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Proposals for Memristor Crossbar Design and Applications
Blaise MouttetGeorge Mason University
Memristors and Memristive Systems SymposiumUC Berkeley November 21, 2008
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• Design should be compatible with standard manufacturing techniques to facilitate wide use and experimentation by many participants (i.e. universities, research labs, existing fabs, etc.) without a significant investment in new equipment.
• Design should be easy to integrate with standard electronics components and materials.
• Design should incorporate materials capable of RHIGH>>RLOW. • Design should be robust to both temporal and spatial
variation of memristance. • Design should avoid internal feedback current paths in
crossbar which can limit speed and ability to read resistance states reliably.
• Design should allow ease of reconfiguration of resistance states.
Desirable Manufacturing Goals to EaseAdoption of Memristor Crossbars
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• Some applications may not require nanowiresto provide competitive solutions in a variety of areas (e.g. signal processing, pattern recognition)
• Near‐term implementation is likely to be easier and more readily adopted using microscale wires which can avoid the problems of nanowire defects, addressing, etc.
Nanowire vs. Microscale Wire Crossbars
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Ideally, the detected resistance state of a selected crossbar junction should be independent of other resistance states in the
crossbar.
Vread
1 0 0 0
1
0
0
Low resistancejunction
(i.e. logic 1)
High resistancejunction
(i.e. logic 0)
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However, this is not the case for simple crossbar designs due tointernal currents.
Vread
1 0 0 0
1
0
0
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Silicon wafer
SiO2
metal layer (e.g. Al)
p‐doped polysilicon
n‐doped polysilicon
A simple solution compatible with microfabricationtechniques is the incorporation of pn junctions in the crossbar (taught by Ovshinsky for phase change crossbar memory in US Patent 4,597,162). One variation of this solution adapted to bilayer oxide memristive films is as follows:
A) Film deposition of metal layer and silicon layers
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Silicon wafer
SiO2
P
B) Etch metal and semiconductor layers to form crossbar columns.
N
P
N
P
N
P
N
Al Al Al Al
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Silicon wafer
SiO2
P
C) Deposit SiO2 in gaps to provide isolation and planarize surfaceD) Deposit memristor oxide bilayer (e.g. TiO2/TiO2‐x) E) Deposit and pattern top metal layer to form crossbar row wires
N
P
N
P
N
P
N
Al Al Al Al
SiO2 SiO2 SiO2
Pt
TiO2/TiO2‐x
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Desirable Goals for MemristorCrossbar Array Applications
• Complement (not conflicting with) existing technologies and markets to achieve ease of acceptance
• Identify uses compatible with smaller emerging markets with potential for high growth (e.g. FPAAs , commercial robotics, neural interfaces)
• Solve problems for which conventional electronic hardware and software do not provide efficient solutions but which memristors can (e.g. pattern recognition, traveling salesman problem)
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R1
+_
RF
Vout = - [V1(RF/R1)+V2(RF/R2)+V3(RF/R3)+V4(RF/R4)]
Op‐amps are well known to be implemented as summing amplifiers
R2
R3
R4
V1
V2
V3
V4
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R1 R2 R3 R4
M41 M42 M43 M44
M31 M32 M33 M34
M21 M22 M23 M24
M11 M12 M13 M14
V1 V2 V3 V4
+_
RF
Vout
Integrating Memristor Crossbar Array with Op‐Amp Circuitry = Matrix Summing Amplifier
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∑−=ij
ijF II
For an ideal op‐amp:
∑ +−
−=ij iij
lossi
F
out
RMVV
RV
)()(
)()()()( lossi
ijij
ijlossi
iij
Fout VVMTVV
RMRV −−=−+
−= ∑∑
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To achieve behavior similar to binary logic requires T(Mij=RHIGH)=0 and T(Mij=RLOW)=1
By setting the fixed column resistors Ri = RF‐RLOW then T(RLOW)=1 is achievable. However, T(RHIGH) is not able to be zero since this would require RF = 0. Thus a low bit error (LBE) exists and a tolerable LBE should satisfy:
T(RHIGH)= LBE ≥ 1/[1+(RHIGH‐RLOW)/RF]
Solving for RF produces:
RF ≤ [LBE/(1‐LBE)] (RHIGH‐RLOW)
This inequality sets an upper limit to RF based on a maximum allowable low bit error and the high and low resistance values of the memristor.
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Analysis for memristor (Mij) variation
For an allowable bit sensitivity σ(Mij),
)()(
|)(| 2 ijiij
ijFij M
RMdMR
MTd σ<+
=
The maximum allowable value of d|T(Mij)| is at Mij = RLOWand for Ri = RF‐RLOW
)()( 2 ij
F
ij
LOWFLOW
ijF MR
dMRRR
dMRσ<=
−+
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Analysis for memristor (Mij) variation
Combining the previous conditions the optimum range for RF canbe determined based on the memristance sensitivity and low bit error as:
)(1)( LOWHIGHF
ij
ij RRLBE
LBERM
dM−
−<<
σ
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Analysis for memristor (Mij) variation
A possible rule of thumb is to set the allowable low bit error and bit sensitivity in terms of the number of columns of the crossbar (=N). For example, if all of the crosspoints have a low bit error and sensitivityof 1/N a total of 1 bit error is produced at the output. The range of RFmay then be expressed as:
)(/11
/1LOWHIGHFij RR
NNRNdM −
−<<
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Analysis for memristor (Mij) variation
For large N the above inequality can be approximated to find themaximum allowable variation in Mij as:
2
)(N
RRdM LOWHIGHij
−<
In case of relaxing the maximum bit error and sensitivity constraints to allow for n total bit errors for N columns the above equationbecomes:
2
2 )(N
RRndM LOWHIGHij
−<
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Potential Application #1 Programmable Drive Waveforms
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Problems with Conventional Drive Waveform Circuits
• In many electronics applications variation of circuit parameters due to temperature change, aging, etc. require adjustment of drive waveforms (e.g. LEDs may require a higher amplitude voltage drive over time to produce a consistent light output).
• Waveform adjustment is also desirable for mode adjustment in various applications (e.g. inkjet printheads changing resolution or drop size often involves timing or amplitude adjustment of drive signal for heater or piezo.)
• Timing modulation and amplitude modulation circuits implemented in hardware can require complex circuitry and have limitations in adaptability and the range of possible waveforms.
• Software based solutions require a microprocessor which can be difficult/expensive to miniaturize for several portable electronics applications
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1 0 0 0
+_
RF
|Vout/Vin|≈RF/R
Memristor Crossbar Drive Waveform Circuit
R
2R
4R
8R
Voltage Level Converter
Shift Register
Assuming RLOW of memristors << RF, R
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0 1 0 0
+_
RF
|Vout/Vin|≈RF/2R
Memristor Crossbar Drive Waveform Circuit
R
2R
4R
8R
Voltage Level Converter
Shift Register
Assuming RLOW of memristors << RF, R
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0 0 1 0
+_
RF
|Vout/Vin|≈RF/4R
Memristor Crossbar Drive Waveform Circuit
R
2R
4R
8R
Voltage Level Converter
Shift Register
Assuming RLOW of memristors << RF, R
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0 0 0 1
+_
RF
|Vout/Vin|≈RF/8R
Memristor Crossbar Drive Waveform Circuit
R
2R
4R
8R
Voltage Level Converter
Shift Register
Assuming RLOW of memristors << RF, R
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Advantages
• Both timing and amplitude of output waveform can be adjusted by binary switching of the memristance states in the crossbar.
• Even with only binary memristance switching, a very large number of possible drive waveforms are available (2NxM) (e.g. 10x10 1030 states).
• Combined with techniques such as hill climbing and genetic algorithms has potential for self‐optimizing drive waveforms and real‐time adaption of circuitry to effects of aging and temperature variation.
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Potential Application #2 Pattern Recognition
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Problems with Conventional Pattern Recognition Solutions
• Software‐based solutions require time for data transfer between memory and processor circuits which causes a lag in responsiveness.
• Hardware solutions can be faster but have limits in adaptability and limits in the range of patterns that can be classified.
• Memristors offer a route to a “morphware”pattern recognition solution combining both memory storage and data processing in a common circuit.
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Memristor Crossbar Pattern Comparison Circuit (write mode)
V5 V6 V7 V8V1 V2 V3 V4
+_
RF
+_
-Vref
1 0 1 0
1
0
0
0
Voltage Level Converter (V>Vthreshold)
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Memristor Crossbar Pattern Comparison Circuit (write mode)
V5 V6 V7 V8V1 V2 V3 V4
+_
RF
+_
-Vref
0 1 1 1
0
1
0
0
Voltage Level Converter (V>Vthreshold)
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Memristor Crossbar Pattern Comparison Circuit (write mode)
V5 V6 V7 V8V1 V2 V3 V4
+_
RF
+_
-Vref
1 1 0 0
0
0
1
0
Voltage Level Converter (V>Vthreshold)
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Memristor Crossbar Pattern Comparison Circuit (write mode)
V5 V6 V7 V8V1 V2 V3 V4
+_
RF
+_
-Vref
0 0 1 0
0
0
0
1
Voltage Level Converter (V>Vthreshold)
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Memristor Crossbar Pattern Comparison Circuit (detect mode)
V5 V6 V7 V8V1 V2 V3 V4
+_
RF
+_
-Vref
0 1 1 1
1
I
0
0
0
Voltage Level Converter (V<Vthreshold)
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Memristor Crossbar Pattern Comparison Circuit (detect mode)
V5 V6 V7 V8V1 V2 V3 V4
+_
RF
+_
-Vref
0 1 1 1
0
4I
1
0
0
Voltage Level Converter (V<Vthreshold)
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Memristor Crossbar Pattern Comparison Circuit (detect mode)
V5 V6 V7 V8V1 V2 V3 V4
+_
RF
+_
-Vref
0 1 1 1
0
I
0
1
0
Voltage Level Converter (V<Vthreshold)
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Memristor Crossbar Pattern Comparison Circuit (detect mode)
V5 V6 V7 V8V1 V2 V3 V4
+_
RF
+_
-Vref
0 1 1 1
0
2I
0
0
1
Voltage Level Converter (V<Vthreshold)
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Advantages
• Output voltage from 1st op‐amp is analogous to XNOR (bit comparator) function
• Tuning Vref can adjust sensitivity of pattern comparison and adjust allowable bit error between resistance states and voltage states.
• Allowing for bit error could potentially be very useful to applications such as facial recognition which can require robustness to a large percentage of bit errors.
))]()()()(([2 reflossii
ijlossii
ijout VVVMTVVMTAV −−+−= ∑∑
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Potential Application #3 FPAAs
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Problems with Conventional FPAAs
• FPAAs (Field Programmable Analog Arrays) provide reconfigurability of filter designs useful in communications and control systems but are limited in the range of configurable states.
• Lacks ability to electrically tune the resistance such as provided by memristors to achieve intermediate frequency states (for communication apps.) or pole/zero adjustment (for control apps.)
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M21 M22 M23 M24 M25
M11 M12 M13 M14 M15 Vout(t)
C
Vin(t)
R1 C/2 C/4 C/8
CR2 C/2 C/4 C/8
Memristance programming circuitry
Vout(s)/Vin(s) = K(Mij) [1+s/a(Mij)]/[(1+s/b(Mij)]a(Mij)<<b(Mij) high pass filtera(Mij>>b(Mij) low pass filter
By including memristor crossbar junctions in the input and feedback path of an op‐amp capacitor array, a transfer function can be tuned to adjust the
gain, pole, and/or zero of a filter.
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Advantages
• Conversion between low pass and high pass filter by appropriate selection of on/off states of Mij.
• Tuning of f‐3dB or pole/zero by adjustment of memristance state.
• Cascading multiple stages can provide for tunable bandpass adjustment
• Dynamic PID controllers can be implemented by connecting multiple stages in parallel.
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Potential Application #4 Arithmetic Optimization Problems
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Problems with Conventional Arithmetic Processor Designs
• Segmentation between memory and processor circuitry may produce a bottleneck in speed. New clock independent designs are desirable.
• Logic based arithmetic is inefficient for some network optimization problems such as the traveling salesman problem involving repeated recalculation of sums
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0 1 0 1
+_
R
Vout
Memristor Crossbar Arithmetic Circuit
R
R/2
R/4
R/8
Voltage Level Converter
Assuming RLOW of memristors << R/8
20
21
22
23
Analog output representative of 2+4
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1 0 1 0
+_
R
Vout
Memristor Crossbar Arithmetic Circuit
R
R/2
R/4
R/8
Voltage Level Converter
Assuming RLOW of memristors << R/8
20
21
22
23
Analog output representative of 1+3
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Advantages
• Although op‐amps are slower than logic circuits the combination of memory and processing in a single circuit reduces the reliance on a clock.
• May be scalable to provide real time solutions to network optimization. For example, in a traveling salesman problem with 100 nodes including 5050 inter‐relational distances, each distance metric can be stored in a different crossbar column. Comparisons between different paths between the nodes only requires changing the bit pattern input to the crossbar rows and detecting the analog level of voltage output.
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Potential Application #5 Signal Mixing
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Problems with Conventional Modulation Systems
• Increase in portable wireless electronics requires more efficient uses of spectrum with techniques such as frequency hopping.
• Simpler but more secure signal encryption methods are desirable.
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Silicon wafer
SiO2
N
Back‐to‐back diode memristor crossbar
P
N
P
N
P
N
P
Al Al Al Al
SiO2 SiO2 SiO2
TiO2/TiO2‐x Pt Pt Pt Pt
Pt
NP
Al
SiO2
Silicon wafer
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Equivalent circuit at each crossbar junction
VeqB = VinB [(Ri+Mij)/(Ri+Rj+Mij)]+ VinA[Rj/(Ri+Rj+Mij)]
For VinB less than the diode threshold voltage, the resistance state of Mij and voltage state of VinA can be used to modulate signal transmission.
VoutA
VoutB (ZB=∞)
VinB
VinA
Ri
Rj
RL
Mij
VeqB
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Input Wiring
Vsig1
Vsig2
Vsig4
Vsig3
Vmod1 Vmod2 Vmod3 Vmod4
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Input Wiring
Vsig1
Vsig2
Vsig4
Vsig3
Vmod1 Vmod2 Vmod3 Vmod4
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Input Wiring
Vsig1
Vsig2
Vsig4
Vsig3
Vmod1 Vmod2 Vmod3 Vmod4
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Input Wiring
Vsig1
Vsig2
Vsig4
Vsig3
Vmod1 Vmod2 Vmod3 Vmod4
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Advantages
• Switching of carrier frequencies allow more efficient use of spectrum and compensation for crowded channels.
• Potential exist for improved signal encryption by sharing a randomized memristanceswitching pattern between sender and receiver.
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Potential Application #6Artificial Intelligence
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Potential Routes to Strong A.I. with Memristor Crossbars
• Neural Networks (feedforward of nonlinear weighted sums of memristance states)
• Genetic Algorithms (selection, crossover, and mutation of memristance states)
• Emergent Complexity from Memory‐Prediction Framework (Hawkins approach)
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Memristor Crossbar Circuit Design for Sensor Stimulated Emergent Behavior
Differential Amplifiers
Vsen1 Vsen2 Vsen3 Vsen4
Summing Amplifiers
V11 V12 V13 V14 V21 V22 V23 V24
Vact1
Vact2
Vact3
Vact4
M11 M12 M13 M14
M21 M22 M23 M24
M31 M32 M33 M34
M41 M42 M43 M44
1st crossbar array
Analog Sensor Voltages
Analog Actuator Voltages
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Memristor Crossbar Circuit Design for Sensor Stimulated Emergent Behavior
Differential Amplifiers
Vsen5 Vsen6 Vsen7 Vsen8
Summing Amplifiers
V21 V22 V23 V24 V11 V12 V13 V14
Vact5
Vact6
Vact7
Vact8
M11 M12 M13 M14
M21 M22 M23 M24
M31 M32 M33 M34
M41 M42 M43 M44
2nd crossbar array
Analog Sensor Voltages
Analog Actuator Voltages
Recursive feedback between 1st and 2nd
crossbar can potentially set up a dynamic
memory‐prediction framework for intelligence
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Potential Applications #7 and 8 Neural Interfaces (spike counting and classification) and Robotics (enhanced responsiveness for actuator control)
‐To be continued at NSTI Nanotech Conference and Expo
May 3‐7, 2009Houston, TX
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Conclusion
• Thank you to organizers and participants.
• Thank you to Dr. Wei Wang of the College of Nanoscale Science and Engineering for information and feedback on FPAAs and suggestion for error analysis.
• Thank you to Jeff Hawkins for insights on memory‐prediction framework for intelligence as documented in On Intelligence