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1National Instruments Confidential
Improving Life Cycle Management
for Testing Aerospace and Defense
Electronics
Sean ThompsonPlatform Manager
Aerospace/Defense Applications
mailto:[email protected]:[email protected]:[email protected]:[email protected] -
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Agenda
Understanding Life Cycles
Improving Life Cycle Management with a Software
Defined Modular Platform
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Definition Development Production &Deployment
Operation &Support
All Systems and Products Have a Life Cycle
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COTS Electronics Have Their Own Life Cycles
EIA-724, Product Life Cycle Data Modelfor microelectronics
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Operation & Support
Sustainment-Dominated Life CycleLong operation and support phases
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Extended Life Cycles
Source: EIA Engineering Bulletin, Diminishing Manufacturing Sources and Material Shortages Management Practices
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Definition DevelopmentProduction &Deployment
Operationand Support
Life Cycle Management Practices
Reactive/Tactical
Alternate source
Substitution
Redefine requirement
Emulation
Lifetime Buy
Redesign
Reverse Engineer
Reclamation
Proactive/Strategic
Modular open architectures
Technology roadmapping
Planned system upgrades
Technology insertion planning
Life cycle analysis and monitoring
Formal lifecycle strategy
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Modular Platform based on COTS
Technologies
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System Software Architecture
Hardware is the most common cause of
obsolescence issues
Changing software to deal with hardware
obsolescence is the biggest source of cost and
disruption
Good software architecture is key to mitigating
obsolescence issues
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Key Investment Areas for NI
System Software Stack
Modular HW platform based on COTS technology
Heterogeneous Computing/Graphical System Design FPGA
Multicore Processors
Long term supportTechnology Investments
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Software Provides the Flexibility forAbstraction or Drill Down as Required
Frost and Sullivan 2006 World Synthetic Instrumentation Test Equipment Report
Software is the core of a [Synthetic Instrumentation] test system, it
is the task of the software to define and control the hardware
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Modular Test Software Technology
Hardware AbstractionIVI
VISA
Test Management Software
TestStand NI Switch Executive
Test Development SoftwareLabVIEW
LabWindows/CVI
Visual Studio .NET & Measurement Studio
Services & DriversNI-DAQ
NI-DMM
NI-SCOPE
NI-FGEN
NI-HSDIO
Other
Combine/Manage
Tests acrossEnvironments
Abstract HW-specific
Implementation
Add Test to HW
Control/Interface
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Modular Architecture TPS Software
NI TestStand API
NI TestStand Engine
Operator
Interface
Sequence
Editor
LabVIEW CVI .NET C/C++ ActiveX HTBasic ATLAS
ATML,
Reports
Databases
Other
VEE,
Java
(ActiveX server)
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ATML Document Schemas
Development
Test
Result
Test
Description
Instrument
Description
Test
Adapter
Test
Station
UUT
DescriptionTest
Configuration
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Enabling High-Performance Automated Test Rugged, modular form factor
High-speed data movement
Timing and synchronization
Optimization for parallel execution
PXI: Hardware platform based on COTS
Multicore ProcessorsPCI Express FPGAs Data Converters
Riding Moores Law
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Traditional Instruments
Expanding Measurement Capabilities
Accura
cy(Bits)
2826
24
22
20
18
16
14
12
10
8
41 10 100 1K 10K 100K 1M 10M 100M 1G 10G 100G
Sampling Rate (S/s)
6
NI Products, 2004NI Products, 1995
NI Products, 2010
NI Products, 2005
NI PXI-4071 7-digit FlexDMM
Industrys fastest, most accurate 7-digit DMM
NI PXI-5922, 24-bit, 15 MS/sIndustrys highest resolution digitizer
PXI-5186, 8-bit, 12.5 MS/s, 5 GHz BW
Industrys highest performance Digitizer
Phase Matrix 26.5 GHz
Signal Analyzer
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FPGAs
Heterogeneous ComputingGraphical System Design
Multicore
Processors
Task Parallelism Data Parallelism Pipelining
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IP to the Pin Technology
Driving user-defined software IP as close to the I/O pins of
reconfigurable (FPGA-based) instruments as possible.
Downloadable FPGA IP :
Control logic
Data transforms
Waveform creation
Digital protocols
Encryption
Math algorithms RF signal processing
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Software Defined Test ExampleDigital Protocol Test
Application
Presentation
Session
Transport
Network
Data Link
Physical
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Data Link
Physical
Software Defined Test ExampleDigital Protocol Test
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NI FlexRIO FPGA Module Virtex-5 FPGA
132 digital I/O lines
Up to 512 MB of DRAM
NI FlexRIO Adapter Module Interchangeable I/O
Analog or Digital
NI FlexRIO Adapter Module
Development Kit (MDK)
Data Link
Physical
Software Defined Test ExampleDigital Protocol Test
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Software Defined Test ExampleSDLC Test System
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Life Cycle Planning Fundamentals
Know the life cycle of your system or product
Know the life cycle of the COTS components youreusing in your tester or embedded system
Leverage open, modular platforms
Good software architecture is key to mitigatingobsolescence issues
Definition DevelopmentProduction &
Deployment
Operation &
Support
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