE problem, we ter-minate the iterative process before convergence to numericalprecision. In the case of linear algorithms with the Gaussiannoise approximation (piFP and NR with Gaussian noisemodel), we found 5–25 iterations to be optimal, since furtherincreasing the number of iterations N iter leads to highly visible

noise amplification in the reconstructed images. The absoluteerror, calculated as the difference between the reconstructed im-age and the ground truth (averaged over all pixels), reaches∼1.5 × 103 photons per pixel at the chosen stopping iteration.The algorithms, which are based on the assumption of Poissonor mixed Poisson-Gaussian noise (jRL, interpolated jRL-NR,NR with mixed noise model), converge considerably slower.In order to reach absolute error levels similar to the oneachieved in the piFP algorithm, about 100–300 iterations haveto be applied. We have chosen a fixed number of 200 iterationsas a stopping criterion for these algorithms. The computationtakes about 3–7 s per iteration (3.3 s for piFP, 4 s for jRL, and7 s for jRL-NR) on an Intel Xeon E5-1620 v2 CPU with3.70 GHz clock speed. The simulation is implemented inMATLAB (Mathworks, USA; the corresponding softwarepackage can be found at http://www.diplib.org/add-ons).

Examples of the images reconstructed using jRL and piFPalgorithms are given in Fig. 1. The jRL reconstruction provideshigher resolution improvement for point objects compared tothe piFP reconstruction. However, the piFP reconstructionexhibits higher resolution in periodic structures. A majoradvantage of the jRL algorithm is the positivity constraint:the reconstructed image is always positive provided that the ini-tial estimate did not have any negative values. The piFPreconstruction, on the contrary, results in a considerable numberof non-physical negative values. Additionally, reconstructionartifacts in the form of amplified noise are more pronounced

Fig. 1. Comparison of the jRL and piFP algorithms in simulations. (a) Simulated resolution target with 512 × 512 pixels of 23 nm. (b) Widefieldimage. (c) jRL reconstruction (200 iterations). (d) piFP reconstruction (20 iterations); negative pixels are clipped. (e) Combination of the jRL andpiFP methods: the outcome of the 20 piFP iterations was used as an initial estimate for the 100 iterations of the jRL algorithm.

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in piFP reconstruction. Ringing artifacts are characteristic ofboth methods, but are more expressed in jRL reconstruction.A combination of piFP and jRL methods can help us to utilizethe strengths of both algorithms. As seen in Fig. 1(e), by using anoutput of several piFP iterations as an initial estimate for the jRLalgorithm, one can achieve a higher resolution for both isolatedand periodic objects.

A. Quantitative Assessment of the ReconstructedImages

Quantitatively, the quality of reconstructed images was evalu-ated by two parameters: the signal-to-noise ratio (SNR) in theuniform white area and the full width at half maximum(FWHM) of the point objects. The FWHM is calculated fromthe standard deviation of the Gaussian function fitted to theisolated point objects in the reconstructed images. It is impor-tant to note that the FWHM measure does not provide a com-plete representation of resolution in the reconstructed image[33]: it can only be used as a resolution indicator for very sparsesamples or well-isolated objects. The results for several MLEmethods are summarized in Fig. 2.

Assessing the quality of reconstructed images is not a trivialtask. There is no standard procedure that estimates how wellthe reconstructed image corresponds to the ground truthand how severe the reconstruction artifacts are. In this work,we have chosen the so-called relative energy regain G [34]to further assess the performance of the reconstructions. Therelative energy regain is calculated from the Fourier transformsof the ground truth of the object (Object) and the recon-structed image (Estimate), using the Holmes error energyΔE [35]:

ΔE � jObject − Estimatej2; (16)

G � jObjectj2 − ΔEjObjectj2 : (17)

The curves shown in Fig. 3 correspond to the profiles of therelative energy regain (the vertical profiles were taken at thezero horizontal spatial frequency). The shaded error bars showthe standard deviation over the 50 different noise realizations.The value of G � 1 corresponds to the ideal reconstruction,whereas negative values of the G profiles indicate artifact for-mation. As a linear method, piFP cannot produce non-zero val-ues beyond the theoretical frequency cutoff; therefore, the Gfunction in the case of the piFP reconstruction is close to zeroin the region of spatial frequencies above f cutoff � 4 NA∕λ.The nonlinear jRL method is not band limited and will pro-duce values above the theoretical frequency cutoff; some ofthese values will lead to errors, which results in a less smoothprofile of the G function.

B. Object-Dependent Resolution Improvement

Simulated reconstructions of the resolution target indicate thatthe resolution improvement achieved with MLE methods canbe object dependent. In order to study this phenomenon, wehave computed the modulation transfer function (MTF),which characterizes the frequency content of the reconstructedimage, in two distinct cases. First, a line with a thickness of onepixel (λ∕16 NA) was used as an object. The MTF was mea-sured by taking the Fourier transform of a line profile in thereconstructed images. Figure 4 displays the resulting MTFcurves for each iteration of the piFP [Fig. 4(a)] algorithmand each fourth iteration of the jRL [Fig. 4(b)] algorithm.These MTF curves represent the frequency content of isolatedobjects in the reconstructed images. The MTFs at the corre-sponding stopping iterations are shown in red. The dotted lineindicates the theoretical frequency cutoff calculated from thepitch of the multi-spot illumination patterns and correspond-ing to 5/3 times the widefield diffraction limit of 2 NA∕λ. Inthe jRL reconstructions, we observe non-zero MTF valuesbeyond the theoretical frequency cutoff of SIM imaging(f cutoff � 4 NA∕λ). Hence, out-of-band frequency recovery

Fig. 2. Quantitative comparison of various MLE methods. TheFWHM is measured for point objects of the reconstructed resolutiontarget, and the SNR is measured in the bright uniform area of thereconstructed resolution target [shown in Fig. 1(a)]. The relation be-tween the SNR and the FWHM displays the trade-off between theimage sharpening and noise amplification.

Fig. 3. Profiles of the relative energy regain function in the cases ofthe piFP and jRL reconstructions are used for assessment of thereconstruction quality.

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is possible for well-separated objects. The reconstruction ofout-of-band information has been previously described inthe context of maximum likelihood deconvolution of widefieldimages and originates from the available prior knowledge of theobject [34].

Next, sine patterns with different spatial frequencies in theinterval �0; 4 NA∕λ� were used as objects. The modulation ofsine patterns in the reconstructed images was measured at the

stopping iteration. The resulting MTF curves represent the fre-quency content of periodic objects in the reconstructed images.The “periodic” MTF curves for the jRL and piFP methods arecompared to their “isolated” counterparts in Fig. 4(c). The piFPmethod resolves periodic and isolated structures equally well,whereas the jRL method provides considerably higher resolu-tion in isolated objects compared to the periodic ones. The dif-ference between the two MTF curves of the jRL method isparticularly evident in the region above the widefield imagingfrequency cutoff f > 2 NA∕λ. The shoulder at the normalizedfrequency of 0.6–0.9 in the “periodic” MTF curve of the jRLmethod is due to the artifact that appears as the edge corrosionand sharpening of the peaks of the sine pattern.

4. EXPERIMENTAL RESULTS

Experimental datasets were acquired using a custom-built SIMsetup: an inverted Olympus IX71 microscope complementedwith a digital micro-mirror device (DMD) in the illuminationpath. Structured illumination is provided by the fast and flex-ible DMD, and fluorescence from the sample is recorded in awidefield mode by the sCMOS camera (Orca Flash 4.0,Hamamatsu Photonics, Japan). Further technical details aboutthe optical design of the microscope can be found in our earlierwork [36]. The following experimental parameters were usedfor imaging: 60 × ∕0.7 objective, 488/520 nm excitation/emis-sion wavelength, 108 nm camera pixel size, and 137 nm DMDpixel size (back-projected to the sample plane). A fixed samplecontaining bovine pulmonary artery endothelial (BPAE) cells,in which F-actin is stained with Alexa Fluor 488 phalloidin(Invitrogen, CA, USA), is chosen as a test object. Multi-spotpatterns with a periodicity of 10 DMD pixels were used to il-luminate the sample. The widefield image obtained by sum-ming up the 100 raw images acquired by the sCMOS cameracontains significant fixed pattern noise, which is found to havea negative impact on the reconstruction. In order to preventthis effect, a uniform object was used as an initial estimateof the high-resolution reconstruction. A comparison of the im-ages reconstructed by the piFP (15 iterations) and the jRL (100iterations) algorithms is given in Fig. 5. Both reconstructed im-ages display resolution improvement compared to the widefieldimage. At the same time, since the structure of the sample isfairly dense, the piFP method provides a slightly higherresolution improvement than the jRL method.

A. Read-Out Noise of the sCMOS Camera

One of the properties of sCMOS cameras is the presence ofpixel-dependent gain, read-out noise and offset. We measuredthe variance of the pixel-dependent read-out noise by taking thevariance of the intensities for each pixel over 103 dark images.The standard deviation of the pixel-dependent read-out noisehas a fixed pattern with a mean value of σ � 1 photo-electronand a number of “hot” pixels (∼0.3% of all camera pixels) witha read-out noise on the order of σ � 8 − 10 photo-electrons. Inorder to examine to what extent the measured read-out noisestandard deviation pattern of the sCMOS camera influencesthe reconstruction, we have tested the performance of the MLEalgorithms with the mixed-noise model (jRL and NR), wherethe uniform Gaussian noise variance was replaced by the

Fig. 4. Development of the MTF curves, which represent the fre-quency content of isolated objects during the (a) piFP and (b) jRLiterations. MTFs at the stopping iterations are shown in red. The dot-ted line indicates the theoretical frequency cutoff corresponding tothe periodicity of the multi-spot illumination patterns. (c) Object-dependent resolution improvement is visualized in the comparisonof the “isolated” and “periodic” MTFs for jRL and piFP algorithms.The MTF of the widefield image is given for reference.

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Fig. 6. jRL reconstructions taking the spatially dependent readout noise variance of the sCMOS camera into account. (a) Reconstruction withPoisson noise assumption. (b) Reconstruction using the mixed-noise assumption with the measured read-out noise variance pattern. Reconstructedimage displays an overall deterioration of the SNR and circular artifacts caused by “hot” pixels in the read-out noise variance pattern (examplesindicated by the yellow arrows). (c) The measured read-out noise standard deviation pattern of the sCMOS camera.

Fig. 5. Comparison of SIM images reconstructed by jRL and piFP algorithms. A fixed sample containing BPAE cells, in which F-actin is stainedwith Alexa Fluor 488 phalloidin, was imaged using a 60 × ∕0.7 air objective with DMD-based multi-spot illumination and sCMOS-based imageacquisition.

Fig. 7. Performance of (c) jRL and (d) piFP algorithms is comparable to the performance of commercial Nikon N-SIM reconstruction (b). A fixedsample containing BPAE cells with labeled microtubules was imaged using a 100 × ∕1.49 objective and an EM-CCD camera with zero read-outnoise. Top row (i) displays sparse part of the image; bottom row (ii) displays dense part of the image. A widefield image (a) is given for comparison.

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measured fixed Gaussian noise variance pattern. As can be seenin Fig. 6, applying the measured fixed noise pattern does notimprove the reconstruction. On the contrary, the overall SNR isdeteriorated and, moreover, “hot” pixels of the read-out noisevariance pattern result in circular artifacts. Hence, the spatiallyvarying readout noise for sCMOS cameras is preferably nottaken into account in the jRL or NR type of MLE algorithms.

B. Comparison to the Performance of CommercialSIM Microscope

Fixed BPAE cells stained with an anti-β-tubulin mouse mon-oclonal antibody for labeling microtubules (Invitrogen, CA,USA) were imaged with a Nikon N-SIM microscope. Imagingwas performed using the 2D SIM mode, 488 nm excitationlaser, 100 × ∕1.49 objective, and an EM-CCD camera withzero read-out noise (Andor iXon 897, Andor Technology,UK). The raw data from a Nikon N-SIM microscope was proc-essed by the jRL and piFP algorithms and compared to thegeneralized Wiener reconstruction provided by the manufac-turer. As can be seen in Fig. 7, the performance of the presentedMLE algorithms is comparable to the performance of the origi-nal N-SIM reconstruction. However, the piFP and jRL algo-rithms produce slightly noisier images with visible edge ringing,since no regularization or apodization was applied in thesealgorithms. The quality of SIM reconstructions depends onthe sparsity of the sample, with dense parts of the sample beingmore strongly affected by noise amplification.

Although from this experiment, there is no apparent advan-tage of using piFP or jRL algorithms for the reconstruction ofthe line SIM data, the benefit of these methods is that theyallow the reconstruction of SIM images acquired under differ-ent types of illumination, such as multi-spot or random(speckle) illumination.

5. CONCLUSION

We formulated a generalized MLE approach to the imagereconstruction problem in SIM, which takes into account bothPoisson and Gaussian noise. The choice of update form in theiterative solution to the MLE problem, the noise model, andthe regularization function define the exact form of the MLEalgorithm. In this work, we focused on two special cases: therecently developed piFP and jRL methods. These algorithmsare based on different noise models and employ different up-dated steps, which led to substantial differences in the charac-teristics of the reconstructed images.

When jRL is applied, the apparent resolution improvementin periodic or dense objects is much smaller than the resolutionimprovement in well-isolated objects, such as sparsely distrib-uted points. This object-dependent resolution improvement isconfirmed by studies of the MTF curves corresponding to thesedifferent types of objects. The MTF curve derived from the lineresponse has higher values than the MTF curve derived fromperiodic objects. The difference is especially pronounced in theregion beyond the widefield frequency cutoff, where jRL pro-vides only marginal resolution improvement for periodic ob-jects. At the same time, in sparse/isolated objects, we observedthe reconstruction of spatial frequencies beyond the theoreti-cally predicted SIM cutoff frequency. Such reconstruction of

out-of-band information is made possible by the prior informa-tion about the object.

In the case of piFPMTF, the curves for isolated and periodicobjects are similar to each other, which leads to the conclusionthat piFP provides uniform resolution improvement. In com-parison to the jRL method, the resolution improvementachieved by applying piFP is lower in isolated objects andhigher in periodic/dense objects.

Reconstruction artifacts are present in both methods. ThepiFP method produces a large amount of non-physical negativevalues and, additionally, results in higher noise amplification,since its MTF curves display higher values in the region be-tween the widefield and SIM cutoff frequencies. The ringingartifact, which is inherent to both methods, can be explainedby the sharp drop in the shape of the piFP MTF curves and thejRL “periodic” MTF curve [37]. Early termination of theiterative process can be used to reduce the ringing effect atthe expense of a smaller resolution improvement. Alternatively,a regularization function can be added to the iterative updatealgorithm.

Computationally, jRL reconstructions take approximately5–10 times longer than piFP reconstructions, since on theorder of 100–300 iterations are required for jRL, whereas5–25 iterations are typically sufficient for piFP.

The final choice of the reconstruction algorithm depends onthe object under study and on the type of noise that is dominantin the images. In the case of very low photon counts, when theread-out noise becomes more significant, the algorithms basedon the assumption of the Poisson noise will not performwell, and algorithms with the Gaussian or mixed noise modelsshould be applied. Finally, a well-matched regularization canenhance the reconstruction, reduce noise amplification, andeliminate artifacts.

Acknowledgment. We would like to thank Jan Keller-Findeisen for the useful comments on this work and JeremieCapoulade for his assistance in acquiring the N-SIM data.We also thank the reviewers of this paper for their valuable sug-gestions. This research is supported by the Dutch TechnologyFoundation STW (http://www.stw.nl/).

†These authors contributed equally to this work.

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