effect of corn spacing and emergence variation on grain...
TRANSCRIPT
Effect of Corn Spacing and Emergence Variation on Grain Yield
Wisconsin Fertilizer, Ag Lime, and Pest Management Conference
Madison, WIJanuary 20-22, 2004
Joe LauerUniversity of Wisconsin
http://corn.agronomy.wisc.edu/Extension/CC04
Lauer, © 1994-2004University of Wisconsin – Agronomy
Uniform Stand:
• Plants emerged in adequate numbers, with uniform spacing and emergence time
(Hoeft, R.G., E.D. Nafziger, R.R. Johnson, and S.R. Aldrich)
Lauer, © 1994-2004University of Wisconsin – Agronomy
Previous Research on Corn Grain Yield Response to Plant Spacing and Emergence VariationPlant Spacing and Emergence Variation
• Iowa: Non significant up to 6 inches standard deviation
• Ontario: Non significantDaynard et al (1983 1981inches standard deviation
Erbach et al. (1972)• Illinois: Non significant
J h d M l (1980)
Daynard et al. (1983, 1981, 1979)
• Kansas: Significant Krall et al (1977): 3 4 bu/AJohnson and Mulvaney (1980)
Dungan et al., (1958): hills• Indiana: Non significant and
Si ifi ( b)
Krall et al. (1977): 3.4 bu/A decrease for each inch increase standard deviationVanderlip et al (1988): grainSignificant (web)
Nielsen (1997)Nielsen (web): Grain yield
Vanderlip et al (1988): grain yield decreased when standard deviation values were greater than 2.4 inches
decreases 2.5 bu/A for each inch standard deviation > 2 inches
• Nebraska: Non significant in hills
Kiesselbach and Weihing • Uneven emergence can reduce yield by 10-20% when 1/3 plants emerged 2 weeks late or later (C t 1989 N f i 1991)
g(1933)
Lauer, © 1994-2004University of Wisconsin – Agronomy
(Carter, 1989; Nafziger, 1991)
Objectives
• To measure the effects and interactions of plant spacing variation and plant emergence variation on plant growth and grain yield.
• To quantify the grain yield compensation ofTo quantify the grain yield compensation of individual plants in variable corn stands
• To quantify the grain yield of corn in communities ith i bl t dwith variable corn stands
Lauer, © 1994-2004University of Wisconsin – Agronomy
Plant Spacing Variability Treatments 2000-2002; Plant Population = 30 000 Plants/APlant Population = 30,000 Plants/A
98Control 2-plant 4-plant 8-plant
84
hes)
56
70
cing
(inc
h
42
ant s
pac
14
28Pla
00 2 4 2 4 8 2 4 8 12
Lauer, © 1994-2004University of Wisconsin – Agronomy
Standard deviation (inches)
100 2-plant pattern4-plant pattern8-plant patternControl
eld
(%)
90
Control
grai
n yi
80 =
Rel
ativ
e R
70
0 2 4 6 8 10 12 1460
Lauer, © 1994-2004University of Wisconsin – Agronomy
Plant spacing deviation (inches)
0 2 4 6 8 10 12 14
Deen et al. University of GuelphFi ld D i tiField Descriptions
Locations: • Elora (E)Elora (E)• Woodstock (W)
CHU:CHU:• 2700 (E)• 2900 (W)
Soil Types:• London Loam (E) • Guelph Loam
(W)
Previous Crops: • Alfalfa (E)• Soybeans (W)
Lauer, © 1994-2004University of Wisconsin – Agronomy
y ( )
Treatments using Roundup Ready seed to establish Plant Spacing Variabilityestablish Plant Spacing Variability
Treatment Roundup Ready Normal CornTreatment Roundup Ready Normal Corn
Seeds/A
RR 28250 0%
RR + 10% Normal 28250 10%
RR + 20% Normal 28250 20%RR 20% Normal 28250 20%
RR + 35% Normal 28250 35%
RR + 50% Normal 28250 50%
RR 70% N l 28250 70%Lauer, © 1994-2004
University of Wisconsin – Agronomy
RR + 70% Normal 28250 70%
Establishment of Plant Standard Deviation and Plant Density
88 Standard Deviation Plant Density
Plant Density
6
7
6
7
nts
m-2
)
LSD (0.05)
ion
(inch
es)
4
5
4
5
nsity
(pla
n
tand
ard
devi
at
2
3
2
3
Plan
t Den
Plan
t st
0
1
2
0
1
2 P
00RR RR+10c RR+20c RR+35c RR+50c RR+70c
Treatments
Lauer, © 1994-2004University of Wisconsin – Agronomy
Grain yield response to Plant Standard Deviation using Roundup Ready Treatments
200
Deviation using Roundup Ready Treatments
160
A)
120(bu/
A
80Yiel
d
40
Gra
in
00 2 4 6 8
G
Elora 2000 Elora 2001 Woodstock 2000 Woodstock 2001
Lauer, © 1994-2004University of Wisconsin – Agronomy
0 2 4 6 8Plant Spacing Deviation (inches)
I t f Pl t S i d EImpact of Plant Spacing and Emergence Variation on Yield
Lauer, © 1994-2004University of Wisconsin – Agronomy
Summary of variance analysis
Plant Forage GrainFactor Plant height LAI Forage
yieldGrainyield
Emergence ** ** ** **
Spacing NS NS NS NS
E X S NS NS NS NS
** Significant at P < 0.05, NS = Non significant
Lauer, © 1994-2004University of Wisconsin – Agronomy
Significant at P 0.05, NS Non significant
Grain Yield Response to Emergence
140
130)
a
b
120
130
(bu/
A c
110
120
yiel
d
110
Gra
in
100E EM EL
G
Emergence Treatments
Lauer, © 1994-2004University of Wisconsin – Agronomy
e ge ce eat e ts
Dry Grain Yield per Plant
150 E-20 (Control)150
)
E 20 (Control)
100
plan
t-1
50d (g
p
0
50
n Yi
eld
0No.1 No.2 No.3 No.4 No.5 No.6G
rain
Plant PositionsLauer, © 1994-2004
University of Wisconsin – Agronomy
Plant Positions
E-40 Relative Yield
110120101
11093 90
99 100100
120
)
60
80
eld
(%)
40
60
ve Y
ie
0
20
Rel
ativ
0No.1 No.2 No.3No.4 No.5 No.6
R
Plant Positions
Lauer, © 1994-2004University of Wisconsin – Agronomy
E-60 Relative Yield
103 110120 103 11094 89 89
100100120
ld
6080Yi
e)
4060
tive
(%)
2040
Rel
at
0No 1 No 2 No 3No 4No 5 No 6
R
Plant PositionsLauer, © 1994-2004
University of Wisconsin – Agronomy
No.1 No.2 No.3No.4No.5 No.6Plant Positions
EM-20 Relative Yield
120100 103 102 99 102
100
)
6560
80
ld (%
)
40
60
ve Y
ie
20
40
Rel
ativ
0No 1 No 2 No 3 No 4 No 5 No 6
R
Lauer, © 1994-2004University of Wisconsin – Agronomy
No.1 No.2 No.3 No.4 No.5 No.6Plant Positions
EL-20 Relative Yield
120101 107 106 102 102
100
120
80
ld (%
)
2840
60
ve Y
iel
2820
40
Rel
ativ
0No 1 No 2 No 3 No 4 No 5 No 6
R
Plant PositionsLauer, © 1994-2004
University of Wisconsin – Agronomy
No.1 No.2 No.3 No.4 No.5 No.6Plant Positions
EL-60 Relative Yield
119107
11995103 103
100ld
100
e Yi
e)
50
ativ
e(%
)
160R
ela
0No.1 No.2 No.3No.4No.5 No.6Plant Positions
Lauer, © 1994-2004University of Wisconsin – Agronomy
Clipping Studies at Arlington
Lauer, © 1994-2004University of Wisconsin – Agronomy
Plant Clipping at Arlington(2000 2003)(2000-2003)
• Growth stages:All leaves clipped at V2, V4 and V6
• Plot plant patterns for clipping treatments:p p pp gUntreated check, 2-, 4-, and 8-plant patterns, All
Lauer, © 1994-2004University of Wisconsin – Agronomy
Corn Grain Yield Response to Clipping on a Plot Basis at Arlington (2000 2003)on a Plot Basis at Arlington (2000-2003)
206210
194197200
LSD(0.10) = 12
189
182186
178181 179
190
d (b
u/A
)
174178 179
170
180
rain
yie
ld
160
170
Gr
150Control V2-2 V2-4 V2-8 V4-2 V4-4 V4-8 V6-2 V6-4 V6-8
Lauer, © 1994-2004University of Wisconsin – Agronomy
Clipping Treatment
Conclusions
• Corn was more responsive to plant emergence variability h l i i bilithan plant spacing variability.
• Plant growth and grain yield were unaffected by within-ro plant spacing ariabilit (SD 1 7 inches)row plant spacing variability (SD= 1-7 inches)
• Yield decreased 4-8% as 1/6 plants emerged 2 to 4 leaves lateleaves late.
• Yield reduction due to emergence delay was not intensified by increased spacing variabilityintensified by increased spacing variability.
• Planter performance evaluation and subsequent maintenance must consider crop emergence uniformity.maintenance must consider crop emergence uniformity.
• Management and planting decisions that influence emergence pattern can have a significant impact on yield.
Lauer, © 1994-2004University of Wisconsin – Agronomy
g p g p y