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Sheeba GandhiFei Xu
Neal Moyer
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• Sense amplifiers are important circuit• Sense amplifiers are important circuit elements in memory designThe aim of the project is to design a high• The aim of the project is to design a high yield and high speed voltage sense amplifier to detect change in data and the data barto detect change in data and the data bar lines during a read operation.
• The fault detection circuit is also designed to• The fault detection circuit is also designed to detect the validity of the data presented to the sense amplifierthe sense amplifier.
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M M d l• Memory Model simulates the input to the psense and the fault detection circuitcircuit
• Delay circuit provides the enable signal soenable signal so that the input signal difference i b this above the noise threshold.
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Bit Line resistanceBit Line resistance and capacitance calculated for 512calculated for 512 word SRAM cellPrecharge voltagePrecharge voltage was set to 1.15 V
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O t t h d t• Outputs precharged to VDD
• M9 foot enabled M7 M8• M9 foot enabled, M7, M8 precharge stopped
• M5, M6 inputs control bias currents, ∆Vout
• M1, M2, M3, M4 cross-coupled inverters drivecoupled inverters drive full-rail swing at Vout
• Offset voltageOffset voltage issues/mitigation techniques
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W fi d bi Vref Vrefbit bit bWant to find bit errors (bit == bit_b)T lifi
Vref Vrefbit bit_b
Two sense amplifiers with Vref (1.15 V) i t
Sense Amplifier
Sense Amplifier
out out binputSense bit/bit_b lines i d d l
xOR
out out_b
independentlyResults are xORed to h k if d i lid i V lidcheck if data is valid isValid
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2X bi li k 2 i ll2X bit-slice, can stack 2 verticallyOnly 1 VDD, 1 GND railVery regular topologyAttaches to bottom of SRAM core
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Characteristics Simulated ResultsCharacteristics Simulated Results
Read enable- sense enable delay 200 ps
Read enable- data output delay 475 ps
Read enable- fault detection delay 575 ps
XOR delay 100 ps
Sense amplifier differential Input 250 mV
Fault detection differential Input 50 mV
Noise Floor 30 mVNoise Floor 30 mV
6σ offset voltage ±40 mV