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38
I NSTABILITIES AND SCALE INVARIANCE IN THE GROWTH OF NANOSTRUCTURES : MESOSCOPIC DESCRIPTIONS Rodolfo Cuerno Departamento de Matem ´ aticas & Grupo Interdisciplinar de Sistemas Complejos (GISC) Universidad Carlos III de Madrid [email protected] http://gisc.uc3m.es/cuerno Rodolfo Cuerno, Universidad Carlos III de Madrid Talk delivered at Universit¨ at G¨ ottingen, May 2003

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Page 1: Departamento de Matematicas· & Grupo Interdisciplinar de ... · Rodolfo Cuerno, Universidad Carlos III de Madrid Talk delivered at Universitat¤ Gottingen,¤ May 2003 Can also be

INSTABILITIES AND SCALE INVARIANCE IN THE GROWTH OFNANOSTRUCTURES: MESOSCOPIC DESCRIPTIONS

Rodolfo Cuerno

Departamento de Matematicas &Grupo Interdisciplinar de Sistemas Complejos (GISC)

Universidad Carlos III de [email protected]

http://gisc.uc3m.es/∼cuerno

Rodolfo

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Madrid

Talkdelivered

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ottingen,May

2003

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Sketch of the talk

• Introduction

• Example I: Erosion by ion-beam sputteringJ. M. ALBELLA, C. BALLESTEROS, A.-L. BARABASI, M. CASTRO, R. GAGO,

M. M. GARCIA HERNANDEZ, M. MAKEEV, M. VARELA, L. VAZQUEZ

– Experimental results

– Discrete approach

– Continuum approach

– Discussion

• Example II: Dynamics of steps on vicinal surfacesT. ALA-NISSILA, M. CASTRO, I. KOPONEN, M. RUSANEN

• Conclusions

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Introduction

Systems of nanoscopic dimensions feature:

• Fluctuations: thermal origin or externally driven (flux of aggregating units)

• Instabilities pattern formation

Theory of growth has to study the interplay between both trends

Tools: Non-equilibrium Statistical Mechanics

Focus: Coarse-grained description, sensitive to fluctuation effects

Outcome: Universal properties (scaling of fluctuations); also preasymptotic features,relevant to system specifics

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Example I: Erosion by ion-beam sputtering

Removal of material from surfaces through the impact of energetic particles

θ

x

y

h

Expect “pattern removal” . . .

Employed traditionally for

• film fabrication

• surface and depth microanalysis

• surface cleaning and micromachining

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Pattern formation �

�θ 6= 0 =⇒ ripples

HABENICHT ET AL, PRB ‘99: 5 keV Xe+ graphite RUSPONI ET AL, PRL ‘98: 1 keV Ar+ Cu(110)

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� �

� �θ≡

0=⇒

dots

FAC

SK

OE

TA

L,P

RB

‘02:

Ar+

GaS

b

FAC

SK

OE

TA

L,S

cien

ce‘9

9:42

0eV

Ar+

GaS

b

Rodolfo Cuerno, Universidad Carlos III de Madrid Talk delivered at Universitat Gottingen, May 2003

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Also obtained on Si

GAGO ET AL, APL ‘01: 1.2 keV Ar+ Si

Times: 6 min [(a): 1 × 1 µm2]; 960 min [(b): 3 × 3 µm2]

(c), (d): two-dimensional autocorrelation functions over 400 × 400 µm2 areas

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GA

GO

ET

AL

,APL

‘01:

1.2

keV

Ar+

Si

Rodolfo Cuerno, Universidad Carlos III de Madrid Talk delivered at Universitat Gottingen, May 2003

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Can also be obtained for rotating targets and θ 6= 0

FROST ET AL, PRL ‘00: 500 eV Ar+ InPTimes: 10 s (a); 40 s (b); 9600 s (c)

(d) two-dimensional autocorrelation function

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Microscopic approach

Highly complex many-body process

Typical scales in Molecular Dynamics

• Time ≈ 10−1 – 102 ps

• Length ≈ 10 – 100 A

• Number of atoms ≈ 105

Typical scales in experiments

• Time ≈ 1 – 103 s

• Length ≈ 10 – 100 nm

BRINGA ET AL, PRB ‘01: MD simulation 100 keV Xe onto Au

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Kinetic Monte Carlo

Trans. probabilities W (conf → conf ′) =∑N

a=1 RaV a(conf → conf ′)

KOPONEN ET AL, PRB ‘96: 5 keV Ar onto carbon

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Typical scales in kinetic Monte Carlo

• Time ≈ 1 µs (≈ 106 cascades)

• Length ≈ 30 nm

KOPONEN ET AL, PRL ‘97: kMC simulation 5 keV Ar onto carbon

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More coarse-grained approaches

E(x′, y′, z′) =ε

(2π)3/2σµ2exp

(

− (z′ + a)2

2σ2− x′2 + y′2

2µ2

)

“Linear cascade” approximation, P. SIGMUND, PR (1969)

Erosion probability ∝ Total energy

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(a)

3M

Lre

mov

ed

(b)

30M

L

(c)

300

ML

(d)

104

ML

HA

RT

MA

NN

ET

AL

,PR

B‘0

2

Rodolfo Cuerno, Universidad Carlos III de Madrid Talk delivered at Universitat Gottingen, May 2003

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Mesoscopic description

Goal: Compute local erosion velocity

v =∂h

∂t= V(ϕ, a, µ, σ, T, J, . . .)

σ

µ

P

Incident Ionh(x,y) O

a E(x′, y′, z′) = ε(2π)3/2σµ2

exp(

− (z′+a)2

2σ2 − x′2+y′2

2µ2

)

v = p

R

drΦ(r) E(r)

Perform expansion for small slopes |∇h| � 1

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Two important facts:

b) concave

a) convex

BeamIon

A

A’

ϕϕ’

• Surface features are amplified instability

• Effective angle of incidence varies across the surface

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�Surface diffusion (MULLINS, HERRING ‘50’s)

~ = −∇µ

µ ∝ κ (curvature) ' −∇2h

∂h

∂t= −∇ · ~

= −∇ · (∇∇2h) = −∇4h

In general κ may be anisotropic (metals)�

�Noise∂h

∂t= F(h,∇h, . . .) + η(r, t)

〈η〉 = J (flux)

〈η(r, t)η(r′, t′)〉 ' J δ(r− r′) δ(t − t′)

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Full dynamics(Anisotropic, stochastic) Kuramoto-Sivashinsky equation

∂h

∂t= νx∂2

xh + νy∂2yh

︸ ︷︷ ︸

“surface tension”

−Dxx∂4xh − Dyy∂4

yh − Dxy∂2x∂2

yh︸ ︷︷ ︸

“surface diffusion”

+ λx(∂xh)2 + λy(∂yh)2︸ ︷︷ ︸

lateral growth

�Comments

• All coefficients (νx, Dxx, λx) are functions of parameters θ, a, σ, µ, T , J .

• νy < 0 ∀θ (⇒ instability); νx changes sign with θ

• Dij = dij + Kij with{

dij ∝ ε, indep. of T

Kij ∝ 1T exp(−Eij/kBT )

• For θ = 0 symmetry is restored in (x, y) plane⇒ νx = νy; λx = λy; dxx = dyy; dxy = 0

• νi, Dij , λk ∝ ε

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Linear theory for θ 6= 0

∂h

∂t= −|ν|∇2h − D∇4h

h(k, t) ∝ exp(ωkt)

ωk = |ν|k2 − Dk4

There exists k∗ ≡√

|ν|/D such that:

k > k∗ stable modes

k < k∗ unstable modes

k0 = k∗/√

2 has a maximal growth rate ωk0

The amplitude of k0 dominatesexponentially fast ⇒ dot structure

No hexagonal ordering

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Linear theory for θ 6= 0(Bradley & Harper, JVSTA ‘88)

h(k, t) ∝ exp[(−νxk2

x + |νy|k2y −Kk4)t

]

Small θ: νx < νy < 0

Large θ: νy < νx and νy < 0

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Rodolfo Cuerno, Universidad Carlos III de Madrid Talk delivered at Universitat Gottingen, May 2003

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Effects of anisotropy

COSTANTINI ET AL, JPC ‘01: 1 keV Ar+ Ag(110)

When surface diffusion is thermally activated(dij = 0), anisotropies [Eij(T )] allow selectionof ripple direction by tuning T

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Limitations of BH (linear) theory

The actual surface (rms) roughness saturates with time, rather than diverge exponentially

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�� 6 � � 7 �� 8 �� 9: "3 ;# - -# " ; '( & )

< => ?@

AB C

DE FG � �IH

GAGO ET AL, APL ‘02: 1.2 keV Ar, Si ERLEBACHER ET AL, JVSTA ‘00: 750 eV Ar, Si

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Limitations of BH (linear) theory

The actual ripple amplitude coarsens with time, rather than stay constant

HABENICHT ET AL, PRB ‘02: 30 keV Ga onto Si

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Non-linear dynamics (θ 6= 0)�

�λxλy > 0

λLn| |

Ln

W2

τ

(a)

40000 500003000020000100000

PARK ET AL, PRL ‘99

Crossover time τ = onset for kinetic roughening

ν∂xh ∼ λ(∂xh)2 ⇒ ν W0

`2 ∼ λW 2

0

`2 ⇒ W0 ∼ ν/λ

W0 ∼ exp(ντ/`2)

⇒ τ ∼ K

ν log(ν/λ)

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Kinetic roughening

JK L M JK L N J K L O JK L P

JK L PJK Q

JK PJK O

JK NJK M

JK RJK S

JK TJK U

JK VJK P Q

JK P P

WYX

Z Z[ Z[ [ Z[ [ [[Z

\]

^_`abc

deefc

g hij k l lmn lo pm q p or s

tuv r wv xm qy z Z[ {|~} p � � s

Z[ � Z[ � Z[ � Z[ �� l} �m w wm j l � qr p s

� �� �

��� �

�� �� L P��

GAGO ET AL, APL ‘02: Ar onto Si

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Kinetic roughening (2)

0.1 1k

102

103

104

105

106

S(k,

t)

t=9.3x107

t=2.5x105

t=2.7x104

t=9.2x103

parallel

HABENICHT ET AL, PRB ‘99: 5 keV Xe+ graphite HARTMANN ET AL, PRB ‘02: MD simulations

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�λxλy < 0 Ripples prevail with large roughness: shadowing effects may be relevant

PARK ET AL, PRL ‘99

GAGO ET AL, Nanotechnol. ‘02

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Non-linear dynamics (θ = 0)

Dots are formed, but not with the proper ordering

KAHNG ET AL, APL ‘01

FACSKO ET AL ‘00

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Other sputtered systems might be described by the nKS equation:

Amorphous carbon films (KOPONEN ET AL, JAP ‘97)

Ge bombarded at low energy (CHEY ET AL, PRB ‘95)

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Other sputtered systems might be described by the nKS equation:Si within a magnetron (with M. CASTRO, M. G. HERNANDEZ, L. VAZQUEZ)R

odolfoC

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IIIdeM

adridTalk

deliveredatU

niversitatGottingen,M

ay2003

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(M.C

AS

TR

O)

Cel

l(“d

ot”)

coar

seni

ng

Dot

stat

istic

s!

rele

vanc

eof

nois

e

Rodolfo Cuerno, Universidad Carlos III de Madrid Talk delivered at Universitat Gottingen, May 2003

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Continuum description of IBS (a summary)

• Full dynamic equation cannot be described out of symmetry arguments:(cf. ∂th = |ν|∂2

xh + λ(∂xh)2 + η, Kardar, Parisi, Zhang)

• (Qualitative) Agreement in terms of energy and flux dependencies(for thermally suppressed diffusion)

• Agreement in terms of pattern formation + stabilization

• Universality class for kinetic roughening? (need extremely long experiments)

• Disagreements:Dot formation:

– In-plane ordering

Ripple formation:

– Wavelength coarsening

• Mechanisms not considered thus far may play a role(viscous flow, shadowing effects, . . .)

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Example II: step dynamics on vicinal surfaces

Vicinal surface: orientation close to that of a high symmetry surface steps

Steps have equilibrium roughness, that can be characterizedWANG ET AL. ‘90 TUNG ET AL. ‘90

d) Si [2 1 1]; (e) 1 ML; (f) 2 ML

Under growth conditions, steps move and their roughness evolves

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Negligible nucleation: step flow

j-1j+1

j

x

y

F

Adatom density c(r, t) on terrace

∂c∂t

= D∇2c − cτ + J −∇ · q + j

q = fluctuations in diffusion current

j = flucts. adsorption/desorption

Attachment/dettachment at steps

±n · (D∇c − q)|step = k±(c − ceq + j±)

+ = at ascending step

− = at desdending step

k± = kinetic coeffs. for attachment

Velocity v · n = n · (D∇c− q)|+ − n · (D∇c− q)|− +[∇2

sκs

]

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EHRLICH-SCHWOEBEL barrier ⇒ instability

If attachment depends on side of step (k+ 6= k−) ⇒ meandering instability in step profile

stepmotion

BALES, ZANGWILL, PRB ‘90

Protrusions “screen” indentationsAnalogous to Mullins-Sekerka instabilityin solidification (snowflakes)

Evolution equation for a single step is the Kuramoto-Sivashinsky equation(KARMA, MISBAH, PIERRE-LOUIS, . . ., late 90’s)

Can be generalized to trains of steps, no desorption, etc.

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MAROUTIAN ET AL, PRB ‘01: Cu (1 1 17) SAITO & UWAHA, PRB ‘94: kinetic MC

Agreement is not complete though (wavelength dependence with flux, . . .) further work is needed

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Conclusions

• Tools developed in the study of non-equilibrium systems can be employed for thestudy of growth systems with nanometer size features (growth, erosion, microfluids)

• Although the formalism is adapted to the study of asymptotic properties(esp. in the case of scale invariance), equations cannot be derived merely fromsymmetry arguments

• Careful attention must be paid to system specifics

• Still, advantage can be taken from developments on universal or generic models.Specifically, the latter studies can assess parameter regions for pattern formation, ore.g. surface disordering

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