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Chapter 3: Optical Devices Detectors for Optical Communications Optical Communications: Circuits, Systems and Devices Sep 2012 Sharif University of Technology 1 lecturer: Dr. Ali Fotowat Ahmady

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  • Chapter 3: Optical Devices

    Detectors for Optical Communications

    Optical Communications: Circuits, Systems and Devices

    Sep 2012 Sharif University of Technology 1

    lecturer: Dr. Ali Fotowat Ahmady

  • Photo Detectors

    • All detectors for optical communications use optical absorption in a depletion region to convert photons into electron-hole pairs, and then sense the number of pairs.

    - Because of the electric field in the depletion region, the electron-hole pairs give rise to a photocurrent, Ip- One figure of merit is the responsivity, defined as the ratio of the

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 2

    p- One figure of merit is the responsivity, defined as the ratio of the photocurrent to the optical power, Pin:

    where ηQ = quantum efficiency and q = charge generated per photon

    p Q Q

    in

    I q qR

    P hvη η

    ω= = =

    helectron-hole pair generation rate

    photon incident rateQη =

    (units: A/W)

  • Detector Materials

    • Bandgaps and emission wavelengths (at 300◦ K) of semiconductors used as detectors for optical communications

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 3

  • Characteristics of Light Detectors (1 of 2)

    • Responsitivity: Is a measure of the conversion efficiency of a photodetector.

    e = electron charge (1.6×10-19 coulomb)v = frequency of the light

    Chapter 3 Optical Devices Detectors

    [A/W]e GRhην

    =

    Sep 2012 Sharif University of Technology 4

    v = frequency of the lightη = quantum efficiencyG = internal gain (>1 for APD)

    • Dark current: The leakage current that flows through a photodiode with no light input. Thermally generated.

  • Characteristics of Light Detectors (2 of 2)

    • Transit time: The time it takes a light-induced carrier to travel across the depletion region of a semiconductor. This parameter determines the maximum bit rate possible with a particular photodiode.

    • Light sensitivity: The minimum optical power a light detector can receive

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 5

    and still produce a usable electrical output signal.

    • Spectral response: The range of wavelength values that a given photodiode will respond.

  • Types of Optical Detectors

    • p-n photodiodes- Electron-hole pairs are created in the depletion region of a p-n junction in proportion to the optical power- Electrons and holes are swept out by the electric field, leading to a current

    • p-i-n photodiodes

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 6

    • p-i-n photodiodes- Electric field is concentrated in a thin intrinsic (i) layer

    • Avalanche photodiodes- Like p-i-n photodiodes, but have an additional layer in which an average of M secondary electron-hole pairs are generated through impact ionization for each primary pair

    ◦ Leads to a responsivityqR M ηω

    =h

  • p-n Photodiodes

    • Operated in reverse-biased regime for detection, instead of forward-biased regime for emission• Wide depletion region

    - Advantage: High quantum efficiency- Problem: Diffusion of carriers created in the boundary p and n regions limits the detector bandwidth

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 7

    regions limits the detector bandwidth- Problem: Transit time across the depletion region also limits the detector bandwidth- RC time constant:

    τRC = (RL + Rs)CpRL = load resistance, Rs = internal series resistance, Cp = parasitic capacitance

  • Photoconductive vs. Photovoltaic Operation

    • Photoconductive regime: Reverse-biased• Photovoltaic regime: Unbiased

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 8

    Current-voltage characteristic curves for a silicon photodetector

  • p-i-n Photodiodes

    • Basic idea: Eliminate diffusion of carriers created outside the depletion region by:

    - Sandwiching a thin layer of a different semiconductor material (of intrinsic conductivity) between the outer p and n layers- Choosing the outer p and n layers to be transparent to light in the working wavelength range

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 9

    working wavelength range• Typical sensitivities for a BER of 10−10 are:−26 dBm at a bit rate B = 2.5Gb/s, or −18 dBm at a bit rate B = 10Gb/s

  • InGaAs p-i-n DC Responsivity vs. Wavelength

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 10

  • p-i-n Sensitivity vs. Bit Rate

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 11

  • Load-Line Analysis of a p-i-n Circuit

    • Photoconductive regime: Voltage across load resistor is proportional to optical power

    - For optical powers above a certain critical value (40 μW in this example), the voltage across the load grows very slowly as a function of optical power

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 12

    (a) simple PIN circuit. (b) Graphical analysis of the circuit

  • Noise in PIN Diodes

    • Shot noise (Poisson process ~ Gaussian)

    - R is responsivity of detector- Be is electrical BW of detector (typically between BR and ½ BR)

    • Thermal noise (Gaussian process)

    Chapter 3 Optical Devices Detectors

    2 ( ) 2 s ei t eIB I RP= =

    Sep 2012 Sharif University of Technology 13

    • Thermal noise (Gaussian process)

    - Fn is the noise figure of front-end amplifier, typically 3-5 dB• Total noise power

    2 4( ) Bt n eL

    k Ti t F BR

    =

    ( )2 2 2( ) ( )s tI i t i t∆ = +

  • Avalanche Photodiodes (1 of 2)

    • Internal gain- Electron-hole pairs created by absorption of photons are accelerated to energies at which more pairs are created, and then the new pairs are accelerated and create more pairs, in an “avalanche”

    ◦ Overall gain is M pairs generated for each pair created optically

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 14

    optically

    where vd = reverse bias voltage, VBR = breakdown voltage, and n > 1

    - Avalanche multiplication creates excess noise- Noise scales nonlinearly with M, while the signal scales linearly

    ( )1

    1 nd BRM

    v V≈

  • Avalanche Photodiodes (2 of 2)

    - Therefore there’s an optimal value, Mopt◦ Typically 3 < Mopt < 9

    - Much better signal-to-noise ratio than with external amplification

    • Typical sensitivities for a BER of 10−10 are:−32 dBm at a bit rate B = 2.5Gb/s, or −22 dBm at a bit rate B = 10Gb/s

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 15

    −32 dBm at a bit rate B = 2.5Gb/s, or −22 dBm at a bit rate B = 10Gb/s

  • Noise in APD

    • Shot noise

    Chapter 3 Optical Devices Detectors

    ( )

    ( )( )

    2

    1

    ( ) 2

    ( ) 1 2

    s e m A m

    m

    A m m G

    i t eRPB G F G

    I G RP

    F G Gβ βα α

    =

    =

    = + − −

    Sep 2012 Sharif University of Technology 16

    - Where FA is the excess noise factor - InGaAs detectors typically have β/α =0.7

    ( )( )( ) 1 2 mA m m GF G Gα α= + − −

  • Comparisons

    • PIN gives higher bandwidth and bit rate• APD gives higher sensitivity• Si works only up to 1100 nm; InGaAs up to 1700, Ge up to 1800

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 17

    An APD typically has 10dB better sensitivity than a PIN

  • Questions

    Chapter 3 Optical Devices Detectors

    Sep 2012 Sharif University of Technology 18