Performance Measurements Using MAC Addressable Technology
TPB MOITS Traffic Signals and Operations Subcommittee
November 12, 2008
Data CollectionData Collection
Time intensive Costly Highly variable Difficult to be statistically significant Sometimes intrusive
Performance Measures & TechniquesPerformance Measures & Techniques
Travel Time– Probe vehicles
– GPS tracking
– Toll tags
Volume & Speed– Road tubes
– System detectors
– Toll tags
Origin-Destination/Route Choice– License plate surveys
– Surveys
New Technique ProcessNew Technique Process
Track MAC Addressable Devices to Determine Travel Speed– Set up antenna locations
• Flexibility on number and locations
– Use portable antennas to log device signal• Unique signature for each device• Time-stamp logs into a database
– Match MAC Address• Data mining programs available
– Calculate performance measure
MAC Addressable Technologies - BackgroundMAC Addressable Technologies - Background
MAC Address – Devices that have a 48 bit UNIQUE address assigned to a device by
its manufacturer
Bluetooth Devices– Cell Phones
– Hands free units
– MP3 Players
– Vehicles
3 Different Classes with Operating Ranges– Class 1 – 100 meters
– Class 2 – 10 meters – Most common
– Class 3 – 1 meter
Sample ProjectSample Project
Preliminary Study – Purdue University & Indiana Department of Transportation
– Indiana Motor Speedway (IMS) – Brickyard 400
– I-65 to IMS
Investigate travel patterns and characteristics– Before and after event
– Highway and arterial data
Workshop DetailsWorkshop Details
Professor Darcy Bullock – Purdue University Professor Phil Tarnoff – University of Maryland
Friday, November 21, 2008 10:00 AM – 2:00 PM SHA OOTS Training Room – Hanover Complex
Workshop Details - AgendaWorkshop Details - Agenda
10:00 AM – 11:45 AM – Prof. Darcy Bullock
– Prof. Phil Tarnoff
11:45 AM – 12:30 PM– Lunch (TBD)
12:30 PM – 2:00 PM– Roundtable Discussion
• Focus on applicability of technology and technique to various transportation engineering fields
• Possible revolution in data collection and reliability
