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EUROPE EMC GUIDE2013

ARTICLES • BUYERS’ GUIDES • STANDARDS UPDATES • EMC EVENTS

Cover_EEG2013.indd 6 11/16/12 1:37 PM ADs_EEG13.indd 1 11/16/12 1:41 PM

a TESEQ Company a TESEQ Company

What we offer:

AmplifiersforEMC,ISM,telecomanddefense

Solid-stateclassAandclassABmodels

CW,pulsedandcombinedTWTamplifiers

Tetrodetubeamplifiers

Whatmakesusunique:

Rugged,reliabledesignforEMCtestingwithanyload

Higherpoweratlowerfrequencytocompensateforantennagain

Compactdesignwithmodulararchitecture

Upto5yearswarranty

LocalservicethroughTeseq’sownservice organizations

Teseq, IFI & mIlmega –RF, mICROWaVe & TWT eXPeRTsamPlIFIeRs 10 kHz – 40 gHz uP TO 10 kWThree strong brands joined forces in 2012 under the Teseq

umbrella to offer the industry’s widest product range: Teseq, IFI

and Milmega!

Our product portfolio includes Milmega’s famous solid state micro-

wave amplifiers, Teseq’s rugged Class A power amplifiers and IFI’s

high power RF solid state and Tetrode tube amplifiers, as well as

their well-known TWT amplifiers up to 40 GHz. Teseq now covers

any application in the EMC, telecommunications and defense

industries.

Our strong global service network with local accredited calibration

labs ensures fast turn-around for calibration and repair. We back our

commitment to quality and reliability with a warranty up to 5 years.

Teseq – IFI – Milmega, the new power amplifier team to remember!

TeseqInc. Edison, NJ USA T + 1 732 417 0501 F + 1 732 417 0511 [email protected] www.tesequsa.com

ADs_EEG13.indd 3 11/16/12 1:43 PM

CONTENTS2013 Europe EMC Guide

interferencetechnology.eu interference technology 1

4 letter from the editor

6 european StandardS and reSourceS standards organizations, government sites, institutes and trade associations

14 eVentS and tradeShoWS

168 indeX of adVertiSerS

26 productS & SerViceS

34 reSourceS

36 inVeStigation of Vehicle radiated emiSSionS meaSurement practiceS AlAstAir r. ruddle, Ph.d., Project engineer, mira Limited

46 neW Voltage Sag teSting requirementS for induStrial equipment AndreAs eberhArd, vice President, Power standards Lab

50 Surge protectiVe deViceS (SpdS) and Short circuit currentS bryAn Cole, President, technology research council Jim tiesi, marketing manager, emerson network Power surge Protection

58 produkte und SerViceS

65 reSSourcen

66 anforderungen der ciSpr 16-1-1 an meSSempfänger, SpektrumanalySatoren und fft-baSierende meSSinStrumente stePhAn brAun, Arnd FreCh, Founders, gauss instruments gmbH

74 punktgenaue pulS-StörfeStigkeitS-analySe lArs Gläser, Hardware-entwickler von emv - maß, Langer

S u b s c r i p t i o n sITEM, InterferenceTechnology—The EMC Directory & Design Guide, The EMC Symposium Guide, The EMC Test & Design Guide and the Europe EMC Guide are distributed annually at no charge to engineers and managers who are engaged in the application, selection, design, test, specification or procurement of electronic components, systems, materials, equipment, facilities or related fabrication services. subscriptions are available through interferencetechnology.com.

United Kingdom

Deutchland

8

Page 77

all of our articles are availableonline in english at

www.interferencetechnology.eu

TOC_EEG13.indd 1 11/16/12 3:03 PM


What we offer:

AmplifiersforEMC,ISM,telecomanddefense

Solid-stateclassAandclassABmodels

CW,pulsedandcombinedTWTamplifiers

Tetrodetubeamplifiers

Whatmakesusunique:

Rugged,reliabledesignforEMCtestingwithanyload

Higherpoweratlowerfrequencytocompensateforantennagain

Compactdesignwithmodulararchitecture

Upto5yearswarranty

LocalservicethroughTeseq’sownservice organizations

Teseq, IFI & mIlmega –RF, mICROWaVe & TWT eXPeRTsamPlIFIeRs 10 kHz – 40 gHz uP TO 10 kWThree strong brands joined forces in 2012 under the Teseq

umbrella to offer the industry’s widest product range: Teseq, IFI

and Milmega!

Our product portfolio includes Milmega’s famous solid state micro-

wave amplifiers, Teseq’s rugged Class A power amplifiers and IFI’s

high power RF solid state and Tetrode tube amplifiers, as well as

their well-known TWT amplifiers up to 40 GHz. Teseq now covers

any application in the EMC, telecommunications and defense

industries.

Our strong global service network with local accredited calibration

labs ensures fast turn-around for calibration and repair. We back our

commitment to quality and reliability with a warranty up to 5 years.

Teseq – IFI – Milmega, the new power amplifier team to remember!

TeseqInc. Edison, NJ USA T + 1 732 417 0501 F + 1 732 417 0511 [email protected] www.tesequsa.com

ADs_EEG13.indd 3 11/16/12 1:43 PM

2 INTERFERENCE TECHNOLOGY EUROPE EMC GUIDE 2013

2013 Europe EMC Guide


82 PRODUITS ET SERVICES

85 RESSOURCES

86 COUPLAGE ANTENNAIRES D’UNCOUPLAGES ENTRES ANTENNES DANS UN AÉRONEF PAR LA MÉTHODE DIRECTE ACA PASCAL DE RESSÉGUIER, Chef de projet chez, Entares Engineering YANNICK POIRÉ, SAMUEL LEMAN, Ingénieurs Etudes & Simulations CEM, Nexio

96 PRODOTTI E SERVIZI

97 RISORSE

98 IMPATTI POTENZIALI DELLE ARMI ELETTROMAGNETICHE SULLE INFRASTRUTTURE CRITICHE (SITUAZIONE AL 2012) DOTT. WILLIAM A. RADASKY, Membro a vita dell’IEEE

108 PRODOCTOS Y SERVICIOS

111 LOS RECURSOS

112 CÓMO PROTEGER LA INFORMACIÓN CORPORATIVA CONFIDENCIAL DEL ACCESO NO AUTORIZADO HERBERT MANGSTL, Director de ventas, EMshield GmbH JORDI FERRI, Director de la división de blindaje, AST Modular S.L.

116 EMISIONES DE RF DE LAS LÁMPARAS FLUORESCENTES DE BAJO CONSUMO W.G. FANO, Profesor, Facultad de Ingeniería, Universidad de Buenos Aires

124 PRODOKTY I USŁUGI

125 ZASOBY

126 O SZACOWANIU BŁĘDU NIEDOPASOWANIA W BADANIACH EMISJI PROMIENIOWANEJ JAN SROKA, Profesor, Politechnika Warszawska

France

Italia

España

Polska

PAGE 88

PAGE 101

PAGE 118

PAGE

131

TOC_EEG13.indd 2 11/16/12 6:11 PM


InterferenceTechnology—The Annual EMC Guide, The EMC Symposium Guide, and The EMC Test & Design Guide are distributed annually at no charge to qualified engineers and managers who are engaged in the application, selection, design, test, specification or procurement of electronic components, systems, materials, equipment, facilities or related fabrication services. To be placed on the subscriber list, complete the subscription qualification card or subscribe online at InterferenceTechnology.com.

ITEM PublIcaTIons endeavors to offer accurate information, but assumes no liability for errors or omissions in its technical articles. Furthermore, the opinions contained herein do not necessarily reflect those of the publisher.

ITEMTM, InterferenceTechnology™—The Annual EMC GuideTM, and Interference Technology.comTM are trademarks of ITEM PublIcaTIons and may not be used without express permission. ITEM, InterferenceTechnology—The Annual EMC Guide, The EMC Symposium Guide, The EMC Test & Design Guide and InterferenceTechnology.com, are copyrighted publications of ITEM PublIcaTIons. contents may not be reproduced in any form without express permission.

136 Producten en SerViceS

139 middelen

140 Verbeteringen AAn reSonAntieVrij Pdn-deSign MarT Coenen, cEo, EMcMcc arThur van roerMund, Hoogleraar, Technische universiteit van Eindhoven

148 ProduKte und SerViceS

150 reSSourcen

154 ProduitS et SerViceS

156 reSSourceS

158 ProduKte und SerViceS

162 ProductS & SerViceS

Nederland

Schweiz

Belgique

Österreich

Europe

PaGE 141

Cover: Photography by photographer Ray lombardi, lorray Design studio; Model: George bruno, conshohocken, Pennsylvania, u.s. lab use courtesy of alion science & Technology, conshohocken, Pennsylvania, u.s.

2013 Europe EMC Guide

TOC_EEG13.indd 3 11/16/12 3:06 PM

4 interference technology

Letter from the Editor

USA1000 Germantown Pike, F-2

Plymouth Meeting, PA 19462Phone: (484) 688-0300

Fax: (484) 688-0303E-mail:

[email protected]

chinA, tAiwAn, hong kongBeijing Hesicom Consulting Company

Cecily Bian, +86-010-65250537E-mail: [email protected]

JAPAnTÜV SÜD Ohtama, Ltd.

Miho Toshima, +81-44-980-2092E-mail: [email protected]

ITEM MEdIa endeavors to offer accurate information, but assumes no liability for errors or omissions. Information published herein is based on the latest information available at the time of publication. Furthermore, the opinions contained herein do not necessarily reflect those of the publisher.

I T E M T M , I n t e r f e r e n c e T e c h n o l o g y ™ a n d Inter ferenceTechnology.comTM are trademarks of ITEM MEdIa and may not be used without express permission. ITEM, InterferenceTechnology and InterferenceTechnology.com are copyrighted publications of ITEM MEdIa. Contents may not be reproduced in any form without express permission.

Copyright © 2012 • ITEM Media • ISSN 0190-0943

PublisherPaul Salotto

editorBelinda Stasiukiewicz

editorial AssistantAliza Becker

graphic DesignerEvan Schmidt

MarketingFrancesco diMaioJacqueline Gentile

Business Development ManagerCasey Goodwin

Business Development executivesdaryl McFadyen

Leslie RingeKatie ToltonJanet Ward

Administrative ManagerEileen M. ambler

circulation ManagerIrene H. Nugent

Product Development ManagerHelen S. Flood

Data AnalystKaren Holder

PresidentGraham S. Kilshaw

Publisher emeritusRobert d. Goldblum

A year for europe

W ELCOME TO THE THIRD ANNUAL IS-SUE of the Interference Technology Europe EMC Guide. 2013 has been designated the European Year of Citizens to commemorate the 20th

anniversary of EU citizenship under the Maastricht Treaty. The European Year is both an interdepartmental and grass-roots-level campaign that aims to raise European awareness of citizen rights. Therefore, Interference Technology has dedicated this edition of the Europe EMC Guide to the contributions of Europeans to the

EMC world, featuring biographies of significant engineers and articles on new standards and practices taking place in Europe. One recent important standard is the New Legislative Framework for Marketing of Products, which came into effect in 2010. This decision concerns the traceability of products being placed in the EU, including components like EMI filters and shielding. It requires importers, distributors and manufacturers to share the responsibility to put only compliant products on the market. The articles in this issue demonstrate how information on EMC can reach across continents, connecting engineers the world over, regardless of nation. Each section in this issue contains an article in its country’s native language, and all articles are also available in English on our website, www.interferencetechnology.eu. Be sure to check out our new digital edition on the site as well, which has interactive elements and special features. In this issue, Mart Coenen, who is based in the Netherlands, discusses enhancements on resonant-free PDN Design on page 140. We also provide information on new requirements, such as CISPR 16-1-1 test receivers, spectrum analysers and FFT-based measuring instruments, which Germans Stephan Braun and Arnd Frech discuss on page 66. EMC on aircraft is a commonly discussed and disputed topic among engineers and the general public alike. French engineers Pascal De Resseguier, Yannick Poire and Samuel Leman discuss antenna coupling inside an aircraft on page 86. We also take a look back in this issue by exploring some of the historical figures in the field. These men and women are all from European countries and were key in the development of the field. One of the most well-known European engineers is Nicola Tesla. He was born in Croatia and lived in Austria, Hungary, the Czech Republic and France before emigrating to the U.S. He worked for Thomas Edison before forming his own companies, Tesla Electric Light & Manufacturing and Tesla Electric Company, and he patented the Tesla Coil. Tesla’s impact can be felt across the globe, even in my hometown on Long Island, New York, where he built his Wardenclyffe Laboratory. Joining Tesla in this year’s focus on historical figures in EMC are Guglielmo Marconi, the Italian inventor of radio; Heinrich Rudolf Hertz, the German physicist; Michael Faraday, the English scientist who inspired Albert Einstein; and other historically significant men and women. These engineers contributed in many important ways that helped shape the field as we know it today. There are also many important shows that will take place in Europe over the next year. One is the EMC 2013 Europe show, which will take place in Brugge, Belgium. There is also EMV 2013 in Stuttgart, Germany — one of the largest trade shows in Europe for electromagnetic compatibility. This conference, held in March, offers professionals the opportunity to acquire information on trends and developments firsthand. We have a list of these and other important events and conferences on page 14. Europe — from its significant historical figures to its new regulations and important industry events — is a very important contributor to EMC and we’re committed to providing current, practical and accurate articles and information for the entire region. If you have any questions or comments about this issue, or would like to contribute to the next edition, please email me at [email protected].

Belinda StasiukiewiczEditor

2013 EUROPE EMC GUIDE

Editors_Note_EEG13.indd 6 11/16/12 3:08 PM

International Microwave SymposiumIEEE 2-7 June 2013, Seattle, WA MTT-S

IMS2013 MUST ATTEND!

HTTP://IMS2013.MTT.ORG FOR FULL CONFERENCE DETAILS VISIT

The 2013 IEEE MTT-S International Microwave Symposium (IMS2013) is the Premier Microwave Conference in the Industry! With over 9,000 attendees and over 800 industrial exhibits of the latest state-of-the-art microwave products, Microwave Week is the world’s largest gathering of Radio Frequency (RF) and Microwave professionals and the most important forum for the latest and most advanced research in the area.

Technical Paper Submissions: Authors are invited to submit technical papers describing original work on radio-frequency, microwave, millimeter-wave, and terahertz (THz) theory and techniques. The deadline for submission is 10 December 2012. Please refer to the IMS2013 website (http://ims2013.mtt.org) for detailed instructions concerning paper submission, as well as a complete list of technical areas.

Become an Exhibitor: The 2013 IEEE MTT-S International Microwave Symposium is the world’s premier microwave event. It features a large trade show, technical sessions, workshops and panel sessions covering a wide range of topics. Attendee interests include wireless communication, radar, RF technologies, high frequency semiconductors, electromagnetics, commercial and military RF, microwave and mm-wave electronics, applications, and much more.

SUBMIT YOUR TECHNICAL PAPER TO IMS2013 TODAY!

EXPERIENCE ALL THE ADVANTAGES OF BECOMING AN EXHIBITOR AT IMS2013.

IMS2013 EXHIBIT SPACE IS AVAILABLE FOR RESERVATION Questions or further information contact: Cedric W. Fellows, Sales Director, Events Tel 303-530-4562 ext. 133, Email: [email protected]

Tim Thompson Tim Thompson

Tim Thompson

Tim Thompson

Tim Thompson

ADs_EEG13.indd 4 11/16/12 2:34 PM

6 interference technology europe emc guide 2013

Compliance with standards can make or break any new product. This section recaps some of the major new and revised EMC standards in the last year from the three European standards organizations: the European Committee for Standardization (CEN), the European Committee for Electrotechnical Standardization (CENELEC) and the European Telecommunications Standards Institute (ETSI). Standards information and updates are featured in our Interference Technology eNews. Visit InterferenceTechnology.com, subscribe to the eNews, and you’ll be notified weekly of important changes in EMC standards from Europe and around the world. Standards are sorted by standard reference number.

European Committee for Electrotechnical Standardization (CENELEC)

EN 50177:2009/A1:2012

IEC TEChNICAl Body: CLC/SC 31-8

STATuS: Published

dATE of puBlICATIoN: 2012-08-17

TITlE: Stationary electrostatic appli-cation equipment for ignitable coating powders - Safety requirements

EN 50516-1-1:2011/AC:2012IEC TEChNICAl Body: CLC/TC 86BXA

STATuS: Published


TITlE: Industrial connector sets and interconnect components to be used in optical fibre control and communication systems - Product specifications - Part 1-1: Type SC-RJ PC industrial terminated on EN 60793-2-10 category A1a and A1b multimode fibre to meet the requirements of category I (industrial environments) as specified in IEC/PAS 61753-1-3

SCopE: 1.1 Product definition This Euro-pean Standard contains the initial, start of life dimensional, optical, mechanical and environmental performance requirements that an SC-RJ connector set with one side protected by an industrial housing with the fibres terminated with cylindrical

zirconia PC ferrules, an adaptor fitted with resilient alignment sleeves and patchcord shall meet in order for it to be categorised as an EN standard product. The product is rated IP67. Since different variants are permitted, product marking details are given in 3.6. 1.2 Intermateability Products conforming to the requirements of this specification will intermate and give the specified level of random attenuation and random return loss performance, provided that the same fibre type is used. The intention is that this will be true irrespective of the manufacturing source(s) of the product. 1.3 Operating environment The tests selected combined with the severities and durations, speci-fied as category I, are intended to reflect, although they do not necessarily satisfy all the requirements of the boundary con-ditions of M3I3C3E3. 1.4 Reliability Whilst the anticipated service life expectancy of the product in this environment is 20 years, compliance with this specification does not guarantee the reliability of the product. This should be predicted us-ing a recognised reliability assessment programme. 1.5 Quality assurance Com-pliance with this specification does not guarantee the manufacturing consistency of the product. This should be maintained using a recognised quality assurance programme.

EN 50521:2008/A1:2012IEC TEChNICAl Body: CLC/TC 82

STATuS: Published


TITlE: Connectors for photovoltaic systems - Safety requirements and tests

SCopE: This European Standard applies to connectors of application Class A ac-cording to EN 61730-1 for use in photo-voltaic systems with rated voltages up to 1 500 V DC and rated currents up to 125 A per contact. This standard applies to connectors without breaking capacity but might be engaged and disengaged under voltage. NOTE For connectors according to Class B and C of EN 61730 as well as for protection for Class II equipment intended for use between 0 V and 120 V d.c. in photovoltaic-systems this standard may be used as a guide.

EN 60269-4:2009/A1:2012IEC TEChNICAl Body: CLC/SR 32B

STATuS: Published


TITlE: Low-voltage fuses - Par t 4: Supplementary requirements for fuse-links for the protection of semiconductor devices

SCopE: IEC 60269-4:2009 is to be used in conjunction with IEC 60269-1. This Part 4 supplements or modifies the corresonding clauses or subclauses of Part 1. Fuse-links for the protection of semiconductor de-vices shall comply with aIl requirements of IEC 60269-1, if not otherwise indicated hereinafter, and shall also comply with the supplementary requirements laid down below. This fifth edition cancels and replaces the fourth edition published in

STANDARDS EUROPE

Standards | Europe

Standards_EEG13.indd 6 11/16/12 5:55 PM


Standards | Europe

2006. It constitutes a technical revision. The significant technical changes to the fourth edition are: - the introduction of voltage source inverter fuse-links, includ-ing test requirements; - coverage of the tests on operating characteristics for a.c. by the breaking capacity tests; - the updating of examples of standardised fuse-links for the protection of semicon-ductor devices.

EN 60358-1:2012IEC TEChNICal Body: CLC/SR 33

STaTuS: Published

daTE of puBlICaTIoN: 2012-08-10

TITlE: Coupling capacitors and capacitor dividers - Part 1: General rules

SCopE: IEC 60358-1:2012 applies to ca-pacitors, with rated voltage >1 000 V, con-nected line to ground with the low voltage terminal either permanently earthed or connected to devices, for applications listed hereunder and other similar uses. This standard serves as basic standard for the coupling capacitor, the different parts of this standard will present the supplementary specifications and tests, for example IEC 60358-2, IEC 60358-3 or IEC 60358-4. This standard cancels and replaces the second edition of IEC 60358 (1990), and constitutes a techni-cal revision. This edition of IEC 60358-1 includes the following significant techni-cal changes with respect to the former edition of IEC 60358: - the standard has been split into different parts; Part 1 is the general rules and Parts 2, 3, 4 will be specific to the PLC, filters and dividers applications. - the routine and type test have been reviewed and are presented in Figure 2. Keywords: coupling capacitor, capacitor dividers.

EN 60717:2012IEC TEChNICal Body: CLC/SR 40

STaTuS: Published


TITlE: Method for the determination of the space required by capacitors and resistors with unidirectional terminations

SCopE: IEC 60717:2012 applies to ca-pacitors and resistors with unidirectional

wire terminations intended for use in elec-tronic equipment. This standard provides a method for determination of the space required by capacitors and resistors with unidirectional wire terminations. NOTE: Instead of measuring the actual space, it may be sufficient to ensure that a component fits into the maximum space for which it is designed. This may be achieved by means of fixed gauges. The main technical changes with respect to the first edition are the following: - em-ployment of the millimetre-based grid, the preferred grid system given in IEC 60097, - employment of SI units only, causing deletion of the imperial dimensions from Table 1, - reduction of the tolerance on the chamfer depth in Figure 1, and - introduc-tion of requirements on information to be given in a relevant specification.


STaTuS: Published


TITlE: Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guide-lines for the use

SCopE: IEC 60862-2:2012 gives practi-cal guidance on the use of SAW filters which are used in telecommunications, measuring equipment, radar systems and consumer products. IEC 60862-1 should be referred to for general information, stan-dard values and test conditions. This part of IEC 60862 includes various kinds of fil-ter configuration, of which the operating frequency range is from approximately 10 MHz to 3 GHz and the relative bandwidth is about 0,02 % to 50 % of the centre fre-quency. It is not the aim of this standard to explain theory, nor to attempt to cover all the eventualities which may arise in practical circumstances. This standard draws attention to some of the more fundamental questions, which should be considered by the user before he places an order for a SAW filter for a new ap-plication. Such a procedure will be the user’s insurance against unsatisfactory performance. This edition includes the following significant technical changes with respect to the previous edition: - Clause 3 ‘Terms and definitions’ has been deleted to be included in the next edition of IEC 60862-1; - the tapered IDT

STaNdaRdS oRGaNIZaTIoNS

• CEN, the European Committee for Standardization

CEN is a provider of European Stan-dards and technical specifications. It is a recognized European organization according to Directive 98/34/EC for the planning, draf ting and adoption of European Standards in all areas of economic activity with the exception of electrotechnology (CENELEC) and telecommunication (ETSI).

CEN-CENELEC Management Centre, Avenue Marnix 17, B-1000 Brussels, Belgium; + 32 2 550 08 11; Fax: + 32 2 550 08 19; w w w.cen.eu/cenorm/homepage.htm

• CENELEC - European Committee for Electrotechnical Standardization

CENELEC’s mission is to prepare vol-untary electrotechnical standards that help develop the Single European Mar-ket/European Economic Area for electri-cal and electronic goods and services removing barriers to trade, creating new markets and cutting compliance costs.

17, Avenue Marnix, B-1000 Brussels, Belgium; +32 2 519 68 71; Fax: +32 2 519 69 19; www.cenelec.org

• European Telecommunications Standards InstituteRecognized as an of ficial European Standards Organization by the Euro-pean Union, ETSI produces globally applicable standards for Information & Communications Technologies including fixed, mobile, radio, broadcast, internet, aeronautical and other areas.

ETSI Secretariat: 650, Route des Lu-cioles, 06921 Sophia-Antipolis Cedex, France; +33 (0)4 92 94 42 00; Fax: +33 (0)4 93 65 47 16; [email protected]; www.etsi.org

• International Electrotechnical Commission (IEC)The IEC prepares and publishes Interna-tional Standards for all electrical, electronic and related technologies — collectively known as electrotechnology.

IEC Central Office, 3, rue de Varembé, P.O. Box 131, CH - 1211 Geneva 20, Switzerland; +41 22 919 02 11, Fax: +41 22 919 03 00; [email protected], www.iec.ch

IEC’s EMC Zone: www.iec.ch/zone/emc/emc_entry.htm



Standards | Europe

filter and the RSPUDT filter have been added to the clause of SAW transversal filters. Also DART, DWSF and EWC have been added as variations of SPUDT; - the balanced connection has been added to the subclause of coupled resonator filters; - recent substrate materials have been described; - a subclause about packaging of SAW filters has been added.

EN 61000-6-3:2007/A1:2011/AC:2012IEC TEChNICAl Body: CLC/TC 210

STATuS: Published


TITlE: Electromagnetic compatibility (EMC) - Part 6-3: Generic standards - Emission standard for residential, com-mercial and light-industrial environments.

EN 61076-3-110:2012IEC TEChNICAl Body: CLC/SR 48B

STATuS: Published


TITlE: Connectors for electronic equip-ment - Product requirements - Part 3-110: Detail specification for shielded, free and fixed connectors for data transmission with frequencies up to 1 000 MHz

SCopE: IEC 61076-3-110:2012 This detail specification covers mechanical and en-vironmental requirements, and electrical transmission requirements for frequen-cies up to 1 000 MHz. These connectors can be used as category 7A connectors in class FA cabling systems specified in ISO/IEC 11801. The connectors are intermateable with IEC 60603-7 series connectors (see 3.3). The connectors are interoperable with IEC 60603-7-7 and IEC 60603-7-71 connectors (see 3.4). The con-nectors are backward compatible with IEC 60603-7-7 and IEC 60603-7-71 connectors (see 3.5). This second edition cancels and replaces the first edition, issued in 2007, and constitutes a technical revision. This edition includes the following significant technical changes with respect to the pre-vious edition: - changes in 4.5 regarding electrical transmission performance i.e. return loss, among other specific changes, in compliance to the requirements of ISO/

IEC 11801, - updated text and format to be consistent with the referenced standards, - removal of duplication of requirements in the IEC 60603-7 standard series, in-troduction of transmission performance testing procedures as specified by IEC 60512-28-100. Keywords: Free connec-tors, Fixed connectors.

EN 61124:2012IEC TEChNICAl Body: CLC/SR 56

STATuS: Published


TITlE: Reliability testing - Compliance tests for constant failure rate and con-stant failure intensity

SCopE: IEC 61124:2012 gives a number of optimized test plans, the correspond-ing operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies proce-dures to test whether an observed value of: failure rate, failure intensity, meantime to failure (MTTF), and mean operating time between failures (MTBF). The main changes with respect to the previous edition are as follows: - A number of new test plans have been added based on the Russian standard GOST R 27.402 [1], and it is intended to align the new edition of MIL-HDBK-781 [2] with this edition. Algorithms for optimizing test plans using a spreadsheet program are given and a number of optimized test plans are listed. Furthermore, emphasis is laid on the fact that the test should be repeated following design changes; - Discrepancies in test plans A, B as well as Annexes A and B that originated in IEC 60605-7 [3], now withdrawn, have been corrected so these test plans differ from those given in previ-ous editions of IEC 61124. As requested by the National Committees, mathematical background material and spreadsheet program information has been moved to informative annexes. In addition, the sym-bol lists have been divided, so that some annexes have separate lists of symbols; - Guidance on how to choose test plans has been added as well as guidance on how to use spreadsheet programs to cre-ate them. Test plans A.1 to A.9 and B.1 to B.13 have been corrected; - Subcluses 8.1,

8.2, 8.3, Clause 9, Annex C, Clauses G.2, I.2, I.3 and Annex J are unchanged, except for updated terminology and references.

EN 61375-1:2012IEC TEChNICAl Body: CLC/TC 9X

STATuS: Published


TITlE: Electronic railway equipment - Train communication network (TCN) - Part 1: General architecture

SCopE: IEC 61375-1:2012 applies to the architecture of data communication sys-tems in open trains, i.e. it covers the ar-chitecture of a communication system for the data communication between vehicles of the said open trains, the data commu-nication within the vehicles and the data communication from train to the ground. The applicability of this part of IEC 61375 to the train network technologies allows for interoperability of individual vehicles within open trains in international traf-fic. The main technical change of this new edition with regard to the previous edition consists of a new structure of the complete IEC 61375 series.

EN 61439-6:2012IEC TEChNICAl Body: CLC/SR 17D

STATuS: Published


TITlE: Low-voltage switchgear and controlgear assemblies - Part 6: Busbar trunking systems (busways)

SCopE: IEC 61439-6:2012 lays down the definitions and states the service conditions, construction requirements, technical characteristics and verification requirements for low voltage BTS (see 3.101) as follows: - BTS for which the rated voltage does not exceed 1 000 V in case of a.c. or 1 500 V in case of d.c.; - BTS intended for use in connection with the generation, transmission, distribution and conversion of electric energy, and for the control of electric energy consuming equipment; - BTS designed for use under special service conditions, for example in ships, in rail vehicles, and for domestic applications (operated by unskilled per-sons), provided that the relevant specific



Standards | Europe

filter and the RSPUDT filter have been added to the clause of SAW transversal filters. Also DART, DWSF and EWC have been added as variations of SPUDT; - the balanced connection has been added to the subclause of coupled resonator filters; - recent substrate materials have been described; - a subclause about packaging of SAW filters has been added.

EN 61000-6-3:2007/A1:2011/AC:2012IEC TEChNICAl Body: CLC/TC 210

STATuS: Published


TITlE: Electromagnetic compatibility (EMC) - Part 6-3: Generic standards - Emission standard for residential, com-mercial and light-industrial environments.

EN 61076-3-110:2012IEC TEChNICAl Body: CLC/SR 48B

STATuS: Published


TITlE: Connectors for electronic equip-ment - Product requirements - Part 3-110: Detail specification for shielded, free and fixed connectors for data transmission with frequencies up to 1 000 MHz

SCopE: IEC 61076-3-110:2012 This detail specification covers mechanical and en-vironmental requirements, and electrical transmission requirements for frequen-cies up to 1 000 MHz. These connectors can be used as category 7A connectors in class FA cabling systems specified in ISO/IEC 11801. The connectors are intermateable with IEC 60603-7 series connectors (see 3.3). The connectors are interoperable with IEC 60603-7-7 and IEC 60603-7-71 connectors (see 3.4). The con-nectors are backward compatible with IEC 60603-7-7 and IEC 60603-7-71 connectors (see 3.5). This second edition cancels and replaces the first edition, issued in 2007, and constitutes a technical revision. This edition includes the following significant technical changes with respect to the pre-vious edition: - changes in 4.5 regarding electrical transmission performance i.e. return loss, among other specific changes, in compliance to the requirements of ISO/

IEC 11801, - updated text and format to be consistent with the referenced standards, - removal of duplication of requirements in the IEC 60603-7 standard series, in-troduction of transmission performance testing procedures as specified by IEC 60512-28-100. Keywords: Free connec-tors, Fixed connectors.

EN 61124:2012IEC TEChNICAl Body: CLC/SR 56

STATuS: Published


TITlE: Reliability testing - Compliance tests for constant failure rate and con-stant failure intensity

SCopE: IEC 61124:2012 gives a number of optimized test plans, the correspond-ing operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies proce-dures to test whether an observed value of: failure rate, failure intensity, meantime to failure (MTTF), and mean operating time between failures (MTBF). The main changes with respect to the previous edition are as follows: - A number of new test plans have been added based on the Russian standard GOST R 27.402 [1], and it is intended to align the new edition of MIL-HDBK-781 [2] with this edition. Algorithms for optimizing test plans using a spreadsheet program are given and a number of optimized test plans are listed. Furthermore, emphasis is laid on the fact that the test should be repeated following design changes; - Discrepancies in test plans A, B as well as Annexes A and B that originated in IEC 60605-7 [3], now withdrawn, have been corrected so these test plans differ from those given in previ-ous editions of IEC 61124. As requested by the National Committees, mathematical background material and spreadsheet program information has been moved to informative annexes. In addition, the sym-bol lists have been divided, so that some annexes have separate lists of symbols; - Guidance on how to choose test plans has been added as well as guidance on how to use spreadsheet programs to cre-ate them. Test plans A.1 to A.9 and B.1 to B.13 have been corrected; - Subcluses 8.1,

8.2, 8.3, Clause 9, Annex C, Clauses G.2, I.2, I.3 and Annex J are unchanged, except for updated terminology and references.

EN 61375-1:2012IEC TEChNICAl Body: CLC/TC 9X

STATuS: Published


TITlE: Electronic railway equipment - Train communication network (TCN) - Part 1: General architecture

SCopE: IEC 61375-1:2012 applies to the architecture of data communication sys-tems in open trains, i.e. it covers the ar-chitecture of a communication system for the data communication between vehicles of the said open trains, the data commu-nication within the vehicles and the data communication from train to the ground. The applicability of this part of IEC 61375 to the train network technologies allows for interoperability of individual vehicles within open trains in international traf-fic. The main technical change of this new edition with regard to the previous edition consists of a new structure of the complete IEC 61375 series.

EN 61439-6:2012IEC TEChNICAl Body: CLC/SR 17D

STATuS: Published


TITlE: Low-voltage switchgear and controlgear assemblies - Part 6: Busbar trunking systems (busways)

SCopE: IEC 61439-6:2012 lays down the definitions and states the service conditions, construction requirements, technical characteristics and verification requirements for low voltage BTS (see 3.101) as follows: - BTS for which the rated voltage does not exceed 1 000 V in case of a.c. or 1 500 V in case of d.c.; - BTS intended for use in connection with the generation, transmission, distribution and conversion of electric energy, and for the control of electric energy consuming equipment; - BTS designed for use under special service conditions, for example in ships, in rail vehicles, and for domestic applications (operated by unskilled per-sons), provided that the relevant specific



Standards | Europe

requirements are complied with; - BTS designed for electrical equipment of ma-chines. Supplementary requirements for BTS forming part of a machine are covered by the IEC 60204 series. This first edition of IEC 61439-6 cancels and replaces the third edition of IEC 60439-2 (2000) and its Amendment 1 (2005), and constitutes a technical revision. This edition of IEC 61439-6 includes the following significant technical changes with respect to the lat-est edition of IEC 60439-2: - alignment on the second edition of IEC 61439-1 (2011) regarding the structure and technical content, as applicable; - introduction of new verifications, accordingly; - cor-rection of inconsistencies in resistance, reactance and impedance measurements and calculations; - numerous editorial improvements.


STaTuS: Published


TITlE: Surface mounted piezoelectric devices for frequency control and selec-tion - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

SCopE: IEC 61837-1:2012 deals with standard outlines and terminal lead connections as they apply to SMDs for frequency control and selection in plastic moulded enclosures and is based on IEC 61240.

EN 62271-107:2012IEC TEChNICal Body: CLC/TC 17AC

STaTuS: Published


TITlE: High-voltage switchgear and controlgear - Part 107: Alternating current fused circuit-switchers for rated voltages above 1 kV up to and including 52 kV

SCopE: IEC 62271-107:2012 applies to three-pole operated units for distribution systems that are functional assemblies of a circuit-switcher and current-limiting fuses designed so as to be capable of: - breaking, at the rated recovery volt-age, any load or fault current up to and

including the rated short-circuit breaking current; - making, at the rated voltage, circuits to which the rated short-circuit breaking current applies. This second edition cancels and replaces the first edition, published in 2005. It consti-tutes a technical revision. This edition includes the following significant techni-cal changes with respect to the previous edition. - the reference to IEC 60694 has been changed to IEC 62271-1; - the new clauses and subclauses from IEC 62271-1 have been added and where necessary new wording has been provided; - the normative references have been updated: IEC 60265-1 to IEC 62271-103, IEC 60787 to IEC/TR 60787, IEC 60466 to IEC 62271-201, and IEC/TR 60787 was moved to the bibliography; - the figures and tables have been placed in the document where they are first cited; - the numbering of figures and tables has been changed to obtain the correct order; - the definition of NSDD was deleted. This definition is included in IEC 62271-1; - the acceptance criteria have been aligned with 6.101.4 of IEC 62271-103:2011; - the various provisions expressed about ‘extension of the validity of type tests’ have been grouped under 6.103: some of the rules were duplicated in Clauses 6 and 8, and it seems better fitted to deal within each type test sub-clause only with the type test to be performed. Conditions have not been changed, but the wording is clearer; - new numbering of subclauses in Clauses 8 and 9 to avoid conflict with clauses from IEC 62271-1.

EN 62271-207:2012IEC TEChNICal Body: CLC/TC 17AC

STaTuS: Published


TITlE: High-voltage switchgear and con-trolgear - Part 207: Seismic qualification for gas-insulated switchgear assemblies for rated voltages above 52 kV

SCopE: IEC 62271-207:2012 applies to gas-insulated switchgear assemblies for alternating current of rated voltages above 52 kV for indoor and outdoor instal-lations, including their supporting struc-ture. This second edition of IEC 62271-207 cancels and replaces the first edition published in 2007. It constitutes a techni-cal revision. This edition includes the fol-

• CISPR The principal task of CISPR, the Inter-national Special Committee on Radio Interference, is at the higher end of the frequency range, from 9 kHz upwards, preparing standards that offer protec-tion of radio reception from interference sources such as electrical appliances of all types, the electricity supply system, industrial, scientific and electromedical RF, broadcasting receivers (sound and TV) and, increasingly, IT equipment (ITE).

www.iec.ch/zone/emc/emc_cis.htm

• International Organization for StandardizationA developer and publisher of interna-tional standards, ISO is comprised of a network of the national standards insti-tutes of 163 countries, one member per country, with a Central Secretariat in Geneva, Switzerland, that coordinates the system.

ISO Central Secretariat: 1, ch. de la Voie-Creuse, Case postale 56, CH- 1211 Geneva 20, Switzerland; +41 22 749 01 11; Fax +41 22 733 34 30; www.iso.org

GOVERNMENT SITES

• CEOC InternationalSecretariat, Rue du Commerce 20-22, B-1000 Brussels, Belgium; +32 2 511 5065; Fax: +32 2 502 5047; [email protected]; www.ceoc.com

• EFTA (European Free Trade Association)Headquarters: 9-11, rue de Varembé, CH-1211 Geneva 20, Switzerland; +41 22 332 26 00; Fax: +41 22 332 26 77; [email protected]; www.efta.int

• European Comm iss ionSecretariat-General, B-1049 Brussels, Belgium

http://ec.europa.eu

• European New Legislative Framework for marketing of productsht tp://ec.europa.eu/enterprise/poli-cies/single-market-goods/regulatory-policies-common-rules-for-products/new-legislative-framework



Standards | Europe

lowing significant technical changes with respect to the previous edition: - modifi-cation of the minimum voltage rating from 72,5 kV to above 52 kV; - harmonisation of qualification procedures for GIS with IEEE 693:2005 Annex A and P by modifying the response spectra; - modification of the test procedures; - addition of criteria of allowed stresses; - addition of dynamic analysis CQC.

European Committee for Standardization (CEN)

CWA 16504:2012IEC TEChnICAl Body: CEN/WS InTime - Secure multilateral communication via EDI in non-hierarchical networks (InTime)

STATuS: Published

dATE of puBlICATIon: 2012-08-29

TITlE: Simplified multilateral EDI - Se-cure electronic data interchange in non-hierarchical networks

SCopE: This workshop agreement is intended as a guideline for the exchange of business documents between compa-nies by electronic communication (EDI). Since every company has a multitude of business relationships it is important to keep this communication easy to handle. Especially for small and medium sized enterprises a new approach is necessary because the efforts to handle bilateral communication channels are too heavy. The idea is to route the communication through a central platform in the Internet where only the data format is used which is described in this workshop agreement. The data format must be lightweight (to enable companies of all sizes to commu-nicate) and free of redundancies (so the semantics are clear). Both aspects are not possible with traditional data formats like EDIFACT.

En 13032-1:2004+A1:2012IEC TEChnICAl Body: CEN/TC 169 - Light and lighting

STATuS: Published


Title: Light and lighting - Measurement and presentation of photometric data of lamps and luminaires - Part 1: Measure-ment and file format

SCopE: This standard establishes gener-al principles for the measurement of basic photometric data for lighting application purposes. It establishes the measurement criteria needed for the standardisation of basic photometric data and details of the CEN file format for electronic data transfer. In addition to it being a valuable standard in its own right, this standard has been written in two parts to provide the basis of photometric measurement in part 1 and verification and presentation techniques for specific lighting applica-tions in part 2.

En 13309:2010IEC TEChnICAl Body: CEN/TC 151 - Construction equipment and building material machines - Safety

STATuS: Published


TITlE: Construction machinery - Electro-magnetic compatibility of machines with internal power supply

SCopE: This European Standard provides test methods and acceptance criteria for the evaluation of the electromagnetic compatibility of construction machinery with respect to free trade of goods in the European Union. It deals with functional EMC requirements under typical EMC environmental conditions. This European Standard does not deal with safety re-quirements. Electrical and/or electronic component(s) or separate technical unit(s) intended to be fit ted in construction machinery are also dealt with in this European Standard. The following elec-tromagnetic disturbance phenomena are evaluated: - broadband and narrowband electromagnetic interference; - electro-magnetic field immunity test; - broadband and narrowband interference of electri-cal/electronic sub-assemblies; - electro-magnetic field immunity test of electrical/electronic sub-assemblies; - electrostatic discharge; - conducted transients. Con-struction machinery can have DC and/or AC internal electrical power supply sys-tems. Machines that are designed to be

supplied by the “Public Mains Network” are specifically excluded.

En 618:2002+A1:2010IEC TEChnICAl Body: CEN/TC 148 - Continuous handling equipment and systems - Safety

STATuS: Published


TITlE: Continuous handling equipment and systems - Safety and EMC require-ments for equipment for mechanical handling of bulk materials except fixed belt conveyors

SCopE: 1.1 This standard deals with the technical requirements to minimise the risks due to the hazards listed in clause 4, which can arise during operation and maintenance of mechanical handling equipment defined in clauses 3.1 to 3.3 and which are designed for continuously conveying bulk materials from the loading point(s) to the unloading point(s).In gen-eral, it also applies to equipment which are built into machines or attached to machines. This standard deals with the technical requirements for EMC. 1.2 The standard does not apply to: - continuous handling equipment and systems for open-cast lignite mining; - continuous handling equipment and systems for underground mining; - tunnel digging and excavating machines; - bulk material processing or classification machines such as grinders, crushers, screens; - fixed belt conveyors for bulk materials. These are covered by the standard EN 620:2002+A1:2010; - fixed pneumatic handling equipment. These equipment and systems are covered by the standard EN 741; - the interface between the ma-chinery dealt with in this standard and the fixed belt or pneumatic conveyor. 1.3 This standard does not give the ad-ditional requirements for: a) use in public areas or for the transportation of people; b) floating, dredging and ship mounted equipment; c) conveyors requiring a high level of cleanliness for hygiene reasons, e.g. in direct contact with foodstuffs or pharmaceuticals; d) transportation of the equipment; e) hazards caused by vibra-tion; f) use in ambient air temperature below - 20 °C and above + 40 °C; g) the effects of wind on strength and stability; h) hazards resulting from handling specific



Standards | Europe

lowing significant technical changes with respect to the previous edition: - modifi-cation of the minimum voltage rating from 72,5 kV to above 52 kV; - harmonisation of qualification procedures for GIS with IEEE 693:2005 Annex A and P by modifying the response spectra; - modification of the test procedures; - addition of criteria of allowed stresses; - addition of dynamic analysis CQC.

European Committee for Standardization (CEN)

CWA 16504:2012IEC TEChnICAl Body: CEN/WS InTime - Secure multilateral communication via EDI in non-hierarchical networks (InTime)

STATuS: Published


TITlE: Simplified multilateral EDI - Se-cure electronic data interchange in non-hierarchical networks

SCopE: This workshop agreement is intended as a guideline for the exchange of business documents between compa-nies by electronic communication (EDI). Since every company has a multitude of business relationships it is important to keep this communication easy to handle. Especially for small and medium sized enterprises a new approach is necessary because the efforts to handle bilateral communication channels are too heavy. The idea is to route the communication through a central platform in the Internet where only the data format is used which is described in this workshop agreement. The data format must be lightweight (to enable companies of all sizes to commu-nicate) and free of redundancies (so the semantics are clear). Both aspects are not possible with traditional data formats like EDIFACT.

En 13032-1:2004+A1:2012IEC TEChnICAl Body: CEN/TC 169 - Light and lighting

STATuS: Published


Title: Light and lighting - Measurement and presentation of photometric data of lamps and luminaires - Part 1: Measure-ment and file format

SCopE: This standard establishes gener-al principles for the measurement of basic photometric data for lighting application purposes. It establishes the measurement criteria needed for the standardisation of basic photometric data and details of the CEN file format for electronic data transfer. In addition to it being a valuable standard in its own right, this standard has been written in two parts to provide the basis of photometric measurement in part 1 and verification and presentation techniques for specific lighting applica-tions in part 2.

En 13309:2010IEC TEChnICAl Body: CEN/TC 151 - Construction equipment and building material machines - Safety

STATuS: Published


TITlE: Construction machinery - Electro-magnetic compatibility of machines with internal power supply

SCopE: This European Standard provides test methods and acceptance criteria for the evaluation of the electromagnetic compatibility of construction machinery with respect to free trade of goods in the European Union. It deals with functional EMC requirements under typical EMC environmental conditions. This European Standard does not deal with safety re-quirements. Electrical and/or electronic component(s) or separate technical unit(s) intended to be fit ted in construction machinery are also dealt with in this European Standard. The following elec-tromagnetic disturbance phenomena are evaluated: - broadband and narrowband electromagnetic interference; - electro-magnetic field immunity test; - broadband and narrowband interference of electri-cal/electronic sub-assemblies; - electro-magnetic field immunity test of electrical/electronic sub-assemblies; - electrostatic discharge; - conducted transients. Con-struction machinery can have DC and/or AC internal electrical power supply sys-tems. Machines that are designed to be

supplied by the “Public Mains Network” are specifically excluded.

En 618:2002+A1:2010IEC TEChnICAl Body: CEN/TC 148 - Continuous handling equipment and systems - Safety

STATuS: Published


TITlE: Continuous handling equipment and systems - Safety and EMC require-ments for equipment for mechanical handling of bulk materials except fixed belt conveyors

SCopE: 1.1 This standard deals with the technical requirements to minimise the risks due to the hazards listed in clause 4, which can arise during operation and maintenance of mechanical handling equipment defined in clauses 3.1 to 3.3 and which are designed for continuously conveying bulk materials from the loading point(s) to the unloading point(s).In gen-eral, it also applies to equipment which are built into machines or attached to machines. This standard deals with the technical requirements for EMC. 1.2 The standard does not apply to: - continuous handling equipment and systems for open-cast lignite mining; - continuous handling equipment and systems for underground mining; - tunnel digging and excavating machines; - bulk material processing or classification machines such as grinders, crushers, screens; - fixed belt conveyors for bulk materials. These are covered by the standard EN 620:2002+A1:2010; - fixed pneumatic handling equipment. These equipment and systems are covered by the standard EN 741; - the interface between the ma-chinery dealt with in this standard and the fixed belt or pneumatic conveyor. 1.3 This standard does not give the ad-ditional requirements for: a) use in public areas or for the transportation of people; b) floating, dredging and ship mounted equipment; c) conveyors requiring a high level of cleanliness for hygiene reasons, e.g. in direct contact with foodstuffs or pharmaceuticals; d) transportation of the equipment; e) hazards caused by vibra-tion; f) use in ambient air temperature below - 20 °C and above + 40 °C; g) the effects of wind on strength and stability; h) hazards resulting from handling specific



Standards | Europe

hazardous materials, (e.g. Explosives, radiating material); i) hazards resulting from contact with or inhalation of harm-ful fluids, gas, mists, fumes and dusts; j) biological and micro-biological (viral or bacterial) hazards; k) hazards due to heat radiation from the materials handled.

European Telecommunications Standards Institute

EN 302 885-2 IEC TEChNICal Body: ERM TG26

STaTuS: Published


TITlE: Electromagnetic compatibility and Radio spectrum Matters (ERM); Portable Very High Frequency (VHF) radiotele-phone equipment for the maritime mobile service operating in the VHF bands with integrated handheld class D DSC; Part 2: Harmonized EN covering the essential requirements of article 3.2 of the R&TTE Directive. Portable VHF radiotelephone equipment

SCopE: Part 2: Harmonised standard for handheld VHF with class D DSC (EN302 885-2)


STaTuS: Published


TITlE: Electromagnetic compatibility and Radio spectrum Matters (ERM); Portable Very High Frequency (VHF) radiotele-phone equipment for the maritime mobile service operating in the VHF bands with integrated handheld class D DSC; Part 3: Harmonized EN covering the essential re-quirements of article 3.3(e) of the R&TTE Directive . Portable VHF radiotelephone equipment

SCopE: Part 3 harmonised standard for handheld VHF with class D DSC (EN302 885-3)

EN 302 858-2IEC TEChNICal Body: ERM TGSRR

STaTuS: Published


TITlE: Electromagnetic compatibility and Radio spectrum Matters (ERM); Road Transport and Traffic Telematics (RTTT); Short range radar equipment operating in the 24,05 GHz to 24,25 GHz frequency range for automotive application; Part 2: Harmonized EN covering the essential requirements of article 3.2 of the R&TTE Directive. EN for NB SRR @ 24GHz

SCopE: Creation of EN for automotive narrowband short range radar (SRR) op-erating in the band 24.050 to 24.250 GHz, to meet requirements for Vehicle Radars (VR) in the band 24.075 - 24.150 GHz of the revised annex 5 of ERC Rec 70-03.

EN 302 288-2IEC TEChNICal Body: ERM TGSRR

STaTuS: Published


TITlE: Electromagnetic compatibility and Radio spectrum Matters (ERM); Short Range Devices; Road Transport and Traf-fic Telematics (RTTT); Short range radar equipment operating in the 24 GHz range; Part 2: Harmonized EN covering the es-sential requirements of article 3.2 of the R&TTE Directive. SRD for UWB SRR in 24 GHz band

SCopE: RSCOM 11-07 decided to amend the existing EC decision 2005/50/EC for the frequency range from 22 GHz to 26,65 GHz with the sunset date 30.6. 2013 to 24,25 GHz to 26,65 GHz with the new sun-set date January 1st 2022. This requires an adaption of the current EN 302 288-2.


STaTuS: Published


TITlE: Electromagnetic compatibility and Radio spectrum Matters (ERM); Short Range Devices (SRD); Radio equipment to be used in the 40 GHz to 246 GHz frequency range; Part 2: Harmonized EN

• European Environment AgencyKongens Nytorv 6, DK - 1050 Copenha-gen K, Denmark; +45 3336 7100; Fax: +45 33 36 71 99; http://www.efta.int

• RapexEU consumer alerts about unsafe prod-ucts European Commission, Health & Consumers Directorate-General,

B – 1049 Brussels, Belgium; ht tp://ec.europa.eu/consumers/dyna/rapex/rapex_archives_en.cfm

INSTITUTES & TRADE aSSoCIaTIoNS

• Electromagnetic Compatibility Industry AssociationNutwood UK Limited, Eddystone Court, De Lank Lane, St. Breward, Bodmin, Cornwall. PL30 4NQ; +44 (0) 1208 851 530; Fax: +44 (0) 1208 850 871www.emcia.org

• Electromagnetics Society (aCES)President Osama Mohammed, ECE De-partment, Florida International Univer-sity, 10555 W. Flagler Street, EAS-3983, Miami, FL 33174 USA; +1-305-348-3040; [email protected];http://aces.ee.olemiss.edu/

• Energy Institute (EI)61 New Cavendish Street, London W1G 7AR, United Kingdom; +44 (0) 20 7467 7100; Fax: +44 (0) 20 7255 1472; [email protected]

• European Federation for Non-Destructive TestingEuropean Building Services scrl, 80, av-enue de l’Opale, B-1030 Brussels; Belgium +32274 32980; Fax: 32274 32990; www.efndt.org

• European Federation of Na-tional Associations of Measure-ment, Testing and Analy tical Laboratories (EUROLAB)Rue du Commerce 20-22, B-1000 Brus-sels, Belgium, +32 2 511 5065, Fax: +32 2 502 5047; [email protected] www.eurolab.org.



Standards | Europe

covering the essential requirements of article 3.2 of the R&TTE Directive. SRDs in the 40-246 GHz.

Scope: Emerging components availabil-ity provide generic SRDs above 40GHz, the upper limit frequency of the existing EN 300 440. A new HS for 40 to 246 GHz frequency range is proposed to satisfy long standing existing frequencies as designated by ERC Rec. 70-03 Annex 1 and will support a recommendation from the (2006) CEPT Report 14 in response to the EU Commission mandate to develop a strategy to improve the effectiveness and flexibility of spectrum availability SRDsef-fectiveness and flexibility of spectrum availability SRDs.

International Electrotechnical Commission (IEC)

cISpR/TR 30-1 ed.1.0Iec TechnIcal Body: CIS/F

STaTuS: Published

daTe of puBlIcaTIon: 2012-08-24

TITle: Test method on electromagnetic emissions - Part 1: Electronic control gear for single- and double-capped fluorescent lamps

Scope: CISPR/TR 30-1:2012(E), which is a technical report, details, with the aid of reference luminaires, an independent method by which the radio disturbance characteristics of electronic control gear for fluorescent lamp luminaires with protection classes I and/or II may be com-pared against the requirements of CISPR 15. This technical report covers electronic control gear for double-capped fluores-cent lamps fitted with G5 or G13 lamp caps and to single-capped fluorescent lamps fitted with lamp caps: 2GX7, 2G8, 2G10, 2G11, 2GX13, G23, GX23, G24q, GX24q, GR8, and GR10q. It is specifically applicable for equipment to be connected to 230 V - 50 Hz mains power networks. For other power systems, modifications may be necessary. This first edition of CISPR/TR 30-1 cancels and replaces the first edition of CISPR/TR 30 published in 2001. It is a technical revision which includes the following significant techni-

cal changes with respect to the previous edition:

- minor correction of wiring distances of reference luminaire in Figure A.1;

- addition of reference luminaires for elec-tronic control gear with output terminals on both ends;

- addition of reference luminaires for electronic control gear for circular-shaped fluorescent lamps; and

- introduction of control gear marking in-dicating suitability for application in pro-tection class I and/or class II luminaires.

cISpR/TR 30-2 ed1.0Iec TechnIcal Body: CIS/F

STaTuS: Published


TITle: Test method on electromagnetic emissions - Part 2: Electronic control gear for discharge lamps excluding fluorescent lamps

Scope: CISPR/TR 30-2:2012(E), which is a technical report, details with the aid of reference luminaires, an independent method by which the radio disturbance characteristics of built-in electronic control gear for discharge (excluding fluorescent) lamp luminaires with protec-tion classes I and/or II may be compared against the requirements of CISPR 15. The scope of the part is limited to electronic lamp control gear with an output power (lamp power) up to and including 150 W. Independent electronic lamp control gears are not covered by this technical report; they are within the scope of CISPR 15. This first edition of CISPR/TR 30-2 is published in conjunction with CISPR/TR 30-1. Each part of CISPR 30 series is independent and describes the test set-up for electronic control gear use together with a special lamp family.

cISpR 32:2012Iec TechnIcal Body: CIS/I - Elec-tromagnetic compatibility of information technology equipment, multimedia equip-ment and receivers

STaTuS: Published


TITle: Electromagnetic compatibility of multimedia equipment - Emission require-ments

Scope: CISPR 32:2012 International Stan-dard applies to multimedia equipment (MME) having a rated r.m.s. AC or DC supply voltage not exceeding 600 V. Equipment within the scope of CISPR 13 or CISPR 22 is within the scope of this publication. MME intended primarily for professional use is within the scope of this publication. The radiated emis-sion requirements in this standard are not intended to be applicable to the intentional transmissions from a radio transmitter as defined by the ITU, nor to any spurious emissions related to these intentional trans-missions. Equipment, for which emission requirements in the frequency range covered by this publication are explicitly formulated in other CISPR publications (except CISPR 13 and CISPR 22), are excluded from the scope of this publication. This document does not contain requirements for in-situ assessment. Such testing is outside the scope of this publication and may not be used to demon-strate compliance with it. This publication covers two classes of MME (Class A and Class B). The objectives of this publication are to establish requirements which provide an adequate level of protection of the radio spectrum, allowing radio services to operate as intended in the frequency range 9 kHz to 400 GHz and to specify procedures to ensure the reproducibility of measurement and the repeatability of results. The contents of cor-rigendum of March 2012 and August 2012 have been included in this copy.

cISpR 32 ed1.0Iec TechnIcal Body: CIS/I

STaTuS: Published


TITle: Corrigendum 2 - Electromagnetic compatibility of multimedia equipment - Emission requirements

Iec 60512-1-100 ed3.0Iec TechnIcal Body: 48B - Connec-tors

STaTuS: Published


TITle: Connectors for electronic equip-ment - Tests and measurements - Part 1-100: General - Applicable publications



Standards | Europe

Scope: IEC 60512-1-100:2012 provides a listing of the 60512 series of standards for specific tests that are created for con-nectors. Further it gives cross-references with the former (60)512 standards, where different test numbers were used. The connector tests as such are mainly identical with the previously published standards; minor changes may be intro-duced due to technical developments (e.g. other soldering temperatures in soldering tests, resulting from the introduction of lead-free soldering). The former issues were in booklets, with several related tests in one document, while the present issues are leaflets, each featuring one single test. This third edition cancels and replaces the second edition published in 2006. This edition constitutes a technical revision. This new edition reflects the status of publications in the IEC 60512 series as of 1 September, 2011.

Iec/TR 60725 ed3.0Iec TechnIcal Body: 77A - EMC - Low frequency phenomena

STaTuS: Published


Title: Consideration of reference im-pedances and public supply network impedances for use in determining the disturbance characteristics of electrical equipment having a rated current ≤75 A per phase

Scope: IEC/TR 60725:2012, which is a technical report, records the information that was available and the factors that were taken into account in arriving at the reference impedances that were incorporated in IEC 60555 and which are now incorporated in some parts of IEC 61000-3. In addition, information is given on the impedances of public sup-ply networks associated with service current capacities ≤100 A per phase. The third edition includes brings two mainly significant technical changes with respect to the previous edition:

- A new survey and other data from coun-tries with public supply networks operat-ing at 60 Hz have been included; and

- Recommendations that were applicable to 50 Hz systems are now mirrored by new recommendations that are relevant to 60 Hz systems.

Iec/TR 61000-1-6 ed1.0Iec TechnIcal Body: 77 - Electromag-netic compatibility

STaTuS: Published


TITle: Electromagnetic compatibility (EMC) - Part 1-6: General - Guide to the assessment of measurement uncertainty

Scope: IEC/TR 61000-1-6:2012(E), which is a technical report, provides methods and background information for the as-sessment of measurement uncertainty. It gives guidance to cover general mea-surement uncer tainty considerations within the IEC 61000 series. The objec-tives of this Technical Report are to give advice to technical committees, product committees and conformity assessment bodies on the development of measure-ment uncertainty budgets; to allow the comparison of these budgets between laboratories that have similar influence quantities; and to align the treatment of measurement uncertainty across the EMC committees of the IEC. It gives a description for:

- a method for the assessment of mea-surement uncertainty;

- mathematical formulas for probability density functions;

- analytical assessment of statistical evaluations;

- correction of measured data; and

- documentation. This Technical Report is not intended to summarize all measure-ment uncertainty influence quantities nor is it intended to define how measurement uncertainty is to be taken into account in determining compliance with an EMC requirement.

• IEC System for Conformit y Testing and Certification of Elec trical Equipment (IECEE)Executive Secretar y IECEE, c/o IEC Central Office, 3, Rue de Varembé, PO Box 131, 1211 Geneva 20, Switzerland; +41 22 919 02 23; Fax: +41 22 919 03 00,

www.iecee.org

• IEEE EMC SocietyIEEE Corporate Office, 3 Park Avenue, 17th Floor, New York, N.Y. 10016-5997 USA; +1 212 419 7900; Fax: +1 212 752 4929;

www.ewh.ieee.org/soc/emcs

• IEEE Product SafetyEngineering Societyhttp://ewh.ieee.org/soc/pses

• iNARTE, In terna tional Associ-ation for Radio, Telecommunica tions and Electromagnetics8 4 0 Queen St reet , New Bern, NC 2 8 5 6 0 U S A ; +1 - 2 5 2 - 6 7 2 - 0 2 0 0 ; +1-800-89-NARTE; Fax: +1-252-672-0111; www.narte.org

• Institution of Engineering and TechnologyMichael Faraday House, Six Hills Way, Stevenage, Her ts SG1 2 AY United Kingdom; +44 (0)1438 313 311; Fax: +44 (0)1438 765 526; [email protected];

www.theiet.org

• International Accreditation Forum, Inc. (IAF)IAF Secretariat, 28 Chemin Old Chelsea, Box 1811, Chelsea, Quebec, Canada, J9B 1A0; +1 (613) 454 8159

www.iaf.nu

• International Laboratory Ac-creditation CooperationThe ILAC Secretariat, PO Box 7507, Silverwater, NSW 2128, Australia; +61 2 9736 8374; Fax: +61 2 9736 8373; [email protected]

www.ilac.org/home.html



This section includes information on important events in the electromagnetic compatibility community. Visit Interference Technology online at www.interferencetechnology.eu for the latest listings. If you would like to add an event, e-mail details to Belinda Stasiukiewicz at [email protected]

INTERNATIONAL WORKSHOP ON ANTENNA TECHNOLOGYWHEN: 4-6 March 2013

WHERE: Karlsruhe, Germany

WHAT: The International Workshop on Antenna Technology (iWAT) is an annual forum for the exchange of information on the progress of research and development in the area of innovative antenna technology. Top-ics include small antennas and applications of advanced and artificial materials to the antenna design.

INFORMATION: www.iwat2013.de

EMV 2013 WHEN: 5-7 March 2013

WHERE: Stuttgart, Germany

WHAT: Europe’s leading application-oriented conference on electromagnetic compat-ibility highlights the requirements of EMC and provides a comprehensive information program that includes reports on the newest products and developments. Specialists from all over the world are available for technical discussion.

INFORMATION: www.mesago.de/en/EMV/The_Conference

INTERNATIONAL VDI CONFERENCE“PLASTICS IN AUTOMOTIVE ENGINEERING”

WHEN: 13-14 March 2013

WHERE: Mannheim, Germany

WHAT: The 37th international congress Plastics in Automotive Engineering will provide a comprehensive overview of the current developments in plastics from German manufacturers of passenger and commercial vehicles. The congress will feature a techni-cal conference and a trade exhibition by raw material producers, manufacturers of plastic processing machines, plastics processors and system suppliers.

INFORMATION: www.vdi-wissensfo-rum.de/en/nc/angebot /det ailsei te/event/01TA701013/

SMART SYSTEMS INTE-GRATION 2013WHEN: 13-14 March 2013

WHERE: Amsterdam, The Netherlands

WHAT: Smart Systems Integration allows you to form a system out of components which is able to gain information from the environment, to process it electronically, to communicate signals and data and to give enabled feedback signal to the ambience. The whole system is subject to the trend of today’s world: miniaturization, networking capabil-ity, energy-autonomy and reliability. Due to increasing complexity and multidisciplinarity developing teams in fields of microsystems- and nanotechnology, optics, fluidics, biology, medical science, electronics and wireless communication technologies face highest demands.

INFORMATION: www.mesago.de/en/SSI/home.htm

DESIGN, AUTOMATION AND TEST IN EUROPE CONFER-ENCE 2013 (DATE)WHEN: 18-22 March 2013

WHERE: Grenoble, France

WHAT: DATE is an international event and networking opportunity for the design and engineering of Systems-on-Chip, Systems-on-Board and Embedded Systems Software. Sup-pliers of development tools and platforms for hardware and software development exhibit a range of information and products including front-end to back-end chip design, silicon test and manufacture, system architecture and embedded software implementation.

INFORMATION: www.date-conference.com

EuCAP 2013WHEN: 8-12 April 2013

WHERE: Gothenburg, Sweden

WHAT: The 7th annual Conference on Anten-nas and Propagation provides a forum for the exchange of scientific and technical informa-tion on the latest results and developments in antenna theory and technology, electro-magnetic wage propagation and antenna measurement techniques. Members of both industry and academia are welcome to attend.

INFORMATION: www.eucap2013.org

EXPOELECTRONICA 2013WHEN: 10-12 April 2013

WHERE: Moscow, Russia

WHAT: ExpoElectronica is one of the largest

EMC EVENTS

EMC Events

EMC_Events_EEG13.indd 6 11/16/12 5:54 PM

EDICON

Electronic DesignInnovations Conference电子设计创新会议 2013

March 12-14, 2013Beijing, China

www.EDICONCHINA.com

EDI CON is an opportunity for design engineers and system integrators to learn about the latest RF/microwave and high speed digital products, design tools and technologies for today’s communication, computing,

RFID, industrial wireless monitoring, navigation, aerospace and related markets. A focus on enhancing physical design, emerging technologies and practical

engineering solutions, brings together designers at the forefront of Chinese innovation and the world’s

leading technology companies.

Learning to Innovate at GHz and Gbps Rates …

Sponsors

Platinum

China

Media Partners

Organized by

In Partnership with

ADs_EEG13.indd 5 11/16/12 2:35 PM

EMC Events


exhibitions for electronic components and technologies in Russia and Eastern Europe and consists of three smaller trade fairs. The largest, ExpoElectronica, is an international trade fair for components, PCBs and electronic production. ElectronTechExpo is the only trade fair in Russia for electronics manufacturing technology, while LEDTechExpo covers LED solutions, chips and production facilities.

INFORMATION: http://expoelectronica.primexpo.ru/en/

eCarTec MUNICH 2013 & eCarTec PARIS 2013WHEN/WHERE: 23-25 April 2013 in Munich Germany; 16-18 April 2013 in Paris, France

WHAT: The leading trade fair for electric mobility hosts an information conference and an accompanying exhibition of new and de-veloping products. Conference topics include electric vehicles, drive and motor technique, engineering and subcontracting, energy and infrastructure, maintenance and parts, energy storage technology and finance.

INFORMATION: www.ecartec.de/index.php?id=3&L=4; www.ecartec-paris.eu

POWER CONVERSION IN-TELLIGENT MOTION (PCIM)WHEN: 14-16 May 2013

WHERE: Nuremberg, Germany

WHAT: From latest developments of power semiconductors, passive components, prod-ucts for thermal management, new materials, sensors as well as servo-technology and the wide area of power quality and energy-management - PCIM offers a comprehensive, focused and compact presentation of products all under one roof. Benefit from the success of such a well established international exhibi-tion with conference and tutorials.

INFORMATION: www.mesago.de/en/PCIM/For_visitors/Welcome/index.htm

SVIAZ-EXPOCOMM 2013WHEN: 14-17 May 2013


WHAT: Sviaz-Expocomm is Russia’s key in-formation technology and telecommunication event used by many overseas IT manufactur-ers to promote their products and develop their business in Russia. The conference showcas-

es the latest innovative products, technologies and services and serves as a place for industry professionals to network, promote technology and exchange information.

INFORMATION: www.sviaz-expocomm.ru/en

INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC THEORY (EMTS) 2013WHEN: 20-24 May 2013

WHERE: Hiroshima, Japan

WHAT: The 21st event in a triennial series of international symposia dating back to 1953, EMTS 2013 covers all areas of electromag-netic theory and its applications.

INFORMATION: http://ursi-emts2013.org/index.html

ASIA-PACIFIC INTERNATIONAL SYMPOSIUM AND EXHIBITION ON ELECTROMAGNETIC COMPATIBILITYWHEN: 20-23 May 2013

WHERE: Melbourne, Australia

WHAT: The Symposium showcases devices, components and subsystems, design and simulation software and test and measure-ment equipment used in the fields of micro-waves and electromagnetic compatibility and provides an international gathering for all members involved in technologies associ-ated with RF, microwaves, antennas, EMC instrumentation and analysis software.

INFORMATION: www.apemc2013.org

2013 IEEE EMC SYMPOSIUMWHEN: 5-9 August 2013

WHERE: Denver, Colorado, USA

WHAT: The 2013 International EMC Sym-posium is a comprehensive event featuring technical information, collateral industry meetings, professional awards, professional development, networking social events and companion events.

INFORMATION: http://emc2013.org

PES 2013 INTERNATIONAL CONFERENCE ON APPLIED ELECTROMAGNETICSWHEN: 1-4 September 2013

WHERE: Niš, Serbia

WHAT: Conference topics include com-putation of electromagnetic fields, inverse electromagnetic field problems, optimization techniques, electromagnetic field measure-ment techniques, electromagnetic CAD, EMC problems, non-linear electromagnetic systems, bio-effects of electromagnetic fields and EM circuits and systems.

INFORMATION: http://pes2013.elfak.ni.ac.rs

EMC EUROPE - INTERNATIONAL SYMPOSIA AND WORKSHOPS ON ELECTROMAGNETIC COMPATIBILITYWHEN: 2-6 September 2013

WHERE: Brugge, Belgium

WHAT: EMC Europe is the leading EMC Sym-posium in Europe with a long history, created from a series of independent EMC confer-ences based in Worclaw, Zurich and Rome that ran every other year. This year, EMC Europe extends an invitation to all those working in the field of electromagnetic compatibility to participate in an international forum for the exchange of technical information on EMC to be held in Brugge, Belgium.

INFORMATION: www.emceurope2013.eu

METAMATERIALS 2013WHEN: 15-21 September 2013

WHERE: Bordeaux, France

WHAT: The 7th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics provides a forum for members of the engineering, physics and material science communities working in the field of artificial electro-magnetic materials and their applications at various frequencies to network and discuss the latest results of research and development.

INFORMATION: http://congress2013.metamorphose-vi.org


EMC Events


exhibitions for electronic components and technologies in Russia and Eastern Europe and consists of three smaller trade fairs. The largest, ExpoElectronica, is an international trade fair for components, PCBs and electronic production. ElectronTechExpo is the only trade fair in Russia for electronics manufacturing technology, while LEDTechExpo covers LED solutions, chips and production facilities.

INFORMATION: http://expoelectronica.primexpo.ru/en/

eCarTec MUNICH 2013 & eCarTec PARIS 2013WHEN/WHERE: 23-25 April 2013 in Munich Germany; 16-18 April 2013 in Paris, France

WHAT: The leading trade fair for electric mobility hosts an information conference and an accompanying exhibition of new and de-veloping products. Conference topics include electric vehicles, drive and motor technique, engineering and subcontracting, energy and infrastructure, maintenance and parts, energy storage technology and finance.

INFORMATION: www.ecartec.de/index.php?id=3&L=4; www.ecartec-paris.eu

POWER CONVERSION IN-TELLIGENT MOTION (PCIM)WHEN: 14-16 May 2013

WHERE: Nuremberg, Germany

WHAT: From latest developments of power semiconductors, passive components, prod-ucts for thermal management, new materials, sensors as well as servo-technology and the wide area of power quality and energy-management - PCIM offers a comprehensive, focused and compact presentation of products all under one roof. Benefit from the success of such a well established international exhibi-tion with conference and tutorials.

INFORMATION: www.mesago.de/en/PCIM/For_visitors/Welcome/index.htm

SVIAZ-EXPOCOMM 2013WHEN: 14-17 May 2013


WHAT: Sviaz-Expocomm is Russia’s key in-formation technology and telecommunication event used by many overseas IT manufactur-ers to promote their products and develop their business in Russia. The conference showcas-

es the latest innovative products, technologies and services and serves as a place for industry professionals to network, promote technology and exchange information.

INFORMATION: www.sviaz-expocomm.ru/en

INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC THEORY (EMTS) 2013WHEN: 20-24 May 2013

WHERE: Hiroshima, Japan

WHAT: The 21st event in a triennial series of international symposia dating back to 1953, EMTS 2013 covers all areas of electromag-netic theory and its applications.

INFORMATION: http://ursi-emts2013.org/index.html

ASIA-PACIFIC INTERNATIONAL SYMPOSIUM AND EXHIBITION ON ELECTROMAGNETIC COMPATIBILITYWHEN: 20-23 May 2013

WHERE: Melbourne, Australia

WHAT: The Symposium showcases devices, components and subsystems, design and simulation software and test and measure-ment equipment used in the fields of micro-waves and electromagnetic compatibility and provides an international gathering for all members involved in technologies associ-ated with RF, microwaves, antennas, EMC instrumentation and analysis software.

INFORMATION: www.apemc2013.org

2013 IEEE EMC SYMPOSIUMWHEN: 5-9 August 2013

WHERE: Denver, Colorado, USA

WHAT: The 2013 International EMC Sym-posium is a comprehensive event featuring technical information, collateral industry meetings, professional awards, professional development, networking social events and companion events.

INFORMATION: http://emc2013.org

PES 2013 INTERNATIONAL CONFERENCE ON APPLIED ELECTROMAGNETICSWHEN: 1-4 September 2013

WHERE: Niš, Serbia

WHAT: Conference topics include com-putation of electromagnetic fields, inverse electromagnetic field problems, optimization techniques, electromagnetic field measure-ment techniques, electromagnetic CAD, EMC problems, non-linear electromagnetic systems, bio-effects of electromagnetic fields and EM circuits and systems.

INFORMATION: http://pes2013.elfak.ni.ac.rs

EMC EUROPE - INTERNATIONAL SYMPOSIA AND WORKSHOPS ON ELECTROMAGNETIC COMPATIBILITYWHEN: 2-6 September 2013

WHERE: Brugge, Belgium

WHAT: EMC Europe is the leading EMC Sym-posium in Europe with a long history, created from a series of independent EMC confer-ences based in Worclaw, Zurich and Rome that ran every other year. This year, EMC Europe extends an invitation to all those working in the field of electromagnetic compatibility to participate in an international forum for the exchange of technical information on EMC to be held in Brugge, Belgium.

INFORMATION: www.emceurope2013.eu

METAMATERIALS 2013WHEN: 15-21 September 2013

WHERE: Bordeaux, France

WHAT: The 7th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics provides a forum for members of the engineering, physics and material science communities working in the field of artificial electro-magnetic materials and their applications at various frequencies to network and discuss the latest results of research and development.

INFORMATION: http://congress2013.metamorphose-vi.org

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EMC Events


InternatIonal electronIcs Forum 2013 WHen: 2-4 October 2013

WHere: TBD

WHat: No location confirmed

WHAT: Future Horizons presents its 24th an-nual International Electronics Industry Forum to provide the industry with developments in the electronics industry. Topics include advanced research, equipment and materials, semiconductor and OEM system design and production, and IP and EDA. Speakers and world-leading experts from across the globe will be available to participate in seminars and debates.

InFormatIon: www.futurehorizons.com/page/127/International-Electronics-Forum

euroPean mIcroWaVe WeeKWHen: 6-11 October 2013

WHere: Nuremburg, Germany

WHat: The European Microwave Week is a 5-day event that provides seminars, workshops and discussion groups where attendees can discuss relevant microwave, RF, wireless, defense/security and radar is-sues with leading manufacturers, institutes and industry bodies. EMW consists of three conferences: The European Micro-wave Conference (EuMC), the European Microwave Integrated Circuits Conference (EuMIC) and the European Radar Confer-ence (EuRAD).

InFormatIon: www.eumweek.com

InnoVatIVe smart GrID tecHnoloGIes euroPe 2013WHen: 6-9 October 2013 (preliminary)

WHere: Copenhagen, Denmark (preliminary)

WHat: The 4th European conference and exhibition on innovative smart grid tech-nologies is an international forum for the participants to address and discuss the current development and state-of-the-art innovation in smart grids. The conference features sessions, panels and tutorials by international experts on smart grids.

InFormatIon: /www.ieee-isgt-2012.eu

emc uK eXHIBItIon anD conFerence WHen: 8-9 October 2013

WHere: Newbury, United Kingdom

WHat: EMC UK is a targeted networking event ideal for any members of a business that designs and manufactures electrical or electronic systems. The event will give designers and test engineers a chance to meet and discuss EMC issues, problems or test requirements. Discussion sessions hosted by panels of experts will cover EMC in defense systems, EMV in buildings and infrastructure, EMC in transport sys-tems and EMV in consumer electronics, including diagnostics and smart grid/me-tering. Full CISPR 16-1-1 compliance test systems for the evaluation of completed products will also be available.

InFormatIon: www.emcuk.co.uk

InternatIonal eXHIBItIon oF testInG eQuIPment, sYstems anD tecHnoloGIes For tHe aerosPace InDustrYWHen: 22-24 October 2013

WHere: Moscow, Russia

WHat: In 2013, the International Ex-hibition of Testing Equipment, Systems and Technologies of Aerospace Industry Aerospace Testing Russia will celebrate its 10th anniversary. Aerospace Testing Russia presents the latest developments and unique methods of aerospace tech-nique, component and subsystem testing to specialists of aerospace sector of Rus-sia and CIS countries.

InFormatIon: www.aerospace-expo.ru/eng

ID WorlD InternatIonal conGressWHen: 5-7 November 2013

WHere: Frankfurt, Germany

WHat: The ID World International Con-gress showcases new developments in the evolving world of RFID, biometrics and smart card technologies and explores the fundamental issues associated with automatic identification in a variety of

market segments. The Congress is broken down into a conference, a networking event and an exhibition.

InFormatIon: www.mesago.de/en/IDW/home.htm

Ieee GloBecom 2013WHen: 9-13 December 2013

WHere: Atlanta, GA, US

W H at: T he Global Communicat ion Conference is an annual conference, exhibition and industry forum on theories and technologies on the management of emerging networks and services. Globe-com 2013 features tutorials and work-shops on technical and business issues in communications technologies as well as an exhibition showcasing the latest technologies, applications and services.

InFormatIon: www.ieee-globecom.org/2013/#.UFytZlFOhdA

emc comPo 2013WHen: 15-18 December 2013

WHere: Nara, Japan

WHat: The 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits provides information on the latest research achievements and experience in IC-level EMC and welcomes researchers both from industry and from academia backgrounds.

InFormatIon: www.emccompo2013.org

emV semInare 2013WHen: TBD

WHere: Munich and Stuttgart, Germany

WHat: EMV Seminare is a series of full-day seminars hosted by Mesago designed to provide par ticipants with current, application-specific, vendor-neutral infor-mation and training on the subject of EMC.

InFormatIon: http://www.mesago.de/de/EMV-Seminare/home.htm


2013 Asia-Pacific International Symposium and Exhibition on Electromagnetic Compatibility

20-23 May 2013, Melbourne, Australia

Prospective authors are invited to submit original papers on their latest research results. Suggested topics are (papers on other, EMC related topics are welcome):

Important Dates Proposals for topical meetings, industry fora workshops and tutorials 29 October 2012

Preliminary paper submissions 30 November 2012 Notification of acceptance 31 January 2013 Final paper submission 15 March 2013 All submissions must be electronic. Font embedding must be IEEE Xplore compatible. No hardcopies shall be accepted. Details are given on the symposium website: apemc2013.org

2013 ASIA-PACIFIC EMC Symposium

apemc2013.org

Call for Papers

2013 ASIA2013 ASIA

Computational EM Signal Integrity Power Integrity IC and Semiconductor EMC Meas. Methods & Stds Lightning EM HPEM

ESD Power System EMC EM Protection System Level EMC EM Leakage Wireless Comm. EMC Wireless Power EMC

Transportation EMC Aerospace EMC Advancements in EMC Radioastronomy EMC Biomedical EMC EMF in EMC

The 2013 Asia-Pacific International Symposium and Exhibition on EMC will be hosted in Melbourne, Australia.

The symposium will cover the entire scope of electromagnetic compatibility and include emerging technologies. It will comprise regular sessions and special session, poster presentations, workshops and tutorials, an industry forum, and a trade exhibition.

Mark the dates in your diary and visit the symposium website for more information.

EMC Society of Australia

EMC Society of Australia

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The trade show dedicated to radiofrequencies,microwaves, wireless and fibre optics

www.microwave-rf.com

EXHIBITION - CONFERENCES - ANIMATIONS

10 & 11, April 2013 Paris Expo Porte de Versailles

France

2ndedition

Organization

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EMC Europe 2013, Brugge

September 2‐6, 2013 Brugge, Belgium

BRUGGE 2013

BRUGGE 2013

FirstCallforPapersEMCweekinBruggeEMCEuropeistheleadingEMCSymposiuminEuropeandthe2013editionwill be held at the University College KHBO in Brugge, Belgium, fromSeptember2ndtillSeptember6th,2013.Wewishtoinviteandencourageallthoseworkinginthefieldofelectromagneticcompatibilitytoparticipateinthisprestigiousevent.EMC research and conferences in Europe have a long tradition. From theseries of independentEMCSymposia based inWroclaw, Zurich andRomerunning every second year, has emerged EMC Europe which is organisedevery year in a European city to provide an international forum for theexchangeoftechnicalinformationonEMC.EMC Europe 2013, Brugge, will consist of 5‐day oral and posterpresentations, workshops, tutorials, special sessions, short‐courses,industrial forum,andexhibits.Acceptedpaperswillappearin IEEEXplore.Prospective authors are invited to submit original papers on their latestresearchresults.Selectedpapersafterrevisionwillbepresentedinoralandpostersessions.Thepreliminaryprogram,registrationform,informationonaccommodationandsocialactivitieswillbeavailableonthewebsite(www.emceurope2013.eu)induetime.SymposiumVenueKnown as the Venice of the North, Brugge is one of themost beautifulcitiesinEurope!ItwasajustifiedmotivethatpromptedUNESCOin2000to include the entire historical city centre on the World Heritage list.Walking along themazeofwinding cobbledalleys and romantic canals,youimagineyourselftobeinmedievaltimes.Thewealthofmuseumsisastrikingimageofthiscity'sstirringhistory.Brugge is also home to contemporary culture, such as the newConcertHall,which isoneof themostprominentmusichouses inFlanders.TherestaurantsinBruggewhichoffergastronomiccuisineandtheexclusivehotelsareatruefeastforthosewhoenjoythegoodthingsinlife.

Importantdates

Papersubmission February15,2013ProposalforWorkshopsandTutorials March15,2013NotificationofAcceptance April30,2013FinalPaperSubmission May30,2013

SubmissionofpapersAuthors are invited to submit original papers in the areas listedbelow,focussing on EMC aspects. Prospective authors should submit their fullpaper (4/6 pages, 2‐column) by February 15, 2013. The paper shouldclearly explain the originality and the relevance to EMC, and should beuploaded in electronic format to the website of the symposium. Theguidelinestouploadwillappearonthewebsitewww.emceurope2013.eu.Allsubmittedpaperswillbeevaluatedbyapeerreviewprocess.Authorswhosepapersareacceptedforpresentationwillberequestedtoprovidethefinalpaper(4/6pages,2‐columninIEEEformat)byMay30,2013.Poster sessions and special sessions will stimulate more in depthdiscussionsonsometopics.

TechnicalAreas1. Electromagnetic Environment, Lightning, ESD, Transients, High Power

Electromagnetics,IntentionalEMI&EMP2. EMCundernon‐linearandmultiplephenomenaconditions3. TransmissionLines,Cables,Crosstalk,CouplingPaths4. Shielding,Gaskets,Filters,Grounding5. Measurement & Instrumentation, Chambers & Cells, Antennas, Near Field

techniques6. ComputationalElectromagnetics,CodeValidation7. Modellingofsystems,circuitsandcomponents,ModelValidation8. Apparatus,PCB,ElectronicPackaging&Integration,Semiconductors9. EMC behaviour over the life cycle and due to aging and environmental

conditions10. SignalIntegrity&PowerIntegrityofcircuitry11. PowerSystems,PowerQuality,PowerElectronics,SmartGrids12. Wired&WirelessRFCommunications,UWB,BPL,datanetworksandfield

busses13. Automotive,RailwaySystems,NavalSystems,Aircraft&SpaceSystems14. FunctionalSafetyofmachinesandsystems15. AdvancedMaterials&NanotechnologyrelatedtoEMCapplications16. StandardsandRegulations17. EMCManagement,EMC(risk)assessment18. EMCEducation19. HumanExposuretoEMfields,Biologicaleffects20. AnyotherrelevanttopicorissueCommittees

InternationalSteeringCommittee&AdvisoryBoardJ.L.terHaseborg,Chairman(Germany)H.Garbe,ViceChairman(Germany)InternationalSteeringCommitteeP.Besnier(France) F.G.Canavero(Italy)J.Catrysse(Belgium) J.Carlsson(Sweden)G.C.Cerri(Italy) C.Christopoulos(UK)M.D’Amore(Italy) P.Degauque(France)M.Feliziani(Italy) A.Karwowski(Poland)Z.Joskiewicz(Poland) F.B.J.Leferink(NL)M.Klingler(France) A.Marvin(UK)F.Maradei(Italy) D.Pissoort(Belgium)G.Peres(France) M.Ramdani(France)F.Rachidi(Switserland) M.S.Sarto(Italy)F.Sabath(Germany) A.P.J.vanDeursen(NL)F.Silva(Spain) T.W.Wieckowski(Poland)J.Welinder(Sweden) InternationalAdvisoryBoardJ.Drewniak(USA) ErpingLi(Singapore)O.Fujiwara(Japan) D.Hoolihan(USA)T.Hubing(USA) JounghoKim(Korea)N.Korovkin(Russia) D.C.Pande(India)G.Pettit(USA) O.Ramahi(Canada)C.Sartori(Brasil) F.Schlagenhaufer(AUS)Wen‐YanYin(China) P.Wilson(USA)XiangCui(China)

LocalOrganizingCommitteeChair: JohanCatrysse,KHBO–KULeuvenCo‐Chair: DavyPissoort,KHBO–KULeuvenOrganization: JosWesthof‐Jacobs,Rohde&Schwarz

ChristianBrull,SchlegelEMIGeorgesGielen,KULeuvenGuyVandenbosch,KULeuvenRenaudGillon,OnSemiconductorVeroniqueBeauvois,ULGHerbertDeGersem,KULeuven‐KULAKDirkVanTroyen,LaboDeNayerMarcCumps,AgoriaHugoPues,MelexisRamiroSerra,TUEindhovenCeesKeyer,HogeschoolAmsterdam

ContactandInformationForfurtherinformationdonothesitatetocontacttheorganizingcommittee:[email protected].

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UNITED

KINGDOM

interferencetechnology.eu INTERFERENCE TECHNOLOGY 25

Contents | United Kingdom

Michael Faraday was an English scientist who contributed to the elds of electromagnetism and electrochemistry. Faraday researched the magnetic eld around a conductor car r y ing a direct cur rent and established the basis for the concept of the electromagnetic eld in physics. After electric currents were discovered, he built a device of a hinged wire, a magnet and a chemical battery. When the current was turned on, a magnetic eld was set up in the wire, and it began to spin around the magnet – creating an electric motor. He also discovered the principle of electromagnetic induction, diamagnetism and the laws of electrolysis. The SI unit of capacitance, the farad, is named for Faraday. Albert Einstein kept a picture of Faraday on his study wall next to scientists Isaac Newton and James Clerk Maxwell.

MichaelFaraday (1791–1867)

PRODUCTS & SERVICES

RESOURCES

ARTICLES Investigation of Vehicle Radiated Emissions Measurement Practices ALASTAIR R. RUDDLE, PH.D., Project engineer, MIRA Limited

New Voltage Sag Testing Requirements for Industrial Equipment ANDREAS EBERHARD, Vice President, Power Standards Lab

Surge Protective Devices (SPDs) and Short Circuit Currents BRYAN COLE, President, Technology Research Council JIM TIESI, Marketing Manager, Emerson Network Power Surge Protection

26

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United Kingdom | Products & Services

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3C Test Ltd.Silverstone Technology Park, Silverstone Circuit, Northamptonshire NN12 8GX, United Kingdom; +44(0)1327 857500; Fax: +44(0)1327 857747;Pete Sheppard, [email protected]; www.3ctest.co.ukProducts and Services: Testing

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A.H. SystemsSystemWare Europe, Bedfordshire, United Kingdom; +44(0)1462 734777; Fax: +44(0)1462 835777;[email protected];www.AHSystems.comProducts and Services: Antennas, Test Instrumenta-tion, Testing

Aaronia UKBellringer Road, Trentham, Lakes South, Stoke-on-Trent, ST4 8GB Staffordshire, United Kingdom;+44(0)845-4379092; Fax: +44(0)870-8700001;[email protected]; www.aaronia.co.uk Products and Services: Antennas, Shielding, Test Instrumentation

Accurate Controls Ltd. 25 Cowley Road, Nuffield Industrial Estate, Poole, Dorset, United Kingdom, BH17 0UJ;+44(0)1202 678108; Fax: +44(0)1202 670161;Paul Gibbens, [email protected]; www.accurate-controls.ltd.ukProducts and Services: Test Instrumentation

AEF SolutionsUnit 46, Thomas Way, Lakesview Business Park, Hersdon, Canterbury, CT3 4JJ, United Kingdom;+44(0)1227 711455; Fax: +44(0)2380 455022; Paul Lawrence, [email protected];Products and Services: Filters, Cables & Connectors, Surge & Transients, Miscellaneous

Aeroflex Test SolutionsLongacres House, Six Hills Way,Stevenage, SG1 2AN, United Kingdom;+44 1438 742200; Fax: +44 1438 727601;www.aeroflex.comProducts and Services: Test Instrumentation

Agilient Technologies UK Ltd.5 Lochside Avenue, Edinburgh Park,Edinburgh, EH12 9DJ, United Kingdom,+44 (0)131 452 0200; Fax: +44 (0)131 452 0419; www.agilent.comProducts and Services: Test Instrumentation

Albacom Ltd.George Buckman Drive,Dundee, DD2 3SP United Kingdom;+44(0)1382 889311; +44(0)1382 810171;Martin Mackin, [email protected]; Products and Services: Amplifiers

Albatross Projects GmbHDaimlerstraße 17, 89564 Nattheim, Germany;+49 7321 730 500; Fax: +49 7321 730 590; [email protected];www.albatross-projects.comProducts and Services: Shielded Rooms & Enclosures, Anechoic Chambers

Alrad Instruments Ltd.Alder House, Turnpike Road Industrial Estate,Newbury, Berkshire, RG14 1NS, United Kingdom; +44(0)1635 32630,[email protected],www.alrad.co.ukProducts and Services: Test Instrumentation

Anritsu EMEA Ltd. 200 Capability Green,Luton, Beds, LU1 3LU, United Kingdom;+44 (0)1582 433280; Fax: +44 (0)1582 731303;[email protected];www.eu.anritsu.comProducts and Services: Test Instrumentation, Testing

Ansys UK, Ltd.First Floor, 8 Bracknell Beeches, Old Bracknell Lane West, Bracknell, Berks, RG12 7BW, United Kingdom; +44 (0) 1344767550; Fax: 44 (0) 1344767551;[email protected]; www.ansys-uk.comProducts and Services: EMC Design SoftwareApplied Coating

Technologies Ltd.Tipton Road, Tividale,Oldbury B69 3HY. United Kingdom;

+44 (0)121 557 5324; Fax: +44 (0)121 557 7064;[email protected]; www.applicoat.comProducts and Services: Conductive Materials

AQL EMC Limited16 Cobham Road, Ferndown Industrial Estate,Wimborne, Dorset, BH21 7PG United Kingdom; +44(0)1202 861175; Fax: +44(0)1202 861176; www.aqlemc.co.ukProducts and Services: Consultancy, Testing

AR United Kingdom Ltd.Unit 8 TORC MK, Chippenham Drive, Kingston, Milton Keynes , England Bucks MK10 OAE;+44(0)1908 282766; Fax: +44(0)1908 288249;Dr. Tom Cantle, [email protected];www.arukltd.co.ukProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclosures, Surge & Transients, Test Instrumentation

Arrow EuropeArrow Advantage UK, london Road Campus,London Road, Harlow Essex CM179NA;+44 1279 626777; www.arroweurope.comProducts and Services: Ferrites, Cables & Connectors, Power Applications

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BAE Systems Faraday Test Centre, Marconi Way,Rochester, Kent. ME1 2XX, United Kindom;+44(0)1634205155;[email protected];www.baesystems.com/faradaytestcentreProducts and Services: Testing

BFi OPTiLAS Ltd.Mill Court, Wolverton Mill South,Milton Keynes MK 12 5EU, United Kingdom;+44(0)1908 326326; Fax: +44(0)1908 221110;[email protected];www.bfioptilas.co.ukProducts and Services: Shielding, Testing

Blackwood Labs8 Woodfieldside Business Park, Pontllanfraith,Blackwood, NP12 2DG, United Kingdom;+44(0)1495 229219;[email protected];www.blackwood-labs.co.uk;Products and Services: Testing

Brand-Rex Ltd.Viewfield Industrial Estate,Glenrothes, Fife., KY6 2RS United Kingdom;

PRODUCTS & SERVICES



Products & Services | United Kingdom

+44(0)1592 772124; Fax: +44(0)1592 775314;Audrey O’Brien, [email protected];www.brand-rex.com Products and Services: Cables & Connectors

BRE Ltd.Bucknalls Lane,Watford, WD25 9XX United Kingdom;+44(0)1923 664000;[email protected]; www.bre.co.ukProducts and Services: Testing

Brian Jones89 Widney Road, Knowle,Solihull B93 9EA, United Kingdom;+44(0)1564 773319; Fax: +44(0)1564 773319; [email protected] and Services: EMC Consultant and Com-petent Body Signatory specializing in standards and regulations

BulginMelville Court, Spilsby Road,Romford, Essex, Great Britain, RM3 8SB;+44(0)1708 343800;[email protected]; www.bulgin.co.ukProducts and Services: Filters

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Cabletec ICS Ltd.Sunnyside Road, Weston-super-Mare, North Somerset, BS23 3PZ, United Kingdom; +44(0)1934 424900; Fax: +44(0)1934 636632; Karen French, [email protected]; www.cabletec.com Products and Services:Shielding

Caltest Instruments Ltd. 4 Riverside Business Centre, Walnut Tree Close,Guildford, Surrey GU1 4UG, United Kingdom;+44 (0) 1483 302 700; Fax: +44 (0) 1483 300 562;[email protected]; www.caltest.co.ukProducts and Services: Test Instrumentation

Carlisle Interconnect TechnologiesUnited Kingdom;+44-7817-731-000;Andy Bowne, [email protected]; www.CarlisleIT.comProducts and Services: Filters

CASS Industries Ltd.Blackbrook Trading Estate Weybrook Road, Levenshulme, Manchester, M19 2QD United Kingdom; +44(0)1614 424200; Fax: +44(0)1614 424283; www.cassindustries.comProducts and Services: TestingCCQS UK Ltd.Level 7, CEC Westgate, Westgate House,Westgate Road, London, W5 1YY, United Kingdom;+44 (0)20 8991 3488; [email protected]; www.ccqsuk.co.ukProducts and Services: Certification Services

Cherry Clough Consultants9 Bracken View, Brocton,Stafford, Staffs, ST17 0TF, United Kingdom;+44(0)1785 660247;Keith Armstrong; [email protected]; www.cherryclough.comProducts and Services: Training, Seminars & Work-shops, Design and Management Consultancy

Cobham Microwave148 Stocks Lane, Bracklesham Bay, Chichester,West Sussex, PO20 8NT United Kingdom;+44(0)1243 670711; Fax: +44(0)1243 672907;Dean Terrett, Key Account Manager;[email protected];www.cobham.com/microwaveProducts and Services: Antennas, Cables & Connec-tors, Filters, Shielded Rooms & Enclosures

Conformance Services Ltd.24 Tidnock Avenue, Congleton,Cheshire, CW12 2HW United Kingdom;+44(0)1260 270729; Fax: +44(0)1260 270729;[email protected];www.conformance-services.comProducts and Services: Testing

CoreshieldSt. Margaret’s School, Gosfield Hall Park,Gosfield, Halstead, Essex, CO9 1SE, Great Britain; +44(0)1787 472134; Fax: +44(0)1787 473589;[email protected];www.coreshield.euProducts and Services: Shielding Communications & Power

Industries Europe Ltd.Surrey, England,+44 (1932) 256 930; Fax: +44 (1932) 241 271;Tony Johns, [email protected];Donna Crittenden; [email protected];www.cpii.com Products and Services: Amplifiers, Microwave Power

Cranage EMC & SafetyMarket Drayton, Shropshire, United Kingdom; +44(0)1630 658568; Fax: +44(0)1630 658921; [email protected]; www.cranage.co.ukProducts and Services: Testing Labs

Cre8 Associates Ltd. Bruntingthorpe Proving Ground, Bath Lane,Lutterworth, Leicestershire, LE17 5QS, Great Britain; +44(0)1162 479787;[email protected];www.cre8-associates.com Products and Services: Cables & Connectors, Filters, Testing

Credowan Ltd. Stocks Lane, Bracklesham Bay, Chichester,West Sussex P020 8NT, United Kingdom;+44(0)1243 670711; Fax: +44(0)1243 672907;[email protected]; www.credowan.co.uk Products and Services: Shielded Rooms & Enclosures

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DEM ManufacturingDeltron Emcon House, Hargreaves Way, SawcliffeIndustrial Park, Scunthorpe, North Lincolnshire DN15 8RF United Kingdom;+44(0)1724 273200; Fax: +44(0)1724 280353;Diane Kilminster, [email protected];www.dem-uk.com Products and Services: Filters, Surge & Transients

Dexter Magnetic Technologies Europe, Ltd. Unit 12, Tavistock Industrial Estate, Ruscombe Park, Twy-ford, Berkshire RG10 9NJ, United Kingdom; +44(0)1189 602430; Fax: +44(0)1189 602431; [email protected]; www.dextermag.comProducts and Services: Ferrites, Shielding, Surge & Transients

D+M Systems and Test60 Wilbury Way, Hitchin, Hertfordshire SG4 0TA,United Kingdom;+44(0)1462 428991, Fax: +44(0)1462 428995; [email protected]; www.dplusm.ukProducts and Services: Testing

Dutch Microwave Absorber SolutionsIndustrieweg 12, Zoeterwoude, 2382 NV NL+31-71-5012526Bas de Groot; [email protected]; www.dmas.euProducts and Services: Microwave absorbers

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Electromagnetic Testing Services Ltd.Pratts Fields, Lubberhedges Lane, Stebbing, Essex, CM6 3BT United Kingdom;+44(0)1371 856061; Fax: +44(0)1371 856144; www.etsemc.co.ukProducts and Services: Testing

Electronic Test & Calibration Ltd.Caddsdown Industrial Park, Clovelly Road, Bideford, EX393DX, United Kingdom;+44(0)1237 423388; Fax: +44(0)1237 423434;[email protected]; www.etcal.co.ukProducts and Services:Antennas, Calibration, Test-ing, Training

Electrostatic Solutions Ltd.13 Redhill Crescent, Bassett, Southampton, Hampshire, SO16 7BQ, United Kingdom;+44 (0)2380 905600;Dr. Jeremy Smallwood; [email protected]; www.static-sol.com/index.htm Products and Services: Consultancy

Elmac ServicesWareham, Dorset, United Kingdom;+44 (0) 1929 558279; [email protected]; www.elmac.co.uk; Products and Services: Consultancy, Training

EM Test AGFrequensys Ltd., 10 Abbey Court, Fraser Road, MK44 3WH Bedford, United Kingdom;+44 (0)1142 353507; Fax: +44 (0)1234 831998;[email protected]; www.frequensys.co.ukProducts and Services: Surge & Transients, Test Instrumentation, Testing

EMC Consultants Ltd.Stebbing Hall, Lubberhedges Lane, Stebbing, Essex, CM6 3BU United Kingdom;+44(0)1371 856964; +44(0)1371 856984; [email protected];http://emc-consultants.co.uk Products and Services: Consultancy



EMC Hire Ltd.Unit 1, Ivel Road, Shefford, Bedfordshire, SG17 5JU United Kingdom;+44(0)1462 817111; +44(0)1462 819564; www.emchire.co.ukProducts and Services: Test Instrumentation

EMC Partner UK Ltd.1A Golf Link Villas, The Common, Downley, HighWycombe, HP13 5YH, Buckinghamshire United Kingdom; +44(0)1494 44 42 55; Fax: +44(0)1494 44 42 77;David Castle, [email protected]; www.emcpartner.co.ukProducts and Services: Surge & Transients, Test Instrumentation

EMC Resources Ltd.Willow House, Greenrig Road, Hawksland, Lanark, ML11 9QA United Kingdom;+44(0) 141 4161 663;info@ nda-training-course.co.uk;www. nda-training-course.co.ukProducts and Services: Consultancy

EMC Solutions Ltd.Unit 6, Century Park, Starley Way, Solihull, West Mid-lands, B37 7HF United Kingdom;+44(0)1217 822705;www.emcsolutionsltd.comProducts and Services: Filters, Testing

ERA Technology Ltd. Cleeve Road, Leatherhead, Surrey, KT22 7SA,United Kingdom;+44(0)1372 367030;www.cobham.com/technicalservicesProducts and Services: Consultancy

ETC Ltd.Caddsdown Industrial Park Clovelly Road, Bideford, EX39 3DX United Kingdom;+44(0)1237 423388; Fax: +44(0)1237 423434;[email protected]; www.etcal.co.uk/emc_cont.htm; Products and Services: Testing

ETS - Lindgren Ltd.Unit 4 Eastman Way, Pin Green Industrial Area, Steve-nage, Hertfordshire, SG1 4UH, United Kingdom; +44(0)1438 730700; Fax: +44(0)1438 730750; [email protected]; www.ets-lindgren.comProducts and Services: Antennas, Ferrites, Filters, Shielded Rooms & Enclosures, RFI/EMI Signal Genera-tors, Test Instrumentation, Miscellaneous

European EMC Products Unit 7-9, Saffron Business Centre Elizabeth Way, Saf-fron Walden, Essex, CB10 2BL United Kingdom; +44(0)1799 523 073; Fax: +44(0)1799 521 191; [email protected]; www.euro-emc.co.ukProducts and Services: Shielding

Euroquartz Ltd.Blacknell Lane, Crewkerne, Somerset TA18 7HE,United Kingdom;+44(0)1460 230000; Fax: +44(0)1460 230001;John Dale, [email protected]; www.euroquartz.co.uk Products and Services:Filters

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Fair-Rite Products Corp.Dexter Magnetic Technologies Europe, Ltd., Unit 12, Tavistock Industrial Estate, Ruscombe Park, Twyford, Berkshire RG10 9NJ United Kingdom;+44(0) 1189 602430; Fax: +44(0) 1189 602431;[email protected]

Schaffner Ltd., Ashville Way, Molly Millars Lane,Wokingham, Berkshire RG41 2PL United Kingdom; +44 118 977 0070; Fax: +44 118 979 2969;[email protected]; www.Fair-Rite.comProducts and Services: Antennas, Ferrites

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Glenair UK Ltd.40 Lower Oakham Way, Mans eld, NG18 5BY,Great Britain;+44(0)1623 638154; Fax: +44(0)1623 638111;Jane Moss, [email protected]; www.glenair.co.uk Products and Services: Cables & Connectors

Global EMCProspect Close, Lowmoor Road Industrial Estate,Kirby-in-Ash eld, NG17 7LF United Kingdom; +44(0)1623 755539; Fax: +44(0)1623 755719;www.globalemc.co.ukProducts and Services: Shielding, Testing

Globec (UK) Ltd.Unit 15, Shrivenham Hundred Business Park, Watch eld, Oxfordshire, SN6 8TZ, United Kingdom;+44(0)1793 780790; Fax: +44(0) 1793 780776;Peter Harris, [email protected]; www.globec.co.uk/emc/ lters/ lter7.html Products and Services: Cables & Connectors, Filters

Gowanda ElectronicsACAL BFI UK Ltd.; Mill Court, Wolverton Mill South, Milton Keynes, Buckinghamshire, United Kingdom, MK12 5EU;+44 1908 326326; Fax: +44 1908 221110;info.uk@b optilas.com; www.b optilas.com Products and Services: Inductors

Charcroft ElectronicsDol-y-Coed, Llanwrtyd Wells, Powys, United Kingdom, LD5 4TH;+44 01591 612242; Fax: +44 01591 612005;[email protected];www.charcroft.comProducts and Services: Inductors

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Habia Cable Inc.Unit 10 Short Way, Thornbury Industrial Estate,Thornbury, Great Britain, Bristol, BS35 3UT;+44(0)1454 41 25 22; www.habia.com Products and Services: Cables & Connectors

HarwinFitzherbert Road, Farlington, Portsmouth, PO6 1RT, Hants, United Kingdom;+44(0)2392 314545;www.harwin.comProducts and Services: Cables & Connectors

HITEK Electronic Materials Ltd.15 Wentworth Road, South Park Industrial Estate,Scunthorpe, LINCS, DN17 2AX, United Kingdom; +44(0)1724 851678; Fax: +44(0)1724 280586;John Terry, [email protected];www.hitek-ltd.co.ukProducts and Services: Conductive Materials

Horiba Instruments UK Service CenterKyoto Close, Summerhouse Road, Moulton Park, Northampton, NN3 6FL United Kingdom;+44(0)1604 542500;www.horiba.comProducts and Services: Testing

HTT (UK) Ltd.Unit 6 Northend Industrial Estate, Bury Mead Road, Hitchin, SG5 1RT, United Kingdom;+44(0)1462 486866;Roland Brunisholz, [email protected]; www.httuk.co.uk Products and Services: Test Instrumentation, Testing

Hursley EMC ServicesUnit 16, Brick eld Lane Chandlers Ford, Eastleigh, Hampshire, SO53 4DP United Kingdom;+44(0)2380 271111; Fax: +44(0)2380 271144;[email protected]; www.hursley-emc.co.ukProducts and Services: Consultancy, Testing

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Instrument Plastics Ltd.Unit 35, Kings Grove Industrial Est, Maidenhead,Berkshire, SL6 4DP, United Kingdom; [email protected];www.instrumentplastics.co.ukProducts and Services: Shielding

IFI - Instruments for IndustryDM Systems and Test, Ltd., Iceni Court, Icknield Way, Letchworth Garden City, Hertfordshire, SG6 1TN, United Kingdom;+44 (0) 1462 650620; Fax +44 (0) 1462 650622;Ken Ward; [email protected];Andy Jessavala, [email protected];Products and Services: Designers and Manufactur-ers of High Power Microwave and RF Ampli ers (Tetrode Tubes, Solid State and TWT)

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J. M. Woodgate and Associates 3 Bram eld Road East, Rayleigh, Essex, SS6 8RG,United Kingdom;+44(0)1268 747839; Fax: +44(0)1268 777124;[email protected]; www.jmwa.demon.co.uk Products and Services: Consultancy

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Kemtron Ltd.19-21 Finch Drive, Springwood Inustrial Estate,Braintree, Essex, CM7 2SF, United Kingdom;+44(0)1376 348115; Fax: +44(0)1376 345885;[email protected]; www.kemtron.co.ukProducts and Services: RFI/EMI Sheilding gaskets and components

KnitMesh TechnologiesGreenfield, Holywell, Flintshire, North Wales,CH8 9DP United Kingdom;+44(0)1352 717600; Fax: +44(0)1352 714909;Colin Barnes; [email protected]; www.knitmeshtechnologies.com Products and Services: Shielding, Conductive Materials

KTL (TracGlobal)Unit E, South Orbital, Tracking Park, Hedan Road, Hull, HU9 1NJ United Kingdom;+44(0)1482 801801;www.ktl.comProducts and Services: Testing

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Langer EMV-Technik GmbHAPC-Novacom, Novalis Place, DeepdaleEnterprise Park, Deepdale Lane, Nettleham, Lincoln, LN2 2LL, United Kingdom;+44 1522 751136; Fax: +44 1522 754408;[email protected]; www.apc-novacom.co.uk; www.langer-emv.deProducts and Services: Test Instrumentation

Laplace Instruments Ltd.Tudor House, Grammar School Road, North Walsham, Norfolk NR28 9JH, UK;+44 (0) 16 92 40 20 70; Fax: +44 (0) 16 92 40 49 10;[email protected];www.laplaceinstruments.comProducts and Services: Amplifiers, Antennas, Shielded Rooms & Enclosures, Test Instrumentation

Link Microtek Ltd.High Point, Church Street, Basingstoke, Hampshire, RG21 7QN, United Kingdom;+44(0)1256 355771; Fax: +44(0)1256 355118;Hugo Bibby, [email protected];www.linkmicrotek.com Products and Services: Test Instrumentation

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M.Buttkereit Ltd.Unit 2, Britannia Road, Ind. Est. Sale Cheshire,M33 2AA, United Kingdom;+44(0)1619 695418; [email protected] and Services: Cables & Connectors

Magnetic Shields Ltd.Headcorn Road, Staplehurst, Kent TN12 ODSUnited Kingdom;+44(0)1580 891521; Fax: +44(0)1580 893345; [email protected];www.magneticshields.co.uk Products and Services: Shielding

MDL Technologies Ltd. Unit 11, Devonshire Business Centre, Works Road, Letchworth, Herts, SG6 1GJ, United Kingdom; +44(0)1462 431981; Fax: +44(0)5603 152515; www.mdltechnologies.co.ukProducts and Services: Testing

Mead Testing Ltd. Unit 25 Mead Industrial Park River Way, Harlow, Essex, CM20 2SE United Kingdom;+44(0)1279 635864; Fax: +44(0)1279 635874;www.meadtest.comProducts and Services: Testing

Mentor Graphics Mechanical Analysis Div.81 Bridge Road, Hampton Court, Surrey, KT8 9HH, United Kingdom;+44(0)2084 873000; Fax: +44(0)2084 873001;John Parry, Research Manager;[email protected];www.mentor.com/products/mechanical Products and Services: Software

METECC179 Junction Road, Burgess Hill, West Sussex,RH15 0JW, United Kingdom;+44(0)7725 079956;Peter Metcalfe, [email protected]; www.metecc.eu Products and Services: Testing, Training

a TESEQ CompanyMILMEGA Ltd. MDL Technologies Limited, Unit 11, Devonshire Business Centre, Works Road, Letchworth Hertfordshire SG6 1GJ, United Kingdom; +44 0 1462 431981; Fax: 0044 0 560 315 2515;[email protected];www.mdltechnologies.co.uk; www.milmega.comProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

MIRA Ltd. Watling Street Nuneaton, Warwickshire,CV10 0TU United Kingdom;+44(0)2476 355576; Fax: +44(0)2476 358576; www.mira.co.ukProducts and Services: Testing, Training

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Kemtron Ltd.19-21 Finch Drive, Springwood Inustrial Estate,Braintree, Essex, CM7 2SF, United Kingdom;+44(0)1376 348115; Fax: +44(0)1376 345885;[email protected]; www.kemtron.co.ukProducts and Services: RFI/EMI Sheilding gaskets and components

KnitMesh TechnologiesGreenfield, Holywell, Flintshire, North Wales,CH8 9DP United Kingdom;+44(0)1352 717600; Fax: +44(0)1352 714909;Colin Barnes; [email protected]; www.knitmeshtechnologies.com Products and Services: Shielding, Conductive Materials

KTL (TracGlobal)Unit E, South Orbital, Tracking Park, Hedan Road, Hull, HU9 1NJ United Kingdom;+44(0)1482 801801;www.ktl.comProducts and Services: Testing

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Langer EMV-Technik GmbHAPC-Novacom, Novalis Place, DeepdaleEnterprise Park, Deepdale Lane, Nettleham, Lincoln, LN2 2LL, United Kingdom;+44 1522 751136; Fax: +44 1522 754408;[email protected]; www.apc-novacom.co.uk; www.langer-emv.deProducts and Services: Test Instrumentation

Laplace Instruments Ltd.Tudor House, Grammar School Road, North Walsham, Norfolk NR28 9JH, UK;+44 (0) 16 92 40 20 70; Fax: +44 (0) 16 92 40 49 10;[email protected];www.laplaceinstruments.comProducts and Services: Amplifiers, Antennas, Shielded Rooms & Enclosures, Test Instrumentation

Link Microtek Ltd.High Point, Church Street, Basingstoke, Hampshire, RG21 7QN, United Kingdom;+44(0)1256 355771; Fax: +44(0)1256 355118;Hugo Bibby, [email protected];www.linkmicrotek.com Products and Services: Test Instrumentation

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M.Buttkereit Ltd.Unit 2, Britannia Road, Ind. Est. Sale Cheshire,M33 2AA, United Kingdom;+44(0)1619 695418; [email protected] and Services: Cables & Connectors

Magnetic Shields Ltd.Headcorn Road, Staplehurst, Kent TN12 ODSUnited Kingdom;+44(0)1580 891521; Fax: +44(0)1580 893345; [email protected];www.magneticshields.co.uk Products and Services: Shielding

MDL Technologies Ltd. Unit 11, Devonshire Business Centre, Works Road, Letchworth, Herts, SG6 1GJ, United Kingdom; +44(0)1462 431981; Fax: +44(0)5603 152515; www.mdltechnologies.co.ukProducts and Services: Testing

Mead Testing Ltd. Unit 25 Mead Industrial Park River Way, Harlow, Essex, CM20 2SE United Kingdom;+44(0)1279 635864; Fax: +44(0)1279 635874;www.meadtest.comProducts and Services: Testing

Mentor Graphics Mechanical Analysis Div.81 Bridge Road, Hampton Court, Surrey, KT8 9HH, United Kingdom;+44(0)2084 873000; Fax: +44(0)2084 873001;John Parry, Research Manager;[email protected];www.mentor.com/products/mechanical Products and Services: Software

METECC179 Junction Road, Burgess Hill, West Sussex,RH15 0JW, United Kingdom;+44(0)7725 079956;Peter Metcalfe, [email protected]; www.metecc.eu Products and Services: Testing, Training

a TESEQ CompanyMILMEGA Ltd. MDL Technologies Limited, Unit 11, Devonshire Business Centre, Works Road, Letchworth Hertfordshire SG6 1GJ, United Kingdom; +44 0 1462 431981; Fax: 0044 0 560 315 2515;[email protected];www.mdltechnologies.co.uk; www.milmega.comProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

MIRA Ltd. Watling Street Nuneaton, Warwickshire,CV10 0TU United Kingdom;+44(0)2476 355576; Fax: +44(0)2476 358576; www.mira.co.ukProducts and Services: Testing, Training

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EMI/RFI Shielding Solutions

TECH-ETCH, INC., 45 Aldrin Road, Plymouth, MA 02360 USA • TEL 508-747-0300 • FAX 508-746-9639 • [email protected] • HF TECHNOLOGY • The Netherlands • TEL +31 75 628 37 17 • FAX +31 75 621 11 20 • [email protected] • BOMBERG & CO. ApS • TEL +45 48 14 01 55 • FAX +45 48 14 01 56 • [email protected] • YELLOZ COMPONENTS • TEL +3301 64 46 69 68 • FAX +3301 60 92 38 01 • [email protected] • FEUERHERDT GmbH • TEL +49 30 710 96 45 - 53 • FAX +49 30 710 96 45 - 99 • [email protected] • MAHAM FASTENERS • TEL +972 3 9626516 • FAX +972 3 9626517 • [email protected] • SIRCES SRL. ITALY • TEL +39 02 55231395 • FAX +39 02 56816112 • [email protected] • EG COMPONENTS NORWAY AS • TEL +47 23254600 • FAX +47 23254601 • [email protected] • TBA ELECTRO CONDUCTIVE PRODUCTS • TEL +44 1706 647718 • FAX +44 1706 646170 • [email protected]

Exceptional FREE sample program Fast response to customer requests Finest print and web catalogs

Better than 99% quality rating Customization of standard products ISO 9001:2008 Registered

Large inventory for immediate delivery Industry leader of innovative designs Specialists for application assistance

www.tech-etch.com/shield

Tech-Etch, a global supplier of EMI shielding for over 40 years, designs and manufactures a full line of standard and custom products, including contact strips, conductive elastomers, wire mesh, honeycomb vents, board level shielding, metalized fabric shielding, and conductive foam.

ADs_EEG13.indd 14 11/16/12 2:41 PM



MPE Ltd.Hammond Road, Knowsley Industrial Park, Liverpool,Merseyside, L33 7UL, United Kingdom;+44(0)1516 329100; Fax: +44(0)1516 329112; John Jephcott, [email protected]; www.mpe.co.ukProducts and Services: Filters

Murata Electronics UK Oak House, Ancells Road, Ancells Business Park, Fleet,Hampshire, GU51 2QW, United Kingdom;+44(0)1252 8111666;Aya Tonooka, Marketing Officer UK,[email protected]; www.murata-europe.comProducts and Services: Amplifiers, Ferrites, Filters, Surge & Transients

N

Noratel UK Ltd.7 George House Princes Court, Beam Heath Way,Nantwich, CW5 6GD United Kingdom;+44(0)1270 611368;[email protected]; www.toroid.co.ukProducts and Services: Ferrites, Surge & Transients

O

Optical Filters Ltd.Unit 13 & 14, Thame Park Business Centre,Wenman Road, Thame, Oxon, United Kingdom; +44(0)1844 260377; Fax: +44(0)1844 260355;www.opticalfilters.co.ukProducts and Services: Filters, Shielding

Oxley Group Ltd.Priory Park, Ulverston, Cumbria, LA12 9QG,United Kingdom;+44(0)1229 582621; Fax: +44(0)1229 585090;Mark Johnson; [email protected]; www.oxleygroup.comProducts and Services: Cables & Connectors, Fer-rites, Filters, Shielding, Surge & Transients, Testing

P

P & P Technology Ltd.Finch Drive, Springwood, Braintree, Essex,United Kingdom;+44(0)1376 550525; Fax: +44(0)1376 552389; www.p-p-t.co.ukProducts and Services: Conductive Materials, Die Cut Shielding Material, EMI Gaskets, Shielding

Panashield (UK) Ltd.The Bothy, 38 Smarts, Heath Road, Woking,Surrey, GU22 0NP, United Kingdom;+44(0)1483 722020; Fax: +44(0)1483 770330; [email protected] and Services: Filters, Shielded Rooms & Enclosures, Shielding, Testing

Peak Electromagnetics 139 Bank Street, Macclesfield, Cheshire,SK11 7AY United Kingdom;+44(0)1625 269808; [email protected]; www.peak-em.co.ukProducts and Services: Consultancy

PPI (Power Products International) Ltd.Commerce Way, Edenbridge, Kent, TN8 6ED,United Kingdom;+44(0)1732 866424; Fax: +44(0)1732 866399;Geoff Robinson; [email protected];www.ppi-uk.comProducts and Services: Filters

PPM (Pulse Power and Measurement) Ltd.65 Shrivenham Hundred Business Park, Watchfield, Swindon, Wiltshire, SN6 8TY, United Kingdom; +44(0)1793 784389; Fax: +44(0)1793 784391;Philip Surman, [email protected]; www.point2point.co.ukProducts and Services: Antennas, Cables & Con-nectors, Test Instrumentation, Testing

Precision Micro Ltd11 Vantage Way, Erdington, Birmingham,B24 9GZ, United Kingdom;+44 121 380 0100; Fax: +44 121 749 4157; www.precisionmicro.comProducts and Services: Shielding

Q

Q-par Angus Ltd.Barons Cross Laboratories, Leominster, Hereford-shire, HR6 8RS, United Kingdom;+44(0)1568 612138l; Fax: +44(0)1568 616373;Rob Lowther; [email protected]; www.q-par.comProducts and Services: Antennas, Testing,Miscellaneous

QinetiQCodyTechnology, Park 1005, Ively Road, Farnborough, Hampshire, GU14 OLX, United Kingdom;+44 (0)1252 392000; Fax:+44 (0)1252 393399;www.qinetiq.com Products and Services: Testing

R

Rainford EMC SystemsSt. Helens Merseyside, United Kingdom;+44(0)1942 296190;www.rainfordemc.comProducts and Services: Shielding

Rasmi Electronics Ltd.Morrison Road, Annfield Plain, Stanley, Durham,DH9 7RX, United Kingdom;+44(0)1207 291300;Dr. Surendra, [email protected]; www.rasmi.com Products and Services: Antennas, Filters, Shielded Rooms & Enclosures

UK_PS_R_EEG13.indd 32 11/16/12 3:39 PM



MPE Ltd.Hammond Road, Knowsley Industrial Park, Liverpool,Merseyside, L33 7UL, United Kingdom;+44(0)1516 329100; Fax: +44(0)1516 329112; John Jephcott, [email protected]; www.mpe.co.ukProducts and Services: Filters

Murata Electronics UK Oak House, Ancells Road, Ancells Business Park, Fleet,Hampshire, GU51 2QW, United Kingdom;+44(0)1252 8111666;Aya Tonooka, Marketing Officer UK,[email protected]; www.murata-europe.comProducts and Services: Amplifiers, Ferrites, Filters, Surge & Transients

N

Noratel UK Ltd.7 George House Princes Court, Beam Heath Way,Nantwich, CW5 6GD United Kingdom;+44(0)1270 611368;[email protected]; www.toroid.co.ukProducts and Services: Ferrites, Surge & Transients

O

Optical Filters Ltd.Unit 13 & 14, Thame Park Business Centre,Wenman Road, Thame, Oxon, United Kingdom; +44(0)1844 260377; Fax: +44(0)1844 260355;www.opticalfilters.co.ukProducts and Services: Filters, Shielding

Oxley Group Ltd.Priory Park, Ulverston, Cumbria, LA12 9QG,United Kingdom;+44(0)1229 582621; Fax: +44(0)1229 585090;Mark Johnson; [email protected]; www.oxleygroup.comProducts and Services: Cables & Connectors, Fer-rites, Filters, Shielding, Surge & Transients, Testing

P

P & P Technology Ltd.Finch Drive, Springwood, Braintree, Essex,United Kingdom;+44(0)1376 550525; Fax: +44(0)1376 552389; www.p-p-t.co.ukProducts and Services: Conductive Materials, Die Cut Shielding Material, EMI Gaskets, Shielding

Panashield (UK) Ltd.The Bothy, 38 Smarts, Heath Road, Woking,Surrey, GU22 0NP, United Kingdom;+44(0)1483 722020; Fax: +44(0)1483 770330; [email protected] and Services: Filters, Shielded Rooms & Enclosures, Shielding, Testing

Peak Electromagnetics 139 Bank Street, Macclesfield, Cheshire,SK11 7AY United Kingdom;+44(0)1625 269808; [email protected]; www.peak-em.co.ukProducts and Services: Consultancy

PPI (Power Products International) Ltd.Commerce Way, Edenbridge, Kent, TN8 6ED,United Kingdom;+44(0)1732 866424; Fax: +44(0)1732 866399;Geoff Robinson; [email protected];www.ppi-uk.comProducts and Services: Filters

PPM (Pulse Power and Measurement) Ltd.65 Shrivenham Hundred Business Park, Watchfield, Swindon, Wiltshire, SN6 8TY, United Kingdom; +44(0)1793 784389; Fax: +44(0)1793 784391;Philip Surman, [email protected]; www.point2point.co.ukProducts and Services: Antennas, Cables & Con-nectors, Test Instrumentation, Testing

Precision Micro Ltd11 Vantage Way, Erdington, Birmingham,B24 9GZ, United Kingdom;+44 121 380 0100; Fax: +44 121 749 4157; www.precisionmicro.comProducts and Services: Shielding

Q

Q-par Angus Ltd.Barons Cross Laboratories, Leominster, Hereford-shire, HR6 8RS, United Kingdom;+44(0)1568 612138l; Fax: +44(0)1568 616373;Rob Lowther; [email protected]; www.q-par.comProducts and Services: Antennas, Testing,Miscellaneous

QinetiQCodyTechnology, Park 1005, Ively Road, Farnborough, Hampshire, GU14 OLX, United Kingdom;+44 (0)1252 392000; Fax:+44 (0)1252 393399;www.qinetiq.com Products and Services: Testing

R

Rainford EMC SystemsSt. Helens Merseyside, United Kingdom;+44(0)1942 296190;www.rainfordemc.comProducts and Services: Shielding

Rasmi Electronics Ltd.Morrison Road, Annfield Plain, Stanley, Durham,DH9 7RX, United Kingdom;+44(0)1207 291300;Dr. Surendra, [email protected]; www.rasmi.com Products and Services: Antennas, Filters, Shielded Rooms & Enclosures

UK_PS_R_EEG13.indd 32 11/16/12 3:39 PM


Products & Services | United Kingdom

RFI Global Services Ltd.Unit 3 Horizon, Wade Road, Kingsland Business Park, Basingstoke, Hampshire, RG24 8AH United Kingdom; +44 (0)1256 312000; www.rfi-global.comProducts and Services: Testing

Richard Marshall Ltd.The Dappled House, 30 Ox Lane, Harpenden,Herts. AL5 4HE, United Kingdom;+44(0)1582 460815;[email protected]; www.design-emc.co.uk Products and Services: Consultancy

Rittal Ltd. Braithwell Way, Hellaby Industrial Estate, Hellaby, Rotherham, South Yorkshire, S66 8QY United Kingdom; +44(0)1709 704000;[email protected]; www.rittal.co.ukProducts and Services: Shielded Rooms & Enclosures

RN Electronics Ltd. Arnolds Court, Arnolds Farm Lane, Brentwood, Essex CM13 1UT United Kingdom;+44(0)1277 352219; Fax: +44(0)1277 352968;Paul Darragh, [email protected]; www.rnelectronics.com Products and Services: Testing

Roxburgh EMC Deltron Emcon House, Hargreaves Way, SawcliffeIndustrial Park, Scunthorpe, North Lincolnshire, DN15 8RF, United Kingdom;+44(0)1724 273200; Fax: +44(0)1724 280353;Diane Kilminster; [email protected];www.dem-uk.com/roxburghProducts and Services: Filters, Shielded Rooms & Enclosures, Surge & Transients

RS Coatings Ltd.Unit 10, Britannia Way, Britannia Enterprise Park, Lichfield, Staffordshire, WS14 9UY;+44 01543 410 771; Fax: +44 01543 414 977;[email protected]; www.rscoatings.comProducts and Services: Shielding

S

Schaffner Ltd.5 Ashville Way, Molly Millars Lane, Wokingham,Berkshire RG41 2PL, United Kingdom;+44(0)1189 770070; Fax: +44(0)1189 792969;[email protected]; www.schaffner.comProducts and Services: Filters

Schlegel Electronic MaterialsKemtron Limited, 19-21 Finch Drive,Springwood Industrial Estate, Braintree, Essex, CM7 2SF;+44(0)1376 348115; Fax: +44(0)1376 345885;David Wall, [email protected]; www.kemtron.co.ukProducts and Services: Conductive Materials, Shielding

Sematron UK Ltd.Sandpiper House, Aviary Court, Wade Road,Basingstoke, Hampshire, RG24 8GX, United Kingdom; +44(0)1256 812222; Fax: +44(0)1256 812666;Glenn Toal, [email protected]; www.sematron.com; Products and Services: Cables & Connectors, Test Instrumentation

Slater PlasticsUnit 7, Hanborough Business Park Lodge Road, Long Hanborough, Oxon, OX8 8LG United Kingdom; +44(0)1785 213861; Fax: +44(0)1785 243204; [email protected]; www.slaterplastics.comProducts and Services: Filters, Shielding, Test Instrumentation

Sulis Consultants Ltd.Mead House, Longwater Road, Eversley, Hampshire, RG27 0NW, United Kingdom;+44(0)7946 624317;Charlie Blackham, [email protected]; www.sulisconsultants.com Products and Services: Product Approvals, CE Marking

Suppression DevicesUnit 8 - York St Business Centre, Clitheroe, Lancashire, BB7 2DL, United Kingdom;+44(0)1200 444497;Campbell Barker, [email protected]; http://suppression-devices.comProducts and Services: Filters

Swift Textile Metalizing LLC 00 1 860 243 1122; Fax: 00 1 860 243 0848 Christen Holmberg [email protected] Products and Services: Shielding

Syfer Technology Ltd.Old Stoke Road, Arminghall, Norwich, Norfolk,NR14 8SQ, United Kingdom;+44(0)1603 723310; Fax: +44(0)1603 723301;[email protected]; www.syfer.comProducts and Services: Filters

T

T C Shielding, Ltd.Unit 2, Ashburton Industrial Estate Ross on Wye, Herefordshire, HR9 7BW United Kingdom;+44(0)1989 563941;[email protected];www.tcshielding.com Products and Services: Shielding

TBA Electro-Conductive ProductsRooley Moor Road, PO Box 56, Rochdale, Laurashire, OL12 7E4 United Kingdom;+44(0)1706 647718; Fax: +44(0)1706 646170; www.tbaecp.co.uk Products and Services: Conductive Materials,Shielding, Surge & Transients

Tecan Ltd.Tecan Way, Weymouth, Dorset DT4 9TU United King-dom; +44(0)1305 765432; Fax: +44(0)1305 780194;www.tecan.co.ukProducts and Services: Shielding

Tech-Etch, Inc.TBA Electro Conductive Products, P.O. Box 56,Rooley Moor Road, Rochdale, Spotland, Lancs. OL12 7EYUnited Kingdom;+44(0)1706 647718; Fax: +44(0)1706 646170;[email protected]; www.tech-etch.comProducts and Services: Conductive Materials, Shielding

Teledyne ReynoldsNavigation House, Canal View Road, Newbury,Berkshire, RG14 5UR, United Kingdom;+44 (0) 1635 262200;Olivier Dilun, Southern Europe regional sales manager;[email protected]; www.teledynereynolds.co.ukProducts and Services: Cables & Connectors

Telonic Instruments Ltd.Toutley Industrial Estate, Toutley Road, Wokingham, RG41 1QN, United Kingdom;+44(0)1189 786911;Bob Lovell, [email protected]; www.telonic.co.ukProducts and Services: Filters, Test Instrumen-tation

Advanced Test So lut ions for EMC

Teseq Ltd.Teseq Ltd., Ashville Way, Molly Millars Lane,Wokingham, Berkshire RG41 2PL;+44 (0) 8540 740 660; Fax: +44 (0) 845 074 0656; [email protected]; www.teseq.co.ukProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Test software, Calibration & Service

UK_PS_R_EEG13.indd 33 11/16/12 3:39 PM


United Kingdom | Resources

The Lighting Association LaboratoriesStafford Park 7, Telford, Shropshire, TF3 3BQ,United Kingdom;+44(0)1952 290905; Fax: +44(0)1952 290906; [email protected]; www.lightingassociation.com; Products and Services: Surge & Transients

Thurlby-Thandar Instruments (TTI)Glebe Road, Huntingdon, Cambridgeshire, PE29 7DR United Kingdom;+44(0)1480 412451;www.tti-test.com Products and Services: Test Instrumentation, Testing

Tioga Ltd.St Thomas House, Mans eld Road, Derby,DE1 3TN, United Kingdom;+44(0)1332 360884; Fax: +44(0)1332 360885;Angela Bond; [email protected];www.tioga.co.ukProducts and Services: Testing

TMD Technologies Ltd.Swallow eld Way, Hayes, Middlesex UB3 1DQ,United Kingdom;+44(0)2085 735555; Fax: +44(0)2085 691839;[email protected]; www.tmd.co.ukProducts and Services: Ampli ers, Antennas, Filters, Test Instrumentation

TRAC Global, Ltd.100 Frobisher Business Park, Leigh Sinton Road,Malvern, Worcestershire, WR14 1BX, United Kingdom; +44(0)1684 571700; Fax: +44(0)1684 571701; [email protected];www.tracglobal.comProducts and Services: Testing

TRW ConektTechnical Centre, Stratford Road, Solihull, B90 4GW,United Kingdom;+44(0)1216 274242; Fax: +44(0)1216 274243; www.conekt.co.ukProducts and Services: Consultancy and Testing provider

TUV Product Service Ltd.Octagon House, Concorde Way, Segensworth North, Fareham, Hampshire, PO15 5RL, United Kingdom;Fax: +44(0)1489 558100;www.tuvps.co.ukProducts and Services: Testing

U

Uvox Ltd. Building 14/Unit 3, Stanmore Industrial Estate,Bridgnorth, Shropshire, WV15 5HR, United Kingdom; +44(0)1746 769369; Fax: +44(0)1746 766001; Robin Shedden, Sales Manager, [email protected]; www.uvox.co.uk Products and Services: Shielding

V

Vector Fields Ltd. / Cobham Technical Services24 Bankside, Kidlington, OX5 1JE United Kingdom; +44(0)1865 370151; Fax: +44(0)1865 370277;www.vector elds.com Products and Services: Shielding

Visteon Engineering Services Ltd.Dunton Engineering Centre, Dunton, Essex, SS15 6EE, United Kingdom;+44(0)1245 395000;Martin Black, [email protected];www.visteon.com/testing Products and Services: Testing

W

WemtechBordesley Hall, The Holloway, Alvechurch,Birmingham, B48 7QQ United Kingdom;+44(0)1527 595066; +44(0)1527 595033; www.wemtech.co.ukProducts and Services: Consultancy, Training

Westbay Technology Ltd. Main St. Baycliff, Ulverston, Cumbria, LA12 9RNUnited Kingdom;+44(0)1229 869798; Fax: +44(0)1229 869108; www.westbay.ndirect.co.ukProducts and Services: Testing

Wurth Electronics UK Ltd.Exchange Quay, The Of ce Oxfordshire Village, First Floor, Building 24, Salford, Quays, M50 3EQ,United Kingdom;+44(0)1618 720431; Fax: +44(0)1618 720433;[email protected] and Services: Cables & Connectors, Ferrites

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UK_PS_R_EEG13.indd 34 11/16/12 3:39 PM


Resources | United Kingdom

Y

York EMC Services Ltd.Market Square, University of York, Heslington, York, YO10 5DD, United Kingdom;+44(0)1904 434440;www.yorkemc.co.ukProducts and Services: Signal Generators

Z

Zytronic Displays Ltd. Whitely Road Blaydon-on-Tyne, Tyne & Wear, NE21 5NJ United Kingdom;+44(0)1914 145511; Fax: +44(0)1914 140545; www.zytronic.co.ukProducts and Services: Filters

ASSOCIATIONSELECTROMAGNETIC COMPATIBILITY INDUSTRY ASSOCIATIONNutwood UK Limited, Eddystone Court, De Lank Lane, St Breward, Bodmin, Cornwall. PL30 4NQ; +44 (0) 1208 851 530; Fax: +44 (0) 1208 850 871; [email protected]; www.emcia.org

INSTITUTION OF ENGINEERINGAND TECHNOLOGYMichael Faraday House, Six Hills Way, Stevenage, Herts, SG1 2AY, UK;+44 (0)1438 313 311; Fax: +44 (0)1438 765 526; [email protected]; www.theiet.org

RADIO SOCIETY OF GREAT BRITAIN 3 Abbey Court, Fraser Road, Priory Business Park, Bedford MK44 3WH, England;01234 832700; Fax: 01234 831496; [email protected]; www.rsgb.org

UNITED KINGDOM & REPUBLIC OFIRELAND IEEE EMC SOCIETY CHAPTER CST UK Ltd, Strelley Hall, Main Street, Strelley, Nottingham NG8 6PE, United Kingdom;+44 115-906128; Fax: +44 115-9061115;Chairman Nihal Sinnadurai; [email protected];www.ieee-ukri.org

NOTIFIED BODIES 3C TEST LIMITEDSilverstone Technology Park, Silverstone Circuit, Silverstone Northamptonshire NN12 8GX,United Kingdom;+44 (0)1327 857500; Fax: +44 (0)1327 857747; [email protected]; www.3ctest.co.uk

KIWA BLACKWOOD COMPLIANCE LABORATORIESUnit 8 Wood eldside Business Park, Pontllanfraith, Blackwood NP12 2DG, United Kingdom;+44 (0) 1495 229219; Fax: +44 (0) 1495 228331; [email protected];www.kiwa.co.uk

CCQS UK LTDLevel 7, CEC Westgate, Westgate House,Westgate Road, London W5 1YY, United Kingdom;+44 (0)20 8991 3488; [email protected]; www.ccqs.co.uk

CEM INTERNATIONAL LTDThe Atrium Business Centre Curtis Road, Dorking Surrey RH4 1XA, United Kingdom; +44 (0) 1306 646388; Fax: +44 (0) 1306 646389; [email protected]; www.cem-international.co.uk

CONFORMANCE SERVICES LTDConformance House, 24 Tidnock Ave., Congleton, Cheshire CW12 2HW, United Kingdom; +44 (0)1260 270729; Fax: +44 (0)1260 270729; [email protected]; www.conformance-services.com

ERICSSON LIMITEDUnit 4, Midleton Gate, Guildford Business Park, Guildford, GU2 8SD United Kingdom; +44 (0) 1483 30 36 66; Fax: +44 (0) 1483 30 35 37; [email protected]; www.ericsson.com

HURSLEY EMC SERVICES LTDUnit 16 Brick eld Trading Est., Brick eld Lane, Chandler’s Ford, Eastleigh, Hampshire SO53 4DP,United Kingdom; +44 (0)23 8027 1111; Fax: +44 (0)23 8027 1144; [email protected];www.hursley-emc.co.uk

INTERTEK TESTING & CERTIFICATION Intertek House, Cleeve Road, Leatherhead, SurreyKT22 7SB, United Kingdom; +44 (0) 1372 370900; Fax: +44 (0) 1372 370999; [email protected]; www.intertek.com

LLOYD’S REGISTER GROUP LTD71 Fenchurch St., London EC3M 4BS, United Kingdom; +44 (0)20 7709 9166; Fax: +44 (0) 20 7488 4796;[email protected]; www.lr.org

MIRA LIMITEDWatling Street, Nuneaton Warwickshire CV10 0TU, United Kingdom; +44 (0) 24 7635 5000; [email protected]; www.mira.co.uk

RFI GLOBAL SERVICES LTDPavilion A, Ashwood Park, Ashwood Way, Basingstoke RG23 8BG, United Kingdom; +44 (0) 1256 312000; Fax: +44 (0) 1256 312001; info@r -global.com; www.r -global.com

SAFENET LIMITEDDenford Garage, Denford, Kettering, Northants NN14 4EQ, United Kingdom; +44 (0) 1832 732 174; [email protected]; www.safenet.co.uk

SAI GLOBAL ASSURANCE SERVICES Winterhill House Snowdon Drive, Milton Keynes, Buckinghamshire, MK6 1AX, United Kingdom;+44 (0) 1926854111; Fax: +44 (0) 1926854222;[email protected]; www.saiglobal.com

SAMSUNG ELECTRONICSEURO QA LABBlackbushe Business Park Saxony Way, Yateley Hampshire GU46 6GG, United Kingdom; +44 (0)1252 863 800; Fax: +44 (0)1252 863 805; [email protected]

SGS UNITED KINGDOM LIMITEDInward Way, Rossmore Business Park, Ellesmere Port, CH65 3 EN, United Kingdom;+44 (0) 151 350 6666; Fax: +44 (0) 151 350 6600; [email protected]; www.uk.sgs.com

TECHNOLOGY INTERNATIONAL EUROPE LTD56 Shrivenham Hundred Business Park Shrivenham, Swindon, Wiltshire SN6 8TY, United Kingdom; +44 (0) 1793 783137; Fax: +44 (0) 1793 782310; [email protected]; www.iti.co.uk

TRAC GLOBAL LTDSouth Orbital Trading Park, Hedon Road, HullHU9 1NJ, United Kingdom; +44 (0)1482 801801; Fax: +44 (0)1482 801806; [email protected]; www.tracglobal.com

TÜV SÜD BABTForsyth House, Church eld Road, Walton-on-Thames Surrey KT12 2TD, United Kingdom;+44 (0) 1932 251200; Fax: +44 (0) 1932 251201;[email protected]; www.babt.com

TUV PRODUCT SERVICE LTDOctagon House, Concorde Way, Segensworth North, Fareham, Hampshire PO15 5RL, United Kingdom; +44 (0) 1489 558100; Fax: +44 (0) 1489 558101; [email protected]; www.tuvps.co.uk

YORK EMC SERVICES LTDMarket Square, University of York, Heslington, York YO10 5DD, United Kingdom; +44 (0) 1904 434440; Fax: +44 (0) 1904 324434; [email protected]; www.yorkemc.co.uk

Follow Us on Twitter @EMC_EMI

UK_PS_R_EEG13.indd 35 11/16/12 6:35 PM

ALASTAIR R. RUDDLE, PH.D.Computational Electromagnetics SpecialistMIRA Limited

RADIATED ELECTROMAGNETIC emissions measurement standards for road vehicles were developed at a time when the main threat posed by radio-frequency noise from vehicles was interference to broadcast transmissions from spark ignition systems. Since that time, however, on-going technological developments

have resulted in changes in the nature of both the emissions from vehicles and the radio-based services under potential threat. is raises questions as to whether the existing test methods remain appropriate for modern vehicles.

The developments that impact on electromagnetic emissions from modern vehicles arise from the following technological trends in the automotive industry:

1. Replacement of traditional mechanical systems with mechatronic solutions (anti-lock braking systems, steer-by-wire etc.).

2. Use of more sophisticated technologies to deliver existing electrical and electronic functions (PWM control for vehicle lamps, faster processors etc.).

3. Moves towards greater integration between systems in order to provide enhanced functionality (e.g. stability control systems).

4. Introduction of new functions and services based on wireless communications and operating at increasingly high frequencies (vehicle telematics, Bluetooth, radar-based adaptive cruise control etc.).

5. Wider exploitation of lightweight materials, rather than traditional steel, in order to improve energy effi ciency.

6. Increasing deployment of alternative powertrain tech-nologies (e.g. battery, hybrid and fuel cell vehicles).

e latter prompted amendments in the fi fth edition of CISPR 12 [1], which is referenced by the Automotive EMC Directive [2], requiring vehicles with electric pow-ertrain to be operated at 40 km/hr in order to ensure that emissions from these components are taken account of. A further amendment to CISPR 12 [3], which includes an additional requirement for hybrid vehicles that both drive systems should be operational during the measurements where possible, is referenced by UNECE Regulation 10 [4], which will replace the Automotive EMC Directive for EU


Investigation of Vehicle Radiated Emissions Measurement Practices

United Kingdom

Ruddle_UK_EEG13.indd 6 11/16/12 3:41 PM

ALASTAIR R. RUDDLE, PH.D.Computational Electromagnetics SpecialistMIRA Limited

RADIATED ELECTROMAGNETIC emissions measurement standards for road vehicles were developed at a time when the main threat posed by radio-frequency noise from vehicles was interference to broadcast transmissions from spark ignition systems. Since that time, however, on-going technological developments

have resulted in changes in the nature of both the emissions from vehicles and the radio-based services under potential threat. is raises questions as to whether the existing test methods remain appropriate for modern vehicles.

The developments that impact on electromagnetic emissions from modern vehicles arise from the following technological trends in the automotive industry:

1. Replacement of traditional mechanical systems with mechatronic solutions (anti-lock braking systems, steer-by-wire etc.).

2. Use of more sophisticated technologies to deliver existing electrical and electronic functions (PWM control for vehicle lamps, faster processors etc.).

3. Moves towards greater integration between systems in order to provide enhanced functionality (e.g. stability control systems).

4. Introduction of new functions and services based on wireless communications and operating at increasingly high frequencies (vehicle telematics, Bluetooth, radar-based adaptive cruise control etc.).

5. Wider exploitation of lightweight materials, rather than traditional steel, in order to improve energy effi ciency.

6. Increasing deployment of alternative powertrain tech-nologies (e.g. battery, hybrid and fuel cell vehicles).

e latter prompted amendments in the fi fth edition of CISPR 12 [1], which is referenced by the Automotive EMC Directive [2], requiring vehicles with electric pow-ertrain to be operated at 40 km/hr in order to ensure that emissions from these components are taken account of. A further amendment to CISPR 12 [3], which includes an additional requirement for hybrid vehicles that both drive systems should be operational during the measurements where possible, is referenced by UNECE Regulation 10 [4], which will replace the Automotive EMC Directive for EU


Investigation of Vehicle Radiated Emissions Measurement Practices

United Kingdom

Ruddle_UK_EEG13.indd 6 11/16/12 3:41 PM ADs_EEG13.indd 15 11/16/12 2:41 PM

United Kingdom


whole vehicle type approval purposes with effect from November 2014 [5]. Amendments to UNECE Regulation 10 adopted in 2012 also describe new radiated emissions test requirements relating to on-board conductively-coupled electrical charging systems [6]. Wireless inductive charging of vehicle traction batteries, which is currently of growing interest, will necessitate the development of further emissions test requirements.

However, there may be emissions at frequencies outside the existing vehicle emissions test band, and conventional vehicles may also be equipped with systems that are dor-mant until the wheels are in motion. Thus, existing test methods may be becoming less relevant as new tech-nology is introduced. This article gives an overview of an investigation into possible alternative ap-proaches for measuring vehicle electromagnetic emissions that was motivated by these issues.

EXISTING VEHICLE EMISSIONS MEASUREMENT PRACTICES

Unlike the emissions testing standards used by many other industries, such as CISPR 22 [7], there is no require-ment for height scanning of the antenna and rotation of the test object in order to identify the maximum emission levels. The approach for vehicles is based on more restricted “snapshots” for fixed test configurations.

Current vehicle-level radiated emissions test require-ments ([2], [5]) specify broadband and narrowband emis-sions measurements over the band 30–1000 MHz using an antenna at a fixed point relative to the vehicle. Broadband

emissions are classified as signals with bandwidths that exceed the receiver bandwidth, and have pulse repetition frequencies that are smaller than the receiver bandwidth. Narrowband emissions are classified as signals with band-widths that are smaller than the receiver bandwidth, and have pulse repetition frequencies that are greater than the receiver bandwidth. In CISPR 12, both broadband and nar-rowband measurements are carried out using a receiver bandwidth of 120 kHz.

For conventional vehicles, broadband measurements are carried out using a quasi-peak detector with the en-gine running at constant speed (1500 rpm), primarily to detect emissions from the spark ignition system. Vehicles with electric powertrain are required to be operated at 40 km/hr (or maximum speed if this is lower), either on a dynamometer under negligible load or in a free-wheeling

mode with the driven wheels raised up using non-conductive axle stands. As quasi-peak measurements require a significant dwell time, a common ap-proach is to use peak measurements to quickly identify those frequencies that are sufficiently close to the limits to merit the slower quasi-peak measure-ments. Narrowband measurements are carried out using an average detec-tor with the vehicle switched on but without the engine running, in order to detect emissions from on-board electronic modules.

The most common test configura-tion is an open area test site (OATS), or a semi-anechoic chamber (SAC), with an antenna mounted 3 m high at a distance of 10 m from the side of the vehicle and aligned with the centre of the engine (as illustrated in Fig. 1). However, the standards also permit measurements at a reduced distance of 3 m, with the antenna

FIGURE 1: Standard 10 m emissions test on MIRA open area test site.

TABLE 1: Summary of tests carried out on sample vehicles.

Vehicle Static Mode Dynamic Mode Other Tests

Motorcycle CISPR 12, 30-1000 MHz, 10mANSI, 30-1000 MHz, 10mCISPR 12, 0.009-30 MHz, 3mANSI, 0.009-30 MHz, 3m

CISPR 12, 30-1000 MHz, 10mANSI, 30-1000 MHz, 10mCISPR 12, 0.009-30 MHz, 3mANSI, 0.009-30 MHz, 3m

Family Car CISPR 12, 30-1000 MHz, 10mANSI, 30-1000 MHz, 10m

CISPR 12, 30-1000 MHz, 10mANSI, 30-1000 MHz, 10m

Hybrid Vehicle CISPR 12, 30-1000 MHz, 10mANSI, 30-1000 MHz, 10mCISPR 12, 0.009-30 MHz, 3mANSI, 0.009-30 MHz, 3m

Intermittent, 30-1000 MHz, 10m

Light Goods Vehicle


Luxury Car CISPR 12, 30-1000 MHz, 10mANSI, 30-1000 MHz, 10mCISPR 12, 0.009-30 MHz, 3mANSI, 0.009-30 MHz, 3m


Static, 1-10 GHz, 3mIntermittent, 30-1000 MHz, 10m

City Car CISPR 12, 30-1000 MHz, 10mANSI, 30-1000 MHz, 10m

Car with Composite Body


Static, 1-10 GHz, 3m


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height reduced to 1.8 m. e limits for the 3 m measurements are based on the 10 m limits with a 10 dB increase, refl ecting free-space attenuation for a point source.

e emission level is simply taken to be the maximum of the values recorded on either side of the vehicle. Nonetheless, sweep times can be signifi cant, even without the require-ment to identify the direction of maximum emission, so broadband antennas are normally used in order to minimize test disruptions.

Although there is an SAE Recom-mended Practice [8] for measurement of radiated electric and magnetic fi eld emissions at lower frequencies (from 9 kHz to 30 MHz) for vehicles with electric powertrain, this is not a re-quirement and there are no similar recommendations for the testing of conventional (i.e. internal combustion engine) vehicles at these frequencies.

INVESTIGATION OF ALTERNATIVETEST METHODS

Measurements based on both the conventional fi xed geometry of CISPR 12 and the height/azimuth scanning approach of ANSI C63.4 [9] were carried out at frequencies from 9 kHz to 1000 MHz on an open area test site (OATS) for a range of seven diff erent vehicles using the static test modes of CISPR 12. Various practical issues limited the ability to replicate these methods exactly. In earlier investigations of alternative powertrain vehicles at low frequency [10] it was found that measurements at the standard 10 m distance were impracticable because of high and fl uctuating ambient signals. In this work, therefore, the measurement distance was reduced to 3 m for frequencies below 30 MHz.

A bilog antenna at 3 m height was used for measurements in the band 30–1000 MHz, for both horizontal and vertical fi eld polarizations. For the measurements below 30 MHz, an active loop antenna at a height of 1.8 m was used to detect transverse and radial horizontal magnetic fi elds, and an active monopole antenna mounted at a height of 1 m was used to measure the vertically polarized electric fi eld.

As there are vehicle systems that are dormant unless the wheels are in motion, measurements were also made for a dynamic, steady-state operat-ing mode that was achieved by raising the driven wheels so that the powertrain could be engaged in free-wheeling operation (as used for electric pow-ertrain testing). For two vehicles, emissions from various intermittent sources, and in the band 1–10 GHz, were also investigated. e antennas used above 1 GHz included a bilog, a dual-polarized horn and a double-ridged horn. e range of sample vehicles and the tests that were carried out on them

are summarized in Table 1 on page 38.For the ANSI-based measurements with antenna height

and angular scanning, the vehicle wheelbase was centred on the turntable axis and the antenna was positioned at a distance of X m as indicated in Fig. 2, such that the separa-tion between the antenna and the vehicle was at least X m

FIGURE 2: Geometry for ANSI-based scanning measurements.


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(where X=10 m for measurements in the band 30–1000 MHz and X=3 m for measurements in the band 9 kHz to 30 MHz).

Preliminary scans, which were needed in order to iden-tify emissions frequencies for more detailed investigation, were carried out on both sides of the vehicle at fi xed heights of 1 m for vertical polarization and 2 m for horizontal po-larization. e selection of these particular confi gurations for the preliminary scans was based on practical experience of these types of measurements. As in the method based on CISPR 12, the measurements were carried out using a quasi-peak detector for broadband emissions and an average detector for narrowband emissions. Where time permitted, such as when few emissions were found, additional data was collected at diff erent test positions.

RESULTS FOR FREQUENCIES BELOW 30 MHZLow frequency measurements were not carried out for

the city car or the family car, and only the motorcycle and luxury car were tested in the steady-state dynamic mode. Measurements for the hybrid, light goods and composite vehicles were limited to the static mode only.

No low frequency emissions were detected from the motorcycle in either static or dynamic modes. e light goods vehicle (only tested in the static mode) provided narrowband emissions at 16 MHz only, which probably arises from a control module clock signal. For the composite vehicle, broadband emissions were found for two polariza-tions (see Fig. 3).

Broadband emissions were also detected from the hybrid vehicle (see Fig. 4), together with a few narrowband emis-sions. Both static and dynamic measurements were carried out for the luxury vehicle. In this case a few broadband emissions were found, but for the static mode only, while a large number of narrowband emissions were obtained for the dynamic mode only (see Fig. 5). No reliable emissions were detected from any of the vehicles in measurements using the active monopole antenna.

RESULTS FOR FREQUENCY RANGE30–1000 MHZ

Measurements in this band were carried out for all of the vehicles in the conventional static mode. e motorcycle, family car and luxury cars were also tested in the steady-state dynamic mode.

For the family car, the only emissions detected were broadband for vertical polarization, which were present in both static and dynamic modes. e results obtained from the luxury car, however, were limited to a few broadband emissions, in the static mode only, again only for vertical polarization.

Almost no emissions were detected from the light goods vehicle. Only broadband emissions were detected from the hybrid vehicle, while for the composite vehicle narrowband emissions were obtained for vertical polarization and broad-band emissions were detected for both polarizations. For the city car, both broadband (see Fig. 6) and narrowband emissions were detected, mostly for vertical polarization.

For the motorcycle, broadband emissions were detected for both vertical and horizontal polarization, in both static and dynamic modes (shown in Figs. 7–8). Narrowband emissions were also obtained for the motorcycle in both

FIGURE 3: Composite vehicle, comparison of low frequency CISPR 12 and ANSI-based results: broadband, transverse horizontal polarization, static mode.

FIGURE 4: Hybrid vehicle, comparison of low frequency CISPR 12 and ANSI-based results: broadband, radial horizontal polarization, static mode.

FIGURE 5: Luxury car, comparison of low frequency CISPR 12 and ANSI-based results: narrowband, radial horizontal polarization, dynamic mode.

FIGURE 6: City car, comparison of CISPR 12 & ANSI-based results: broadband, vertical polarization, static mode.


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(where X=10 m for measurements in the band 30–1000 MHz and X=3 m for measurements in the band 9 kHz to 30 MHz).

Preliminary scans, which were needed in order to iden-tify emissions frequencies for more detailed investigation, were carried out on both sides of the vehicle at fi xed heights of 1 m for vertical polarization and 2 m for horizontal po-larization. e selection of these particular confi gurations for the preliminary scans was based on practical experience of these types of measurements. As in the method based on CISPR 12, the measurements were carried out using a quasi-peak detector for broadband emissions and an average detector for narrowband emissions. Where time permitted, such as when few emissions were found, additional data was collected at diff erent test positions.

RESULTS FOR FREQUENCIES BELOW 30 MHZLow frequency measurements were not carried out for

the city car or the family car, and only the motorcycle and luxury car were tested in the steady-state dynamic mode. Measurements for the hybrid, light goods and composite vehicles were limited to the static mode only.

No low frequency emissions were detected from the motorcycle in either static or dynamic modes. e light goods vehicle (only tested in the static mode) provided narrowband emissions at 16 MHz only, which probably arises from a control module clock signal. For the composite vehicle, broadband emissions were found for two polariza-tions (see Fig. 3).

Broadband emissions were also detected from the hybrid vehicle (see Fig. 4), together with a few narrowband emis-sions. Both static and dynamic measurements were carried out for the luxury vehicle. In this case a few broadband emissions were found, but for the static mode only, while a large number of narrowband emissions were obtained for the dynamic mode only (see Fig. 5). No reliable emissions were detected from any of the vehicles in measurements using the active monopole antenna.

RESULTS FOR FREQUENCY RANGE30–1000 MHZ

Measurements in this band were carried out for all of the vehicles in the conventional static mode. e motorcycle, family car and luxury cars were also tested in the steady-state dynamic mode.

For the family car, the only emissions detected were broadband for vertical polarization, which were present in both static and dynamic modes. e results obtained from the luxury car, however, were limited to a few broadband emissions, in the static mode only, again only for vertical polarization.

Almost no emissions were detected from the light goods vehicle. Only broadband emissions were detected from the hybrid vehicle, while for the composite vehicle narrowband emissions were obtained for vertical polarization and broad-band emissions were detected for both polarizations. For the city car, both broadband (see Fig. 6) and narrowband emissions were detected, mostly for vertical polarization.

For the motorcycle, broadband emissions were detected for both vertical and horizontal polarization, in both static and dynamic modes (shown in Figs. 7–8). Narrowband emissions were also obtained for the motorcycle in both

FIGURE 3: Composite vehicle, comparison of low frequency CISPR 12 and ANSI-based results: broadband, transverse horizontal polarization, static mode.

FIGURE 4: Hybrid vehicle, comparison of low frequency CISPR 12 and ANSI-based results: broadband, radial horizontal polarization, static mode.

FIGURE 5: Luxury car, comparison of low frequency CISPR 12 and ANSI-based results: narrowband, radial horizontal polarization, dynamic mode.

FIGURE 6: City car, comparison of CISPR 12 & ANSI-based results: broadband, vertical polarization, static mode.


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static and dynamic modes, although very few such emissions were detected for horizontal polarization.

RESULTS FOR FREQUENCIES ABOVE 1 GHZMeasurements based on the CISPR 12 approach were also

carried out for the static mode over the band 1–10 GHz in an anechoic chamber, but only for the luxury car and for the composite vehicle.

The emissions were monitored using a receiver config-ured with a 1 MHz measurement bandwidth and a 500 kHz frequency increment. The antenna was positioned at 1 m height and placed at a 3 m distance (due to space con-straints in the anechoic chamber) and at multiple positions alongside the vehicle (because of the narrower beamwidths of the antennas at these frequencies). The test positions investigated included:

• Position 1 – driver’s side, aligned with rear axle• Position 2 – driver’s side, aligned with midpoint• Position 3 – driver’s side, aligned with front axle• Position 4 – front, aligned with vehicle axis

Broadband emissions were found for both polarizations at frequencies up to 3 GHz for the luxury car, and at up to 6 GHz for the composite vehicle. Results for the latter were clearly clustered by position for horizontal polariza-tion (see Fig. 9), but not for vertical polarization (see Fig. 10). However, no narrowband emissions were detectable (using a criterion that the emission should be at least 4 dB above the noise floor) from either of the vehicles tested at these frequencies.

INTERMITTENT SOURCES, 30–1000 MHZIn order to investigate the emissions from electronic

systems under more realistic driving conditions, measure-ments were carried out in a large semi-anechoic chamber (SAC). The SAC (shown in Fig. 11) is equipped with a dyna-mometer, which allows vehicles to be operated under road-load conditions whilst carrying out EMC measurements. Thus, vehicle emissions can be measured under realistic driving conditions, including during acceleration and decel-eration cycles, using this facility. A further advantage is that the emissions from vehicle sources are more easily identified and quantified in the SAC, which minimizes the impact of high ambient signals such as broadcast transmissions.

Due to the relative geometry of the dynamometer in the SAC, the measurements were made from the front of the ve-hicle, with the vehicle positioned on the dynamometer and the measuring antenna (a bilog) positioned 10 m forward of the front axle at a height of 3 m. Measurements were made during operational cycles of each of the following systems:

• Electric window operating (window wound up and down until sweeps were completed);• Windscreen wipers operating in fast and slow modes;• Rear window heater on;• Internal fan heater operating in fast and slow modes;• Indicators operating on driver’s side;• Headlights on;• Engine idling at 1500 revs/min (for comparison with standard CISPR 12 measurements).

FIGURE 7: Motorcycle, comparison of CISPR 12 measurements for dynamic and static modes of operation: broadband, vertical polarization.

FIGURE 8: Motorcycle, comparison of ANSI preliminary scans for dynamic and static modes of operation: broadband, vertical polarization.

FIGURE 9: High frequency broadband emissions for composite vehicle at different positions, horizontal polarization.

FIGURE 10: High frequency broadband emissions for composite vehicle at different positions, vertical polarization.


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For these sources, five “maximum hold” measurements with the peak de-tector (each lasting 10 seconds) were carried out while the system under test was operated.

Measurements were also made during the following dynamometer drive-cycles (the sweep time varies as detailed below for specific drive-cycles):

• Acceleration to 50 km/h (over a period of 20 s);• Deceleration from 50 km/h (over a period of 20 s);• Constant 50 km/h.The fan heater and electric win-

dows produced emissions that ap-proached, but did not exceed, the limits. However, emissions at levels above the limits were observed for the constant speed and acceleration/deceleration modes. For the luxury car, emissions of up to 10 dB above the limits were found at constant speed for vertical polarization. Thus, there may be some merit in investigating vehicle emissions under constant speed conditions, which can be achieved using current CISPR 12 methods if a dynamometer is available.

MEASUREMENT ISSUESIn these comparison of CISPR 12 and ANSI-based

methods, the ANSI-based values were generally higher, and markedly so in some cases, whereas the CISPR 12 approach allowed larger numbers of emissions to be identified much more rapidly, but at the cost of limited amplitude and direc-

FIGURE 11: Vehicle under EMC test on dynamometer in MIRA SAC.


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For these sources, five “maximum hold” measurements with the peak de-tector (each lasting 10 seconds) were carried out while the system under test was operated.

Measurements were also made during the following dynamometer drive-cycles (the sweep time varies as detailed below for specific drive-cycles):

• Acceleration to 50 km/h (over a period of 20 s);• Deceleration from 50 km/h (over a period of 20 s);• Constant 50 km/h.The fan heater and electric win-

dows produced emissions that ap-proached, but did not exceed, the limits. However, emissions at levels above the limits were observed for the constant speed and acceleration/deceleration modes. For the luxury car, emissions of up to 10 dB above the limits were found at constant speed for vertical polarization. Thus, there may be some merit in investigating vehicle emissions under constant speed conditions, which can be achieved using current CISPR 12 methods if a dynamometer is available.

MEASUREMENT ISSUESIn these comparison of CISPR 12 and ANSI-based

methods, the ANSI-based values were generally higher, and markedly so in some cases, whereas the CISPR 12 approach allowed larger numbers of emissions to be identified much more rapidly, but at the cost of limited amplitude and direc-

FIGURE 11: Vehicle under EMC test on dynamometer in MIRA SAC.


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tional information. This is due to the time taken to maxi-mize the emissions in the ANSI-based approach through height and angular scanning. In this study, the time that was available for the ANSI-based measurements was twice that allocated for the measurements based in CISPR 12. Furthermore, the emissions frequencies identified using the two methods are not always identical. This perhaps resulted from differences in the relative geometry of the vehicle and the antenna between the CISPR-based measurements and the preliminary scans used in the ANSI-based approach.

Comparison of measurements using the two approaches on real vehicles on the OATS was also complicated by ap-parent drift in the levels during the time taken to maximize the emissions. Thus, in many cases the “maximized” results were in fact lower than those recorded from the preliminary scan. This problem did not arise in measurements carried out using a noise source to excite the wiring of two of the vehicles (in a dormant state), which were used to investi-gate the correlation between measurements at 3 m and 10 m distances.

Consequently, the emissions identified from the two methods were not identical and there were emissions, of-ten at high levels from the CISPR 12 measurements, which were missed using the ANSI method. This, together with the drift problem and the fact that the number of emissions that can be investigated using the ANSI method is limited by the time taken to maximize the levels, suggests that the

ANSI results do not necessarily provide a better view of the overall emissions profile than can be obtained using methods based on CISPR 12.

In practice, therefore, both methods have weaknesses in characterizing the emissions profiles of vehicles. A more cost effective approach for improving the spectral and spatial coverage of vehicle emissions measurements could be to use additional sweeps at different fixed measurement locations, rather than the adoption of inherently slower and more limited height and azimuth scanning methods. However, this would mean further expansion of the test requirements.

In the band 1-10 GHz it was not possible to investigate the ANSI-based method due to lack of a suitable turntable in the anechoic chamber. Nonetheless, the greater bandwidth to be covered and the smaller beamwidths of the antennas used in this band resulted in long measurement times for the approach based on CISPR 12.

CONCLUSIONSThe measurements carried out in this project, at frequen-

cies from 9 kHz to 10 GHz, demonstrate that emissions are present at frequencies outside the existing vehicle emissions test band, both above 1 GHz and (for magnetic field) below 30 MHz. Thus, there is a case for extending the frequency scope of automotive emissions measurement requirements both above and below the current test band. In order to


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facilitate this, suitable frequency and emissions limits, as well as appropriate measurement methods, would need to be defined for frequencies above 1 GHz and below 30 MHz.

The investigation of emissions under the steady-state dynamic test condition (with the driven wheels in motion) and from “intermittent” vehicle sources (including accel-eration and deceleration cycles as well as systems such as heaters, lights and electric windows) also shows that the operational emissions characteristics are likely to be differ-ent from those for the static modes that are currently tested. The steady-state dynamic test condition could be accom-modated using current test methods, and can be achieved using “free-wheeling” operation as in this work, although a dynamometer (as used in [3]) provides a more realistic and satisfactory solution. It is therefore recommended that a dynamic steady-state mode should be considered for future development of automotive emissions standards.

The measurements reported here show that both CISPR 12 and ANSI C63.4 based methods have weaknesses in characterizing the emissions profiles of vehicles. These results also suggest that the use of additional sweeps at different fixed measurement locations would perhaps be a more efficient approach for improving the spatial coverage and reliability of vehicle emissions measurements than the adoption of inherently slower and more limited height and azimuth scanning methods. This approach may also be

more suitable for alternative powertrain vehicles, which include architectures that combine spark-ignition engines and electric motors, and may employ multiple traction ma-chines (e.g. wheel-mounted motors). However, increasing the number of fixed emissions measurement points would mean further expansion of the test requirements in addition to the expanded frequency scope and steady-state dynamic test mode that are recommended above.

The time taken to complete measurements using the current methods is already considered to be too high by industry, so any movement towards increasing emissions measurement time would not be regarded favourably. However, measuring a wider range of frequencies would inevitably require more time, even using methods based on CISPR 12. Consequently, alternative approaches that could speed up the measurement process would be highly desirable.

Time-domain emissions measurement methods offer much greater speed more traditional frequency-domain ap-proaches (acceleration factors of 10-100 have been reported [11]–[12]), and could therefore allow many more measure-ment configurations to be investigated within a given time than conventional frequency sweeps. The results obtained in this work suggest that making additional CISPR type fixed measurements is perhaps more beneficial than maximizing a few emissions. Faster, time-domain measurements could

be used for this purpose, or to reduce the “search space” by more rapidly identifying emissions that are required to be maximized. Furthermore, time-domain methods are inherently much better suited to the measurement of intermittent sources, for which cycle times are too short for reliable mea-surements using frequency domain methods.

Measurement of emissions in the 1–10 GHz band was also found to be slow. For radiated im-munity measurements, reverberation conditions offer several advantages, such as reducing the power required to achieve high field levels and eliminating the need to illuminate the equipment under test from a particular direction and with a specific field polarization. Furthermore, rever-beration chambers are much cheaper to construct than anechoic or semi-anechoic chambers of comparable size as expensive absorbing material is not required. The use of reverberation chambers for achieving faster emissions measurements has also been considered [13], as this test environment provides more comprehensive coverage in terms of emission angles and field polarizations. Methods for measuring both emissions and immunity char-acteristics are described in IEC 61000-4-21 [14]. In order to achieve the necessary statistical field properties the reverberation chamber must support a sufficiently large number of modes. Although it would be impractical to have a sufficiently large chamber for use at very low frequencies, as for immunity measurements, reverberation chambers become increasingly successful (in that they are able to support increasing numbers of modes) at high frequencies. Thus, a reverberation chamber


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could be used to rapidly identify signifi cant emissions at high frequencies, perhaps for more detailed investigation using other techniques.

ACKNOWLEDGEMENTThe work reported here was carried out as part of a

contract from the UK’s Radiocommunications Agency, which is now part of Ofcom (Office of Communications). The report on the study that this article is based on [15] is available from the Ofcom website.

REFERENCES• [1] CISPR 12:2001, “Vehicles, motorboats and spark-ignited

engine driven devices. Radio disturbances characteristics. Lim-its and methods of measurements”, 2001.

• [2] “Directive 2004/104/EC of 14 October 2004 adapting to technical progress Council Directive 72/245/EEC relating to the radio interference (electromagnetic compatibility) of vehicles and amending Directive 70/156/EEC on the approximation of the laws of the Member States relating to the type-approval of motor vehicles and their trailers”, Official Journal of the Euro-pean Union, No. L 337, 13th November 2004, pp. 13-58.

• [3] CISPR 12:2001+A1:2005, “Vehicles, motorboats and spark-ignited engine driven devices. Radio disturbances charac-teristics. Limits and methods of measurements”, 2005.

• [4] UNECE, “Regulation No. 10 – Uniform provisions concerning the approval of vehicles with regard to electromagnetic compatibility”, Add. 9, Rev. 3, 14th August 2008.

• [5] “Directive 2007/46/EC of the European Parlia-ment and of the Council of 5 September 2007 estab-lishing a framework for the approval of motor vehicles and their trailers, and of systems, components and separate technical units intended for such vehicles”, Official Journal of the European Union, No. L 263, 9th October 2007, pp. 1-160.

• [6] UNECE, “Regulation No. 10 – Uniform provi-sions concerning the approval of vehicles with regard to electromagnetic compatibility”, Add. 9, Rev. 4, 6th March 2012.

• [7] CISPR 22, “Limits and methods of measure-ment of electromagnetic disturbance characteristics of information technology equipment”, 1999.

• [8] SAE Recommended Practice J551-5:2004, “Performance levels and methods of measurement of magnetic and electric field strength from electric vehicles, broadband, 9 kHz to 30 MHz”.

• [9] ANSI C63.4, “American National Standard for Methods of Measurement of Radio-Noise Emission from Low-Voltage Electrical and Electronic Equip-ment in the Range of 9 kHz to 40 GHz”, 2001.

• [10] A.R. Ruddle, D.A. Topham and D.D. Ward, “Investigation of electromagnetic emissions mea-surements practices for alternative powertrain road vehicles”, Proceedings of 2003 IEEE EMC Symposium, Boston, USA, August 2003, pp. 543-547.

• [11] F. Krug and P. Russer, “Ultra-fast broadband EMI measurement in time-domain using FFT and periodogram”, Proceedings of 5th European Sympo-sium on EMC, Sorrento, Italy, September 2002, pp.

379–384.• [12] C. Keller and K. Feser, “Non-linear superposition of

broadband spectra for fast emission measurements in time-domain”, Proceedings of 15th Zurich EMC Symposium, Zurich, Switzerland, February 2003, pp. 505–510.

• [13] C.L. Holloway, P.F. Wilson, G. Koepke and M. Candidi, “Total radiated power limits for emission measurements in a reverberation chamber”, Proceedings of IEEE 2003 EMC Sym-posium, Boston, USA, August 2003, pp. 838–843.

• [14] IEC 61000-4-21, “Electromagnetic compatibility (EMC) - Part 4-21: Testing and measurement techniques - Reverberation chamber test methods”, Edition 2.0, January 2011,

• [15] A.R. Ruddle, “Investigation of road vehicle electromag-netic emissions measurement methods”, MIRA Report No. 04-0845046, 18th March 2004. Available at: http://stakeholders.ofcom.org.uk/binaries/research/technology-research/mira_04-0845046.pdf

ALASTAIR RUDDLE is with MIRA Ltd (Nuneaton, UK), where much of his work is concerned with the use of numerical modeling methods to investigate electromagnetic issues, primarily for automotive applica-tions. Specific areas of interest include EMC, installed performance of antennas, human exposure to electromagnetic fields, and associ-ated test and measurement methods. He can be contacted at [email protected].

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ANDREAS EBERHARDVice President Power Standards Lab

IMMUNITY FROM voltage sags is vital for reliable opera-tion of our evermore-sophisticated electronic controls and equipment. Every electrical product should be able to ride through typical voltage sags, but in many cases the fi rst sag test occurs after equipment is installed and in operation. Select the appropriate sag immunity specifi cation and equipment compliance testing, and

you’ll be glad you did.Modern equipment can be sensitive to brief disturbances

on utility power mains. Electrical systems are subject to a wide variety of power quality problems that can interrupt production processes, aff ect sensitive equipment, and cause downtime, scrap, and capacity losses. e most common disturbance, by far, is a “sag”: a brief reduction in voltage lasting a few hundred milliseconds.

Sags are commonly caused by fuse or breaker opera-tion, motor starting, or capacitor switching, but they are also triggered by shortp-circuits on the power distribution system caused by such events as snakes slithering across insulators, trenching machines hitting underground cables, and lightning ionizing the air around high-voltage lines. Many utilities report that 80% of electrical disturbances originate within the user’s facility.

A decade ago, the solution to voltage sags was to try to fi x them by storing enough energy somehow and releasing it onto the AC mains when voltage dropped. Some of the old solutions included uninterruptible power supplies (UPS), fl ywheels, and ferroresonant transformers.

More recently, engineers have realized that voltage sag is really a compatibility problem with at least two classes of solutions: You can improve the power or you can make the equipment tougher. e latter approach is called “voltage sag immunity,” and gets more important around the world.

STANDARDS DEVELOPED

ree main primary voltage sag immunity standards are discussed in the following paragraphs: IEC 61000-4-11, IEC 61000-4-34, and SEMI F47. ere are others in use—such as IEEE 1100, CBEMA, ITIC, Samsung Power Vaccine, international standards and MIL-STD—but the fi rst three seem to have the widest acceptance in the marketplace.


New Voltage Sag Testing Requirements for Industrial Equipment

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Eberhard_UK_EEG13.indd 6 11/16/12 3:48 PM

ANDREAS EBERHARDVice President Power Standards Lab

IMMUNITY FROM voltage sags is vital for reliable opera-tion of our evermore-sophisticated electronic controls and equipment. Every electrical product should be able to ride through typical voltage sags, but in many cases the fi rst sag test occurs after equipment is installed and in operation. Select the appropriate sag immunity specifi cation and equipment compliance testing, and

you’ll be glad you did.Modern equipment can be sensitive to brief disturbances

on utility power mains. Electrical systems are subject to a wide variety of power quality problems that can interrupt production processes, aff ect sensitive equipment, and cause downtime, scrap, and capacity losses. e most common disturbance, by far, is a “sag”: a brief reduction in voltage lasting a few hundred milliseconds.

Sags are commonly caused by fuse or breaker opera-tion, motor starting, or capacitor switching, but they are also triggered by shortp-circuits on the power distribution system caused by such events as snakes slithering across insulators, trenching machines hitting underground cables, and lightning ionizing the air around high-voltage lines. Many utilities report that 80% of electrical disturbances originate within the user’s facility.

A decade ago, the solution to voltage sags was to try to fi x them by storing enough energy somehow and releasing it onto the AC mains when voltage dropped. Some of the old solutions included uninterruptible power supplies (UPS), fl ywheels, and ferroresonant transformers.

More recently, engineers have realized that voltage sag is really a compatibility problem with at least two classes of solutions: You can improve the power or you can make the equipment tougher. e latter approach is called “voltage sag immunity,” and gets more important around the world.

STANDARDS DEVELOPED

ree main primary voltage sag immunity standards are discussed in the following paragraphs: IEC 61000-4-11, IEC 61000-4-34, and SEMI F47. ere are others in use—such as IEEE 1100, CBEMA, ITIC, Samsung Power Vaccine, international standards and MIL-STD—but the fi rst three seem to have the widest acceptance in the marketplace.


New Voltage Sag Testing Requirements for Industrial Equipment

United Kingdom


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(IEC is the International Electrotech-nical Commission, SEMI is the Semi-conductor Equipment and Materials Institute, CBEMA is the Computer Business Equipment Manufacturers Association, ITIC is the Information Technology Institute Council, and MIL-STD is the U.S. Defense Depart-ment’s specification.)

IEC 61000-4-11 and IEC 61000-4-34 are a closely related set of standards that cover voltage sag immunity. IEC 61000-4-11 Ed. 2 covers equipment rated at 16 amps per phase or less while IEC 61000-4-34 Ed. 1 covers equipment rated at more than 16 amps per phase. The latter was written after IEC 61000-4-11, so it seems to be more comprehensive.

SEMI F47 is the voltage sag immu-nity standard used in the semiconduc-tor manufacturing industry, where a single voltage sag can result in the multi-million-dollar loss of product if a facility is not properly protected. The semiconductor industry has developed specifications for its manufacturing equipment and for components and subsystems in that equipment. Enforcement is en-tirely customer-driven in this industry, as semiconductor manufacturers understand the economic consequences of sag-induced failures and generally refuse to purchase new equipment that fails the SEMI F47 immunity requirement. SEMI F47 is currently going through its five-year revision and update cycle.

All three standards specify voltage sags with certain depths and durations for the equipment under test (EUT). For example, a specification may state 70% of nominal for 500 milliseconds. The percentage is the amount of voltage remaining, not the amount that is missing. Each standard specifies pass-fail criteria for EUT when a voltage sag is ap-

plied; the IEC standards have a range of pass-fail criteria, but the SEMI F47 standard is more explicit (photo 2).

What makes Voltage sag testing different

In contrast to most other emissions and immunity test-ing, voltage sag testing requires the engineer to control and manipulate all of the power flowing into the EUT. For smaller devices such as personal computers, this is not a great challenge. But for larger industrial equipment; perhaps rated at 480 volts three-phase at 200 amps per phaseand an expected inrush current of 600 amps or more, the test engineer must be prepared for serious performance and safety challenges.

A voltage-sag generator is a piece of test equipment that is inserted between the AC mains and the EUT. It generates voltage sags of any required depth and duration. Some, like the PSL Industrial Power Corruptor, include

pre-programmed sags for all of the IEC, SEMI or MIL standards.

Because a common EUT failure mechanism is a blown fuse or circuit breaker during the current inrush after a voltage-sag, the sag generator must be specified for delivering large peak currents – typically in the hundreds of amps. This peak current requirement in the IEC standards means that elec-tronic amplifier AC sources generally can only be used for pre-compliance testing, not certification

Certain software, such as the sag immunity testing software from Power Standards Lab, comes with extensive safety checklists: some of the checklist items are obvious (Who on the test team is trained in CPR?; Where is the closest fire extin-guisher?) and some are less obvious (How do we get access to at least two

PHOTO 1: Immunize your products and facilities. Voltage sag immunity testing has been common in the semiconductor industry for years and has proved its economic value. New IEC standards for voltage sag immunity will expand this kind of testing and certification to other industries.

PHOTO 2: Playing through. A typical example of a voltage sag ride-through curve comparedwith the SEMI F47 specification commonly used in the semiconductor industry.


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upstream circuit breakers?; Where is the closest trash can?). This kind of testing requires a fully-functional EUT,

and someone who knows how to operate it. The only way to determine if an EUT is immune to the required voltage sags is to have it fully operating during the voltage sags; in many cases, the sags will need to be applied during differ-ent stages of EUT operation. Remarkably often, the EUT is not ready on time for voltage sag testing. Development work may need to be completed, or no one is available to operate the EUT, or the supplies to operate the EUT (raw materials, cooling water, compressed air, etc.) are not avail-able, or the EUT software is broken. Test engineers should plan for these kinds of problems.

EUT failure mechanisms can be complicated, too, and the test engineer will be expected to help diagnose them. The built-in digital oscilloscopes in most sag generators will help, but the test engineer must figure out where to connect the channels to circuits inside the EUT.

Common failure meChanisms due to voltage sags

The most common failure mechanism is lack of energy. This can manifest itself in something as simple as insuf-ficient voltage to keep a critical relay or contactor energized or something as complex as an electronic sensor with a fail-ing power supply giving an incorrect reading, which would

cause EUT software to react inappropriately (Figure 6). The second most common failure mechanism, surpris-

ingly, occurs just after the sag has finished. In such cases, all of the bulk capacitors inside the EUT re-charge at once, causing a large increase in AC mains current. This increase can trip circuit breakers, open fuses, and even destroy solid-state rectifiers. Most design engineers correctly protect against this inrush current during power cycling, but many do not consider the similar effects of voltage sags. Be careful when the test procedure is developed; if you use a sag generator that lacks sufficient current capability it will incorrectly pass the equipment if there is insufficient current available to blow a fuse or trip a circuit breaker in a half-cycle.

Another common EUT failure mechanism occurs when a sensor detects the voltage sag and decides to shut down the EUT. In a straightforward example, a three-phase EUT might have a phase-rotation relay that incorrectly interprets an unbal-anced voltage-sag as a phase reversal and therefore shuts down the EUT. A more atypical example would be if you had an airflow sensor mounted near a fan, it detected that the fan had slowed down momentarily, and the equipment software misinterpreted the message from this sensor as indicating that the EUT cooling system had failed. In this case, a software fan failure signal delay is the solution to improve sag immunity.

One more typical EUT failure mechanism involves an uncommon sequence of events. For example, in one case, a voltage-sag was applied to the EUT and its main contactor opened with a bang. But further investigation revealed that a small relay, wired in series with the main contac-tor coil, actually opened because it received an open relay contact from a stray water sensor. That

PHOTO 3: The voltage sag test engineer will insert a sag generatorbetween the AC source and the EUT. Often, high currents (200 amps) and high voltages (480 volts 3-phase) must be handled.


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sensor, in turn, opened because its small 24-VDC supply output dropped to 18 V during the sag. The solution was an inexpensive bulk capacitor across the 24-VDC supply.

Many other failure mechanisms can take place during voltage sags. The question to the test engineer will always be: How do we fix this problem? Usually, there is a simple, low-cost fix once the problem is identified.

A new embedded Power QuAlitymeAsurement technology

There is a new way to increase the reliability of products due to common power quality and voltage sag problems. How about making the product more intelligent - so it can react depending on severity of the voltage sag problem?

You will see more and more of such permanently in-stalled Power Quality Monitors on a product level. This new embedded technology comes with the huge advantage that power quality problems and energy consumption can be evaluated directly within the product or machine. The new Power Quality Monitor (Photo 4) has the same func-tionality and features as the well-known expensive Power Quality Instruments. These are typically used on a facility level and are much too expensive, and, of course way too big, to integrate and design into products. Traditional power quality instruments have been designed with their own unique packaging. By packaging this new little power qual-ity instrument (the “PQube”) in a standard 35mm DIN-rail circuit breaker package, installation is greatly simplified. The new trend is towards anembedded and intelligent power quality functionality. The PQube detects any kind of power problems on the AC lines and can communicate directly with the product, machine or facility personnel.

The version shown in Photo 4 has Ethernet connectivity (and includes a web server, an FTP server, and an e-mail generator), wireless radio connectivity, and a modem con-nection. However, it is optimized to function without con-nectivity – it can easily store a year’s data on a removable SD memory card.

By following the software model of a digital camera, the PQube requires absolutely no software. When you connect a digital camera to your computer, you immediately see the pictures in a folder on your disk drive. The same is true for power quality data in this application.

With the ever-increasing use of sophisticated controls and equipment in industrial, commercial, institutional, and governmental facilities; the continuity, reliability, and quality of electrical service has become extremely crucial to many power users. The power will hardly get better in the future, so the ultimate goal for any product manufacturer is to make its product immune to voltage sags. As all modern cars should be able to drive through regular bumps on the road, every electrical product should be able to ride-through any regular voltage sag that will occur in a facility.

Andreas Eberhard is member of various power quality standard com-mittees around the world. He has more than 10 years of experience in product compliance based on international standards. He is vice president of technical services at Power Standard Labs and can be contacted at [email protected] or +1-510-522-4400.

PHOTO 4: Anatomy of voltage sag. To test a new product, a voltage-sag is introduced in the power source (a). The waveform, which was about 40 amps peak before the sag in this example, then increases to 450 amps peak after the voltage sag (b). The same current, this time expressed as an RMS value, is shown. The next graph shows the same current, this time as an RMS value. Before the sag, it was about 23 amps RMS (this equipment was rated at 30 amps), but after the sag the current increased to 175 amps RMS. This behavior is not unusual (c). The final graph shows the output of a DC supply during this sag (d).

PHOTO 5: Picture of latest low-cost PQube® - Power Quality andEnergy Monitor for permanent installation and integration.


BRYAN COLEPresident Technology Research Council

JIM TIESIMarketing ManagerEmerson Network Power Surge Protection

ELECTRICAL SYSTEMS and equipment that power and control industrial, commercial, telecommunication and medical processes are subjected to numerous power quality events. These includes power disruptions, brown-outs, sags, swells, temporary overvoltages and lightning. Lightning can disrupt processes by

damaging transformers, distribution equipment, conduc-tors or power conversion equipment. Lightning can also disrupt processes by activating protection and control relays within the utility system, which can cause transient conditions which could result in switching transmis-sion and distribution relays to re-route electrical power. To protect electrical systems and equipment from light-ning induced transients, surge protective devices (SPDs) are connected to the electrical system. An SPD is a device that contains at least one non-linear component and is intended to protect the electrical system and equipment by limiting transient overvoltages and diverting surge currents [1]. SPDs come in numerous confi gurations from small DIN Rail and fl anged mounted devices intended for installation inside electrical equipment and machines (Figure 1), to permanently connected devices intended to be connected external to electrical equipment and machines (Figure 2). SPDs need to protect the electrical system without adversely aff ecting the overall system or cause harm to adjacent personnel. Adverse interactions include system resonances, interactions with ground fault systems, and electrical system damage from inadequately applied (rated) equipment [2]. Protection is derived from the performance characteristics of the SPD. Performance attributes include limiting transient voltages by diverting transient current to amplitudes that are acceptable for continual operation of the connected equipment. e connection of the SPD to the electrical system should not subject personnel to additional electrical hazards from its operation: such as shock and arcing hazards.


Surge Protective Devices (SPDs) and Short Circuit Currents

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Cole_UK_EEG13.indd 6 11/16/12 3:46 PM

BRYAN COLEPresident Technology Research Council

JIM TIESIMarketing ManagerEmerson Network Power Surge Protection

ELECTRICAL SYSTEMS and equipment that power and control industrial, commercial, telecommunication and medical processes are subjected to numerous power quality events. These includes power disruptions, brown-outs, sags, swells, temporary overvoltages and lightning. Lightning can disrupt processes by

damaging transformers, distribution equipment, conduc-tors or power conversion equipment. Lightning can also disrupt processes by activating protection and control relays within the utility system, which can cause transient conditions which could result in switching transmis-sion and distribution relays to re-route electrical power. To protect electrical systems and equipment from light-ning induced transients, surge protective devices (SPDs) are connected to the electrical system. An SPD is a device that contains at least one non-linear component and is intended to protect the electrical system and equipment by limiting transient overvoltages and diverting surge currents [1]. SPDs come in numerous confi gurations from small DIN Rail and fl anged mounted devices intended for installation inside electrical equipment and machines (Figure 1), to permanently connected devices intended to be connected external to electrical equipment and machines (Figure 2). SPDs need to protect the electrical system without adversely aff ecting the overall system or cause harm to adjacent personnel. Adverse interactions include system resonances, interactions with ground fault systems, and electrical system damage from inadequately applied (rated) equipment [2]. Protection is derived from the performance characteristics of the SPD. Performance attributes include limiting transient voltages by diverting transient current to amplitudes that are acceptable for continual operation of the connected equipment. e connection of the SPD to the electrical system should not subject personnel to additional electrical hazards from its operation: such as shock and arcing hazards.


Surge Protective Devices (SPDs) and Short Circuit Currents

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SPDS & SHORT CIRCUIT CURRENTS.

IEC standards require SPDs to withstand fault or short circuit cur-rents from an internal SPD failure [1]. To ensure that an SPD is capable of withstanding the short circuit currents associated with a connection to the electrical system, the SPD is required to have a disconnecting device.

An SPD disconnector is a device that disconnects an SPD from the electrical system in the event of an SPD failure [3]. SPD disconnectors are required to provide system protection to two SPD failure modes: thermal faults and short-circuit current faults [3]. A short-circuit current is the amount of current that can flow in the system to the point of failure. The amplitude of the short-circuit current depends on numerous conditions, including the source imped-ance, conductor impedance, whether the fault is phase-to-phase or phase-to-ground, and the amount of other impedances in the electrical system.

SPDs that are connected to the electrical system are required to have a short-circuit current rating [1]. The short-circuit current rating of an SPD is the maximum prospective short-circuit current available from the electrical system that the SPD and disconnector is able to withstand without creating an electrical hazard [3]. For an SPD to be properly connected to the electrical system, the short-circuit current rating of the SPD must be equal to or greater than the short-circuit current at the point of installation [3, 4].

Calculating short-circuit currents in an electrical system is complex. While it can be performed by hand or through the use of spreadsheets, software simulation is commonly used to account for the many variables. However, estimat-ing the short-circuit current at the output of a transformer can be easily estimated. To approximate the short-circuit current (SCC) at the secondary of the transformer, one

needs to know the power rating of the transformer (P), the full-load secondary current of the transformer (I), the line-line voltage at the secondary of the transformer (V) and the transformer impedance (Z) [5]. The power rating is in kVA, the current is in amperes (A), and the voltage is in volts (V).

The full-load secondary current (I) of the transformer can be calculated by EQ1.

I=P/(V√3)

The short-circuit current (SCC) can be calculated by EQ2

SCC=I/Z

As the power rating of the transformer increases, the available short-circuit current increases. As the impedance of the transformer increases, the available short-circuit current decreases.

SPD SHORT-CIRCUIT CURRENT TESTING.SPDs are required to be tested to short-circuit currents

to determine the short-circuit current rating (SCCR) [3]. A disconnecting device is required to disconnect the SPD dur-ing the short-circuit current test, except for the Neutral to Protective Earth (N-PE) protection mode of an SPD in a TN or TT grounding system [3]. The SPD disconnecting device can be either an internal or external fuse or circuit breaker.

The SPD manufacturer specifies the amplitude of the short-circuit current (Table I). If no short-circuit current is defined by the SPD manufacturer, then the SPD is tested at a short-circuit current of 300 A. Once the short-circuit current amplitude is selected, the power source must be able to deliver a specific current with a minimum power

FIGURE 1: Integrated SPD.

FIGURE 2: External SPD.


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SPDS & SHORT CIRCUIT CURRENTS.

IEC standards require SPDs to withstand fault or short circuit cur-rents from an internal SPD failure [1]. To ensure that an SPD is capable of withstanding the short circuit currents associated with a connection to the electrical system, the SPD is required to have a disconnecting device.

An SPD disconnector is a device that disconnects an SPD from the electrical system in the event of an SPD failure [3]. SPD disconnectors are required to provide system protection to two SPD failure modes: thermal faults and short-circuit current faults [3]. A short-circuit current is the amount of current that can flow in the system to the point of failure. The amplitude of the short-circuit current depends on numerous conditions, including the source imped-ance, conductor impedance, whether the fault is phase-to-phase or phase-to-ground, and the amount of other impedances in the electrical system.

SPDs that are connected to the electrical system are required to have a short-circuit current rating [1]. The short-circuit current rating of an SPD is the maximum prospective short-circuit current available from the electrical system that the SPD and disconnector is able to withstand without creating an electrical hazard [3]. For an SPD to be properly connected to the electrical system, the short-circuit current rating of the SPD must be equal to or greater than the short-circuit current at the point of installation [3, 4].

Calculating short-circuit currents in an electrical system is complex. While it can be performed by hand or through the use of spreadsheets, software simulation is commonly used to account for the many variables. However, estimat-ing the short-circuit current at the output of a transformer can be easily estimated. To approximate the short-circuit current (SCC) at the secondary of the transformer, one

needs to know the power rating of the transformer (P), the full-load secondary current of the transformer (I), the line-line voltage at the secondary of the transformer (V) and the transformer impedance (Z) [5]. The power rating is in kVA, the current is in amperes (A), and the voltage is in volts (V).

The full-load secondary current (I) of the transformer can be calculated by EQ1.

I=P/(V√3)

The short-circuit current (SCC) can be calculated by EQ2

SCC=I/Z

As the power rating of the transformer increases, the available short-circuit current increases. As the impedance of the transformer increases, the available short-circuit current decreases.

SPD SHORT-CIRCUIT CURRENT TESTING.SPDs are required to be tested to short-circuit currents

to determine the short-circuit current rating (SCCR) [3]. A disconnecting device is required to disconnect the SPD dur-ing the short-circuit current test, except for the Neutral to Protective Earth (N-PE) protection mode of an SPD in a TN or TT grounding system [3]. The SPD disconnecting device can be either an internal or external fuse or circuit breaker.

The SPD manufacturer specifies the amplitude of the short-circuit current (Table I). If no short-circuit current is defined by the SPD manufacturer, then the SPD is tested at a short-circuit current of 300 A. Once the short-circuit current amplitude is selected, the power source must be able to deliver a specific current with a minimum power

FIGURE 1: Integrated SPD.

FIGURE 2: External SPD.


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factor (Table II).Prior to short-circuit current testing, samples must be

prepared. For SPDs with voltage limiting components, e.g. metal-oxide varistors (MOVs) or silicon avalanche diodes (SADs), they are replaced with appropriately sized copper blocks [3]. SPDs that are intended to be connected inside an electrical enclosure or have a degree of protection of IP20 or less are installed in a mesh type, metal enclosure [2]. SPDs intended to be connected outside of electrical equipment are tested in the supplied enclosure.

After the short-circuit current test is completed, the pass criteria of the SPD are [3]:

• No visible damage to the SPD enclosure; small indents or cracks that do not degrade the degree of protection (IP code) are excluded

• Disconnection shall be provided by the disconnector• Disconnector indication shall show proper state• SPDs with a degree of protection greater than IP20 shall

not have accessible live components (unless accessible prior to the test) when subjected to a test finger probe

• The short-circuit current from the power source shall be interrupted by the SPD disconnector within five seconds

• There shall be no explosion of other hazard• There shall be no flashover to the mesh type, metallic

enclosure

SPD & DISCONNECTOR INTERACTIONS.Interrupting a short-circuit current produces an arc be-

tween the two electrodes or points in the electrical circuit. Circuit breakers incorporate arc shoots to direct the arc away from the contacts within the circuit breaker. Fuse elements use an arc quenching medium, e.g. vacuum, sand, etc., to ensure the arc between the two electrodes.

Some SPDs use internal disconnectors that are in close proximity to the voltage limiting component(s), i.e. MOVs. When MOVs are placed in close proximity to the internal disconnector intended to disconnect short circuit currents, the arc created can rupture the MOVs resulting in subse-quent actions that will result in the SPD failing to meet the pass criteria (Figure 3).

SPDs subjected to the short-circuit current tests using a copper shorting block in place of the voltage limiting com-ponent meet the requirements of the standard. However, using a copper shorting block may not fully evaluate the overall safety performance of the SPD to adequately dis-connect during short-circuit currents. Other international standards require that the SPD be tested as a complete function device [6].

When considering the installation of an SPD, a risk as-sessment is required to ensure that the SPD will provide the proper protection and disconnect from the electrical system without creating additional hazards [1]. This risk assessment should include an evaluation of how the SPD was tested to short-circuit currents and if the voltage limiting components were connected in the circuit or if they were replaced by copper blocks.

SPD APPLICATION EXAMPLEConnecting the SPD to the electrical system requires

that the short-circuit current at the point of installation

and the short-circuit cur-rent rating of the SPD are needed. In all cases, the short-circuit current rat-ing of the SPD must be larger than the calculated short-circuit current at the point of installation. If the SPD is located in other locations, a detailed short-circuit current study is required. If connecting to the secondary side of a transformer, simple equa-tions (EQ1, EQ2) can be used in conjunction with the parameters of the transformer to determine the short-circuit current.

For example, if an SPD is to be connected at a facility service entrance feed from a 2 .5 MVA transformer with a voltage of 400Y/230 V, 4W+G, and an impedance of 3 %, using EQ1 and EQ2 yields a short circuit current of 120.3 kA. To properly apply the SPD, the SPD would have a short-circuit current rating of 125 kA or more. Applying an SPD with a short-circuit current rating of less than 125 kA would compromise the safety of personnel.

CONCLUSIONThe application of SPDs on the electrical system is an

effective and important method to reduce damage to the electrical system and equipment from transient voltages. Properly applying SPDs requires the engineer to consider many system and equipment parameters. One important parameter is the short-circuit current rating of the SPD, the type and location of the SPD disconnector, and the short-circuit current at the point of application.

The short-circuit current at the point of application can be calculated using the process shown in this article or through electrical power analysis software, e.g. SKM, ETAP, or EasyPower. To determine the short-circuit current for SPDs connected at the secondary side of a transformer, simple calculations can be used.

Fuses or circuit-breakers, whether internal or external to

TABLE 1: SPD Short Circuit Current Ratings.

TABLE 2: Short Circuit Current and Power Factor.

ISCCR (kA)

5,0

10,0

14,0

22,0

25,0

30,0

42,0v

50,0

65,0

85,0

100,0

125,0

150,0

200,0

Ip (kA) Power Factor

Ip ≤ 1,5 0,95

1,5 < Ip ≤ 3,0 0,90

3,0 < Ip ≤ 4,5 0,80

4,5 < Ip ≤ 6,0 0,70

6,0 < Ip ≤ 10,0 0,50

10,0 < Ip ≤ 20,0 0,30

20,0 < Ip ≤ 50,0 0,25

50,0 < Ip 0,20


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factor (Table II).Prior to short-circuit current testing, samples must be

prepared. For SPDs with voltage limiting components, e.g. metal-oxide varistors (MOVs) or silicon avalanche diodes (SADs), they are replaced with appropriately sized copper blocks [3]. SPDs that are intended to be connected inside an electrical enclosure or have a degree of protection of IP20 or less are installed in a mesh type, metal enclosure [2]. SPDs intended to be connected outside of electrical equipment are tested in the supplied enclosure.

After the short-circuit current test is completed, the pass criteria of the SPD are [3]:

• No visible damage to the SPD enclosure; small indents or cracks that do not degrade the degree of protection (IP code) are excluded

• Disconnection shall be provided by the disconnector• Disconnector indication shall show proper state• SPDs with a degree of protection greater than IP20 shall

not have accessible live components (unless accessible prior to the test) when subjected to a test finger probe

• The short-circuit current from the power source shall be interrupted by the SPD disconnector within five seconds

• There shall be no explosion of other hazard• There shall be no flashover to the mesh type, metallic

enclosure

SPD & DISCONNECTOR INTERACTIONS.Interrupting a short-circuit current produces an arc be-

tween the two electrodes or points in the electrical circuit. Circuit breakers incorporate arc shoots to direct the arc away from the contacts within the circuit breaker. Fuse elements use an arc quenching medium, e.g. vacuum, sand, etc., to ensure the arc between the two electrodes.

Some SPDs use internal disconnectors that are in close proximity to the voltage limiting component(s), i.e. MOVs. When MOVs are placed in close proximity to the internal disconnector intended to disconnect short circuit currents, the arc created can rupture the MOVs resulting in subse-quent actions that will result in the SPD failing to meet the pass criteria (Figure 3).

SPDs subjected to the short-circuit current tests using a copper shorting block in place of the voltage limiting com-ponent meet the requirements of the standard. However, using a copper shorting block may not fully evaluate the overall safety performance of the SPD to adequately dis-connect during short-circuit currents. Other international standards require that the SPD be tested as a complete function device [6].

When considering the installation of an SPD, a risk as-sessment is required to ensure that the SPD will provide the proper protection and disconnect from the electrical system without creating additional hazards [1]. This risk assessment should include an evaluation of how the SPD was tested to short-circuit currents and if the voltage limiting components were connected in the circuit or if they were replaced by copper blocks.

SPD APPLICATION EXAMPLEConnecting the SPD to the electrical system requires

that the short-circuit current at the point of installation

and the short-circuit cur-rent rating of the SPD are needed. In all cases, the short-circuit current rat-ing of the SPD must be larger than the calculated short-circuit current at the point of installation. If the SPD is located in other locations, a detailed short-circuit current study is required. If connecting to the secondary side of a transformer, simple equa-tions (EQ1, EQ2) can be used in conjunction with the parameters of the transformer to determine the short-circuit current.

For example, if an SPD is to be connected at a facility service entrance feed from a 2 .5 MVA transformer with a voltage of 400Y/230 V, 4W+G, and an impedance of 3 %, using EQ1 and EQ2 yields a short circuit current of 120.3 kA. To properly apply the SPD, the SPD would have a short-circuit current rating of 125 kA or more. Applying an SPD with a short-circuit current rating of less than 125 kA would compromise the safety of personnel.

CONCLUSIONThe application of SPDs on the electrical system is an

effective and important method to reduce damage to the electrical system and equipment from transient voltages. Properly applying SPDs requires the engineer to consider many system and equipment parameters. One important parameter is the short-circuit current rating of the SPD, the type and location of the SPD disconnector, and the short-circuit current at the point of application.

The short-circuit current at the point of application can be calculated using the process shown in this article or through electrical power analysis software, e.g. SKM, ETAP, or EasyPower. To determine the short-circuit current for SPDs connected at the secondary side of a transformer, simple calculations can be used.

Fuses or circuit-breakers, whether internal or external to

TABLE 1: SPD Short Circuit Current Ratings.

TABLE 2: Short Circuit Current and Power Factor.

ISCCR (kA)

5,0

10,0

14,0

22,0

25,0

30,0

42,0v

50,0

65,0

85,0

100,0

125,0

150,0

200,0

Ip (kA) Power Factor

Ip ≤ 1,5 0,95

1,5 < Ip ≤ 3,0 0,90

3,0 < Ip ≤ 4,5 0,80

4,5 < Ip ≤ 6,0 0,70

6,0 < Ip ≤ 10,0 0,50

10,0 < Ip ≤ 20,0 0,30

20,0 < Ip ≤ 50,0 0,25

50,0 < Ip 0,20


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the SPD, are required to obtain a short-circuit current rat-ing and shall not hinder the performance attributes of the SPD. The short-circuit current rating of the SPD is required by standards to be located either on the SPD or in the ac-companying installation instructions. The type and location of the SPD disconnector is also included in the installation instructions.

When performing the risk assessment, the engineer should obtain data from the manufacturer of the SPD whether the short-circuit current test was conducted with the MOVs being replaced with a copper block or if the MOV was installed during the test. SPDs tested with the MOV replaced with a copper block and an internal disconnector can lead to a safety hazard that requires an additional enclosure or protective measures to be considered in the final installation.

REFERENCES.• [1] International Electrotechnical Commission (IEC). Low-

voltage Surge Protective Devices – Part 12: Surge protective devices connected to low-voltage power distribution systems – Selection and application principles, IEC 61643-12. Geneva, Switzerland.

• [2] Institute of Electrical and Electronic Engineers (IEEE). IEEE Guide for the Application of Surge-Protective Devices for Low-Volt-age (1000 V or Less) AC Power Circuits, IEEE C62.72TM – 2007. NY, NY USA.

• [3] International Electrotechnical Commission (IEC). Low-voltage Surge Protective Device – Part 11: Surge protec-tive devices connected to low-voltage power systems – Requirements and test methods, IEC 61643-11. Geneva, Switzerland.

• [4] Cole, B.R., Brown, K, McCurdy, P.S., Phipps, T.E., and Hotchkiss, R. The Short Circuit Current Ratings of Surge Protective Devices. 2006 IEEE Power Engineering Society Summer Conference. Available [on-line] at IEEE Explore.

• [5] McKeown, D., Simple Methods for Calculat-ing Short Circuit Current without a Computer, Re-trieved 2012 August 10, Available [on-line] at http://www.geindustrial.com/publibrary/checkout/Short%20Circuit?TNR=White%20Papers|Short%20Circuit|generic.

• [6] Underwriters Laboratories (UL). Standard for Safety, Surge Protective Devices, UL 1449, 3rd Edition. Northbrook, IL USA.

BRYAN COLE is the president of Technology Research Coun-cil. Cole has more than 25 years experience in the design, development, application, and product safety of power quality equipment, aviation instrumentation, and various low-voltage distribution equipment. He is an IEEE member, a number of UL Standard Technical Panels, a member to the US National Committee to the IEC, and has assisted in the development of numerous national and international standards related to Elec-trical Power Systems. Cole is a former US Marine, is a NARTE Certified Engineer, holds a Bachelors degree in electrical engi-neering, and an MBA with a focus in technology management.

JIM TIESI is the Marketing Manager for Emerson Network Power Surge Protection. Tiesi has 20 years of experience in the

design, development, application, and marketing of power quality equip-ment. He is active in various working groups for both the IEEE and NEMA, and is a member of the Product Development and management Associa-tion. Tiesi holds a Bachelor of Science degree in electrical engineering and a master’s degree in business administration.

FIGURE 3: Improperly Applied MOV & Disconnector.


ADs_EEG13.indd 18 11/16/12 2:43 PM


DEUTSCHLAND


Contents | Deutschland

Heinrich Rudolf Her tz war ein deutscher Physiker, der die elektromagnetische Theorie des Lichts von James Clerk Maxwell überprüfen wollte. Hertz war der erste Physiker, der die E xis tenz von elek tromagnetischen Wellen technischer Ins t rumente in E xper imenten nachgewiesen hat. Die wissenschaftliche Einheit der Frequenz wurde nach ihm benannt: “Hertz”. 18 8 6 e n t w i c k e l t e H e r t z d i e H e r t z -Empfängerantenne, eine Anschlussgruppe die für den Betrieb nicht elektrisch geerdet wird. Außerdem entwickelte er einen Übertragungstyp der Dipolantenne, ein zentral zugeführtes Element zum Übermitteln von UHF-Funkwellen. 1887 experimentierte Hertz in seinem Labor mit Funkwellen. Er verwendete eine von einem Ruhmkorf nduktor gesteuerte Funkenstrecke und ein Leiterpaar als Radiator. An den Enden waren Kapazitätsbereiche für die Schaltresonanz vorhanden. Hertz veröffentlichte seine Arbeit in einem Buch mit dem Titel Electric waves: being researches on the propagation of electric action with nite velocity through space.(Elektrische Wellen: derzeitige Forschungen über die Ausbreitung von Elektrischer Wirkung mit begrenzter Geschwindigkeit im Raum).Hertz bewies in Experimenten, dass transversale elektromagnetische Freiraumwellen eine bestimmte Distanz zurücklegen können.

Heinrich RudolfHertz (1857–1894)

PRODUKTE UND SERVICES

RESSOURCEN

ARTIKEL Anforderungen der CISPR 16-1-1 an Messempfänger, Spektrumanalysatoren und FFT-basierende Messinstrumente STEPHAN BRAUN, ARND FRECH, Founders, GAUSS INSTRUMENTS GmbH

Punktgenaue Puls-Störfestigkeits-Analyse LARS GLÄSER, Hardware-Entwickler von EMV - Maß, Langer

58

64

66

GER_TOC_EEG13.indd 57 11/16/12 3:53 PM

Deutschland | Produkte und Services


1-9

7 layersBorsigstrasse 11, Ratingen 40880, Deutschland;+49(0)2102 7490; Fax: +49(0) 2102 749350; [email protected];www.7layers.com Produkte und Services: Antennen, Testausstattung, Testen

A

A.H. Systems, Inc.Pro Nova Elektronik GmbH, Ludwigsburg, Deutschland; +49 7141 2858 20; Fax: +49 7141 2858 29;[email protected];www.AHSystems.comProdukte und Services: Antennen, Testausstattung, Testen

Aaronia AGGewerbegebiet Aaronia AG, Strickscheid,RLP, 54597, Deutschland;+49(0)6556 93033; Fax: +49(0)6556 93034;Manuel Pinten; [email protected];www.aaronia.deProdukts und Services: Verstärker, Antennen, Kabel und Steckverbinder, Schirmung, Test Instrumentation, Testing, Diverses

Albatross Projects GmbHDaimlerstraße 17, 89564 Nattheim, Deutschland; +49(0)7321 730500; Fax: +49(0)7321 730590;[email protected]; Dr. Michael Kueppers; [email protected]; Thomas Baisch; [email protected] www.albatross-projects.com Produkte und Services: Abgeschirmte Räume und Gehäuse, Absorberhallen

Alfatec Kerafol GmbHMeckenloher Str. 11, D-91126, Rednitzhembach, Deutschland;+49(0)91 22 9796 0; Fax: +49(0)91 22 97 96 50;Holger Schuh, [email protected]; www.alfatec.deProdukte und Services: Testausstattung

AMS Technologies AGFraunhoferstrasse 22, Martinsried, INTL,D-82152, Deutschland;+49(0)11 498 989577561; Fax: +49(0)11 498 989577199; de_info(at)amstechnologies.com;www.amstechnologies.comProdukte und Services: Verstärker, Kabel und Stecker, Filter, Testausstattung, Sonstiges

AR RF/Microwave InstrumentationEMV GmbH, Wallbergstr.7, Taufkirchen,Deutschland D-82024;+49(0)8961 41710; Fax: +49(0)8961 417171;Wolfram Abels; [email protected];www.emvGmbh.de;www.arworld.usProdukte und Services: Verstärker, Antennen, Kabel und Stecker, Abgeschirmte Räume und Gehäuse, Übers-pannung und Einschaltstöße, Testausstattung

Arrow EuropeIm Gefierth 11a, 63303 Dreieich;0180 2020 112 (0.06 Euro/call);www.arroweurope.comProdukte und Services: Ferrite, Kabel und Steck-verbinder, Power Applications

Atmel MARCOM74072 Heilbronn, CA, Deutschland;+49(0)7131 672081;www.atmel.com/ad/automotiveProdukte und Services: Testausstattung

B

Bajog electronic GmbH Mühlstraße 4, Pilsting, 94431 Deutschland;+49(0)9953 30020; Fax: +49(0)9953 300213;[email protected]; www.bajog.deProdukte und Services: Filter

BLOCK Transformatoren-ElektronikGmbH & Co. KG

Max-Planck-Str. 36-46, 27283 Verden, Deutschland;+49(0)4231 6780; Fax: +49(0)4231 678177;Jens Kramer, [email protected];www.block-trafo.deProdukte und Services: Filter

Boger ElectronicsGrundesch 15, Aulendorf, D-88326, Deutschland; +49(0)1175 25451; Fax: +49(0)1175 252382; [email protected]; www.boger.deProdukte und Services: Verstärker, Testen

BONN Elektronik GmbHOhmstr. 11, 83607 Holzkirchen, Germany+49 (0)8024 608 83-0; Fax: +49 (0)8024 608 83-10Gerald Puchbauer, [email protected]; www.bonn-elektronik.com Produkte und Services: Verstärker, Filter

BundesnetzagenturCanisiusstr. 21, 55122 Mainz, INTL, Deutschland;+49(0) 6131 180; [email protected]; www.bundesnetzagentur.de Produkte und Services: CE marking

C

Carl Zeiss Optronics GmbH 73446 Oberkochen, Deutschlandf;+49(0)7364 206530; Fax: +49(0)7364 203697;[email protected]; www.zeiss.deProdukte und Services: Verstärker

Carlisle Interconnect TechnologiesUnited Kingdom;+44-7817-731-000;Andy Bowne, [email protected];www.CarlisleIT.comProdukte und Services: Filter

Cascade Microtech GmbHHeisenbergbogen 1,85609, Aschheim / Dornach, Deutschland,+49(0)8990 901950; Fax: +49(0)8990 90195 25;www.cmicro.comProdukte und Services: Testen

CEcert GmbH Alter Holzhafen 19, Wismar, D-23966, Deutschland; +49(0)3841 2242 906; Fax: +49(0)3841 2242 926;

PRODUKTEUND SERVICES




1-9

7 layersBorsigstrasse 11, Ratingen 40880, Deutschland;+49(0)2102 7490; Fax: +49(0) 2102 749350; [email protected];www.7layers.com Produkte und Services: Antennen, Testausstattung, Testen

A

A.H. Systems, Inc.Pro Nova Elektronik GmbH, Ludwigsburg, Deutschland; +49 7141 2858 20; Fax: +49 7141 2858 29;[email protected];www.AHSystems.comProdukte und Services: Antennen, Testausstattung, Testen

Aaronia AGGewerbegebiet Aaronia AG, Strickscheid,RLP, 54597, Deutschland;+49(0)6556 93033; Fax: +49(0)6556 93034;Manuel Pinten; [email protected];www.aaronia.deProdukts und Services: Verstärker, Antennen, Kabel und Steckverbinder, Schirmung, Test Instrumentation, Testing, Diverses

Albatross Projects GmbHDaimlerstraße 17, 89564 Nattheim, Deutschland; +49(0)7321 730500; Fax: +49(0)7321 730590;[email protected]; Dr. Michael Kueppers; [email protected]; Thomas Baisch; [email protected] www.albatross-projects.com Produkte und Services: Abgeschirmte Räume und Gehäuse, Absorberhallen

Alfatec Kerafol GmbHMeckenloher Str. 11, D-91126, Rednitzhembach, Deutschland;+49(0)91 22 9796 0; Fax: +49(0)91 22 97 96 50;Holger Schuh, [email protected]; www.alfatec.deProdukte und Services: Testausstattung

AMS Technologies AGFraunhoferstrasse 22, Martinsried, INTL,D-82152, Deutschland;+49(0)11 498 989577561; Fax: +49(0)11 498 989577199; de_info(at)amstechnologies.com;www.amstechnologies.comProdukte und Services: Verstärker, Kabel und Stecker, Filter, Testausstattung, Sonstiges

AR RF/Microwave InstrumentationEMV GmbH, Wallbergstr.7, Taufkirchen,Deutschland D-82024;+49(0)8961 41710; Fax: +49(0)8961 417171;Wolfram Abels; [email protected];www.emvGmbh.de;www.arworld.usProdukte und Services: Verstärker, Antennen, Kabel und Stecker, Abgeschirmte Räume und Gehäuse, Übers-pannung und Einschaltstöße, Testausstattung

Arrow EuropeIm Gefierth 11a, 63303 Dreieich;0180 2020 112 (0.06 Euro/call);www.arroweurope.comProdukte und Services: Ferrite, Kabel und Steck-verbinder, Power Applications

Atmel MARCOM74072 Heilbronn, CA, Deutschland;+49(0)7131 672081;www.atmel.com/ad/automotiveProdukte und Services: Testausstattung

B

Bajog electronic GmbH Mühlstraße 4, Pilsting, 94431 Deutschland;+49(0)9953 30020; Fax: +49(0)9953 300213;[email protected]; www.bajog.deProdukte und Services: Filter

BLOCK Transformatoren-ElektronikGmbH & Co. KG

Max-Planck-Str. 36-46, 27283 Verden, Deutschland;+49(0)4231 6780; Fax: +49(0)4231 678177;Jens Kramer, [email protected];www.block-trafo.deProdukte und Services: Filter

Boger ElectronicsGrundesch 15, Aulendorf, D-88326, Deutschland; +49(0)1175 25451; Fax: +49(0)1175 252382; [email protected]; www.boger.deProdukte und Services: Verstärker, Testen

BONN Elektronik GmbHRudolf-Diesel-Str.18, Hohenbrunn, DE-85662, Deutschland;+49(0)8960 87540; Fax: +49(0)8960 875499;Robert Bonn; [email protected];www.bonn-elektronik.com Produkte und Services: Verstärker, Filter

BundesnetzagenturCanisiusstr. 21, 55122 Mainz, INTL, Deutschland;+49(0) 6131 180; [email protected]; www.bundesnetzagentur.de Produkte und Services: CE marking

C

Carl Zeiss Optronics GmbH 73446 Oberkochen, Deutschlandf;+49(0)7364 206530; Fax: +49(0)7364 203697;[email protected]; www.zeiss.deProdukte und Services: Verstärker


Cascade Microtech GmbHHeisenbergbogen 1,85609, Aschheim / Dornach, Deutschland,+49(0)8990 901950; Fax: +49(0)8990 90195 25;www.cmicro.comProdukte und Services: Testen

CEcert GmbH Alter Holzhafen 19, Wismar, D-23966, Deutschland; +49(0)3841 2242 906; Fax: +49(0)3841 2242 926;

PRODUKTEUND SERVICES


GER_PS_R_EEG12.indd 54 11/16/12 3:57 PM


Bahn frei für die Zukunft: Die Generatoren der Serie NSG 5000

erfüllen alle bekannten internationalen Normen und bestätigen

Teseq als Weltmarktführer für KFZ-Elektronik-Tests. Der NSG 5500

mit seinem einzigartigen integrierten 100A Transienten und einer

grossen Auswahl an Einsteckmodulen ermöglicht Tests für Puls

1, 2a, 3a/b und Puls 5 Transienten für jede Norm. Der NSG 5600,

von Grund auf als weltweit bester Funktionsgenerator für den

Automobilbereich konzipiert, lässt sich mit einer breiten Auswahl

an Leistungsverstärkern für Batterie-Simulationen kombinieren.

Zusätzliche schnell wechselbare Module für Erdungs- und Magnet-

feldtests stellen die Kompatibilität mit Tests neuer Normbereiche

sicher.

Integrierter 100 A-Koppler/Batterieschutzschalter

Saubere Pulsgebung für ISO 7637 und hunderte

weitere internationale und herstellerspezifische

Standardtests

Störfestigkeitstests für Transienten

nach ISO 7637-2 Anhang D

Einzigartige Magnetfeld-Funktionen

Ground-Shift- und Trenntransformator

für SAE J1113-2 und mehr

Leistungsfähiger Multifunktionsgenerator

FORMEL 1 FÜR KFZ-IMMUNITÄTSTESTS –NSG 5500/NSG 5600

Teseq GmbH Berlin DeutschlandT + 49 30 5659 8835 F + 49 30 5659 [email protected] www.teseq.de

ADs_EEG13.indd 19 11/16/12 2:44 PM



[email protected]; www.cecert.comProdukte und Services: Antennen, Testen

CETECOM GmbHIm Teelbruch 116, 45219 Essen, Deutschland;+49(0)2054 9519 0; Fax: +49(0)2054 9519 997;[email protected]; www.cetecom.comProdukte und Services: Testen

Communications & Power IndustriesInternational Ismaning, Bayern, Deutschland;+49(0)8945 87370; Fax: +49(0)8945 873745;Wolfgang Tschunke; [email protected];Roman Jaresch; [email protected];www.cpii.com Produkte und Services: Verstärker

Conec CorpOstenfeldmark 16, 59557 Lippstadt, Deutschland; +49(0)2941 7650; Fax: +49(0)2941 76565;Ferdinand Schrader; [email protected]; www.conec.deProdukte und Services: Kabel und Stecker

CST - Computer Simulation Technology Bad Nauheimer Str. 19, Darmstadt, 64289, Deutschland; +49(0)6151 7303 0; Fax: +49(0)6151 7303 100;[email protected]; Ruth Jackson; [email protected]; www.cst.com Produkte und Services: Testen, Antennen, Abschir-mung, Kabel und Stecker

E

Eberspacher ElectronicsRobert Bosch Strasse 6, Goeppingen,73037 Deutschland;+49(0)7161 9559206; Fax: +49(0)7161 9559455;Christian Huschle [email protected]; www.eberspacher.com Produkte und Services: Testen

EM Software & Systems GmbHOtto-Lilienthal-Strasse 36, D-71034 Böblingen,Deutschland;+49(0)7031 7145200; Fax: +49(0)7031 7145249;Dr. U. Jakobus; [email protected];www.emss.de Produkte und Services: Testausstattung, Testen

EM Test GmbHLünener Strasse 211, 59174 Kamen, Deutschland; +49(0)2307 260700; Fax: +49(0)2307 17050; [email protected];www.emtest.deProdukte und Services: Überspannung und Einschalt-stöße, Testen

EMC Partner H+H High Voltage Technology GmbH, Herr Volker Henker, Im kurzen Busch 15, DE - 58640 Iserlohn Deutschland; +49(0)2371 78530; Fax: +49(0)2371 157722;[email protected];www.hundh-highvoltage.de Produkte und Services: Überspannung und Einschalt-stöße, Testausstattung

EMC Testhaus Schreiber GmbHEiserfelderstrasse 316, D-57080 Siegen, Deutschland; +49(0)2713 8270; Fax: +49(0)2713 82758;[email protected];www.emc-testhaus.deProdukte und Services: Testen

EMCC DR. RAŠEKMoggast, Boelwiese 4-8, 91320Ebermannstadt, Deutschland;+49(0)9194 9016; Fax: +49(0)9194 8125;[email protected];www.emcc.deProdukte und Services: Testing

EMCO Elektronik GmbHBunsenstraße 5, 82152 Planegg, Deutschland; +49(0)8989 55650; +49(0)8989 590376;Diego Waser; [email protected];www.emco-elektronik.de Produkte und Services: Verstärker, Antennen, Kabel und Stecker, Testausstattung

EMC Test NRW GmbHEmil-Figge-Str. 76, Dortmund, D-44227, Deutschland;+49(0)2319 742750; Fax: +49(0)2319 742755;Monika Przybilla, [email protected];www.emc-test.deProdukte und Services: Testing

emitec agBirkenstrasse 47, Rotkreuz, INTL 6343, Schweiz; +49(0)4141 7486010;[email protected];www.emitec.chProdukte und Services: Testen

EMI-tec GmbHMotzener Str 17, Berlin, 12277, Deutschland;+49(0)3072 39490; Fax: +49(0)3072 394919;Robert Kahl, [email protected];www.emi-tec.de Produkte und Services: Testen

emscreen GmbHWallbergstraße 7, D-82024 Taufkirchen, Deutschland; +49(0)8961 41710; Fax: +49(0)8961 417171;[email protected];www.emscreen.comProdukte und Services: Abgeschirmte Räume und Gehäuse, Abschirmung

emv - Elektronische Meßgeräte Vertriebs GmbHWallbergstraße 7, 82024 Taufkirchen Deutschland; +49(0)8961 41710; Fax: +49(0)8961 417171;Ariane Wahrmann; [email protected];www.emvgmbh.comProdukte und Services: Testausstattung, Verstärker, Antennen

EMV Testhaus GmbHGustav-Hertz-Straße 35, Straubing,D-94315, Deutschland;+49(0)9421 568680; Fax: +49(0)9421 56868100;Charlotte Klein, [email protected]; www.emv-testhaus.com Produkte und Services: Testen

ETS-Lindgrenemv GmbH –an ETS-Lindgren company - Wallbergstraße 7 82024 Taufkirchen+49 (0) 89 614171-0; Fax. +49 (0) 89 614171-0;[email protected];www.emvgmbh.deProdukte und Services: Verstärker, Antennen, Ferrite, Filter, geschirmte Räume und Gehäuse, RFI / EMI-Signalgeneratoren, Test Instrumentation, Diverses

euro EMC GmbHSchlossstr. 4, Oberkoellnbach, 84103 Postau,Deutschland;+49(0)8774 968550; Fax: +49(0)8774 968559;[email protected];www.emc-positioning.deProdukte und Services: Antennen, Verstärker

F

Fair-Rite Products Corp.Industrial Electronics, Hauptstr. 71 - 79 D-65760Eschborn Deutschland;+49(0)6196 927900; Fax: +49(0)6196 927929;[email protected] Elektronik GmbH, Schoemperienstrasse 12B D-76185 Karlsruhe Deutschland;+49(0)7215 6910; Fax: +49(0) 7215 69110;[email protected]; www.fair-rite.comProdukte und Services: Ferrit, Filter, Abgeschirmte Räume und Gehäuse, Abschirmung

Federal-Mogul CorporationBürgermeister-Schmidt-Straße 17, 51399 Burscheid,+49 2174 69 1360; Fax: +49 2174 696 1360;[email protected];www.federalmogul.com/spProdukts und Services: Shielded Cable Assemblies & Gurte, Shielded Conduits, Shielded Tubing

Feuerherdt GmbHMotzener Str. 26b, 12277 Berlin, Deutscland;+49(0)30 710 96 45 52; Fax: +49(0)30 710 96 45 99; Judith Feuerherdt, [email protected];www.shielding-online.comProdukts und Services: Conductive Materials, Shielding

Frankonia GmbHIndustriestr. 16, Heideck, 91180, Deutschland;+49(0)9177 98500; Fax: +49(0)9177 98520;Andrea Bodhee, [email protected];www.frankoniagroup.comProdukts und Services: Shielded Rooms & Enclo-sures, Shielding, Test Instrumentation

FS Antennentechnik GmbHMorsestr. 6, D-85716 Unterschleissheim, Deutschland; +49(0)8937 44860; Fax: +49(0)8937 448655;[email protected];www.fsant.deProdukte und Services: Antennen

FUSS-EMVJohann-Hittorf-Straße 6, D-12489 Berlin, Deutschland; +49(0)3040 44004, Fax: +49(0)3040 43150;[email protected];www.fuss-emv.deProdukte und Services: Filter

G

GAUSS Instruments Vertriebs GMBHAgnes-Pockels-Bogen 1, Munich, 80992, Deutschland; +49(0)89 9962 7826; Fax: +49(0) 1803 5518 44585; Caroline Lommer, [email protected]; www.gauss-instruments.com

GER_PS_R_EEG12.indd 56 11/16/12 7:11 PM ADs_EEG13.indd 20 11/16/12 2:45 PM



Produkts und Services: Cables & Connectors, Test Instrumentation, Testing, Miscellaneous

germania elektronik GmbHGutenbergring 41, 22848 Norderstedt, Deutschland; +49(0)4059 35580; Fax: +49(0)4059 355820;[email protected];www.germania-elektronik.deProdukte und Services: Abschirmung, Leitungsma-terialien, Ferrit, Filter

GIGACOMP GmbHRichard-Wagner-Str. 31, D-82049 Pullach, Deutschland; +49(0)8932 208957; Fax: +49(0)8932 208958;[email protected]; www.gigacomp.deProdukte und Services: Testausstattung

Gowanda ElectronicsACAL BFI Germany GmbH; Assar-Gabrielsson-Strasse 1, Dietzenbach, Deutschland, D-63128;+49 6074 4098 0; Fax: +49 6074 4098 110;[email protected];www.bfioptilas.com.Produkte und Services: Induktivitäten

Rossmann Electronic GmbHGeorg-Grobl-Strasse 11, Diessen, Deutschland, 86911; +49 8807 94994 0; Fax: 49 8807 94994 29;[email protected]; www.rossmannweb.de.Produkte und Services: Induktivitäten

SK Trade GmbHBehringersdorfer Str 2, Heroldsberg, Deutschland, D-90562;+49 911 5187080; Fax: +49 911 5187081;[email protected]; www.sktrade.de.Produkte und Services: Induktivitäten

H

H+H High Voltage Technology GmbHIm kurzen Busch 15, D-58640 Iserlohn, Deutschland; +49(0)2371 7853 0; Fax: +49(0)2371 7853 28;Klaus Hornickel, Managing Director;[email protected];www.hundh-highvoltage.deProdukte und Services: Testausstattung

HF-SHIELDING Joachim Broede GmbHIndustriestraße 6, D-49170 Hagen a.T.W., Deutschland; +49(0)5405 999904; Fax: +49(0)5405 999906;Joachim Broede, [email protected];www.hf-shielding.deProdukte und Services: Testen

HILO-TEST GmbHE. Pohlner, Hennebergstr. 6,D - 76131 Karlsruhe, Deutschland;+49-721-931 090; Fax: +49-721-931 0939;[email protected]; www.hilo-test.deProdukte und Services: Testausstattung

Hirschmann Car Communication GmbHStuttgarter Straße 45-51, 72654 Neckartenzlingen, Deutschland;+49 (0) 7127 14-0; Fax: +49 (0) 7127 14-1060;[email protected];www.hirschmann-car.comProdukte und Services: Testen

I

i. thomas gmbhAn der B73 - 200a, D-21684 Stade, Deutschland; +49(0)4141 82920; Fax: +49(0)4141 84461;www.schirmkabinen.deProdukte und Services: Filter, Abschirmung, Software

IBH Elektrotechnik GmbHGutenbergring 35, D-22848 Norderstedt, INTL,Deutschland;+49(0)40 52 30 52 0; Fax: +49(0)40 523 97 09;Michaela Kluckert, [email protected];www.ibh-elektrotechnik.deProdukte und Services: Kabel und Stecker

a TESEQ CompanyIFI - Instruments for Industry Teseq GmbH, Landsberger Strasse 255, 12623 Berlin; +49 (0) 3056 598835; Fax: +49 (0) 3056 598834; [email protected];www.teseq.dewww.pischzan-technologies.deProdukte und Services: Entwicklung und Herstellung von Leistungsverstärkern im Mikrowellen und HF-Bereich (Tetrode Tubes, Solid State and TWT)

IMST GmbHCarl-Friedrich-Gauß-Str. 2-4-4, 47475, Kamp-Lintfort, Deutschland;+49(0)2842 981 0; Fax: +49 2842 981 199;[email protected]; [email protected];www.imst.comProdukte und Services: Software

innco-systems GmbHErlenweg 12, 92521 Schwarzenfeld, Deutschland;+49 9435 301659-0; Fax: +49 9435 301659-99;[email protected];[email protected]; www.inncosystems.comProdukte und Services: EMV Positionierer –Drehtische & Antennen Masten

Industrial ElectronicsRudolf-Diesel-Str. 2a D-65719 Hofheim-Wallau;+49 (0) 6122 / 7 26 60-0; Fax: +49 (0) 6122 / 7 26 60-29; [email protected]; [email protected];www.ie4u.deProdukte und Services: Ferrite, Kabel und Steck-verbinder, Power Applications

Instec FiltersACAL BFI GmbH; Assar Gabrielsson Straße 1,Dietzenbach, Deutschland, D-63128;+49 (0) 6074 4098 113; Fax: +49 (0) 6074 81 20 20; Kerstin Reinhardt, [email protected]; www.bfioptilas.com.Produkte und Services: Filters

J

Jacob GmbH Elektrotechnische Fabrik, Gottlieb-Daimler-Str. 11, D-71394 Kernen, Deutschland;+49 (0)7151 40110; Fax: +49 (0)7151 4011 49;[email protected]; www.jacob-gmbh.deProdukte und Services: Testausstattung

JiangSu WEMC Technology Co., Ltd.No. 8, Jian Ye Road, TianMu Lake Industrial Park, LiYang Jiangsu, 213300, China;+86 519 8746 7888; Fax: +86 519 8746 5666;Xiao Wei; [email protected];www.wemctech.comProducts and Services: Filters

K

KE Kitagawa GmbHElbinger Straße 3-5, D-63110 Rodgau-Jügesheim, Deutschland;+49(0)6106 8524 0; Fax: +49(0)6106 85 2430;[email protected];www.kitagawa.deProdukte und Services: Ferrit

L

Langer EMV-Technik GmbHNoethnitzer Hang 31, Bannewitz, 01728, Deutschland;+49(0)3514 3009323;[email protected]; www.langer-emv.dePeter Harms Consulting, Schenefelder Landstraße 127, DE-22589 Hamburg;+49 40 870-2469; Fax: +49 40 870-3821;[email protected]; www.langer-emv.deProdukte und Services: Testausstattung, Pre-compliance EMC engineering services, Measurement software, EMC pre-test equipments, Test and measure-ment, Training

Luethi Elektronik-Feinmechanik AGParkstrasse 6, 4402 Frenkendorf / BL, Deutschland; +49(0)6190 21210; Fax: +49(0)6190 21211;www.luethi-ag.ch Produkte und Services: Testausstattung

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Maschek ElektronikAdolf-Scholz-Allee 4a, 86825, Bad Wörishofen, Deutschland;+49(0)8247 959807; Fax: +49(0)8247 959809;[email protected]; www.maschek.deProdukte und Services: Testausstattung

maturo GmbHBahnhofstr. 26, 92536, Pfreimd, Deutschland;+49(0)9606 9239130; Fax: 49(0)9606 92391329;Markus Saller; [email protected];www.maturo-gmbh.deProdukte und Services: Antennen, Testen


Produkte und Services | Deutschland


MB-technology GmbH Kolumbusstr. 19+21, 71063 Sindelfingen, Deutschland;+49(0)7031 6863000; Fax: +49(0)7031 6864500;[email protected]; www.mbtech-group.comProdukte und Services: Testen

Mesago Messe Frankfurt GmbHRotebuehlstraße 83-85, Stuttgart, 70178, Deutschland;+49(0)7116 19462 0; Fax: +49(0) 7116 1946 91;www.mesago-online.deProdukte und Services: Events

Mician GmbHSchlachte 21, 28195 Bremen, Deutschland;+49(0)4211 6899351; Fax: +49(0)4211 68993 52;[email protected]; www.mician.comProdukte und Services: Software

a TESEQ CompanyMILMEGATeseq GmbH, Landsberger Strasse 255, 12623 Berlin;+49 (0) 3056 598835; Fax: +49 (0) 3056 598834;[email protected]; www.teseq.deProdukte und Services: Entwicklung und Herstellung von Leistungsverstärkern im Mikrowellen und HF-Bereich

MOOSER Consulting GmbHAmtmannstraße 5a, 82544Egling/Thanning, Deutschland;+49(0)8176 92250; Fax: +49(0)8176 92252;Mario Kantner; [email protected]; http://mooser-consulting.de Produkte und Services: Verstärker, Testen

MTS Systemtechnik GmbHGewerbepark Ost 8, D-86690 Mertingen, Deutschland; +49(0)9078 912940, Fax: +49(0)9078 912947 0; [email protected];www.mts-systemtechnik.deProdukte und Services: Antennen, Testausstattung

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Narda Safety Test Solutions GmbHSandwiesenstrasse 7, 72793, Pfullingen, Deutschland; +49(0)7121 9732 0 Fax: +49(0)7121 9732790,[email protected]; www.narda-sts.deProdukte und Services: Antennen, Testausstattung, Sonstiges

Neosid Pemetzrieder GmbH & Co. KGP.O. Box 1354, D-58543 Halver, Deutschland;+49(0)2353 710; Fax: +49(0)2353 7154;[email protected]; www.neosid.deProdukte und Services: Ferrit, Filter

Neuhaus Elektronik GmbHDrontheimer Str. 21, D-13359 Berlin, Deutschland; +49(0)3049 76950; Fax: +49(0)3049 769530;[email protected];www.neuhaus-elektronik.deProdukte und Services: Leitungsmaterialien

NexioEmco Elektronik, Bunsenstr.5, D-82152 Planegg, Deutschland;+49(0)8989 55650; Fax: +49(0)8989 590376; [email protected]; www.emco-elektronik.deProdukte und Services: Testausstattung, Filter, Überspannung und Einschaltstöße

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PFLITSCH GmbH & Co. KGErnst-Pflitsch-Straße 1 industriegebie, Nord 1, D-42499 Hückeswagen, Deutschland;+49(0)2192 9110; Fax: +49(0)2192 911220;[email protected]; www.pflitsch.deProdukte und Services: Kabel und Stecker

Phoenix Testlab GmbHKonigswinkel 10, D-32825 Blomberg, Deutschland; +49(0)5235 95000; Fax: 49(0)5235 950010;[email protected]; www.phoenix-testlab.deProdukte und Services: Testen

Pontis - Audiv GmbHAudivo GmbH,Irrenloher Damm 17, 92521 Schwarzenfeld, Deutschland;+49(0)9435 54190; Fax: +49(0)9435 541919;[email protected]; www.audivo.comProdukte und Services: Abschirmung

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Rohde & Schwarz GmbHMuhldorfstrasse 15, Munich, 81671, Deutschland; +49(0)89 418695 0; Fax: +49(0)89 404764;

[email protected];www2.rohde-schwarz.comProdukte und Services: Antennen, Abgeschirmte Räume und Gehäuse, Abschirmung, Testausstattung

ROLEC GEHÄUSE-Systeme GmbHKreuzbreite 2, 31737 Rinteln, Deutschland;+49(0)5751 40030; www.rolec-enclosures.co.ukProdukte und Services: Abgeschirmte Räume und Gehäuse

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Schlegel Electronic MaterialsElectrade GmbH, Lochhamer Schlag 10b, 82166 Graefelf-ing, Deutschland;+49(0)8989 81050; Fax: +49(0)8985 44922;Frau Anja Schmidt, [email protected];www.electrade.comProdukte und Services: Leitungsmaterialien, Ab-schirmung

Schlenk Metallfolien GmbH & Co. KGBarnsdorfer Hauptstr. 5, D-91154 Roth, Deutschland; +49(0)9171 808 0; Fax: +49(0)9171 808200;Gerhard Loeckler, [email protected];www.schlenk.de Produkte und Services: Abschirmung


Deutschland | Ressourcen


Schlöder GmbHHauptstrasse 71, D-75210, Keltern-Weiler, Deutschland; +49(0)7236 93960; Fax: +49(0)7236 939690;Friedrich Schloeder, [email protected]; www.schloeder-emv.de Produkte und Services: Testen, Testausstattung

Schwarzbeck Mess - ElektronikAn der Klinge 29, D 69250, Schönau, Deutschland; +49(0)6228 1001; Fax: +49(0)6228 1003;[email protected]; www.schwarzbeck.deProdukte und Services: Antennen, Testausstattung ServiceForce.Com GmbHKleyerstraße 92, 60326, Frankfurt am Main,Deutschland;+49(0)6936 50905500; www.serviceforce-com.deProdukte und Services: Testen

Siemens Energy & Automation EMC-CentreGuenther-Scharowsky-Str. 21,Erlangen, D-91058, Deutschland;+49(0)9131 732977; Fax: +49(0)9131 725007; [email protected]; www.automation.siemens.comProdukte und Services: Testen

SINUS Electronic GmbHSchiefweg 10, D-7427 Untereisesheim, Deutschland; +49(0)7132 99690; +49(0)7132 996950;[email protected]; www.sinus-electronic.deProdukte und Services: Filter, Überspannung und Einschaltstöße

Sonderhoff Chemicals GmbHRichard-Byrd-Straße 26, 50829 Köln, Deutschland; +49(0)2219 56850; Fax +49(0)2219 5685599;[email protected]; www.sonderhoff.comProdukte und Services: Testen

SOSHIN Electronics Europe GmbHWesterbachstrasse 32, D-61476, Kronberg im Taunus, Deutschland;+49(0)6173 993108; Fax: +49(0)6173 993206;www.soshin-ele.comProdukte und Services: Filter

Spitzenberger & Spies GmbH & CoSchmidstraße 32-34, D-94234, Viechtach, Deutschland; +49(0)9942 956 0;[email protected]; www.spitzenberger.de Produkte und Services: Verstärker, Testausstattung Statex Produktions & Vertriebs GmbHKleiner Ort 9, 28357 Bremen, Deutschland;+49(0)4212 750479; Fax: +49(0)4212 73643;[email protected]; www.statex.deProdukte und Services: Abgeschirmte Räume und Gehäuse, Abschirmung, Leitungsmaterialien

Stolberg HF-Technik AG Muensterau 168, 52224, Stolberg-Vicht, Deutschland; +49(0)2402 997770; Fax: +49(0)2402 99777900;Harald Landes, [email protected];www.stolberg-hf.comProdukte und Services: Verstärker, Kabel und Stecker, Testausstattung

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Tactron Elektronik Bunsenstraße 5 / 11 Stock, 82152 Planegg, Deutschland; +49(0)8989 55690; Fax: +49(0)8985 77605;[email protected] TDK; www.tactron.deProdukte und Services: Software

TDK Electronics Europe Wanheimer Strasse 57, Dusseldorf, INTL, D-40472, Deutschland;+44(0)1344 381515;Stuart Jackson; [email protected];www.tdk-europe.comProdukte und Services: Verstärker, Antennen, Ferrit, Filter, Abgeschirmte Räume und Gehäuse, Abschirmung, Testausstattung, Testen

Tech-Etch, Inc.Feuerherdt GmbH, Motzener Str. 26 b, 12277 Berlin, Deutschland;+49(0)30 710 96 45 53; Fax: +49(0)30 710 96 45 99; [email protected]; www.tech-etch.comProdukte und Services: Leitungsmaterialien, Ab-schirmung

Telemeter Electronic GmbHJoseph-Gansler-Straße 10,D-86609 Donauworth, Deutschland;+49(0)9067 06930; Fax: +49(0)9067 069350;[email protected]; www.telemeter.infoProdukte und Services: Testen,HF-und Mikrowellen

TESTEC Elektronik GmbHWesterbachstr. 58,60489 Frankfurt am Main, Deutschland;+49(0)6994 33350; Fax: +49(0)6994 333555;[email protected]; www.testec.deProdukte und Services: Testausstattung


Teseq GmbHLandsberger Strasse 255, 12623 Berlin, Deutsch-land; +49 (0) 3056 598835; Fax: +49 (0) 3056 598834;[email protected]; www.teseq.deProduk te und Ser vices : Vers tärker (HF & Mikrowellen), Antennen, Automotive Systeme, leitungsgebundene Störfestigkeit, leitungsgebun-dene Überspannung & schnelle Transienten, ESD, Netzoberwellen & Flicker, GTEM Zellen, HF Immu-nitäts- und Emissionssysteme, HF Testsoftware, Kalibration & Service

THORA Elektronik GmbHEsbacher Weg 13, D-91555 Feuchtwangen,+49 (0) 98 52 6 10 79-0; Fax: +49 (0) 98 52 6 10 79-50; [email protected]; www.thora.comProdukte und Services: Ferrit, Connectors

TTV GmbHSudetenstr. 53, 82538 geretsried, Deutschland; +49(0)8171 34690; Fax: +49(0)8171 346929;[email protected]; www.go-ttv.comProdukte und Services: Filter

TÜV SÜD SENTON GmbH Äußere Frühlingstraße 45,94315 Straubing, Deutschland;+49(0)9421 552222; Fax: +49(0)9421 552299;Stefan Kammerl; [email protected];www.tuev-sued.de/sentonProdukte und Services: Testen

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Vacuumschmelze GmbHGrüner Weg 37, Hanau, D-63450, Deutschland;+49 6181 38-0; Fax: +49(0)6181 382645; [email protected];www.vacuumschmelze.comProdukte und Services: Produkte

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Würth Elektronik GmbH &Co. KGSalzstraße 21, 74676 Niedernhall, Deutschland;+49 (0) 79 40 946 - 0; Fax: +49 (0) 79 40 946 - 55 00 00; Alexander Gerfer, [email protected];www.we-online.deProdukte und Services: Ferrit, Kabel und Stecker

ASSOCIATIONIEEE EMC SOCIETY CHAPTER GERMANY Frank Sabath, Federal Ministry of Defense, Armament Directorate IV 6, Am Steinberg 9, Garstedt 21441, Deutschland; +49 4173 58 17 20; Fax: +49 4173 58 17 21; [email protected]

NOTIFIED BODIESCETECOM GMBHIm Teelbruch 116, 45219 ESSEN, Deutschland; 49 (0) 20 54 95 283; Fax: 49 (0) 20 54 95 19 903; [email protected]; www.cetecom.de

EMC TEST NRW GMBHEmil-Figge-Straße 76, 44227 Dortmund, Deutschland; +49 231 9742750; Fax: +49 231 9742755; [email protected]; www.emc-test.de

EMCCERT DR. RASEK GMBHMoggast, Boelwiese 4-8, 91320 Ebermanstadt, Deutschland; +49 9194 9016; Fax: +49 9194 8125; [email protected]; www.emcc.de

EUROFINS PRODUCT SERVICE GMBHStorkower Straße 38C, 15526 Reichenwalde, Deutschland; +49 33 63 18 88 0; Fax: +49 33 63 18 88 660; [email protected]; www.eurofins.com

KRAUSS-MAFFEI WEGMANNGMBH & CO. KGAugust-Bode-Straße 1, 34127 Kassel, Deutschland; +49 561 105 0; Fax: +49 (561) 1052832; [email protected]; www.kmweg.de

MIKES-TESTING PARTNERS GMBHOhmstrasse 2-4, 94342 Strasskirchen, Deutschland; +49 (0) 9424 94810; Fax: +49 (0) 9424 9481240; [email protected]; www.mikes-testing-partners.com

MITSUBISHI ELECTRIC EUROPE B.V.Mündelheimer Weg 35, 40472 Düsseldorf, Deutschland; +49 211 17149712; Fax:+49 211 17149727; [email protected]; www.mitsubishielectric.de

OBERING BERG & LUKOWIAK GMBHLöhner Straße 157, 32609 Hüllhorst, Deutschland; +49 5744 9296 0; Fax: +49 5744 929615; [email protected]; www.obl-gmbh.de

Deutschland | Ressourcen


Schlöder GmbHHauptstrasse 71, D-75210, Keltern-Weiler, Deutschland; +49(0)7236 93960; Fax: +49(0)7236 939690;Friedrich Schloeder, [email protected]; www.schloeder-emv.de Produkte und Services: Testen, Testausstattung

Schwarzbeck Mess - ElektronikAn der Klinge 29, D 69250, Schönau, Deutschland; +49(0)6228 1001; Fax: +49(0)6228 1003;[email protected]; www.schwarzbeck.deProdukte und Services: Antennen, Testausstattung ServiceForce.Com GmbHKleyerstraße 92, 60326, Frankfurt am Main,Deutschland;+49(0)6936 50905500; www.serviceforce-com.deProdukte und Services: Testen

Siemens Energy & Automation EMC-CentreGuenther-Scharowsky-Str. 21,Erlangen, D-91058, Deutschland;+49(0)9131 732977; Fax: +49(0)9131 725007; [email protected]; www.automation.siemens.comProdukte und Services: Testen

SINUS Electronic GmbHSchiefweg 10, D-7427 Untereisesheim, Deutschland; +49(0)7132 99690; +49(0)7132 996950;[email protected]; www.sinus-electronic.deProdukte und Services: Filter, Überspannung und Einschaltstöße

Sonderhoff Chemicals GmbHRichard-Byrd-Straße 26, 50829 Köln, Deutschland; +49(0)2219 56850; Fax +49(0)2219 5685599;[email protected]; www.sonderhoff.comProdukte und Services: Testen

SOSHIN Electronics Europe GmbHWesterbachstrasse 32, D-61476, Kronberg im Taunus, Deutschland;+49(0)6173 993108; Fax: +49(0)6173 993206;www.soshin-ele.comProdukte und Services: Filter

Spitzenberger & Spies GmbH & CoSchmidstraße 32-34, D-94234, Viechtach, Deutschland; +49(0)9942 956 0;[email protected]; www.spitzenberger.de Produkte und Services: Verstärker, Testausstattung Statex Produktions & Vertriebs GmbHKleiner Ort 9, 28357 Bremen, Deutschland;+49(0)4212 750479; Fax: +49(0)4212 73643;[email protected]; www.statex.deProdukte und Services: Abgeschirmte Räume und Gehäuse, Abschirmung, Leitungsmaterialien

Stolberg HF-Technik AG Muensterau 168, 52224, Stolberg-Vicht, Deutschland; +49(0)2402 997770; Fax: +49(0)2402 99777900;Harald Landes, [email protected];www.stolberg-hf.comProdukte und Services: Verstärker, Kabel und Stecker, Testausstattung

T

Tactron Elektronik Bunsenstraße 5 / 11 Stock, 82152 Planegg, Deutschland; +49(0)8989 55690; Fax: +49(0)8985 77605;[email protected] TDK; www.tactron.deProdukte und Services: Software

TDK Electronics Europe Wanheimer Strasse 57, Dusseldorf, INTL, D-40472, Deutschland;+44(0)1344 381515;Stuart Jackson; [email protected];www.tdk-europe.comProdukte und Services: Verstärker, Antennen, Ferrit, Filter, Abgeschirmte Räume und Gehäuse, Abschirmung, Testausstattung, Testen

Tech-Etch, Inc.Feuerherdt GmbH, Motzener Str. 26 b, 12277 Berlin, Deutschland;+49(0)30 710 96 45 53; Fax: +49(0)30 710 96 45 99; [email protected]; www.tech-etch.comProdukte und Services: Leitungsmaterialien, Ab-schirmung

Telemeter Electronic GmbHJoseph-Gansler-Straße 10,D-86609 Donauworth, Deutschland;+49(0)9067 06930; Fax: +49(0)9067 069350;[email protected]; www.telemeter.infoProdukte und Services: Testen,HF-und Mikrowellen


TESTEC Elektronik GmbHWesterbachstr. 58,60489 Frankfurt am Main, Deutschland;+49(0)6994 33350; Fax: +49(0)6994 333555;[email protected]; www.testec.deProdukte und Services: Testausstattung

Teseq GmbHLandsberger Strasse 255, 12623 Berlin, Deutsch-land; +49 (0) 3056 598835; Fax: +49 (0) 3056 598834;[email protected]; www.teseq.deProduk te und Ser vices : Vers tärker (HF & Mikrowellen), Antennen, Automotive Systeme, leitungsgebundene Störfestigkeit, leitungsgebun-dene Überspannung & schnelle Transienten, ESD, Netzoberwellen & Flicker, GTEM Zellen, HF Immu-nitäts- und Emissionssysteme, HF Testsoftware, Kalibration & Service

THORA Elektronik GmbHEsbacher Weg 13, D-91555 Feuchtwangen,+49 (0) 98 52 6 10 79-0; Fax: +49 (0) 98 52 6 10 79-50; [email protected]; www.thora.comProdukte und Services: Ferrit, Connectors

TTV GmbHSudetenstr. 53, 82538 geretsried, Deutschland; +49(0)8171 34690; Fax: +49(0)8171 346929;[email protected]; www.go-ttv.comProdukte und Services: Filter

TÜV SÜD SENTON GmbH Äußere Frühlingstraße 45,94315 Straubing, Deutschland;+49(0)9421 552222; Fax: +49(0)9421 552299;Stefan Kammerl; [email protected];www.tuev-sued.de/sentonProdukte und Services: Testen

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Vacuumschmelze GmbHGrüner Weg 37, Hanau, D-63450, Deutschland;+49 6181 38-0; Fax: +49(0)6181 382645; [email protected];www.vacuumschmelze.comProdukte und Services: Produkte

W

Würth Elektronik GmbH &Co. KGSalzstraße 21, 74676 Niedernhall, Deutschland;+49 (0) 79 40 946 - 0; Fax: +49 (0) 79 40 946 - 55 00 00; Alexander Gerfer, [email protected];www.we-online.deProdukte und Services: Ferrit, Kabel und Stecker

ASSOCIATIONIEEE EMC SOCIETY CHAPTER GERMANY Frank Sabath, Federal Ministry of Defense, Armament Directorate IV 6, Am Steinberg 9, Garstedt 21441, Deutschland; +49 4173 58 17 20; Fax: +49 4173 58 17 21; [email protected]

NOTIFIED BODIESCETECOM GMBHIm Teelbruch 116, 45219 ESSEN, Deutschland; 49 (0) 20 54 95 283; Fax: 49 (0) 20 54 95 19 903; [email protected]; www.cetecom.de

EMC TEST NRW GMBHEmil-Figge-Straße 76, 44227 Dortmund, Deutschland; +49 231 9742750; Fax: +49 231 9742755; [email protected]; www.emc-test.de

EMCCERT DR. RASEK GMBHMoggast, Boelwiese 4-8, 91320 Ebermanstadt, Deutschland; +49 9194 9016; Fax: +49 9194 8125; [email protected]; www.emcc.de

EUROFINS PRODUCT SERVICE GMBHStorkower Straße 38C, 15526 Reichenwalde, Deutschland; +49 33 63 18 88 0; Fax: +49 33 63 18 88 660; [email protected]; www.eurofins.com

KRAUSS-MAFFEI WEGMANNGMBH & CO. KGAugust-Bode-Straße 1, 34127 Kassel, Deutschland; +49 561 105 0; Fax: +49 (561) 1052832; [email protected]; www.kmweg.de

MIKES-TESTING PARTNERS GMBHOhmstrasse 2-4, 94342 Strasskirchen, Deutschland; +49 (0) 9424 94810; Fax: +49 (0) 9424 9481240; [email protected]; www.mikes-testing-partners.com

MITSUBISHI ELECTRIC EUROPE B.V.Mündelheimer Weg 35, 40472 Düsseldorf, Deutschland; +49 211 17149712; Fax:+49 211 17149727; [email protected]; www.mitsubishielectric.de

OBERING BERG & LUKOWIAK GMBHLöhner Straße 157, 32609 Hüllhorst, Deutschland; +49 5744 9296 0; Fax: +49 5744 929615; [email protected]; www.obl-gmbh.de


Ressourcen | Deutschland


PANASONIC CUSTOMERSERVICES EUROPE Winsbergring 15, 22525 Hamburg, Deutschland; +49 40 8549 359 0; Fax: +49 40 8549 2500; [email protected]; www.panasonic.de

PHOENIX TESTLAB GMBHKöningswinkel 10, 32825 Blomberg, Deutschland; +49 5235 9500 0; Fax: +49 5235 9500 20; [email protected]; www.phoenix-testlab.de

SGS GERMANY GMBHZERTIFIZIERUNGSSTELLE MÜNCHENHofmannstraße 50 81379 München, Deutschland; +49 89 787475132; Fax: +49 89 787475122; [email protected]; www.sgs-cqe.de

SIEMENS AGSan-Carlos-Straße 7, 91058 Erlangen,

Deutschland +49 9131 733177; Fax:+49 9131 733265; [email protected]; www.siemens.de

SLG PRÜF UND ZERTIFIZIERUNGS GMBHBurgstädter Strasse 20, 09232 Hartmannsdorf, Deutschland; +49 (0) 3722 7323 0; Fax:+49 (0) 3722 7323-899; [email protected]; www.slg.de.com

SONY DEUTSCHLAND GMBHHedelfinger Straße 61, 70327 Stuttgart, Deutschland; +49 (0) 711 5858 0; Fax: +49 (0) 711 5858 235; [email protected]; www.stuttgart.sony.de

TÜV RHEINLAND LGA PRODUCTS GMBHTillystraße 2, 90431 Nürnberg, Deutschland; +49 0911 6555227; Fax: +49 221 806 3935; ksc@

de.tuv.com; www.de.tuv.com

TÜV SÜD PRODUCT SERVICE GMBHRidlerstraße 65, 80339 München, Deutschland; +49 (0) 89 5008 40; Fax: +49 (0) 89 5008 4222 [email protected]; ww.tuev-sued.de/ps

TÜV TECHNISCHE ÜBERWACHUNG HESSEN GMBHRüdesheimer Straße, 119, 64285 Darmstadt, Deutschland; +49 651 600 109; Fax: +49 6151 600 666; [email protected]; www.tuev-hessen.de

VDE - PRÜF- UND ZERTIFIZIERUNGSINSTITUT GMBHMerianstraße, 28, 63069 Offenbach (AM MAIN), Deutschland; +49 069 8306 0; Fax: +49 069 8306 555; [email protected]; www.vde.com

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STEPHAN BRAUN, ARND FRECHFoundersGAUSS INSTRUMENTS GmbH

I. EINLEITUNG

DURCH DIE Erweiterung der Fachgrundnorm CISPR 16-1-1 um Spektrumanalysatoren sowie um das “FFT-based Measuring Instru-ment” wurden die Weichen für den Technolo-giewechsel gestellt. Der Einsatz des Spektru-manalysators für EMV Messungen wurde in die Fachgrundnorm aufgenommen um primär

stationäre EMV Emissionen, wie sie z.B. von einem PC existieren kostengünstig und schnell messen zu können. Das FFT-based Measuring Instrument hingegen wurde in die Fachgrundnorm aufgenommen, um komplexe Störer mit höhere Zuverlässigkeit und höherer Geschwindigkeit zu analysieren und messen zu können. Durch die Digital-isierung der Messgeräte stehen mittlerweile verschiedene Verfahren zur Verfügung um einen Messempfänger zu re-alisieren. Zum einen existieren klassische Messempfänger, welche schmalbandig heruntermischen, durchgestimmt werden und die Messung an je einem Frequenzpunkt durchführen. Des weiteren existieren Basisbandmess-geräte welche mit sehr leistungsf ähigen Gigasamples A/D Wandlern und FPGAs ausgestattet sind[2], und die eigentliche Messung, d.h. Emulation eines Messempfängers oder Spektrumanalyzers, voll digital an mehreren tausend Frequenzpunkten durchgeführt werden. Als Brückentech-nologie gibt es noch Messempfänger mit einer breiteren Zwischenfrequenz, typischerweise ca. 25 MHz welche die Auswertung über diesen Bandbereich durchführen, und einzelne Bänder sequentiell durchmessen und diese zu einem Spektrum zusammensetzen.

Allerdings stellt die CISPR 16-1-1 höchste Anforderun-gen an derartige Messgeräte hinsichtlich der Dynamik für breitbandige Störungen. Die zentrale Herausforderung ist die Dynamik für Pulse im Band C mit niedriger Pulswieder-holrate und Quasi-Spitzenwert Bewertung bereitzustellen. Zum erreichen dieser Dynamik werden unterschiedliche Konzepte eingesetzt. Bei breitbandigen Messsystemen werden mehrstufi ge A/D Wandlersystem eingesetzt um die Dynamik zu verbessern. Bei Messempfänger wird dies durch Vorselektion erreicht.

In diesem Artikel wird eine Übersicht an die Anforde-


Deutschland

Anforderungen der CISPR 16-1-1 an Messempfänger, Spektrumanalysatoren

und FFT-basierende Messinstrumente

Braun_GER_EEG13.indd 6 11/16/12 4:03 PM

STEPHAN BRAUN, ARND FRECHFoundersGAUSS INSTRUMENTS GmbH

I. EINLEITUNG

DURCH DIE Erweiterung der Fachgrundnorm CISPR 16-1-1 um Spektrumanalysatoren sowie um das “FFT-based Measuring Instru-ment” wurden die Weichen für den Technolo-giewechsel gestellt. Der Einsatz des Spektru-manalysators für EMV Messungen wurde in die Fachgrundnorm aufgenommen um primär

stationäre EMV Emissionen, wie sie z.B. von einem PC existieren kostengünstig und schnell messen zu können. Das FFT-based Measuring Instrument hingegen wurde in die Fachgrundnorm aufgenommen, um komplexe Störer mit höhere Zuverlässigkeit und höherer Geschwindigkeit zu analysieren und messen zu können. Durch die Digital-isierung der Messgeräte stehen mittlerweile verschiedene Verfahren zur Verfügung um einen Messempfänger zu re-alisieren. Zum einen existieren klassische Messempfänger, welche schmalbandig heruntermischen, durchgestimmt werden und die Messung an je einem Frequenzpunkt durchführen. Des weiteren existieren Basisbandmess-geräte welche mit sehr leistungsf ähigen Gigasamples A/D Wandlern und FPGAs ausgestattet sind[2], und die eigentliche Messung, d.h. Emulation eines Messempfängers oder Spektrumanalyzers, voll digital an mehreren tausend Frequenzpunkten durchgeführt werden. Als Brückentech-nologie gibt es noch Messempfänger mit einer breiteren Zwischenfrequenz, typischerweise ca. 25 MHz welche die Auswertung über diesen Bandbereich durchführen, und einzelne Bänder sequentiell durchmessen und diese zu einem Spektrum zusammensetzen.

Allerdings stellt die CISPR 16-1-1 höchste Anforderun-gen an derartige Messgeräte hinsichtlich der Dynamik für breitbandige Störungen. Die zentrale Herausforderung ist die Dynamik für Pulse im Band C mit niedriger Pulswieder-holrate und Quasi-Spitzenwert Bewertung bereitzustellen. Zum erreichen dieser Dynamik werden unterschiedliche Konzepte eingesetzt. Bei breitbandigen Messsystemen werden mehrstufi ge A/D Wandlersystem eingesetzt um die Dynamik zu verbessern. Bei Messempfänger wird dies durch Vorselektion erreicht.

In diesem Artikel wird eine Übersicht an die Anforde-


Deutschland

Anforderungen der CISPR 16-1-1 an Messempfänger, Spektrumanalysatoren

und FFT-basierende Messinstrumente

Braun_GER_EEG13.indd 6 11/16/12 4:03 PM ADs_EEG13.indd 21 11/16/12 2:46 PM

Deutschland


rungen von Messgeräten hinsichtlich der erweiterten Norm CISPR 16-1-1 gegeben. Dabei werden die Heraus-forderungen, Lösungsansätze sowie mögliche Grenzen diskutiert. Auch neuere Verfahren wie Noise Floor Extension (NFE) werden hinsichtlich Chancen und Risiken diskutiert.

II. FUNKSTÖRMESSEMPFÄNGER UND SPEKTRUMANALYSATOREN

Funkstörmessempfänger messen das Emissionssignal im Frequenz-bereich. Die Messung erfolgt dabei sequentiell an mehreren tausend Fre-quenzpunkten. Bis heute ist der Einsatz von Superheterodynempfängern weit verbreitet. Ein Blockdiagramm eines konventionellen Superheterodynemp-fängers ist in Abbildung 1 dargestellt. Eine Vorselektion unterdrückt Signale außerhalb des Bandes, in welchem die Messungen durchgeführt werden. Dadurch wird die Dynamik, insbesondere für breitbandige Störungen im Vergleich zu Spektrumanalysatoren erhöht. Ein Mischer, sowie ein Überlagerungsoszillator füh-

ren eine Frequenzkonversion zu einer Zwisch-enfrequenz durch. Das Signal wird durch das ZF-Filter bandpassgefiltert. Das ZFFilter muss die Selektivität nach CISPR 16-1-1 einhalten. Das Ausgangssignal wird gewichtet mittels eines Spit-zenwert, Quasi-Spitzenwert, Mittelwert, CISPR-AVG, CISPRAVG - RMS Detektors. Üblicherweise wird das ZF-Signal sIF auch analog bereitgestellt. Spektrumanalysatoren können einen gesweepten Scan durchführen und benutzen üblicherweise eine Video Filter zur Mittelwertbildung. Man spricht hier von einer logarithmischen Mittelwertbildung.

III. EMV-ZEITBEREICHSMESSSYSTEMBeim EMV-Zeitbereichsmesssystem wird das

Eingangssignal mittels einer Analog-Digital-Wandler-Einheit zur Messung im Frequenzbereich 9 kHz - 1 GHz abgetastet und digitalisiert. Für Mes-sungen oberhalb 1 GHz erfolgt eine breitbandige Frequenzumsetzung. Die spektrale Berechnung erfolgt mittels Kurzzeit-FFT. Ein Blockschaltbild eines EMVZeitbereichsmesssystems ist in Ab-bildung 2 dargestellt. Für gestrahlte Emissions-messung verwendet man typischerweise eine breitbandige logarithmisch-periodische Antenne. Alternativ können Messungen mittels Absorber-zange oder Netznachbildung durchgeführt werden. Zur Untersuchung der Einkopplung an Antennen im KFZ kann das EMVZeitbereichsmesssystem direkt angeschlossen werden. Das Eingangssignal wird mittels eines mehrstufigen Analog- Digital-Wandler-Systems digitalisiert. Durch das mehr-stufige Analog-Digital-Wandler-System erfolgt die Digitalisierung in eine Gleitkommazahl [1]. Dies erlaubt es, einen äquivalenten Dynamikbereich

Fig. 1: Konventioneller Superheterodynempfänger

Fig. 2: EMV-Zeitbereichsmesssystem


Deutschland


rungen von Messgeräten hinsichtlich der erweiterten Norm CISPR 16-1-1 gegeben. Dabei werden die Heraus-forderungen, Lösungsansätze sowie mögliche Grenzen diskutiert. Auch neuere Verfahren wie Noise Floor Extension (NFE) werden hinsichtlich Chancen und Risiken diskutiert.

II. FUNKSTÖRMESSEMPFÄNGER UND SPEKTRUMANALYSATOREN

Funkstörmessempfänger messen das Emissionssignal im Frequenz-bereich. Die Messung erfolgt dabei sequentiell an mehreren tausend Fre-quenzpunkten. Bis heute ist der Einsatz von Superheterodynempfängern weit verbreitet. Ein Blockdiagramm eines konventionellen Superheterodynemp-fängers ist in Abbildung 1 dargestellt. Eine Vorselektion unterdrückt Signale außerhalb des Bandes, in welchem die Messungen durchgeführt werden. Dadurch wird die Dynamik, insbesondere für breitbandige Störungen im Vergleich zu Spektrumanalysatoren erhöht. Ein Mischer, sowie ein Überlagerungsoszillator füh-

ren eine Frequenzkonversion zu einer Zwisch-enfrequenz durch. Das Signal wird durch das ZF-Filter bandpassgefiltert. Das ZFFilter muss die Selektivität nach CISPR 16-1-1 einhalten. Das Ausgangssignal wird gewichtet mittels eines Spit-zenwert, Quasi-Spitzenwert, Mittelwert, CISPR-AVG, CISPRAVG - RMS Detektors. Üblicherweise wird das ZF-Signal sIF auch analog bereitgestellt. Spektrumanalysatoren können einen gesweepten Scan durchführen und benutzen üblicherweise eine Video Filter zur Mittelwertbildung. Man spricht hier von einer logarithmischen Mittelwertbildung.

III. EMV-ZEITBEREICHSMESSSYSTEMBeim EMV-Zeitbereichsmesssystem wird das

Eingangssignal mittels einer Analog-Digital-Wandler-Einheit zur Messung im Frequenzbereich 9 kHz - 1 GHz abgetastet und digitalisiert. Für Mes-sungen oberhalb 1 GHz erfolgt eine breitbandige Frequenzumsetzung. Die spektrale Berechnung erfolgt mittels Kurzzeit-FFT. Ein Blockschaltbild eines EMVZeitbereichsmesssystems ist in Ab-bildung 2 dargestellt. Für gestrahlte Emissions-messung verwendet man typischerweise eine breitbandige logarithmisch-periodische Antenne. Alternativ können Messungen mittels Absorber-zange oder Netznachbildung durchgeführt werden. Zur Untersuchung der Einkopplung an Antennen im KFZ kann das EMVZeitbereichsmesssystem direkt angeschlossen werden. Das Eingangssignal wird mittels eines mehrstufigen Analog- Digital-Wandler-Systems digitalisiert. Durch das mehr-stufige Analog-Digital-Wandler-System erfolgt die Digitalisierung in eine Gleitkommazahl [1]. Dies erlaubt es, einen äquivalenten Dynamikbereich

Fig. 1: Konventioneller Superheterodynempfänger

Fig. 2: EMV-Zeitbereichsmesssystem


DeutschlandBraun, Frech


von ca. 20 Bit zu erreichen. Damit ist es möglich eine hohe Sensistivität von ca. −20 dBμV (Band B) zu erreichen und gleichzeitig Pulse von mehreren Volt zu erfassen. Mittels leistungsfähiger FPGAs mit einer Rechenleistung, welche ca. 20 handelsüblichen PCs entspricht, erfolgt die Auswer-tung in einer Bandbreite von 162,5 MHz vollständig lücken-los in Echtzeit. Ein derartiges EMVZeitbereichsmesssystem wurde erstmalig in [2] vorgestellt. Die Messung konnte hierbei um einen Faktor 1000 beschleunigt werden. Das EMV Zeitbereichsmessystem bis 1 GHz arbeitet über den gesamten Frequenzbereich mit Basisbandabtas-tung und reduziert die Messzeit um bis zu einen Faktor 4000. Das System bis 40G mit zusätzlicher Frequenzumsetzung deckt den Frequenzbereich 10 Hz - 40 GHz ab.

A. Kurzzeit-FFTDie Kurzzeit-FFT wird als eine FFT-Berechnung

über einen begrenzten Abschnitt verstanden, welche im Zeitbereich verschoben wird. Mittels Kurzzeit-FFT wird ein Spektrogramm berechnet, welches einer Darstellung des Spektrums über der Zeit entspricht. Während stationäre Signale ein konstantes Spektrum über der Zeit aufweisen, zeigt sich beim Spektrogramm das instationäre Verhalten des Störsignals.

Die mathematische Definition der Kurzzeit-FFT ist gegeben durch:

(1) Z[m, k] = N-1

n-0

−j2π knN∑ x[n]w[n − m]e

Da die Fensterfunktion w[n] symmetrisch ist, exis-tieren mehrere Möglichkeiten Gl. 1 umzuformen. Zur realen Berechnung erfolgt die Umwandlung derart, dass nicht die Fensterfunktion verschoben wird, sondern das Eingangssignal. Weitere Ver-einfachungen sind möglich, insbesondere für die Applikation der Störemssionsmessung, da hier die Phase nicht weiter ausgewertet wird. w[n] ist die Fensterfunktion, welche das ZF-Filter eines Mes-sempfängers nachbildet [3].

B. Vergleich zu einem konventionellen Messemfänger

Es ist aus der Literatur bekannt, dass die Kurzzeit-FFT äquivalent zu einer Anordnung von Basisbandmischern und einer Filterbank ist [4],[5]. Die Kurzzeit-FFT kann ebenfalls aus einer Anordnung einer Filterbank hergeleitet [6] werden.

Ein Blockschaltbild einer derartigen Anordnung ist in Abbildung 3 dargestellt. Das Verhältnis des Dezimators ist gegeben durch:

Fig. 3. Filterbank

Fig. 4. Bewertungskurven gem¨aß CISPR Anforderungen

100 101 102 103 104−15

−10

−5

0

5

10

15

20

25

30CISPR 16TDEMI

Rela

tive I

nput

Lev

el fo

r con

stant

Indi

catio

n

Pulse Repetition Frequency [Hz]

Band A

Band B

Band C/D


Deutschland


(2) M = fs/fs b b

wobei fs die Abtastrate des Analog-Digital-Wandlers ist und fs b b die in-verse Schrittweite der Kurzzeit-FFT, welche der Basisbandabtastfrequenz entspricht. W[ f ] ist die diskretisierte Übertragungsfunktion. Die Basisband-abtastfrequenz fs b b muss so groß sein, dass die Nyquistbedingung im Basis-band beispielsweise bei der digitalen Implementierung des Quasispitzenwertdetektors eingehalten wird. Ein zu geringe Abtastrate führt zu Messfehlern bei transienten Signalen.

C. Messungen oberhalb der NyquistfrequenzTypischerweise ist die Abtastrate verfügbarer Analog-

Digital-Wandler um eine Größenordnung niedriger, als die verfügbaren Frequenzbereiche von Mischern. Eine Kombination von einer sehr breitbandigen Konversion-seinheit [7], welche den Frequenzbereich bis 40 GHz in den Bereich unterhalb 1 GHz mischt, wird verwendet, um Messungen oberhalb der Nyquistfrequenz zu ermöglichen. Mittlerweile existieren EMV Zeitbereichsmesssysteme bis 40 GHz. Damit sind Messungen nach den Normen CISPR 16-1-1, MIL461F sowie DO160 möglich.

D. VorselektionBreitbandige EMV Zeitbereichsmesssysteme verfügen

zusätzlich über eine Vorselektion mit einer Bandbreite von 300 MHz. Hierdurch wird zusätzlich zum mehrstufigen A/D Wandlersystem die Dynamik verbessert. Die Vorselek-tion befindet sich vor dem mehrstufigen A/D Wandlersys-tem mit integriertem 20 dB Vorverstärker.

IV. MESSEMPFÄ NGER MIT BREITBANDIGER ZFNeben den sehr breitbandingen ÉMV Zeitbereichs-

messssytemen existieren auch frequenzumsetzende Messgeräte, welche eine breitbandige ZF verwenden, das ZF Signals mittels eines A/D Wandlers digitalisieren und die Berechnung der Kurzzeit Fourier Transformation in Segmenten von maximal 25 MHz durchführen.

V. ANFORDERUNGEN DER NORM CISPR 16-1-1Die CISPR 16-1-1 [8] verlangt ein bestimmtes Anzei-

geverhalten eines Instruments für unterschiedliche Prüf-signale. Man unterscheidet zwischen:

• Anzeigeverhalten für Sinus und Pulsfolgen• Anforderungen an die Dynamik• Anforderungen für Ein- und Ausgänge

A. Anzeigeverhalten für Sinus und PulsfolgenEin Messgerät gemäß CISPR 16-1-1 muss eine Sinusan-

zeigenauigkeit von +/-2 dB erfüllen. Darüber hinaus muss je nach Detektor ein bestimmter relativer Anzeigewert zu einem Sinussignal erreicht werden. Weiter müssen die Bewertungskurven, welche eine Änderung der Anzeige hin-sichtlich der Pulswiederholrate fordert eingehalten werden. Ein Beispiel für die Bänder A,B,C und D ist in Abbildung 4 dargestellt. Die Abweichungen sind deutlich niedriger als die zulässigen Toleranzen.

B. Anforderungen an die DynamikFür alle Messgeräte gelten die gleichen Anforderungen

hinsichtlich Dynamik. Für den eingeschränkten Einsatz des Spektrumanalysators sind hierbei Erleichterungen vorgesehen.

Bei Messempfängern und Messempfängern mit breiter ZF wird die Dynamik durch den 1 dB Kompressionspunkt des Systems bestimmt. Des weiteren wird für Pulse die Dynamik maßgeblich durch die Bandbreite der Vorselek-tion bestimmt.

Bei Basisbandsystemen, wird die Dynamik für Sinus-signale mit dem Aussteuerbereich des ersten A/D Wandler und die Dynamik für Breitbandpulse durch den gesamten Ausstuerbereich des Gleitkomma A/D Wandlersystems bestimmt.

Im folgenden wollen wir die Anforderungen an die Dy-namik zunächst allgemein und dann für konkrete Beispiele darstellen. Hierbei benutzen wir die Anforderungen des Band C gemäß CISPR 16-1-1. Üblicherweise besitzen Mes-sempfänger bei aktiviertem Vorstärker von 20 dB einen Rauschboden von ca. -7 dBuV bei Bewertung mit dem Mit-telwert Detektor. Für den Quasispitzenwertdetektor ergibt sich ein Rauschboden von 0 dBuV.

Die Referenz für die Anzeige des Quasispitzenwertde-tektors liegt bei 100 Hz. Hierbei muss der Anzeigewert 31.5 dB höher sein, als für einen Einzelimpuls. Umgekehrt bedeutet dies, dass der Einzelimpuls mit ausreichenden Abstand über dem Rauschboden liegen muss. Um eine Überhöhung des Rauschens zu verhindern, sollte zumind-est ein Signal- Rausch-Abstand von 10 dB vorhanden sein. Ferner muss zusätzlich ein Dynamikreserve in der Höhe der

ANFORDERUNGEN AN DIE PULSDYNAMIK

Messempfänger: Schmalbandig Breite ZF ZB-System

Bimp 1 GHz 1 GHz 1 GHz

Bpre 7 MHz 70 MHz 300MHz

Dext 43.1 dB 23.1 dB 10.5dB

V1dB 58 mV 590 mV 2.5 V

P1dBmin -14.6 dBm 5.4 dBm 18 dBm

P1dBmino.V. +4.6 dBm +25.4 dBm enfällt

Fig. 5. CISPR 16-1-1 Puls im Band B, Analoger Messempfänger

0 5 10 15 20 25 3034

35

36

37

38

39

40

41

42

Frequency / MHz

Leve

l / d

BµV

Analogue EMI−Receiver

CISPR 16−1−1 40 dBuVCISPR 16−1−1 39 dBuVCISPR 16−1−1 38 dBuV


Deutschland


(2) M = fs/fs b b

wobei fs die Abtastrate des Analog-Digital-Wandlers ist und fs b b die in-verse Schrittweite der Kurzzeit-FFT, welche der Basisbandabtastfrequenz entspricht. W[ f ] ist die diskretisierte Übertragungsfunktion. Die Basisband-abtastfrequenz fs b b muss so groß sein, dass die Nyquistbedingung im Basis-band beispielsweise bei der digitalen Implementierung des Quasispitzenwertdetektors eingehalten wird. Ein zu geringe Abtastrate führt zu Messfehlern bei transienten Signalen.

C. Messungen oberhalb der NyquistfrequenzTypischerweise ist die Abtastrate verfügbarer Analog-

Digital-Wandler um eine Größenordnung niedriger, als die verfügbaren Frequenzbereiche von Mischern. Eine Kombination von einer sehr breitbandigen Konversion-seinheit [7], welche den Frequenzbereich bis 40 GHz in den Bereich unterhalb 1 GHz mischt, wird verwendet, um Messungen oberhalb der Nyquistfrequenz zu ermöglichen. Mittlerweile existieren EMV Zeitbereichsmesssysteme bis 40 GHz. Damit sind Messungen nach den Normen CISPR 16-1-1, MIL461F sowie DO160 möglich.

D. VorselektionBreitbandige EMV Zeitbereichsmesssysteme verfügen

zusätzlich über eine Vorselektion mit einer Bandbreite von 300 MHz. Hierdurch wird zusätzlich zum mehrstufigen A/D Wandlersystem die Dynamik verbessert. Die Vorselek-tion befindet sich vor dem mehrstufigen A/D Wandlersys-tem mit integriertem 20 dB Vorverstärker.

IV. MESSEMPFÄ NGER MIT BREITBANDIGER ZFNeben den sehr breitbandingen ÉMV Zeitbereichs-

messssytemen existieren auch frequenzumsetzende Messgeräte, welche eine breitbandige ZF verwenden, das ZF Signals mittels eines A/D Wandlers digitalisieren und die Berechnung der Kurzzeit Fourier Transformation in Segmenten von maximal 25 MHz durchführen.

V. ANFORDERUNGEN DER NORM CISPR 16-1-1Die CISPR 16-1-1 [8] verlangt ein bestimmtes Anzei-

geverhalten eines Instruments für unterschiedliche Prüf-signale. Man unterscheidet zwischen:

• Anzeigeverhalten für Sinus und Pulsfolgen• Anforderungen an die Dynamik• Anforderungen für Ein- und Ausgänge

A. Anzeigeverhalten für Sinus und PulsfolgenEin Messgerät gemäß CISPR 16-1-1 muss eine Sinusan-

zeigenauigkeit von +/-2 dB erfüllen. Darüber hinaus muss je nach Detektor ein bestimmter relativer Anzeigewert zu einem Sinussignal erreicht werden. Weiter müssen die Bewertungskurven, welche eine Änderung der Anzeige hin-sichtlich der Pulswiederholrate fordert eingehalten werden. Ein Beispiel für die Bänder A,B,C und D ist in Abbildung 4 dargestellt. Die Abweichungen sind deutlich niedriger als die zulässigen Toleranzen.

B. Anforderungen an die DynamikFür alle Messgeräte gelten die gleichen Anforderungen

hinsichtlich Dynamik. Für den eingeschränkten Einsatz des Spektrumanalysators sind hierbei Erleichterungen vorgesehen.

Bei Messempfängern und Messempfängern mit breiter ZF wird die Dynamik durch den 1 dB Kompressionspunkt des Systems bestimmt. Des weiteren wird für Pulse die Dynamik maßgeblich durch die Bandbreite der Vorselek-tion bestimmt.

Bei Basisbandsystemen, wird die Dynamik für Sinus-signale mit dem Aussteuerbereich des ersten A/D Wandler und die Dynamik für Breitbandpulse durch den gesamten Ausstuerbereich des Gleitkomma A/D Wandlersystems bestimmt.

Im folgenden wollen wir die Anforderungen an die Dy-namik zunächst allgemein und dann für konkrete Beispiele darstellen. Hierbei benutzen wir die Anforderungen des Band C gemäß CISPR 16-1-1. Üblicherweise besitzen Mes-sempfänger bei aktiviertem Vorstärker von 20 dB einen Rauschboden von ca. -7 dBuV bei Bewertung mit dem Mit-telwert Detektor. Für den Quasispitzenwertdetektor ergibt sich ein Rauschboden von 0 dBuV.

Die Referenz für die Anzeige des Quasispitzenwertde-tektors liegt bei 100 Hz. Hierbei muss der Anzeigewert 31.5 dB höher sein, als für einen Einzelimpuls. Umgekehrt bedeutet dies, dass der Einzelimpuls mit ausreichenden Abstand über dem Rauschboden liegen muss. Um eine Überhöhung des Rauschens zu verhindern, sollte zumind-est ein Signal- Rausch-Abstand von 10 dB vorhanden sein. Ferner muss zusätzlich ein Dynamikreserve in der Höhe der

ANFORDERUNGEN AN DIE PULSDYNAMIK

Messempfänger: Schmalbandig Breite ZF ZB-System

Bimp 1 GHz 1 GHz 1 GHz

Bpre 7 MHz 70 MHz 300MHz

Dext 43.1 dB 23.1 dB 10.5dB

V1dB 58 mV 590 mV 2.5 V

P1dBmin -14.6 dBm 5.4 dBm 18 dBm

P1dBmino.V. +4.6 dBm +25.4 dBm enfällt

Fig. 5. CISPR 16-1-1 Puls im Band B, Analoger Messempfänger

0 5 10 15 20 25 3034

35

36

37

38

39

40

41

42

Frequency / MHz

Leve

l / d

BµV

Analogue EMI−Receiver

CISPR 16−1−1 40 dBuVCISPR 16−1−1 39 dBuVCISPR 16−1−1 38 dBuV




Schritte des Abschwächers vorgesehen werden. Damit ergibt sich ohne die Dynamikreserve die Anforderung, dass der Messempfänger mit aktiviertem Vorverstärker zumindest Pulse mit einem Anzeigepegel von 41,5 dBuV im Band C korrekt und 0 dB Abschwächung darstellen können muss. Ein Pulsgenerator nach CISPR 16-1-1 welcher eine Anzeige von 60 dBuV am Messempfänger bei 100 Hz erzeugt, hat eine Impulsfläche von 0,044 uVs, eine Pulsbreite von 300 ps und demzufolge eine Pulsspannung von 146 V. Daraus ergibt sich für die Anzeige von 41,5 dBuV eine Pulsspannung von ca. 8.4 V. Ein komplett breitbandiges Messgerät ohne jegliche Vorselektion müsste daher einen 1 dB Kompressionpunkt von 28,5 dBm aufweisen.

Durch den Einsatz der Vorselektion wird diese Anforderung verringert. Hierbei wird die Dynami-kanforderung gemäß der Formel

(3) Dext = 20log10( BimpBpre

)

abgesenkt.Im folgenden sind die Anforderungen f ¨ur

einen traditionellen Messempfänger mit schmaler Vorselektion, einem Messempfänger mit breiter ZF und breiter Vorselektion sowie dem EMV Zeitbe-reichsmesssystem (ZB-System) welches breitbandig arbeitet für das Band C dargestellt.

Die Anforderungen werden durch die Vorsele-ktion bei schmalbandigen Messempfängern um ca. 43 dB verringert, so dass sich am Eingang des Vorverstärkers eine Anforderung an den 1 dB Kompressionspunkt von -14.6 dBm bzw. 92.4 dBuV ergibt. Am Mischer üblicherweise 4.6 dBm. Dies stellt keine größeren Herausforderungen an das Messgerät dar. Die technische Herausforderung besteht bei diesen Messgeräten an die Realisierung der Vorselektion.

Bei Messemfängern mit breiter Zwischenfre-quenz ergeben sich deutlich höhere Anforderun-gen, welche zum Teil von den Messgeräten nicht mehr vollständig eingehalten werden können. Derartige Messgeräte können aber mit der Er-leichterung um ca. 15 dB nach CISPR 16-1-1 2010

für bestimmte Messungen eingesetzt werden. Messgeräte, welche in der Lage sind einen 1 dB Kompressionpunkt von ca. 25 dBm bei ausgeschaltetem Verstärker bereit zu stellen, können für full Compliance Messungen eingesetzt werden. Die Dynamik kann gegebenenfalls durch Verfahren wie Noise Floor Extension oder gezielte Übersteuerung des Mischers und digitale Korrektur verbessert werden. Allerdings können derartige Verfahren zu Unterschieden

Fig. 7. Anwendung von Noise Floor Extension

18 18.5 19 19.5 20 20.5 21 21.5 22−16

−14

−12

−10

−8

−6

−4

−2

0

2

Frequency / MHz

Leve

l / d

BµV

OriginalNFE

Fig. 6. Spektrogrammdarstellung einer Folge von Pulsen


Deutschland


bei realen Prüfungen und damit zu Fehlmessungen führen.Bei breitbandigen Messgeräten besteht die Herausfor-

derung darin, eine sehr hohe Dynamik mit Vorverstärker von 18 dBm am Eingang zu erreichen. Diese Anforderung wird durch einen Leistungsteiler und ein mehrkanaliges A/D Wandlersystem erreicht. Dabei existieren hohe An-forderungen an die Linearität. Typischerweise haben diese Messgeräte einen Aussteuerbereich bis ca. 5 V. Damit besitzt man noch Dynamikreserven von ca. 6 dB.

C. Anforderungen an die Dynamik für SpektrumanalysatorenSpektrumanalysatoren verfügen üblicherweise über

eine Vorselektion, welche nur zur Unterdrückung von unerwünschten Mischprodukten verwendet wird. Im Gegensatz zum Messempfänger ist diese nicht primär für die Erhöhung der Dynamik entwickelt worden. Allerdings haben hochwertige Spektrumanalysatoren einen hohen 1 dB Kompressionspunkt von ca. 13 dBm. Die Norm CISPR 16-1-1 Ed 2010 hat diesen Umstand berücksichtigt und erlaubt die Verwendung für Spektrumanalysatoren bei Prüflingen, deren Pulswiederholrate derart hoch ist, dass die Dynamik des Spektrumanalysators ausreichend ist. Es dürfen Prü-flinge mit einer Pulswiederholrate, welche größer als 20 Hz ist gemessen werden. Gleichzeitig muss die Dynamik des Spektrumanalyzers die Norm CISPR 16-1-1 für Pulswie-derholraten von mehr als 20 Hz einhalten. Dies entspricht einer Erleichtung um ca. 23 dB. Spektrumanalysatoren mit

hoher Performance stellen hier ausreichend Dynamik zur Verfügung. Es ist allerdings darauf zu achten, dass dies meist nicht im Datenblatt vermerkt ist, und daher vom Anwender selbst validiert werden muss.

VI. MESSUNGENA. Pulsdynamik bei klassichen Messempfängern

Messungen, welche die Grenzen der Pulsdynamik von klassischen Messempfängern zeigen, wurden durchgeführt. Beispielsweise wurde ein klassicher Messempfänger im Band B mit dem CISPR 16-1-1 Puls beaufschlagt. Der Pegel wurde im Bereich 39 dBuV bis 41 dBuV variiert. In Abbil-dung 5 ist das Messergebnis gezeigt.

Idealerweise ist das angzeigte Pulsspektrum flach und alle Spektren sollten parallel in den Pegeln 38, 39 und 40 dBuV sein. Es zeigt sich allerdings, dass in den unter-schiedlichen Frequenzbereichen der Vorselektion die Lin-earität und das Autorange des analogen Messempfängers unterschiedliche verhält. Im oberen Frequenzbereich ist der 1 dB Kompressionspunkt des Messempfängers geringer als im mittleren Bereich, so dass dies zu einer Minderanzeige führt. Ab 40 dBuV schaltet der Eingangsabschwächer auf 5 dB. Dadurch gerät der obere Frequenzbereich aus der Kompression und die Anzeige nähert sich dem tatsächli-chen Pegel deutlich an. Es wird deutlich, dass bei diesem analogen Messempfänger die Toleranzen der CISPR 16-1-1 vollständig genutzt werden.

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bei realen Prüfungen und damit zu Fehlmessungen führen.Bei breitbandigen Messgeräten besteht die Herausfor-

derung darin, eine sehr hohe Dynamik mit Vorverstärker von 18 dBm am Eingang zu erreichen. Diese Anforderung wird durch einen Leistungsteiler und ein mehrkanaliges A/D Wandlersystem erreicht. Dabei existieren hohe An-forderungen an die Linearität. Typischerweise haben diese Messgeräte einen Aussteuerbereich bis ca. 5 V. Damit besitzt man noch Dynamikreserven von ca. 6 dB.

C. Anforderungen an die Dynamik für SpektrumanalysatorenSpektrumanalysatoren verfügen üblicherweise über

eine Vorselektion, welche nur zur Unterdrückung von unerwünschten Mischprodukten verwendet wird. Im Gegensatz zum Messempfänger ist diese nicht primär für die Erhöhung der Dynamik entwickelt worden. Allerdings haben hochwertige Spektrumanalysatoren einen hohen 1 dB Kompressionspunkt von ca. 13 dBm. Die Norm CISPR 16-1-1 Ed 2010 hat diesen Umstand berücksichtigt und erlaubt die Verwendung für Spektrumanalysatoren bei Prüflingen, deren Pulswiederholrate derart hoch ist, dass die Dynamik des Spektrumanalysators ausreichend ist. Es dürfen Prü-flinge mit einer Pulswiederholrate, welche größer als 20 Hz ist gemessen werden. Gleichzeitig muss die Dynamik des Spektrumanalyzers die Norm CISPR 16-1-1 für Pulswie-derholraten von mehr als 20 Hz einhalten. Dies entspricht einer Erleichtung um ca. 23 dB. Spektrumanalysatoren mit

hoher Performance stellen hier ausreichend Dynamik zur Verfügung. Es ist allerdings darauf zu achten, dass dies meist nicht im Datenblatt vermerkt ist, und daher vom Anwender selbst validiert werden muss.

VI. MESSUNGENA. Pulsdynamik bei klassichen Messempfängern

Messungen, welche die Grenzen der Pulsdynamik von klassischen Messempfängern zeigen, wurden durchgeführt. Beispielsweise wurde ein klassicher Messempfänger im Band B mit dem CISPR 16-1-1 Puls beaufschlagt. Der Pegel wurde im Bereich 39 dBuV bis 41 dBuV variiert. In Abbil-dung 5 ist das Messergebnis gezeigt.

Idealerweise ist das angzeigte Pulsspektrum flach und alle Spektren sollten parallel in den Pegeln 38, 39 und 40 dBuV sein. Es zeigt sich allerdings, dass in den unter-schiedlichen Frequenzbereichen der Vorselektion die Lin-earität und das Autorange des analogen Messempfängers unterschiedliche verhält. Im oberen Frequenzbereich ist der 1 dB Kompressionspunkt des Messempfängers geringer als im mittleren Bereich, so dass dies zu einer Minderanzeige führt. Ab 40 dBuV schaltet der Eingangsabschwächer auf 5 dB. Dadurch gerät der obere Frequenzbereich aus der Kompression und die Anzeige nähert sich dem tatsächli-chen Pegel deutlich an. Es wird deutlich, dass bei diesem analogen Messempfänger die Toleranzen der CISPR 16-1-1 vollständig genutzt werden.

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B. Dynamik des EMV Zeitbereic-hsmessystemsZur Untersuchung wurde ein TDEMI verwendet. Hierbei

wurde eine Pulsfolge gemäß der Norm CISPR 16-1-1 auf das Gerät gegeben und das Echtzeitspektrogramm, bewertet mit dem Spitzenwertdetektor, zur Anzeige gebracht. Das Ergebnis der Messung ist in Abbildung 6 dargestellt.

Das Resultat ist dreidimensional als Spektrogramm dar-gestellt. Es ist deutlich zu erkennen, dass jeder Puls korrekt gemessen und zur Anzeige gebracht wird. Die Dynamik beträgt mehr als 55 dB, wobei CISPR 16-1-1 nur 43,5 dB verlangt. Die Anzeigegenauigkeit entspricht den Vorgaben der CISPR 16-1-1.

C. Erweiterung des Dynamikbereichs durch Noise Floor Extension

Noisefloor Extension (NFE) ist eine Methode, die es erlaubt den Rauschboden abzusenken. Bei der Rausch-bodenabsenkung wird vom Messergebnis das Rauschen des Messger ätes nach ZF-Filterung und Detektorbewer-tung subtrahiert. Da Rauschen ein statistischer Prozess ist, führt dies zu Einflüssen auf die Pegelgenauigkeit in der Nähe des Rauschbodens. Im folgende wurde eine NFE von 8 dB erzeugt.

In Abbildung 7 ist das Ergebnis des realen Spektrums sowie des korrigierten Spektrums mit NFE dargestellt. Für das Sinussignal wird der Dynamikbereich um ca. 8 dB verbessert. Allerdings ist auch deutlich zu erken-nen, dass der Rauschboden eine deutlich höhere Varianz aufweist. Diese Streuung führt zu Mes-sunsicherheiten die berücksichtigt werden müssen.

VII. ZUSAMMENFASSUNGIn diesem Artikel wurden die Anforderungen

hinsichtlich analoger Messempfänger, Messemp-fänger mit breiter ZF sowie FFT-basierende Mes-sempfänger gemäß der Norm CISPR 16-1-1 diskuti-ert. Es wurde gezeigt, dass analoge Messempfänger genügend Dynamik für Emissionsmessungen zur Verfügung stellen. Effekte welche durch Kom-pression des Mischers und Autorange entstehen wurden diskutiert. Des weiteren wurden Vor- und Nachteile des Verfahren Noise Floor Extension dis-kutiert. Die Anforderungen hinsichtlich Dynamik wurden für Messempfänger mit breitbandiger ZF diskutiert. Diese stellen eine hohe Herausforderung an den 1 dB Kompressionspunkt dar, die üblich-erweise nicht erreicht wird. Derartige Messgeräte können allerdings verwendet werden, wenn man die Erleichterungen von ca. 20 dB für den Einsatz als Spektrumanalysator ansetzt. Darüber hinaus existieren breitbandige Messsysteme mit mehr-stufigen A/D Wandlern und Vorselektion welche die Dynamikanforderungen der CISPR 16-1-1 einhalten.

REFERENCES

• [1] S. Braun and P. Russer, “A Low-Noise Multiresolution High-Dynamic Ultra-Broad-Band Time-Domain EMI Measurement System,” IEEE Transactions on Micro-wave Theory and Techniques, vol. 53, pp. 3354 – 3363,

Nov 2005.• [2] S. Braun, M. Al-Qedra, and P. Russer, “A novel realtime time-

domain emi measurement system based on field programmable gate arrays,” in 17th International Zurich Symposium on Electromag-netic Compatibility, Digest, (Singapore), pp. 501–504, Feb. 2006.

• [3] S. Braun, F. Krug, and P. Russer, “A novel automatic digital quasi-peak detector for a time domain measurement system,” in 2004 IEEE International Symposium On Electromagnetic Compat-ibility Digest, August 9–14, Santa Clara, USA, vol. 3, pp. 919–924, Aug. 2004.

• [4] A. V. Oppenheim and R. W. Schafer, Discrete–Time Signal Processing. ISBN 0-13-214107-8, Prentice-Hall, 1999.

• [5] F. J. Harris, “On the Use of Windows for Harmonic Analysis with the Discrete Fourier Transform,” in Proceeding of the IEEE, vol. 66, no. 1, pp. 51–83, 1978.

• [6] J. Allen and L. Rabiner, “A unified approach to short-time Fourier analysis and synthesis,” in Proceedings of the IEEE, vol. 65, pp. 1558–1564, 1977.

• [7] C. Hoffmann, S. Braun, and P. Russer, “A Broadband Time-Domain EMI Measurement System up to 18 GHz,” in In EMC Europe 2010, Breslau, Polen, September 2010, September 2010.

• [8] CISPR16-1-1 Ed. 3, Specification for radio disturbance and im-munity measuring apparatus and methods Part 1-1: Radio distur-bance and immunity measuring apparatus – Measuring apparatus. International Electrotechnical Commission, 2010


LARS GLÄSERHardware-Entwickler von EMV - MaßLanger

PHYSIKALISCHE PROBLEME BEI DER STÖRFESTIGKEITSANALYSE EINER ELEKTRONIK LÖSUNGSANSATZ

EINLEITUNG:

FEHLERSUCHE IN modernen Schaltungen erweist sich heutzutage als zunehmend schwierig. Neben der gestiegenen Komplexität (und damit stark erhöhter Anzahl möglicher Fehlerquellen) stellen die geringeren mechanischen Abmessungen den Entwickler vor immer größere Schwierigkeiten, gerade wenn es um die Eingrenzung der Fehler

geht. Dazu ein Beispiel aus unserer Messpraxis:

AUFGABENSTELLUNG:Gegenstand der Untersuchung war das Bedienteil eines

neuen Störgenerators zur Störfestigkeitsuntersuchung.Neben einem LCD Display (+ Controller) enthält die

Leiterkarte einen µC (142 Pin TQFP), einen FPGA (100 Pin TQFP), Schnittstellenbausteine, passive Bauelemente (u.a. SMD 0603) sowie diverse Bedienelemente (Impulsdrehge-ber, Taster, Schalter). Zusätzlich befi nden sich USB Buchsen, Anschlüsse für die später erzeugte Generatorspannung sowie die Eingänge für die Stromversorgung auf dem Board. Aus Kostengründen wurde die Leiterkarte im 2-Lagen Sys-tem mit 200µm Strukturgrößen ausgeführt. Es gibt keinen durchgehenden GND-Layer. Die Busse / Leitungen sind auf beiden Ebenen verlegt. Die räumliche Nähe des Bedienteils zum Generatorteil ergibt dabei hohe Anforderungen an die Störfestigkeit.

Beim ersten ESD - Test nach DIN EN 61000-4-2 kam es zu Fehlfunktionen. Nach Einkopplung von Störimpulsen (Kontaktentladung) in das GND System der Platine stürzte der Mikrocontroller ab, was sich durch den Ausfall des Heartbeat – Signals sowie dem Einfrieren des Displays bemerkbar machte. Diese Störung trat je nach Position der ESD – Pistole (Einkoppelpunkt und Stellwinkel) bei unterschiedlichen Spannungen auf (2,4 kV – 4 kV). Die Störschwelle war deutlich zu erhöhen.


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Koppelmechanismus:Wie bereits in [1] gezeigt treten zwei mögliche Koppel-

mechanismen der Störgrößen in kritischen Bereichen der Schaltung auf: Magnetische Einkopplung und elektrische Einkopplung.

Beim Einkoppeln mit der ESD Pistole in die Baugruppe muss diese unterscheiden:

Bei der magnetischen Einkopplung fließen Störströme durch das Board und erzeugen dabei Magnetfelder. Diese können in Leiterschleifen Spannungen induzieren. Dies kann nun auf zwei Wegen zu Problemen führen: Einerseits kann die induzierte Spannung vom Schaltkreiseingang als logisches Signal behandelt werden oder sie treibt einen Störstrom, welcher Probleme in anderen Schaltungsteilen hervorruft.

Hinzu kommen Störungen durch elektrische Einkop-plung. Dabei koppeln elektrische Felder kapazitiv in die Leitungsnetze oder auch Bauelemente des Boards ein. Der dabei entstehende Verschiebestrom kann das System wieder

auf zwei Wegen beeinflussen: Zum einen führt der Ver-schiebestrom an einem Widerstand (gegen Vss oder Vdd) zu einem Spannungsabfall, welcher wieder als logisches Signal erkannt wird oder er induziert Spannungen in anderen Schaltungsteilen, ähnlich der magnetischen Einkopplung.

Für die genauere Eingrenzung empfindlicher Baugrup-penteile ist es erforderlich, gezielt einzelne Leitungen (z.B. in Bussystemen) bzw. deren Vias oder einzelne IC Pins mit Störgrößen zu beaufschlagen. Aufgrund der bereits erwähnten hohen Integration von Schaltungen und Struk-turgrößen im µm Bereich wachsen die Anforderungen an die mechanische Auflösung einer Störquelle.

Da die Fehlfunktion und Störschwelle nun bekannt waren, musste ein geeigneter Weg gefunden werden, die Störfestigkeit zu erhöhen.

Durch den Normtest konnte der Fehler auf den Control-ler eingekreist werden. Welche(r) Pin(s) für den Absturz verantwortlich war(en) musste noch ermittelt werden. Dies

Bild 1: Wirkung elektrischer und magnetischer Felder auf den IC

Bild 2: Prüfanordnung – Pulser + IC


DeutschlandGl Äser


ist in diesem Fall aber notwendig, da die entsprechenden Gegenmaßnahmen (Verblockung der IC-Pins, Vergraben der empfindlichen Leitungen) sonst nicht effektiv durch-führbar gewesen wären.

Um nun die empfindlichen Leitungen / IC-Pins zu ermit-teln, muss jeder Pin einzeln mit einer ESD – ähnlichen Stör-größe beaufschlagt werden. Der erneute Einsatz der ESD – Pistole schied aus mehreren Gründen aus:

- Die Impulse sind zu stark für einzelne IC-Pins – der Schaltkreis kann leicht zerstört werden.

- Die Feldemission der ESD-Pistole kann an-dere Schaltungsteile beeinflussen und eine gezielte Fehlersuche dadurch erheblich erschweren.

- Durch die mechanischen Abmessungen ist es nahezu unmöglich, einen einzelnen IC-Pin zu kontaktieren, ohne mit den Nachbarpins einen Kurzschluss zu erzeugen.

- Aufgrund der Leitungsdichte ist das GND-Sys-tem um den Schaltkreis nur schlecht zugänglich, was das Anschließen des Bezugsleiters erschwert.

Lösungsansatz:Zur lokalen Einkopplung von Störgrößen

werden häufig E- bzw. B-Feldquellen verwendet. Deren Selektivität war jedoch im vorliegenden Fall nicht ausreichend. Eine weitere Verkleinerung der Feldquellen erscheint jedoch nicht sinnvoll: Die Koppelkapazität zwischen der Elektrode der E Feldquelle und der entsprechenden Leiterplat-tenstruktur / Bauteilgehäuse würde entscheidend verkleinert, so dass der resultierende Störimpuls nicht ausreicht, um den bereits beobachteten Fehler zu reproduzieren.

Um dieses Problem zu umgehen wurde ein neuer Störgenerator entwickelt. Dieser erzeugt steil-flankige Störimpulse (1,2 kV / 1,8 ns Anstiegszeit), welche über eine interne Kapazität (10 pF) in den Prüfling eingekoppelt werden können. Polarität und Intensität sind verstellbar. Zur Kontaktierung wird eine austauschbare Nadelelektrode verwendet.

Dieses PrinziP bringt mehrere VorteiLe mit sich:

- Die Koppelkapazität zwischen der zu beaufschlagenden Struktur und der Feldquelle ist immer gleich (nicht mehr abhängig von Abstand).

- Es lassen sich einzelne Pins an hochintegrierten Schalt-

Bild 3: Pulsform der Feldquelle an 50 Ω Bild 4: Einkopplung in IC


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kreisgehäusen (TQFP) einzeln kontaktieren.- Die Koppelkapazität gegenüber einer kleinen Struktur

wird vergrößert. - Es ist möglich Schaltkreise in der Applikation zu testen.

Da in unmittelbarer Nähe der zu testenden Signale einer realen Baugruppe keine ausreichend kurze Massev-erbindung mit dem Pulsgenerators möglich ist, wurde der Generator so ausgelegt, dass eine kapazitive Kopplung zum Prüfling genügt.

Die Impulsform der Feldquelle wurde zunächst in einem 50 Ω System und mit einem 1 GHz Oszilloskop untersucht, um sicher zu stellen, dass die von der Pulsspannungsquelle er-zeugte Störgröße ausreichend ist, um Systeme zu beeinflussen.

Die Messung zeigte, dass trotz kapazitivem Stromrückweg der produzierte Impulse mit 8 V stark genug ist, um Störun-gen am IC hervorzurufen (Amplitude und Kurvenform rich-ten sich nach dem Messaufbau, z.B. wird in einen hochohmi-gen Eingang oder auf einen Treiberausgang eingekoppelt).

Mit dieser Messanordnung wurden nun alle IC Pins – einzeln – mit einem Störimpuls beaufschlagt. Dabei wurde zuerst die niedrigste Pulsintensität bei positiver Polarität gewählt. Beim ersten Abprüfen konnte keine Fehlfunk-tion festgestellt werden. Nach schrittweiser Erhöhung der Intensität stellte sich das gleiche Fehlerbild wie bei dem Normtest mit der ESD Pistole ein. Bei der Einkopplung in zwei der 20 Leitungen, welche zum Bedienteil führen,

konnte der Controller zum Absturz gebracht werden. Als mögliche Gegenmaßnahmen kamen zunächst nur zwei Modifikationen in Frage: der Einbau von Abblockkondensa-toren gegen Masse und der Einbau von Chipinduktivitäten/Widerständen in die Leitungen zwischen Bedienteil und Controller. Nach Einbau von 2x10 pF 0402 Kondensatoren wurden alle Pins erneut mit dem P23 beaufschlagt. Die Störung trat nun nicht mehr auf.

Anschließend wurde erneut ein Normtest mit ESD Pis-tole durchgeführt. Wie sich zeigte standen die bei beiden Tests hervorgerufenen Fehler in Zusammenhang. Die Störschwelle wurde auf 4,8 kV angehoben.

Fazit:Durch die lokale Einkopplung in einzelne Leitungen

oder IC Pins ist es möglich, die bei der Störfestigkeitsprü-fung eines Gerätes auftretenden Störgrößen nachzubilden und besonders empfindliche Schaltungsteile (IC-Pins / Leitungen) zu ermitteln. Die Ursachensuche wird damit erheblich erleichtert und erlaubt es, Fehlern schneller auf den Grund zu gehen.

Quellen:• [1] Neue Aspekte zur ESD-Störfestigkeit“ Elektronik, 05/2009,

Autor: Gunter Langer• [2] Neue Burst-Generatoren zur Prüfung der Störfestigkeit von

integrierten Schaltungen“.


Deutschland


kreisgehäusen (TQFP) einzeln kontaktieren.- Die Koppelkapazität gegenüber einer kleinen Struktur

wird vergrößert. - Es ist möglich Schaltkreise in der Applikation zu testen.

Da in unmittelbarer Nähe der zu testenden Signale einer realen Baugruppe keine ausreichend kurze Massev-erbindung mit dem Pulsgenerators möglich ist, wurde der Generator so ausgelegt, dass eine kapazitive Kopplung zum Prüfling genügt.

Die Impulsform der Feldquelle wurde zunächst in einem 50 Ω System und mit einem 1 GHz Oszilloskop untersucht, um sicher zu stellen, dass die von der Pulsspannungsquelle er-zeugte Störgröße ausreichend ist, um Systeme zu beeinflussen.

Die Messung zeigte, dass trotz kapazitivem Stromrückweg der produzierte Impulse mit 8 V stark genug ist, um Störun-gen am IC hervorzurufen (Amplitude und Kurvenform rich-ten sich nach dem Messaufbau, z.B. wird in einen hochohmi-gen Eingang oder auf einen Treiberausgang eingekoppelt).

Mit dieser Messanordnung wurden nun alle IC Pins – einzeln – mit einem Störimpuls beaufschlagt. Dabei wurde zuerst die niedrigste Pulsintensität bei positiver Polarität gewählt. Beim ersten Abprüfen konnte keine Fehlfunk-tion festgestellt werden. Nach schrittweiser Erhöhung der Intensität stellte sich das gleiche Fehlerbild wie bei dem Normtest mit der ESD Pistole ein. Bei der Einkopplung in zwei der 20 Leitungen, welche zum Bedienteil führen,

konnte der Controller zum Absturz gebracht werden. Als mögliche Gegenmaßnahmen kamen zunächst nur zwei Modifikationen in Frage: der Einbau von Abblockkondensa-toren gegen Masse und der Einbau von Chipinduktivitäten/Widerständen in die Leitungen zwischen Bedienteil und Controller. Nach Einbau von 2x10 pF 0402 Kondensatoren wurden alle Pins erneut mit dem P23 beaufschlagt. Die Störung trat nun nicht mehr auf.

Anschließend wurde erneut ein Normtest mit ESD Pis-tole durchgeführt. Wie sich zeigte standen die bei beiden Tests hervorgerufenen Fehler in Zusammenhang. Die Störschwelle wurde auf 4,8 kV angehoben.

Fazit:Durch die lokale Einkopplung in einzelne Leitungen

oder IC Pins ist es möglich, die bei der Störfestigkeitsprü-fung eines Gerätes auftretenden Störgrößen nachzubilden und besonders empfindliche Schaltungsteile (IC-Pins / Leitungen) zu ermitteln. Die Ursachensuche wird damit erheblich erleichtert und erlaubt es, Fehlern schneller auf den Grund zu gehen.

Quellen:• [1] Neue Aspekte zur ESD-Störfestigkeit“ Elektronik, 05/2009,

Autor: Gunter Langer• [2] Neue Burst-Generatoren zur Prüfung der Störfestigkeit von

integrierten Schaltungen“.


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FRANCE


Contents | France

A n d r é - M a r i e A m p è r e , p h y s i c i e n e t mathématicien français, est l’un des fondateurs de la science de l’électromagnétisme classique. Il donne son nom à l’ampère, l’unité SI de mesure du courant électrique. L a t héor ie mat hémat ique e t physique développée par Ampère tente de comprendre la relation entre l’électricité et le magnétisme. Ampère démontre que deux conducteurs parallèles parcourus par des courants électriques s’attirent ou se repoussent en fonction de la direction, identique ou opposée, du ux des courants. La loi d’Ampère stipule que l’action mutuelle de deux conducteurs électrifiés est proportionnelle à leurs longueurs et aux intensités de leurs courants. Il applique également ce même principe au magnétisme. Nous devons à Ampère l’idée nouvelle de la relation électromagnétique. En reconnaissance de sa contribution à la création d’une science électrique moderne, l’ampère est établi comme unité de base de la mesure électrique en 1881.

André-MarieAmpère (1775–1836)

PRODUITS ET SERVICES

RESSOURCES

ARTICLES Couplages Entre Antennes Dans un Aéronef Par la Méthode Directe ACA PASCAL DE RESSÉGUIER, Chef de projet chez, Entares Engineering YANNICK POIRÉ, SAMUEL LEMAN, Ingénieurs Etudes & Simulations CEM, Nexio

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FRANCE


Contents | France

A n d r é - M a r i e A m p è r e , p h y s i c i e n e t mathématicien français, est l’un des fondateurs de la science de l’électromagnétisme classique. Il donne son nom à l’ampère, l’unité SI de mesure du courant électrique. L a t héor ie mathémat ique e t physique développée par Ampère tente de comprendre la relation entre l’électricité et le magnétisme. Ampère démontre que deux conducteurs parallèles parcourus par des courants électriques s’attirent ou se repoussent en fonction de la direction, identique ou opposée, du ux des courants. La loi d’Ampère stipule que l’action mutuelle de deux conducteurs électrifiés est proportionnelle à leurs longueurs et aux intensités de leurs courants. Il applique également ce même principe au magnétisme. Nous devons à Ampère l’idée nouvelle de la relation électromagnétique. En reconnaissance de sa contribution à la création d’une science électrique moderne, l’ampère est établi comme unité de base de la mesure électrique en 1881.

André-MarieAmpère (1775–1836)


RESSOURCES

ARTICLES Couplages Entre Antennes Dans un Aéronef Par la Méthode Directe ACA PASCAL DE RESSÉGUIER, Chef de projet chez, Entares Engineering YANNICK POIRÉ, SAMUEL LEMAN, Ingénieurs Etudes & Simulations CEM, Nexio

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France | Products & Services

A

A.H. Systems Inc.AR France, 7 Rue des Fosses Blanc Bat D1,F-92230, Gennevilliers, France;+011 33 1 47 91 75 30; Fax: 011 33 1 47 91 75 35; [email protected]; www.AHSystems.comProduits et services: Antennes, Instrument de contrôle, Contrôles

AA Opto-ElectronicAA MCS, 18, rue Nicolas Appert, F-91898,Orsay Cedex, France,+33 01 76 91 5012 Fax +33 01 76 91 5031;[email protected];www.aa-mcs.comProduits et services: Micro-ondes, amplificateurs de puissance, coupleurs à large bande, diviseurs, filtres

Aaronia AGKauthenbergstr. 14, Strickscheid,DE-54597 Germany; Fax:+49(0)6556-93034; +49(0)6556-93033;Vanessa Bauer, [email protected];Thorsten Chmielus, owner, [email protected];Manuel Pinten, Materials contact, [email protected]; www.aaronia.de Produits et services: Antennes, Protection, Instru-ment de contrôle

Apache Design SolutionsLa Grande Arche, Paroi Nord, Paris La Defense,92044, France;+33(0)1 43 25 92 45 Fax: +33(0)1 40 84 57 21 41;Jose Gandlarz; [email protected];www.apache-da.comProduits et Services: Miscellaneous

AR France7 rue du Fosse Blanc, Bat D1, Gennevilliers,France 92230;+33(0)1 47 91 75 30; Fax: +33(0)1 47 91 75 35;Bernard Bessot; [email protected]; www.arfrance.euProduits et services: Amplificateurs, Antennes, Câbles et connexions, Espaces sous protection et clôtures,Hausse et éléments temporaires, Instrument de contrôle

Arrow Europe13-15 rue de pont des Halles Rungis 94656;+33 01 4978 4949;www.arroweurope.comProduits et services: Ferrites, câbles et connecteurs, applications de puissance

C

Carlisle Interconnect TechnologiesUnited Kingdom;+44-7817-731-000;Andy Bowne, [email protected];www.CarlisleIT.comProduits et services: Filtres

E

EM Test FranceLe Trident - Parc des Collines, 36, Rue Paul Cézanne, 68200 Mulhouse, France;+33(0)3 89 31 23 50; Fax: +33(0)3 89 31 23 55;[email protected];www.emtest.frProducts and Services: Hausse et éléments tempo-raires, Instrument de contrôle, Contrôles

EMC Partner France Mr Pascal POIRET, 6 rue Clément VI ;19300 Rosiers d’Egletons – France;+33 (0)5 55 74 31 68 ; Fax. : +33 (0)5 55 87 47 69;[email protected]; www.emc-partner.frProduits et services: Générateurs et solutions CEM & RF

EMI TECH3, rue des Coudriers - CAP 78, ZA de l’Observatoire, 78180 Montigny le Bretonneux France;+33(0)1 30 57 55 55; Fax: +33(0)1 30 57 8640;Jean Luc Tisserand, [email protected];www.emitech.fr Produits et services: Contrôles

Eurofarad 93, rue Oberkampf, F-75540 PARIS Cedex 11, France; +33(0)1 49 23 10 00; Fax: +33(0)1 43 57 05 33;[email protected]; www.eurofarad.com Produits et services: Filtres

EuroMC12/24 Avenue de Stalingrad Stains, ZA St, Leger,93240, France;+33 1 58 34 00 00; Fax. +33 1 58 34 07 07;[email protected]; www.euromc.fr Produits et services: Filtres, Protection, Espaces sous protection et clôtures

ETS-LindgrenZ.A. Saint Léger - Batiment; 12-24 Avenue Stalingrad, 93240 Stains;+33 1 49 40 19 30; Fax:+33 1 49 40 19 31;[email protected];www.ets-lindgren.comProduits et services: Antennes, ferrites, filtres, chambres blindées et boîtiers, Générateurs de signaux RFI / EMI, instrumentation de test, Divers


France | Produits Et Services

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Concepteurs et fabricants d’amplificateursradiofréquences et hyperfréquences de forte puissance

MILMEGA Limited Park Road, Ryde, Isle of Wight, PO33 2BE United KingdomTel. +44 (0) 1983 618004 Fax. +44 (0) 1983 811521 [email protected] www.milmega.co.uk

MILMEGALa différence entre l’ordinaire

et l’extraordinaire

La nouvelle série d’amplificateurs de 80 à 1 000 MHz de MILMEGA est à l’imagede notre société : elle fournit des produits et des services exceptionnels et établit

des standards que nos concurrents souhaitent imiter.

Nous promettons seulement ce que nous pouvons livrer…puis livrons plus que ce nous avons promis.

Le meilleur dans sa catégorie pour unepuissance garantie

Des sous ensembles amovibles améliorent l’utilisation du produit

Garantie 5 ans tous frais compris

Compacité exceptionnelle(la moitié de la taille de nos concurrents)

Architecture modulaire, permettant unemise à niveau

Extra210x297ITEMFrance_Layout 1 04/09/2012 16:37 Page 1

ADs_EEG13.indd 25 11/16/12 2:48 PM


France | Produits Et Services

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Fair-Rite ProductsSchaffner EMC SAS, 112, Quai de Bezons B.P. 133 95103 Argenteuil France;+33(0)1 34 34 30 60; Fax: +33(0)1 39 47 02 28;[email protected]; www.fair-rite.com Produits et services: Ferrite, Filtres, Espaces sous protection et clôtures, Protection

FCI ConnectorsImmeuble Calypso, 18 Parc Ariane III, 3-5 rue Alfred Kastler, 78 280 Guyancourt, France;+33 1 72 67 35 00; Fax : +33 1 72 67 36 83;[email protected]; www.fciconnect.comProduits et services: Câbles et connexions

Federal-Mogul Corporation69, rue Henri Laroche, 60800 Crépy-en-Valois;+33 3 44 39 06 06; Fax: +33 3 44 94 48 33;[email protected];www.federalmogul.com/spProduits et services: Ensembles de câbles blindés & harnais conduits, tuyaux blindés blindé

G

GETELEC375 rue Morane Saulnier, 78530 Buc- France;+33(0)1 39 20 42 42; Fax: +33(0)1 39 20 43 43;[email protected]; www.getelec.com Produits et services: Matériaux conducteurs, Protection

Gowanda ElectronicsACAL BFI; ZI De La Petite Montagne Sud, 4 Allee Du Cantal, CE 1834 Lisses, Evry Cedex, France, 91018;+33 01 60 79 59 00; 33 01 60 79 89 01;[email protected]; www.bfioptilas.com.Produits et services: inducteurs

I

a TESEQ CompanyIFI - Instruments for IndustryTeseq Sarl, 50, route de Pontoise, 95870 Bezons;+33 (0)1 39 47 42 21; Fax: +33 (0)1 39 47 40 92;[email protected]; www.teseq.frProduits et services: Concepteurs et fabricants d’ amplificateurs radiofréquences et hyperfréquences de haute puissance (Tetrode Tubes, Solid State and TWT)

K

Kemtron SARL315 Square des Champs Elysees,91080 Courcouronnes, France;+33(0)1 60 91 34 48; Fax: +33 (0)1.60.91.34.47;Pascal Malblanc, [email protected];www.kemtron.frProduits et services: Matériaux conducteurs, Protection

L

Langer EMV-Technik GmbHM2S SARL, 3 rue des Martins Pécheurs, F-66700 Argelès sur Mer France;04-68-81-49-52; Fax: 04-68-81-62-16;[email protected];www.langer-emv.deProduits et services: Instrument de contrôle

M

a TESEQ CompanyMILMEGATeseq Sarl, 50, route de Pontoise, 95870 Bezons;+33 (0)1 39 47 42 21; Fax: +33 (0)1 39 47 40 92;[email protected];www.teseq.frProduits et services: Concepteurs et fabricants d’ amplificateurs radiofréquences et hyperfréquences de haute puissance

N

NEXIO46 Avenue du General de Croutte, Toulous,31100 France;+33(0)5 61 44 02 47; Fax: +33(0)5 61 44 05 67;Frederic Amoros, President;[email protected];www.nexio-online.comProduits et services: Instrument de contrôle, Divers

P

PranaZ.I. La Marquisie, Avenue du 4 Juillet 1776, Brive Cedex 19101 France;+33(0)5 55 86 49 33; Fax: +33(0)5 55 86 49 45;Dennis Dumont, [email protected];www.prana-rd.comProduits et services: Amplificateurs

S

Schlegel Electronic MaterialsYelloz Component - MILMEGA, 4 Rue de Mayotte Z.I.de Courtaboeuf, FR- 91940 Les Ulis, France;+33(0)1 64 46 04 42; Fax: +33(0)1 64 46 92 70;Eric Stunault; [email protected];www.yellozgroup.com Produits et services: Matériaux conducteurs, Protection

Schurter S.A.S.Route de Châteauvillain, 52210 Arc en Barrios, France; +33 3 2502 5049;[email protected];www.schurter.fr Produits et services: Filtres, Protection

T

Tech-Etch, Inc.Yelloz ComponentsZa de Courtaboeuf, 4 Rue de Mayotte,F-91940 Les Ulis, France;+33 164 46968; Fax: +33 160 923801;[email protected]; www.tech-etch.comProduits et services: Matériaux conducteurs, Protection


Teseq SarlTeseq Sarl, 50, route de Pontoise, 95870 Bezons;+33 (0)1 39 47 42 21; Fax: +33 (0)1 39 47 40 92;[email protected];www.teseq.frProduits et services: Amplifiers (RF & Microwave), Antennas, Automotive Systems, Conducted RF immu-nity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

ASSOCIATIONSASSOCIATION FRANÇAISE DE LA COMPATIBILITÉ ELECTROMAGNÉTIQUE (AFCEM) Pour la promotion et le développement de laCompatibilité ElectroMagnétique Association régie par la loi du 1er juillet 1901, 86 rue de la Liberté – 38180 SEYSSINS;01 43 86 13 96; Fax: 01 43 86 09 40;[email protected];www.afcem.org/index.asp

IEEE EMC SOCIETY CHAPTER FRANCEAndré Berthon, Admittance, 11 rue Bertron, F-92330 Sceaux, France;+331 433 45231;[email protected]


Ressources | France


NOTIFIED BODIES

AEMC LAB19 rue françois Blumet, ZI de l’Argentière,F38360, Sassenage, France;+33 04 76 27 83 83; Fax: +33 04 76 27 77 00;[email protected]

ASEFA33 avenue du Général Leclerc,92260 Fontenay-aux-Roses, France;+33 1 40 95 63 34; Fax: +33 1 40 95 88 18;[email protected]

ASEFA - PLATE FORME F 03 - SCHNEIDER ELECTRIC INDUSTRIES37 quai Paul Louis Merlin,38050 Grenoble cedex 9, France ;+33 4 76 39 85 51; Fax: +33 4 76 57 99 38;[email protected];www.schneider-electric.com

ASEFA - PLATE FORME P 01 - LEGRAND128 avenue du Maréchal de Lattre de Tassigny, F87045 Limoges cedex, France;+33 5 55 06 87 87; Fax: +33 5 55 06 88 88;[email protected]

ASEFA - PLATE FORME V 01 - ALSTOM TRANSPORT11-13 Avenue de Bel Air 69627,Villeurbanne Cedex, France;+33 4 72 81 46 27;[email protected]; www.alstom.transport.com

CENTRE TECHNIQUE DES INDUSTRIES MECANIQUES52 Avenue Felix Louat - BP 80067, F60304 SENLIS CEDEX, France;+33 3 44 67 30 00; Fax: +33 3 44 67 34 00;[email protected]; www.cetim.fr

EMITECH ATLANTIQUERue de la Claie 15, ZI Angers-Beaucouzé, 49070 BEAU-COUZE, France;+33 2 41 732627; Fax: +33 241 7326.40;[email protected]; www.emitech.fr

EMITECH - CHASSIEU7, rue Georges Méliès, F 69680 CHASSIEU, France; +33 478 406655; Fax: +33 472 470039; [email protected]; www.emitech.fr

EMITECH GRAND SUDRue du Massacan 145, ZI Vallée du Salaison, BP 25, 34741 VENDARGUES CEDEX, France;+33 467 871102; Fax: +33 467 709455;[email protected];www.emitech.fr

EMITECH ILE DE FRANCEZ.A. de l’Observatoire 3 rue des Coudriers, 78180 MONTIGNY LE BRETONNEUX, France;+33 1 30 57 55 55; Fax: +33 1 30 43 74 48;[email protected]; www.emitech.frEMITECH - LE RHEU2 allée du Chêne Vert F35650 le Rheu, Le Rheu, France; +33 299 14 5914; +33 299 146454;[email protected]; www.emitech.fr

EUROCEM364, rue Armand Japy Technoland, 25460 Etupes, Cedex, France;+33 381 907590; Fax: +33 381 3236 28;[email protected];[email protected];www.eurocem.fr

GYL TECHNOLOGIESParc d’activités de Lanserre 21 rue de la Fuye F49610 Juigne sur Loire, Juigne sur loire, France;+33 241 575740; Fax: +33 2414525 77;[email protected]

GROUPE D’ETUDES ET DE RECHERCHES APPLIQUÉES À LA COMPATIBILITÉ105 avenue du Général Eisenhower BP 23705 F 31037 Toulouse cedex 01, Toulouse, France,+33 561 1946 50; Fax: +33 561 194668;[email protected]

INSTITUT NATIONAL DE L’ENVIRONNEMENT INDUSTRIEL ETDES RISQUESParc Technologique Alata BP 2, F60550 Verneuil-en-Halatte, France;+33 344 556677; Fax: +33 344 556699;[email protected];www.ineris.fr

LABORATOIRE CENTRAL DES INDUSTRIES ELECTRIQUES33 avenue du Général Leclerc BP 8, F92266 Fontenay-aux-Roses cedex, France;+33 140 956060; Fax: +33 140 955407;[email protected]; www.lcie.fr

LABORATOIRE NATIONAL DE MÉTROLOGIE ET D’ESSAIS 1, rue Gaston Boissier, 75724 PARIS CEDEX 15, France; +33 140 433700; Fax: +33 140 433737;[email protected]; www.lne.fr

LABORATOIRE CENTRAL DESINDUSTRIES ELECTRIQUES - ETABLISSEMENT SUD-ESTZI Centr’Alp 170 rue de Chatagnon,F38430 Moirans, France;+33 476 073636; Fax: +33 476 559088;[email protected]; www.lcie.fr

UNION TECHNIQUE DE L’AUTOMOBILE, DU MOTOCYCLE ET DU CYCLEAutodrome de Linas-Montlhéry BP 20212,91311 Montlhéry Cedex, France;+33 169 801700; Fax: +33 169 801717;[email protected]; www.utac.com

OTHERMINISTÉRE DE L’ECONOMIE, DES FINANCES ET DE L’INDUSTRIE DIGITIP/SPIC/SQUALPI DIGITIP 5Le Bervil, 12 rue Villiot, F-75572 Paris Cedex 12;+33 015 3449703; Fax: + 33 015 3449888;Michel Berger, [email protected]


Ressources | France


NOTIFIED BODIES

AEMC LAB19 rue françois Blumet, ZI de l’Argentière,F38360, Sassenage, France;+33 04 76 27 83 83; Fax: +33 04 76 27 77 00;[email protected]

ASEFA33 avenue du Général Leclerc,92260 Fontenay-aux-Roses, France;+33 1 40 95 63 34; Fax: +33 1 40 95 88 18;[email protected]

ASEFA - PLATE FORME F 03 - SCHNEIDER ELECTRIC INDUSTRIES37 quai Paul Louis Merlin,38050 Grenoble cedex 9, France ;+33 4 76 39 85 51; Fax: +33 4 76 57 99 38;[email protected];www.schneider-electric.com

ASEFA - PLATE FORME P 01 - LEGRAND128 avenue du Maréchal de Lattre de Tassigny, F87045 Limoges cedex, France;+33 5 55 06 87 87; Fax: +33 5 55 06 88 88;[email protected]

ASEFA - PLATE FORME V 01 - ALSTOM TRANSPORT11-13 Avenue de Bel Air 69627,Villeurbanne Cedex, France;+33 4 72 81 46 27;[email protected]; www.alstom.transport.com

CENTRE TECHNIQUE DES INDUSTRIES MECANIQUES52 Avenue Felix Louat - BP 80067, F60304 SENLIS CEDEX, France;+33 3 44 67 30 00; Fax: +33 3 44 67 34 00;[email protected]; www.cetim.fr

EMITECH ATLANTIQUERue de la Claie 15, ZI Angers-Beaucouzé, 49070 BEAU-COUZE, France;+33 2 41 732627; Fax: +33 241 7326.40;[email protected]; www.emitech.fr

EMITECH - CHASSIEU7, rue Georges Méliès, F 69680 CHASSIEU, France; +33 478 406655; Fax: +33 472 470039; [email protected]; www.emitech.fr

EMITECH GRAND SUDRue du Massacan 145, ZI Vallée du Salaison, BP 25, 34741 VENDARGUES CEDEX, France;+33 467 871102; Fax: +33 467 709455;[email protected];www.emitech.fr

EMITECH ILE DE FRANCEZ.A. de l’Observatoire 3 rue des Coudriers, 78180 MONTIGNY LE BRETONNEUX, France;+33 1 30 57 55 55; Fax: +33 1 30 43 74 48;[email protected]; www.emitech.frEMITECH - LE RHEU2 allée du Chêne Vert F35650 le Rheu, Le Rheu, France; +33 299 14 5914; +33 299 146454;[email protected]; www.emitech.fr

EUROCEM364, rue Armand Japy Technoland, 25460 Etupes, Cedex, France;+33 381 907590; Fax: +33 381 3236 28;[email protected];[email protected];www.eurocem.fr

GYL TECHNOLOGIESParc d’activités de Lanserre 21 rue de la Fuye F49610 Juigne sur Loire, Juigne sur loire, France;+33 241 575740; Fax: +33 2414525 77;[email protected]

GROUPE D’ETUDES ET DE RECHERCHES APPLIQUÉES À LA COMPATIBILITÉ105 avenue du Général Eisenhower BP 23705 F 31037 Toulouse cedex 01, Toulouse, France,+33 561 1946 50; Fax: +33 561 194668;[email protected]

INSTITUT NATIONAL DE L’ENVIRONNEMENT INDUSTRIEL ETDES RISQUESParc Technologique Alata BP 2, F60550 Verneuil-en-Halatte, France;+33 344 556677; Fax: +33 344 556699;[email protected];www.ineris.fr

LABORATOIRE CENTRAL DES INDUSTRIES ELECTRIQUES33 avenue du Général Leclerc BP 8, F92266 Fontenay-aux-Roses cedex, France;+33 140 956060; Fax: +33 140 955407;[email protected]; www.lcie.fr

LABORATOIRE NATIONAL DE MÉTROLOGIE ET D’ESSAIS 1, rue Gaston Boissier, 75724 PARIS CEDEX 15, France; +33 140 433700; Fax: +33 140 433737;[email protected]; www.lne.fr

LABORATOIRE CENTRAL DESINDUSTRIES ELECTRIQUES - ETABLISSEMENT SUD-ESTZI Centr’Alp 170 rue de Chatagnon,F38430 Moirans, France;+33 476 073636; Fax: +33 476 559088;[email protected]; www.lcie.fr

UNION TECHNIQUE DE L’AUTOMOBILE, DU MOTOCYCLE ET DU CYCLEAutodrome de Linas-Montlhéry BP 20212,91311 Montlhéry Cedex, France;+33 169 801700; Fax: +33 169 801717;[email protected]; www.utac.com

OTHERMINISTÉRE DE L’ECONOMIE, DES FINANCES ET DE L’INDUSTRIE DIGITIP/SPIC/SQUALPI DIGITIP 5Le Bervil, 12 rue Villiot, F-75572 Paris Cedex 12;+33 015 3449703; Fax: + 33 015 3449888;Michel Berger, [email protected]


PASCAL DE RESSÉGUIERChef de projet chezEntares Engineering

YANNICK POIRÉ, SAMUEL LEMANIngénieurs Etudes & Simulations CEM Nexio

Résumé — Une étude approfondie des interférences électromagnétiques à l’intérieur d’un aéronef est désormais incontournable face à la récente augmentation des dispositifs électroniques à bord. Leurs eff ets sur la communication et les systèmes électroniques de l’appareil ont besoin d’être pris en compte en priorité lors de l’étape de conception. Des simula-tions numériques sont souvent utilisées afi n d’eff ectuer cette analyse. Cependant, la grande taille électrique des modèles à haute fréquence entraîne un temps de calcul et un espace mé-moire considérable. Bien qu’un certain nombre de méthodes itératives “rapides” existe, la structure en forme de cavité de l’aéronef pose des problèmes de convergence réduisant leur applicabilité pour ce type de problème. La méthode directe proposée résout le système linéaire de la Méthode des Mo-ments (MoM) en utilisant l’algorithme Adaptive Cross Ap-proximation (ACA) afi n de réduire la taille de la matrice et le temps de calcul. Contrairement aux solveurs itératifs “rapides,” une approche directe est eff ectuée afi n d’éviter les problèmes de convergence. Une bonne concordance entre les simulations du logiciel CAPITOLE-EM utilisant la com-pression ACA et les mesures sur une maquette d’un avion simplifi é a été observée.

Mots clés : Adaptive Cross Approximation, ACA, câble, cavité, couplage, antenne, aéronef

INTRODUCTION

LE NOMBRE de passager embarquant dans les avions qui ont des appareils électroniques a considérablement augmenté durant la dernière décennie. L’utilisation des appareils électron-iques est généralement interdite pendant les phases critiques du vol en raison de leur pouvoir d’interférer avec les systèmes de l’avion. Toute-

fois, il est important d’étudier les IEM (Interférences Elec-tromagnétiques) assez tôt dans la phase de conception afi n de minimiser les eff ets possibles.


Couplages Entre Antennes Dans un Aéronef Par la Méthode Directe ACA

France

Nexio_FRA_EEG13.indd 6 11/16/12 4:17 PM

PASCAL DE RESSÉGUIERChef de projet chezEntares Engineering

YANNICK POIRÉ, SAMUEL LEMANIngénieurs Etudes & Simulations CEM Nexio

Résumé — Une étude approfondie des interférences électromagnétiques à l’intérieur d’un aéronef est désormais incontournable face à la récente augmentation des dispositifs électroniques à bord. Leurs eff ets sur la communication et les systèmes électroniques de l’appareil ont besoin d’être pris en compte en priorité lors de l’étape de conception. Des simula-tions numériques sont souvent utilisées afi n d’eff ectuer cette analyse. Cependant, la grande taille électrique des modèles à haute fréquence entraîne un temps de calcul et un espace mé-moire considérable. Bien qu’un certain nombre de méthodes itératives “rapides” existe, la structure en forme de cavité de l’aéronef pose des problèmes de convergence réduisant leur applicabilité pour ce type de problème. La méthode directe proposée résout le système linéaire de la Méthode des Mo-ments (MoM) en utilisant l’algorithme Adaptive Cross Ap-proximation (ACA) afi n de réduire la taille de la matrice et le temps de calcul. Contrairement aux solveurs itératifs “rapides,” une approche directe est eff ectuée afi n d’éviter les problèmes de convergence. Une bonne concordance entre les simulations du logiciel CAPITOLE-EM utilisant la com-pression ACA et les mesures sur une maquette d’un avion simplifi é a été observée.

Mots clés : Adaptive Cross Approximation, ACA, câble, cavité, couplage, antenne, aéronef

INTRODUCTION

LE NOMBRE de passager embarquant dans les avions qui ont des appareils électroniques a considérablement augmenté durant la dernière décennie. L’utilisation des appareils électron-iques est généralement interdite pendant les phases critiques du vol en raison de leur pouvoir d’interférer avec les systèmes de l’avion. Toute-

fois, il est important d’étudier les IEM (Interférences Elec-tromagnétiques) assez tôt dans la phase de conception afi n de minimiser les eff ets possibles.


Couplages Entre Antennes Dans un Aéronef Par la Méthode Directe ACA

France

Nexio_FRA_EEG13.indd 6 11/16/12 4:17 PM ADs_EEG13.indd 26 11/16/12 2:48 PM

France


Le fuselage d’un aéronef peut être assimilé à une cavité cylindrique en métal avec des ouvertures pour les fenêtres. Lorsqu’il est excité par une antenne, des résonances sur les champs électriques et magnétiques apparaissent à cer-taines fréquences et peuvent créer des interférences avec des équipements de l’appareil, entraînant des problèmes évident de sécurité.

Pour analyser ces effets de couplage, diverses méthodes ont été jusqu’à présent utilisées, telles que la Méthode des Différences Finies dans le Domaine Temporel [1] et la Mé-thode des Moments (MoM) [2] entre autres. Cependant, la fréquence de fonctionnement des appareils ainsi que la taille des aéronefs sont en augmentation, demandant ainsi un temps de calcul ainsi qu’un espace de mémoire prohibitifs.

Plusieurs méthodes dites « rapides » telles que AIM [3], MLFMA [4], MLMDA [5], et ACA [6] ont été développées afin de résoudre électriquement et de manière efficace de gros modèles traités par la méthode MoM. Toutes ces méthodes sont basées sur une approximation de la matrice d’impédances sous forme compressée, réduisant ainsi sa taille. Généralement, le système est résolu par un algorithme itératif, impliquant un produit matrice vecteur par itération. Grâce à la compression de la matrice d’impédances, le coût de calcul du processus de résolution est grandement réduit.

Bien que ces méthodes, et en particulier la MLFMA, sont très efficaces sur les gros problèmes électriques, il reste certains cas où les méthodes itératives ont une con-vergence lente ou voire même ne converge pas du tout. En général, il est difficile de prévoir la convergence d’un problème donné, mais les structures de type cavité sont communément difficiles à résoudre. La méthode présentée ici est basée sur la MoM-EFIE, celle-ci se traduit par une réduction significative du temps de calcul en évitant tout problème de convergence.

Dans la Section II, la compression de la matrice d’impédances avec l’utilisation de l’algorithme ACA est brièvement expliquée. La Section III décrit la factorisation avec un processus d’inversion directe. Enfin, la Section IV expose une comparaison de cette méthode avec la MoM classique et la MLFMA. Une validation avec des mesures

FIGURE 1: Décomposition du bloc

FIGURE 3: Modèle CAD

FIGURE 4: Maquette physique

FIGURE 2: Compression ACA


France


Le fuselage d’un aéronef peut être assimilé à une cavité cylindrique en métal avec des ouvertures pour les fenêtres. Lorsqu’il est excité par une antenne, des résonances sur les champs électriques et magnétiques apparaissent à cer-taines fréquences et peuvent créer des interférences avec des équipements de l’appareil, entraînant des problèmes évident de sécurité.

Pour analyser ces effets de couplage, diverses méthodes ont été jusqu’à présent utilisées, telles que la Méthode des Différences Finies dans le Domaine Temporel [1] et la Mé-thode des Moments (MoM) [2] entre autres. Cependant, la fréquence de fonctionnement des appareils ainsi que la taille des aéronefs sont en augmentation, demandant ainsi un temps de calcul ainsi qu’un espace de mémoire prohibitifs.

Plusieurs méthodes dites « rapides » telles que AIM [3], MLFMA [4], MLMDA [5], et ACA [6] ont été développées afin de résoudre électriquement et de manière efficace de gros modèles traités par la méthode MoM. Toutes ces méthodes sont basées sur une approximation de la matrice d’impédances sous forme compressée, réduisant ainsi sa taille. Généralement, le système est résolu par un algorithme itératif, impliquant un produit matrice vecteur par itération. Grâce à la compression de la matrice d’impédances, le coût de calcul du processus de résolution est grandement réduit.

Bien que ces méthodes, et en particulier la MLFMA, sont très efficaces sur les gros problèmes électriques, il reste certains cas où les méthodes itératives ont une con-vergence lente ou voire même ne converge pas du tout. En général, il est difficile de prévoir la convergence d’un problème donné, mais les structures de type cavité sont communément difficiles à résoudre. La méthode présentée ici est basée sur la MoM-EFIE, celle-ci se traduit par une réduction significative du temps de calcul en évitant tout problème de convergence.

Dans la Section II, la compression de la matrice d’impédances avec l’utilisation de l’algorithme ACA est brièvement expliquée. La Section III décrit la factorisation avec un processus d’inversion directe. Enfin, la Section IV expose une comparaison de cette méthode avec la MoM classique et la MLFMA. Une validation avec des mesures

FIGURE 1: Décomposition du bloc

FIGURE 3: Modèle CAD

FIGURE 4: Maquette physique

FIGURE 2: Compression ACA


FrancePoiré, Leman


répartition en deux groupes jusqu’à ce qu’un certain nombre d’éléments par groupe soit atteint.

Les blocs diagonaux, qui correspondent aux interactions des groupes sur eux-mêmes, sont calculés avec la méthode classique MoM alors que, les blocs n’appartenant pas à la diagonale, qui représentent l’interaction entre deux blocs bien distincts, sont calculés avec l’aide de l’Algorithme ACA.

L’algorithme ACA fut introduit par Bebendorf [7] afin de calculer une forme compressée de matrice de rang faible en utilisant que quelques éléments de la matrice originale. Par conséquent, chaque matrice bloc peut avoir une approxima-

sur maquette a aussi été effectuée.

L’ALgorithme de Compression ACALa méthode présentée ici est basée sur la compression

de la matrice d’impédances MoM en blocs. Le point majeur vient du fait que les matrices blocs, représentant des interac-tions entre deux groupes d’éléments spatialement éloignés, sont de rang faible.

Un algorithme de type arbre binaire est utilisé afin de subdiviser la matrice d’impédances en blocs (Figure 1). Les éléments sont successivement partagés suivant leur

FIGURE 5: Couplage S21 entre deux monopôles, comparaison entre ACA & MoM

FIGURE 6: Erreur ACA & MoM1e+008 2e+008 3e+008 4e+008 5e+008 6e+008 7e+008 8e+008 9e+008 1e+009

-180

-160

-140

-120

-100

-80

-60

-40

-20

Freq. (Hz)

|S21

| (dB

)

MoM

ACA

1e+008 2e+008 3e+008 4e+008 5e+008 6e+008 7e+008 8e+008 9e+008 1e+0090.0

0.5

1.0

1.5

2.0

2.5

Freq. (Hz)

Erre

ur A

CA

/ M

oM (%

)

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tion qui est représentée par le produit de deux matrices de plus petite taille:

M≈UV

On a M une matrice m×n, U une matrice m×k et V une matrice k×n avec k<<m,n, où k est le rang τ de la matrice bloc (Figure 2). L’erreur est contrôlée par un seuil τ qui détermine le moment où il faut arrêter de chercher plus de colonnes ou de lignes pour respectivement U et V. Il en résulte une réduction de la taille de mémoire et du temps de calcul. Cet algorithme est purement algébrique, il ne dépend donc pas du cœur d’équations intégrales et par conséquent, il peut être facilement intégré dans un code MoM existant.

Une re-compression SVD est faite sur la matrice gé-nérée par l’algorithme ACA afin d’obtenir une plus grande compression et avoir la matrice sous la forme SVD pour le processus de résolution. Un seuil SVD dix fois plus grand que celui d’ACA est choisi.

III. DecomposItIon bloc-luUne fois que la matrice compressée est calculée, une mé-

thode « directe » par bloc est utilisée. Bien qu’habituellement plus lente pour la résolution d’un vecteur incident que les méthodes accélérées itératives, la méthode directe évite des problèmes de convergence puisqu’elle trouve une solution en un temps prévisible. Sans oublier le temps supplémen-taire qui est négligeable si la solution de plusieurs vecteurs entrant est nécessaire, ce qui est en général le cas dans la plupart des applications.

En particulier, nous utilisons une factorisation LDLt par bloc pour matrices symétriques indéfinies, où L est une matrice triangulaire inférieure, D représente les blocs diagonaux et T correspond à la transposée de la matrice. Ceci est une généralisation de la factorisation de Cho-lesky, qui requiert une matrice définie positivement. Une représentation de cette décomposition lorsque la matrice est subdivisée en 3x3 blocs est présentée ci-dessous:

Z11 Z12 Z13

Z12 Z22 Z23

Z13 Z23 Z33

I 0 0L21 I 0L31 L32 I

D1 0 00 D2 00 0 D3

I L21 L31

0 I L32

0 0 I[ [= [ [] ] ] ]T T

T

où

Dj=Aii-∑ Ljk Dk Ljk

k=1

j-1

T

et

Lij= (Aij -∑ Lik Dk Ljk) Dj

j-1

k=1

T -1

La résolution est effectuée par une descente triangulaire suivie d’une remontée triangulaire afin d’obtenir la solution.

IV. ResultAtsAfin de valider la méthode de résolution en utilisant

l’algorithme de compression ACA nous avons effectué

FIGURE 7: Modèle de cabine avec fenêtres

TABLE 2: comparaison entre MLFMA & ACA

MLFMA ACA

Nombre d’inconnues 10378 10378

Nombre de Fréquences 501 501

Temps Total CPU 35h 4h 52min

Taux de Compression 93.7% 83.9%

FIGURE 8: Couplage S21 entre deux monopôles, comparaison entre ACA & MoM

3e+008 4e+008 5e+008 6e+008 7e+008 8e+008 9e+008 1e+009-150

-100

-50

0

Freq. (Hz)

|S21

| (dB

)

MLFMM

CAPITOLE-EM

FIGURE 9: Nombre d’itérations par fréquence en utilisant la MLFMA3e+008 4e+008 5e+008 6e+008 7e+008 8e+008 9e+008 1e+0090

50

100

150

200

250

300

350

400

450

500

Freq. (Hz)

Nbr

e ite

ratio

ns

TABLE 1: comparaison entre ACA & MoM

MoM ACA

Nombre d’inconnues 10221 10221

Nombre de Fréquences 451 451

Solveur LAPACK ACA-BlockLU

Temps Total CPU 30h 22min 3h 38min

Taux de Compression 0% 84.8%


FrancePoiré, Leman


La Figure 6. nous montre le pourcentage d’erreur entre les deux courbes, elles sont la plupart du temps en dessous de 1% et atteignent rarement 2.4% ce qui représente une dif-férence de 0.5dB contre une gamme dynamique supérieure à 100dB.

Dans le second test, le modèle de cylindre avec des fenêtres et un plancher est utilisé. Une comparaison avec la méthode MLFMA est alors réalisée.

La TABLE II. Synthétise les performances des deux méthodes. Même si la MLFMA a une meilleure compres-sion, le temps de calcul est beaucoup plus important. Cela est dû à la convergence des solveurs itératifs, en particulier pour les fréquences supérieures à 700MHz (voir Figure 9. ).

Notons que même dans le cas où la MLFMA atteint son niveau maximal d’itérations sans convergence, la valeur de couplage obtenue est très proche de celle actuelle, ce qui signifie que l’algorithme a pratiquement convergé.

C. Validation par mesuresLes mesures ont été réalisées sur le modèle en aluminium

complet.Le paramètre S21 a été mesuré entre une source

d’interférence et un récepteur avec un analyseur vectoriel (VNA).

Le premier cas représente un couplage entre deux monopôles sur le plancher de la cabine. La Figure 10. présente le résultat de la simulation et des mesures. Elle a l’aspect d’un couplage direct entre deux monopôles proches superposés aux résonances de la cavité.

Une bonne correspondance entre les mesures et la simu-lation peut être observée. Il reproduit convenablement le niveau moyen et les résonances. Le second cas mesure le couplage entre un monopôle placé à l’intérieur du cockpit et un câble qui s’étend du mur jusqu’à la cabine. La Figure 11, en dehors de la plage de fréquence autour de 510MHz, montre une bonne corrélation.

La longueur de la fente entre le plancher du cockpit et le cône tronqué est d’environ 29.5cm. Si l’on regarde la fréquence de résonance à λ / 2, nous obtenons 3e8/29.5e-2/2 = 508MHz, résonance qui apparaît dans la simulation. Il est légitime de penser que cette résonance est manquante dans les mesures à cause des cales de PVC utilisées pour supporter le plancher.

trois types de comparaisons: une avec la référence non-compressée de la méthode MoM, une autre avec la méthode rapide MLFMA et enfin une avec des mesures sur un modèle réduit et simplifié d’un avion.

A. Présentation du modèleLe modèle utilisé pour la validation représente un avion

inspiré du CASA CN-235 de EADS. Des formes simples ont été choisies afin de faciliter la fabrication physique du modèle. Néanmoins, les volumes ont été respectés selon une échelle fixe (Figure 3. )

Le fuselage simplifié est représenté par un cylindre d’une longueur de 150 cm et d’un diamètre de 47 cm. Le plancher de l’appareil se situe à 29 cm du haut du cylindre. Une série de petites ouvertures de chaque côté du cylindre ont été percées pour les fenêtres. Le cockpit est représenté par un cône tronqué de 27.3 cm de long, ajusté au cylindre au niveau de sa section la plus large et d’un diamètre opposé de 24 cm. Les ouvertures pour les fenêtres ont également été créées dans le cockpit. Un plancher a aussi été placé dans le cockpit à la même hauteur que dans la cabine. Notons qu’il y a un espace entre le plancher et le fuselage qui est obturé par deux cales longitudinales en PVC supportant le plancher.

Plusieurs monopôles de 2 cm sont placés à différents endroits à l’intérieur de la structure dans le but de modé-liser les antennes. Les câbles sont représentés par des fils conducteurs rectilignes connectés au plancher.

Le modèle a été construit en aluminium d’une épaisseur de 2 mm. (Figure 4. )

B. Validation numériqueLes simulations suivantes ont été réalisées sur un poste

de travail DELL PRECISION 690 avec un processeur quad-core Intel Xeon E5345 à 2.33GHz et 12GB de mémoire. Le logiciel CAPITOLE-EM d’Entares Engineering a été utilisé pour les simulations numériques.

Dans le premier cas, une comparaison est faite entre le modèle compressé ACA et la MoM conventionnelle. Dans ce cas-là, le modèle était simplement le cylindre comprenant deux monopôles à l’intérieur.

La taille de la matrice a été réduite de 84.8% alors que le temps de CPU était presque réduit par dix. (voir TABLE I. ).

Le résultat du couplage entre les deux monopôles est représenté sur la Figure 5. Un excellent accord est observé.

FIGURE 10: Couplage entre deux monopôles, mesures et comparaison ACA

FIGURE 11:Couplage entre un monopôle et un câble, mesures et comparaison ACA

1e+008 2e+008 3e+008 4e+008 5e+008 6e+008 7e+008 8e+008 9e+008 1e+009-90

-80

-70

-60

-50

-40

-30

-20

Freq. (Hz)

|S21

| (dB

)

Mesures

CAPITOLE-EM

1e+008 2e+008 3e+008 4e+008 5e+008 6e+008 7e+008 8e+008 9e+008 1e+009-80

-70

-60

-50

-40

-30

-20

Freq. (Hz)

|S21

| (dB

)

Mesures

CAPITOLE-EM


France


CONCLUSIONDans ce document, une méthode de résolution basée sur

l’algorithme ACA pour la compression de matrices issues de la Méthode des Moments a été décrite et appliquée aux études de couplages dans une cavité résonante. Une comparaison avec la méthode conventionnelle MoM a montré la bonne précision de la méthode. Dans ce cas en particulier, nous avons observé les diffi cultés de convergence de la MLFMA. Et enfi n, nous pouvons également noter une bonne concor-dance avec les mesures.

Ces dernières années, les méthodes dites “rapides” ont révolutionné les simulations électromagnétiques de façon spectaculaire, en réduisant le temps de calcul et la taille mémoire. Néanmoins, la méthode présentée, bien que moins effi cace sur de très gros modèles électriques, peut être intéres-sante pour des modèles de taille intermédiaire plus complexes comme ceux comportant des cavités par exemple.

REFERENCES• [1] K. S. Yee, “Numerical solution of initial boundary value

problems involving Maxwell’s equations in isotropic media,” IEEE Trans. Antennas Propagat., vol. AP-14, pp. 302–307, May 1966

• [2] R. F. Harrington, Field Computation by Moment Meth-ods, MacMillan, New York, 1968

• [3] E. Bleszynski, M. Bleszynski and T. Jaroszewicz, “Adap-tive Integral Method for Solving Large-scale Electromagnetic scattering and Radiation Problems, Radio Science, vol.31, no.5, pp1225-1251, 1996, Sep.-Oct.

• [4] J. Song, C.C. Lu and W.C. Chew, “Multilevel Fast Multipole Algorithm for Electromagnetic Scattering by Large Complex Objects”, IEEE Trans. On Antennas and Propag., Vol. 45, No. 10, pp. 1488-1493, October 1997.

• [5] E. Michielsen and A. Boag, “A multilevel matrix decom-position algorithm for analyzing scattering from large struc-tures”, IEEE Trans. on Antennas and Propag., Vol. 44, No. 8. 1086-1093, Aug. 1996.

• [6] K. Zhao, M. Vouvakis, and J.-F. Lee, “The adaptive cross approximation algorithm for accelerated method of moment computations of emc problems”, IEEE Trans. on Electromag-netic Compatibility, vol. 47, no. 4, pp. 763–773, Nov. 2005.

• [7] M. Bebendorf “Approximation of boundary element matrices”, Numer. Math., vol. 86, pp.565 - 589, 2000

Nexio_FRA_EEG13.indd 12 11/16/12 4:19 PM ADs_EEG13.indd 27 11/16/12 2:48 PM

ADs_EEG13.indd 27 11/16/12 2:48 PM

ADs_EEG13.indd 28 3/13/13 2:01 PM

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ADs_EEG13.indd 28 11/16/12 2:49 PM


ITALIA


Contents | Italia

Guglielmo Marconi fu un famoso inventore italiano noto come “il padre della trasmissione radio a lunga distanza”. Gli è stata spesso attribuita l’invenzione della radio. Marconi iniziò i suoi esperimenti di laboratorio sulle frequenze radio nel 1895. Creò un sistema e condusse esperimenti con l’obiettivo di utilizzare le onde radio per la trasmissione dei messaggi telegra ci senza li. Inviò con successo segnali senza li a una distanza di circa 2,4 chilometri e gli fu concesso il primo brevetto al mondo per un sistema di telegra a senza li. Nel 1901 Marconi utilizzò il suo sistema per trasmettere i primi segnali senza li al di là dell’Oceano Atlantico, da Poldhu in Cornovaglia a St. John’s in Terranova, a una distanza di oltre 3300 chilometri. Marconi ricevette nel 1909 il Premio Nobel per la sica per il suo contributo allo sviluppo della telegra a senza li. Costituì la Wireless Telegraph & Signal Company in Gran Bretagna nel 1897.

GuglielmoMarconi (1874–1937)

PRODOTTI E SERVIZI

RISORSE

ARTICOLO Impatti Potenziali Delle Armi Elettromagnetiche Sulle Infrastrutture Critiche (Situazione al 2012) DOTT. WILLIAM A. RADASKY, Membro a vita dell’IEEE

96

97

98

ITL_TOC_EEG13.indd 95 11/16/12 4:22 PM

Italia | Prodotti e Servizi


A

A.H. Systems, Inc.NARDA Safety Test Solutions s.r.L., Via Leonardo Da Vinci 21/23, 20090, Segrate (MI), Italia; +39-02-22699871; Fax: +39-02-26998700; [email protected]; www.AHSystems.comTESEO S.p.A., C.so Alexander Flemming, 25/27/29, 10040, Druento, Italia; +39-011-9941911; Fax: +011 39-011-9941900; [email protected]; www.AHSys-tems.comProdotti e servizi: Antenne, Strumentazione per test, Test

AR / RF Microwave InstrumentationTeseo S.p.A., C.so Alexander Fleming, 25/27/29, Druento, Italia 10040; +39 01 19941911; Fax: +39 01 19941900; Stefano Serra, [email protected],; www.teseo.netProdotti e servizi: Amplificatori, Antenne, Cavi e con-nettori, Stanze e spazi schermati, Oscillazioni di tensione e sovratensioni temporanee, Strumentazione per test

AFJ INTERNATIONAL SrlVia G. Watt, Milano, 12 -20143 Italia; +39 02 89159140; Fax: +39 02 89159226; [email protected]; www.afj.itProdotti e servizi: Filtri, Strumentazione per test

Arrow Europeviale F.testi 280 20126 Milano; +39 02 66 12 51; Fax: +39 02 66 10 5156; www.ar-roweurope.comProdotti e servizi: Ferriti, Cavi e connettori, applica-zioni di potenza

C

Carlisle Interconnect TechnologiesUnited Kingdom; +44-7817-731-000; Andy Bowne, [email protected]; www.CarlisleIT.comProdotti e servizi: Filtri

E

EM Test AGVolta S.p.A., Via del Vigneto 23, 39100 Bolzano, Italia; +39 04 71561120; Fax: +39 04 71561100; [email protected]; www.volta.itProdotti e servizi: Oscillazioni di tensione e sovraten-sioni temporanee, Strumentazione per test, Test

EMC PartnerAFJ Istruments Srl, Mr. Marco Mozzi, Via Corno di Cavento 5; IT - 20148 Milano Italia; +39 02 91434850; Fax: +39 02 91434877; [email protected]; www.afj-instruments.com Prodotti e servizi: Oscillazioni di tensione e sovraten-sioni temporanee, Strumentazione per test

ETS - LindgrenUnit 4, Eastman Way, Pin Green Industrial Area, Stevenage, Hertfordshire, SG1 4UH, United Kingdom; +44(0)1438 730700; Fax: +44(0)1438 730750; [email protected]; www.ets-lindgren.com Prodotti e servizi: Antenne, Cavi e connettori, Filtri, Stanze e spazi schermati, Schermatura, Strumentazione per test, Test

F

Fair-Rite Products Corp.Schaffner EMC Srl, Via Galileo Galile1,471-20092 Cinise-llo Balsamo (MI), Italia; +39 02 66043045; Fax: +39 02 6123943; [email protected], Via Delle Imprese, 44/46 Ang Murari, Brembate Sotto 24041 Italia; +39 03 54874010; Fax: +39 03 54826473; [email protected]; www.fair-rite.comProdotti e servizi: Ferritici, Filtri, Stanze e spazi schermati, Stanze e spazi schermati

Federal-Mogul CorporationVia Reiss Romoli 122/11, 10148 Torino; +39 011 22 63 016; Fax: + 39 011 22 63 016; [email protected]; www.federalmogul.com/spProdotti e servizi: Schermatura; Cavi

Finmotor srlVia Edison, 217, 20019 Settimo Milanese, (Milano) – Italia; +39 02 48910020; Fax: +39 02 48910053; [email protected]; http://finmotor.comProdotti e servizi: Filtri

G

Ghiringhelli MarioVia Luigi Riva, 10 - 21013 Gallarate - (VA) Italia; +39 03 31 70 05 25; Fax: +39 03 31 70 05 26; [email protected]; www.ghiringhellimario.comProdotti e servizi: Schermatura

PRODOTTI e SERVIZI

Italia | Prodotti e Servizi

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Prodotti e Servizi | Risorse | Italia


Gowanda ElectronicsSincron SRL; Via Aldo Moro 55, Gessate (MI), Italia, 20060; +39 02 95384218; Fax: + 39 02 95384210; [email protected]; www.sincron.it. Prodotti e servizi: induttori

H

Haefely EMC DivisionInsitec Elettronica S.r.l., Via del parco degli Scout 7, 20091 - Bresso - Milano, Italia; +39 02 66501075; +39 02 66501096; Roberto Landrisci-na, [email protected]; www.insitec.itProdotti e servizi: Oscillazioni di tensione e sovraten-sioni temporanee, Strumentazione per test

a TESEQ CompanyIFI - Instruments for Industry L.P. Instruments, Rome Office, 00155 Roma (RM) - Via Bardanzellu, 46; +39 06 40800491; Fax: +39 06 40800493; [email protected]; www.lpinstruments.it, Trezzano Office, 20090 Trezzano Sul Naviglio (MI) - Viale Leonardo da Vinci, 255/a; +39 02 48401713; Fax: +39 02 48401582; [email protected]: www.lpinstruments.itProdotti e servizi: Amplificatori a RF e microonde ad alta potenza (Tetrode Tubes, Solid State and TWT)

Instec FiltersMilano Brothers; Via Enrico Fermi 79, Roma, Italia, 00146; +39 (0) 6888 16531; Fax: +39 (0) 33849 69298; Uriel Perugia, [email protected]; www.milanobro.com.Prodotti e servizi: FiltriSpec Tec SRL; Viale Abruzzi, 87, Milano, Italia, 20131; +39 (0) 2294 03186; Fax: +39 (0) 34844 12911; Paolo Franciosi, [email protected]; www.stspectec.it.Prodotti e servizi: FiltriTechnopartner; Via delle impresse, 44/46, Brembarte BG, Italia, 24041; +39 (0) 3548 74010; Fax: +39 (0) 3548 26473; Danilo Corsini, [email protected]; www.technopartner.it.Prodotti e servizi: Filtri

International Business DevelopmentVia San Rocco, 8/a, 25032 Chiari (BS), Italia; +39 03 07100618; Fax: +39 03 07002803; [email protected]; www.ibdonline.itProdotti e servizi: Test

L

LP InstrumentsMilano: Via Via Leonardo Da Vinci, 255A, 20090 Trezzano sul Naviglio (MI) Italia; +39 02 48401713; Fax: +39 02 48401852; [email protected]; www.lpinstruments.itRoma: Viale Battista Bardanzellu, 46, 00155 Roma Italia; +39 06 40800491; Fax: +39 06 40800493; [email protected]; www.lpinstruments.itProdotti e servizi: Test

M

a TESEQ CompanyMILMEGANarda Safety Test Solutions S.r.l.; Via Leonardo da Vinci, 21/23, 20090 Segrate (Milano); +39 02 2699871; Fax: +390226998700; [email protected]; www.narda-sts.itProdotti e servizi: Amplificatori a RF e microonde ad alta potenza

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Narda Safety Test Solutions S.r.l.Via Leonardo da Vinci, 21/23 - 20090 Segrate (Milano), Italia; +39 02 2699871; Fax: +39 02 26998700; Roberto Grego; [email protected]; www.narda-sts.itProdotti e servizi: Amplificatori, Antenne, Strumen-tazione per test

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Schlegel Electronic MaterialsSirces Srl, Via C. Boncompagni 3/B, 20139 Milano Italia; +39 02 55231395; Fax: +39-0256816112; Mario Crippa, [email protected]; www.sirces.itProdotti e servizi: Materiali conduttivi, Schermatura

Soliani EMC SRLVia Varesina 122, 22100 Como, Italia; +39 03 15001112; Fax: +39 03 1505467; [email protected];www.solianiemc.comProdotti e servizi: Materiali conduttivi, Stanze e spazi schermati, Schermatura

T

Tech-Etch, Inc.Sirces Srl. Italia, Via C. Boncompagni 3/B, 20139 Milano - MI, Italia; +39 02 55231395; Fax: +39 02 56816112; [email protected]; www.tech-etch.comProdotti e servizi: Materiali conduttivi, Scher-matura

Technopartner srlVia Delle Imprese, 44/46, 24041, Brembate Sotto (BG), Italia; +39 035 4874010; Fax: +39 035 4826473; [email protected]; www.technopartner.itProdotti e servizi: Schermatura

TEMAS EngineeringVia Milano 72, 22070 Bregnano CO, Italia; +39 031 772348; Fax: +39 031 773897; [email protected]; www.temas.itProdotti e servizi: SchermaturaTESEO S.p.A. Corso Alexander Fleming, 25/27/29 10040 Druento (TO) Italia; +39 011 9941911; Fax: +39 011 9941900; [email protected]; www.teseo.netProdotti e servizi: Test


Teseq Ltd.Narda Safety Test Solutions S.r.l.; Via Leonardo da Vinci, 21/23, 20090 Segrate (Milano); +39 02 2699871; Fax: +39 02 26998700; [email protected]; www.narda-sts.itProdotti e servizi: Amplifiers (RF & Microwave), Antenne, sistemi automotive, Immunità RF, Picco di e transitori, ESD, Armoniche e Flicker, GTEM-cel-lule, sistemi di immunità RF, RF Emission Systems, RF Testsoftware, Taratura e Servizi

RISORSEIEE EMC SOCIETY ITALIA CHAPTERUniversità degli Studi dell’Aquila, Via G. Gronchi 18, 67100, L’Aquila, Italia; +39 320-923116, Fax: Fax: +39 0862-701979; Chairman Giulio Antonini, [email protected]; ing.univaq.it/emc-chap-it

CEI - COMITATO ELETTROTECNICO ITALIANOVia Saccardo, 9- 20134, Milano, Italia; +02 21006 226; Fax: +02 21006 222; Punto Vendita, [email protected]; www.ceiweb.it

MINISTERO DELLO SVILUPPO ECONOMICOVia Molise 2, 00187 Roma, Italia; +39 06 4705 1; Fax: +39 06 4788 7748; www.sviluppoeconomico.gov.it/index.php

ITL_PS_R_EEG13.indd 111 11/16/12 7:53 PM

DOTT. WILLIAM A. RADASKYMembro a vita dell'IEEE

COS'È LA IEMI?

NEGLI ULTIMI ANNI, diverse opere holly-woodiane hanno suggerito che criminali e terroristi potrebbero avvalersi di armi elettromagnetiche, ad esempio per cau-sare un blackout in una parte di Las Vegas ("Ocean's 11") o per mettere fuori uso un centro informatico antiterrorismo ("24").

Si tratta di pura fi nzione o di un'eventualità concreta? Ebbene, in questo caso Hollywood sta aiutando l'opinione pubblica e le forze di polizia a comprendere le possibilità di una simile minaccia. In quanto frutto di fantasia, tuttavia, questi due esempi sono estremi, dal momento che preve-dono l'uso di un grande generatore per collegarsi ai cavi di una cabina elettrica o di un congegno esplosivo nel baule di un'automobile. Nessuna di queste situazioni rispecchia i modi in cui, probabilmente, le armi elettromagnetiche sarebbero utilizzate contro infrastrutture critiche.

Alla fi ne degli anni '90, due stimate organizzazioni scien-tifi che e tecniche internazionali hanno mosso i primi passi per capire se le armi elettromagnetiche rappresentino una minaccia per la società. Nel 1999, nel corso della propria as-semblea generale a Ottawa, in Canada, l'URSI (Unione Radio Scientifi ca Internazionale) ha approvato una risoluzione che imponeva a scienziati e ingegneri di prendere sul serio tale minaccia e di lavorare per tutelarci da essa. Nello stesso anno, l'IEC SC 77C (sottocomitato 77C della Commis-sione Elettrotecnica Internazionale) ha ampliato il proprio campo di lavoro, iniziando a redigere rapporti e norme relativi a quello che in origine era stato defi nito terrorismo elettromagnetico, successivamente ribattezzato Intentional Electromagnetic Interference (IEMI, interferenza elettro-magnetica intenzionale). La IEMI è stata formalmente defi nita come segue: "Generazione intenzionale e dolosa di energia elettromagnetica, che introduce disturbi o segnali negli impianti elettrici ed elettronici interrompendone il funzionamento, disorientandoli o danneggiandoli a fi ni terroristici o criminali."

Il motivo per cui tale minaccia è emersa negli ultimi anni è duplice. Innanzitutto, la potenza dell’elettronica a stato solido consente lo sviluppo di armi elettromagnetiche, che producono elevati livelli di potenza di picco in impulsi a dimensione temporale molto breve; dal momento che


Impatti Potenziali Delle ArmiElettromagnetiche Sulle Infrastrutture

Critiche (Situazione al 2012)

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Radasky_ITL_EEG13.indd 6 11/16/12 4:28 PM ADs_EEG13.indd 29 11/16/12 2:49 PM

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l'obiettivo di queste armi è produrre campi elettrici e magnetici a picco ele-vato, l'energia contenuta negli impulsi non è altrettanto importante. Ciò con-sente l'utilizzo di una fonte di energia di piccole dimensioni per alimentare le armi. In secondo luogo, l'elettronica commerciale e i computer moderni operano con microprocessori con velocità di clock misurate in GHz e a basse tensioni di funzionamento in-terne e sono pertanto potenzialmente più sensibili a interferenze e danni causati da armi elettromagnetiche nello stesso intervallo di frequenza e tensione.

Alcuni casi di minacce/attacchi con IEMI sono stati ampiamente documentati, ma molti altri non sono resi pubblici a causa dell'imbarazzo di chi li ha subiti o per motivi di sicurezza. Ecco alcuni esempi.

1. In Giappone, due criminali della Yakuza sono stati sorpresi a utilizzare un'arma elettromagnetica su una mac-china Pachinko (tipo slot machine) per determinare una falsa vincita.

2. A San Pietroburgo, in Russia, un criminale si è avvalso di un'arma elettromagnetica per disattivare l'impianto di allarme di una gioielleria e perpetrare un furto.

3. A Londra, una banca è stata oggetto di un tentativo di estorsione, con la minaccia di utilizzare un'arma elettro-magnetica sui suoi impianti.

4. A Mosca, un centro di telecomunicazioni è stato at-taccato e messo fuori uso per 24 ore, lasciando 200.000 clienti senza servizio.

5. A inizio marzo 2011, la città di Seul, in Corea del Sud, è stata attaccata con un'interferenza elettronica che ha disattivato numerosi impianti GPS utilizzati in campo industriale. Inoltre, l'esercito sudcoreano segnalò che l’interferenza aveva avuto conseguenze negative su alcuni dei suoi impianti. A inizio 2012 è stato segnalato che gli impianti GPS nella zona dell'aeroporto internazionale di Incheon, sempre in Corea del Sud, stavano subendo un at-tacco mediante interferenza elettronica e che le compagnie aeree erano state allertate.

INTRODUZIONE Le armi elettromagnetiche si dividono in due categorie:

irradiate e condotte. Entrambi i tipi sono dotati di fonte di energia (ad esempio una batteria), di un generatore a stato solido che produce tensioni elevate con rapida variazione nel tempo e, in alternativa, di un'antenna progettata per propagare tali campi a una certa distanza dall'arma (campi irradiati) o di un collegamento ai cavi di un impianto (ten-sioni condotte). I campi irradiati sono più fl essibili (per chi attacca), ma decrescono rapidamente all'allontanarsi dall'arma. Le armi condotte richiedono un collegamento a una fonte di alimentazione o a linee dati esterne a un edifi cio, ma l'intera tensione prodotta viene trasmessa ai circuiti sotto attacco. Si potrebbe pensare che una minaccia tramite arma condotta non sia temibile; al contrario, è stato verifi cato che molti edifi ci hanno cabine dati non protette

e prese elettriche esterne all'aperto. Inoltre, chiunque ab-bia esperienza in materia di impianti di alimentazione può stabilire un collegamento alle emissioni a bassa tensione dei trasformatori che portano all'interno degli edifi ci.

La fi gura 1 illustra il processo di base per "accoppiare" i campi irradiati da un'arma elettromagnetica in un edifi cio. I campi elettromagnetici indurranno tensioni e correnti sui cavi esterni e interni (per questi ultimi sono importanti le proprietà di schermatura dell'edifi cio). Tali tensioni rag-giungeranno gli apparecchi elettronici, che spesso non sono in grado di tollerarne il livello. Posizionare elementi di protezione delle linee (relè di massima/fi ltri di sovra-tensione) all'ingresso dei cavi esterni all'edifi cio e inserire una schermatura elettromagnetica nelle pareti dello stesso garantirà una certa protezione da questo tipo di minaccia (maggiori dettagli a seguire).

Per quanto riguarda le infrastrutture critiche (impianti elettrici, di telecomunicazione, fi nanziari, acqua, gas na-turale, eccetera), quasi tutte sono controllate da computer sempre più sofi sticati. Ad esempio, gli impianti elettrici dei paesi sviluppati stanno installando wattmetri digitali intel-ligenti in edifi ci privati e commerciali, insieme a impianti di comunicazione per interpretare i dati. Inoltre, gli impianti di energia rinnovabile distribuiti necessitano di ulteriori sensori che ne stabiliscano lo stato di funzionamento, cosic-ché la rete possa operare in modo effi ciente. L'aumento della quantità di informazioni da elaborare e i requisiti di comunicazione correlati rendono il sistema più vulnerabile da parte di coloro che intendono creare problemi (che si tratti di pirati informatici, criminali o terroristi).

Sebbene la sicurezza sia sempre un aspetto importante per le infrastrutture critiche, va ricordato che le serrature e le recinzioni non costituiscono un ostacolo per le armi elettromagnetiche. Inoltre, l'autore di un attacco può tentare ripetutamente di mandare in tilt una struttura fi nché non ci riesce perché nessuno si renderà conto di cosa sta acca-dendo fi nché non verranno osservati problemi ai computer.

Fig. 1. Uno scenario delle interazioni IEMI.

Radasky_ITL_EEG13.indd 8 11/16/12 4:28 PM

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l'obiettivo di queste armi è produrre campi elettrici e magnetici a picco ele-vato, l'energia contenuta negli impulsi non è altrettanto importante. Ciò con-sente l'utilizzo di una fonte di energia di piccole dimensioni per alimentare le armi. In secondo luogo, l'elettronica commerciale e i computer moderni operano con microprocessori con velocità di clock misurate in GHz e a basse tensioni di funzionamento in-terne e sono pertanto potenzialmente più sensibili a interferenze e danni causati da armi elettromagnetiche nello stesso intervallo di frequenza e tensione.

Alcuni casi di minacce/attacchi con IEMI sono stati ampiamente documentati, ma molti altri non sono resi pubblici a causa dell'imbarazzo di chi li ha subiti o per motivi di sicurezza. Ecco alcuni esempi.

1. In Giappone, due criminali della Yakuza sono stati sorpresi a utilizzare un'arma elettromagnetica su una mac-china Pachinko (tipo slot machine) per determinare una falsa vincita.

2. A San Pietroburgo, in Russia, un criminale si è avvalso di un'arma elettromagnetica per disattivare l'impianto di allarme di una gioielleria e perpetrare un furto.

3. A Londra, una banca è stata oggetto di un tentativo di estorsione, con la minaccia di utilizzare un'arma elettro-magnetica sui suoi impianti.

4. A Mosca, un centro di telecomunicazioni è stato at-taccato e messo fuori uso per 24 ore, lasciando 200.000 clienti senza servizio.

5. A inizio marzo 2011, la città di Seul, in Corea del Sud, è stata attaccata con un'interferenza elettronica che ha disattivato numerosi impianti GPS utilizzati in campo industriale. Inoltre, l'esercito sudcoreano segnalò che l’interferenza aveva avuto conseguenze negative su alcuni dei suoi impianti. A inizio 2012 è stato segnalato che gli impianti GPS nella zona dell'aeroporto internazionale di Incheon, sempre in Corea del Sud, stavano subendo un at-tacco mediante interferenza elettronica e che le compagnie aeree erano state allertate.

INTRODUZIONE Le armi elettromagnetiche si dividono in due categorie:

irradiate e condotte. Entrambi i tipi sono dotati di fonte di energia (ad esempio una batteria), di un generatore a stato solido che produce tensioni elevate con rapida variazione nel tempo e, in alternativa, di un'antenna progettata per propagare tali campi a una certa distanza dall'arma (campi irradiati) o di un collegamento ai cavi di un impianto (ten-sioni condotte). I campi irradiati sono più fl essibili (per chi attacca), ma decrescono rapidamente all'allontanarsi dall'arma. Le armi condotte richiedono un collegamento a una fonte di alimentazione o a linee dati esterne a un edifi cio, ma l'intera tensione prodotta viene trasmessa ai circuiti sotto attacco. Si potrebbe pensare che una minaccia tramite arma condotta non sia temibile; al contrario, è stato verifi cato che molti edifi ci hanno cabine dati non protette

e prese elettriche esterne all'aperto. Inoltre, chiunque ab-bia esperienza in materia di impianti di alimentazione può stabilire un collegamento alle emissioni a bassa tensione dei trasformatori che portano all'interno degli edifi ci.

La fi gura 1 illustra il processo di base per "accoppiare" i campi irradiati da un'arma elettromagnetica in un edifi cio. I campi elettromagnetici indurranno tensioni e correnti sui cavi esterni e interni (per questi ultimi sono importanti le proprietà di schermatura dell'edifi cio). Tali tensioni rag-giungeranno gli apparecchi elettronici, che spesso non sono in grado di tollerarne il livello. Posizionare elementi di protezione delle linee (relè di massima/fi ltri di sovra-tensione) all'ingresso dei cavi esterni all'edifi cio e inserire una schermatura elettromagnetica nelle pareti dello stesso garantirà una certa protezione da questo tipo di minaccia (maggiori dettagli a seguire).

Per quanto riguarda le infrastrutture critiche (impianti elettrici, di telecomunicazione, fi nanziari, acqua, gas na-turale, eccetera), quasi tutte sono controllate da computer sempre più sofi sticati. Ad esempio, gli impianti elettrici dei paesi sviluppati stanno installando wattmetri digitali intel-ligenti in edifi ci privati e commerciali, insieme a impianti di comunicazione per interpretare i dati. Inoltre, gli impianti di energia rinnovabile distribuiti necessitano di ulteriori sensori che ne stabiliscano lo stato di funzionamento, cosic-ché la rete possa operare in modo effi ciente. L'aumento della quantità di informazioni da elaborare e i requisiti di comunicazione correlati rendono il sistema più vulnerabile da parte di coloro che intendono creare problemi (che si tratti di pirati informatici, criminali o terroristi).

Sebbene la sicurezza sia sempre un aspetto importante per le infrastrutture critiche, va ricordato che le serrature e le recinzioni non costituiscono un ostacolo per le armi elettromagnetiche. Inoltre, l'autore di un attacco può tentare ripetutamente di mandare in tilt una struttura fi nché non ci riesce perché nessuno si renderà conto di cosa sta acca-dendo fi nché non verranno osservati problemi ai computer.

Fig. 1. Uno scenario delle interazioni IEMI.


ItaliaRADASKY


potente è stato sviluppato dall'aeronautica statunitense a fi ni di ricerca. Si chiama simulatore JOLT e le sue capacità sono state illustrate negli atti dell'IEEE del luglio 2004. Una fotografi a del generatore è riportata nella fi gura 2.

BACKGROUND TECNICO Caratteristiche delle armi elettromagnetiche

Per comprendere le minacce alle apparecchiature elettroniche, è necessario conoscere i diversi tipi di ambi-ente elettromagnetico che possono essere prodotti e sono in grado di creare problemi di funzionamento alle apparec-chiature esposte. Ci sono due categorie basilari di ambienti elettromagnetici di interesse: a banda stretta e a banda larga. Come già ricordato, ci sono anche due modi fondamentali di trasmettere tale energia a un impianto: per irradiazione e per conduzione.

Una forma d'onda a banda stretta è quasi una frequenza singola (solitamente una larghezza di banda inferiore all'1% della frequenza centrale) di energia trasmessa in un arco di tempo stabilito (da 100 nanosecondi a pochi microsecondi). Alcuni degli ambienti in questa categoria includono la modulazione delle onde sinusoidali, frequenze variabili e persino applicazioni ripetitive. Solitamente questa catego-ria di minaccia è indicata come microonde ad alta potenza (HPM, High Power Microwaves), sebbene il termine in senso lato includa le frequenze al di fuori dell'intervallo delle microonde.

Una forma d'onda a banda larga – a volte defi nita a banda ultralarga (UWB, Ultra Wide Band) o a impulso breve (SP, Short Impulse) – di solito implica la trasmissione di un impulso a dimensione temporale, spesso in modo ripeti-tivo. Il termine "banda larga" di solito indica che la potenza della forma d'onda viene prodotta su una gamma di frequenze sostanziale relativa alla "frequenza centrale". Ovviamente, molte forme d'onda dell'impulso non hanno una frequenza cen-trale esplicita e la comunità tecnica ha deciso che fossero necessarie defi nizioni migliori in relazione alla questione. La IEC ha defi nito nuovi termini per descrivere le forme d'onda a banda larga: me-sobanda, subiperbanda e iperbanda [61000-2-13].

In termini di vulnerabilità degli impianti, la banda stretta ha solitamente potenza molto elevata, dal momento che l'energia elettrica viene trasmessa in una banda a frequenza ristretta. È piuttosto facile trasmettere campi dell'ordine di migliaia di volt/metro a una singola frequenza. Spesso i malfunzi-onamenti osservati nelle apparecchiature di test con forme d'onda a banda stretta sono sintomo di danni permanenti.

La minaccia a banda larga è leggermente di-versa da questo punto di vista. Dal momento che un impulso a dimensione temporale produce en-ergia su molte frequenze contemporaneamente, l'energia prodotta su ogni singola frequenza è molto inferiore. Ciò signifi ca che la probabilità di danni è inferiore che nella banda stretta. Sorgenti che sono state realizzate sono in grado di produrre impulsi ripetitivi fi no a un milione al secondo e possono continuare per diversi secondi o minuti, aumentando in tal modo la probabilità di indurre un malfunzionamento degli impianti. Alcuni di questi malfunzionamenti possono interferire con le comunicazioni di dati, causando un modo diverso di interruzione dei servizi.

Un generatore a banda larga estremamente

Fig. 2. Il generatore JOLT produce un campo elettrico con tempi di gamma di picco pari a 5,3 MV, una larghezza di impulso di 1 ns e un tasso di ripetizione di 600 impulsi al secondo.


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Vulnerabilità dei prodotti elettronici commerciali Negli ultimi quindici anni ci sono stati numerosi esperi-

menti volti a testare la risposta delle apparecchiature com-merciali a minacce a banda stretta e larga analoghe a quelle della IEMI. In generale, questi test si sono concentrati sui personal computer (e sulle relative reti), dal momento che sono largamente utilizzati in molti settori diversi. Inoltre, i test hanno riguardato sportelli bancomat, dispositivi di controllo industriale, generatori, componenti Ethernet, reti WiFi, automobili, elettronica GPS, telefoni cellulari, palmari e diversi tipi di sensori. Molti articoli di giornale e relazioni di conferenze descrivono i dettagli di tali esperimenti, per-tanto in questa sede ci limiteremo a riassumere i risultati.

I moderni computer e altri tipi di apparecchiature che si avvalgono di microprocessori sembrano essere soggetti a malfunzionamenti dovuti a campi magnetici a banda stretta irradiati al di sopra di 30 V/m, sebbene i più moderni PC ad alta velocità presentino livelli di suscettibilità superiori (~300 V/m). Sembrano esserci notevoli variazioni nella risposta delle apparecchiature, a seconda delle specifi che impostazioni degli esperimenti e della qualità degli invo-lucri delle apparecchiature stesse. Inoltre, i test eff ettuati entro la gamma 1 - 10 GHz sembrano indicare che i mal-funzionamenti si verifi cano a livelli di campo inferiori e a frequenze più basse.

Test sui campi irradiati a banda larga sono stati condotti anche da scienziati russi, svedesi, tedeschi e statunitensi. I test su apparecchiature elettroniche delle dimensioni di un computer indicano che i livelli di picco del campo elettrico di ~2 kV/m per impulsi con ampiezze dell'ordine di 200 ps creano problemi all'elettronica (rendendo necessario un hard reset), con danni che si verifi cano nella gamma 5 kV/m. La fi gura 3 mostra un esempio di danno a un circuito stampato dovuto a una tensione a impulsi che rappresenta l'accoppiamento a un cavo Ethernet metallico.

Va osservato che questi esperimenti, di solito, sono ef-fettuati esponendo direttamente le apparecchiature testate all'antenna che irradia. Chiaramente, se l'apparecchiatura è all'interno di un edifi cio o in una stanza priva di fi nestre, ci sarà una riduzione del campo incidente dall'esterno all'interno (a seconda di come è costruito il muro). Ancora, nella maggior parte degli esperimenti non sono stati esa-minati approfonditamente la polarizzazione e l'angolo di incidenza (per questioni di tempi e costi) e pertanto molti degli eff etti osservati durante i test possono verifi carsi

anche a livelli di campo inferiori, se la geometria di accop-piamento è ottimale.

Per le minacce IEMI condotte, sembra evidente che se l'autore dell'attacco ha accesso a cabine di telecomunicazi-one o cavi di alimentazione esterni, gli risulterebbe facile riversare segnali dannosi su un edifi cio. Per le forme d'onda a impulsi, sembra che le ampiezze di impulso dell'ordine di 100 microsecondi possano creare danni ai generatori delle apparecchiature e ai circuiti stampati di interfaccia a livelli fi no a un minimo di 500 volt, ma solitamente intorno ai 2 - 4 kV.

Relazione con gli standard di immunità EMC della IEC Anche se questi valori di guasto possono sembrare

bassi rispetto alle capacità delle armi elettromagnetiche, non devono sorprendere. Quando si esaminano i requisiti di immunità della IEC per i test di compatibilità elettro-magnetica (EMC) nelle applicazioni quotidiane, è insolito trovare un requisito con livello di campo irradiato a banda stretta superiore a 10 V/m (per frequenze superiori a 80 MHz). Livelli superiori sono sconsigliati per applicazioni domestiche o industriali, per via dei costi necessari per garantire una maggior protezione.

Per quanto riguarda i transitori condotti a banda larga, gran parte dei test rapidi di EMC svolti sui transitori di illuminazione ed elettrici si limitano a livelli fi no a 2 kV. Solo in casi speciali, ad esempio per le apparecchiature di uno stabilimento di produzione di energia o di una cabina, i livelli delle prove di immunità saranno più alti. Le tipiche forme d'onda dei test a banda larga condotti sull'EMC (come l'EFT) hanno tempi di salita fi no a 5 ns e ampiezze di im-pulso fi no a 700 millisecondi (ad es. 61000-4-5). L'ampiezza di impulso più stretta per l'EMC è pari a 50 ns, molto mag-giore di quella della tipica minaccia IEMI.

Pertanto è chiaro che i livelli di immunità alle interfer-enze elettromagnetiche dei prodotti elettronici commerciali sono bassi rispetto ai loro apparenti livelli di sensibilità agli ambienti elettromagnetici IEMI. Ciò indica che i normali livelli di protezione non sono suffi cienti per le interferenze intenzionali. Inoltre, un generatore come JOLT può pro-durre 50 kV/m a fi no a una distanza di 100 metri. Questo signifi ca, per la maggior parte dei prodotti elettronici non protetti, danni di entità 10 volte superiore.

Fig. 3. Capacitore danneggiato su una scheda di interfaccia di rete.

Fig. 4. Esempio di rilevatore IEMI.


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Vulnerabilità dei prodotti elettronici commerciali Negli ultimi quindici anni ci sono stati numerosi esperi-

menti volti a testare la risposta delle apparecchiature com-merciali a minacce a banda stretta e larga analoghe a quelle della IEMI. In generale, questi test si sono concentrati sui personal computer (e sulle relative reti), dal momento che sono largamente utilizzati in molti settori diversi. Inoltre, i test hanno riguardato sportelli bancomat, dispositivi di controllo industriale, generatori, componenti Ethernet, reti WiFi, automobili, elettronica GPS, telefoni cellulari, palmari e diversi tipi di sensori. Molti articoli di giornale e relazioni di conferenze descrivono i dettagli di tali esperimenti, per-tanto in questa sede ci limiteremo a riassumere i risultati.

I moderni computer e altri tipi di apparecchiature che si avvalgono di microprocessori sembrano essere soggetti a malfunzionamenti dovuti a campi magnetici a banda stretta irradiati al di sopra di 30 V/m, sebbene i più moderni PC ad alta velocità presentino livelli di suscettibilità superiori (~300 V/m). Sembrano esserci notevoli variazioni nella risposta delle apparecchiature, a seconda delle specifi che impostazioni degli esperimenti e della qualità degli invo-lucri delle apparecchiature stesse. Inoltre, i test eff ettuati entro la gamma 1 - 10 GHz sembrano indicare che i mal-funzionamenti si verifi cano a livelli di campo inferiori e a frequenze più basse.

Test sui campi irradiati a banda larga sono stati condotti anche da scienziati russi, svedesi, tedeschi e statunitensi. I test su apparecchiature elettroniche delle dimensioni di un computer indicano che i livelli di picco del campo elettrico di ~2 kV/m per impulsi con ampiezze dell'ordine di 200 ps creano problemi all'elettronica (rendendo necessario un hard reset), con danni che si verifi cano nella gamma 5 kV/m. La fi gura 3 mostra un esempio di danno a un circuito stampato dovuto a una tensione a impulsi che rappresenta l'accoppiamento a un cavo Ethernet metallico.

Va osservato che questi esperimenti, di solito, sono ef-fettuati esponendo direttamente le apparecchiature testate all'antenna che irradia. Chiaramente, se l'apparecchiatura è all'interno di un edifi cio o in una stanza priva di fi nestre, ci sarà una riduzione del campo incidente dall'esterno all'interno (a seconda di come è costruito il muro). Ancora, nella maggior parte degli esperimenti non sono stati esa-minati approfonditamente la polarizzazione e l'angolo di incidenza (per questioni di tempi e costi) e pertanto molti degli eff etti osservati durante i test possono verifi carsi

anche a livelli di campo inferiori, se la geometria di accop-piamento è ottimale.

Per le minacce IEMI condotte, sembra evidente che se l'autore dell'attacco ha accesso a cabine di telecomunicazi-one o cavi di alimentazione esterni, gli risulterebbe facile riversare segnali dannosi su un edifi cio. Per le forme d'onda a impulsi, sembra che le ampiezze di impulso dell'ordine di 100 microsecondi possano creare danni ai generatori delle apparecchiature e ai circuiti stampati di interfaccia a livelli fi no a un minimo di 500 volt, ma solitamente intorno ai 2 - 4 kV.

Relazione con gli standard di immunità EMC della IEC Anche se questi valori di guasto possono sembrare

bassi rispetto alle capacità delle armi elettromagnetiche, non devono sorprendere. Quando si esaminano i requisiti di immunità della IEC per i test di compatibilità elettro-magnetica (EMC) nelle applicazioni quotidiane, è insolito trovare un requisito con livello di campo irradiato a banda stretta superiore a 10 V/m (per frequenze superiori a 80 MHz). Livelli superiori sono sconsigliati per applicazioni domestiche o industriali, per via dei costi necessari per garantire una maggior protezione.

Per quanto riguarda i transitori condotti a banda larga, gran parte dei test rapidi di EMC svolti sui transitori di illuminazione ed elettrici si limitano a livelli fi no a 2 kV. Solo in casi speciali, ad esempio per le apparecchiature di uno stabilimento di produzione di energia o di una cabina, i livelli delle prove di immunità saranno più alti. Le tipiche forme d'onda dei test a banda larga condotti sull'EMC (come l'EFT) hanno tempi di salita fi no a 5 ns e ampiezze di im-pulso fi no a 700 millisecondi (ad es. 61000-4-5). L'ampiezza di impulso più stretta per l'EMC è pari a 50 ns, molto mag-giore di quella della tipica minaccia IEMI.

Pertanto è chiaro che i livelli di immunità alle interfer-enze elettromagnetiche dei prodotti elettronici commerciali sono bassi rispetto ai loro apparenti livelli di sensibilità agli ambienti elettromagnetici IEMI. Ciò indica che i normali livelli di protezione non sono suffi cienti per le interferenze intenzionali. Inoltre, un generatore come JOLT può pro-durre 50 kV/m a fi no a una distanza di 100 metri. Questo signifi ca, per la maggior parte dei prodotti elettronici non protetti, danni di entità 10 volte superiore.

Fig. 3. Capacitore danneggiato su una scheda di interfaccia di rete.

Fig. 4. Esempio di rilevatore IEMI.


ItaliaRADASKY


APPROCCIO ALLA PROTEZIONE L'approccio di base alla protezione

dalla IEMI di un edifi cio contenente dispositivi elettronici sensibili con-siste nell'accertarsi che tutti i cavi che entrano nell'edifi cio dall'esterno siano protetti al punto di ingresso con fi ltri e schermature contro la sovratensione e dotati di un buon impianto di messa a terra a bassa induttanza. Ciò è neces-sario poiché il contenuto in frequenza dei disturbi accoppiati sarà superiore a 100 MHz e un semplice cavo di messa a terra avrà un'impedenza elevata. Il secondo approccio consiste nel ridurre la possibilità dei campi esterni di pen-etrare nell'edifi cio senza attenuazione. Per i campi che riescono a penetrare, ci sono modi per aff rontare i campi elettromagnetici interni.

Varie opzioni di mitigazione includono: 1. Una migliore schermatura elettromagnetica

dell'edifi cio. Il miglioramento dell'effi cacia della scherma-tura dell'edifi cio nella gamma di frequenze rilevante. Ad es-empio, le fi nestre sono permeabili ai campi elettromagnetici ad alta frequenza e vanno coperte completamente con fogli metallici.

2. Aumento della possibile distanza di posiz-ionamento dell'arma tramite elementi di sicurezza fi sici, come una recinzione, per tenere lontani gli assalitori, traendo vantaggio dal decadimento 1/R dei campi magnetici generati da un'antenna.

3. Uso di allarmi elettromagnetici per moni-torare l'ambiente elettromagnetico, in modo da rilevare l'inizio e lo svolgimento di un attacco IEMI.

4. Se la struttura viene penetrata da elevati livelli di IEMI che si accoppiano ai cavi di rete, occorre cercare di ridurre tale accoppiamento o di contenere gli eff etti dei segnali accoppiati. Alcuni possibili approcci per ottenere tale risultato sono:

• Disporre i cavi lungo superfi ci metalliche. • Utilizzare cavi e connettori schermati. • Utilizzare ferriti sui cavi metallici. • Utilizzare dispositivi di protezione dalla sovratensione nel punto di collegamento all'apparecchiatura. • Utilizzare cavi ottici privi di metallo per sostituire i cavi metallici.

Schermatura dell'edifi cio A seconda della potenza di un'arma IEMI e del

suo posizionamento rispetto alle apparecchiature elettroniche, è ragionevole pensare che i campi elettromagnetici di picco esterni saranno superiori a 10 kV/m. Tali campi potrebbero essere attenuati solo lievemente nella gamma fra 1 MHz e 5 GHz, a seconda della schermatura naturale garantita dai normali metodi di costruzione. La tabella 1 mostra

i risultati di misurazioni eff ettuate su edifi ci con diversi tipi di materiali costruttivi. È evidente la forte variazione dell'attenuazione. La colonna a destra riporta i valori misu-rati, mentre la prima inserisce le misurazioni in categorie approssimative.

Esistono due approcci per lavorare sull'edifi cio. Innanzi-tutto si può migliorare l'effi cacia di schermatura coprendo le

Misurazioni della schermatura

Schermatura nominale, dB Stanza Schermatura, dB

0 Edi cio interamente in Legno 2

5

10

20

Stanza sotto solaio in legnoEdi cio in legno - stanza 1

44

Calcestruzzo senza tondiniEdi cio in legno - stanza 2Calcestruzzo con tondini - stanza 1Calcestruzzo con tondini - stanza 2Calcestruzzo con tondini - stanza 3Calcestruzzo con tondini - stanza 4

567111118

30Edi cio in metallo 26

Calcestruzzo con tondini - stanza ben pretetta

29

Tabella 1. Misurazioni dell'ef cacia della schermatura per vari edi ci e stanze contenenti impianti elettrici fra 1 MHz e 5 GHz.

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eventuali finestre aperte, le superfici esterne dell'edificio che presentano materiale metallico, inserendo materiale metal-lico nelle pareti interne dell'edificio (pannello metallico per rivestimenti murali) o sostituendo l'edificio esistente con un altro interamente metallico (ovviamente l'opzione più costosa). Inoltre, indipendentemente dall'approccio scelto, qualsiasi cavo esterno di alimentazione, comunicazione e controllo deve essere messo a terra all'ingresso dell'edificio con tecniche a bassa induttanza (piastre, non fili).

Allarmi elettromagnetici Poiché in molti casi le armi elettromagnetiche pos-

sono creare forti interferenze in computer e altri dispositivi elettronici solo durante la fase di trasmissione, può essere utile avvalersi di un rilevatore per individuare l'attività di un'eventuale sorgente IEMI continua nelle vicinanze. Anche se l'attacco fosse di breve durata, un rilevatore sarebbe utile dal punto di vista legale. Considerato l'ampio ventaglio di ambienti elettromagnetici (dalla banda stretta all'iperbanda), non è facile costruire rilevatori che possano coprire un'ampia gamma di frequenze e intervalli di tempo, ma la figura 4 mostra un esempio di rilevatore portatile (tarato per un mas-simo di 8 GHz). Altri rilevatori possono essere installati in modo permanente nei pressi di apparecchi elettronici sensibili.

Attività di protezione Come spiegato nell'introduzione al presente articolo,

dopo la risoluzione dell'URSI, la IEC ha avviato la propria opera di standardizzazione, affrontando sistematicamente la questione IEMI. Ciò ha portato alle seguenti attività in seno a IEEE, ITU-T e Cigré:

• Lo sviluppo degli standard IEMI della IEC è iniziato nel 1999. • Il numero speciale di Transacions dell'IEEE EMC Society sulla IEMI è stato pubblicato nell'agosto del 2004. • La raccomandazione dell'ITU-T per la protezione degli impianti di telecomunicazione dalla HPEM (IEMI), K.81, è stata pubblicata nel 2009. • La pubblicazione della prassi standard P1642 dell'IEEE EMC Society, in corso di sviluppo, per la protezione dei computer pubblicamente accessibili dalla minaccia della IEMI è prevista a inizio 2013. • È in corso di sviluppo una brochure C4 Cigré per la pro tezione dei dispositivi elettronici di controllo di una cabina elettrica ad alta tensione dalla IEMI; la sua pub blicazione è prevista per la fine del 2012.

Oltre alle attività di standardizzazione, la Federal Energy Regulatory Commission e il Ministero dell'energia hanno valutato l'impatto di diverse minacce elettromagnetiche sull'industria energetica, e la Camera dei deputati ha introdotto lo SHIELD Act, HR 668, che, qualora diventi legge, imporrà la protezione dell'infrastruttura elettrica di


NSG 3040 – MULTIFUNCTION GENERATORGOOd THINGS COME IN SMALL pACkAGES

It is small, smart and has a high-contrast 7” touchscreen color display and the rotary wheel for quick input with appealing ease of operation. With its open modular archi-tecture, the NSG 3040 is the ideal immunity test companion for smaller engineering labs – with amazing capacities for demanding EMC testing companies and for easy integration into the production process. The electromagnetic pulses generated from this multipurpose unit are especially tailored for CE marking requirements of the EU in addition to the national and international standards. Like its big brother, NSG 3060 (6.6 kV), the NSG 3040 also has a SD memory card where test files can be saved easily and expanded at any time.

Modular, expandable system

Surge voltage to 4.4 kV

EFT/Burst to 4.8 kV/1 MHz

PQT to 16A/260 VAC & DC

Easy-to-operate 7“ touchscreen color display

TA (Test Assistance) for rapid test resolution

Parameters can be changed during test

Sales International Teseq AG Luterbach SwitzerlandT + 41 32 681 40 50 www.teseq.com


ItaliaRadasky


produzione energetica all'ingrosso contro i pericoli degli impulsi elettromagnetici naturali e generati dall'uomo. La IEMI rientra fra i pericoli generati dall'uomo.

ConClusioni Sebbene le armi elettromagnetiche possano sembrare

un'invenzione hollywoodiana pensata per l'intrattenimento, sono una chiara minaccia ai moderni impianti elettronici, a causa dei progressi dell'elettronica allo stato solido per la produzione di armi piccole e moderne e della maggior efficienza di dispositivi elettronici che operano a tensioni sempre più basse (e sono pertanto più sensibili).

Dalla breve panoramica fornita qui, è chiaro che la comu-nità tecnica internazionale ha valutato la situazione e ritiene che la IEMI sia una minaccia reale per le nostre infrastrutture critiche. Tramite ricerche e studi tecnici sono stati individuati diversi modi per rendere la nostra società meno vulnerabile a questa minaccia. La sfida per il futuro è determinare gli ap-procci più economicamente sensati alla protezione, che deve essere fisica ed elettromagnetica, oltre a includere il rileva-mento elettromagnetico. Inoltre, la formazione di operatori per le strutture è un obiettivo importante ed è auspicabile che venga promosso dal presente articolo.

Per aPProfondire l'argomento Standard su HPEM e IEMI redatti da IEC SC 77C (www.

iec.ch)

“Special Issue on High-Power Electromagnetics (HPEM) and Intentional Electromagnetic Interference (IEMI)”, IEEE Transactions on Electromagnetic Compatibility, Volume 46, n. 3, Agosto 2004.

“High-power electromagnetic immunity guide for tele-communication systems,” Telecommunication Standardiza-tion Sector di ITU, ITU-T, K.81, Novembre 2009.

Dott. William A. Radasky, Ph.D, P.E., membro a vita dell'IEEE Il dott. Radasky ha conseguito il Ph.D. in ingegneria elettrica presso la University of California di Santa Barbara nel 1981. Lavora ad ap-plicazioni elettromagnetiche ad alta energia da oltre 44 anni. Nel corso della sua carriera ha pubblicato più di 400 rapporti, paper e articoli inerenti gli ambienti elettromagnetici, i loro effetti e la relativa protezione. Di recente si è dedicato intensamente a condurre valuta-zioni di infrastrutture critiche rispetto alle minacce di HEMP, IEMI e forti tempeste geomagnetiche. È presidente di IEC SC 77C (EMC: fenomeni transitori ad alta energia), presidente di IEEE EMC Society TC-5 (elettromagnetismo ad alta energia) e responsabile delle con-vocazioni dei gruppi di lavoro di Cigré C4. Nel 1984 ha fondato la Metatech Corporation in California e ne è presidente e capo ingegnere. Il Dott. Radasky è molto attivo nel campo della standardizzazione della compatibilità elettromagnetica e, nel 2004, è stato premiato con il Lord Kelvin Award da parte della IEC per il suo eccezionale contributo alla standardizzazione internazionale. È membro a vita dell'IEEE e profes-sionista in ingegneria elettrica iscritto all'albo.


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Contents | España

José Manuel Rodríguez Delgado fue un profesor español de siología de la Universidad de Yale , conocido por sus investigaciones sobre el control de la mente mediante la estimulación eléctrica del cerebro. Delgado nació en España en 1915. Recibió el título de Doctor en Medicina de la Universidad de Madrid, volvió a recibir el título de Doctor en Medicina, y luego recibió un doctorado en el Instituto Cajal después de la Guerra Civil Española. En 1946, Delgado se convirtió en miembro de la Universidad de Yale y aceptó un cargo en el departamento de siología en 1950. En el año 1952, fue coautor de su primer artículo sobre la implantación de electrodos en humanos con el n de controlar el cerebro. La investigación de Delgado usaba señales eléctricas para evocar respuestas en el cerebro, lo que se podía utilizar para crear emociones y comportamientos. Inventó un estimoceptor, una radio que unía simuladores de ondas cerebrales con un receptor que supervisaba las ondas de la EEG y las devolvía a través de canales de radio separados. Delgado también creó un quemitrodo, que era un dispositivo que se podía implantar y que liberaba cantidades controladas de un medicamento en áreas especí cas del cerebro. También inventó una versión primitiva de lo que hoy es un marcapasos.

Jose ManuelRodriguez Delgado (1915–2011)

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ARTÍCULO Cómo proteger la información corporativa con dencial del acceso no autorizado W.G. FANO, Profesor, Facultad de Ingeniería, Universidad de Buenos Aires

Emisiones de RF de las Lámparas Fluorescentes de bajo consumo HERBERT MANGSTL, Director de ventas, EMshield GmbH JORDI FERRI, Director de la división de blindaje, AST Modular S.L.

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A.H. Systems Wavecontrol; C/Pallars 65-71,Barcelona, ES-08018, España;+34 933 208 055, ext 3; Fax: +34 933 208 056;Jordi Accensi, [email protected];www.wavecontrol.com;www.AHSystems.comProductos y servicios: Antenas, Instrumentación para pruebas, Pruebas

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AR RF/Microwave InstrumentationWAVECONTROL, S.L., C/ Pallars 65-71,Barcelona, España E-08018;+34 933 208 055; Fax: +34 933 208 056;Jordi Accensi, [email protected];Ernest Cid; [email protected];www.wavecontrol.com; www.arworld.usProductos y servicios: Amplificadores, Antenas, Cables y conectores, Habitaciones y recintos aislados, Sobrecargas y transitorios, Instrumentación para pruebas

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A.H. Systems Wavecontrol; C/Pallars 65-71,Barcelona, ES-08018, España;+34 933 208 055, ext 3; Fax: +34 933 208 056;Jordi Accensi, [email protected];www.wavecontrol.com;www.AHSystems.comProductos y servicios: Antenas, Instrumentación para pruebas, Pruebas

Adler InstrumentosC/Antonio de Cabezón, 83 2ª planta,28034 Madrid, España;+34 913 584 046; Fax: +34 913 581 383;[email protected]; www.adler-instrumentos.esProductos y servicios: Instrumentación para pruebas

APPLUSLGAI Technological Center, S.A. / Catalunya, Campus UAB Carretera acceso a la Facultad de Medicina, s/n, Bellaterra 08193, Barcelona, España;+34 93-567 20 00; www.appluscorp.comProductos y servicios: Pruebas

AR RF/Microwave InstrumentationWAVECONTROL, S.L., C/ Pallars 65-71,Barcelona, España E-08018;+34 933 208 055; Fax: +34 933 208 056;Jordi Accensi, [email protected];Ernest Cid; [email protected];www.wavecontrol.com; www.arworld.usProductos y servicios: Amplificadores, Antenas, Cables y conectores, Habitaciones y recintos aislados, Sobrecargas y transitorios, Instrumentación para pruebas

Arrow EuropeAlbasanz 75 28037 Madrid;+34 91 304 30 40;www.arroweurope.comProductos y servicios: Ferritas, cables y conectores, aplicaciones de energía

ASTAdvanced Shielding Technologies,Albert Einstein, 43 E-08940Cornellà de Llob. (BCN) España;+34 934 751 481; +34 616 081 176;Fax: +34 933 772 880;Jordi Ferri, Shielding Division Manager,[email protected]; http://ast-global.comProductos y servicios: Aislamiento

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CEMITECPolígono Mocholí, Plaza Cein 4, 31110, Noain, España; +34 848 420 800; Fax: +34 948 317 754;[email protected]; www.cemitec.comProductos y servicios: Pruebas

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Eldonvasa ABP° de la Finca, 1 Edificio 13, Madrid 28223, España;+34 953 551 000; Fax: +34 953 551 539;[email protected]; www.eldon.com Productos y servicios: Habitaciones y recintos aislados

EM Test AGALAVA Ingenieros S.A., C/ Albasanz 16 - Edificio Antalia, 28037 Madrid, España;+34 91 799 71 35; Fax: +34 91 799 52 33;[email protected];www.alava-ing.esProductos y servicios: Sobrecargas y transitorios, Pruebas Instrumentation, Pruebas

EMC Partner AGWAVECONTROL, Pallars, 65 - 71 ES - 08018Barcelona España;+34 933 20 80 55; Fax: +34 933 20 80 56;Jordi Accensi; [email protected]; www.wave-control.comProductos y servicios: Sobrecargas y transitorios, Instrumentación para pruebas

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Fair-Rite Products Corp. Redislogar, Anabel Segura, 11 Centro de Negocios Albatros, Edificio B 28108 - Alcobendas Madrid, España;+34 902 509 980; Fax: +34 916 591 436;[email protected]; www.fair-rite.comProductos y servicios: Artículos con ferrita, Filtros, Habitaciones y recintos aislados, Aislamiento

Federal-Mogul CorporationC/Progres, 394, Barcelona 08918;+34 93 460 24 70; Fax: +34 93 460 18 16;[email protected];www.federalmogul.com/spProductos y servicios: Conjuntos de cables apantalla-dos y blindados Arneses, Conductos, tuberías blindado



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GCEMUPC Campus Nord. Building C4, c/ Jordi Girona 1-3., 08034, Barcelona, España;+34 934 011 021;[email protected]; www.upc.edu/web/gcemProductos y servicios: Pruebas

Gowanda ElectronicsACAL BFI Iberia; C/Anabel Segura 7, Planta Acceso, Alcobendas (Madrid), España, 28108;+ 34 914531160; Fax: + 34 916626837;[email protected]; www.acalbfi.com.Productos y servicios: Inductores

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Ibertest International SAC/ Ramon y Cajal, 35. Pol. Ind Gitesa I, Daganzo de Arriba, Madrid, 28814, España;+34 91 884 53 85; Fax: +34 91 884 50 02;[email protected]; www.ibertestint.comProductos y servicios: Pruebas

a TESEQ CompanyIFI - Instruments for Industry Adler Instrumentos, S.L., C/Antonio de Cabezon, 83, 28034 Madrid Espana,+34 913 584 046; Fax: +34 913 581 383;Millan Fernandez; [email protected];www.adler-instrumentos.esProductos y servicios: Disenadores y Fabricantes de Amplificadores de Alta Potencia para RF y Microondas (Tetrode Tubes, Solid State and TWT)

INTACtra. Ajalvir, Km. 4 28850,Torrejón de Ardoz, Madrid, España;+34 915 201 200; www.inta.esProductos y servicios: Pruebas

ITAMaría de Luna, n˚8 50018 Zaragoza, España;+34 976 010 000; Fax: +34 976 011 888;www.ita.esProductos y servicios: Pruebas

ITEParque Tecnológico de Valencia, Avenida Juan de la Cierva 24, 46980 Paterna, Valencia, España;+34 961 366 670; Fax: +34 96 136 66 80;www.ite.esProductos y servicios: Pruebas

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Labien TecnaliaParque Tecnológico de Bizkaia, Edificio 700, C/Geldo, 48160, Derio, España;+34 946 073 300; Fax: +34 946 073 349;www.labein.esProductos y servicios: Pruebas

LACECALE.T.S. Ingenieros Industriales, Paseo del Cauce, 59, 47011 Valladolid, España;+34 983 423 343; Fax: 983 423 996;[email protected]; www.lacecal.esProductos y servicios: Pruebas

Langer EMV-Technik GmbHWavecontrol S.L., Pallars, 65-71,08018-Barcelona España;+34 93 320 805-5; Fax: +34 93 320 805-6;[email protected]; www.wavecontrol.com;www.langer-emv.deProductos y servicios: Instrumentación para pruebas

LCOELaboratorio Central Oficial de Electrotecnia, c/ José Gutiérrez Abascal, 2, 28006, Madrid, España;+34 915 625 116; Fax: +34 915 618 818;www.ffii.es/lcoe/lcoe_portada.aspProductos y servicios: Pruebas

Lifasa International Capacitorsc/. Vallès, 32 - Polígono Urvasa, 08130, Santa Perpètua De Mogoda, Barcelona, España;+34 935 747 017; Fax: +34 935 448 433;[email protected]; www.lifasa.comProductos y servicios: Filtros

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a TESEQ CompanyMILMEGAAdler Instrumentos, S.L., C/Antoniode Cabexon, 83-2, 28034 Madrid;+34 91 358 40 46; Fax: +34 91 358 13 83;[email protected]; www.adler-instru-mentos.esProductos y servicios: Disenadores y Fabricantes de Amplificadores de Alta Potencia para RF y Microondas

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Premo GroupGrupo Premo C/. Conchita Supervía, 13 - 08028, Bar-celona, España;+34 934 098 980; Fax: +34 934 906 682;[email protected]; www.grupopremo.comProductos y servicios: Filtros

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Schlegel Electronic MaterialsRC Microelectrònica S.A., c/ Francesc Moragas 72, nave 3, 08907 L’ Hospitalet de Llobregat, Barcelona España; +34 932 602 166; Fax: +34 933 383 602;

Jordi Nogué, [email protected]; www.rcmicro.esProductos y servicios: Materiales conductores, Aislamiento

SGS TECNOSTrespaderne, Edificio Barajas 1, 28042 Madrid, España; +34 913 138 000; Fax: +34 913 138 080;www.sgs.esProductos y servicios: Pruebas

Salicru S.A.Avda de la Serra, 100, 08460 Santa María de Palautordera, España;+34 902 482 400; Fax +34 938 481 151;[email protected]; www.salicru.comProductos y servicios: Filtros

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TecnologicaC/ La Majada, 3, 28760, Tres Cantos, Madrid, España; +34 918 041 893;www.alter-spain.comProductos y servicios: Pruebas


Teseq Ltd.Adler Instrumentos, S.L., C/Antoniode Cabexon, 83-2, 28034 Madrid;+34 91 358 40 46; Fax: +34 91 358 13 83;[email protected]; www.adler-instru-mentos.esProductos y servicios: Amplificadores (RF y Microon-das), Antenas, Sistemas Automotrices, de inmunidad conducida RF, sobretensiones conducidas y Transitorios, ESD, Armónicos y Flicker, las células GTEM, Sistemas de Inmunidad a la RF, RF Sistemas de Emisión, Testsoftware RF, Calibración y Servicio

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WavecontrolPallars 65-71 Barcelona, E-08018, España;+34 933 208 055; Fax: +34 933 208 056;Ernest Cid, Marketing; [email protected]; www.wavecontrol.comProductos y servicios: Instrumentación, acceso-rios y sistemas para EMC, RF, Seguridad Eléctrica y Medida de antenas

ASSOCIATIONSIEEE EMC SOCIETY CHAPTER SPAINFerran Silva Martinez, GCEM. Universitat Politèc-nica de Catalunya, Campus Nord. Edifici C4, C. Jordi Girona 1-3, Barcelona 08034, España;+34 93 401 7826; Fax: +34 93 401 1021; [email protected]


Los Recursos | España


NOTIFIED BODIESALTER TECHNOLOGY GROUP SPAINC/ DE LA MAJADA, Nº 3 28760 TRES CANTOS, Madrid, España;+34 91 8043292; Fax: +34 91 8041664;[email protected]; w w w.alter-spain.com

APPLUS/LGAI TECHNOLOGICAL CENTERCampus UAB, Apto Correos 18, 08193 Bellaterra (Barcelona), España;+34 935 672 000; Fax: +34 935 672 001;[email protected]; www.appluscorp.com

AT4 WIRELESS CENTRO DE TECNOLOGIA DE LAS COMUNICACIONES S.A.Parque Tecnologico de Andalucia Calle Severo Ochoa, 2, 29590 Campanillas (Malaga), España;+34 952 619100; Fax: +34 952 619112;[email protected]; www.at4wireless.com

FUNDACION TECNALIA RESEARCH & INNOVATIONParque Tecnológico de Vizcaya, Ed. 700, 48160 Derio (Vizcaya), España;+34 90 276 00 00; Fax: +34 94 607 33 49;[email protected]; www.tecnalia.com

INSTITUTO NACIONAL DE TECNICA AEROESPACIALCarretera de Ajalvir, km. 4, 28850 Torrejon De Ardoz (Madrid), España;+34 91 5201396; Fax: +34 91 5202021;[email protected]

LABORATORIO CENTRAL OFICIAL DE ELECTROTECNIACalle José Gutíerrez Abascal, 2, 28006 Madrid, España; +34 91 5625116; Fax: +34 91 5618818;[email protected]; www.ffii.es

LABORATORIO ICEM. ASOCIACION ITACAUniversidad Politécnica de Valencia Camino de la Vera, s/n Edificio 8G. Acceso C. Nivel 3 46022, Valencia, España; +34 963879306; Fax : +34 963877279; [email protected]; www.itaca.upv.es

SGS, TECNOS, S.A.C/ Trespaderne, 29, 28042 Madrid, España;+34 91 3138000; Fax: +34 9131380 90;[email protected]

Solid StateTWT • Tetrode TubeDC - 40 GHz • up to 10 kW

903 South Second Street • Ronkonkama, NY 11779Tel: 631-467-8400 • Fax: 631-467-8558 • Email: [email protected] • www.ifi.coma TESEQ Company

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HERBERT MANGSTL Director de ventasEMshield GmbH

JORDI FERRI Director de la división de blindaje AST Modular S.L.

LA PROTECCIÓN DE LA INFORMACIÓN CORPORATIVA CONFIDENCIAL DEL ACCESO NO AUTORIZADO ES UN FACTOR CLAVE PARA MUCHAS ORGANIZACIONES. UN BLINDAJE ADECUADO PROTEGERÁ LOS DATOS DEL ESPIONAJE ILEGAL

A MODO DE EJEMPLO, las deliberaciones del comité de empresa de Breuninger fueron interceptadas durante una reunión, lo que ocasionó un polémico escándalo de espionaje que ha asestado un duro golpe al fabricante de equipamiento original de coches de Renault: una vez más, los titu-

lares relacionados con espectaculares casos de espionaje industrial ocupan todas las portadas. Los autores de este tipo de acciones pueden ser servicios secretos, empresas competidoras y personas infi ltradas. El objetivo siempre es el mismo: obtener información acerca de los productos y la estrategia futura de la empresa.

Según la Ofi cina del Estado Bávaro para la Protección de Datos en Alemania, el espionaje industrial genera cada año miles de millones de euros en daños. Las consecuencias que conlleva son la pérdida de cuota de mercado, la pérdida de liderazgo en el sector tecnológico y la pérdida de puestos de trabajo para la empresa debido a la pérdida de competi-tividad. Además, los gastos indirectos son mucho mayores. Estos daños no se pueden determinar claramente, pero para la empresa suponen una grave pérdida de reputación como resultado del delito económico que se puede traducir incluso en un descenso del precio de sus acciones. Pero, ¿por qué es tan aparentemente fácil conseguir información empresarial? Por una razón: los sistemas modernos de comunicaciones ofrecen muchos “puntos débiles” de los que los delincuentes experimentados y bien preparados se pueden aprovechar.


Cómo proteger la información corporativacon dencial del acceso no autorizado

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Para los Piratas informáticos es muy fácil intercePtar y caPturar información confidencial

La escucha de conversaciones telefónicas, o la intrusión en el tráfico de correo electrónico o fax, no representan un problema para los profesionales. Los teléfonos, la voz sobre IP, las conferencias inalámbricas y las videoconferencias ofrecen muchas opciones para que los piratas informáticos se introduzcan sin ser advertidos en el flujo de información. A menudo, estos profesionales utilizan métodos muy sofisti-cados y creativos en estas acciones de espionaje. Hasta las películas de espionaje de Hollywood se basan, a menudo, en tecnología real, afirma un experto del contraespionaje, como por ejemplo los smartphones con control remoto, la fotografía aérea infrarroja y los ataques por láser a través del cristal de las ventanas de las salas de conferencias. La idea generalizada de que los sencillos micrófonos ocultos son dispositivos obsoletos y de que la manipulación de or-denadores y sistemas de telefonía digital los ha desbancado por completo no es del todo cierta. El acceso no restringido a la red inalámbrica o la instalación de programas troyanos en el ordenador en segundo plano hacen que acceder al lugar deseado con éxito y sin riesgos sea cada vez más com-plicado. Para lograr un ataque con resultados inmediatos, los dispositivos electrónicos convencionales de espionaje representan, sin duda, un medio económico de calidad para conseguir información confidencial.

Puntos débiles del blanco de las intrusiones

El precio de los micrófonos ocultos es sumamente bajo y su diseño está muy perfeccionado, por lo que no son comparables con el clásico mini-transmisor del pasado: los dispositivos modernos pueden enviar información de forma discontinua; los datos se registran durante la sesión y, posteriormente, se envían sin ser detectados.

Adicionalmente, la frecuencia de transmisión en estos nuevos dispositivos; por eso, es cada vez más difícil detectar estos “micrófonos inteligentes” con métodos convencionales.

Sin embargo, las empresas se pueden proteger por sí so-las. El primer paso es clasificar la información en categorías propias: ¿qué tipo de información confidencial necesita una estrategia de protección digna y específica?

También es necesario que participen expertos de seguri-dad con una gran experiencia, que la empresa sensibilice a sus empleados y que los instruya para que se conciencien

de la importancia de la protección de la información in-terna y la estrategia de seguridad. Solo una estrategia de seguridad consecuente aplicada a la totalidad de la empresa puede ofrecer una protección eficaz. En una empresa, desde el escalafón más bajo al más elevado, se debe establecer claramente quién puede acceder a qué tipo de información y cuándo puede hacerlo.

Prevención de ataques de esPionaje ilegal

La importancia del asunto no está únicamente en la par-ticipación de expertos en seguridad: los propios empleados de la empresa deben estar concienciados sobre el problema y recibir una formación de calidad. Para que la protección sea eficaz, la estrategia de seguridad debe estar implementada en toda la empresa.

Si una empresa de espionaje profesional actúa como asesora, comprobará la situación global actual y los puntos débiles, y diseñará una estrategia contra el espionaje ilegal. Por ejemplo, con la ayuda de un analizador de espectro especial se puede comprobar la existencia de transmisores ilegales en una habitación.

Con detectores semiconductores se puede verificar que no haya micrófonos en las paredes, los techos y el suelo. Las líneas acopladas ilegales se pueden localizar con analiza-dores de línea. Para no interrumpir el trabajo normal, estas operaciones se suelen llevar a cabo por las tardes, fuera del horario laboral o los fines de semana.

alta Protección con seguridad electrónica, mecánica y estructural

Existen tres formas de garantizar el acceso no autorizado a las áreas de acceso restringido de una empresa o el acceso a la información confidencial: la seguridad electrónica, mecánica y estructural es la única forma de contrarrestar los ataques.

Desde hace varios años, la instalación de una habitación a prueba de micrófonos se ha convertido en una práctica estándar para protegerse contra el espionaje ilegal en em-presas con una estrategia de seguridad imperativa. En una habitación de estas características, las ondas acústicas y


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posible crear una habitación completamente blindada con paneles modulares que se unen como si fueran las piezas de un rompecabezas. De este modo, se pueden construir habitaciones de cualquier tamaño como habitaciones in-dependientes o una habitación dentro de otra. El diseño modular de este tipo de estructuras ofrece un montaje rápido y fl exible, que se adapta a espacios de diferentes tamaños, evitando la necesidad de construir una habitación tradicional. Además, la posibilidad de reutilizarlo es una ventaja en el caso de que en el futuro se quiera modifi car la distribución de la habitación.

electromagnéticas se absorben, por lo que es imposible conseguir información desde el exterior.

EL BLINDAJE SE PUEDE ADAPTAR A LA ARQUITECTURA DE LA HABITACIÓN

Un sistema de blindaje bien diseñado encaja a la perfec-ción en el diseño arquitectónico original de una habitación, sin que éste sea detectable.

La expresión “La forma sigue a la función” es un principio cuyo origen se debe al sector del diseño y la arquitectura. La forma y la composición de las cosas deberían ser con-secuencia directa de su función y su uso. Con los sistemas de blindaje arquitectónico, el diseño y la arquitectura son los puntos clave. Este concepto se adapta completamente a habitaciones de cualquier forma y distribución. El sistema de blindaje es compatible con cualquier tipo de acabado tradicional de techos, paredes y suelos. En combinación con soluciones inteligentes, las habitaciones blindadas se pueden construir con la apariencia de una habitación tradicional sin blindaje. El componente principal del blindaje estructural es el material de blindaje especial, que elimina la necesidad de añadir una estructura de refuerzo adicional. Es transpirable y permite colocar materiales de revestimiento tradicionales en suelos y paredes. La instalación es similar a la del papel pintado convencional.

Además, existe la opción de construir nuevas habitacio-nes empleando técnicas modulares. Con esta tecnología, es

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posible crear una habitación completamente blindada con paneles modulares que se unen como si fueran las piezas de un rompecabezas. De este modo, se pueden construir habitaciones de cualquier tamaño como habitaciones in-dependientes o una habitación dentro de otra. El diseño modular de este tipo de estructuras ofrece un montaje rápido y fl exible, que se adapta a espacios de diferentes tamaños, evitando la necesidad de construir una habitación tradicional. Además, la posibilidad de reutilizarlo es una ventaja en el caso de que en el futuro se quiera modifi car la distribución de la habitación.

electromagnéticas se absorben, por lo que es imposible conseguir información desde el exterior.

EL BLINDAJE SE PUEDE ADAPTAR A LA ARQUITECTURA DE LA HABITACIÓN

Un sistema de blindaje bien diseñado encaja a la perfec-ción en el diseño arquitectónico original de una habitación, sin que éste sea detectable.

La expresión “La forma sigue a la función” es un principio cuyo origen se debe al sector del diseño y la arquitectura. La forma y la composición de las cosas deberían ser con-secuencia directa de su función y su uso. Con los sistemas de blindaje arquitectónico, el diseño y la arquitectura son los puntos clave. Este concepto se adapta completamente a habitaciones de cualquier forma y distribución. El sistema de blindaje es compatible con cualquier tipo de acabado tradicional de techos, paredes y suelos. En combinación con soluciones inteligentes, las habitaciones blindadas se pueden construir con la apariencia de una habitación tradicional sin blindaje. El componente principal del blindaje estructural es el material de blindaje especial, que elimina la necesidad de añadir una estructura de refuerzo adicional. Es transpirable y permite colocar materiales de revestimiento tradicionales en suelos y paredes. La instalación es similar a la del papel pintado convencional.

Además, existe la opción de construir nuevas habitacio-nes empleando técnicas modulares. Con esta tecnología, es

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HABITACIÓN BLINDADA:ATENUACIÓN HASTA 80 DB

Para la aceptación del usuario, es extremadamente importante que las habitaciones blindadas no difi eran de las habitaciones normales. Instalada por especialistas, es posible conseguir una atenuación de 80 dB, equivalente a un factor de 10 000, garantizada en una gama de frecuencias de entre 30 MHz a 6 GHz Uno de los principales sectores actuales del blindaje arquitectónico son las zonas con protección contra espionaje. En una ofi cina o una sala de conferencias, las posibilidades existentes para el espionaje ilegal son variadas. La emisión pasiva de información crítica se presenta en todos los lugares en los que se utilizan dis-positivos informáticos periféricos como tarjetas gráfi cas y de vídeo, puertos de impresora, monitores, teclados y unidades de disco duro. La posibilidad del espionaje existe mediante el usode transmisores telefónicos o mini-transmisores. Además, la interfaz de datos de los teléfonos móviles puede transmitir datos e imágenes sin necesidad de registrarse.

HABITACIONES SEGURAS CON LA APARIENCIA DE UNA HABITACIÓN NORMAL

En estas zonas, el sistema de blindaje abarca todas las po-sibilidades existentes, basándose en sistemas de protección invisibles de techo, paredes y suelo, con soluciones inteligentes para las ventanas, las puertas y los dispositivos electrónicos.

Una habitación equipada de estas características ofrece al

usuario la apariencia de una habitación normal y la seguri-dad de poder mantener sus conversaciones confi denciales en una habitación a prueba de micrófonos con el fi n de proteger su información. Para proteger la “palabra hablada”, se instala un aislamiento acústico adicional en el sistema de blindaje electromagnético y generadores de vibraciones, que enmascaran las vibraciones producidas por las ondas sonoras de la conversación.

SALAS DE TRABAJO CONBLINDAJE ELECTROMAGNÉTICO

Desde un laboratorio de investigación de una empresa in-dustrial que desarrolla nuevos productos hasta laboratorios en el sector farmacéutico para los estudios de larga duración durante los que se prueba la efi cacia de nuevos medicamen-tos, surge la necesidad de proteger estas habitaciones con un sistema de blindaje electromagnético.

En estas aplicaciones, es primordial evitar la intercep-tación y la lectura de datos o información confi dencial; por ello, las mediciones se deben efectuar sin ruidos electro-magnéticos externos, de modo que no haya interpretaciones erróneas de los resultados de las pruebas.

Debido a la ilimitada variedad de este tipo de habitacio-nes, incluyendo ventanas, habitaciones húmedas, salas blan-cas y zonas destinadas a albergar dispositivos electrónicos, una solución fl exible ideal para este tipo de aplicaciones es una habitación individual modular con sistema de blindaje.

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W.G. FANOProfesor, Facultad de IngenieríaUniversidad de Buenos Aires

RESUMEN

RECIENTEMENTE LAS lámparas Fluorescentes, y en particular las lámparas fluorescentes compactas son usadas en todo el mundo para reemplazar las lámparas incandescentes, esta nueva tecnología tiene el benefi cio de un bajo consumo de energía aproximadamente 5 veces menos que las incandescentes, y esto es

debido al balasto electrónico de alta frecuencia, que podría interferir con el equipamiento electrónico por la generación de ondas electromagnéticas producidas por el circuito electrónico y e mecanismo de arco de la lámpara, y también las emisiones conducidas por las líneas de alimentación. Este artículo está dedicado a la medición y al estudio de las emisiones características de las lámparas fl uorescentes compactas a pequeñas distancias.

INTRODUCCIONLámparas incandescentesUna lámpara incandescente tradicional produce luz cu-

ando circula una corriente por el fi lamento de Tungsteno y dicho fi lamento se encuentra dentro de un gas inerte, y alcanzará altas temperaturas por el efecto Joule. Esta tecnología tiene una baja efi ciencia, y mas aún, el tiempo de vida de esta lámpara es relativamente corta, porque el fi lamento se encontrará a altas temperaturas y se vapor-izará gradualmente en las paredes de vidrio de la lámpara, y eventualmente se romperá después de algunas cientos de horas de operación[4].

El fi lamento de una lámpara incandescente es simple-mente un resistor que depende de la temperatura, ésta resistencia dependerá principalmente de la longitud, ancho y material del fi lamento.

Si se aplica energía eléctrica, ésta se convierte en calor en el fi lamento, donde la temperatura crecerá.

La temperatura del fi lamento se eleva hasta que se de-shace de calor a la misma tasa que el calor se genera en el fi lamento. Idealmente, en el fi lamento se convertirá energía calorífi ca en energía radiada, aunque una pequeña cantidad de energía calorífi ca se eliminan también por la conduc-ción térmica del fi lamento. La temperatura del fi lamento


Emisiones de RF de las Lámparas Fluorescentes de bajo consumo

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será muy alta, generalmente mas de 2000°C. A estas altas temperaturas, la radiación térmica del filamento incluye una significativa cantidad de luz visible. La pobre eficiencia de esta lámpara reside en el hecho de que el filamento de Tungsteno radia mayormente en longitudes de onda cor-respondiente al infrarojo al menos a las temperaturas que soporta el filamento [7].

La lámpara incandescente está también radiando a una frecuencia de 50/60Hz dependiendo del país, porque de-pende de la corriente suministrada al filamento, aunque esta radiación será enmascarada por la radiación producida a esa frecuencia por las líneas de transmisión que distribuyen energía eléctrica en la ciudad.

Lámparas fluorescentesHay una gran variedad de lámparas no incandescentes

de luz visible, que son empleadas para ambientes internos o externos de edificios. La mayoría de estas lámparas se basan en la descarga eléctrica através de un gas como el mercurio, o de gases nobles como neón, argón y xenón.

La generación de luz visible en lámparas de descarga gaseosa se basa en la colisión entre átomos e iones en el gas con una corriente eléctrica que pasa entre dos electrodos colocados en los extremos de la lámpara [8].

El tubo de vidrio de una lámpara fluorescente común tiene un recubrimiento de fósforo en la superficie interna del vidrio, y el tubo se llena con vapor de mercurio a muy baja

presión (ver Fig. 2). Si se aplica una diferencia de potencial entre los electrodos del tubo, se producirá una corriente de electrones que fluye de un electrodo hacia el otro. Cuando los electrones coalisionan con los átomos de mercurio, éstos se excitan, llendo a estados de energía más altos. Esta energía es liberada en forma de radiación ultravioleta cuando los electrones de mercurio retornan al estado de energía base. La radiación ultravioleta además energizará la cara interna de la lámpara que está recubierta de fósforo, causando la emisión de luz blanca que se observa desde las lámparas fluorescentes. Las lámparas fluorescentes son de dos a cu-atro veces mas eficientes para emitir en logitudes de ondas visibles, produciendo menos cantidad de calor generado, aproximadamente de diez a veinte veces menos de calor generado que las lámparas incandescentes [8].

Una característica de las lámparas fluorescentes es que generan una serie de longitudes de onda que están concen-tradas en pequeñas bandas del espectro electromagnético, que se denominan líneas espectrales. Como consecuencia, estas fuentes no producen un espectro de iluminación continua, como el caso de las lámparas incandecentes. Es posible diseñar las lámparas de descarga gaseosas que emi-tan un espectro casi continuo, además de los espectros de

Fig.1 lámparas incadescentes y la distribución espectral de lámparas.

Fig.2 Lámparas de vapor de mercurio fluorescentes. Ref: Olympus Microscopy Resource Center. http://www.olympusmicro.com/primer/lightandcolor/lightsourcesintro.html

Fig.3 Espectro de fuentes luminosas comunes, ref: Olympus Microscopy Resource Center. http://www.olympusmicro.com/primer/lightandcolor/lightsourcesintro.html


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línea inherente en la mayoría de estas lámparas. La técnica más común es recubrir la superficie interior del tubo con partículas de fósforo, que absorben la radiación emitida por el gas brillante y lo convierten en un amplio espectro de luz visible que van del azul al rojo.

Historia de las lámparas Fluorescentes compactas (CFL)Las lámparas f luorescentes compactas helicoidales

fueron inventadas por Ed Hammer de GE en 1976. La propuesta consistía en un tubo de forma de hélice largo

y delgado de alta eficiencia, de modo que se ajusten al tamaño y distribución de la luz de una lámpara incandescente, con un funcionamiento en frío, es decir sin generar calor.

Sin embargo, GE consideró que enrollar tubos de vidrio en esta forma era complejo y no era compatible con técnicas de alta velocidad de fabricación, y la idea fue archivada [1] [2].

No fue sino hasta 1992 que GE completó una máquina para curvar el cristal, y las muestras de la lámpara llamada Heliax que produjo fueron enviadas al mercado ese mismo año. Lamentablemente la lámpara nunca se produjo a escala, debido a la extrema dificultad en el control del proceso de producción [1] [2]. La introducción comercial de la lámpara tendría que esperar otros tres años hasta que la empresa china, Shanghai Xiangshan, que comercializó con éxito el diseño. Esta fue la primera lámpara de Phillips de 2003 [1].

Lámparas fluorescentes compactasLas lámparas fluorescentes se han utilizado en la oficina

y otros entornos comerciales, iluminando con una eficien-cia de 5-10 veces mayor que las bombillas de filamento de tungsteno. El tubo fluorescente contiene un electrodo con un gas que típicamente es una mezcla de argón / criptón y una pequeña cantidad de mercurio. Se trata de una lám-para de descarga, la descarga se inicia por un iniciador o arrancador y después es controlado por un balasto, que es tradicionalmente un inductor con núcleo de hierro. Cuando el arco se alcanza, la corriente fluye y el circuito opera a una frecuencia de suministro de la red. Cuando el funcio-namiento es normal, las emisiones de radiofrecuencia de una lámpara fluorescente a frecuencia de la red se producen debido a un arco en los electrodos.

El funcionamiento de una lámpara fluorescente a una frecuencia más alta reduce el parpadeo visual, y reduce el zumbido, aumentando la facilidad de regulación y también la eficiencia hasta aproximadamente 25%. Por esa razón es deseable una mayor frecuencia de operación usando balasto electrónico de conmutación [5].

¿Por qué se utilizan las lámparas fluorescentes compac-tas (CFL)? En la figura 4 se puede observar una imagen de una lámpara de este tipo. La característica más importante de por qué la lámpara fluorescente compacta se utiliza, es por el consumo eléctrico. Esto se puede ver en la Figura 5, donde la CFL tiene un consumo de aproximadamente 5 veces respecto que el tipo incandescente.

MEDICION DEL CAMPO MAGNETICO Un método conocido para medir el campo magnético de

ondas electromagnéticas es usando un espira, y se llama ha-bitualmente antena de lazo, que se puede observar en la Fig. 6.

La Fuerza electromotriz inducida en el lazo a circuito abierto, se puede obtener mediante la ley de Faraday [6],

Fig. 5. Consumo eléctrico de los tipos de lámparas, incandescentes, fluorescentes y halógenas. Datos tomados de la página de Osram http://catalog.myosram.com

Fig. 4 Fotografía de una lámpara fluorescente compacta (CFL)

Fig.6 Diferencia de potencial inducida en el lazo debida a la aplicaciónde campo magnético Hi.


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que se expresa de la siguiente manera:

(1) VOC = nωBAcosθ

donde: n es el número de vueltas, w: es la pulsación an-gular, A: es el área del lazo, y q: es el ángulo entre z y Hi. Más detalles acerca de los parámetros de esta antena que se emplean para medir el campo magnético se describen en el Apéndice.

PARTE EXPERIMENTALLa antena lazo o cuadro de aire se ha diseñado con un

cilindro dieléctrico con un alambre sobre el mismo, con: un diámetro = 0,1 m, a 50 vueltas, y la sección del cable = 0.5mm2.

Es interesante observar que la fuerza electromotriz inducida Voc de la ecuación. (1) aumenta con el área y el número de vueltas n, esto puede ser usado para seleccionar la recepción. La sección de alambre se han elegido para reducir las pérdidas por efecto Joule del alambre. Como el dispositivo es básicamente un inductor, en la práctica, la resistencia de esta antena de lazo se puede despreciar comparada con la reactancia. En la Fig. 7 se muestra como se ha construido la antena de lazo.

Para observar las emisiones de radiación de RF de las lámparas fluoresecentes compactas, se ha medido el campo magnético que producen en función de la distancia a la lámpara. Hay dos posibilidades en la medición del campo magnético: en la dirección del eje del lazo, y en la dirección radial del lazo, como se puede observar en la Fig. 8 y 9.

Se ha medido el campo magnético de las lámparas fluores-centes Osram de 11W de potencia, conectadas a 220V/50Hz, en las direcciones Axial y radial como se puede observar en la Fig. 10 y 11. Este campo magnético se puede modelizar en función de la dis-tancia “d” con un exponente a. Es decir:

H –› 1/da

a=4

Es interesante observar que usu-almente en antenas lineales como las antenas dipolo, el campo magnético cercano a la antena en la región reactiva, tiene una dependencia con la distancia de 1/d2, esto está muy difundido en la gente que pertenece a la comunidad de antenas [6]. En este trabajo la depen-dencia del campo magnético ha sido medida resultando una variación en función de la distancia de 1/d4 . Esto significa que el campo magnético de las lámparas fluorescentes decrece mucho más rápido que las antenas tipo dipolo.

El campo magnético medido en la dirección radial como se puede obser-var en la Fig. 12, se encuentra aproxi-madamente 6 órdenes de magnitud menor que el campo magnético en la dirección axial de la Fig. 11.

Fig. 7 Imagen de la antena lazo para sensado de campo magnético H

Fig. 8 Medición de campo magnético en la dirección del eje del sensor.

Fig. 9 Medición de campo magnético en la dirección radial del sensor.


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ConClusionesLos niveles de los campos magnéti-

cos de las lámparas fluprescentes com-pactas (CFL) se han medido, y se han detectado importantes niveles entre 40 y 50kHz en la dirección axial de la Fig. 10. Los niveles en la dirección radial es-tán 6 órdenes de magnitud por debajo que los medidos en la dirección axial y por lo tanto se podrian despreciar.

En frecuencias de 150kHz la poten-cia recibida es considerablemente baja comparada con la recibida a frecuen-cias de 40-50kHz.

Como una prueba de que se está produciendo intereferencia debida a la generación de ondas electromag-neticas en RF, si se coloca un receptor de AM de frecuencias medias cerca de la lámpara fluorescente y la recepcion será interferida con ruido audible que se suma al sonido recibido durante la recepción.

La lámpara f luorescente genera un campo electromagnético en la banda de 40-50kHz principalmente y puede interferir con otros circuitos electrónicos, estas emisiones están en campo cercano debido a la banda de frecuencias. Si en el lugar donde se encuentran las lámparas hay disposi-tivos electrónicos sensibles al campo magnético, es aconsejable reemplazar las lámparas fluorescentes por otro tipo de iluminación como los LED pero sin emplear fuentes de conmutación, empleando reguladores de tensión lineales. Las lámparas incandescentes también podrían ser empleadas porque no tienen emisiones de RF.

instrumentaCiónAnalizador de espectro PSA 6000 9 kHz – 6.2GHzMedidor de impedancia vectorial HP4815Analizador de impedancia AEA 200kHz – 200MHzLCR Instek 1kHz- 100kHz

apéndiCeEl circuito eléctrico de una antena

lazo de n vueltas empleado como an-tena receptora se representa por la impedancia Z=R+jX en serie con un generador de tensión. El analizador de espectro está representado por me-dio de una impedancia de 50 Ω. Este circuito eléctrico se puede observar en la Fig. 12, donde: Voc: es la fuerza electromotriz a circuito abierto, ZL:

Fig.10 Campo magnético medido en función de la distancia, y modelizado para diferentes valores de alfa. Dirección axial f=48.95kHz.

Fig.11 Campo magnético medido en función de la distancia, y modelizado para diferentes valores de alfa. Dirección radial f=48.95kHz.

Fig.12 Circuito eléctrico equivalente de la antena lazo.


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impedancia de carga del analizador de espectro, y Z es la impedancia de la antena lazo. La diferencia de potencial medida en el analizador de espectro se puede escribir como:

(2) VOC ZL

ZL+Z = Vm

De las ecs. (1) y (2) el campo magnético se puede expresar

como una función de la tensión medida Vm:

(3) H = (ZL+Z)ZL Vm

1nωACOSθμ0

De la ec. (3) el factor de antena puede se puede definir como la relación entre el campo magnético y la tensión medida Vm en el lazo como sigue:

(4) H = KVm

Entonces el factor de antena es:

(5) K = 1 + ZZL 1

nωACOSθμ0

Este factor es muy importante porque relaciona la ten-sión medida con el campo magnético que es lo que se desea conocer.

En la Fig.13 se observa la foto de la medición de imped-ancias de una antena de lazo empleada en el experimento. El resultado de la medición de la reactancia en función de la frecuencia de la antena de lazo se puede observar en la Fig. 14, donde la reactancia es lineal y se incrementa con la frecuencia. Esto representa un comportamiento inductivo.

En la Fig. 14 la reactancia es lineal hasta 1700kHz aproximadamente, y entonces la reactancia se aleja del comportamiento lineal, esto es debido a la cercanía de la frecuencia de resonancia de la antena, porque la antena tiene una capacidad de pérdidas, y la frecuencia de resonancia aumenta con el número de vueltas de la antena.

En la Fig.15 se muestra el factor de antena obtenido me-diante la ecuación (5), este factor es utilizado para obtener el campo magnético medido.

RefeRencias• [1] “Philips Tornado Asian Compact Fluorescent”. Philips. Retrieved

2007-12-24.• [2] ^ “Compact Fluorescent Light Bulbs”. Energy Star. Retrieved

2010-09-30.• [3] Antenna Engineering Handbook. 3rd Ed. R.C. Jhonson. Mac-Graw

Hill Inc. 1993.• [4] Characterization of compact fluorescent lights RF emissions in the

perspective of human exposure. T. Letertre, A. Azoulay, A. Destrez, F. Gaudaire y Christophe Martinsons. EMC’09/ Kyoto.

• [5] Effective Tests and Measurements Mechanisms for EMI Level Iden-tification in Fluorescent Lamp Operation V. Sekar, T. G. Palanivelu, and B. Revathi. European Journal of Scientific Research, Vol.34 No.4 (2009), pp.495-505

• [6] Antenna Theory Analysis and Design 2nd Ed. C.A. Balanis. J. Wiley. 1997.

• [7] The Great Internet Light Bulb Book, Part I. Donald L. Klipstein. http://freespace.virgin.net/tom.baldwin/bulbguide.html

• [8] Olympus Microscopy Resource Center. http://www.olympusmicro.com/primer/lightandcolor/lightsourcesintro.html

Fig. 13 Medición de la impedancia de la antena lazo con un medidor LCR.

Fig.14 Reactancia medida de la antena lazo.

Fig. 15 Reactancia medida de la antena lazo.

Fig.16 Factor de antena en veces en función de la frecuencia.


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POLSKA


Contents | Polska

Walen t y S t a r c z ako w ukońc z y ł s t u d ia inżynierskie na Wydziale Elektrycznym Politechniki Warszawskiej. Pierwszą pracę podją ł w za łożonej przez Kazimierza Szpotańskiego Fabryce Aparatów Elektrycznych. Prace konstruktorskie Starczakowa koncentrowały się na projektowaniu przekładników prądow ych i napięciow ych oraz obwodów magnetycznych. P r zek ł adnik i kons t r uowane w fabr yce Szpotańskiego z powodzeniem rywalizowały z uznanymi wyrobami dostępnymi na rynkach międzynarodowych. W. Starczakow interesował się również opracowywaniem modeli ogólnych zjawisk zachodzących w obwodach magnetycznych przekładników. Po zakończeniu II Wojny Światowej, W. Starczakow podjął pracę na Wydziale Elektrycznym na Politechnice Łódzkiej w Katedrze Podstaw Elektrotechniki, na stanowisku starszego asystenta, następnie adiunkta i docenta. W tym okresie wydana została jego książka pt. „Przekładniki”. Książka ta stała się podstawowym źródłem wiedzy na temat zarówno teorii i konstrukcji, jak i eksploatacji przekładników. Od czerwca 1957 roku pełnił funkcję kierownika Katedry Elektrotechniki Ogólnej, wprowadzając tematykę naukową z dziedziny przekładników i materiałoznawstwa elektrotechnicznego. Starczakow jest uważany za twórcę polskiej szkoły przekładnikowej. Został odznaczony Krzyżem Kawalerskim Orderu Odrodzenia Polski i Złotym Krzyżem Zasługi. Otrzymał tytuł Honorowy Zasłużonego Nauczyciela Rzeczpospolitej Polskiej.

PRODUKTY I USŁUGI

ZASOBY

ARTYKUŁ O Szacowaniu Błędu Niedopasowania W Badaniach Emisji Promieniowanej JAN SROKA, Profesor, Politechnika Warszawska

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126

WalentyStarczakow (1906–1999)

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A.H. SystemsAM Technologies Polska SP.z.o.o., Jerozolimskie 146C, 02-305 Warszawa, Polska;+48 22 532 28 00; Fax: +48 22 532 28 28;[email protected]; www.amt.pl; www.AHSystems.comProdukty i usługi: Anteny, Przyrządy pomiarowe, Testowanie

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OSRODEK BADAWCZO-ROZWOJOWY PREDOM-OBRul. Krakowiakow 53, 02-255 Warszawa, Polska; +48 22 846 19 51; Fax: +48 22 846 19 51; [email protected]; www.predom.com.pl

POLSKIE CENTRUM BADAN I CERTYFIKACJI S.A.ul. Klobucka 23A, 02-699 Warszawa, Polska; +48 22 464 52 00; Fax: +48 22 647 12 22; [email protected]; www.pcbc.gov.pl

POLSKI REJESTR STATKOW S.A.Al. Gen. Jozefa Hallera 126, 80-416 Gdansk, Polska; +48 58 346 17 00; Fax: +48 58 346 03 92; [email protected]; www.prs.pl

PRZEMYSLOWY INSTYTUT AUTOMATYKI I POMIAROWAl. Jerozolimskie 202, 02-486 Warszawa, Polska; +48 22 8740 164; Fax: +48 22 8740 216; [email protected]; www.piap.pl

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POL_PS_R_EEG13.indd 125 11/16/12 8:12 PM

JAN SROKAProfesorPolitechnika Warszawska

ST RE S ZC Z ENIE . Zaburzen ia prom ien-iowane w badaniach kompatybi lności elektromagnetycznej mierzone są anteną połączoną z miernikiem zaburzeń koncen-trycznym torem pomiarowym o impedancji charakterystycznej 50Ω. Współczynnik przeliczeniowy sygnalu miernika na wiel-

kosc mierzoną anteną (mezurand) zdefiniowany jest z pominięciem niedopasowań w torze pomiarowym. Jest to jeden ze składnikow błędu pomiaru. Błędu tego nie da sie wyznaczyć w sposób deterministyczny. Jest on szacowany i wbudowany w bilans niepewności pomiaru. Wyprow-adzono wzory na dwa rodzaje błędu niedopasowania: dla bezpośredniego połączenia anteny z odbiornikiem oraz z wtrąconym torem pomiarowym. Oszacowanie błędu niedopasowania metodą polecaną w dokumencie CISPR 16-4-2 oraz z wykorzystaniem metody Monte Carlo zilustrowano obliczeniami numercznymi dla po-miaru pola elektrycznego zaburzeń promieniowanych w pasmach C i D, w przedziale częstotliwosci od 30MHz do 1GHz. Podejście proponowne w dokumencie CISPR 16-4-2 jest zbyt pesymistyczne i prowadzi do znacznego przeszacowania błędu.

WSTĘP1

Poszukiwaną wielkością fizyczną w pomiarach emisji promieniowanej (mezurandem) jest natężenie pola elektrycznego lub magnetycznego. Do pomiarów tych używa się odpowiedniej anteny, która jest konwerterem natężenia pola na sygnał napięciowy na przyłączu anteny. Sygnał ten jest przekazywany do odbiornika zaburzeń elektromagnetycznych torem pomiarowym o impedancji charakterystycznej 50Ω, składającym się z dwu kabli kon-

O Szacowaniu Błędu Niedopasowania W Badaniach Emisji Promieniowanej

Polska

1Artykuł jest polską, uaktualnioną i poprawioną wersją publikacji[4].2Sytuacja opisana w publikacji [8], w której obciążenie jest połączone bezpośrednio do źródła może występować przy kalibracji sprzętu, natomiast nigdy nie występuje przy pomiarach EMC. Tutaj zawsze między anteną, a odbiornikiem jest tor pomiarowy.


Sroka_PO_EEG13.indd 6 11/16/12 4:52 PM

JAN SROKAProfesorPolitechnika Warszawska

ST RE S ZC Z ENIE . Zaburzen ia prom ien-iowane w badaniach kompatybi lności elektromagnetycznej mierzone są anteną połączoną z miernikiem zaburzeń koncen-trycznym torem pomiarowym o impedancji charakterystycznej 50Ω. Współczynnik przeliczeniowy sygnalu miernika na wiel-

kosc mierzoną anteną (mezurand) zdefiniowany jest z pominięciem niedopasowań w torze pomiarowym. Jest to jeden ze składnikow błędu pomiaru. Błędu tego nie da sie wyznaczyć w sposób deterministyczny. Jest on szacowany i wbudowany w bilans niepewności pomiaru. Wyprow-adzono wzory na dwa rodzaje błędu niedopasowania: dla bezpośredniego połączenia anteny z odbiornikiem oraz z wtrąconym torem pomiarowym. Oszacowanie błędu niedopasowania metodą polecaną w dokumencie CISPR 16-4-2 oraz z wykorzystaniem metody Monte Carlo zilustrowano obliczeniami numercznymi dla po-miaru pola elektrycznego zaburzeń promieniowanych w pasmach C i D, w przedziale częstotliwosci od 30MHz do 1GHz. Podejście proponowne w dokumencie CISPR 16-4-2 jest zbyt pesymistyczne i prowadzi do znacznego przeszacowania błędu.

WSTĘP1

Poszukiwaną wielkością fizyczną w pomiarach emisji promieniowanej (mezurandem) jest natężenie pola elektrycznego lub magnetycznego. Do pomiarów tych używa się odpowiedniej anteny, która jest konwerterem natężenia pola na sygnał napięciowy na przyłączu anteny. Sygnał ten jest przekazywany do odbiornika zaburzeń elektromagnetycznych torem pomiarowym o impedancji charakterystycznej 50Ω, składającym się z dwu kabli kon-

O Szacowaniu Błędu Niedopasowania W Badaniach Emisji Promieniowanej

Polska

1Artykuł jest polską, uaktualnioną i poprawioną wersją publikacji[4].2Sytuacja opisana w publikacji [8], w której obciążenie jest połączone bezpośrednio do źródła może występować przy kalibracji sprzętu, natomiast nigdy nie występuje przy pomiarach EMC. Tutaj zawsze między anteną, a odbiornikiem jest tor pomiarowy.


Sroka_PO_EEG13.indd 6 11/16/12 4:52 PM ADs_EEG13.indd 33 11/16/12 2:51 PM

Polska


centrycznych i przepustu w ścianie komory pomiarowej2. Tor pomiarowy weryfikuje się przy pomocy parametrów rozproszeniow ych S-Parameters. Współczynnik F stanowiska pomiarowego pozwalający przeliczyć sygnał, który mierzy miernik na moduł natężenia pola, nie uwzględnia niedopasowa´n w torze pomiarowym. Jest to praktyka powszechnie stosowana w laboratoriach badawczych. Uproszczenie to implikuje błąd, którym można skorygować pomiar. Błąd ten nazywa się nie-dopasowaniem mismatch. Zgodnie z dokumentem [1] oznacza się go symbolem δM. W efekcie, relacja między mezurandem, a napięciem mierzonym przez miernik, w zależności od użytej skali (liniowej lub decybelowej) jest iloczynem (F ∙ δM) lub sumą (F +δM) współczynnika stanowiska pomiarowego i bł ędu niedopasowania.

Współczynnik antenyW pomiarach emisji promieniowanej mezurandem jest

moduł natężenia pola elektrycznego |E| lub magnetyc-znego |H| w strefie dalekiej pola [2]. Wprowad´zmy dla tego mezurandu ogólny symbol |Q|

|Q| |E| natężenie pola elektrycznego|H| natężenie pola magnetycznego[ ]

W procesie kalibracji anteny wyznacza si ę jej dwaparametry: współczynnik anteny FA oraz współczynnik

odbicia ГS na przyłączu anteny, który jest równowaz˙nyimpedancji wej sciowej anteny ZS. Mierzalny jest tylko moduł współczynnika anteny, dlatego FA jest wielkos cią rzeczywistą, zależną od częstotliwos ci.Współczynnik anteny FA jest ilorazem modułu natężeniapola w miejscu umieszczenia anteny i modułu napię-cia |U| mierzonego na przyłączu anteny pod warunkiem, żemiernik na przyłączu anteny nie powoduje odbic , jest dopasowany (ГL = 0)

(1) FA

|E||U| współczynnik anteny elktrycznej

|H||U| współczynnik anteny magnetycznej

Rys. 1. Kalibracja anteny oraz równoważny schemat elektryczny złącza antena-odbiornik.

ГS


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PolskaSROK A


Moduł siły elektromotorycznej (SEM) |ε| w schemaciezastepczym anteny (Rys.1) jest proporcjonalny do natężeniapola. Jest tak zarówno dla pola elektrycznego, jak i mag-netycznego w strefie dalekiej.

(2) |Ε| = FΕ ∙ |Q|

Przyporządkowując procesowi kalibracji równoważnyobwód elektryczny z obciążeniem 50 jak pokazano naRys.1, wprowadzając do niego dane z kalibracji anteny orazzależność wyrażoną Równ.(2), współczynnik anteny może być wyraz˙ony następująco

(3) FA = 2Fε |1 - ГS|

|Q||U| =

Pominięcie odbić na wejściu miernika pomiarowego wRówn.(3) (ГL = 0) jest uzasadnione w procesie kalibracjianteny pod warunkiem, że miernik jest kalibrowany z

zachowanim spójności pomiarowej i błąd wynikający z niedopasowania na jego wejściu jest skompensowany [2]. Niezmienia to faktu, że odbicia na wejs ciu miernika są i wpływają na błąd niedopasowania toru pomiarowego przy pomiarze zaburzeń.

BŁĄD NIEDOPASOWANIA PRZY BEZPOŚ REDNIM POŁĄCZNIU ANTENYZ MIERNIKIEM

Jeżeli antena podłączona jest bezpos rednio do od-biornika zaburzeń (kreska przerywana na Rys.1), spadek napięcia na wejściu miernika wyraża się następującym wzorem

Rys. 2. Tor pomiarowy wtrącony między antenę, a miernik zaburzeń.

3To samo dotyczy samego współczynnika FA anteny elektrycznej. Tę losową zmienność uwzgle˛dnia się w bilansie niepewności [2]. Nie jest to przedmiotem rozważań tej publikacji.

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(4) |U| = Fε |Q|2

∙ | |(1 + ГL)(1 -ГS)

1 - ГLГS

Wstawienie Równ.(4) do Równ. (3) daje

(5) |U| = |1 + ГL||1 - ГLГS|

|Q|FA

∙

Uwzględniając niedopasowanie na wejściu miernika(Równ.(14)) otrzymyjemy

(6) |Q| = FA ∙ |1 - ГLГS| ∙ |UR|

Jak widać

(7) δMA-R = |1 - ГLГS|

jest bł ędem niedopasowania przy pomiarze emisji pro-mieniowanej gdy antena podłączona jest bezpos rednio do miernika.

Błąd niedopasowania przy połączeniu anteny z odBiornikiem za pośrednictwem toru pomiarowego

Zwykle antena połączona jest z miernikiem zapośrednictwem toru pomiarowego składającego się z kab-la koncentrycznego w komorze pomiarowej, przepustu w ścianie komory i kabla w pomieszczeniu z miernikiem Rys.(2). Sytuacja ta odpowiada schematowi pokazanemu na Rys.7 b) jeśli przyjmie się antenę za źródło, miernik za obciążenie, a tor pomiarowy, wtrącony między Port-1 i Port-2 scharakteryzuje się zespolonąmacierzą S parametrów rozproszeniowych.

Wstawiając równanie definicyjne stratnościwtrąceniowej Równ.(15) do równania na spadek napięcia na wejściu miernika przy bezpośrdnim podłączeniu anteny do miernika Równ.(5) oraz wstawiając niedo-pasowanie na wej ściu miernika Równ.(14) do spadku napięcia U2, można wyznaczyć zależność między |Q|, a napięciem wskazanym przez miernik |UR|

(8) |Q| = = |(1 - ГSS11)(1 - ГLS22) - ГSS12ГLS21| ∙ FA

|S21| ∙ |UR|

Do przeliczenia wskazania miernika na poszukiwane natężenie pola, czyli jako współczynnika stanowiska pomiarowego u zywa si ę iloczynu współczynnika anteny oraz tłumienia toru pomiarowego

(9) FA-I-R = FA ∙ 1|S21|

natomiast

(10) δMA-I-R == |(1 - ГSS11)(1 - ГLS22)- ГSS12ГLS21|

Rys. 3. Paramtry S toru pomiarowego.

Rys. 4. Moduł współczynnika odbić |ГL| na wejściu anteny przy polaryzacji poziomej i pionowej dla anteny umieszczonej odpowiednio 1,5m i 1,7m nad podłogą.

Rys. 5. Niepewność standardowa u oraz wartość oczekiwana E błędu niedopasowania dla poziomej polaryzacji anteny.

Tablica 1. Maximum niepewności standardowej dla poziomejpolaryzacji anteny.

Pasmo częstotliwości(zakres)

Metoda

CISPR Monte Carlo

C (30MHz - 300MHz) 1.85dB 0.95dB

D (300MHz - 1000MHz) 0.53dB 0.26dB

4Rozkład kształtu U ma zmienna zespolona ГL, jeśli jej moduł |ГL| jest deterministy-czny, a tylko argument jest losowy. Niestety, zwykle w danych producenta dostępne jest tylko ekstremum |ГL|.


Polska


(4) |U| = Fε |Q|2

∙ | |(1 + ГL)(1 -ГS)

1 - ГLГS

Wstawienie Równ.(4) do Równ. (3) daje

(5) |U| = |1 + ГL||1 - ГLГS|

|Q|FA

∙

Uwzględniając niedopasowanie na wejściu miernika(Równ.(14)) otrzymyjemy

(6) |Q| = FA ∙ |1 - ГLГS| ∙ |UR|

Jak widać

(7) δMA-R = |1 - ГLГS|

jest bł ędem niedopasowania przy pomiarze emisji pro-mieniowanej gdy antena podłączona jest bezpos rednio do miernika.

Błąd niedopasowania przy połączeniu anteny z odBiornikiem za pośrednictwem toru pomiarowego

Zwykle antena połączona jest z miernikiem zapośrednictwem toru pomiarowego składającego się z kab-la koncentrycznego w komorze pomiarowej, przepustu w ścianie komory i kabla w pomieszczeniu z miernikiem Rys.(2). Sytuacja ta odpowiada schematowi pokazanemu na Rys.7 b) jeśli przyjmie się antenę za źródło, miernik za obciążenie, a tor pomiarowy, wtrącony między Port-1 i Port-2 scharakteryzuje się zespolonąmacierzą S parametrów rozproszeniowych.

Wstawiając równanie definicyjne stratnościwtrąceniowej Równ.(15) do równania na spadek napięcia na wejściu miernika przy bezpośrdnim podłączeniu anteny do miernika Równ.(5) oraz wstawiając niedo-pasowanie na wej ściu miernika Równ.(14) do spadku napięcia U2, można wyznaczyć zależność między |Q|, a napięciem wskazanym przez miernik |UR|

(8) |Q| = = |(1 - ГSS11)(1 - ГLS22) - ГSS12ГLS21| ∙ FA

|S21| ∙ |UR|

Do przeliczenia wskazania miernika na poszukiwane natężenie pola, czyli jako współczynnika stanowiska pomiarowego u zywa si ę iloczynu współczynnika anteny oraz tłumienia toru pomiarowego

(9) FA-I-R = FA ∙ 1|S21|

natomiast

(10) δMA-I-R == |(1 - ГSS11)(1 - ГLS22)- ГSS12ГLS21|

Rys. 3. Paramtry S toru pomiarowego.

Rys. 4. Moduł współczynnika odbić |ГL| na wejściu anteny przy polaryzacji poziomej i pionowej dla anteny umieszczonej odpowiednio 1,5m i 1,7m nad podłogą.

Rys. 5. Niepewność standardowa u oraz wartość oczekiwana E błędu niedopasowania dla poziomej polaryzacji anteny.

Tablica 1. Maximum niepewności standardowej dla poziomejpolaryzacji anteny.


Metoda

CISPR Monte Carlo

C (30MHz - 300MHz) 1.85dB 0.95dB

D (300MHz - 1000MHz) 0.53dB 0.26dB

4Rozkład kształtu U ma zmienna zespolona ГL, jeśli jej moduł |ГL| jest deterministy-czny, a tylko argument jest losowy. Niestety, zwykle w danych producenta dostępne jest tylko ekstremum |ГL|.


PolskaSrok a


jest bł ędem niedopasowania przy pomiarze emisji promieniowanej gdy antena połączona jest z miernikiem za pośrednictwem toru pomiarowego

Uwagi na temat odbi´c na wej´sciU anteny i odbiornika

Odbicia ГS na przyłączu anteny w ystępują w błędzie niedopasowania niezależnie od tego, czy an-tena podłączona jest bezpośrednio Równ.(7), czy za pośrednictwem toru pomiarowego Równ.(10).

Anteny elektryczne kalibruje si ę w komorach w pełni bezodbiciowych. Jeżeli pomiarów emisji promieniowanej dokonuje si ę również w komorach w pełni bezodbicio-wych to, ГS jest deterministyczną zmienną zespoloną niezależną od polaryzacji anteny i jej wysokości nad podłogą.

I n a c z e j j e s t p r z y p o m i a r a c h w k o m o r z e wpółbezodbiciowej. Pomiarów tych dokonuje się dla różnych wysokos ci anteny nad podłogą, dla obu po-laryzacji (poziomej i pionowej) oraz czasami zmieniając nachylenie anteny do podłogi. Przy tych pomiarach ГS jest zmienną zależną od wszystkich w ymieni-onych czynników3. Dokładnie rzecz biorąc należałoby wyznaczyć ekstrema ГS w zależnosći od wysokos ci an-teny nad podłogą, polaryzacji oraz nachylenia anteny. To wyznaczałoby przestrzeń zmienności wielowymiar-owej zmiennej losowej ГS. Na szczęście przestrzeń tej zmienności jest mała. Dlatego w tym artykule ГS jest uwzględniona jako zmienna deterministyczna dla ty-powej wysokości anteny nad podłogą, oddzielnie dla poziomej i pionowej polaryzacji.

Innym uproszczeniem jest założ enie, że ГS jest prak-tycznie niezależne od wpływu badanego obiektu EUT. To zało żenie jest uzasadnione ponieważ pomiarów dokonuje się w strefie dalekiej pola.

Zmienności odbić ГS na wejściu anteny magnetycznej nie trzeba wogóle uwzględniać, bowiem kalibracja i pomiar odbywają się w tym samym środowisku elek-tromsagnetycznym tzn. w komorze wpół-bezodbiciowej, na określonej wysokości nad podłogą i tylko przy jednej polaryzacji.

Pomiar zespolonej wartości ГL na wej sciu miernika jest możliwy, ale kosztowny. Dlatego informację na ten temat czerpie się z danych technicznych dostarcznych przez producenta. Zwykle producenci podaja˛ największą wartość modułu odbić |ГL| z włączonym i wyłączonym tłumikiem w stopniu wej sciowym miernika. Przy pomi-arach emisji promieniowanej tłumik na wejściu miernika jest zawsze wyłączony, aby zachować możliwie dobry odstęp sygnału od szumu i zachować możliwie duży odstęp szumów od limitów wymaganych przez normy. Jeżeli dostępny jest przedwzmacniacz na wejściu, zawsze włącza się go, aby poprawić obydiwe wspomniane cechy pomiaru.

szacowanie błĘdU niedopasowaniaW podejściu prezentowanym w dokumencie [1]

wszystkie zmienne występujące we wzorze Równ.(10) przyjmuje się za zmienne losowe. Dalej, ekstremum bł ędu niedopa-sowania δMA-I-R szacuje się w ten sposób, że

w skali decybelowej argument funkcji logarytmicznej jest sumą arytmetyczną wszystkich składników

(11) δM ± A-I-R= 20log [1 ± (|ГS| |S11| + +|ГL| |S22|+|ГS| |S11| |ГL| |S22| + |ГS| |S21|2 |ГL|)]

Nazywa się to często propagacją błedu. Każdy ze składników w tym wypadku dziesi ęciowymiarowej zmi-ennej losowej (pięć zespolonych zmiennych losowych)

Rys. 7. Schemat blokowy z oznaczeniami wielkości u˙zytych w definicji stratności wtrąceniowej.

Rys. 6. Niepewność standardowa u oraz wartość oczekiwana E błędu niedopasowania dla pionowej polaryzacji anteny.

Tablica 2. Maximum niepewności standardowej dla pionowej polaryzacji anteny.


Metoda

CISPR Monte Carlo

C (30MHz - 300MHz) 1.68dB 0.90dB

D (300MHz - 1000MHz) 0.53dB 0.26dB


Polska


wpływa na błąd (propaguje swój udział w błędzie) ma-zurandu według podanej zależności Równ.(11). Równ.(11) określa przedział zmienności zmiennej losowej, która ma w przybliżeniu rozkład kształtu U [2]. W konsekwencji półprzedział zmiennos ći a oraz wartość oczekiwana E są następujące

(12) a = δMA-I-R - δMA-I-R

2

(+) (-)

(13) Ε= δMA-I-R - δMA-I-R

2

(+) (-)

Ze względu na założony rozkład kształtu U, przyjmuje się współczynnik rozszerzenia między niepewnościa˛ standardową u, a półprzedziałem zmienności równy √2. ściśle biorąc tak oszacowany błąd nie ma rozkładu kształtu U4.

Jeżeli pomierzy się parametry S toru pomiarowego, to błąd niedopasowania Równ.(10) jest dwuwymiarową zmienną losową, ponieważ tylko zespolony współczynnik odbić na wejsćiu anteny |ГL| jest zmienną losową. Prawidłowo i efektywnie moz˙na oszacować ten błąd stosując metodę Monte Carlo [5], [6], [7]. Autor, podob-nie jak w swoim poprzednim artykule [3] posłużył się programem Math- Cad13 wykorzystując dostępny w nim generator wartości pseudo-losowych o rozkładzie równomiernym (prostokątnym). Wartość oczekiwana E(X) jest policzona jako średnia arytmetyczna próbek, a niepewność standardowa u policzona jest wzorem u =√E(X2) - E2(X).

Obliczenia prOpOagacjiparametrów rOzkładu

Parametry rozproszeniowe toru pomiarowego zostały pomierzone wektorowym analizatorem sieci (VNA) ZVRE firmy R&S w przedziale częstotliwości od 30MHz do 1GHz w 801 rozłożonych logarytmicznie punktach częstotliwo ści. Do kalibracji VNA użyto zestawu kali-bracyjnego 85032B TYPE-N Firmy HP.

Szacowanie błędu przeprowadzono dla stanowiska po-miarowego z miernikiem zaburzeń ESIB40 firmy Rohde& Schwarz. Zgodnie z danymi producenta, współczynnik fali stojącej na wejściu tego miernika, w całym przedziale częstotliwości od 20Hz do 40GHz jest nie większy niż 2,0 dla zerowego tłumienia na wejściu (V SWR ≤ 2:0) oraz nie większy niż 1,2, jeżeli tłumienie na wejściu jest co najmniej 10dB (V SWR ≤ 1:2).

Oznacza to, że moduł współczynnika odbicia na wejściu miernika spełnia nierówność |ГL| < 0:34 dla ze-rowej nastawy tłumienia. Własńie tę wartość graniczną przyję to w obliczeniach, gdyż jak wyjaśniono wcześniej przy pomiarach emisji promieniowanej tłumik wejściowy jest wyłączony. Wygenerowano 180, równomiernie rozłożonych warto sci losowych modułu |ГL| w przedziale [0; 0; 34]. Każdej z nich przyporza˛dkowano 180 zmien-nych losowych argumentu ГL z zakresu [-π; π].

Tor pomiarowy składa się z kable koncentrycznego długo sci 9m w komorze wpół-bezodbiciowej, przepustu oraz kable koncentrycznego długości 3m w pomieszcze-

niu z odbiornikiem. Moduły parametrów rozproszenio-wych toru pomiarowego pokazane są na Rys.3.

S t a now i s ko p om i a rowe w y p o s a ż one j e s t w szerokopasmową antenę dwustożkowo-logarytmiczną EMCO3141. Współczynnik odbić na wejściu anteny ГS pomierzono w komorze wpół-bezodbiciowej dla polary-zacji poziomej, przy umieszczeniu anteny na wysokości 1,5m nad podłogą oraz dla polaryzacji pionowej przy umieszczeniu anteny na wysokości 1,7m nad podłogą. Moduły tych współczynników odbić przedstawione są na Rys.4. Można na nim zauważyć tylko niewielkie różnice dla obu ustawień anteny.

Porównanie rezultatów szacowania błędu metodą CISPR oraz Monte Carlo dla polaryzacji poziomej i pi-onowej przedstawiono na Rys.5 i 6. Wartości graniczne błędu dla pasm częstotliwości C (30MHz - 300MHz) oraz D (300MHz -1GHz) zebrane są w Tab.1 i Tab.2.wniOski

Zgodnie z dokumentem [1] błąd niedopasowania δMA-I-R (Równ.(10)) przy badaniu emisji promieniowanej jest dziesięciowymiarowa˛ zmienną losową o rozkładzie zbliżonym do kształtu U. Przyję ty błaąd graniczny tego rozkładu (Równ.(11) jest przeszacowany. Obliczenie parametrów tego rozkładu tzn. wartości oczekiwanej i niepewno sci standardowej jest bardzo proste.

Przy pomiarach pola elektr ycznego zaburzeń promieniowanych w komorze wpół-bezodbiciowej współczynnik odbic´ na wejs ciu anteny ГS jest zmienna˛ deterministyczną, jeśli rozpatruje się oddzielnie polary-zacje poziomą i pionową anteny. W takiej sytuacji błąd niedopasowania Równ.(10) jest dwuwymiarową zmienną losową, ze względu na zespolony współczynnik ГL odbić na wejściu miernika. Do szacowania takiego zagadnienia losowego z łatwością można wykorzystać metodę Monte Carlo.

W artykule przedstawiono szacowanie błędu obiema metodami.

Wartości oczekiwane E w obu podejściach były pomi-jalnie małe. Dotyczy to zwłaszcza pasma D częstotliwości. Niepewność standardowa, obliczana zgodnie z metodą zalecaną w dokumencie [1] jest przesadnie i niepotrze-bnie zawyżona.

W paśmie C częstotliwości dużym wartościom odbić ГS na wejściu anteny towarzyszy duży błąd graniczny ГL odbić na wejściu miernika. Skutkuje to dużo większum błędem niedopasowania niż w pa smie D częstotliwości.

załĄcznikiniedOpasOwanie na wejŚciu miernika

Jeżeli uwzględni się odbicia ГL na wejściu miernika, to sygnał na wejściu miernika U i zarejestrowany przez miernik UR różnią się od siebie. Związane one są ze sobą następującą zależnością

(14) |U| = |1 + ГL| _ |UR|

stratnOŚĆ wtrĄceniOwa LI

Stratność wtrąceniowa jest to stosunek napięcia U na zaciskach obciążenia, gdy podłączone jest ono bezpośrednio do źródła (Rys.7a) do napięcia U2 na tych samych zaciskach jeżeli między z´ródło i obciąz˙enie


PolskaSrok a


włączony jest czwórnik (Rys.7b)

(15) LI = UU2

= (1 - ГS ∙ S11) ∙ (1 - ГL ∙ S22) - ГS ∙ S12 ∙ ГL ∙ S21

S21 ∙ (1 - ГS ∙ ГL)

W przypadku braku odbić w źródle (ГS = 0) i na obciążeniu (ГL = 0) stratność napięciowa jest odwrotnością współczynnika transmisji S21. Moduł stratności napięciowej w takich warunkach nazywa się tłumiennością A

(16) |LI||rS=rL=0 = A = 1|S21|

LITERATURA• [1] CISPR 16-4-2: 2003, Specification for radio disturbance and

immunity measuring apparatus and methods - Part 4-2: Uncer-tainties, statistics and limit modeling - Measurement instru-mentation uncertainty. IEC, 2003.

• [2] J. Sroka, Niepewno´sć pomiarowa w badaniach EMC, pomi-ary emisyjności radioelektrycznej . OWPW, Warszawa, 2009.

• [3] J. Sroka, Mismatch Correction by Measurement of Con-ducted Radio Disturbances With AMN . IEEE Trans. on EMC Vol. 53 No. 2 pp. 534 - 536, May, 2011.

• [4] J. Sroka, Mismatch Error by Measurement of Radiated Disturbances in EMC Testing. PRZEGLA˛D ELEKTROTECH-NICZNY (Electrical Review), PL ISSN 0033-2097, ROK LXXXVIII NR 2 pp. 92-95, 2012.

• [5] R. Ba¸bka, Niepewność pomiarów emisji przewodzonej w kompatybilności elektromagnetycznej . Poltechnika Warsza-wska, Rozprawa Doktorska, 2009.

• [6] Joint Committee for Guides in Metrology (JCGM), Evalua-tion of measurement data - Supplement 1 to the “Guide to the expression of uncertainty in measurement” - Propagation of dis-tributions using a Monte Carlo method. JCMG 101:2008. Freely available at OIML web side, www.oiml.org.

• [7] C.,F.,M. Carobbi, The GUM Supplement 1 and the Uncer-tainty Evaluations of EMC Measurements . IEEE EMC Society Newsletter, Issue No. 225, 2010.

• [8] C.,F.,M. Carobbi, M. Cati and C. Panconi, Note on the Ex-pected Value and Standard Deviation of the Mismatch Correc-tion . IEEE Trans. Electromagn. Compat. vol. 53, no. 4, pp.1098-1099, Nov. 2011.

Prof. Jan Sroka jest pracownikiem Politechniki Warszawskiej, IETi-SIP, Koszykowa 75, 00-662 Warszawa, email: ([email protected]) oraz EMC-Testcenter Zürich AG, Schaffhauserstr. 580, 8052-Zürich, Szwajcaria, e-mail: ([email protected]). Jest równocześnie doradcą w zakresie kompatybilno sci elektromagnetycznej firmy ASTAT Sp. z o. o. Poznań (www.astat.com.pl).

Automotive + Telecom + Consumer Products + Military + Industrial + Medical + Avionics

THE BEST EMC-TEST-EQUIPMENT FOR ANY APPLICATION:

EM TEST Polska > ul. Ogrodowa 31/35 > 00-893 Warszawa > +48 (0) 518 643 [email protected] > www.emtest.com/pl

Your direct line to EM TEST is + 48 (0) 518 643 512



ADs_EEG13.indd 34 11/16/12 2:51 PM


NEDERLAN

D


Contents | Nederland

Ewald Georgvon Kleist (1700–1748)

PRODUCTEN EN SERVICES

MIDDELEN

ARTIKEL Verbeteringen Aan Resonantievrij PDN-Design MART COENEN, CEO, EMCMCC ARTHUR VAN ROERMUND, Hoogleraar, Technische Universiteit van Eindhoven

136

139

140

Ewald Georg von Kleist was een Duits fysicus die in 1745 de Kleistiaanse fles uitvond nadat hij een fundamenteel element in de elektrische stroomkring ontdekte om elektriciteit op te slaan. Hij studeerde aan de Universiteit van Leiden in de jaren 1720. Samen met een aantal collega-elektriciens ging hij op zoek naar een methode om zwakke elektrische ladingen te verhogen en er zoveel mogelijk van te accumuleren en op te slaan in een substantie. Zijn Kleistiaanse es toonde aan dat elektriciteit kon worden geaccumuleerd en opgeslagen. Zijn uitvinding betrof een glazen es die voor de helft met water werd gevuld en aan de buitenzijde en de binnenzijde werd bekleed met metaalfolie. Een metaaldraad of ketting werd door een kurk in de hals van de es geleid en vastgemaakt aan een handmatig aangeslingerde statische generator. Op deze manier had de es twee gelijke maar aan elkaar tegengestelde lasten die elkaar in evenwicht hielden tot ze met een geleider werden verbonden, waardoor een elektrische schok werd geproduceerd. Pieter van Musschenbroek, een Nederlandse professor aan de Universiteit van Leiden vond een erg gelijkaardig apparaat uit dat de Leidse es werd genoemd. Beide mannen werden erkend als uitvinder van het apparaat.

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A.H. Systems, Inc.EEMCCOIMEX, Apolloweg 80,8239 Da Lelystad, Nederland;+31 320 295 395; Fax: +31 320 413 133;[email protected]; www.eemc.nl; www.AHSystems.com Producten en services: Antennes, Testinstrumenten, Testen

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Bal Seal Engineering Europe B.V.Jollemanhof 16, 5th floor,

1019 GW Amsterdam, Nederland;+31-20-638-65-23; Fax: +31-20-625-60-18;W. Young; [email protected];www.balseal.comProducts and Services: Shielding

Bicon LaboratoriesWaterdijk 3a, 5705 CW Helmond, Nederland;+31(0)49 239 0911; Fax: +31(0)49 239 0433; [email protected]; www.bicon.nlProducten en services: Consultants, Testen

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Carlisle Interconnect TechnologiesUnited Kingdom; +44-7817-731-000;Andy Bowne, [email protected]; www.CarlisleIT.comProducten en services: Filtres

CE-Test CE-Test, Qualified Testing bv, Kiotoweg 363, 3047 BG Rotterdam, Nederland;+31(0)10 415 2426; Fax +31(0)10 415 4953;[email protected]; www.cetest.nlProducten en services: Testen

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A.H. Systems, Inc.EEMCCOIMEX, Apolloweg 80,8239 Da Lelystad, Nederland;+31 320 295 395; Fax: +31 320 413 133;[email protected]; www.eemc.nl; www.AHSystems.com Producten en services: Antennes, Testinstrumenten, Testen

Acal Nederland b.v.Eindhoven Airport, Beatrix de Rijkweg12, 5657EG Eindhoven, Nederland;+31(0)40 250 7400; Fax: +31(0)40 250 7409;[email protected]; www.acaltechnology.com Producten en services: Ferrieten, Filters

Accelonix BVPostbus 7044, NL-5605 JA Eindhoven, Nederland; +31(0)40 750 1651;[email protected]; www.accelonix.nlProducten en services: Versterkers, Antennes, Filters, Testen

AR Benelux B.V. Frankrijklaan 7, ITC Boskoop, NL-2391 PX, Hazerswoude-Dorp, Nederland;+31(0)17 242 3000; Fax: +31(0)17 242 3009;Onno de Meyer, [email protected]; www.arbenelux.comProducten en services: Versterkers, Antennes, Span-ning en overgangen, Testinstrumenten

Arrow EuropeEizenkade 3 3992 AD Houten;+31 (0) 30 6 39 12 34;www.arroweurope.comProducten en services: Ferrieten, Kabels & Con-nectoren, Vermogen Toepassingen

B

Bal Seal Engineering Europe B.V.Jollemanhof 16, 5th floor,1019 GW Amsterdam, Nederland;+31-20-638-65-23; Fax: +31-20-625-60-18;W. Young; [email protected];www.balseal.comProducts and Services: Shielding

Bicon LaboratoriesWaterdijk 3a, 5705 CW Helmond, Nederland;+31(0)49 239 0911; Fax: +31(0)49 239 0433; [email protected]; www.bicon.nlProducten en services: Consultants, Testen

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Carlisle Interconnect TechnologiesUnited Kingdom; +44-7817-731-000;Andy Bowne, [email protected]; www.CarlisleIT.comProducten en services: Filtres

CE-Test CE-Test, Qualified Testing bv, Kiotoweg 363, 3047 BG Rotterdam, Nederland;+31(0)10 415 2426; Fax +31(0)10 415 4953;[email protected]; www.cetest.nlProducten en services: Testen

CN Rood bvC.N. Rood B.V., Blauw-roodlaan 280,2718 SK Zoetermeer, Nederland;+31(0)79 360 0018; Fax +31(0)79 362 8190;[email protected];www.cnrood.com Producten en services: Testinstrumenten

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D.A.R.E.!! ConsultancyVijzelmolenlaan 7, 3447 GX Woerden, Nederland; +31(0)34 843 0979; Fax: +31(0)34 843 0645; [email protected]; www.dare.nlProducten en services: Testinstrumenten

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EMC PartnerRimarck, Mr. Jan Heerooms, Oosterleek 3, NL - 1609 GA Oosterleek Nederland;+31(0)22 950 3478; Fax: +31(0)22 950 3479; [email protected]; www.rimarck.nl Producten en services: Spanning en overgangen, Testinstrumenten



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MART COENEN CEOEMCMCC

ARTHUR VAN ROERMUND HoogleraarTechnische Universiteit van Eindhoven

ABSTRACT

IN 2011 werd tijdens EMCCompo2011 een nieuw con-cept voor resonantievrij PDN-design gepresenteerd[1]. Dit concept werd gebaseerd op begrensde transmis-sielijnen. Uit toepassingen op meerlaagse panelen zijn bijkomende beperkingen aan het licht gekomen waarvoor we hier oplossingen geven. Verder vermel-den we de beperkingen bij de correcte toepassing van

een ontkoppeld apparaat op een chip of behuizing op basis van een werkelijk FPGA-applicatie. Aangezien dit soort IC-gerelateerde informatie vaak in de meegeleverde datasheets en handleidingen ontbreekt, bieden we een compacte meet-methode voor het bepalen van de aanwezigheid en aard van deze ontkoppeling op chip of behuizing en valideren we dit door middel van metingen.

I. INLEIDING Veel van de IC-ontkoppelingssystemen die tegenwoordig

worden toegepast, zijn nog steeds gebaseerd op het idee dat ontkoppeling buiten de chip noodzakelijk is om te zorgen voor een correcte werking van de IC’s.

Het is echter bij CMOS-ontwerpen al zo'n twintig jaar gebruikelijk om de ontkoppeling op de chip uit te voeren, aangezien de time-of-flight voor het transport van de lading buiten de chip naar het schakelen op de chip te lang is. Deze ontkoppeling op de chip heeft er vervolgens voor gezorgd dat kloksnelheden van IC's ver boven 50 MHz uitrijzen.

Dankzij deze zelfde on-chipcapaciteit in combinatie met de gelijkwaardige seriële inductie van een lead frame, worden er laagdoorlaatfilters gevormd waarvan de resonan-tiefrequentie ver onder 100 MHz ligt. Uitzonderingen op deze laagfrequentieresonanties worden bereikt door BGA of lead frame flip-chipbundels waarbij transmissielijnen worden gevormd tussen de silicium en de PCB waar de voed-ing vandaan komt. Ook in dit geval tonen de gelijkwaardige circuits scherpe resonanties in het bereik van 100 - 1000 MHz, of zelfs nog lager.


Verbeteringen aan Resonantievrij PDN-Design

Nederland NederlandCoenen, Van RoeRmund


Naast de resonanties veroorzaakt door ontkoppeling op een chip of plaat komen er ook scherpe resonanties op de PCB zelf voor. De meeste PCB’s bevatten eilandjes met ontkoppel-ingscondensatoren nabij de voedings- en massapennen van de IC. Aangezien deze ontkoppelingscondensatoren bij bepaalde frequenties op de verschillende eilandjes van de PCB zeer lage impedanties vormen, ontstaan er staande golven tussen de eilandjes. De resonantiefrequenties, n. λ/2, worden bepaald door de fysieke afstand tussen deze ontkoppelingseilandjes en de diëlektrische constante van het isolerende materiaal dat wordt gebruikt bij het stapelen van de PCB lagen.

Zoals in het vorige artikel [1] werd vermeld, ontstaan er uit deze ontkoppelingszones ook staande golven in de richting van de PCB-randen die gewoonlijk open worden gelaten. Als zodanig treden er resonanties op tussen elk van deze ontkoppelde (kortgesloten) eilandjes, via de structuur van de PCB-transmissielijnen, naar de opengelaten PCB-randen toe. Dit resulteert in m. λ/4 resonantiefrequenties.

Zelfs wanneer twee of meer transmissielijnen, met verschillende Z0 en τpd evenwijdig aan elkaar met onjuiste afsluiting worden geplaatst, ontstaan er nieuwe resonanties. De verschillen in karakteristieke impedanties: Z0, van de transmissielijnen bepalen de stroomverdeling.

II. BEPALING VAN IC-DECAP De on-chipontkoppelingscapaciteiten worden geleverd

door een combinatie van passief geïntegreerde, afzonder-lijke condensatoren, gewoonlijk op de die-pad geplaatst, geïntegreerde siliciumcondensatoren (een speciale behu-izing, gewoonlijk trench-condensatoren met 'n flip-chip erboven op) en/of metalen aan elkaar verbonden capaciteit, gate-oxidecondensatoren of zelfs trench-condensatoren op silicium.

De on-chipcapaciteit wordt doorgaans gebruikt met alle digitale core-ontwerpen van CMOS: DSP, geheugen, proces-sor enz. In veel gevallen wordt on-chipontkoppeling ook toegepast in het digitale I/O-domein, zowel bij pre-drivers en level-shifters als bij de uitgangstrappen. Bij het ontwerp

van analoge circuits wordt on-chipontkoppeling minder vaak gebruikt. Bij het ontkoppelen van oscillatoren, PLL’s, bandgaps, ADC- of stroomspanningen, spanningsregelaars, enz. is er echter steeds meer on-chipontkoppeling nodig om-dat een aansluiting buiten de chip naar een PCB-referentie, die weinig gemeenschappelijk heeft met het on-chipcircuit, dat moet worden gebufferd of ontkoppeld. Vergeleken met de hoeveelheid ontkoppelingscapaciteit die aan het digi-tale domein wordt toegevoegd, wordt er slechts een fractie daarvan aan het analoge domein toegevoegd.

De on-chipactiviteitsfactor kan worden onder-verdeeld in twee groepen: • Spanningsafhankelijk• Spanningsonafhankelijk

De spanningsafhankelijke groep wordt gevormd door de gate-oxidecapaciteit. Het belangrijkste deel van deze groep bestaat uit alle extern gevoede standaard logicacellen die statisch zijn in het geval waarin andere, die moeten worden ontkoppeld, schakelen. De capaciteit ervan wordt bepaald door de on-chipactiviteitenfactor: α, waarbij (1-α) van de totale hoeveelheid cellen in ontkoppeling, de actieve cellen zijn. Gewoonlijk is α minder dan 0,3 voor bediening van functionele blokken.

Andere spanningsafhankelijke onderdelen zijn trench-condensatoren met een in spanning variërende capaciteit. Het proces van deze ontkoppelingscondensator is ontleend aan het normaal geïntegreerde DRAM trench-proces. Trench-condensatoren bieden een aanzienlijke ruimtebe-sparing op chipniveau, ze gebruiken slechts 1/8 deel van het siliciumoppervlak dat nodig is voor standaard gate-oxidecondensatoren. Daarnaast bieden trench-decaps een aanzienlijke verbetering voor wat betreft afname in lekst-room vergeleken met standaard gate-oxidecondensatoren.

Een extra uitdaging ontstaat wanneer een complexe chip een ingebouwde spanningsregeling heeft. Wanneer bijv. functionele blokken op de chip via de gezamenlijke core-voeding kunnen worden in- of uitgeschakeld, afhankelijk van de functie die de chip moet uitvoeren. Niet alleen het

Afbeelding 1: Vereenvoudigd FPGA-ontkoppelingscircuit

Nederland


Voor het meten van de on-chipcapaciteit en/of elektrische impedanties is een impedance/gain of vectornetwerk analyzer nodig. Bij de impedantie-meetpoort(en) is een voorspan-ninggevend netwerk nodig om de nominale spanning op het vereiste vermogen naar het IC te voeren. Bovendien moeten alle andere voedingspoorten, die in dit onderzoek buiten beschouwing zijn gelaten, ook worden gevoed en, wanneer ze zijn verbonden met hetzelfde domein als de geteste poort, begrensd. Om het geteste IC te dwingen op te starten en communicatie tot stand te brengen met JTAG of een andere manier dit om de stroomtoevoer op normale werking in te stellen, moet de IC worden uitgerust met een externe klok. Tijdens de impedantiemetingen op de verschillende voed-ingspoorten, doorgaans een voor een, moet het externe klok worden uitgeschakeld.

N.B. Tijdens de impedantiemetingen moet het IC (ti-jdelijk) inactief zijn, d.w.z. dat de externe klok moet zijn uitgeschakeld.

Om de impedantiemetingen correct uit te voeren, moet de amplitude van het RF-signaal aan de hand waarvan de impedantie wordt gemeten, klein zijn vergeleken met de beschikbare voedingsspanning. Dit is nodig om niet-lineair gedrag van het IC tijdens de test te vermijden.

Om de spanningsafhankelijkheid van de gemeten ont-koppelingcapaciteiten te ontdekken, moeten de nominale DC-voorspanningen worden gewijzigd naar +5 of +10 % en tenminste -5 en -10 %. Indien mogelijk moet de DC-voorspanning worden verminderd tot net boven de situatie waarbij het apparaat stopt met 'functioneren'. Dit niet-functioneren kan worden opgemerkt door een onmiddellijke

in- en uitschakelen van de voeding op functionele blokken varieert, maar ook de voedingsspanningen en/of klokfre-quenties van de functieblokken.

En tenslotte, maar daarom zeker niet minder belangrijk, is dat de spanningsverzorging op de chip vaak niet langer toegankelijk blijkt door het gebruik van een LDO-spanning-sregelaar (low drop-out) op de chip. De geïntegreerde on-chipontkoppeling moet echter groot genoeg zijn om een aantal klokcyclussen, gewoonlijk tussen 10 tot 100 ns, te overbruggen voordat een LDO het kan overnemen. Bovendien moet het mogelijk zijn de lading die voor de LDO wordt opgeslagen, onmiddellijk te leveren. Ook hiervoor is on-chipontkoppeling onvermijdelijk. De time-of-flight voor het verkrijgen van spanning afkomstig van een ontkoppel-ingscondensator buiten de chip, is te lang. Een compromis hiervoor is gevonden met de integratie van passieve con-densatoren in de IC- behuizing die vaak in commerciële apparaten worden gebruikt.

De groep spanningsonafhankelijke capaciteiten wordt gevormd door de metalen onderling verbonden capaciteiten in het stroomschema en de samengevoegde condensatoren die in, op of onder de IC-behuizing worden geplaatst. In de laatste gevallen is de samengevoegde ontkoppelingscapac-iteit op de IC-behuizing bijna gelijk aan de ontkoppeling-scondensatoren op de PCB, maar met enige padlengte van de IC-behuizing in de richting van de PCB. De combinatie van deze twee in parallel geschakeld, met enige onderling verbonden lengte ertussenin, resulteert in resonanties.

III. CONFIGURATIE VAN DE IC-DECAPMETING

Afbeelding 2: Veelvoorkomende ontkoppelingsimpedantie buiten de chip die moet worden gebruikt met een FPGA, conform het door de fabrikant meegeleverde PDN-hulpmiddel.

Nederland


Voor het meten van de on-chipcapaciteit en/of elektrische impedanties is een impedance/gain of vectornetwerk analyzer nodig. Bij de impedantie-meetpoort(en) is een voorspan-ninggevend netwerk nodig om de nominale spanning op het vereiste vermogen naar het IC te voeren. Bovendien moeten alle andere voedingspoorten, die in dit onderzoek buiten beschouwing zijn gelaten, ook worden gevoed en, wanneer ze zijn verbonden met hetzelfde domein als de geteste poort, begrensd. Om het geteste IC te dwingen op te starten en communicatie tot stand te brengen met JTAG of een andere manier dit om de stroomtoevoer op normale werking in te stellen, moet de IC worden uitgerust met een externe klok. Tijdens de impedantiemetingen op de verschillende voed-ingspoorten, doorgaans een voor een, moet het externe klok worden uitgeschakeld.

N.B. Tijdens de impedantiemetingen moet het IC (ti-jdelijk) inactief zijn, d.w.z. dat de externe klok moet zijn uitgeschakeld.

Om de impedantiemetingen correct uit te voeren, moet de amplitude van het RF-signaal aan de hand waarvan de impedantie wordt gemeten, klein zijn vergeleken met de beschikbare voedingsspanning. Dit is nodig om niet-lineair gedrag van het IC tijdens de test te vermijden.

Om de spanningsafhankelijkheid van de gemeten ont-koppelingcapaciteiten te ontdekken, moeten de nominale DC-voorspanningen worden gewijzigd naar +5 of +10 % en tenminste -5 en -10 %. Indien mogelijk moet de DC-voorspanning worden verminderd tot net boven de situatie waarbij het apparaat stopt met 'functioneren'. Dit niet-functioneren kan worden opgemerkt door een onmiddellijke

in- en uitschakelen van de voeding op functionele blokken varieert, maar ook de voedingsspanningen en/of klokfre-quenties van de functieblokken.

En tenslotte, maar daarom zeker niet minder belangrijk, is dat de spanningsverzorging op de chip vaak niet langer toegankelijk blijkt door het gebruik van een LDO-spanning-sregelaar (low drop-out) op de chip. De geïntegreerde on-chipontkoppeling moet echter groot genoeg zijn om een aantal klokcyclussen, gewoonlijk tussen 10 tot 100 ns, te overbruggen voordat een LDO het kan overnemen. Bovendien moet het mogelijk zijn de lading die voor de LDO wordt opgeslagen, onmiddellijk te leveren. Ook hiervoor is on-chipontkoppeling onvermijdelijk. De time-of-flight voor het verkrijgen van spanning afkomstig van een ontkoppel-ingscondensator buiten de chip, is te lang. Een compromis hiervoor is gevonden met de integratie van passieve con-densatoren in de IC- behuizing die vaak in commerciële apparaten worden gebruikt.

De groep spanningsonafhankelijke capaciteiten wordt gevormd door de metalen onderling verbonden capaciteiten in het stroomschema en de samengevoegde condensatoren die in, op of onder de IC-behuizing worden geplaatst. In de laatste gevallen is de samengevoegde ontkoppelingscapac-iteit op de IC-behuizing bijna gelijk aan de ontkoppeling-scondensatoren op de PCB, maar met enige padlengte van de IC-behuizing in de richting van de PCB. De combinatie van deze twee in parallel geschakeld, met enige onderling verbonden lengte ertussenin, resulteert in resonanties.

III. CONFIGURATIE VAN DE IC-DECAPMETING

Afbeelding 2: Veelvoorkomende ontkoppelingsimpedantie buiten de chip die moet worden gebruikt met een FPGA, conform het door de fabrikant meegeleverde PDN-hulpmiddel.

NederlandCoenen, Van RoeRmund


daling van de stroomvoeding (zelfs in de hold-stand: klok uit). Deze spanning ligt gewoonlijk rond het spanningsniv-eau voor gegevensbehoud.

IV. METINGSRESULTATEN VAN IC-DECAP Voor een geavanceerde FPGA

werden de volgende parameters gevon-den voor de digitale core:

• On-chipkerncapaciteit:200nF+/-20%• ESRon-chipcapaciteit:1,2mΩ• Serie-inductievanchipnaarPCB:0,103nH• AantalVcc_corepennen:58• Capaciteit nauwelijks beïnvloeddoordeDC-voorspanning;0-0,9V

De piekstroom die door de digitale kern werd getrokken (in het slechtste geval)ligtenigszinsboven30Amp.Degemiddeldestroombedraagtongeveer5Amp.Dezeparameters,incombinatiemetdeidealeontkoppelingbuitendechip,levereneenreso-nantiefrequentievan35MHzmeteenkwaliteitsfactorvanbijna19!!ZoalsookkanwordengezienzoueenresistentePDN-impedantievanenkeletiendenmili-Ohmervoorzor-gendatdekwaliteitsfactorvanderesonantieonder1zakt.

Afbeelding 1 toont de digitale core, aande rechter-kant,aandehandvangeschakeldecondensatorenomdeverliezen van de kern duidelijk aan te geven. De verliezen worden bereikt in combinatie met de Ron-weerstand van de schakelaars. We meten de rimpelspanning in de volledige core,evenalsdestroomindekern,dievooralafkomstigisvandeon-chipcapaciteitC1.Deontkoppelingbuitendechip/spanningsbufferingwordtviadeleadframeenPCB-opbouwdoorC4enC5geleverd.L5//R5vertegenwoordigthetRF-ferrietmetverliesnaarhetresonantievrijePDNmet

eenRF-equivalente impedantie van0,1Ωen een idealevoedingopDC:L6//R5

Door het toevoegen van een kleine seriële inductie met RFverliesmeteenwaardevan10nH(L5)incombinatiemeteenPDN-impedantievan0,1Ωneemtdekwaliteitsfactorvanderesonantieopdechipafmeteenfactorvan10!Ookde ruis op de chip zakt hiermee met een paar procent.

Omhetinschakelenvandestroomen/ofklokmogelijktemaken,wordendegrote, lokaleelektrolytenC4enC5toegevoegdomdespanningtebufferen.MerkopdatdezeelektrolytendirectopdevoedingspennenvandeICmoetenwordenaangebracht,nietaandePDN-zijde.DeRF-stroomdoor de PDN neemt proportioneel af met de stroomreductie tengevolgevandekwaliteitsfactorreductie,naarmatedeRF-stromenopdechipwordenbegrensd.

Uit het feit dan de on-chipcapaciteit nauwelijks wordt beïnvloeddoordevoorspanning,kanwordenafgeleiddat

er afzonderlijke condensatoren binnen de IC-behuizingworden toegevoegd.Deze informatie was niet terug te vinden in de datasheets. Wel beschik-baar was een PDN-hulpmiddel dat de gebruiker precies de tegenovergestelde informatiegafdanuitafbeelding1kanworden afgeleid en zoals gezien door de digitale core binnenin (onderbro-ken lijn).

De PDN-structuur is mogelijk alleen belast met 'hoge' impedantie om de resonantievrije PDN-conditie te handhaven. De PDN-impedantie zoals gezien door de corelogica moet laagliggen,minimaalopdegebruiktefrequenties vande interne klok.Leterop dat data ofwel een harmonische of subharmonische van de gebruikte klokfrequenties zijn.

V. PDN-RESONANTIES

Afbeelding 3: Impedantie zoals gezien door de PDN-structuur (ononderbroken lijn)

Afbeelding 4: Ongelijke TL’s in parallelle opstelling (onderbroken lijnen) versus afgestelde TL’s (ononderbroken lijn)

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Wanneer er meerdere voedings-/massavlakken (PDN) worden gebruikt in een parallelle, meerlaagse PCB-bundel, kunnen zich tussen deze lagen verschillende materialen en ruimtes bevinden. Deze mogen niet worden samengevoegd, aangezien de Z0 en τpd dan zullen verschillen, met een nieuwe resonantie als gevolg (zie afbeelding 4).

Zoals uit de onderbroken lijn in afbeelding 4 kan worden afgeleid, geeft alleen een τpd-verschil van ongeveer 20% in combinatie met een verschilfactor 2 in Z0 steile resonanties op een PCB ter grootte van een Eurocard. Deze verschillen beginnen al onder 1 GHz. Hieruit blijkt dus dat de topolo-gieën van de PCB-laag die parallel worden gebruikt met een resonantievrij PDN-design, aan elkaar gelijk moeten zijn om deze resonanties tussen PDN's onderling te vermijden.

Alleen wanneer de twee of meerdere TL-propagatiever-tragingen gelijk aan elkaar zijn, gedragen de impedanties zich als parallel geplaatste weerstanden. In parallelle opstelling moet de randbegrenzing worden bijgesteld tot de resulterende parallelle impedantie (zie de ononderbroken lijn in afbeelding 4), zodat de resonantie tussen de PDN's afneemt.

VI. CONCLUSIES De instructies voor het ontkoppelen van de voeding die

door fabrikanten van de PCB en andere PCB-deskundigen worden gegeven, zijn tegenstrijdig en worden gebaseerd op een verouderde ontkoppelingsmethode. Deze verouderde methoden worden echter nog wel gehanteerd door een groot deel van de PCB-ontwerpwereld en geïntegreerd in de meeste EDA CAD-toolomgevingen.

Door eenvoudige maatregelen voor de ontkoppeling van PDN kan de variatie van de spanning c.q. stroom die door de PDN wordt opgewekt worden gedecimeerd, indien de maatregelen voor ontkoppeling op de chip of plaat bekend zijn. Zelfs bij bestaande ontwerpen kan een orde van grootte worden verbeterd ten behoeve van een afname in kwalit-eitsfactor en RF-emissie.

Evenwijdige PDN-vlakken op een meerlaagse PCB-structuur moeten op elkaar worden afgestemd, teneinde resonantie tussen PDN's onderling te vermijden. Deze reso-nanties komen zowel bij conventionele als bij resonantievrije PDN-ontwerpen voor.

Bij het gebruik van PDN-vlakstructuren met gelijke propagatievertragingen bij parallelle opstelling moeten randbegrenzingsnetwerken dienovereenkomstig worden aangepast.

MET DANK AAN De auteur bedankt zijn klant, die hem de kans bood

gezamenlijk deze testmethode te ontwikkelen. Het uit-gevoerde werk wordt ondersteund door het Nederlandse overheidsprogramma voor innovatie WBSO, onder het nummer ZT09051042.SO.

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• [15] Norman W. Smith* and James L. Drewniak, Quantifying Decoupling Capacitor Location, Electromagnetic Compatibility Laboratory, Department of Electrical and Computer Engineering, University of Missouri - Rolla, Rolla, MO 65409, USA

• [16] T. Hakoda, T. Takahashi, T. Sakusabe, N. Schibuya. , ”Study on Noise Reduction Effect Using the Decoupling Capacitor with Resistor on Power Distribution Line,” Proc. APEMC 2008 (Singapore), pp.878- 881, May 2008.

• [17] Scott McMorrow, Teraspeed Consulting Group, Brian Vicich, Samtec, Inc., Steve Weir, Teraspeed Consulting Group, Tom Dagos-tino, Teraspeed Consulting Group, Pushing the Envelope Without Tears: An Advanced Power Delivery Solution, DesignCon 2008

• [18] Junho Lee, Hyungsoo Kim, and Joungho Kim, Terahertz In-terconnection & Package Laboratory KAIST, Division of EE and CS Daejon, South Korea, Broadband Suppression of SSN and Radiated Emissions using High-DK Thin Film EBG Power Distribution Network for High-Speed Digital PCB Applications

• [19] Iliya Zamek, Nm-System’s Jitter Resonance induced by PDN noise of toggling on-die Logic, DesignCon 2010

• [20] M. Coenen, D. de Greef, Optimization techniques for minimiz-ing IR-drop and supply bounce, EMCCompo 2005

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SCHWEIZ


Contents | Schweiz

GustavGuanella (1909–1982)


RESSOURCEN

148

150

Gustav Guanella war ein schweizer Er nder, der zahlreiche Patente besaß. Guanella studier te Elektrotechnik an der Eidgenössischen Technischen Hochschule Zürich und graduierte 1933. Er war ein Assistent von Professor Fritz Fischer, der das Eidophor-System für die groß ächige Projektion von Fernsehbildern erfand. G u a n e l l a i n t e r e s s i e r t e s i c h f ü r Hochfrequenzelektronik. Seine Erfindungen führten zu 40 Patentanträgen. Guanella arbeitete für die BBC Schweiz und wurde Leiter einer Abteilung, die sich mit der Entwicklung von Hochfrequenzelektronik befasste. Er ist einer der Er ndert der DSSS-Übertragungstechnik (Direct Sequence Spread Spectrum). Guanella erfand den Guanella-Balun, einen Hochfrequenz-Impedanzadapter.

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Schweiz | Produkte und Services

A

A.H. Systems Pro Nova Elektronik GmbH; Ludwigsburg Deutschland; +49 7141 2858 20; Fax: +49 7141 2858 29;[email protected]; www.AHSystems.comProdukte und Services: Antennen, Testausstattung, Testen

ABB Ltd.Affolternstrasse 44, City Port, Postfach 8131, Zurich, 8050, Schweiz;+41 43 317 7111; Fax: +41 43 317 4420;Thomas Schmidt, [email protected]; www.abb.com Produkte und Services: Testausstattung

AR/RF Microwave InstrumentationEmitec AG, Business Cube, Birkenstrasse 47, Rotkrueuz, Schweiz 6343;+41 41 748 6010; Fax: +41 41 748 5055;Armin Diethelm, [email protected]; Peter Wuethrich, [email protected]; www.emitec.ch Produkte und Services: Verstärker, Antennen, Kabel und Stecker, Abgeschirmte Räume und Gehäuse, Übers-pannung und Einschaltstöße, Testausstattung

Arrow EuropeRiedmatt 9 8153 Rumlang;+41 44 8176-217; www.arroweurope.comProdukte und Services: Ferrite, Kabel und Steck-verbinder, Power Applications

C


Ciba Inc.Klybeckstr. 141, 4057 Basel, Schweiz;+41 61 636 6049; Fax: +41 61 636 3019;www.ciba.com Produkte und Services: Leitungsmaterialien

Communications & Power Industries Shiraz Dewji and Miro Antelj, Communications & Power Industries International Inc., Cham, Schweiz;+41 41 560 7550; Fax: +41 41 560 7551;[email protected] und Services: Verstärker

E

EM TEST AGEMITEC AG, Business Cube, Birkenstrasse 47, CH-6343 Rotkreuz, Schweiz;+41 41 748 6010; Fax: +41 41 748 6011;[email protected]; www.emitec.ch Produkte und Services: Überspannung und Einschalt-stöße, Testausstattung, Testen

EMC PARTNER AGRoschi Rohde & Schwarz AG; Mühlestrasse 7, 3063 Ittigen, Schweiz;+41 31 922 15 22; Fax: +41 31 921 81 01;

[email protected]; www.roschi.rohde-schwarz.comProdukte und Services: Überspannung und Einschalt-stöße, Testausstattung

Emitec AGBusiness Cube, Birkenstrasse 47, Rotkreuz, ZG, 6343, Schweiz;+41 41 748 6010; Fax: +41 41 748 6011;Peter Wuethrich; [email protected]; www.emitec.ch Produkte und Services: Testausstattung, Verstärker, Antennen, Überspannung und Einschaltstöße

Euro EMC ServiceDr.-Ing. D. Hansen, Bahnhofstr. 39, POB 84, CH 8965 Berikon, Schweiz;+41 56 633 7381; Fax: +41 56 633 7381;[email protected]; www.euro-emc-service.de Produkte und Services: Berater

F

Fair-Rite ProductsDantronic AG, Motorenstrasse 100, 8620 Wetzikon / ZH Schweiz;+41 44 931 2233; Fax: +41 44 931 2200;[email protected]; www.fair-rite.comProdukte und Services: Ferrit, Filter, Abgeschirmte Räume und Gehäuse, Abschirmung

G

Gowanda ElectronicsSicovend AG; Alte Poststrasse 1,Kemptthal, Schweiz, CH-8310;+41 52 354 8080; Fax: + 41 52 354 8000;[email protected]; www.sicovend.chProdukte und Services: induktorer


Schweiz | Produkte und Services

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Produkte und Services | Schweiz

H

Haefely Test AGRoschi Rohde & Schwarz AG, Mühlestrasse 7, CH 3063 Ittigen, Schweiz;+41 31 922 1522; Fax: +41 31 921 8101;Kurt Schilter, [email protected]; www.roschi.rohde-schwarz.chProdukte und Services: Überspannung und Einschalt-stöße, Testausstattung

I

a TESEQ CompanyIFI – Instruments for Industry Teseq AG, Nordstrasse 11F, 4542 Luterbach;+41 32 681 40 40; Fax +41 32 681 40 48;[email protected]; www.teseq.chProdukte und Services: Entwicklung und Herstellung von Leistungsverstärkern im Mikrowellen und HF-Bereich (Tetrode Tubes, Solid State and TWT)

L

Langer EMV-Technik GmbHROSCHI ROHDE & SCHWARZ AG,Mühlestrasse 7, CH - 3063 Ittigen;+41 (0)31 92-215 22; Fax: +41 (0)31 92-181 01;[email protected]; www.roschi.rohde-schwarz.ch; www.langer-emv.deProdukte und Services: Testausstattung

M

a TESEQ CompanyMilmegaTeseq AG, Nordstrasse 11F, 4542 Luterbach;+41 32 681 40 40; Fax +41 32 681 40 48;[email protected]; www.teseq.chProdukte und Services: Entwicklung und Herstellung von Leistungsverstärkern im Mikrowellen und HF-Bereich

S

Schlegel Electronic MaterialsAWAG Elektrotechik AG, Sandbüelstrasse 2, CH-8604 Volketswil, Schweiz;+41 44 908 1919; Fax +41 44 908 1999;Oliver Huber, [email protected]; www.awag.chProdukte und Services: Leitungsmaterialien,Abschirmung

SCHURTER AG Werkhofstrasse 8-12, Postfach, 6002 Luzern, Schweiz; +41 41 369 31 11; Fax: +41 41 369 33 33;Herbert Blum; [email protected]; www.schurter.com Produkt und Services: Filter, Drosseln, TestenSchmid & Partner Engineering AG (SPEAG)Zeughausstrasse 43, Zurich, CH 8004, Schweiz;+41 44 245 9691; Fax: +41 44 245 97 79;www.schurter.ch Produkte und Services: Filter


EXZELLENT, WEIL EFFIZIENT! –NSG 4070 DER MULTIFUNKTIONS- GENERATOR

Der NSG 4070, ein Multitalent für entwicklungsbegleitende Tests und Normprüfungen nach IEC/EN 61000-4-6. Wer bisher viel Zeit für die Prüfplatzkalibrierung, die Anbindung des EUT-Monitors oder die Dokumentation aufwenden musste, kann Störfestigkeits-prüfungen nun mit dem NSG 4070 viel effizienter durchführen. Die weiteren Highlights: EUT-Monitoring-Ergebnisse können während der Prüfung kommentiert werden, die Ausgabe erfolgt im Report. Abspeichermöglichkeit für Ergebnisse, Konfigurationen und Kalibrierdateien mit bis zu 340 Daten.

Der NSG 4070 auf einen Blick:

Lösung für IEC/EN 61000-4-6 und Automotive BCI

Frequenzbereich 9 kHz bis 1 GHz

Einfache Bedienung über Frontplatte oder Windows-Software

Anzeige der Kalibrierdaten in graphischer und tabellarischer Form

Verstärker-Sättigungs-Check

Regelung des Kalibrier- und Prüfpegels anhand der Vorwärtsleistung am Verstärkerausgang

Teseq AG 4542 Luterbach SchweizT + 41 32 681 40 50 www.teseq.com

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Schweiz | Ressourcen

T


Teseq AGTeseq AG, Nordstrasse 11F, 4542 Luterbach;+41 32 681 40 40; Fax +41 32 681 40 48;[email protected]; www.teseq.chProdukt und Services: Verstärker (HF & Mikrowellen), Antennen, Automotive Systeme, leitungsgebundene Störfestigkeit, leitungsgebundene Überspannung & schnelle Transienten, ESD, Netzoberwellen & Flicker, GTEM Zellen, HF Immunitäts- und Emissionssysteme, HF Testsoftware, Kalibration & Service

RESSOURCENFEDERAL MINISTRY OF ECONOMICS AND TECHNOLOGY RADIO FREQUENCY POLICY, ELECTROMAGNETIC COMPATIBILITYVillemombler Straße 76 53123 Bonn;+49 228 99615-3258; Fax: +49 228 99 615- 3264; Michael Scharnberg, [email protected] Follow Us on Twitter @e_cooling

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BELGIQUE


Contents | Belique

FemkeOlyslager (1966–2009)


RESSOURCES

154

156

Femke Olyslager est un ingénieur scienti que belge. Détentrice d’une maîtrise et d’un doctorat en ingénierie électrique obtenus à l’Université de Gand, en Belgique, elle enseigne, en tant que professeur, l’électromagnétisme à l’Université de Gand. Ses contributions dans le domaine de l’électromagnétisme se traduisent par la rédaction ou la co-rédaction de 300 publications dans des revues internationales et des actes de conférences. Olyslager a été la sous-secrétaire générale de l’Union Radio-Scienti que Internationale, la rédactrice en chef adjointe de la revue IEEE Transactions on Antennas and Propagation et la rédactrice en chef adjointe de Radio Science. Olyslager a reçu le prix IEEE Microwave en 1995 pour le meilleur article publié dans la revue IEEE Transactions On Microwave Theory and Techniques en 1993 et le Best Transactions Paper Award en 2000 pour le meilleur article publié dans la revue IEEE Transactions on Electromagnetic Compatibility en 1999. En 2002, elle reçoit la Médaille d’Or Issac Koga de l’URSI (en reconnaissance pour son travail en électromagnétisme). En 2004, elle devient lauréate de l’Académie royale amande de Belgique. En 2005, elle est élue membre-associée de l’IEEE.

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Belgique | Produits et Services

A

A.H. SystemsEEMCCOIMEX, Apolloweg 80,8239 DA, Lelystad, Nederland;+31 320 295 395; Fax: +31 320 413 133;[email protected]; www.AHSystems.com Produits et services: Antennes, Instrument de contrôle, Contrôles

ANPIParc scientifique Fleming, Rue Granbonpré 1, 1348 Louvain-la-Neuve, Belgique;+32(0) 10 47 52 11; Fax: +32(0) 10 47 52 70;[email protected]; www.anpi.beProduits et services: Contrôles

AR Benelux B.V.Frankrijklaan 7, ITC Boskoop,NL-2391 PX, Hazerswoude-Dorp, Nederland;+31(0)172 423 000; Fax: +31(0)172 423 009;Onno de Meyer, [email protected];www.arbenelux.comProduits et services: Amplificateurs, Antennes, Câbles et connexions, Espaces sous protection et clôtures, Hausse et éléments temporaires, Instru-ment de contrôle

Arrow EuropeKeiberg II Minervastraat 14/B2 1930 Zaventem;+32 (0) 27 25 46 60; www.arroweurope.comProduits et services: Ferrites, câbles et con-necteurs, applications de puissance

B

Bekaert Fibre TechnologiesPresident Kennedypark 18, B-8500 Kortrijk Bel-gique;+32(0) 56 23 05 11; Fax: +32 (0) 56 23 0543; www.bekaert.comProduits et services: Protection

BGEMC Joseph Cardijnstraat 21, Erpe-Mere,OVl, B-9420, Belgium;+32(0)53 60 16 01; Fax:+32(0)53 70 78 99;Johan De Temmerman; [email protected]; www.bgemc.com Produits et services: Contrôles

C

Carlisle Interconnect TechnologiesUnited Kingdom;+44-7817-731-000;Andy Bowne, [email protected]; www.CarlisleIT.comProduits et services: Filtres

D

Dow Corning CorporationDow Corning Europe SA, Parc Industriel - Zone C, Rue Jules Bordet, 7180 Seneffe, Belgium,+32 64 511 163, Fax: +32 64 888 401,Linda Coughlin, [email protected]; www.dowcorning.comProduits et services: Test

E

EM Test AG

EM Test GmbH, Lünener Strasse 211, 59174 Kamen, Deutschland;+49 (0) 2307 26070 0; Fax: +49 (0) 2307 17050;[email protected]; www.emtest.deProduits et services: Hausse et éléments tem-poraires, Contrôles Instrumentation, Contrôles

EMC PartnerDecatel S.A, Rue de la Technologie 31BE,1082 Berchem-Ste-Agathe, Belgium;+32 2 469 00 90; Fax: +32 2 469 06 07;[email protected]; www.decatel.beProduits et services: Hausse et éléments tem-poraires, Instrument de contrôle

F

Fair-Rite Products Corp.HF Technology, Atalanta 5, 1562 LC Krommenie, Holland; +31 (0)75 - 628 37 17; Fax: +31 (0)75 - 621 11 20;[email protected]; www.fair-rite.comProduits et services: Ferrite, Filtres, Espaces sous protection et clôtures, Protection

I

a TESEQ CompanyIFI - Instruments for Industry Accelonix BV, Postbus 7044,5605 JA Eindhoven, Netherlands;+31 40 750 1650; Fax: +31 40 293 0722;[email protected]; www.accelonix.nl Produits et services: Concepteurs et fabricants


Belgique | Produits et Services

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Produits et Services | Belgique

d ’ ampli f icateurs radiof réquences et hyper-fréquences de haute puissance (Tetrode Tubes, Solid State and TWT)

L

LaborelecRodestraat 125, B -1630 Linkebeek, Belgique,+32(0)2 382 02 11; Fax: +32(0)2 382 02 41;[email protected]; www.laborelec.comProduits et services: Contrôles

M

a TESEQ Company

MILMEGAAccelonix BV, Postbus 7044,5605 JA Eindhoven, Netherlands;+31 40 750 1650; Fax: +31 40 293 0722;[email protected]; www.accelonix.nlProduits et services: Concepteurs et fabricants d ’ ampli f icateurs radiof réquences et hyper-fréquences de haute puissance

N

Nexio EEMC Coimex, Apolloweg 80 8239 Da Lelystad,;+31 320 295 395; Fax: +31 320 413 133;www.eemc.nl/eng; [email protected] Produits et services: Instrument de contrôle

S

Schlegel Electronic MaterialsSHIELDINXDe Ploegschaar 135, 5056 MC Berkel-Enschot, NetherlandsPaul Jansen, Tel: +31-6-12049820Produits et services: Matériaux conducteurs, Protection

T

Tech-Etch, Inc.HF Technology, Atalanta 5,1562 LC Krommenie, Nederland;+31 75 628 37 17; Fax: +31 75 621 11 20;[email protected]; www.tech-etch.comProduits et services: Matériaux conducteurs, Protection


Teseq Ltd.Accelonix BV, Postbus 7044,5605 JA Eindhoven, Netherlands;+31 40 750 1650; Fax: +31 40 293 0722;[email protected]; www.accelonix.nlProduits et services: Amplificateurs, antennes, Automotive Systems, Immunité aux perturbations conduites, les surtensions transitoires et conduites, l’EDD, Harmoniques et Flicker, les cellules GTEM, Systèmes d’immunité RF, RF Systems émission, logiciel de test RF, d’étalonnage et Servicetesting


ITS 6006 EMC IMMUNITY TEST SYSTEM –INGENIOUSLY INTEGRATED TESTING TO 6 GHzThere has never been a specially designed compact system for radiated immunity EMC testing like this: The ITS 6006 ingeniously integrates a large number of functions, reducing setup time, cable losses, errors and costs. This versatile unit is as flexible as it is safe, and its 2.8’’ color display makes it especially easy to use. It features an impressive variety of immunity tests to address a wide range of IEC standards. With the ITS 6006, TESEQ once again demonstrates its leading expertise in the field of immunity testing.

Signal generator with AM/PM/external modulation

Integrated 4-channel RF switch network

Amplifierinterlockcontrol

Remote control via USB, RS 232 or LAN

Extensive EUT monitoring

Power meter integration

PM 6006 Power Meter

RMS power meter, 1 MHz to 6 GHz

Linear from –45 dBm to 20 dBm

Connection to PC/USB or directly to an ITS 6006

Accelonix BV Eindhoven The NetherlandsT +31 40 750 1650 www.accelonix.nl



Belgique | Ressources

ASSOCIATIONS IEEE EMC SOCIETY CHAPTER BENELUX Dodeweg 6B, 3832 RC Leusden, Postbus 366, 3830 AK Leusden, The Netherlands; +(033) 465 75 07; Fax: +(033 ) 461 66 38; Chairman Cees Keyer; [email protected]; www.emc-esd.nl

NOTIFIED BODIES AIB-VINÇOTTE BELGIUMBusiness Class Kantorenpark, Jan Olieslagerslan, 35, 1800 Vilvoorde, Belgique; +32 (0)2 674 57 11; Fax: +32 (0)2 674 59 59; [email protected]; www.vincotte.be

ANPIParc scientifique Fleming, Rue Granbonpré 1, 1348 Louvain-La-Neuve, Belgique; +32 10 47 52 11; Fax: +32 10 47 52 70; [email protected]; www.anpi.be

BLUE GUIDE EMC LABJoseph Cardijnstraat 21, 9420 Erpe-Mere, Belgique; +32 53 60 16 01; Fax: +32 53 70 78 99; [email protected]; www.bgemc.com

LABORATORIA DE NAYERJ.P. De Nayerlaan 9, 2860 Sint-Katelijne-Waver, Belgique; +32 (0)15 31 33 22; Fax: +32 (0)15 32 12 12; Filip Nauwelaerts; [email protected]; www.labodenayer.be

LABORATOIRE COMPATIBILITÉ ÉLECTROMAGNÉTIQUE - UNIVERSITÉDE LIÈGEUniversité de Liège Sart-Tilman, Institut Montefiore, B28, 4000 LIEGE, Belgique, +32 4 366 37 46, Fax: +32 4 366 29 10, Véronique Beauvois; [email protected]; www.ulg.ac.be

LABORELECRodestraat 125, 1630 Linkebeek, Belgique; +32 2 382 02 11; Fax: +32 2 382 02 41; [email protected]; www.laborelec.com

LEMCKOGraaf Karel De Goedelaan 34, 8500 Kortrijk, Belgique; +32 56 24 12 35; Fax: +32 56 24 12 34; [email protected]; http://www.lemcko.be/

SGS BELGIUM NV - DIVISION CEBECSGS House, Noorderlaan 87, Antwerpen, 2030, Belgique; +32 3 545 44 00; Fax: +32 3 545 44 99; [email protected]; www.cebec.sgs.com

OTHER INSTITUT BELGE DES SERVICES POSTAUX ET DES TÉLÉCOMMUNICATIONS / BELGISCH INSTITUUT VOOR POSTDIENSTEN EN TELECOMMUNICATIE (BIPT)Ellipse Building - Bâtiment C, Boulevard du Roi Albert II 35, 1030 Bruxelles, Belgique; +02 226 88 88; Fax: +02 226 88 77; Eric Colpaert, [email protected]

Got thermal problems?We’ve got solutions!

Read the latest news, standards & product updates

Find products & services with our Buyers’ Guide

Download the most recent issue of Electronics Cooling

Share & comment on stories with colleagues

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❯

❯

❯

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Belgique | Ressources

ASSOCIATIONS IEEE EMC SOCIETY CHAPTER BENELUX Dodeweg 6B, 3832 RC Leusden, Postbus 366, 3830 AK Leusden, The Netherlands; +(033) 465 75 07; Fax: +(033 ) 461 66 38; Chairman Cees Keyer; [email protected]; www.emc-esd.nl

NOTIFIED BODIES AIB-VINÇOTTE BELGIUMBusiness Class Kantorenpark, Jan Olieslagerslan, 35, 1800 Vilvoorde, Belgique; +32 (0)2 674 57 11; Fax: +32 (0)2 674 59 59; [email protected]; www.vincotte.be

ANPIParc scientifique Fleming, Rue Granbonpré 1, 1348 Louvain-La-Neuve, Belgique; +32 10 47 52 11; Fax: +32 10 47 52 70; [email protected]; www.anpi.be

BLUE GUIDE EMC LABJoseph Cardijnstraat 21, 9420 Erpe-Mere, Belgique; +32 53 60 16 01; Fax: +32 53 70 78 99; [email protected]; www.bgemc.com

LABORATORIA DE NAYERJ.P. De Nayerlaan 9, 2860 Sint-Katelijne-Waver, Belgique; +32 (0)15 31 33 22; Fax: +32 (0)15 32 12 12; Filip Nauwelaerts; [email protected]; www.labodenayer.be

LABORATOIRE COMPATIBILITÉ ÉLECTROMAGNÉTIQUE - UNIVERSITÉDE LIÈGEUniversité de Liège Sart-Tilman, Institut Montefiore, B28, 4000 LIEGE, Belgique, +32 4 366 37 46, Fax: +32 4 366 29 10, Véronique Beauvois; [email protected]; www.ulg.ac.be

LABORELECRodestraat 125, 1630 Linkebeek, Belgique; +32 2 382 02 11; Fax: +32 2 382 02 41; [email protected]; www.laborelec.com

LEMCKOGraaf Karel De Goedelaan 34, 8500 Kortrijk, Belgique; +32 56 24 12 35; Fax: +32 56 24 12 34; [email protected]; http://www.lemcko.be/

SGS BELGIUM NV - DIVISION CEBECSGS House, Noorderlaan 87, Antwerpen, 2030, Belgique; +32 3 545 44 00; Fax: +32 3 545 44 99; [email protected]; www.cebec.sgs.com

OTHER INSTITUT BELGE DES SERVICES POSTAUX ET DES TÉLÉCOMMUNICATIONS / BELGISCH INSTITUUT VOOR POSTDIENSTEN EN TELECOMMUNICATIE (BIPT)Ellipse Building - Bâtiment C, Boulevard du Roi Albert II 35, 1030 Bruxelles, Belgique; +02 226 88 88; Fax: +02 226 88 77; Eric Colpaert, [email protected]

Got thermal problems?We’ve got solutions!

Read the latest news, standards & product updates

Find products & services with our Buyers’ Guide

Download the most recent issue of Electronics Cooling

Share & comment on stories with colleagues

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❯

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Visit us online at Electronics-Cooling.com

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ÖSTERREICH


Contents | Österrreich


158

Carl August von Steinheil war ein österreichisch-deutscher Physiker, Er nder, Techniker und Astronom. Im Jahr 1839 benutzte Steinheil Silberchloridpapier und eine tubusförmige Kamera aus verschiebbaren Pappröhren um Motive aufzunehmen. Er erfand den ersten Daguerreotypen in Deutschland. 1846 ging Steinheil nach Neapel, um dort ein neues System für Gewichts- und Maßeinheiten einzuführen. Drei Jahre später arbeitete er im Departement für Telegraphie im österreichischen Handelsministerium, entwarf ein Telegraphennetzwerk für die k.u.k. Monarchie und beteiligte sich an der Gründung des Deutsch-Österreichischen Telegraphenvereins. 1851 baute er das Schweizer Telegraphenwesen auf, worauf er nach München zurückkehrte und Kurator der mathematisch-physikalischen Sammlungen und Ministerialrat im Handelsministerium von Bayern wurde. Er erfand die elektrische Erdrückleitung, den Schreibtelegraphen, die elektrische Uhr, die Steinheil-Schrift, das Steinheil-Doublet (eine achromatische Linse) und die Silberbeschichtung von Glas für die Verwendung in Teleskopen.

Carl Augustvon Steinheil (1801–1870)

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Österreich | Produkte und Services

A

A.H. Systems, Inc.

Pro Nova Elektronik GmbH, Ludwigsburg, Österreich; +49 7141 2858 20; Fax: +49 7141 2858 29;[email protected];www.AHSystems.com Produkte und Services: Antennen, Testausstattung, Testen

AR/RF Microwave InstrumentationEMV GmbH, Wallbergstr.7,Taufkirchen, Deutschland, D-82024;+49 8961 41710; Fax: +49 8961 417171;Wolfram Abels; [email protected];www.emvGmbh.de; www.arworld.usProdukte und Services: Verstärker, Antennen, Kabel und Stecker, Abgeschirmte Räume und Gehäuse, Übers-pannung und Einschaltstöße, Testausstattung

Arrow EuropeLandstraßer Haupstraße 97-101 / Stiege 1 / 4A 1030 Wien;+43 (01) 360 46-50; www.arroweurope.com.Produkte und Services: Ferrite, Kabel und Steck-verbinder, Power Applications

E

EM TEST GmbHUEI Universal Elektronik Import GmbH, Anton Freun-schlag Gasse 49, 1230 Vienna, Österreich;+43(0)1 545 1588; Fax: +43(0)1 545 1464;www.uei-vienna.com/index.php/kontakt; www.uei-vienna.comProdukte und Services: Testen & Testausstattungen für ESD, BURST, SURGE, Dips &Drops, RWG, RF Immu-nity, Telecom, Automotive sowie Ueberspannung und Einschaltstösse.

F

Fair-Rite Products Corp.Industrial Electronics, Hauptstr. 71 - 79 D-65760 Esch-born Österreich;+49 6196 927900; Fax: +49 6196 927929;[email protected]; www.fair-rite.comProdukte und Services: Ferrit, Filter, Abgeschirmte Räume und Gehäuse, Abschirmung


Österreich | Produkte und Services

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Produkte und Services | Österreich

I

a TESEQ CompanyIFI - Instruments for Industry deg-Messtechnik GmbHMeldemannstrasse 18, 1200 Wien;+43 1 +813 5380-0; Fax: +43 1 813 5380-3059;[email protected]; www.deg-messtechnik.atProdukte und Services: Entwicklung und Herstellung von Leistungsverstärkern im Mikrowellen und HF-Bereich (Tetrode Tubes, Solid State and TWT)

Industrial ElectronicsRudolf-Diesel-Str. 2a D-65719 Hofheim-Wallau;+49 (0) 6122 / 7 26 60-0; Fax: +49 (0) 6122 / 7 26 60-29; [email protected]; [email protected]; www.ie4u.deProdukte und Services: Ferrite, Kabel und Steck-verbinder, Power Applications

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a TESEQ CompanyMilmegadeg-Messtechnik GmbH Meldemannstrasse 18, 1200 Wien;+43 1 +813 5380-0; Fax: +43 1 813 5380-3059;[email protected];www.deg-messtechnik.atProdukte und Services: Entwicklung und Herstellung von Leistungsverstärkern im Mikrowellen und HF-Bereich

S

Schlegel Electronic MaterialsJiC Warenvertriebs-gesellschaft m.b.H., Theresianum-gasse 13, Vienna 1040, Österreich;+43-1-812 2739; Fax: +43-1-812 1081;John Wellems; [email protected];www.jic-trading.com

Produkte und Services: Leitungsmaterialien, Ab-schirmung

Seibersdorf Labor GmbHSeibersdorf, 2444 Austria;+43 5055 02882; Fax: +43 5055 02881;DI Wolfgang Muellner;[email protected]; www.seibersdorf-laboratories.atProdukte und Services: Antennen, Abgeschirmte Räume und Gehäuse, Testausstattung, Testen

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Teseqdeg-Messtechnik GmbHMeldemannstrasse 18, 1200 Wien;+43 1 +813 5380-0; Fax: +43 1 813 5380-3059;[email protected]; www.deg-messtechnik.atProdukte und Services: Verstärker (HF & Mik-rowellen), Antennen, Automotive Systeme, leitungsge-bundene Störfestigkeit, leitungsgebundene Überspan-nung & schnelle Transienten, ESD, Netzoberwellen & Flicker, GTEM Zellen, HF Immunitäts- und Emissions-systeme, HF Testsoftware, Kalibration & Service


ESD Simulator NSG 437 –DEr Profi für DaS klEiNE BuDGEt

Der NSG 437 mit seinem menugesteuerten, ergonomischen Touchscreen-Kontrollpanel steht für hohe technische Performance und einfachste Bedienung. Er wurde speziell für Basisanwendungen im 30 kV Bereich entwickelt. Das geniale Gerät erfüllt alle gängigen ESD-Standards und gewährleistet jederzeit die geforderten fünf Sekunden Spannungshal-tung. Die breite Palette einfach austauschbarer Netzwerk-Module macht das Testgerät speziell für die Automobilindustrie interessant. Und: Teseq bürgt mit seinem weltweiten Netz an akkreditierten Kalibrierstellen jederzeit für präzise Zertifizierung.

Der Leistungsausweis des NSG 437:

Testet mit Luft- und Kontaktentladung bis 30 kV

Stabilisierte Prüfspannung >5 Sekunden

Automatische Polaritätsumschaltung

Erfüllt IEC, ANSI, SAE, ISO Normen

Grosses Touchscreen-Kontrolldisplay

Schnell auswechselbare Netzwerkmodule

Beliebige R/C-Netzwerke ab 0 Ohm und bis 2 nF

deg-Messtechnik GmbH Wien ÖsterreichT +43 1 8135 380-0 www.deg-messtechnik.at

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interferencetechnology.eu INTERFERENCE TECHNOLOGY 161interferencetechnology.eu INTERFERENCE TECHNOLOGY 161

Contents | Europe 2013

Nikola Tesla was a Serbian-American inventor, physicist and electrical and mechanical engineer known for his contributions to alternating current electrical supply systems. Tesla worked in the telephone and electrical elds throughout Europe in the late 1800s, then moved to the United States in 1884 to work for Thomas Edison, who was trying to improve the electric lighting system. Tesla believed currents could ow bothways, rather than one. After he left Edison, he set up laboratories to develop a range of electrical devices. At his labs in New York and Colorado he experimented with high-voltage, high-frequency power experiments; patented devices to assist in the creation of radio communications and erected antennas for wireless transmissions. He patented an AC induction motor and transformer that was licensed by George Westinghouse, who hired Tesla as a consultant to help develop an alternating current system. Tesla patented the Tesla coil in 1891. He eventually held more than 700 patents. In 1960, the General Conference on Weights and Measures for the International System of Units dedicated the term “tesla” to the SI unit measure for magnetic eld strength. In 1886, Tesla formed Tesla Electric Light & Manufacturing. The company installed electrical arc light based illumination systems designed by Tesla. In April 1887, Tesla started the Tesla Electric Company.

NikolaTesla (1856–1943)

PRODUCTS & SERVICES Albania Armenia Belarus Bosnia-Herzegovina Bulgaria Cyprus Czech Republic Denmark Estonia Finland Greece Hungary Ireland Latvia Lithuania Luxembourg Moldova Norway Portugal Romania Russia Serbia Slovakia Slovenia Sweden Ukraine

162

EUROPE

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Europe | Products & Services


AlbaniaAR / RF Microwave InstrumentationFrankrijklaan 7, ITC Boskoop, NL-2391 PX,Hazerswoude-Dorp, Nederland;+31(0)172 423 000; Fax: +31(0)172 423 009;Onno de Meyer, [email protected];www.arbenelux.comProducts and Services: Amplifiers, Antennas, Cables and Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EMC PartnerACTA Ltd., Ethnikis Antistaseos 14A, Chalandri, GR-15232 Athens, Greece;+30 210 600 33 02; Fax: +30 210 600 31 13;Antonis Georgiou; [email protected]; www.acta.com.grProducts and Services: Surge & Transients, Test Instrumentation

ArmeniaEM TEST EMCI, 105005, Radio Str., 24, Build. 1, Moscow, Russia; +7 (495) 410 64 65; Fax: +7 (495) 980 71 19; [email protected]; www.emci.ruProducts and Services: Surge & Transients, Test Instrumentation, Testing

BelarusAR RF/Microwave InstrumentationRadiant-Elcom, 117246, Nautchny proezd,8 b.1, Moscow;+7495 725 0404; Fax: +7495 921 3585;Sergey Pavlov, [email protected]; www.radiant.suProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TESTEMCI, 105005, Radio Str., 24, Build. 1, Moscow, Russia; +7 (495) 410 64 65; Fax: +7 (495) 980 71 19; [email protected]; www.emci.ruProducts and Services: Surge & Transients, Test Instrumentation, Testing

Bosnia- HerzegovinaEM TEST GmbHLünener Strasse 211, 59174 Kamen, Germany;+49 (0)2307 26070-0; Fax: +49 (0)2307 17050;[email protected]; www.emtest.comProducts and Services: Surge & Transients, Test Instrumentation

BulgariaA.H. Systems, Inc.Test Solutions, Sofia;+359 2 970 1990; Fax: +359 2 970 1999; [email protected]; www.test-solutions.bgProducts and Services: Antennas, Test Instru-mentation, Testing

AR RF/Microwave InstrumentationGiga Electronics EOOD, 21A Manastirska,Sofia Bulgaria 1111;+359 2 971 4919, Fax: +359 2 873 1498;Danail Georgiev, danail@gigatest .net ; w w w.gigatest.netProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TEST GmbHLünener Strasse 211,59174 Kamen, Germany;+49 (0)2307 26070-0; Fax: +49 (0)2307 17050; [email protected]; www.emtest.com Products and Services: Surge & Transients, Test Instrumentation, Testing

EMC Partner AG+41 61 775 20 30;Nicolas Wright; [email protected];www.emc-partner.chProducts and Services: Surge & Transients, Test Instrumentation

IFI – Instruments for IndustryBalkantel Ltd., 68, Bratya Bakston Blvd., Sofia 1618, +359 2 850 04 30; Fax +359 2 955 91 89;[email protected]; www.balkantel.netProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MilmegaBalkantel Ltd., 68, Bratya Bakston Blvd., Sofia 1618, +359 2 850 04 30; Fax +359 2 955 91 89;[email protected]; www.balkantel.netProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

TeseqBalkantel Ltd., 68, Bratya Bakston Blvd., Sofia 1618, +359 2 850 04 30; Fax +359 2 955 91 89;[email protected]; www.balkantel.netProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

CyprusAR RF/Microwave InstrumentationVector Technologies, 40, Diogenous str. Halandri,15234 Greece;+30 210 685 80 08; Fax: +30 210 685 81 18;Geroge Koukas, [email protected];www.vectortechnologies.grProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EMC Partner ACTA Ltd., Ethnikis Antistaseos 14A, Chalandri, GR-15232 Athens, Greece;+30 210 600 33 02; Fax: +30 210 600 31 13;Antonis Georgiou, [email protected]; www.acta.com.grProducts and Services: Surge & Transients, Test Instrumentation

Czech RepublicAR RF/Microwave InstrumentationH TEST a.s, Šafránkova 3,15500 Praha 5 Czech Republic; +420 235365207; Fax: +420 2353689;David Koshuba; www.htest.czProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TEST Testovaci Technika s.r.o., Hakenova 1423,290 01 Podebrady, Czech Republic;+42 (0)325 610 123; Fax: +42 (0)325 610 134;

PRODUCTS AND SERVICES


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Products & Services | Europe


[email protected];www.teste.czProducts and Services: Surge & Transients, Test Instrumentation, Testing

EMC Partner TECTRA A.S., Domkovska 2343/43, CZ-193 00 Praha, Czech Republic;+420 281 921 650; Fax: +420 281 921 649;Herr Ing. Zbynek Sommer, [email protected];www.tectra.czProducts and Services: Surge & Transients, Test Instrumentation

H TEST a.s Šafránkova 3, 15500 Praha 5, Czech Republic;+420 235365207; Fax: +420 23536893;David Koshuba; www.htest.czProducts and Services: Surge & Transients, Test Instrumentation

IFI – Instruments for IndustryEmpos Spol s.r.o., U Novych Vil 18, 10000 Praha 10, +420 2 4174 2084; Fax +420 4174 2088;[email protected]; www.empos.czProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MilmegaEmpos Spol s.r.o., U Novych Vil 18, 10000 Praha 10, +420 2 4174 2084; Fax +420 4174 2088;[email protected]; www.empos.czProducts and Services: Designers and Manufactur-ers of High Power Microwave and RF Amplifiers

SCHURTER spol. s.r.oMalá Skála 190, 46822 Zelezný Brod;+42 0483 392 080;[email protected]; www.schurter.czProducts and Services: Filters, Shielding

TeseqEmpos Spol s.r.o., U Novych Vil 18, 10000 Praha 10, +420 2 4174 2084; Fax +420 4174 2088;[email protected]; www.empos.czProducts and Services: Amplifiers (RF & Microwave), Antennas, Automotive Systems, Conducted RF immu-nity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

DenmarkAR RF/Microwave InstrumentationErik Blichfeld A/S, P.B. 400, Birkemosevej 11, Kolding, Denmark DK-6000;+45 7552 2020; Fax: +45 7556 7007;[email protected]; www.blichfeld.dkProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclosures, Surge & Transients, Test Instrumentation

Bolls ApSVed Gadekæret 11F, DK-3660 Stenløse, Denmark;+45 48 18 35 66;www.bolls.dk; [email protected] & Services: Consultants, Full EMC test facilities and CE typetest

Erik Blichfeld A/S PO Box 400, Kolding, Kolding, DK-6000, Denmark;+45 75 52 20 20; Fax: +45 75 56 70 07;Henrik Andresen, [email protected]; www.blichfeld.dk Products & Services: Amplifiers, Antennas, Filters, Surge & Transients

EM TESTNortelco Electronics Denmark, Vaerkstedsgarden 14, 1, 2620 Albertslund, Denmark;+45 (0)48 17 75 00; Fax: +45 (0)48 17 75 10;[email protected]; www.nortelcoelectron-ics.dkProducts and Services: Surge & Transients, Test Instrumentation, Testing

EMC Partner ERDE- ELEKTRONIK AB, Spikgatan 8,SE-23532 Vellinge, Sweden;+46 40 42 46 10; Fax: +46 40 42 62 18;Ralf Danielsson; [email protected]; www.erde.seProducts and Services: Surge & Transients, Test Instrumentation

Gowanda ElectronicsACAL BFI Nordic AB, Portalgatan 2B, P.O. Box 1335, Uppsala, Sweden, SE-75143;+46 1856 5830; +46 1869 6666;[email protected]; www.bfioptilas.comProducts and Services: Inductors

IFI - Instruments for IndustryTeseq AG, Nordstrasse 11F,4542 Luterbach, Switzerland;+41 32 681 40 40; Fax +41 32 681 40 48;[email protected]; www.teseq.chProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

Langer EMV-Technik GmbHErik Blichfeld A/S, Box 400, Birkemosevej 11,DK-6000 KOLDING;+45 755 22020; Fax: +45 755 67007;Erik Blichfeld; [email protected]; www.blichfeld.dkProducts and Services: Test Instrumentation

MILMEGATeseq AG, Nordstrasse 11F,4542 Luterbach, Switzerland;+41 32 681 40 40; Fax +41 32 681 40 48;[email protected]; www.teseq.chProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

Tech-Etch, Inc.BOMBERG & CO. ApS, Vassingerodvej 145, 3540 Lynge, CVR Nr. 27306179 Denmark;+45 48 14 01 55; Fax: +45 48 14 01 56;[email protected]; www.techetch.comProducts and Services: Conductive Materials, Shielding

TeseqErik Blichfeld A/S, Birkemosevej 11, 6000 Kolding;+45 75 52 20 20, Fax +45 75 56 70 07;info@blichfeld,dk; www.blichfeld.dkProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

EstoniaAR RF/Microwave InstrumentationCaltest Oy, Kaarelantie 21,PO Box 39, Helskinki, Finland FIN-00421;+358 95 30 6070; Fax: +358 95 30 60 711;Mattie Salonen, [email protected]; www.caltest.fiProducts and Services: Amplifiers, Antennas,

Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EMC PartnerASTAT sp. zo.o, ul. Dabrowskiego 441,PL-60 451 Poznan, Poland;+48 61 849 80 61; Fax: +48 61 848 82 76;Lukasz Wilk; [email protected]; www.astat.com.plProducts and Services: Surge & Transients, Test Instrumentation

EM TESTAmitronic OY, Aniankatu 1, 15210 Lahti, Finland;+358 3 876 100; Fax: +358 3 751 0253;[email protected]; www.amitronic.fiProducts and Services: Surge & Transients, Test Instrumentation, Testing


MilmegaTeseq AG, Nordstrasse 11F,4542 Luterbach, Switzerland;+41 32 681 40 40; Fax +41 32 681 40 48;[email protected];www.teseq.chProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

TeseqTeseq AG, Nordstrasse 11F,4542 Luterbach, Switzerland;+41 32 681 40 40; Fax +41 32 681 40 48;[email protected]; www.teseq.chProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

FinlandAR RF/Microwave InstrumentationCaltest Oy, Kaarelantie 21,PO Box 39, Helskinki, Finland FIN-00421;+358 95 30 6070; Fax: +358 95 30 60 711;Mattie Salonen, [email protected]; www.caltest.fiProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TESTAmitronic OY, Aniankatu 1, 15210 Lahti, Finland;+358 3 876 100; Fax: +358 3 751 0253;[email protected]; www.amitronic.fiProducts and Services: Surge & Transients, Test Instrumentation, Testing

EMC PartnerINEL Ltd. Oy, Graniit titie 9, FI-00710 Helsinki, Finland; +358 10 42 37 570; Fax: +358 10 42 37 579;Raimo Sainio, [email protected]; www.inel.fiProducts and Services: Surge & Transients, Test Instrumentation




ETS-LindgrenMekaanikontie 1, 27510 Eura, Findland;+358 2 8383 300; Fax: +358 2 8651 233;[email protected] and Services: Antennas, Ferrites, Fil-ters, Shielded Rooms & Enclosures, RFI/EMI Signal Generators, Test Instrumentation, Miscellaneous


Fair-RiteCaltest Oy, Kaarelantie 21 FIN-00430 Helskini;+358 95 30 6070; Fax: +358 95 30 60 711;[email protected] and Services: Antennas, Ferrites

Langer EMV-Technik GmbHINEL Ltd. Oy, PO Box 14, FIN-00711 Helsinki;+358 10 423 757-0; Fax: +358 10 423 757-9; [email protected]; www.inel.fiProducts and Services: Test Instrumentation

MilmegaExova METECH Oy, Kuormakuja 1, F IN-03100, Nummela; +358 40 03 56 054; Fax +358 95 84 00 552;[email protected]; www.exovametech.fiProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

TeseqMetric Industrial Oy, Postbox 14, Piispantilankuja 4, 02241 Espoo;+358 9 4761 600; Fax +358 9 4761 6700;[email protected]; www.metricindustrial.comProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

GreeceA.H. Systems, Inc.Vector Technologies, Athens;+302106858008; Fax: +302106858118; info@vector technologies.gr; www.vector tech-nologies.grProducts and Services: Antennas, Test Instru-mentation, Testing

AR RF/Microwave InstrumentationVector Technologies, 40,Diogenous str. Halandri, 15234 Greece;+30 210 6858008; Fax: +30 210 6858118;Geroge Koukas, [email protected];www.vectortechnologies.grProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TESTMES Ltd., 228, Kifissias Ave.,145 61 Kifissia, Athens Hellas;+30 (0210) 80 16 077; Fax: +30 (0210) 80 16 034;[email protected] and Services: Surge & Transients, Test Instrumentation, Testing

EMC PartnerACTA Ltd., Ethnikis Antistaseos 14A, Chalandri, GR-15232 Athens, Greece;+30 210 600 33 02; Fax: +30 210 600 31 13;Antonis Georgiou, [email protected]; www.acta.com.grProducts and Services: Surge & Transients, Test Instrumentation

IFI – Instruments for IndustryDRYS TECHNIKI S.A., 13 Thessalonikis str.,18346 Moschato;+30 210 523 2842; Fax +30 210 52 32 555;[email protected]; www.drystech.grProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MilmegaDRYS TECHNIKI S.A., 13 Thessalonikis str.,18346 Moschato;+30 210 523 2842; Fax +30 210 52 32 555;[email protected]; www.drystech.grProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

TeseqDRYS TECHNIKI S.A.,13 Thessalonikis str., 18346 Moschato;+30 210 523 2842; Fax +30 210 52 32 555;[email protected]; www.drystech.grProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

Vector Technologies Ltd 40 Diogenous str, Halandri, Athens 15234, Greece; Panos Vouvounas, [email protected];www.vectortechnologies.gr Products & Services: Test Instrumentation, Amplifiers, Antennas

HungaryAR RF/Microwave InstrumentationH TEST a.s., Šafránkova 3,15500 Praha 5 Czech Republic;+420 23 53 65 207; Fax: +420 23 53 68 93;David Koshuba; [email protected]; www.htest.czProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EMC PartnerELTEST Kf t , Hat t yú u.16, HU-1015 Budapest , Hungary; +36 1 202 18 73; Fax: +36 1 225 00 31;Janos Redai, [email protected]; www.eltest.huProducts and Services: Surge & Transients, Test Instrumentation

EM TESTProMet Merestechnika Kft, Arany Janos u. 54, 2314 Halasztelek, Hungary;+36 (0)24 521 240; Fax: +36 (0)24 521 253;[email protected]; www.promet.huProducts and Services: Surge & Transients, Test Instrumentation, Testing

IFI – Instruments for IndustryTectra Electronics Kft., Mikszath Kalman u. 105,1184 Budapest,+36 1 291 2065; Fax +36 1 291 1643;

[email protected];www.tectra.huProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MilmegaTectra Electronics Kft., Mikszath Kalman u. 105,1184 Budapest,+36 1 291 2065; Fax +36 1 291 1643;[email protected];www.tectra.huProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

TeseqTectra Electronics Kft., Mikszath Kalman u. 105,1184 Budapest,+36 1 291 2065; Fax +36 1 291 1643;[email protected];www.tectra.huProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

IrelandAR RF/Microwave InstrumentationUnit 8 TORC MK, Chippenham Drive, Kingston, Milton Keynes, England Bucks MK10 OAE;+44(1) 908 282766; +44(1) 908 288249;Tom Cantle; [email protected];www.arukltd.co.ukProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

ElectroMagnetic Technologies Ltd.Inniscarra, Cork, Ireland;+353 21 487 1437; Fax: +353 21 487 2132;[email protected]; www.emtcork.bizProducts and Services: Testing

EM TESTFrequensys Ltd., 10 Abbey Court, Fraser Road, MK44 3WH Bedford, United Kingdom;+44 (0)1142 353 507; Fax: +44 (0)1234 831 998;[email protected]; www.frequensys.co.uk Products and Services: Surge & Transients, Test Instrumentation, Testing

EMC Partner (UK) Ltd.1A Golf Link Villas- The Common Downley- High Wycombe, GB-HP13 5YH Buckinghamshire, United Kingdom;+44(0) 1494 44 42 55; Fax: +44(0) 1494 44 42 77;David Castle; [email protected];www.emcpartner.co.ukProducts and Services: Surge & Transients, Test Instrumentation

IFI - Instruments for IndustryDM Systems and Test, Ltd., 60 Wilbury Way Hitchin Hertfordshire SG4 0/A;+44 (0) 1462 477277; Fax +44 (0) 1462 428995;Brian Epton; [email protected];Graham Howard, [email protected];Mick Keryell, [email protected] and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)




MilmegaTeseq Ltd., Ashville Way, Molly Millars Lane,Wokingham, Berkshire RG41 2PL;+44 (0) 8540 740 660; Fax: +44 (0) 845 074 0656; [email protected]; www.teseq.co.ukProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

TeseqTeseq Ltd., Ashville Way, Molly Millars Lane, Wokingham, Berkshire RG41 2PL;+44 (0) 8540 740 660; Fax: +44 (0) 845 074 0656; [email protected];www.teseq.co.ukProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

LatviaAR RF/Microwave InstrumentationCaltest Oy, Kaarelantie 21,PO Box 39, Helskinki, Finland FIN-00421;+358 95 30 6070; Fax: +358 95 30 60 711;Mattie Salonen, [email protected]; www.caltest.fiProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Test Instrumentation

EMC PartnerASTAT sp. zo.o, ul. Dabrowskiego 441,PL-60 451 Poznan, Poland;+48 61 849 80 61; Fax: +48 61 848 82 76;Lukasz Wilk, [email protected]; www.astat.com.plProducts and Services: Surge & Transients, Test Instrumentation

LithuaniaAR RF/Microwave InstrumentationCaltest Oy, Kaarelantie 21,PO Box 39, Helskinki, Finland FIN-00421;+358 95 30 6070; Fax: +358 95 30 60 711;Mattie Salonen, [email protected]; www.caltest.fiProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EMC PartnerASTAT sp. zo.o, ul. Dabrowskiego 441,PL-60 451 Poznan, Poland;+48 61 849 80 61; Fax: +48 61 848 82 76;Lukasz Wilk, [email protected]; www.astat.com.plProducts and Services: Surge & Transients, Test Instrumentation

LuxembourgA.H. Systems, Inc.EEMCCOIMEX, Lelystad, NL;+31 320 295 395; Fax: +31 320 413 133;[email protected]; www.eemc.nlProducts and Services: Antennas, Test Instrumenta-tion, Testing

AR RF/Microwave InstrumentationFrankrijklaan 7, ITC Boskoop, NL-2391 PX, Hazer-swoude-Dorp, the Netherlands;+31(0) 17 242 30 00; Fax: +31(0) 17 242 30 09;Onno de Meyer, [email protected];www.arbenelux.comProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclosures, Surge & Transients, Test Instrumentation

EM TEST GmbHLünener Strasse 211, 59174 Kamen, Germany;+49 (0)2307 26070-0; Fax: +49 (0)2307 17050;[email protected]; www.emtest.comProducts and Services: Surge & Transients, Test Instrumentation, Testing

Fair-RiteHF Technology, Atalanta 5, 1562 LC Krommenie Holland; +31(0) 75 628 37 17; Fax: +31(0) 75 621 11 20;[email protected] and Services: Antennas, Ferrites

IFI – Instruments for IndustryAccelonix BV, Croy 7,5653 LC Eindhoven, The Netherlands;+31 40 750 1650; Fax: +31 40 293 0722;[email protected]; www.accelonix.nlProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MILMEGAAccelonix BV, Croy 7,5653 LC Eindhoven, The Netherlands;+31 40 750 1650; Fax: +31 40 293 0722;[email protected]; www.accelonix.nlProducts and Services: Designers and Manufactur-ers of High Power Microwave and RF AmplifiersTeseqAccelonix BV, Croy 7,5653 LC Eindhoven, The Netherlands;+31 40 750 1650; Fax: +31 40 293 0722;[email protected]; www.accelonix.nlProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

MoldovaEM TESTEMCI, 105005, Radio Str., 24, Build. 1, Moscow, Russia; +7 (495) 410 64 65; Fax: +7 (495) 980 71 19;[email protected]; www.emci.ruProducts and Services: Surge & Transients, Test Instrumentation, Testing

NorwayAR RF/Microwave InstrumentationNortelco Electronics AS, Postboks 116 Manglerud, Oslo, Norway NO-0612;+47 2257 6100; Fax: +47 2257 6130;Arve Bekkevold, [email protected];www.nortelcoelectronics.noProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TESTNortelco Electronics AS, Johan Scharffenbergsvei 95, 0694 Oslo, Norway;+47 2 257 6100; Fax: +47 2 257 6130;

Arve Bekkevold, [email protected];www.nortelcoelectronics.noProducts and Services: Surge & Transients, Test Instrumentation, Testing

EMC PartnerERDE- ELEKTRONIK AB, Spikgatan 8,SE-23532 Vellinge, Sweden;+46 40 42 46 10; Fax: +46 40 42 62 18;Ralf Danielsson; [email protected];www.erde.seProducts and Services: Surge & Transients, Test InstrumentationIFI- Instruments for IndustryMetric Industrial AS, Trollasveien 8, 1414 Trollasen; +47 40 00 40 54; Fax +47 40 00 40 53;[email protected];www.metric.noProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MILMEGAMetric Industrial AS, Trollasveien 8, 1414 Trollasen; +47 40 00 40 54; Fax +47 40 00 40 53;[email protected];www.metric.noProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

Tech-Etch, Inc.EG Components Norway AS,Hovfaret 17 B, N0275 Oslo Norway;+47 2325 4600; Fax: +47 2325 4601;[email protected]; www.techetch.comProducts and Services: Conductive Materials, Shielding

TeseqMetric Industrial AS, Trollasveien 8, 1414 Trollasen; +47 40 00 40 54; Fax +47 40 00 40 53;[email protected]; www.metric.noProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

PortugalAR RF/Microwave InstrumentationWAVECONTROL, S.L., C/ Pallars 65-71,Barcelona, Spain E-08018;+34 933 208 055; Fax: +34 933 208 056;Jordi Accensi, [email protected]; www.wavecontrol.comProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TESTALAVA Ingenieros S.A., C/ Albasanz 16 - Edificio Antalia, 28037 Madrid, Spain;+34 (0)91 567 97 00; Fax: +34 (0)91 570 26 61;[email protected]; www.alava-ing.esProducts and Services: Surge & Transients, Test Instrumentation, Testing

EMC PartnerWAVECONTROL, Pallars, 65-71,ES-08018 Barcelona, Spain;+34 933 208 055; Fax: +34 933 208 056;Jordi Accensi, [email protected]; www.wavecontrol.comProducts and Services: Surge & Transients, Test Instrumentation




IFI – Instruments for IndustryVITELSIS - Soc. Com. De Electrotecnica, Lda., Rua Alvaro Ferreira Alves, 15 C, 2855-591 Corroios;+351 21 258 3619; Fax +351 21 258 8087;[email protected]; www.vitelsis.ptProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MilmegaVITELSIS - Soc. Com. De Electrotecnica, Lda., Rua Alvaro Ferreira Alves, 15 C, 2855-591 Corroios;+351 21 258 3619; Fax +351 21 258 8087;[email protected]; www.vitelsis.ptProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

TeseqVITELSIS - Soc. Com. De Electrotecnica, Lda., Rua Alvaro Ferreira Alves, 15 C, 2855-591 Corroios;+351 21 258 3619; Fax +351 21 258 8087;[email protected]; www.vitelsis.ptProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

RomaniaA.H. Systems, Inc.CELESTA COMEXIM SRL, Bucharest;+4021 410 30 64; Fax: +4021 410 31 17;[email protected]; www.celesta.ro/enProducts and Services: Antennas, Test Instru-mentation, Testing

AR RF/Microwave InstrumentationCOMTEST SRL , Olar i 7A , 024 056 Bucharest , Romania; +4021 211 08 83; Fax: +4021 211 08 84;Radu Mateescu, r adum@ comtes t . ro ; w w w.comtest.roProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation


IFI - Instruments for IndustryInterNET SRL, Calea Grivitei nr. 119, sector 1, 010707 Bucuresti;+40 21 310 7121; Fax +40 21 312 1663;[email protected]; www.inter-net.roProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MilmegaInterNET SRL, Calea Grivitei nr. 119,sector 1, 010707 Bucuresti;+40 21 310 7121; Fax +40 21 312 1663;[email protected]; www.inter-net.roProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

SCHURTER SC INTERELEKTRONIC S.R.L, Comuna Gruiu, sat Santu – Floresti, Str. Ungureni, Nr. 103, 077118 Judet Ilfov; +402 135 08 100;[email protected]; www.ticomel.chProducts and Services: Filters, Shielding

TeseqInterNET SRL, Calea Grivitei nr. 119, sector 1, 010707 Bucuresti;+40 21 310 7121; Fax +40 21 312 1663;[email protected]; www.inter-net.roProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Test software, Calibration & Service

RussiaA.H. Systems, Inc.SERNIA, Moscow;+7 495 225 40 14; Fax: +7 495 932 92 44;[email protected]; www.sernia.ruProducts and Services: Antennas, Test Instru-mentation, Testing

AR RF/Microwave InstrumentationRadiant-Elcom, 117246, Nautchny proezd,8 b.1, Moscow;+7495 725 0404; Fax:n+7495 921 3585;Sergey Pavlov, [email protected]; www.radiant.suProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TESTEMCI, 105005, Radio Str., 24, Build. 1, Moscow, Russia; +7 (495) 410 64 65; Fax: +7 (495) 980 71 19; [email protected]; www.emci.ruProducts and Services: Surge & Transients, Test Instrumentation, TestingEMC PartnerAMIDEON Systems Ltd. Innovation works, National Technology Park, IE- Limerick, Ireland;+353 61 503 007; Fax: +353 61 338 065;Barry Lunn, [email protected]; www.amideon.comProducts and Services: Surge & Transients, Test Instrumentation

IFI – Instruments for IndustryTeseq AG, Nordstrasse 11F,4542 Luterbach, Switzerland;+41 32 681 40 40; Fax +41 32 681 40 48;[email protected]; www.teseq.chProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

MILMEGAEMCI, Radio str 24, Building 1, 105005 Moscow;Tel +7 495 410 6465; Fax +7 495 791 7107;[email protected]; www.emci.ruProducts and Services: Amplifiers

TeseqZAO NFP Dipaul Ltd., 21/23a Professora Popova Street, 197376 St. Petersburg;+7 812 325 1478; Fax 7 812 325 1478;[email protected]; www.dipaul.ruProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD,

Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

SerbiaAR RF/Microwave InstrumentationFrankrijklaan 7, ITC Boskoop, NL-2391 PX, Hazer-swoude-Dorp, Nederland;+31(0)172 423 000; Fax: +31(0)172 423 009;Onno de Meyer, [email protected];www.arbenelux.comProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TEST GmbHLünener Strasse 211, 59174 Kamen, Germany;+49 (0)2307 26070-0; Fax: +49 (0)2307 17050;[email protected];www.emtest.comProducts and Services: Surge & Transients, Test Instrumentation, Testing

IFI – Instruments for IndustryTectra AG Predstavnistvo Beograd, Begejska 2a,11000 Beograd;+381 11 2894 424; Fax +381 11 3049 640;[email protected]; www.tectra.co.rsProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MilmegaTectra AG Predstavnistvo Beograd, Begejska 2a,11000 Beograd;+381 11 2894 424; Fax +381 11 3049 640;[email protected]; www.tectra.co.rsProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

TeseqTectra AG Predstavnistvo Beograd, Begejska 2a,11000 Beograd;+381 11 2894 424; Fax +381 11 3049 640;[email protected]; www.tectra.co.rsProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

SlovakiaAR RF/Microwave Instrumentation- H TEST Šafránkova 3, 15500 Praha 5 Czech Republic; +420 23 53 65 207; Fax: +420 23 53 68 93;David Koshuba; [email protected];www.htest.czProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TESTTestovaci Technika s.r.o., Hakenova 1423,290 01 Podebrady, Czech Republic;+42 (0)325 610 123; Fax: +42 (0)325 610 134;[email protected]; www.teste.czProducts and Services: Surge & Transients, Test Instrumentation, Testing




EMC PartnerTECTRA A.S., Domkovska 2343/43, CZ-193 00 Praha, Czech Republic;+420 281 921 650; Fax: +420 281 921 649;Herr Ing. Zbynek Sommer; [email protected];www.tectra.czProducts and Services: Surge & Transients, Test Instrumentation

IFI – Instruments for IndustryEmpos Spol s.r.o., U Novych Vil 18,10000 Praha 10, Czech Republic;+420 2 4174 2084; Fax +420 4174 2088;[email protected]; www.empos.czProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MILMEGAEmpos Spol s.r.o., U Novych Vil 18,10000 Praha 10, Czech Republic;+420 2 4174 2084; Fax +420 4174 2088;[email protected]; www.empos.czProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

SCHURTER (SK) s.r.oPiestanska 404, 95605 Radosina;+42 138 539 84 80; www.schurter.comProducts and Services: Filters, Shielding

TeseqEmpos Spol s.r.o., U Novych Vil 18,10000 Praha 10, Czech Republic;+420 2 4174 2084; Fax +420 4174 2088;[email protected]; www.empos.czProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

SloveniaAR RF/Microwave InstrumentationFrankrijklaan 7, ITC Boskoop, NL-2391 PX,Hazerswoude-Dorp, Nederland;+31(0)172 423 000; Fax: +31(0)172 423 009;Onno de Meyer, [email protected];www.arbenelux.comProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation


IFI – Instruments for IndustryTectra d.o.o., Stegne 21, 1000 Ljubljana;+386 1 511 46 12; Fax +386 1 511 46 13;[email protected] and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

MilmegaTectra d.o.o., Stegne 21, 1000 Ljubljana;+386 1 511 46 12; Fax +386 1 511 46 13;[email protected] and Services: Designers and Manufac-turers of High Power Microwave and RF AmplifiersTeseqTectra d.o.o., Stegne 21, 1000 Ljubljana;+386 1 511 46 12; Fax +386 1 511 46 13;[email protected] and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

SwedenA.H. Systems, Inc.AGETO MTT AB, Taby;+46 844 677 30; Fax: +46 844 677 45;http://agetomtt.com/contact; http://agetomtt.comProducts and Services: Antennas, Test Instru-mentation, Testing

AR RF/Microwave InstrumentationCe-Bit Electronik, P.O. Box 7055, Taby, Sweden 187 11; +46 8 735 7550; Fax: +46 8 735 6165;Ingemar Islander; [email protected];www.cebit.seProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

CE-BIT Elektronik AB Polygonvaaegen 29,P.O. BOX 7055, TAEBY, SE-187 66, Sweden;+46-8-735 75 50; Fax: +46-8-735 61 65;www.cebit.se; Ingemar Islander,[email protected] & Services: Amplifiers, Shielded Rooms & Enclosures, Surge & Transients, Ferrites

EM TESTCE-BIT Elektronik AB, Polygonvägen 29,187 66 Täby, Sweden;+46 (0)8 735 75 50; Fax: +46 (0)8 735 61 65;www.cebit.sePOXITRON AB; Box 324, 591 24 Motala, Sweden;+46 141-580 00; Fax: +46 141-584 95;[email protected]; www.proxitron.seProducts and Services: Surge & Transients, Test Instrumentation, Testing

EMC PartnerERDE- ELEKTRONIK AB, Spikgatan 8,SE-23532 Vellinge, Sweden;+46 40 42 46 10; Fax: +46 40 42 62 18;Ralf Danielsson; [email protected]; www.erde.seProducts and Services: Surge & Transients, Test Instrumentation

Gowanda ElectronicsACAL BFI Nordic AB; Portalgatan 2B,P.O. Box 1335, Uppsala, Sweden, SE-75143;+46 1856 5830; +46 1869 6666;[email protected]; www.bfioptilas.comProducts and Services: InductorsGritek Konsult Ab; Ostermalmsgatan 49,Stockholm, Sweden, 11426;+46 08242312; +46 08242306; Products and Services: Inductors

IFI - Instruments for IndustryAGETO MTT AB, Propellervägen 6B, 183 62 Täby;+46 8 446 77 30; Fax +46 8 446 77 45;[email protected]; www.agetomtt.seProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers (Tetrode Tubes, Solid State and TWT)

Fair-RiteCe-Bit Electronik, Box 7055, 18711 Taby;+46 8 735 7550; Fax: +46 8 735 6165;[email protected] EMC AB; Turebergstorg 1,6 S-10147 Sollentuna;+46 8 5792 1121; Fax: +46 8 929 690; [email protected] and Services: Antennas, Ferrites

Langer EMV-Technik GmbHIngenjörsfirman, Ekeby Gard,Ekebyborna 250, SE-59195 Motala;+46 8 930 280; +46 14 171 151; [email protected]; www.igpab.seProducts and Services: Test Instrumentation

MILMEGAAGETO MTT AB, Propellervägen 6B, 183 62 Täby;+46 8 446 77 30; Fax +46 8 446 77 45;[email protected]; www.agetomtt.seProducts and Services: Designers and Manufac-turers of High Power Microwave and RF Amplifiers

SCHURTER Nordic ABSandsborgsvägen 50, 122 33 Enskede;+46 8 447 35 60;[email protected]; www.schurter.seProducts and Services: Filters, Shielding

TeseqAGETO MTT AB, Propellervägen 6B, 183 62 Täby;+46 8 446 77 30; Fax +46 8 446 77 45;[email protected]; www.agetomtt.seProducts and Services: Amplifiers (RF & Micro-wave), Antennas, Automotive Systems, Conducted RF immunity, Conducted Surge & Transients, ESD, Harmonics & Flicker, GTEM cells, RF Immunity Systems, RF Emission Systems, RF Testsoftware, Calibration & Service

UkraineAR RF/Microwave InstrumentationRadiant-Elcom, 117246,Nautchny proezd, 8 b.1, Moscow;+7495 725 0404; Fax: +7495 921 3585;Sergey Pavlov, [email protected]; www.radiant.suProducts and Services: Amplifiers, Antennas, Cables & Connectors, Shielded Rooms & Enclo-sures, Surge & Transients, Test Instrumentation

EM TESTEMCI, 105005, Radio Str., 24, Build. 1, Moscow, Russia; +7 (495) 410 64 65; Fax: +7 (495) 980 71 19;[email protected]; www.emci.ruProducts and Services: Surge & Transients, Test Instrumentation




ADVERTISERINDEX

2013 EMC Europe Guide

Aaronia AG . . . . . . . . . . . . . . . . . . . . . . . . . . 24, 67, 93, Back Cover

Advanced Test Equipment Rentals . . . . . . . . . . . . . . . . . . . . 32, 68

A .H . Systems, Inc . . . . . . . . . . . . .37, 63, 85, 101, 115, 129, 139, 158

Albatross Projects GmbH . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42, 43

APEMC Asia Pacific EMC Symposium 2013 . . . . . . . . . . . . . . . . 19

AR RF/Microwave Instrumentation . . . . . . . . . . . . . . . . 29, 56, 80,

99, 109, 122, 137, 146, 152

ASTAT Sp . z o .o . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127

Carlisle Interconnect Technologies . . . . . . . . . . . . . . . . . . . . . . . 34

Dutch Microwave Absorber Solutions . . . . . . . . . . . . . . . . . . . . . 48

EDICON . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15

EM TEST AG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72, 133

EMC Europe 2013 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

EMC PARTNER AG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39

EMV 2013 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

ESD Association . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

European Microwave Week 2013 . . . . . . . . . . . . . . . . . . . . . . . . 79

Federal-Mogul Corporation . . . . . . . . . . . . . . . . . . . . . . . . . . 65, 89

Fair-Rite Products Corp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44, 71

Gowanda . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77

IEEE 2013 EMC Symposium Denver . . . . . . . . . . . . . . . . . . . . . . . 17

IFI, a TESEQ company . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51, 111

IMS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

ITEM Media . . . . . . . . . . . . . . . . . . . . . . .45, 78, 92, 103, 105, 114,

115, 129, 138, 145, 150, 151, 156, 160, Inside Back Cover

JiangSu WEMC Technology Co, Ltd . . . . . . . . . . . . . . . . . . . . . . . 73

Kemtron Limited . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

Langer EMV-Technik GmbH . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69

LP Instruments s .r .l . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94

Montrose Compliance Services . . . . . . . . . . . . . . . . . . . . . . . . . . 33

Nexio . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87

Microwave & RF Show Paris . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

Milmega, a TESEQ Company . . . . . . . . . . . . . . . . . . . . . . . . 83, 134

Rohde & Schwartz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53, 75

Schlegel Electronic Materials . . . . . . . . . . . . . . . . . . . . . . . . . . . 61

Swift Textile Metalizing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55

Tech-Etch, Inc . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

TESEQ . . . . . . . . . . . 59,104, 128, 149, 155, 159, Inside Front Cover

Wavecontrol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106

AD_INDEX_EEG13.indd 110 11/16/12 5:28 PM ADs_EEG13.indd 2 11/16/12 1:43 PM

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emc test design guide

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european standards