FIELD EMISSION SCANNING ELECTRON MICROSCOPY
Make: Carl Zeiss, Germany
Model: SUPRA 55VP, Gemini Column.
With air lock system
Detectors;
1, Secondary Electron 1 (In Lens)
2, Secondary Electron 2(SE2)
3, Backscattered Electron (BSE)
4, VPSE (Variable Pressure Mode)
Energy Dispersive X-ray Analysis (Edx)
Oxford Instruments X-MAX (20mm²)
Resolution: 1.2 nm gold particle separation on a carbon substrate
Magnification: From a min of 100x to > 5, 00,000 X
Description
SUPRA 55VP FE-SEM is a general purpose ultra high resolution FE-SEM based on the unique
GEMINI Technology. It provided excellent imaging properties combined with analytical capabilities which make
this high end FE-SEM suitable for a wide range of applications in materials science, life science and
semiconductor technology. The large specimen chamber for the integration of optional detectors and accessories
enables the user to configure the SUPRA for specific applications without sacrificing productivity or efficiency.
Sample requirement
sample should be in dried condition and it can be powder, film, pellet , coating etc..
NMR SPECTROMETER 500MHz
Make: Bruker
Model: AVANCE III HD
Major Specifications/ Accessories available:
11.7 Tesla Magnet.
a) 5mm BBO probe with gradient facilities and auto-sampler with VT
facility.
Tuning range from 109Ag to P31 also observation of 19F with 1H
decoupling.
b) 3,2mm CP/MAS probe with VT facility.
Tuning range from 15N to 31P +1H +19H.
Type of measurement/analysis available:
1D NMR, 2D NMR, Multi-nuclear NMR; Variable temperature
measurements.
Sample requirement for liquid samples:
5 mg for 1HNMR and 50 mg for 13CNMR experiment. Compounds should be highly pure
and soluble in commonly available solvents . Solubility, nature of compound [carcinogenic, toxic, lachrymatory, explosive,
hygroscopic] and Structural formula [contemplated / known] to be mentioned. The sample must be soluble in 0.6 ml of deuterated
solvent. Facilities available for 1D NMR, 2D NMR, Multi-nuclear NMR; Variable temperature measurements. RADIOACTIVE
MATERIAL should not be submitted.
Sample requirement for solid samples:
For Solid State NMR, 750 mg fine powder is required.
NMR SPECTROMETER 400MHz
Make: Bruker
Model: AVANCE III HD
Major Specifications/ Accessories available:
9.4 T magnet.
a)5mm BBO probe with gradient facility and auto sampler with
VT facility.
Tuning range from 109Ag to P31 also observation of 19F with 1H
decoupling.
b) 4mm CP/MAS probe with VT facility.
Tuning range from 15N to 31P +1H.
Type of measurement/analysis available:
1D NMR, 2D NMR, Multi-nuclear NMR; Variable temperature
measurements.
Sample requirement for liquid samples:
5 mg for 1HNMR and 50 mg for 13CNMR experiment. Compounds should be highly
pure and soluble in commonly available solvents . Solubility, nature of compound [carcinogenic, toxic, lachrymatory, explosive,
hygroscopic] and Structural formula [contemplated / known] to be mentioned. The sample must be soluble in 0.6 ml of deuterated
solvent. Facilities available for 1D NMR, 2D NMR, Multi-nuclear NMR; Variable temperature measurements. RADIOACTIVE
MATERIAL should not be submitted.
Sample requirement for solid samples:
For Solid State NMR, 750 mg fine powder is required.
ELECTRON PARAMAGNETIC RESONANCE (EPR) SPECTROSCOPY
Make: BRUKER BIOSPIN, Germany
Model: EMX Plus Source: Microwave X Band
Operation mode:
Powder, liquid and crystal samples at RT and down to 100 K
Software: Bruker WIN EPR Acquisition, and Processing
Applications:
Physics : Susceptibility, semiconductors, Quantum dots, Defect centers
Chemistry : Free radicals formation, ET reaction kinetics, Organo metallic, catalysis, molecular magnets, electrochemical studies
and spin labels
Biology : Enzyme reaction. ET reaction, folding & dynamics, metal centers, structural elucidation
Material research : Polymers, glasses, superconductors, corrosion, fullerenes, carbon dating
Medical research : In vivo free radical concentration and EPR imaging.
Make:
Thermo Scientific
Model: ESCALAB 250XI BASE SYSTEM WITH UPS AND XPS
IMAGE MAPPING
Sources:
XR6 Micro-focused Monochromator (Al Kα XPS)
XR4 Twin Anode Mg/Al (300/400W) X-Ray Source.
EX06 Ion gun
Detector:
Two types of detectors ensures optimum detection for each type of
analysis- two dimensional detector for imaging and a detector based on
channel electron multipliers for spectroscopy when high count rates are
to be detected
Salient Features:
Twin anode non-monochromated XPS Large area XPS(LAXPS) Small area XPS (SAXPS)
Fast Parallel Imaging(XPI) Energy Resolution Insulator analysis
Depth profiling capability Angle resolved XPS Ion scattering spectroscopy(ISS)
UV Photoelectron Spectroscopy(UPS) E-Beam Evaporator REELS Facility
Applications of ESCA 250 Xi:
- ESCA is unique and non destructive tool to study the surfaces of the materials
- The surfaces of a corroding sample can be analysed.
- Contamination in the matrix of a catalyst can be analysed qualitatively and quantitatively
- Inter faces (SEI in Li ion battery) of energy storage devises can be analysed qualitatively and quantitatively
- Depth profiling which may give elemental composition as function of depth (1-2 µ) can be done
Sample Requirements:
- Solid Samples in the form of pellets of 6mm or 8mm diameter.
- Thin films of area 10 mm2 Thickness 2 to 3 mm.
ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS (ESCA) OR X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)
Make:
Thermo Scientific
Model: : MULTILAB 2000 Base system with X-Ray,
Auger and ISS attachments.
Sources:
Twin Anode Mg/Al (300/400W) X-Ray Source.
EX05 Ion gun for etching and ISS studies.
Electron Gun with spot size < 50 m dia.
Detector:
-110 mm radius hemispherical analyzer with 7 channeltrons.
- 4 variable analyzer slits viz 5, 2, 1 mm and 4mm.
- Operates in CAE (Constant Analyser Energy) and CRR
(Constant Retard Ratio) modes.
Salient Features:
- Sample heating and cooling stages in preparation and Analysis Chamber.
- Sample manipulator with high precision four axes movement.
- CCD camera and zoom microscope for optical viewing of the samples.
Applications of MULTILAB 2000:
- What elements and the quantity of those elements that are present within the top 1-12nm of the sample surface
- What contamination, if any, exits on the surface or in the bulk of the sample
- Empirical formula of a material that is free of excessive surface contamination
- The chemical state identification of one or more of the elements in the sample
- The binding energy of one or more electronic states
- The thickness of one or more thin layers (1-8nm) of different materials within the top 12nm of the surfaces.
Sample Requirements:
- Solid Samples in the form of pellets of 6mm or 8mm diameter.
- Thin films of area 10 mm2 and Thickness 2 to 3 mm.
X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)
Make:
FEI, The Netherlands
Model: : Tecnai 20 G2 (FEI make)
Resolution::
- Line-1.8 Å, Point-2.40 Å
- Information limit (nm) 0.16
- Incorporated with STEM.
- Bottom mount CCD Camera (Gatan-make)
- TEM magnification range 25 x - 700 kx
- TEM point resolution 0.27 nm
- TEM line resolution (nm) 0.144
TEM Holder:
- Single tilt
- Single tilt Low background
- Double tilt
- Double tilt Low background
- STEM HAADF resolution 0.24 nm
- STEM magnification range 150 x – 230 Mx
- EDS
Detection:
- Boron to higher (EDAX-make)
Specimen stage:
- Fully computer-controlled, eucentric side-entry, high stability CompuStage
Sample Preparation:
- - Ceramic sample preparation facility (Ion milling) (BALTEC make).
TRANSMISSION ELECTRON MICROSCOPE (TEM)
Make : Bruker Optik GmbH, Germany
Model No. : TENSOR 27
Source : Middle-infrared light (MIR)
Detector : DLaTGS
Spectral range : 370 to 7,500 cm-1
Spectral resolution : 0.125 cm-1
Beam splitter: Ge-based coating on KBr
Software : OPUS TM
FT-IR SPECTROMETER
Make : VARIAN
Model : Cary 500 Scan
Wavelength range: 190-3300 nm
Modes : Specular reflectance, Diffuse
reflectance, Absorbance
UV-VIS-NIR DOUBLE BEAM SPECTROPHOTOMETER
Make : VARIAN
Model : Cary 5000 Scan
Wavelength range: 175-3300 nm
Spectral bandwidth: 0.01 nm
Detector : PbS NIR
Samples : Solid and liquid
Accessories : Multi cell holder, Temperature
attachment (-10 to 100 ºC)
Modes : Specular reflectance, Diffuse
reflectance, Absorbance
Make : VARIAN
Model : Cary Eclipse
Wavelength range: 200-1100 nm
Source : Xenon pulse lamp
Detector : Photo multiplier tube
Modes : Excitation, Emission
FLUORESCENSE SPECTROPHOTOMETER
True Windows NT environment:
- Image management system for image processing, searching and archiving
- Network capability to transfer SEM images and data to external PCs and servers
Applications:
- To study surface morphology of samples
- Evaluation of crystallographic orientation
Make : TESCAN
Model : VEGA3
Magnification: x 30 – x 3, 00,000
Specimen size : Max. 150 mm diameter
Accelerating voltage: 0.3 – 30 kV
Resolution : 3.5 nm @ 25kV high vacuum mode
Attachments : Energy-dispersive X-ray. Spectroscopy (EDS) &
Backscattered Electron Detector (BSED)
SCANNING ELECTRON MICROSCOPE(SEM)
Make : Horiba, Japan
Model : XGT-5200 X-ray analytical microscope
Source : X-ray tube 50 kV max, 1 mA, with Rh target
Detector : Peltier cooled Silicon Drift Detector (SDD)
Elements Detected: Na to U (with sample at normal atmospheric pressure)
CCD camera : Magnification 30 and 100 approx.
Samples : Metal plates, powders and coatings
Energy Range: 0 - 40 keV
Maximum Measurement Area / Maximum Sample Size:
100 mm x 100 mm / 350 mm x 400 mm x 40 mm
X-RAY ANALYTICAL MICROSCOPE (XRF)
Description :
The XGT-5200 X-ray Fluorescence micro-analyzers combine the fast, non-destructive elemental analysis of energy dispersive
X-ray Fluorescence (EDXRF) with the capability to pinpoint individual particles with diameters down to 10 µm in size.
Automated sample scanning provides detailed images of element distribution, over areas as large as 10cm x 10cm.
High Resolution- Transmission Electron Microscope
Make : FEI
Model : Tecnai F20 The 200kV FEI Tecnai F20 Super-Twin is designed to produce optimum high
resolution performance in both TEM and STEM. This microscope features a
1024x1024 CCD camera positioned after the Gatan Imaging Filter (GIF) that can be
used for both dedicated spectroscopic analysis and energy-filtered imaging. The high
Resolution Gatan Orius 2672x2672 CCD can deliver high resolution and real time
speed for imaging application. The Tecnai F20 is equipped with Lorentz Lens for
magnetic imaging in Fresnel and Fouccault modes and NanoMegas Astar system for
automated phase/orientation mapping of nanocrystals materials.
Specifications :
Electron source
Flexible high tension (20, 40, 80, 120, 160, 200 kV and values in between)
Schottky field emitter with high maximum beam current (> 100 nA)
High probe current (0.5 nA or more in 1 nm probe)
Small energy spread (0.7 eV or less) • Spot drift < 1 nm/minute
Vacuum levels: specimen chamber < 1.2 × 10-5 Pa; gun < 1 × 10-6 Pa
Imaging
TEM point resolution (.24nm)
TEM line resolution (.102nm)
Information limit (.14nm)
Extended resolution (TrueImage) Minimum focus step (.16nm)
TEM magnification range 25X-1030kx
Camera length 30-4500mm
Maximized tilts for any X, Y, Z, α and β combination
Detector window: S-UTW
Active area: 30 mm2
Specimen-detector distance 15 mm
Collection angle 0.166 sterad
Elevation angle 0o
Detector resolution 135 eV@ Mn K-α at 100 μs
EDAX Energy-Dispersive X-ray detector
Tip Enhanced Raman Spectroscopy (TERS)
AFM & Raman
Atomic Force Microscopy (AFM) provides a variety of nanometric characterizations such as topography, conductivity, and thermal
measurements. While very effective at measuring certain properties, AFM cannot identify the chemical composition of a given material.
Raman spectroscopy, however, has emerged as a critical technique in the field of chemical characterization, accurately identifying and
classifying materials in a number of diverse fields and industries such as: material science, chemistry, biophysics, semiconductors, and
many more.
Raman:
Renishew Invia Reflex Spectrometer
focal length 250mm
Raman Spectrum: 50cm-1 to 4000cm-1
Microscope:
Specially adapted Research Grade Leica microscope allowing
confocal measurements with better than 2.5µm depth resolution
(using a 100x objective),2.5x, 20x and 50x objective.
Laser:
Air cooled Argon Ion Laser , 50Mw at 514nm,
High power Infrared diode laser 250Mw at 785nm,
Auto align and optimisation of input laser power
Detector
CCD array detector near infrared enhanced,
deep resolution (576x384 pixels). Peltier cooler to -70˚C