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SCHEME OF INSTRUCTION AND EXAMINATION
BE II YEAR
(ELECTRONCIS AND COMMUNICATION ENGINEERING)
SEMESTER – I
S.No. Code No. Subject Scheme of
Instruction Scheme of Examination
THEORY L/T D/P
Duration
in Hours
Max. Marks
Univ.
Exams
Sessionals
1 MAT 202 Applied
Mathematics 4 - 3 75 25
2 EC 201 Basic Circuit
Analysis 4 - 3 75 25
3 EC 202 Electromagnetic
Theory 4 - 3 75 25
4 EC 203 Electronic Devices 4 - 3 75 25
5 ME 221
Elements of
Mechanical
Engineering
4 - 3 75 25
6 EE 222 Electrical
Technology 4 - 3 75 25
PRACTICALS
1 EC 231 Electronic Devices
Lab - 3 3 50 25
2 EC 232
Electronic
Workshop and
Simulation Lab
- 3 3 50 25
TOTAL 24 6 550 200
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SCHEME OF INSTRUCTION AND EXAMINATION
BE II YEAR
(SERVICE COURSES OFFERED TO OTHER DEPARTMENTS)
SEMESTER – I
S.No. Code No. Subject Scheme of
Instruction Scheme of Examination
THEORY L/T D/P
Duration
in Hours
Max. Marks
Univ.
Exams
Sessionals
1 EC 221
Electronics
Engineering – I
(for EEE and EIE)
4 - 3 75 25
2 EC 222 Basic Electronics
(for CSE) 4 - 3 75 25
PRACTICALS
1 EC 241
Electronics
Engineering - I
Lab
(for EEE and EIE)
- 3 3 50 25
2 EC 242
Basic Electronics
Lab
(for CSE)
- 3 3 50 25
TOTAL 8 6 250 100
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MAT 202
APPLIED MATHEMATICS
(ECE)
Instructions 4 Periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1. Derive first order partial differential equations
2. Analyze the concepts of functions of complex variables, analytic functions, complex
integration and residue theory
3. Apply numerical methods to solve certain types of problems
4. Evaluate curve fitting, correlation and regression
UNIT- I
Partial differential equations: Formation of Partial differential equations, Linear first order partial
differential equations, Lagrange’s equation, Non linear first order partial differential equations,
Charpit’s method, Standard forms.
UNIT-II
Functions of Complex variables: Limits and Continuity of function, Analytic functions, Cauchy-
Riemann equations, Cartesian and Polar forms, Harmonic functions, Complex integration, Cauchy’s
theorem, Cauchy’s integral formula and its applications.
UNIT-III
Residue theory and Transformations: Taylor’s and Laurent’s series expansions, Zeros and
Singularities, Residues, Residue theorem, Evaluation of real integrals using Residue theorem,
Conformal mapping, Bilinear transformation.
UNIT-IV
Numerical Methods: Solutions of Algebraic and Transcendental equations, Bisection method and
Newton-Raphson’s method, Interpolation, Newton’s Forward and Backward difference
interpolations, Lagrange’s interpolation, Newton’s divided difference interpolation, Numerical
differentiation, Solution of differential equations by Euler’s method and Runge-Kutta method of
order four.
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UNIT-V
Curve fitting: Correlation and Regression, lines of regression fitting of curves by the method of
least squares (Straight line, parabola, exponential curves)
Suggested Reading:
1. R.K. Jain and S.R.K. lyengar, Advanced Engineering Mathematics, 4th
ed., Narosa
Publications, 2014.
2. Dr. B.S. Grewal, Higher Engineering Mathematics, 43rd
ed., Khanna Publications, 2014.
3. James Brown and Ruel Churchill, Complex Variables and Applications, 9th
ed., McGraw Hill
Education (India) Private Limited, 2013.
4. Erwin Kreyszig, Advanced Engineering Mathematics, 9th
ed., John Wiley & Sons, 2012.
5. S.C. Gupta, V.K. Kapoor, Fundamentals of Mathematical Statistics (A Modern Approach),
10th
ed., Sultan Chand & Sons, 2002.
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EC 201
BASIC CIRCUIT ANALYSIS
Instructions 4 Periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1. Define basic concepts of DC and AC circuit behavior.
2. Develop and solve mathematical representations for simple RLC circuits.
3. Formulate the circuit analysis theorems and methods.
4. Derive Laplace transforms of signals, their properties and applications.
5. Analyze the principle of two-port networks their parameters.
UNIT I
Lumped Circuit elements, dependent and independent current and voltage sources, Ohms law,
energy, power, Kirchoff’ laws, D.C. circuit analysis. Nodal and mesh analysis. Source
transformations, Terminal characteristics of RLC elements. Thevenin’s and Norton’s theorems.
Superposition theorem, Maximum power transfer theorem. Topological description of networks.
Network graphs, tree, chord, cutest, incidence matrix, tieset matrix, cutest matrix. Formulation of
node and loop equations. Tellegen’s theorem, duality, dual networks.
UNIT II
Linear time invariant first order and second order circuits, Formulation of integro differential
equations, RL, RC and RLC circuits, transient and steady state responses. Zero Input Response
(ZIR), Zero State Response (ZSR) - complete response.
UNIT III
Steady state response of RLC networks to exponential signals, Sinusoidal function, response to
sinusoidal excitation, phasors, impedance and admittance. Calculation of power in a.c. circuits,
average power, apparent power, complex power, vector representation. Network theorems with
impedance. Analysis of magnetically coupled circuits
UNIT IV
Two port networks, Z, Y, h, g, ABCD parameters. Equivalence of two port networks. T, Pi
transformation, Inter connection of two ports, Reciprocity theorem. Analysis of reciprocal networks:
Practical and ideal transformers.
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UNIT V
Concept of complex frequency, impedance and admittance functions, Pole-Zero cancellation,
calculation of natural response from pole zero plot. Series and parallel resonance, Q-factor,
selectivity, bandwidth. Calculation of Q factor for different resonant forms.
Suggested Reading:
1. Hayt Jr. W.H. Kemmerly J.E. and Steven M. Durbin, Engineering Circuit Analysis, 8th
ed.,
McGraw Hill Education (India) Private Limited, 2013.
2. Aatre, V.K., Network Theory and Filter Design, 2nd
ed., New Age International Pvt. Ltd.,
1986.
3. Jagan NC and Laxminarayana C, Network Analysis, 3rd
ed., BSP Publications, 2014.
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EC 202
ELECTROMAGNETIC THEORY
Instruction 4 Periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessional 25 Marks
Objectives:
1. Analyze fundamental concepts of vector analysis, electrostatics and magneto-statics laws and
their applications.
2. Describe the relationship between Electromagnetic Theory and Circuit Theory.
3. Formulate the basic laws of static electricity and magnetism and extend them to time varying
fields.
4. Derive the Maxwell’s equations leading to the wave equations in various media
5. Define wave propagation characteristics.
UNIT I
Vector Analysis, Coulomb’s law and applications, Electric field intensity, Electric flux, flux density,
Gauss’s law and applications: determination of electric field due to line of charge, sheet of charge,
volume charge distributions, divergence theorem.
UNIT II
Potential and energy, potential field of system of charges, potential gradient, energy, energy density,
Conductors – Current density , Continuity equation, Dielectrics – Nature of dielectric materials,
boundary conditions in static electric field, Capacitance of two wire line, Poisson’s and Laplace’s
equations, Solution of Laplace’s Equation, Uniqueness theorem.
UNIT III
Steady magnetic field, Biot-Savart’s law and applications, Ampere’s law and application:
determination of magnetic field due to line, sheet and volume currents, Stoke’s theorem, Magnetic
scalar and vector potential, magnetic boundary conditions.
UNIT IV
Displacement currents, Maxwell’s equations in integral and differential forms, E.M wave Equations
in free space and good conductors, uniform plane wave, wave propagation in free space, perfect
dielectric, lossy dielectric and good conductors. EM Wave polarization.
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UNIT V
Poynting Vector: Instantaneous, average and complex Poynting vector, power and energy
calculations. Reflection of plane waves by a perfect conductor, normal and oblique incidence.
Reflection of plane waves at different media - normal and oblique incidence, Reflection coefficient,
Transmission coefficient.
Suggested Reading:
1. Sadiku N.O., Principles of Electromagnetics, 4th
ed., Oxford University Press, 2009.
2. W H Hayt, J A Buck and Jaleel M. Akhtar, Engineering Electromagnetics, 8th
ed., McGraw Hill
Education (India) Private Limited, 2014.
3. Jordan E.C., Balmain K.G., Electromagnetic Waves and Radiating Systems, 2nd
ed., Prentice Hall
of India, 2001.
4. Nannapaneni Narayana Rao, Elements of Engineering Electromagnetics, 1st
ed., Pearson
Education, 2008.
5. B.N.Basu, Engineering Electromagnetics Essentials, 1st ed., Universities Press (India) Private
Limited, 2015.
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EC 203
ELECTRONIC DEVICES
Instructions 4 Periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1. Analyze the behavior of Semiconductor diodes in Forward and Reverse bias
2. Develop Half wave and Full wave rectifiers with L,C,LC & CLC Filters
3. Explain V-I characteristics of Bipolar Junction Transistor in CB,CE & CC configurations
4. Design Biasing techniques for BJT in Amplifier Applications
5. Explore V-I characteristics of FETs and MOSFETs
UNIT I
Junction Diode : Different types of PN Junction formation techniques, PN Junction Characteristics,
biasing- band diagrams and current flow, Diode current equations under forward bias and reverse
bias conditions, Junction breakdown in diodes and breakdown voltages, effect of temperature on
diode characteristics, Diode as a circuit element, small signal diode models, Junction capacitance
under forward bias and reverse bias, Diode switching characteristics, Zener Diodes, Zener voltage
regulator and its limitation.
UNIT II
PN Diode Applications: Half wave, Full wave and Bridge rectifiers - their operation, performance
characteristics, and analysis; Filters (L, C, LC and CLC filters) used in power supplies and their
ripple factor calculations, design of Rectifiers with and without Filters.
UNIT III
Bipolar Junction Transistor : Transistor Junction formation (collector-base, base-emitter
Junctions) Transistor biasing-band diagram for NPN and PNP transistors, current components and
current flow in BJT, Modes of transistor operation, Early effect, BJT input and output characteristics
in CB, CE CC configuration, BJT as an amplifier, BJT biasing techniques, Thermal runway, heat
sinks and thermal stabilization, operating point stabilization against temperature and device
variations, stability factors, Bias stabilization and compensation techniques, Biasing circuit design.
UNIT IV
Small Signal Transistors equivalent circuits : Small signal low frequency h-parameter model of
BJT, Determination of h parameters, analysis of BJT amplifiers using h-parameter, comparison of
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CB, CE and CC amplifier configurations, Analysis of BJT amplifier with approximate model.
Introduction to low frequency Π and T models
Special Devices: working of UJT, SCR, DIAC, TRIAC and CCD.
UNIT V
Junction Field Effect Transistors (JFET): JFET formation, operation & current flow, pinch-off
voltage, V-I characteristics of JFET. JFET biasing-zero current drift biasing, biasing against device
variations. Low frequency small signal model of FETs. Analysis of CS, CD and CG amplifiers and
their comparison. FET as an amplifier and as a switch. MOSFETs: MOSFETs, Enhancement &
Depletion mode MOSFETs, V-I characteristics. MOSFET as resistance, Biasing of MOSFETs,
MOSFET as a switch
Suggested Reading:
1. Jacob Millman, Christos C. Halkias, and Satyabrata Jit, Electronic Devices and Circuits, 3rd
ed.,McGraw Hill Education, 2010.
2. David A. Bell, Electronic Devices and Circuits, 5th
ed., Oxford University Press, 2009.
3. Robert Boylestad and Louis Nashelsky, Electronic Devices and Circuit Theory, 11th
ed.,Pearson
India Publications, 2015.
4. S Salivahanan, N Kumar, and A Vallavaraj, Electronic Devices and Circuits, 2nd
ed., McGraw
Hill Education, 2007.
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ME 221
ELEMENTS OF MECHANICAL ENGINEERING
(ECE)
Instructions 4 Periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Course Objectives:
1. To understand the basic concepts of thermodynamics
2. To understand the working principles of Heat exchangers, I.C engines and compressors.
3. To understand the various manufacturing processes
4. To understand the various Refrigeration systems and refrigerants. 5. To familiarize the design and working principles of drives and transmission systems
UNIT-I
Thermodynamics: Concept of system, process and properties, laws of thermodynamics, concept of
entropy and Clausius inequality, steady flow energy equation for an open system.
IC Engines: Working of four stroke and two stroke petrol and diesel engine with p-V diagrams,
valve timing diagram, calculation of indicated power, brake power, specific fuel consumption,
mechanical and thermal efficiencies.
Reciprocating Air compressors: work done, efficiency of multistage compressors, effect of
clearance volume.
UNIT-II
Heat transfer: Basic modes of heat transfer, Fourier’s law of conduction, Newton’s law of cooling,
Stefan-Boltzmann law of radiation and one dimensional steady state conduction heat transfer
through plane walls without heat generation.
Heat exchangers: Classification and application of heat exchangers in industry, derivation of
LMTD in parallel and counter-flow heat exchangers and problems.
UNIT-III
Refrigeration: Types of refrigeration systems- Air refrigeration system, vapor compression system,
ammonia-water absorption refrigeration system, thermoelectric refrigeration system, COP and
representation of cycle on T-S and H-S diagrams, Types and properties of refrigerants, eco-friendly
refrigerants. Introduction to psychrometry and psychrometry processes.
UNIT-IV
Basic Manufacturing Processes: Welding, brazing, soldering, brief description of process and
parameters, associated principles of gas welding, arc welding.
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Casting: Sand casting, die casting, and principles and application.
Forming: Basic concepts of forming processes: Extrusion, rod/wire drawing, Forging and
Rolling.
Principles and Applications of basic Machining Processes: Turning, milling and grinding.
UNIT-V
Definition of kinematic link and pair, mechanism and machine, Gears: Classifications of gears,
nomenclature Gear Trains: Simple, compound, inverted and epi-cyclc gear trains.
Belt and Rope drives: Open and cross belt drives, length of belt, ratio of tensions of flat belt,
condition for maximum power transmission for flat belt.
Suggested Reading:
1. P.N. Rao, Manufacturing Technology, Vol. 1 & 2, Tata McGraw Hill publishing co, 2010.
2. Thomas Bevan Theory of Machines, CBS Publishers, 1995.
3. R.K. Rajput, Thermal Engineering, Laxmi Publications, 2005.
4. C. Sachdeva. Fundamentals of Engineering Heat and Mass transfer, Wiley Eastern Ltd,
2004.
5. Serope Kalpakjain and Steven R. Schmid, Manufacturing Engineering and Technology, 4th
ed., Pearson Education, 2013.
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EE 222
ELECTRICAL TECHNOLOGY
Instructions 4 Periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1. Familiarize with working of electrical circuits.
2. Explain basic principle operation of electrical machines.
UNIT I
DC Generators: Constructional details, Simple lap and wave windings, Methods of excitation,
Induced emf, Basic ideas of armature reaction and commutation, Characteristics of shunt, series and
compound generators and applications.
DC Motors: Torque developed in motors, Motor starter, Characteristics of shunt, series and
compound motors, Speed control of DC motors.
UNIT II
Balanced Three-Phase System: Star-delta connection, Relationship between line and phase
quantities, Measurement of power by Two-Wattmeter method, Operations of fluorescent lamp.
UNIT III
AC Generators: Construction, emf equation, Armature reaction, Synchronous impedance,
Regulation.
UNIT IV
Transformers: Single-phase transformer: Construction, Theory of operation, Phasor diagram under
no-load and loaded conditions, OC and SC tests on transformer, Efficiency and regulation, Auto
transformer, Theory of operation.
UNIT V
Induction Motors: Construction, Production of rotating magnetic field, Slip-torque characteristics,
Starters for cage and wound rotor induction motors, Single-phase induction motors, Construction,
Theory of operation, Characteristics of shaded pole, Split phase and Capacitor motors, Applications.
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Suggested Reading
1. Mehtha V.K., Principles of Electrical Engineering and Electronics, S.Chand & Co., 2010.
2. John Bird, Electrical Circuit theory and Technology, 4th
ed., Routledge Taylor & Francis Group,
2012.
3. Naidu MS. and Kamakshiah S., Introduction to Electrical Engineering,McGraw Hill Inida
Private Limited, 2010.
4. A. Chakrabarti, Sudipta Nath, Chandan Kumar Chanda, Basic Electrical Engineering, McGraw
Hill India Private Limited, 2009.
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EC 231
ELECTRONIC DEVICES LAB
Instruction 3 Periods per week
Duration of University Examination 3 Hours
University Examination 50 Marks
Sessional 25 Marks
Objectives:
1. Demonstrate the characteristics of Semiconductor diodes
2. Realize the filters and rectifiers with and without capacitors.
3. Demonstrate the characteristics of different transistor Configurations
4. Design of Biasing Circuits for BJT and FET Amplifiers
5. Simulate the Electronic circuits using PSPICE (Filters and Amplifiers)
List of Experiments:
1. V-I Characteristics of Silicon and Germanium diodes and measurement of static and dynamic
resistances
2. Zener diode characteristics and its application as voltage regulator
3. Design, realization and performance evaluation of half wave rectifiers without filters and
with LC & p section filters
4. Design, realization and performance evaluation of full wave rectifiers without filters and with
LC & Π section filters
5. Plotting the characteristics of BJT in Common Base configuration and measurement of h-
parameters
6. Plotting the characteristics of BJT in Common Emitter configuration and measurement of h-
parameters
7. Plotting the characteristics of JFET in CS configurations and measurement of Trans-
conductance and Drain resistance
8. BJT biasing circuits
9. FET biasing circuits
10. Common Emitter BJT Amplifier and measurement of Gain, bandwidth, input and output
impedances
11. Common Source FET Amplifier and measurement of Gain, bandwidth, input and output
impedances
12. Emitter Follower / Source Follower circuits and measurement of Gain, bandwidth, input and
output impedance
13. Characteristics of special devices-UJT and SCR
14. Characteristics of Tunnel diode and photo diode
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Suggested Reading:
1. Paul B. Zbar, Albert P. Malvino, Michael A. Miller, Basic Electronics, A Text - Lab Manual,
7th
ed., McGraw Hill Education, 2001.
2. David Bell, Fundamentals of electronic devices and circuits Lab Manual, 5th
ed., Oxford
university press, 2009.
3. R.C. Jaeger & T. N. Blalock, Micro Electronic circuit design, 4th
ed.,Mc Graw Hill Higher
Education, 2011.
4. Paul Tobin, PSPICE for Circuit Theory and Electronic Devices, Morgan & Claypool publishers, 1st
ed., 2007.
Note:
Analysis and design of circuits should be carried out using SPICE tools wherever possible a
minimum of 10 Experiments are to be performed
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EC 232
ELECTRONIC WORKSHOP AND SIMULATION LAB
Instruction 3 Periods per week
Duration of University Examination 3 Hours
University Examination 50 Marks
Sessional 25 Marks
Objectives:
1. Familiarize with the basic electronic components.
2. Use of different meters
3. Demonstrate the working & usage of CRO
4. Design of Printed Circuit Board (PCB)
5. Familiarize with simulation of circuits using available simulation tools.
PART – A
1. Study of all types of discrete Active & passive devices, display devices, integrated
components, electro mechanical components (switches, sockets, connectors etc.,)
electromagnetic components (relays).
2. Study and use of different meters (volt/ammeter, AVO/Multi meter) for the measurement of
electrical parameters. Measurement of RLC components using LCR Meter.
3. Study of CRO & its block diagram.
4. Measurement of voltage, frequency and Phase Angle using CRO
5. Study of DSO and Measurement of signals using DSO
6. Study of PDC Board and implementation of Digital Logic using Basic Gates.
7. Half Adder and Full Adder using Universal Gates
8. Verification of Truth Tables for all Flip- Flops
9. 3-bit Asynchronous counter using FFs and Decade counter using IC 7490.
10. PCB design of a small circuit with its layout
11. Soldering & De-soldering Exercises using discrete components & ICs for a specific circuit
requirement
PART – B
12. Introduction to simulation in schematics : To create / open schematic file, placing the
components in to the work space, Editing the components, wiring , using measuring
instruments like Ammeter, Volt meter, Ohm meter, CRO, LCR meter. Etc.
13. V-I Characteristics of diodes (si and zener), and Characteristics of CE transistor
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14. Analysis and Frequency Response of BJT and FET Amplifier. Procedure to configure
waveform generators and Displays in the work space.
Note: not less than 12 experiments need to be executed in the semester. Students may use any
commercial / open source SPICE programs available like MULTISIM, PSPICE, TINA, LAB VIEW
etc.
Suggested Reading:
1. Zbar, P.B. Basic Electronics. A Text-Lab Manual, 7th
ed., McGraw Hill Education, 1995.
2. James M. Kirkpatric, Electronic Drafting and Printed Circuits Board design, Galgotia
Publisher, 1988.
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EC 221
ELECTRONIC ENGINEERING – I
(For EEE and EIE)
Instruction 4 Periods per Week
Duration of University Examination 3Hours
University Examination 75Marks
Sessional 25Marks
Objectives:
1. Obtain the characteristics of diode in forward and reverse bias and perform mathematical
modeling of diode as a resistor and capacitor.
2. Perform analysis and design of a complete AC to DC converter consisting of Rectifiers,
Filters and regulators.
3. Describe the construction and working of a Bipolar Junction Transistor in various modes
(CE, CB, CC) and design circuits for stabilization and compensation of a BJT.
4. Convert the BJT into its equivalent h parameter model and perform exact and approximate
analysis of BJT Amplifiers in mid frequency region for different modes of operation.
5. Describe the construction and working of JFET and MOSFET and design FET based
amplifiers.
UNIT I
Junction Diode : Different types of PN Junction formation techniques, PN Junction Characteristics,
biasing- band diagrams and current flow, Diode current equations under forward bias and reverse
bias conditions, Junction breakdown in diodes and breakdown voltages, effect of temperature on
diode characteristics, Zener Diodes, Zener voltage regulator and its limitation.
UNIT II
PN Diode Applications: Half wave, Full wave and Bridge rectifiers - their operation, performance
characteristics, and analysis; Filters (L, C, LC and CLC filters) used in power supplies and their
ripple factor calculations, design of Rectifiers with and without Filters.
Specials Diodes: Elementary treatment on the functioning of Tunnel diode, Varactor, Photo, Light
Emitting diodes. Liquid Crystal Display. CRO: study of block diagram of CRO
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UNIT III
Bipolar Junction Transistor : Transistor Junction formation (collector-base, base-emitter
Junctions) Transistor biasing-band diagram for NPN and PNP transistors, current components and
current flow in BJT, Modes of transistor operation, Early effect, BJT input and output characteristics
in CB, CE CC configuration, BJT as an amplifier, BJT biasing techniques, Thermal runway, heat
sinks and thermal stabilization, operating point stabilization against temperature and device
variations, stability factors, Bias stabilization and compensation techniques, Biasing circuit design.
UNIT IV
Small Signal Transistors equivalent circuits : Small signal low frequency h-parameter model of
BJT, Determination of h parameters, analysis of BJT amplifiers using h-parameter, comparison of
CB, CE and CC amplifier configurations, Analysis of BJT amplifier with approximate model.
Introduction to low frequency pi and T models.
Special Devices: working of UJT, SCR, DIAC, TRIAC and CCD.
UNIT V
Junction Field Effect Transistors (JFET): JFET formation, operation & current flow, pinch-off voltage, V-I characteristics of JFET. JFET biasing. Low frequency small signal model of FETs.
Analysis of CS, CD and CG amplifiers and their comparison. FET as an amplifier and as a switch. MOSFETs: MOSFETs, Enhancement & Depletion mode MOSFETs, V-I characteristics.
Suggested Reading:
1. Jacob Millman, Christos Halkias, Satyabrata jit, Electronics Devices and Circuits, 3rd
ed.,
McGraw Hill Education (India) Private Limited, 2010.
2. S Salivahanan, N Kumar, and A Vallavaraj, Electronic Devices and Circuits, 2nd
ed.,
McGraw Hill Education (India) Private Limited, 2007.
3. Millman J., Halkias C.C. and Parikh C, Integrated Electronics, 2nd
ed., McGraw Hill
Education (India) Private Limited, 2009.
4. Donald L Schilling and Charles Belove, Electronics Circuits, Discrete & Integrated, 3rd
ed.,
McGraw Hill Education (India) Private Limited, 1989.
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EC 222
BASIC ELECTRONICS
(For CSE, Mechanical and Production)
Instruction 4 Periods per Week
Duration of University Examination 3Hours
University Examination 75Marks
Sessional 25Marks
Objectives:
1. Analyze the behavior of Semiconductor diodes in Forward and Reverse bias
2. Design of Half wave and Full wave rectifiers with L,C,LC & CLC Filters
3. Explore V-I characteristics of Bipolar Junction Transistor in CB,CE & CC configurations
4. Explain feedback concept and different oscillators.
5. Analyze Digital logic basics and Photo Electric devices.
UNIT I
Semi Conductor Theory: Energy levels, Intrinsic and Extrinsic Semiconductor, Mobility, Diffusion
and Drift current. Hall Effect, Characteristics of P-N Junction diode, Parameters and Applications.
Rectifiers: Half wave and Full wave Rectifiers (Bridge, center tapped ) with and without filters,
ripple, regulation and efficiency. Zener diode regulator
UNIT II
Bipolar Junction Transistor: BJT, Current components, CE, CB, CC configurations, characteristics,
Transistor as amplifier. Analysis of CE, CB, CC Amplifiers (qualitative treatment only).
JFET: Construction and working, parameters, CS, CG, CD Characteristics, CS amplifier.
UNIT III
Feedback concepts: Properties of negative feedback amplifiers, Classification, Parameters.
Oscillators: Barkhausen Criterion, LC Type and RC type oscillators and crystal oscillator.
(Qualitative treatment only)
UNIT IV
Operational Amplifiers – Introduction to OP Amp, characteristics and applications - Inverting and
Non-inverting Amplifiers, Summer, Integrator, Differentiator, Instrumentation Amplifier.
Digital System: Basic Logic Gates, Half, Full Adder and Subtractors.
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UNIT V
Data Acquisition systems: Study of transducer (LVDT, Strain gauge, Temperature, Force).
Photo Electric Devices and Industrial Devices: Photo diode, Photo Transistor, LED, LCD,
SCR, UJT Construction and Characteristics only.
Display Systems: Constructional details of C.R.O and Applications.
Suggested Reading:
1. Jacob Millman, Christos Halkias, Satyabrata jit, Electronics Devices and Circuits ,3rd
ed.,
McGraw Hill Education (India) Private Limited, 2010
2. Ramakanth A. Gayakwad, Op-AMPS and Linear Integrated Circuits, 4th
ed., Prentice Hall of
India, 2000.
3. M. Morris Mano, Digital Design, 3rd
edition, Prentice Hall of India, 2002.
4. William D Cooper, and A. D. Helfrick, Electronic Instrumentations and Measurement
Techniques, 2nd
ed., Prentice Hall of India, 2008.
5. S. Shalivahan, N. Suresh Kumar, A. Vallava Raj, Electronic Devices and Circuits, 2nd
Edition,
McGraw Hill Education (India) Private Limited, 2007.
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EC 241
ELECTRONICS ENGINEERING – I LAB
(For EEE and EIE)
Instruction 3 Periods per Week
Duration of University Examination 3Hours
University Examination 50Marks
Sessional 25Marks
Objectives:
1. Obtain V-I Characteristics of PN, Zener diodes, Tunnel and photo diodes, UJT, SCR, BJT
and JFET.
2. Design rectifier circuits with and without capacitor filters.
3. Explain the working principle of CRO.
List of Experiments:
1. V-I Characteristics of Silicon and Germanium diodes and measurement of static and dynamic
resistances.
2. Zener diode characteristics and its application as voltage regulator
3. Design, realization and performance evaluation of half wave rectifiers without filters and with
LC & π-section filters.
4. Design, realization and performance evaluation of full wave rectifiers without filters and with
LC & π- section filters.
5. Plotting the characteristics of BJT in Common Emitter configuration and measurement of h-
parameters
6. Plotting the characteristics of JFET in CS configurations and measurement of Trans-
conductance and Drain resistance
7. Study on CRO and its Application
8. BJT biasing circuits and calculation of DC conditions
9. Common Emitter BJT Amplifier and measurement of Gain, bandwidth, input and output
impedances
10. Common Source FET Amplifier and measurement of Gain, bandwidth, input and output
impedances
11. Characteristics of special devices-UJT or SCR
12. Characteristics of Tunnel diode and photo diode
Suggested Reading:
1. Paul B. Zbar, Albert P. Malvino, Michael A. Miller, Basic Electronics, A Text - Lab Manual, 7th
ed., McGraw Hill Education, 2001.
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General Note:
1. The experiments should be performed on bread board using discrete components.
2. There should not be more than 2 students per batch while performing any of the lab
experiment.
3. A minimum of 10 experiments should be performed.
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EC 242
BASIC ELECTRONICS LAB (For CSE, Mechanical and Production)
Instruction 3 Periods per Week
Duration of University Examination 3Hours
University Examination 50Marks
Sessional 25Marks
Objectives:
1. Demonstrate the characteristics of Semiconductor diodes
2. Realize the filters and rectifiers.
3. Verify the characteristics of different transistor Configurations
4. Design of Biasing Circuits for BJT and FET Amplifiers
5. Design different circuits using Operational Amplifiers. List of Experiments:
1. CRO-Applications, Measurements of R, L and C using LCR meter, Color code method and
soldering practice.
2. Characteristics of Semiconductors diode (Ge, Si and Zener)
3. Static Characteristics of BJT-Common Emitter
4. Static Characteristics of BJT-Common Base
5. Static Characteristics of FET
6. RC-Phase Shift Oscillator
7. Hartley and Colpitt’s Oscillators
8. Common Emitter Amplifier
9. Astable Multivibrator
10. Full-wave rectifier with and without filters using BJT
11. Operational Amplifier Applications
12. Strain Gauge Measurement
13. Analog-to-Digital and Digital to Analog Converters
Suggested Reading:
1. David Bell A., Operational Amplifiers and Linear ICS, Prentice Hall of India, 2005.
2. David Bell A., Laboratory Manual for Electronic Devices and Circuits, Prentice Hall of India,
2007.
3. Boylestad R.L and Nashelsky, Electronics Devices and Circuit Theory, Prentice Hall of India,
2006.
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SCHEME OF INSTRUCTION AND EXAMINATION
BE II YEAR
(ELECTRONCIS AND COMMUNICATION ENGINEERING)
SEMESTER – II
S.No. Code No. Subject Scheme of
Instruction Scheme of Examination
THEORY L/T D/P
Duration
in Hours
Max. Marks
Univ.
Exams
Sessionals
1 EC 251 Analog Electronic
Circuits 4 - 3 75 25
2 EC 252 Networks and
Transmission Lines 4 - 3 75 25
3 EC 253
Probability Theory
and Stochastic
Processes
4 - 3 75 25
4 EC 254
Signal Analysis and
Transform
Techniques
4 - 3 75 25
5 EC 255 Switching Theory
and Logic Design 4 - 3 75 25
6 CE 222 Environmental
Studies 4 - 3 75 25
PRACTICALS
1 EC 281 Analog Electronic
Circuits Lab - 3 3 50 25
2 EE 292 Electrical
Technology Lab - 3 3 50 25
TOTAL 24 6 550 200
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SCHEME OF INSTRUCTION AND EXAMINATION
BE II YEAR
(SERVICE COURSES OFFERED TO OTHER DEPARTMENTS)
SEMESTER – II
S.No. Code No. Subject Scheme of
Instruction Scheme of Examination
THEORY L/T D/P
Duration
in Hours
Max. Marks
Univ.
Exams
Sessionals
1 EC 271
Electronics
Engineering – II
(for EEE and
EIE)
4 - 3 75 25
2 EC 272
Basic Electronics
(for Mech., and
Prod.,)*
4 - 3 75 25
PRACTICALS
1 EC 291
Electronics
Engineering - II
Lab
(for EEE and
EIE)
- 3 3 50 25
2 EC 292
Basic Electronics
Lab
(for Mech.,
Prod.,)**
- 3 3 50 25
TOTAL 8 6 250 100
*Syllabus same as EC 222
**Syllabus same as EC 242
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EC 251
ANALOG ELECTRONIC CIRCUITS
Instructions 4 Periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1. Analyze frequency response of Amplifiers.
2. Familiarize with concept and effect of Negative Feedback
3. Design oscillators and Regulators.
4. Design Power Amplifiers.
5. Familiarize with concept of tuned Amplifiers.
UNIT I
Small signal amplifiers: Classification of amplifiers. Mid-frequency, Low-frequency and high
frequency analysis of single and Multistage RC coupled amplifier with BJT & FET. Analysis of
Transformer coupled amplifier at mid-frequency, low-frequency and high frequency.
UNIT II
Feed Back Amplifiers: The feedback concept, General characteristics of negative feedback
amplifier, Effect of negative feedback on input and output impedances, voltage and current, series
and shunt feedbacks, Stability considerations, Local Versus global feedback.
UNIT III
Oscillators: Positive feedback and conditions for sinusoidal oscillations, RC oscillators, LC
oscillators, Crystal oscillator, Amplitude and frequency stability of oscillator.
Regulators: Transistorized series and shunt regulators.
UNIT IV
Large Signal Amplifiers: BJT as large signal audio amplifiers, Classes of operation, Harmonic
distortion, power dissipation, efficiency calculations. Design considerations of transformer coupled
and transform less push- pull audio power amplifiers under Class-A, Class-B, Class-D and Class-AB
operations.
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UNIT V
R.F. Voltage Amplifiers: General considerations, Analysis and design of single tuned and double
tuned amplifiers with BJT, selectivity, gain and bandwidth. Comparison of multistage, single tuned
amplifiers and double tuned amplifiers. The problem of stability in RF amplifiers, neutralization and
uni-laterisation, introduction to staggered tuned amplifier.
Suggested Reading:
1. Jacob Millman, Christos Halkias, Chetan Parikh, Integrated Electronics, 2nd
ed., McGraw Hill
Education (India) Private Limited, 2011.
2. S Salivahanan, N Kumar,and A Vallavaraj, Electronic Devices and Circuits, McGraw Hill,3rd
edition, 2010.
3. Donald Schilling, Charles Belove, Tuvia Apelewicz, Raymond Saccardi, Electronic Circuits:
Discrete And Integrated, TMH, 3rd
edition, 2002.
4. Donald A.Neamen, Electronic Circuits: Analysis and Design, 3rd
edition, McGraw Hill, 2006.
5. Allen Mottershead, Electronic Devices and Circuits: An introduction, 2009.
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EC 252
NETWORKS AND TRANSMISSION LINES
Instruction 4 periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1. Analyze concepts of Symmetrical and Asymmetrical Networks
2. Design different types of filters
3. Explain attenuators and their design
4. Explore the concepts of transmission lines
5. Explain characteristics and parameters of transmission lines.
UNIT-I
Asymmetrical networks, Image and Iterative impedances. Image transfer constant and iterative
transfer constant. Symmetrical networks, characteristic impedance and propagation constant.
Properties of L, T and Pi section types.
UNIT-II
Constant K-filters – low pass, high pass, band pass, band elimination filter design, m-derived — low
pass, high pass, band pass, band elimination filter design and composite filter design. Notch filter.
UNIT-III
Network synthesis: Hurwitz polynomials, positive real functions, L-C Immitance functions, RC
impedance functions and RL admittance functions. RL impedance functions and RC admittance
functions. Cauer And Foster’s forms of RL impedance and RC admittance
Attenuators and their design. Equalizers and their design. Impedance matching networks. Inverse
network elements.
UNIT-IV
Properties of transmission lines. Transmission line equations from source and load end. The finite
and infinite lines. Velocity of propagation, input impedance. Open and short circuited lines,
telephone cables, distortion less transmission, loading of cables, Campbell’s formula.
UNIT-V
Properties of Transmission lines at UHF, Reflection co-efficient, Standing waves and SWR,
Distribution of voltages and currents on loss less line. Characteristics of half wave, Quarter-wave
and one eighth wave lines. Construction and applications of Smith chart. Transmission line
matching. Single and double stub matching.
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Suggested Reading:
1. John D. Ryder, Networks, Lines and Fields, PHI, 2nd edition, 2009.
2. M.E. Van Valkenburg, Network Analysis, PHI, 3rd edition, 2009.
3. S.P. Ghosh and A.K. Chakraborty, Network Analysis and Synthesis, McGraw Hill,
1st edition, 2009.
4. Roy, Choudhury D., Networks and Systems, New Age International Publishers,
2nd edition, 2010.
5. Ghosh, Smarjit, Network Theory : Analysis and Synthesis, 1st ed.,PHI, 2009.
EC 253
PROBABILITY THEORY AND STOCHASTIC PROCESSES
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Instruction 4 periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1. Define different types of random variables and their density and distribution functions
2. Analyze one random variable and characteristic functions of different variables using their
density or distribution functions.
3. Define the functions of two random variables and probability density and distribution of the
functions
4. Explain the concepts of sequences of random variables, Properties of Random vectors.
5. Explore elementary concepts of the Random Processes
UNIT I
Concepts of Probability and Random Variable: Definitions, Probability and Induction, Causality
versus Randomness, Review of Set Theory, Probability Space, Conditional Probability. Repeated
Trials Combined Experiments, Bernoulli Trials, Bernoulli’s Theorem and Games of Chance.
Random Variable: Definition, Distribution and Density Functions, Specific Random Variables and
their probability density and distribution functions: Normal, Exponential, Gamma, Chi-Square,
Raleigh, Nakagami-m, Uniform, Beta, Cauchy, Laplace and Maxwell, Bernoulli, Binomial, Poisson,
Geometric, Negative Binomial Conditional Distributions, Asymptotic Approximations for Binomial
Random Variable
UNIT II
Functions of One Random Variable Function of a random Variable g(x), The Distribution of g(x),
Mean and Variance, Moments, Characteristic Functions
UNIT III
Two Random Variables Bi-variate Distributions, One Function of Two Random Variables, Two
Functions of Two Random Variables, Joint Moments, Joint Characteristic Functions, Conditional
Distributions, Conditional Expected Values
UNIT IV
Sequences of Random Variables General Concepts, Conditional Densities, Characteristic
Functions, and Normality, Mean Square Estimation, Stochastic Convergence and Limit, Theorems.
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Random Numbers: Meaning, Generation of random sequence and pseudo random binary sequence.
Applications of random numbers
UNIT V
Stochastic Processes General and elementary concepts and definitions of stationary, ergodic,
random processes and independence, spectral density, white and color noise, response to linear
systems and stochastic inputs, Markov Processes.
Suggested Reading:
1. A Papoulis, S.U. Pillai, “Probability, Random Variables and Stochastic Processes”, 4th
edition,
Mc-Graw Hill. 2008.
2. Peyton Z Peebles, “Probability, Random Variables & Random Signal Properties”, 4th
ed.,
McGraw Hill Education (India) Private Limited, 2002.
3. Henry Stark and John W.Woods “Probability and Random Processes with Application to Signal
Processing” 4th ed., Pearson Publications, 2011.
EC 254
SIGNAL ANALYSIS AND TRANSFORM TECHNIQUES
Instructions 4 Periods per week
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Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1. Analyze basic concepts related to signals and systems.
2. Familiarize with basic operations on signals and mathematical representation of periodic and
aperiodic signals.
3. Define convolution, correlation operations on continuous signals.
4. Define the characterization of system using constant coefficient difference equations.
5. Analyze the response of systems upon application of step and ramp inputs using Fourier and
Z transforms.
UNIT I
Definitions and classifications: Classification of continuous time signals. Basic operations on
continuous-time signals and classification of continuous-time systems.
Discrete-time signals and systems: Sampling, Classification of discrete-time signals, Basic
operations on discrete time signals, Classification of discrete time systems, properties of systems.
UNIT II
Representation of Continuous-time signals: Analogy between vectors and signals, signal
representation by a discrete- set of orthogonal functions, orthogonality and completeness.
Fourier series – Trigonometric and Exponential Fourier series, computational formulae, symmetry
conditions, the complex Fourier spectrum. Solution of wave equation and Laplace equation
Fourier Transform (FT): The direct and inverse FT, existence of FT, Properties of FT, The
Frequency Spectrum.
UNIT III
Laplace Transform (LT): The direct LT, Region of convergence, existence of LT, properties of
LT. The inverse LT, Solution of differential equations, system transfer function.
Linear Convolution of continuous time signals: Graphical interpretation, properties of convolution,
Correlation between continuous-time signals: Auto and Cross correlation, graphical interpretation,
properties of correlation.
UNIT IV
Z-Transform: The direct Z transform, Region of convergence, Z-plane and S-plane correspondence.
Inverse Z transform, Properties of Z-transforms, Solution to linear difference equations, Linear
constant coefficient systems, System transfer function
UNIT V
Discrete Fourier series, Frequency domain Representation of discrete-time systems and signals.
Sampling the z-transform.
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Linear Convolution of discrete time signals: Graphical interpretation, properties of discrete
convolution.
Correlation between discrete time signals: Auto and Cross-correlation, graphical interpretation,
properties of correlation.
Suggested Reading:
1. B.P. Lathi, Signals, Systems and Communication, 1st ed., BS Publications, 2011.
2. Alan V. Oppenheim, Alan S. Wilsky and S. Hamid Nawab, Signals and Systems, 2nd
ed., PHI,
2009.
3. Luis F. Chaparro, Signals and Systems using MATLAB, Academic press, 2011.
4. Alan V Oppenheim and Ronald W. Schafer, Digital Signal Processing, 1st ed., PHI, 2008.
5. P. Ramakrishna Rao, Signals and Systems, 2nd
ed., McGraw Hill Education (India) Private
Limited, 2013.
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EC 255
SWITCHING THEORY AND LOGIC DESIGN
Instructions 4 Periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1. Familiarize with concepts of number systems and Boolean Algebra
2. Analyze minimization techniques of Boolean functions
3. Design combinational circuits
4. Design sequential circuits
5. Design and analyze Synchronous counters
UNIT I
Number system and Codes: Binary, Octal, Hexa Decimal numbers, Number base conversion,
Signed binary numbers: 1’s Complement, 2’s complement, Types of codes: Weighted , Un Weighted
code, BCD, Excess -3 code, Development of Gray code, Parity code
Boolean Algebra: Properties of Boolean algebra, Basic Laws and Theorems, DeMorgan’s theorem,
Switching Functions, definitions, simplifications, Canonical and Standard Forms, Logic Gates,
Functional Properties.
UNIT II
Minimization of Switching Functions: The Map Method (K-Map), 5-variable map, Minimal
Functions and their properties. Prime implicants, Essential Prime Implicants, Quine-McCluskey
Tabular Method, Don’t – care combinations
Logic Design realization: Design with basic logic gates, Single Output and Multiple Output
Combinational Logic Circuit Design, AND-OR, OR-AND and NAND/NOR Realizations,
Exclusive-OR and Equivalence Functions.
UNIT III
Combinational Logic Design: Comparators, multiplexer and its applications, decoders,
demultiplexers, priority encoders, Code Conversion, Parity generator and checker, BCD to seven
segment decoder; ROM as a combination of decoder with encoder;
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Full Adder and Subtractor, Serial adder, Ripple carry adder and Carry-look ahead adder. Twos
complement ADD/ Subtractor, Decimal adder;
Implementing Boolean functions with IC 74151, IC 74153,IC 74138.
Contact Networks, Hazards: Static Hazards, Design of Hazard-Free Switching Circuits.
UNIT IV
Sequential Logic Design: Memory element, S-R, J-K and D Latch operation, Race around
condition, Master Salve J-K Flip Flop, Flip-Flop types: S-R, J-K, D, T, State table, State diagram,
Characteristic equation and excitation table, Set up and hold time, Flip flop conversions.
UNIT V
Sequential Logic Design: Classification, state diagram, state table, Asynchronous and Synchronous
counters, Skipping state counter, Counter Lock – out, Shift registers and applications. Implementing
counters with IC 7476, IC 7474, IC 7490, IC 7492, IC 7493.
Suggested Reading:
1. Mano M., Digital Design, Prentice Hall, New Delhi, 2008.
2. Zvi Kohavi, Switching and Finite Automata Theory, 3rd
ed., Cambridge University Press-New
Delhi, 2011.
3. Ronald j Tocci, Neal s Widmer, Gregory L Moss, Digital Systems: Principles and applications,
Prentice Hall India, 2009.
4. R. P Jain, Modern Digital Electronics,4th
ed., McGraw Hill Education (India) Private Limited,
2003
5. John F Wakerly, Digital Design Principles and practices, 4th
ed., Pearson India, 2008.
6. Fletcher, William, An Engineering approach to digital design, 1st ed., Prentice Hall India, 2009..
7. Herbert Taub, Donald L.Schilling, Digital Integrated electronics, 1sted., McGraw Hill Education
(India) Private Limited, 2010.
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CE 222
ENVIRONMENTAL STUDIES
Instructions 4 Periods per week
Duration of University Examination 3 Hours
University Examination 75 Marks
Sessionals 25 Marks
Objectives:
1.To study the sources of water, floods and its impact on environment.
2. To know about the ecosystem and energy resource system.
3.To understand the biodiversity concepts and its advantages.
4.To study different types of pollution and its impact on environment.
5.To know the social and environment related issues and their preventive measures.
UNII-I
Environmental studies: Definition, scope and importance, need for public awareness. Natural
resources: Water resources; use and over utilization of surface and ground water, floods, drought,
conflicts over water, dam’s benefits and problems. Effects of modern agriculture, fertilizer-pesticide
problems, water logging salinity. Energy resources, growing energy needs, renewable and non-
renewable energy sources. Land Resources, land as a resource, land degradation, soil erosion and
desertification.
UNIT-II
Ecosystems: Concepts of an ecosystem, structure and functions of an ecosystem, producers,
consumers and decomposers, energy flow in ecosystem, food chains, ecological pyramids, aquatic
ecosystem (ponds, streams, lakes, rivers, oceans, estuaries).
UNIT-III
Biodiversity: Genetic species and ecosystem diversity, bio-geographical classification of India.
Value of biodiversity, threats to biodiversity, endangered and endemic species of India,
conservation of biodiversity.
UNIT-IV
Environmental Pollution: Causes, effects and control measures of air pollution, water pollution,
soil pollution, noise pollution, thermal pollution and solid waste management, Environment
Protection Act; Air, water, forest and wild life acts, issues involved in enforcement of
environmental legislation.
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UNIT-V
Social Aspects and the Environment: Water conservation, watershed management, and
environmental ethics. Climate change, global warming, acid rain, ozone layer depletion.
Environmental protection act, population explosion.
Disaster Management: Types of disasters, impact of disasters on environment, infrastructure and
development. Basic principles of disaster mitigation, disaster management, and methodology,
disaster management cycle, and disaster management in India.
Suggested Reading :
1. A. K. De, Environmental Chemistry, New Age Publications, 2002.
2. E. P. Odum, Fundamentals of Ecology, W.B. Sunders Co., USA.
3. GL. Karia and R.A. Christian, Waste Water Treatment, Concepts and Design Approach,
Prentice Hall of India, 2005
4. Benny Joseph, Environmental studies, TataMcGraw-Hill, 2005
5. V. K. Sharma, Disaster Management, National Centre for Disaster Management, IIPE, Delhi,
1999.
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40
EC 281
ANALOG ELECTRONIC CIRCUITS LAB
Instructions 3 Periods per week
Duration of University Examination 3 Hours
University Examination 50 Marks
Sessionals 25 Marks
Objectives:
1. Verify frequency response of BJT and FET amplifiers
2. Design different negative feedback amplifiers circuits
3. Design AF and RF oscillator circuits.
4. Design power amplifiers
5. Demonstrate various circuits using PSPICE and verifying functionality.
6. Design Network Theorems and passive filters.
Lab Experiments:
PART – A
1. Design & frequency response of single stage and multistage RC Coupled amplifier using BJT.
2. Design & frequency response of single stage and multistage RC Coupled amplifier using FET.
3. Voltage series feedback amplifier.
4. Current shunt feedback amplifier.
5. Voltage shunt feedback amplifier.
6. Current series feedback amplifier.
7. RC phase shift, Wein bridge oscillator.
8. Hartley oscillator & Colpitts Oscillator.
9. Design of Class-A power amplifier.
10. Design of Class-B power amplifier.
11. Frequency response of Tuned Amplifiers (Single and Double).
12. Transistor regulator.
13. & 14.Simulation experiments using PSPICE
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PART – B
1. Thevenin’s and Norton’s Theorems
2. Maximum Power Transfer, Superposition and Millman’s Theorems
3. Two-Port Parameters
4. Series and Parallel Resonance
5. Constant K low pass and high pass filter
6. m-derived low pass and high pass filter
Suggested Reading:
1. Paul B. Zbar, Albert P.Malvino, Michael Miller, Basic Electronics, A Text- Lab Manual,7th
ed.,
McGraw Hill Education (India) Private Limited,2001.
2. David Bell A, Laboratory Manual for Electrical Circuits, PHI-New Delhi, 2009.
3. Hayt W H Kemmerly J.E and Durbin SM, Engineering Circuit Analysis, 8th
ed., McGraw Hill
Education (India) Private Limited, 2013.
Note:
1. A total of not less than 12 experiments must be carried out during the semester. (Where ever
possible, more than 1 lab experiment should be carried out in one lab session of 3 periods per
week.)
2. The experiments should be performed on bread board using discrete components.
3. There should not be more than 2 students per batch while performing any of the lab
experiment.
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42
EE 292
ELECTRICAL TECHNOLOGY LAB
Instructions 3 Periods per week
Duration of University Examination 3 Hours
University Examination 50 Marks
Sessionals 25 Marks
Objectives:
1. Demonstrate characteristics of generators and motors.
2. Design speed control methods of induction meter
3. Measure three-phase power.
List of Experiments:
1. Magnetization curve of a separately excited DC generator.
2. Load characteristics of a shunt generator.
3. Load characteristics of a series generator.
4. Performance characteristics of a DC shunt motor.
5. Load characteristics of a DC series motor.
6. Performance characteristics of a compound motor.
7. Speed control of DC motor.
8. O.C. and S.C. tests on single phase transformer.
9. Load test on single phase transformer.
10. Performance characteristics of a three phase induction motor.
11. Speed control methods of induction motors.
12. Regulation of alternator by O.C. and S.C. tests.
13. Measurement of three-phase power by Two Wattmeter method.
Note: At least 10 Experiments should be conducted in the semester
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EC 271
ELECTROINCS ENIGNEERING – II
(For EEE and EIE)
Instruction 4 Periods per Week
Duration of University Examination 3Hours
University Examination 75Marks
Sessionals 25Marks
Objectives:
1. Identify the components that effect the frequency response and analyze the single and multi
stage amplifiers
2. Recognize the type of feedback and analyze its effect on amplifier’s characteristics
3. Calculate the frequency of oscillation for different types of oscillator circuits suited for
various applications using Barkhausen’s criterion
4. Identify the importance of power amplifiers and calculate the efficiencies of class –A, B, AB
and examine the effect on distortion
5. Identify the linear and non-linear wave shaping circuits for various waveforms & analyze
their response.
UNIT-I
Multistage amplifiers: Classification of amplifiers, Low, mid and high Frequency response of
single stage RC coupled amplifiers, step response of amplifier, Cascading of amplifier, Interacting
and non interacting amplifiers, effect of cascading on gain and Bandwidth.
UNIT-II
Feed Back Amplifiers: The feedback concept, General characteristics of negative feedback
amplifier, Effect of negative feedback on input and output impedances, Voltage and current, series
and shunt feedbacks. Stability considerations, Local Versus global feedback.
UNIT-III
Oscillators: Bark-hausen Criterion, RC oscillator, Weinbridge, Phase shift, LC Hartley and
colpitts oscillator, Crystal controlled oscillator, (Analysis oscillators using BJTs only) frequency
stability of oscillator.
UNIT-IV
Large Signal Amplifiers: BJT as large signal audio amplifiers, Classes of operation, Harmonic
distortion, power dissipation, efficiency calculations. Design considerations of transformer coupled
and transform less push-pull audio power amplifiers under Class-A. Class-B, Class D and Class-AB
operations
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UNIT-V
Wave-Shaping Circuits: RC Low Pass and High Pass circuit, response to Step, Pulse, Ramp and
square wave inputs, Differentiating and Integrating circuits using diode, Clipping Circuits for Single
level and two levels, Clamping Circuits.
Suggested Reading:
1. Jacob Millman, Christos Halkias, satyabrata jit, Electronics Devices and circuits ,3rd
ed.,McGraw Hill Education (India) Private Limited, 2010.
2. Jacob Millman, Christos Halkias, Chetan Parikh, Integrated Electronics, 2nd
ed., McGraw
Hill Education (India) Private Limited, 2011.
3. Donald L Schilling & Charles Belove, Electronics Circuits, Discrete & Integrated, 3rd
ed.,
McGraw Hill Education (India) Private Limited, 2002.
4. Jacob Millman and Herbert Taub, Pulse, Digital and Switching waveforms, 3rd
ed., McGraw
Hill Education (India) Private Limited, 2011.
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45
EC 272
BASIC ELECTRONICS
(For Mechanical, Production and CSE)
Instruction 4 Periods per Week
Duration of University Examination 3Hours
University Examination 75Marks
Sessional 25Marks
Objectives:
1. Analyze the behavior of Semiconductor diodes in Forward and Reverse bias
2. Design of Half wave and Full wave rectifiers with L,C,LC & CLC Filters
3. Explore V-I characteristics of Bipolar Junction Transistor in CB,CE & CC configurations
4. Explain feedback concept and different oscillators.
5. Analyze Digital logic basics and Photo Electric devices.
UNIT I
Semi Conductor Theory: Energy levels, Intrinsic and Extrinsic Semiconductor, Mobility, Diffusion
and Drift current. Hall Effect, Characteristics of P-N Junction diode, Parameters and Applications.
Rectifiers: Half wave and Full wave Rectifiers (Bridge, center tapped ) with and without filters,
ripple, regulation and efficiency. Zener diode regulator
UNIT II
Bipolar Junction Transistor: BJT, Current components, CE, CB, CC configurations, characteristics,
Transistor as amplifier. Analysis of CE, CB, CC Amplifiers (qualitative treatment only).
JFET: Construction and working, parameters, CS, CG, CD Characteristics, CS amplifier.
UNIT III
Feedback concepts: Properties of negative feedback amplifiers, Classification, Parameters.
Oscillators: Barkhausen Criterion, LC Type and RC type oscillators and crystal oscillator.
(Qualitative treatment only)
UNIT IV
Operational Amplifiers – Introduction to OP Amp, characteristics and applications - Inverting and
Non-inverting Amplifiers, Summer, Integrator, Differentiator, Instrumentation Amplifier.
Digital System: Basic Logic Gates, Half, Full Adder and Subtractors.
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UNIT V
Data Acquisition systems: Study of transducer (LVDT, Strain gauge, Temperature, Force).
Photo Electric Devices and Industrial Devices: Photo diode, Photo Transistor, LED, LCD,
SCR, UJT Construction and Characteristics only.
Display Systems: Constructional details of C.R.O and Applications.
Suggested Reading:
1. Jacob Millman, Christos Halkias, Satyabrata jit, Electronics Devices and circuits ,3rd
ed.,
McGraw Hill Education India Private limited,2010.
2. Ramakanth A. Gayakwad, Op-AMPS and Linear Integrated Circuits, 4th
ed., Prentice Hall of
India, 2000.
3. M. Morris Mano, Digital Design, 3rd
ed., Prentice Hall of India, 2002.
4. William D Cooper, aand A. D. Helfrick, Electronic Instrumentations and Measurement
Techniques, 2nd
ed., PHI 2008.
5. S. Shalivahan, N. Suresh Kumar, A. Vallava Raj, Electronic Devices and Circuits,3rd
ed.,
McGraw Hill Education India Private limited, 2012.
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EC 291
ELECTRONICS ENGINEERING – II LAB
(For EEE and EIE)
Instruction 3 Periods per Week
Duration of University Examination 3Hours
University Examination 50Marks
Sessional 25Marks
Objectives:
1. Evaluate the frequency response of amplifier circuits.
2. Design various oscillator circuits.
3. Design power amplifier, clipper and clamper circuits.
List of Experiments
1. Frequency response of two stage RC Coupled BJT amplifier
2. Current-Series Feedback Amplifier with & with-out Feedback
3. Voltage-Series Feedback Amplifier with & with-out Feedback
4. Current-Shunt Feedback Amplifier with & with-out Feedback
5. Voltage-Shunt Feedback Amplifier with & with-out Feedback
6. RC phase shift oscillator,
7. Hartley oscillator
8. Colpitts Oscillator
9. Design of Class-A power amplifier.
10. Design of Class-B power amplifier.
11. Clipping Circuits
12. Clamping Circuits
Suggested Reading:
1. Paul B. Zbar, Albert P. Malvino, Michael A. Miller, Basic Electronics, A Text - Lab Manual, 7th
ed., McGraw-Hill Higher Education 2001.
WITH EFFECT FROM THE ACADEMIC YEAR 2015-2016
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EC 292
BASIC ELECTRONICS LAB (For Mechanical, Production and CSE)
Instruction 3 Periods per Week
Duration of University Examination 3Hours
University Examination 50Marks
Sessionals 25Marks
Objectives:
1. Demonstrate the characteristics of Semiconductor diodes
2. Realize the filters and rectifiers.
3. Verify the characteristics of different transistor Configurations
4. Design of Biasing Circuits for BJT and FET Amplifiers
5. Design different circuits using Operational Amplifiers.
List of Experiments:
1. CRO-Applications, Measurements of R, L and C using LCR meter, Color code method and
soldering practice.
2. Characteristics of Semiconductors diode (Ge, Si and Zener)
3. Static Characteristics of BJT-Common Emitter
4. Static Characteristics of BJT-Common Base
5. Static Characteristics of FET
6. RC-Phase Shift Oscillator
7. Hartley and Colpitt’s Oscillators
8. Common Emitter Amplifier
9. Astable Multivibrator
10. Full-wave rectifier with and without filters using BJT
11. Operational Amplifier Applications
12. Strain Gauge Measurement
13. Analog-to-Digital and Digital to Analog Converters
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Suggested Reading:
1. David Bell A., Operational Amplifiers and Linear ICS, Prentice Hall of India, 2005.
2. David Bell A., Laboratory Manual for Electronic Devices and Circuits, Prentice Hall of India,
2007.
3. Boylestad R.L and Nashelsky, Electronics Devices and Circuit Theory, Prentice Hall of India,
2006.