elective iii syllabus_revc

8/13/2019 Elective III SYllabus_RevC

1/7

DE LA SALLE UNIVERSITY DASMARIASCollege of Engineering, Architecture and Technology

Engineering Department

COURSE SYLLABUS

Course Title ECE Elective 3 VLSI Test and MeasurementsCourse Code ECET517

UnitsEarned

3.0 Units

Prerequisite ECE Elective 2Co-requisite N/A

Professor Engr. Darwin MaagaE-mail

[email protected]/[email protected]

Consultation TBA

I. COURSE DESCRIPTION

Guided by the values of faith, zeal for service and communion in mission, this course focuses on the concepts and applications ofautomated test systems and bench test set-ups to test analog, digital and mixed signal integrated circuits. Topics include modules of industrialstandard automated test system and testing methodologies of various semiconductor and devices.

The emphasis of this course is for you to learn how to design a test plan for various semiconductor devices for specific applications. It willalso gauge your critical thinking ability, analysis, and skills through solving problems.II. ECE Program Outcomes

A graduate of the Bachelor of Science in Electronics Engineering (BSECE) program must attain:

ECa. An ability to apply knowledge of mathematics, physical, life and information sciences; and engineering sciences appropriate to the field of practice.ECb. An ability to design and conduct experiments, as well as to analyze and interpret data.ECc. An ability to design a system, component, or process to meet desired needs within identified constraints.ECd. An ability to work effectively in multi-disciplinary and multi-cultural teams.ECe. An ability to recognize, formulates, and solves engineering problems.ECf. Recognition of professional, social, and ethical responsibility.ECg. An ability to effectively communicate orally and in writing using the English Language.ECh. An understanding of the effects of engineering solutions in a comprehensive context.ECi. An ability to engage in life-long learning and an understanding of the need to keep current of the developments in the specific field of practice.ECj. A knowledge of contemporary issuesECk. An ability to use the techniques, skills, and modern engineering tools necessary for engineering practice.


2/7

III. Desired Learning Outcome

Expected Lasallian Graduate Attributes(ELGAs)

At the end of the course, the followingare expected to be realized:

Program Outcomes Link

Has Passion for Excellence Provide a practical and useful

information on ATE/Bench systemarchitecture and functionalityProvide an understanding programflow and the trade-off of datacollectionProvide a solid understanding ofdevice specifications and Mixed-SignalTesting

ECc, ECe, Eck

God-loving, Morally Upright Design/Create a Test Plan by applying a solidunderstanding of the device specifications andthe Test Methodologies to be used.

ECc, ECe, Eck

Patriotic, Ecocentric Apply the theories learned by creating projectsthat will benefit the environment and thecommunity as well.

ECh, ECi

IV. ELGA-based rubric for the final output

A. Has Passion forExcellenceCategory

Score Point 4 Score Point 3 Score Point 2 Score Point 1 Score

Functionality The project functionswell according to

requirement

The project functionsbut with some

limitation

Some parts of thecircuit is functioning

The project do notfunction at all

B. God-lovingCategory


Presentation The project was donein good faith andindependently

The project was donewith minimumsupervision

Some parts of thecircuit was done withthe help of others

The project was donewith the help ofothers


3/7

V. COURSE OUTLINE

A. Preliminary Period (Overview of Mixed-Signal Testing and The Test Specifications Process)

Topics Hours Teaching Strategies Class Activities

1. MIXED-SIGNAL CIRCUITSa. Analog, Digital, or Mixed Signal?b. Common Types of Analog andMixed-Signal Circuitsc. Applications of Mixed Signal Circuits

TBD

Interactive LecturesPower Point PresentationsCritical Thinking Activities

Active Learning

Gospel ReadingSeat Work

AssignmentDiscussionsRecitations / Board WorkProblem SolvingQuiz

2. POST-SILICON PRODUCTIONFLOWa. What Is a Test Engineer?b. Automated Test Equipmentc. Nicholas DeWolfThe Father of

ATEd. Typical Bench Test Set-upe. ATE vs. Benchf. Wafer Probers

g. Handlersh. Forced-Temperature Systems

TBD

Interactive LecturesPower Point Presentations

Critical Thinking ActivitiesActive Learning


AssignmentDiscussionsRecitations / Board WorkLong QuizProblem Solving

3. WHY TEST MIXED-SIGNALDEVICES?a. Real-World Circuitsb. Low Level Measurements

TBD


Active Learning


AssignmentDiscussionsRecitations / Board WorkProblem Solving

C. PatrioticCategory


Effectiveness The project is veryuseful and has benefitto community andenvironment

The project iseffective with minorinaccuracies

The project hasmarginal use withmajor inaccuracies

The project showsminimal benefit andnot much effective


4/7

4. DEVICE DATA SHEETSa. Purpose of Data Sheetb. Structure of Data Sheet

c. Electrical Characteristic TBD


Active Learning


Assignment

DiscussionsRecitations / Board WorkProblem Solving

5. GENERATING THE TEST PLANa. To Plan or NOT to Planb. Structure of a Test Planc. Design Specifications versusProduction Test Specificationsd. Converting the Data Sheet into a

Test Plan

TBD


Active Learning


AssignmentDiscussionsRecitations / Board WorkProblem Solving

Long QuizPrelim Major Exam

B. Midterm Period (Components of a Typical Test Program and Common Test Parameters for Op-amps)

Topics Hours Teaching Strategies Class Activities

6. COMPONENTS OF A TESTPROGRAMa. Test Program Structure

b. Test Code and Digital Patternsc. Binningd. Test Sequence Controle. Waveform Calculations andOther Initializationsf. Focused Calibrations and DIB

Checkersg. Characterization Codeh. Simulation Codei. Debuggability

TBD


Active Learning


Assignment

DiscussionsRecitations / Board WorkLong QuizProblem Solving


5/7

7. COMMON TESTPARAMETERS (Part 1)

a. Continuityb. Leakage Currentsc. Power Supply Currentsd. DC References and Regulatorse. Impedance Measurementsf. DC Offset VoltageMeasurementsg. DC Gain Measurementsh. DC PSRRi. DC CMRR

j. Voltage Search Techniques

k. DC Test for Digital Circuits

TBD


Active Learning


Assignment

DiscussionsRecitations / Board WorkProblem SolvingLong QuizMidterm Major Exam

C. FINAL PERIOD (Common Test Parameters for DACs and Measurement Accuracy Basics)

Topics Hours Teaching Strategies Class Activities7. DAC COMMON TEST PARAMETERS

a. DC Accuracy

b. Resolutionc. DAC Range

d. INLe. DNLg. Monotonicityh. Offset Errori. Gain Error

j. Gain Error Mismatchk. Offset Error Driftl. Gain Error Driftm. DAC Noise

TBD


Active LearningActual Plant Tour to At least 2 SemiconductorCompanies


Assignment

DiscussionsRecitations / Board WorkProblem SolvingLong QuizFinals Major Exam

Actual Plant Tour to At least 2Semiconductor Companies


6/7

n. Short Circuit Currento. Settling Timep. Glitch Energyq. DAC DC and AC PSRR

VI. Valid Assessment

Prelim/Midterm/Final Item

Item PercentageQuizzes (Short and Long) 45

Class Participation (Recitation, Board Work, Seatwork) 15Assignments 10

Periodic Examination 30Total 100

VII. COURSE POLICIESa. Students who exceeded 11 hours of un-excused absences inclusive of tardiness will obtain a failing grade.

b. Letter of excuse should be presented in case of a valid reason of absence(s).

c. Homework should be submitted on time. Late submission will not be accepted unless with valid reason.

d. Long quizzes will be announced but short quizzes may or may not be announced.

e. Special quiz will be given to students with a valid reason of absence(s).

f. Cheating in any form is tantamount to 0.0 grade.

g. Refrain from going out of the room during discussion.

h. Passing grade is sixty (60) percent.


7/7

VIII. REFERENCES

Baker, M., Demystifying Mixed-Signal Test Methods, Elsevier Science, USA, 2003Burns, M. and Roberts, G., Mixed-Signal IC Test and Measurements, Oxford University Press Inc., New York, 2001Horowitz, P. and Hill, W., The Art of Electronics, Cambridge University Press, USA, 1994

Scheiber, S., Building a Successful Board Test Strategy, Butterworth-Heinemann, USA, 2001Terell, D., OP AMPS Design, Application and Trouble Shooting 2nd Ed, Butterworth-Heinemann, USA, 1996

Prepared by:

Engr. Darwin Maaga

Endorsed: Approved:

Engr. Jose Rizaldy De Armas, MEng, PECE Arch. Toni GutierrezChair, Engineering Department Dean, College of Engineering, Architecture and Technology

elective iii syllabus_revc

Documents