doc.: ieee 15-04-0452-01-004a submission september 2004 chia-chin chong, samsung (sait)slide 1...
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September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 1
doc.: IEEE 15-04-0452-01-004a
Submission
Project: IEEE P802.15 Working Group for Wireless Personal Area Networks (WPANs)Project: IEEE P802.15 Working Group for Wireless Personal Area Networks (WPANs)
Submission Title: [UWB Channel Model for Indoor Residential Environment]Date Submitted: [16 September, 2004]Source: [Chia-Chin Chong, Youngeil Kim, SeongSoo Lee] Company [Samsung Advanced Institute of Technology (SAIT)]Address [RF Technology Group, Comm. & Networking Lab., P. O. Box 111, Suwon 440-600, Korea.]Voice:[+82-31-280-6865], FAX: [+82-31-280-9555], E-Mail: [[email protected]]
Re: [Response to Call for Contributions on IEEE 802.15.4a Channel Models]
Abstract: [This contribution describes the UWB channel measurement results in indoor residential environment based in several types of high-rise apartments. It consists of detailed characterization of both the large-scale and small-scale parameters of the channel such as frequency-domain parameters, temporal-domain parameters, small-scale amplitude statistics and S-V clustering multipath channel parameters of the UWB channel with bandwidth from 3 to 10 GHz.]
Purpose: [Contribution towards the IEEE 802.15.4a Channel Modeling Subgroup.]
Notice: This document has been prepared to assist the IEEE P802.15. It is offered as a basis for discussion and is not binding on the contributing individual(s) or organization(s). The material in this document is subject to change in form and content after further study. The contributor(s) reserve(s) the right to add, amend or withdraw material contained herein.Release: The contributor acknowledges and accepts that this contribution becomes the property of IEEE and may be made publicly available by P802.15.
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 2
doc.: IEEE 15-04-0452-01-004a
Submission
UWB Channel Model for Indoor Residential Environment
Chia-Chin Chong, Youngeil Kim, SeongSoo Lee
Samsung Advanced Institute of Technology (SAIT), Korea
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 3
doc.: IEEE 15-04-0452-01-004a
Submission
Outline
• Measurement Setup & Environment• Data Analysis & Post-Processing• Measurement Results• Large-Scale Parameters• Small-Scale Parameters• Conclusion
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 4
doc.: IEEE 15-04-0452-01-004a
Submission
Measurement Setup (1)
• Frequency domain technique using VNA– Center frequency, fc : 6.5GHz
– Bandwidth, B : 7GHz (i.e. 3-10GHz)– Delay resolution, : 142.9ps (i.e. =1/B)– No. frequency points, N : 1601– Frequency step, f : 4.375MHz (i.e. f=B/(N-1))
– Max. excess delay, max : 229.6ns (i.e. max=1/f)
– Sweeping time, tsw : 800ms
– Max. Doppler shift, fd,max : 1.25Hz (i.e. fd,max=1/tsw)
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 5
doc.: IEEE 15-04-0452-01-004a
Submission
Measurement Setup (2)
• UWB planar dipole antennas• Measurement controlled by laptop with LabVIEW via
GPIB interface• Calibration performed in an anechoic chamber with
1m reference separation• Static environment during recording• Both large-scale & small-scale measurements
– Large-scale: different RX positions “local point”– Small-scale: 25 (5x5) grid-measurements around each local
point “spatial point”– At each spatial point, 30 time-snapshots of the channel
complex frequency responses are recorded
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 6
doc.: IEEE 15-04-0452-01-004a
Submission
Power Amplifier(Agilent 83020A)
Vector network analyzer(Agilent 8722ES) Low Noise Amplifier
(Miteq AFS5)
Measurement Setup (3)
Attenuator(Agilent 8496B)
Propagation ChannelCoaxial Cables
Laptop with LabVIEW
GPIB Interface
TX antenna RX antenna
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 7
doc.: IEEE 15-04-0452-01-004a
Submission
UWB Planar Dipole Antenna
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 8
doc.: IEEE 15-04-0452-01-004a
Submission
Measurement Environment
• Measurements in various types of high-rise apartments based on several cities in Korea typical types in Asia countries like Korea, Japan, Singapore, Hong Kong, etc.– 3-bedrooms (Apart1)– 4-bedrooms (Apart2)
• Both LOS and NLOS configurations• TX-RX antennas:
– Separations: up to 20m– Height: 1.25m (with ceiling height of 2.5m)– TX antenna: always fixed in the center of the living room– RX antenna: moved around the apartment (i.e. 8-10 locations)
• 12,000 channel complex frequency responses are collected (i.e. 2 apartments x 8 RX local points x 25 spatial points x 30 time snapshots 2x8x25x30=12,000)
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 9
doc.: IEEE 15-04-0452-01-004a
Submission
3-Bedroom Apartment
Grid-Measurement
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 10
doc.: IEEE 15-04-0452-01-004a
Submission
4-Bedroom Apartment
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 11
doc.: IEEE 15-04-0452-01-004a
Submission
Data Analysis & Post-Processing
• All measurement data are calibrated with the calibration data measured in anechoic chamber to remove effect of measurement system
• Perform frequency domain windowing to reduce the leakage problem
• Complex passband IFFT is deployed to transform the complex frequency response to complex impulse response
• Perform temporal domain binning before extract channel parameters
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 12
doc.: IEEE 15-04-0452-01-004a
Submission
Channel Model Description
• Large-Scale Parameters:– Path loss and Shadowing– Frequency Decaying Factor
• Small-Scale Parameters:– Temporal Domain Parameters – S-V Multipath Channel Parameters– Small-Scale Amplitude Statistics
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 13
doc.: IEEE 15-04-0452-01-004a
Submission
Path Loss and Shadowing
• Path loss (PL) vs. Distance (d):
– d0 = 1m
– PL0 : intercept
– n : path loss exponent– S : Shadowing fading parameter
• Perform linear regression to the above equation with measured data to extract the required parameters
( ) 0 10 00
10 log ;d
PL d PL n S d dd
æ ö÷ç ÷= + × × + ³ç ÷ç ÷çè ø
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 14
doc.: IEEE 15-04-0452-01-004a
Submission
Path Loss vs. Distance – LOS
0 1 2 3 4 5 6 7 848
50
52
54
56
58
60
10log10
(Distance) (m)
Pat
h L
oss
(d
B)
Path Loss under LOS Scenario in 3-Bedroom Apartment
DataLinear Regression
0 1 2 3 4 5 6 7 845
50
55
60
65
70Path Loss under LOS Scenario in 4-Bedroom Apartment
10log10
(Distance) (m)
Pa
th L
os
s (
dB
)
DataLinear Regression
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 15
doc.: IEEE 15-04-0452-01-004a
Submission
Path Loss vs. Distance – NLOS
0 1 2 3 4 5 6 7 8 940
45
50
55
60
65
10log10
(Distance) (m)
Pa
th L
os
s (
dB
)
Path Loss under NLOS Scenario in 3-Bedroom Apartment
DataLinear Regression
0 1 2 3 4 5 6 7 8 945
50
55
60
65
70
75
80
10log10
(Distance) (m)
Pa
th L
os
s (
dB
)
Path Loss under NLOS Scenario in 4-Bedroom Apartment
DataLinear Regression
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 16
doc.: IEEE 15-04-0452-01-004a
Submission
Frequency Decaying Factor
• Path loss (PL) vs. Frequency (f):
or
( ) ( )1expPL ff dµ - ×
( ) 2PL ff d-µ
(Method 1)
(Method 2)
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 17
doc.: IEEE 15-04-0452-01-004a
Submission
Frequency Decaying Factor – LOS
3 4 5 6 7 8 9 10-60
-50
-40
-30
-20
-10
0Frequency Dependence Path Loss under LOS Scenario (3-Bedroom Apartment)
Frequency [GHz]
Pa
th L
oss
[dB
]
Measurement DataMethod 1Method 2
3 4 5 6 7 8 9 10-45
-40
-35
-30
-25
-20
-15
-10
-5
0Frequency Dependence Path Loss under LOS Scenario (4-Bedroom Apartment)
Frequency [GHz]
Pa
th L
oss
[dB
]
Measurement DataMethod 1Method 2
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 18
doc.: IEEE 15-04-0452-01-004a
Submission
Frequency Decaying Factor – NLOS
3 4 5 6 7 8 9 10-60
-50
-40
-30
-20
-10
0Frequency Dependence Path Loss under NLOS Scenario - (3-Bedroom Apartment)
Frequency [GHz]
Pa
th L
oss
[dB
]
Measurement DataMethod 1Method 2
3 4 5 6 7 8 9 10-50
-45
-40
-35
-30
-25
-20
-15
-10
-5
0Frequency Dependence Path Loss under NLOS Scenario (4-Bedroom Apartment)
Frequency [GHz]
Pa
th L
oss
[dB
]
Measurement DataMethod 1Method 2
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 19
doc.: IEEE 15-04-0452-01-004a
Submission
Large-Scale Parameters
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 20
doc.: IEEE 15-04-0452-01-004a
Submission
Temporal Domain Parameters
• These parameters were obtained after taking frequency domain Hamming windowing, passband IFFT & temporal domain binning
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 21
doc.: IEEE 15-04-0452-01-004a
Submission
S-V Multipath Channel (1)
• Saleh-Valenzuela (S-V) channel model is given by
– L : number of clusters lth cluster– Kl : number of MPCs within the – ak,l : multipath gain coefficent of the kth component in lth
cluster– Tl : delay of the lth cluster k,l : delay of the kth MPC relative to the to the lth cluster
arrival time
( ) ( ), ,0 0
lL K
k l l k ll k
h t a t Td t= =
= - -å å
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 22
doc.: IEEE 15-04-0452-01-004a
Submission
S-V Multipath Channel (2)
• Cluster arrival times Poisson distribution
• Ray arrival times Poisson distribution
: mean cluster arrival rate : mean ray arrival rate
( ) ( )[ ]1 1| exp , 0l l l lp l- -T T = L - L T - T >
( ) ( )[ ], ( 1), , ( 1),| exp , 0k l k l k l k lp kt t l l t t- -= - - >
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 23
doc.: IEEE 15-04-0452-01-004a
Submission
S-V Multipath Channel (3)
• Average power of a MPC at a given delay, Tl + k,l
– : expected value of the power of the first arriving MPC : cluster decay factor : ray decay factor
,2 2, 0,0 e el k lk la a
t g- T G -= × ×
20,0a
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 24
doc.: IEEE 15-04-0452-01-004a
Submission
Cluster Decay Factor, – LOS
0 10 20 30 40 5010
-3
10-2
10-1
100
101
Normalized Cluster Relative Power vs. Cluster Relative Delay (Apart1-LOS)
Cluster Relative Delay, [ns]
No
rma
lize
d C
lust
er
Re
lativ
e A
mp
litu
de
= 22.10 ns
Cluster amplitudeLinear least-squares fit
0 10 20 30 40 50 6010
-4
10-3
10-2
10-1
100Normalized Cluster Relative Power vs. Cluster Relative Delay (Apart2-LOS)
Cluster Relative Delay, [ns]
No
rma
lize
d C
lust
er
Re
lativ
e A
mp
litu
de
= 23.95 ns
Cluster amplitudeLinear least-squares fit
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 25
doc.: IEEE 15-04-0452-01-004a
Submission
Cluster Decay Factor, – NLOS
0 20 40 60 80 100 12010
-6
10-4
10-2
100
102Normalized Cluster Relative Power vs. Cluster Relative Delay (Apart1-NLOS)
Cluster Relative Delay, [ns]
No
rma
lize
d C
lust
er
Re
lativ
e P
ow
er
= 51.47 ns
Cluster powerLinear least-squares fit
0 10 20 30 40 50 60 7010
-5
10-4
10-3
10-2
10-1
100
101Normalized Cluster Relative Power vs. Cluster Relative Delay (Apart2-NLOS)
Cluster Relative Delay, [ns]
No
rma
lize
d C
lust
er
Re
lativ
e P
ow
er
= 36.86 ns
Cluster powerLinear least-squares fit
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 26
doc.: IEEE 15-04-0452-01-004a
Submission
Ray Decay Factor, – LOS
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 27
doc.: IEEE 15-04-0452-01-004a
Submission
Ray Decay Factor, – NLOS
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 28
doc.: IEEE 15-04-0452-01-004a
Submission
Cluster Arrival Rate, – LOS
0 5 10 15 20-6
-5
-4
-3
-2
-1
0Cluster Inter-Arrival Times CCDF (Apart1-LOS)
Clsuter Inter-Arrival Times, T [ns]
ln(C
CD
F)
1/ = 8.69 ns
Cluster inter-arrival timesLinear least-squares fit
0 10 20 30 40 50 60-6
-5
-4
-3
-2
-1
0Cluster Inter-Arrival Times CCDF (Apart2-LOS)
Clsuter Inter-Arrival Times, T [ns]
ln(C
CD
F)
1/ = 11.79 ns
Cluster inter-arrival timesLinear least-squares fit
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 29
doc.: IEEE 15-04-0452-01-004a
Submission
Cluster Arrival Rate, – NLOS
0 10 20 30 40 50 60 70 80-7
-6
-5
-4
-3
-2
-1
0Cluster Inter-Arrival Times CCDF (Apart1-NLOS)
Clsuter Inter-Arrival Times, T [ns]
ln(C
CD
F)
1/ = 21.45 ns
Cluster inter-arrival timesLinear least-squares fit
0 5 10 15 20 25 30 35 40-6
-5
-4
-3
-2
-1
0Cluster Inter-Arrival Times CCDF (Apart2-NLOS)
Clsuter Inter-Arrival Times, T [ns]
ln(C
CD
F)
1/ = 15.65 ns
Cluster inter-arrival timesLinear least-squares fit
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 30
doc.: IEEE 15-04-0452-01-004a
Submission
Ray Arrival Rate, – LOS
0 5 10 15-18
-16
-14
-12
-10
-8
-6
-4
-2
0Ray Intra-Arrival Times CCDF (Apart2-LOS)
Ray Intra-Arrival Times, [ns]
ln(C
CD
F)
1/ = 0.86 ns
Ray intra-arrival timesLinear least-squares fit
0 2 4 6 8 10 12-25
-20
-15
-10
-5
0Ray Intra-Arrival Times CCDF (Apart1-LOS)
Ray Intra-Arrival Times, [ns]
ln(C
CD
F)
1/ = 0.51 ns
Ray intra-arrival timesLinear least-squares fit
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 31
doc.: IEEE 15-04-0452-01-004a
Submission
Ray Arrival Rate, – NLOS
0 5 10 15 20 25 30 35-50
-45
-40
-35
-30
-25
-20
-15
-10
-5
0Ray Intra-Arrival Times CCDF (Apart1-NLOS)
Ray Intra-Arrival Times, [ns]
ln(C
CD
F)
1/ = 0.72 ns
Ray intra-arrival timesLinear least-squares fit
0 2 4 6 8 10 12 14 16-30
-25
-20
-15
-10
-5
0Ray Intra-Arrival Times CCDF (Apart2-NLOS)
Ray Intra-Arrival Times, [ns]
ln(C
CD
F)
1/ = 0.56 ns
Ray intra-arrival timesLinear least-squares fit
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 32
doc.: IEEE 15-04-0452-01-004a
Submission
Mixture Poisson Distribution
• Fitting the ray arrival times to a mixture of 2 Poisson distributions similar to [1]:
: mixture probability 1 & 2: ray arrival rates
( ) ( )[ ]( ) ( )[ ]
, ( 1), 1 1 , ( 1),
2 2 , ( 1),
| exp
1 exp
k l k l k l k l
k l k l
p t t bl l t t
b l l t t
- -
-
= - -
+ - - -
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 33
doc.: IEEE 15-04-0452-01-004a
Submission
Mixture Poisson Distributions – LOS
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 34
doc.: IEEE 15-04-0452-01-004a
Submission
Mixture Poisson Distributions – NLOS
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 35
doc.: IEEE 15-04-0452-01-004a
Submission
Number of Clusters
1 2 3 4 5 60
0.1
0.2
0.3
0.4Apart1-LOS
No. of Clusters
Pro
ba
bili
ty
2 3 4 5 6 7 80
0.1
0.2
0.3
0.4Apart1-NLOS
No. of Clusters
Pro
ba
bili
ty
1 2 3 40
0.2
0.4
0.6
0.8Apart2-LOS
No. of Clusters
Pro
ba
bili
ty
1 2 3 4 50
0.2
0.4
0.6
0.8Apart2-NLOS
No. of Clusters
Pro
ba
bili
ty
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 36
doc.: IEEE 15-04-0452-01-004a
Submission
Number of MPCs per Cluster
0 50 100 150 2000
0.5
1
No. of MPCs per Cluster
CD
F
Apart1-LOS
0 500 10000
0.5
1
No. of MPCs per Cluster
CD
F
Apart1-NLOS
0 100 200 3000
0.5
1
No. of MPCs per Cluster
CD
F
Apart2-LOS
0 500 1000 15000
0.5
1
No. of MPCs per Cluster
CD
F
Apart2-NLOS
Empirical Data
Exponential Fit
Empirical Data
Exponential Fit
Empirical Data
Exponential Fit
Empirical Data
Exponential Fit
Kl
= 24.10Kl
= 24.10Kl
= 24.10 Kl
= 87.19
Kl
= 30.47 Kl
= 117.36
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 37
doc.: IEEE 15-04-0452-01-004a
Submission
S-V Multipath Channel Parameters
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 38
doc.: IEEE 15-04-0452-01-004a
Submission
Small-Scale Amplitude Statistics
• Comparison of empirical path amplitude distribution with the following five commonly used theoretical distributions:– Lognormal– Nakagami– Rayleigh– Ricean– Weibull
• The goodness-of-fit of the received signal amplitudes is evaluated using Kolmogorov-Smirnov (K-S) test & Chi-Square (2) test with 5% and 10% significance level, respectively.
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 39
doc.: IEEE 15-04-0452-01-004a
Submission
Goodness-of-Test: LOS
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 40
doc.: IEEE 15-04-0452-01-004a
Submission
Goodness-of-Test: NLOS
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 41
doc.: IEEE 15-04-0452-01-004a
Submission
CDF of Path Amplitude – LOS
-120 -100 -80 -60 -40 -20 00
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Amplitude in dB
CD
F
Small-scale amplitude CDFs at different exces delays (3-bedroom apartment, LOS)
EmpiricalLognormalNakagamiRayleighWeibull
Excess delay 5ns
Excess delay 50ns
Excess delay 100ns
-120 -100 -80 -60 -40 -20 00
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Amplitude in dB
CD
F
Small-scale amplitude CDFs at different exces delays (4-bedroom apartment, LOS)
EmpiricalLognormalNakagamiRayleighWeibull
Excess delay 100ns
Excess delay 5ns
Excess delay 50ns
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 42
doc.: IEEE 15-04-0452-01-004a
Submission
CDF of Path Amplitude – NLOS
-120 -100 -80 -60 -40 -20 0 200
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Amplitude in dB
CD
F
Small-scale amplitude CDFs at different exces delays (3-bedroom apartment, NLOS)
EmpiricalLognormalNakagamiRayleighWeibull
Excess delay 100ns
Excess delay 5ns
Excess delay 50ns
-140 -120 -100 -80 -60 -40 -20 0 200
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Amplitude in dB
CD
F
Small-scale amplitude CDFs at different exces delays (4-bedroom apartment, NLOS)
EmpiricalLognormalNakagamiRayleighWeibull
Excess delay 100ns
Excess delay 5ns
Excess delay 50ns
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 43
doc.: IEEE 15-04-0452-01-004a
Submission
Small-Scale Amplitude Statistics Parameters
• The results demonstrate that lognormal, Nakagami and Weibull fit the measurement data well.
• Parameters of these distributions (i.e. standard deviation of lognormal PDF, m-parameter of Nakagami PDF and b-shape parameter of Weibull PDF) can be modeled by a lognormal distribution, respectively
• These parameters are almost constant across the excess delay
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 44
doc.: IEEE 15-04-0452-01-004a
Submission
Standard Deviation of Lognormal PDF – LOS
0 0.5 1 1.5 2 2.50
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Lognormal Standard Deviation
CD
F
Lognormal Standard Deviation CDF (Apart1-LOS)
Empirical CDFLognormal CDF
0 0.5 1 1.5 2 2.5 30
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Lognormal Standard Deviation
CD
F
Lognormal Standard Deviation CDF (Apart2-LOS)
Empirical CDFLognormal CDF
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 45
doc.: IEEE 15-04-0452-01-004a
Submission
Standard Deviation of Lognormal PDF – NLOS
0 0.5 1 1.5 2 2.5 30
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Lognormal Standard Deviation
CD
F
Lognormal Standard Deviation CDF (Apart1-NLOS)
Empirical CDFLognormal CDF
0 0.5 1 1.5 2 2.5 30
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Lognormal Standard Deviation
CD
F
Lognormal Standard Deviation CDF (Apart2-NLOS)
Empirical CDFLognormal CDF
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 46
doc.: IEEE 15-04-0452-01-004a
Submission
m-Nakagami Parameter – LOS
0 0.5 1 1.5 20
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Nakagami-m Values
CD
F
Nakagami-m Values CDF (Apart1-LOS)
Empirical CDFLognormal CDF
0 0.5 1 1.5 2 2.5 30
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Nakagami-m Values
CD
F
Nakagami-m Values CDF (Apart2-LOS)
Empirical CDFLognormal CDF
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 47
doc.: IEEE 15-04-0452-01-004a
Submission
m-Nakagami Parameter – NLOS
0 1 2 3 4 5 6 70
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Nakagami-m Values
CD
F
Nakagami-m Values CDF (Apart1-NLOS)
Empirical CDFLognormal CDF
0 0.5 1 1.5 20
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Nakagami-m Values
CD
F
Nakagami-m Values CDF (Apart2-NLOS)
Empirical CDFLognormal CDF
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 48
doc.: IEEE 15-04-0452-01-004a
Submission
b-Weibull Parameter – LOS
0.5 1 1.5 2 2.5 30
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Weibull-b Values
CD
F
Weibull-b Values CDF (Apart1-LOS)
Empirical CDFLognormal CDF
0.5 1 1.5 2 2.5 3 3.5 40
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Weibull-b Values
CD
F
Weibull-b Values CDF (Apart2-LOS)
Empirical CDFLognormal CDF
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 49
doc.: IEEE 15-04-0452-01-004a
Submission
b-Weibull Parameter – NLOS
0 1 2 3 4 5 6 7 80
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Weibull-b Values
CD
F
Weibull-b Values CDF (Apart1-NLOS)
Empirical CDFLognormal CDF
0.5 1 1.5 2 2.5 30
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
Weibull-b Values
CD
F
Weibull-b Values CDF (Apart2-NLOS)
Empirical CDFLognormal CDF
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 50
doc.: IEEE 15-04-0452-01-004a
Submission
Variations of Lognormal- with Delay – LOS
0 10 20 30 40 50 600
0.5
1
1.5
2
2.5Lognormal Standard Deviation vs. Excess Delay (Apart1-LOS)
Excess Delay, [ns]
Lo
gn
orm
al S
tan
da
rd D
evi
atio
n
0 10 20 30 40 50 60 70 800
0.5
1
1.5
2
2.5Lognormal Standard Deviation vs. Excess Delay (Apart2-LOS)
Excess Delay, [ns]
Lo
gn
orm
al S
tan
da
rd D
evi
atio
n
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 51
doc.: IEEE 15-04-0452-01-004a
Submission
Variations of Lognormal- with Delay – NLOS
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 52
doc.: IEEE 15-04-0452-01-004a
Submission
Variations of Nakagami-m with Delay – LOS
0 10 20 30 40 50 600.2
0.4
0.6
0.8
1
1.2
1.4
1.6
1.8
2Nakagami-m Values vs. Excess Delay (Apart1-LOS)
Excess Delay, [ns]
Na
kag
am
i-m
Va
lue
s
0 10 20 30 40 50 60 70 800
0.5
1
1.5
2
2.5
3Nakagami-m Values vs. Excess Delay (Apart2-LOS)
Excess Delay, [ns]
Na
kag
am
i-m
Va
lue
s
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 53
doc.: IEEE 15-04-0452-01-004a
Submission
Variations of Nakagami-m with Delay – NLOS
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 54
doc.: IEEE 15-04-0452-01-004a
Submission
Variations of Weibull-b with Delay – LOS
0 10 20 30 40 50 600.5
1
1.5
2
2.5
3Weibull-b Values vs. Excess Delay (Apart1-LOS)
Excess Delay, [ns]
We
ibu
ll-b
Va
lue
s
0 10 20 30 40 50 60 70 800.5
1
1.5
2
2.5
3
3.5
4Weibull-b Values vs. Excess Delay (Apart2-LOS)
Excess Delay, [ns]
We
ibu
ll-b
Va
lue
s
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 55
doc.: IEEE 15-04-0452-01-004a
Submission
Variations of Weibull-b with Delay – NLOS
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 56
doc.: IEEE 15-04-0452-01-004a
Submission
Small-Scale Amplitude Statistics Parameters
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 57
doc.: IEEE 15-04-0452-01-004a
Submission
Conclusion
• Frequency domain technique UWB measurement campaign has been carried out in indoor residential environment (high-rise apartments) covering frequencies from 3-10 GHz.
• Measurement covered both LOS & NLOS scenarios.• Channel measurement results and parameters which
characterize both the large-scale and small-scale parameters of the channel are reported.
September 2004
Chia-Chin Chong, Samsung (SAIT)Slide 58
doc.: IEEE 15-04-0452-01-004a
Submission
Reference
1. B. Kannan et. al., “Characterization of UWB Channels: Small-Scale Parameters for Indoor and Outdoor Office Environment,” IEEE 802.15-04-0385-00-04a, July 2004.