dr. alan o’riordan -...
TRANSCRIPT
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Discrete gold nanowires as
electrochemical nanosensor
devices
Dr. Alan O’Riordan
Nanotechnology Group
Tyndall National Institute
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Elements of a Nanosensor
Nanosensors
At the nanoscale:
• Sensor elements are of similar length scales to
analytes
• Lower limits of detection
• Increased sensitivity & selectivity
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Why Nanosensors
Sensing at the nanoscale:
• Many nanomaterials or nanostructured
devices have unique or enhanced properties
compared similar materials at bulk scale
• Fabrication of devices with improved
performance
– Lower limits of detection
– Increased sensitivity & selectivity
– Faster analysis
– Higher S/N ratios
• Several start up companies in market place
based of semiconducting nanowire – FET
technologies, e.g., Vista Therapeutics
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planar diffusion LIMITED
peak shaped response
faster mass transport
shorter response times in analysis
radial diffusion
steady state response
Micro
electrode
Vs.
Why Nanoelectrochemistry?
60 µm
30 µm
1 mM
0
0.530 µm
30 µm
1 mM
0
0.5
60 µm
30 µm
1 mM
0
0.530 µm
30 µm
1 mM
0
0.5
1 mM
0.5
0 mM
250 μm
50 μm
Micro-square Electrode: w = 190 μm
10 μm
Nanowire
electrode
- NW
100 m
+ - - - - -
+ + + +
- +
+
- - +
-
- +
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Voltammetry: Cyclic and Square Wave
Time (s)
Pote
nti
al (V
vs
ref)
Square Wave Voltammetry
Time (s)
Pote
nti
al (V
vs
ref)
Cyclic Voltammetry
• Three electrode cell, working counter and reference electrodes
• Source voltage (positive or negative) and measure current
• Sweep or potential step appraoches
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Nanowire Fabrication - E-beam lithography
• Nanowire devices fabricated by Hybrid Lithography Process:
• Nanowire structures created by E-beam Lithography and metal deposition:
Ti/Au (5/50 nm)
• Micron-scale interconnections fabricated by optical lithography and metal
deposition: Ti/Au (10/ 200 nm)
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PCB packaged nanowires
• Typical NW width ~ 100 ± 6 nm
• Typical NW height ~ 50 ± 0.6 nm
• NW length ~ 40 μm
• Highly reproducible structures
Dawson, K. O'Riordan, A., Journal of Physics: Conference Series 2011, 307 (1), 012004.
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Electrical/electrochemcial Characterisation
• Ohmic behaviour and low resistances observed
• Typical voltammogram for a gold nanoelectrode in sulphuric acid
• Low currents consistent with size of electrode
• Nanowires exhibited steady-state voltammetry kinetics measurements
CV in H2SO4
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Electron Transfer at Nanowire Electrodes-Oxidation
• Rate determining step is rate of electron transfer between redox analyte and nanowire.
• Range of k0 values determined for different nanowires in 1 mM FcCOOH; average 1.02
0.4 cm/s
• Higher values ~2 orders of magnitude higher than reported values
• Also determined for k0 for oxidation of Ferrocyanide at nanowire; average 0.95
0.19 cm/s
kOX = kET
Fit K0, , imt
K0 = FACk0/imt
diffusion
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Electron Transfer at Nanowire Electrodes-Reduction
• Reduction of Ru(NH3)63+ at nanowire electrodes was found to be excellently
described by Butler-Volmer kinetics
• An average k0 value of 1.2 cm/s was determined
• Values consistent with those reported
Dawson, K. O’Riordan, A.; et al. J. Phys. Chem. C 2012, 116 (27), 14665-14673.
Fit K0, , imt
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Arrays of Nanowire Electrodes
15 mm300 μm 10 μm 10 μm
(a) (c)(b)
• Single nanowire electrodes 100 nm wide
• Nanowire metal stack: 5 nm/50 nm Ti/Au
• On-chip Au counter electrodes located in the centre of device
• Silicon Nitride passivation layer ~ 500 nm thick
NW
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WECEPRE
WE CE
RE
• Unknown peak observed at ~0.1 volts during
forward scan
• Nanowires sufficiently sensitive to detect Ag
ions diffusing from commercial electrode
• Redesign with on-chip quasi-reference
electrode
Diffusing through Ag/AgCl reference
300 μm 10 μm 10 μm
(a) (c)(b)
Dawson, K. Wahl, A.; Barrett, C.; Sassiat, N.; Quinn , A.J.; O’Riordan, A.; . Electrochimica Acta, 2013, submitted
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Structural and Electrical Characterisation
• Nanowire dimensions: width 99 ± 3 nm, height ~ 50 nm
• Nanowires and nanowire arrays displayed Ohmic electrical
responses
• Average resistance for single nanowire was ~ 918 ± 55 Ω
• CVs exhibited stead-state sigmoidal behaviour 10,000 mV s-1
• Highly reproducible across different wafers and fabrication
runs. ~8% variation (n = 73 devices)
200 nm
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Arrays of Nanowire Electrodes
• Nanowire electrodes arrays (2, 3, 4, 5 and 6 nanowires)
• Nanowire stack structure: 5 nm/50 nm Ti/Au
• Interelectrode distance in arrays ~ 2 μm
• On-chip Au counter electrodes located in the centre of device
• Silicon Nitride passivation layer ~ 500 nm thick
15 mm300 μm 10 μm 10 μm
(a) (c)(b)
NW
300 μm 10 μm 10 μm
(a) (c)(b) (b) (c)
NWs
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d
δ
r
Diffusional Independence: Approach using δ
• Nernst diffusion layer is distance to bulk concentration from electrode.
• In arrays neighbouring diffusion profiles should not overlap.
• Estimated thickness of diffusion layer for single nanowire was ~ 850 nm
for w = 100 nm
• Nanowire Arrays designed with 2 μm spacing d > 2δ
Bulk
δ
4
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Electrical Characterisation
• 2-point I-V measurements to confirm functionality
• Ohmic behaviour and low resistances observed. Decreasing resistance with increasing numbers of nanowires
• Resistance decreasing linearly as expected.
• Low currents consistent with size of electrode
6 NWs
1 NW
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• Voltammetric characterization for nanowire electrode arrays with increasing number of nanowire elements in 1 mM FcCOOH in 10 mM PBS at 5 mV s-1.
• Increase in the average steady state current values (n=30 per array type) recorded at 5 mV s-1 for increasing numbers of nanowires in arrays (navy data point).
• Expected current values for these nanowire arrays extrapolated from the single nanowire current average are included in grey diffusional overlap ?
Electrochemical Characterisation
Dawson, K; Wahl, A.; Barrett, C.; Sassiat, N.; Quinn, A.J., O’Riordan, A.; Electrochimica Acta, 2012, published online 10.1016/j.electacta.2012.09.105
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• Representation of a plane normal to the electrodes
• Boundaries 1, 3 & 19 : the bulk concentration, C*
• Boundaries 2, 8, 13 & 18 : flux = 0
• No conditions are applicable at boundaries 5, 10 & 15
• Boundaries 4, 6, 7, 9, 11, 12, 14, 16, & 17 : concentration at the
electrode surface with respect to the time step of the electrolysis
Diffusion Domain Approach
CR(t) =
(a)
1
3
19
1617
15141312 18
11
10987
6
542
(b)
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slow scan rates,
closer electrodes
slow scan rates, well
separated electrodes
fast scan rates, well
separated electrodes
slow scan rates,
much closer electrodes
δ = diffusion layer thickness
r = critical dimension
d = interelectrode distance
(i) δ << r planar diffusion
insulating
substrate
nanowire
electrode δ
d r
(iv) δ >> d planar diffusion
(iii) r < δ ≤ d planar vs. radial
diffusion
(ii) δ = r < d radial diffusion
Independent
Overlap
Diffusion Processes at Nanowire Electrode Arrays
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Sweep Voltammetry: Diffusional Independence
• Target very high scan rates 5000 mV.s-1
• Enables rapid analysis and data capture
• Increase in faradaic peak current, ip, of 5.26 nA for 15 m spaced arrays compared with
3.12 nA for the 5 m spaced arrays, an increase of ~60%.
• Average steady-state current for arrays 5 m & 10 m is 5.9 ± 0.2 & 6.2 ± 0.3 nA, for
arrays 15 m & 20 m 7.0 ± 0.5 & 6.9 ± 0.3 nA, respectively
5 μm
(a)
5 μm
(b)
1 mM
0
0.5
5 μm
(c)
5 μm
(d)
60 µm
30 µm
1 mM
0
0.530 µm
30 µm
Wahl, A.; Dawson, K.; O’Riordan, A . Faraday Discussions 2013, submitted
ip
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SWV: Diffusional Overlap Required
• (i) SWV of FcCOOH at a single
nanowire
• (ii) SWV of FcCOOH at a
nanowire array electrode (3
nanowires) diffusionally
overlapped
• (iii) SWV of FcCOOH at a
nanowire array electrode (3
nanowires) diffusionally
independent
Time (s)
Pote
nti
al (V
vs
ref)
(i)
(iii)
(ii)
(i)
(iii)
(ii)
(b)
(a)
5 μm
(a)
5 μm
(b)
1 mM
0
0.5
5 μm
(c)
5 μm
(d)
60 µm
30 µm
1 mM
0
0.530 µm
30 µm
5 μm
(a)
5 μm
(b)
1 mM
0
0.5
5 μm
(c)
5 μm
(d)
60 µm
30 µm
1 mM
0
0.530 µm
30 µm
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Key Sensing Areas for Nanowire Sensors
Nanowire Electrodes
Environment:
Trace metals
Bio-sensing:
Glucose
H2O2
Security:
H2O2
DNT
TNT, PETN H2O2
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Security: Hydrogen Peroxide Detection
Dawson, K.; Strutwolf, J.; Herzog, G.; Rogers, K.; Arrigan, D.W.M.; Quinn, A.J.;. O’Riordan, A Anal. Chem., 2011, 83, 5535-5540.
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Health: Mediated Glucose Detection
• Measurement range : 10 μM – 100 mM Glucose
• LOD~ 3 μM High sensitivity ~ 7.2 mA/mM/cm2
• Blood glucose required detection range: 0.5 mM – 15 mM
• Alternative media e.g. saliva or tears: ~100 μM – 500 μM
Dawson, K.; Baudequin, M.; O’Riordan, A. Analyst, 2011, 136 (21), 4507-4513
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Cu2+
SiO2
Cu2+ Cu2+
Cu2+
Cu2+
Cu2+
Cu2+
Cu
SiO2
Cu
Cu2+
Cu
Cu2+
Cu Cu
Cu2+
SiO2
Cu2+
Cu2+
Cu2+
Cu2+
Cu2+
Cu2+
UPD: E = 0.0 V (vs Ag/AgCl) and time
Deposition of a monolayer of Cu onto the gold surface of the
electrode
SV to remove the Cu from the electrode
surface
Au electrode Au electrode Au electrode
Passivation
Interconnection
tracks
+2e-
-2e-
Cu in 0.1M H2SO4
solution
Background subtracted stripping voltammograms of a series of Cu2+ solutions in 0.1M H2SO4 at a gold nanowire electrode for 60s.
(a) (b)
Environmental: Trace Copper Analysis
Wahl A.; Dawson K., Sassiat N.; Quinn A.J.; O’Riordan, A. Journal of Physics: Conference Series, 307, 2011, 012061.
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Nitroaromatic species detection
• TNT detection important to homeland security and environmental remediation.
• Faster analysis ~ 30 s per measurement
• Does not require complex pre-treatment or experimental setup
• Detection limits sub 200 ng/ml (at present)
-1.0 -0.8 -0.6 -0.4
Potential (V vs On-chip Pt)
Cu
rren
t
3 NT
2,4 DNT
2,6 DNT
TNT
DNB
2,4 DNT 2,6 DNT
NT
DNB
CH3
TNT
Barry, S.; Dawson, K.; O’Riordan, A . Faraday Discussions 2013, submitted
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Simulation - Design for Purpose
Square Wave Voltammetry
1
7
Linear sweep voltammetry
Time (s)
Pote
nti
al (V
vs
ref)
Time (s)
Pote
nti
al (V
vs
ref)
Ox Red Ox Red
Time (s)
Pote
nti
al (V
vs
ref)
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Post Docs Students
Research Team
Pierre Lovera Micki Mitchell Karen Dawson Daniel Jones Amelié Wahl Sean Barry Colm Barrett
Phast-ID FP7-ICT-2009-5 (STREP) Robust, affordable photonic crystal sensors for point-of-
care disease diagnostics
CommonSense FP7-SEC-2010-1 (STREP) Development of a Common Sensor Platform for the Detection of IED "Bomb Factories”
E-Brains FP7-ICT-2009-5 (STREP) Best-Reliable Ambient Intelligent Nanosensor Systems by
Heterogeneous Integration
NanoFunction FP7-ICT-2009-5 (NOE) Beyond CMOS nanodevices for adding functionalities to
CMOS
SFI/ 09/RFP/CAP2455
SFI/12/TIDA/I2377