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Nanochemistry of Phases in Obsidian (MMF is Important here)
200 nm
Log
Scale
O
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ZZ6
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Aluminium 613
0.160.26
1.81.9
5.138.12
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Copper 131329
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*model invalid at higher kV and/or high scattering angles
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DC Joy's MC Program
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Monte Carlo Calculations of Monte Carlo Calculations of BB (Newbury & Myklebust (Newbury & Myklebust -(Newbury & Myklebust -1979)Monte Carlo Calculations of Monte Carlo Calculations of B (Newbury & Myklebust (Newbury & Myklebust (Newbury & Myklebust (Newbury & Myklebust (Newbury & Myklebust 1979)1979)1979)
ThicknessElement Z 10nm
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Spectral ProcessingThin Film Quantification MethodsSpecimen Thickness Effects:
AbsorptionFluorescence
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Spectrum = Characteristic Peaks + Background
Data Reduction
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Deconvolution: Fourier Method for Resolution Enhancement
Background Modeling
Simple - Linear and/or Polynominal Interpolation
Modeling - Parametric Fits of Analytic ExpressionsPhenomenological ExpressionsModified Bethe Heitler ModelDigital Filtering - Mathematical Supression
a*
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Spectral Processing : XEDSSimple Data Reduction
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For a thin specimen
IIA = Measured xMeasured x-Measured x-ray intensity Measured xMeasured xMeasured x-ray intensity ray intensity ray intensity per unit area
- = KKthKthKthK -per unit areaper unit areaper unit areaper unit areaper unit areaper unit area
th-shell ionization crossshell ionization cross-shell ionization crossshell ionization cross-section-.
==
KKKKKthKKKththKthK -
shell ionization crossshell ionization crossshell ionization crossshell ionization crossshell ionization crossshell ionization cross-sectionsectionsectionshell ionization crossshell ionization cross-shell ionization crossshell ionization crossshell ionization crossthth shell fluorescence yield..
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KKKKKKKthKthKthKKKKththKthK -
shell fluorescence yieldshell fluorescence yieldshell fluorescence yieldshell fluorescence yieldshell fluorescence yieldshell fluorescence yieldshell fluorescence yieldshell fluorescence yieldth-shell fluorescence yieldshell fluorescence yieldshell fluorescence yield-shell fluorescence yieldshell fluorescence yieldthth-shell radiative partition function//
W==
KKKKKK -shell radiative partition functionshell radiative partition functionshell radiative partition functionshell radiative partition functionshell radiative partition functionshell radiative partition functionshell radiative partition functionshell radiative partition functionAtomic WeightWW
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vsTheory
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Example in which KExample in which K-Example in which K-Example in which K-Example in which K factor is stable Example in which KExample in which KExample in which K-Example in which K-Example in which K factor is stable factor is stable factor is stable Cr, Fe, Ni Cr, Fe, Ni Cr, Fe, Ni Cr, Fe, Ni Cr, Fe, Ni
Note: Detector efficiency ~ 100% in this energy range
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Variation in K-factor with AEM/Detector SystemSpecimen: Uniform NiO film on Be Grid
From: Comparison of UTW/WL XFrom: Comparison of UTW/WL X-From: Comparison of UTW/WL X-ray Detectors on TEM/STEMs and STEMs
Thomas, Charlot, Franti, GarrattThomas, Charlot, Franti, Garratt-Thomas, Charlot, Franti, Garratt-Reed, Goodhew, Joy, Lee, Ng, Plicta, Zaluzec.Thomas, Charlot, Franti, GarrattThomas, Charlot, Franti, GarrattThomas, Charlot, Franti, Garratt-Reed, Goodhew, Joy, Lee, Ng, Plicta, Zaluzec.Reed, Goodhew, Joy, Lee, Ng, Plicta, Zaluzec.Reed, Goodhew, Joy, Lee, Ng, Plicta, Zaluzec.Analytical Electron Microscopy
Reed, Goodhew, Joy, Lee, Ng, Plicta, Zaluzec.Analytical Electron MicroscopyAnalytical Electron Microscopy-
Reed, Goodhew, Joy, Lee, Ng, Plicta, Zaluzec.Reed, Goodhew, Joy, Lee, Ng, Plicta, Zaluzec.Reed, Goodhew, Joy, Lee, Ng, Plicta, Zaluzec.Analytical Electron MicroscopyAnalytical Electron Microscopy-1984 1 09876543210
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Sources of values for kSources of values for kAB AB AB CalculationsSources of values for kSources of values for kAB Sources of values for kAB CalculationsCalculationsAB Calculations
W -- International Tables of Atomic Weights
//(K) -- Schreiber and Wims , XSchreiber and Wims , X-Schreiber and Wims , X-ray Spectroscopy (1982)Schreiber and Wims , XSchreiber and Wims , XSchreiber and Wims , X ray Spectroscopy (1982)ray Spectroscopy (1982)ray Spectroscopy (1982)Vol 11, p. 42
//(L) -- Scofield, Atomic and Nuclear Data Tables (1974)Scofield, Atomic and Nuclear Data Tables (1974)Vol 14, #2, p. 121
.. (K) (K) -- Bambynek etal, Rev. Mod. Physics, Vol 44, p. 716Bambynek etal, Rev. Mod. Physics, Vol 44, p. 716Freund, X
Bambynek etal, Rev. Mod. Physics, Vol 44, p. 716Freund, XFreund, X-
Bambynek etal, Rev. Mod. Physics, Vol 44, p. 716Bambynek etal, Rev. Mod. Physics, Vol 44, p. 716Bambynek etal, Rev. Mod. Physics, Vol 44, p. 716Freund, XFreund, X-ray Spectrometry, (1975) Vol 4, p.90
..(L) -- Krause, J. Phys. Chem. Ref. Data (1974) Vol 8, Krause, J. Phys. Chem. Ref. Data (1974) Vol 8, p.307
--(Eo) -- Inokuti, Rev. Mod. Physics, Inokuti, Rev. Mod. Physics, 4343, 4343 No. 3, 297 (1971)Inokuti, Rev. Mod. Physics, -
Inokuti, Rev. Mod. Physics, Inokuti, Rev. Mod. Physics, 4343Inokuti, Rev. Mod. Physics, 4343Inokuti, Rev. Mod. Physics, - Goldstein etal, SEM
43434343Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM 1
No. 3, 297 (1971)No. 3, 297 (1971)No. 3, 297 (1971)43, No. 3, 297 (1971)No. 3, 297 (1971)43, 11, 315, (1977)
-Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM
- Chapman etal, XGoldstein etal, SEM Goldstein etal, SEM Chapman etal, X-Goldstein etal, SEM Goldstein etal, SEM , 315, (1977) , 315, (1977) , 315, (1977) , 315, (1977) , 315, (1977) 1, 315, (1977) , 315, (1977) , 315, (1977) Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM Goldstein etal, SEM Chapman etal, X-ray Spectrometry, ray Spectrometry, 121212,153,(1983)
-Chapman etal, XChapman etal, XChapman etal, XChapman etal, X
- Rez, XChapman etal, XChapman etal, XRez, X-Chapman etal, XChapman etal, XChapman etal, XChapman etal, XChapman etal, XChapman etal, X ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, Chapman etal, XChapman etal, XChapman etal, XChapman etal, XRez, X-ray Spectrometry,
ray Spectrometry, ray Spectrometry, ray Spectrometry, 13
ray Spectrometry, ray Spectrometry, 13,
ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, 12121212,153,(1983),153,(1983)121212,153,(1983)ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, 13, 55, (1984)
-Rez, XRez, XRez, XRez, XRez, XRez, X ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, ray Spectrometry, Rez, XRez, X
- Egerton, Ultramicroscopy, 1313
Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, 455, (1984)55, (1984)55, (1984)55, (1984)55, (1984)55, (1984)55, (1984)55, (1984)55, (1984)55, (1984)55, (1984)1313, ,
4444, 169, (1969)-
Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, - Zaluzec, AEM
Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Zaluzec, AEMZaluzec, AEM-Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, 44, 169, (1969), 169, (1969), 169, (1969), 169, (1969), 169, (1969), 169, (1969), 169, (1969)4, 169, (1969)Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Egerton, Ultramicroscopy, Zaluzec, AEMZaluzec, AEM-1984, San Fran. Press. 279, (1984)
'' (E) -- Use mass absorption coefficients from:Use mass absorption coefficients from:-
Use mass absorption coefficients from:Use mass absorption coefficients from:-Thinh and Leroux; X
Use mass absorption coefficients from:Thinh and Leroux; X-
Use mass absorption coefficients from:Use mass absorption coefficients from:Use mass absorption coefficients from:Thinh and Leroux; X-ray Spect. (1979), ray Spect. (1979), 8,8, p. 963
-Thinh and Leroux; XThinh and Leroux; XThinh and Leroux; XThinh and Leroux; XThinh and Leroux; XThinh and Leroux; X ray Spect. (1979), ray Spect. (1979), ray Spect. (1979), ray Spect. (1979), ray Spect. (1979), ray Spect. (1979), Thinh and Leroux; XThinh and Leroux; X
-Henke and Ebsiu, Adv. in Xray Spect. (1979), ray Spect. (1979),
Henke and Ebsiu, Adv. in X-ray Spect. (1979), ray Spect. (1979), ray Spect. (1979), ray Spect. (1979), ray Spect. (1979), ray Spect. (1979),
Henke and Ebsiu, Adv. in X-ray Analysis,ray Spect. (1979), 8,8, p. 963
ray Analysis,ray Analysis,ray Analysis,ray Analysis,17,p. 963p. 963p. 963p. 963
17,17, (1974)-Henke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in X
-Holton and Zaluzec, AEMHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHolton and Zaluzec, AEMHolton and Zaluzec, AEM-
ray Analysis,ray Analysis,ray Analysis,ray Analysis,ray Analysis,ray Analysis,ray Analysis,ray Analysis,ray Analysis,ray Analysis,17,17,17,17, (1974)(1974)(1974)(1974)ray Analysis,ray Analysis,17,17,17, (1974)ray Analysis,ray Analysis,Henke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHenke and Ebsiu, Adv. in XHolton and Zaluzec, AEMHolton and Zaluzec, AEM--1984, San Fran Press,353,(1984)
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Invoke the Intensity Ratio Method, that is consider the ratio of x-ray lines from the same element in both the Unknown and a Standard
This simple equation states that the relative intensity ratio of the samecharacteristic x-ray lines is directly proportional to the relativecomposition ratio of the elemental components mult iplied by aproportionality factor which, in the thin film approximation, isdependent upon , (, t and %
NOTE: The factor also is not a universal constant, and requires an accurate measurement/determination of density, thickness and beam current.
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For finite thickness specimens, what is a thin film?
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Effects of Beam Broadening
Parallel Slab Model: No Change in absorption pathlengthParallel Slab Model: No Change in absorption pathlengthWedge Model:Parallel Slab Model: No Change in absorption pathlength
There is a correction the magnitude ofThere is a correction the magnitude ofThere is a correction the magnitude ofwhich varies with the wedge angle.
Effects of Irregular Surface
This cannot be analytically modeled but must be understood!
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• Original Observations of Effect Original Observations of Effect –
Original Observations of Effect Original Observations of Effect Duncumb
Original Observations of Effect Original Observations of Effect Duncumb Duncumb
Original Observations of Effect Original Observations of Effect Original Observations of Effect Duncumb Duncumb 62, Hall
Original Observations of Effect Original Observations of Effect 62, Hall 62, Hall
Original Observations of Effect Original Observations of Effect Original Observations of Effect 62, Hall 62, Hall 66, Cherns etal 66, Cherns etal 66, Cherns etal 66, Cherns etal 73
•Duncumb Duncumb Duncumb 62, Hall 62, Hall 62, Hall 62, Hall 62, Hall 66, Cherns etal 66, Cherns etal 66, Cherns etal
Predicted Applications Predicted Applications –
Predicted Applications Predicted Applications Cowley
Predicted Applications Predicted Applications Cowley Cowley
Predicted Applications Predicted Applications Cowley Cowley 64,
Predicted Applications Predicted Applications Predicted Applications Predicted Applications 64, 64, 64, 64,
Predicted Applications Predicted Applications Predicted Applications 64, 64, 70
•Cowley Cowley Cowley 64, 64, 64, 64, 64,
ACHEMI Technique ACHEMI Technique ACHEMI Technique -ACHEMI Technique –
ACHEMI Technique ACHEMI Technique Tafto
ACHEMI Technique ACHEMI Technique Tafto
ACHEMI Technique ACHEMI Technique ACHEMI Technique ACHEMI Technique Tafto 79, Spence & Tafto 79, Spence & Tafto 79, Spence & Tafto 83
• MultiTafto
MultiMulti-79, Spence & Tafto 79, Spence & Tafto 79, Spence & Tafto 79, Spence & Tafto 79, Spence & Tafto 79, Spence & Tafto 838383Tafto Tafto Tafto
MultiMulti-Variate Statistical Analysis Variate Statistical Analysis -–
Variate Statistical Analysis Variate Statistical Analysis Variate Statistical Analysis Variate Statistical Analysis Rossouw etal , Anderson and others Rossouw etal , Anderson and others
late80Rossouw etal , Anderson and others Rossouw etal , Anderson and others
late80late80Rossouw etal , Anderson and others
late80late80 -Rossouw etal , Anderson and others Rossouw etal , Anderson and others
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90909090Rossouw etal , Anderson and others Rossouw etal , Anderson and others Rossouw etal , Anderson and others Rossouw etal , Anderson and others
90909090 s
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Ferritin localized in invaginations of oligodendrocytes
Mapping Ferritin in Brain: Misregulation of Iron Metabolism in IRP Knockout Mice
Pre Fe L2,3 Post Fe L2,3
STEM-EELS
(P. Zhang et al., J. Struct. Biol. 2005)
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