emc -- t e s t r e p o r t · electrical fast transients/burst test 1 kv, 2 kv 21 -22 surge test 1...

TÜV SÜD Korea Ltd. of 38 File No. CPSC01313214

12F “KLI 63“ #60, Yoido-Dong, Youngdeungpo-Gu, Seoul Korea

EMC -- T E S T R E P O R T

Test Report No. :

CPSC01313214 25th July 2014 ________________________________________________________________________________________

Date of issue

Type / Model Name : LNU5110R Product Description : High Definition Network Camera Applicant : LG Electronics Inc., Digital Media Standard Group Address

: 222, LG-ro, Jinwi-myeon, Pyeongtaek-si Gyeonggi-do, 451-713 Republic of Korea

Manufacturer : LG Electronics Inc. Address 1 : 222, LG-ro, Jinwi-myeon, Pyeongtaek-si

Gyeonggi-do, 451-713 Republic of Korea Address 2 : P T. LG Electronics Indonesia

Block G, MM2100 Industrial Town, Cikarang Barat, Bekasi Jawa Barat 17520, Indonesia

Address 3 : LG Electronics(Huizhou) Inc.Huitai Factory No.13 Hui Feng Dong Yi Road, Huitai Industrial PARK of Zhongkai Development Zone Huizhou City, Guangdong, 516006 China

Address 4 : LG Electronics Da Amazonia Ltda Av.Javari Sem Numero Lote 254/1-2 Distrito Industrial Manaus, Amazonia Brazil

Address 5 : Shanghai LG Electronics 600 Yun Qiao Road, Jin Qiao Export. Processing Zone, Pu Dong, New Area, Shanghai, China

Address 6 : LG Electronics RUS,LLC House No.9, Solntseva Street, Ruza, Ruza District, Moscow Region, 143100, Russian Federation

Address 7 : LG Electronics Mlawa Sp. z o.o. LG Electronics 7 Street 06-500 Mlawa Poland

Test Standards : EN 55022:2010 EN 50130-4:2011 EN 61000-3-2:2006+A1:2009+A2:2009 EN 61000-3-3:2008

Test Result : Complied

This test report consist of 38 pages. The test report only responds to the tested sample only. It’s not allowed to copy this report partly without the allowance of the test laboratory.



Contents

1. Documentation Page

Test Standards 3

Test Environment, Test set-up and Condition 4

Summary 5

Test result 6

2. Test data

Mains terminal disturbance voltage 150 kHz - 30 MHz 7 - 9

Disturbance radiation 30 MHz - 6 000 MHz 10 - 12

Harmonics & Flicker 230 V / 50 Hz 13 - 15

Electrostatic Discharge (ESD) 6 kV, 8 kV 16 - 17

Radiated Electromagnetic Fields 80 MHz - 2 700 MHz 18 - 20

Electrical fast transients/Burst test 1 kV, 2 kV 21 - 22

Surge test 1 kV, 2 kV 23 - 24

Conducted disturbance test 0.15 MHz - 100 MHz 25 - 26

Voltage dips and interruptions test 20% 30%, 60%, 100% 27 - 28

3. Appendix – Photographs and Detailed Test Data

Appendix A. Photographs of EUT 29

Appendix B. Photographs of test set-up 30 - 36

Appendix C. ESD point generated 37

4. Construction data form 38



Test Standards

• EN 55022:2010 (Class A) Limit and methods of measurement of radio disturbance characteristics of information

Technology equipment

• EN 61000-3-2:2006+A1:2009+A2:2009 Disturbances in supply systems caused by household appliances, portable tools and similar electrical apparatus - Part 2: Harmonics

• EN 61000-3-3:2008 Disturbances in supply systems caused by household appliances, portable tools and similar electrical apparatus - Part 3: Voltage fluctuation

• EN 50130-4:2011 Alarm systems — Part 4: Electromagnetic compatibility — Product family standard: Immunity requirements for components of fire, intruder, hold up, CCTV, access control and social alarm systems

Additions, deviations and exclusions from standards No additions, deviations or exclusions have been made from standards



Test Environment

Address of the test Laboratory.

EMC Lab. of LG Electronics Inc.

Address: 19-1, Cheongho-ri, Jinwi-myeon,

Pyeongtaek-si, Gyeonggi-do,

451-713, Korea

Environmental condition

During the measurement the environmental conditions were within the listed ranges:

Temperature: 15 °C - 35 °C Relative humidity: 30% - 60% Atmospheric pressure: 86 kPa - 106 kPa

Statement of measurement uncertainty

The data and results referenced in this document are true and accurate. The reader is cautioned that there may be errors within the calibration limits of the equipment and facilities. The measurement uncertainty was calculated for all measurements listed in this test report acc. to CISPR 16-4-2 /11.2003 „Uncertainties, statistics and limit modeling – Uncertainty in EMC measurements“ and is documented in the quality system acc. to DIN EN ISO/IEC 17025. Furthermore, component and process variability of devices similar to that tested may result in additional deviation. The manufacturer has the sole responsibility of continued compliance of the device.

Test set-up and Condition

For the test set-up and condition, please see photographs of test set-up, Appendix B, of each test items.



Summary

General Remarks

The results in this report apply only to sample tested. No additions, deviations or exclusions have been made from standard. All tests are performed with the contents of the accreditation.

Final Assessment

We confirm that the product tested without reasonable doubt will fulfil the requirements concerning electromagnetic compatibility according to the above mentioned standard harmonised with the EMC Directive 2004/108/EC.

Date of receipt of test sample : 23th July 2014 Testing commenced on : 23th July 2014 Testing concluded on : 25th July 2014

Checked by: Tested by:

Mickey Lee / Technical Manager J. G. OK / Test Engineer

Approved by:

TÜV SÜD Korea Ltd.



Test Results Order No.: CPSC01313214

Manufacture LG Electronics Inc. Type HIGH DEFINITION NETWORK CAMERA Approval Test (EMI/EMS)

Client LG Electronics Inc. Incoming date July 23, 2014 Retest / Pre-test

Model LNU5110R Outgoing date July 25, 2014 Mass Production test

M/L Models None Technical Documentation

Test are made according to the EN 55022, EN 55130-4, EN 61000-3-2/-3

Kind of Test Serial No.: N/A

Emission Max. Limit exceeding O.K Not O.K N/A

A1 Mains terminal disturbance voltage

A2 Disturbance radiation test ( 30 MHz – 6000 MHz )

A3 Harmonics & Flicker test @ 230 V / 50 Hz

Immunity

B1 Electrostatic Discharge (ESD)

B2 Radiated Electromagnetic Fields,

B3 Electrical fast transients / Burst test

B4 Surge test

B5 Conducted disturbance test

B6 Voltage dips and interruptions test

Remarks:



A1 Mains terminal and telecommunication port disturbance voltage test (0.15 MHz – 30 MHz) Product HIGH DEFINITION NETWORK CAMERA

Model / Type No. LNU5110R Client LG Electronics Inc.

Serial No. N/A Test Engineer J.G.OK

* Mains terminal port

LG Electronics Inc.EMI Test Site

6 August,2013 18:53<<Counducted Emission>>

Standard : ITE: CISPR 22 Class AModel Name : Serial No. : Operator : AC Power : Temp,Humidity:

Remark1 : Remark2 : Remark3 : Remark4 :

0.150 30.0000.500 1.000 5.000 10.0000

90

10

20

30

40

50

60

70

80

Frequency

Leve

l

[MHz]

[dB(uV)]

<CISPR A>Limit (QP)Limit (AV)

<New Data>Spectrum (N,PK)Spectrum (L1,PK)Suspected Item(N)Suspected Item(L1)Final Item-QP(N)Final Item-AV(N)Final Item-QP(L1)Final Item-AV(L1)

Final Result

--- N Phase ---No. Frequency Reading Reading c.f Result Result Limit Limit Margin Margin QP AV QP AV QP AV QP AV [MHz] [dB(uV)] [dB(uV)] [dB] [dB(uV)] [dB(uV)] [dB(uV)] [dB(uV)] [dB] [dB] 1 23.1296 32.4 28.9 10.6 43.0 39.5 73.0 60.0 30.0 20.5 2 26.6108 31.2 27.7 10.6 41.8 38.3 73.0 60.0 31.2 21.7 3 27.1604 30.6 27.1 10.7 41.3 37.8 73.0 60.0 31.7 22.2 4 28.6856 30.0 26.6 10.7 40.7 37.3 73.0 60.0 32.3 22.7 5 29.2364 30.6 27.1 10.7 41.3 37.8 73.0 60.0 31.7 22.2

--- L1 Phase ---No. Frequency Reading Reading c.f Result Result Limit Limit Margin Margin QP AV QP AV QP AV QP AV [MHz] [dB(uV)] [dB(uV)] [dB] [dB(uV)] [dB(uV)] [dB(uV)] [dB(uV)] [dB] [dB] 1 23.130 32.1 28.6 10.5 42.6 39.1 73.0 60.0 30.4 20.9 2 26.6108 30.9 27.4 10.5 41.4 37.9 73.0 60.0 31.6 22.1 3 26.610 30.9 27.4 10.5 41.4 37.9 73.0 60.0 31.6 22.1 4 27.1604 30.2 26.8 10.6 40.8 37.4 73.0 60.0 32.2 22.6 5 29.2364 30.3 26.8 10.6 40.9 37.4 73.0 60.0 32.1 22.6



* Telecommunication port

[ISN: 10 Mbps]



Standard : ITE: CISPR 22 Class AModel Name : Serial No. : Operator : AC Power : Temp,Humidity:


0.150 30.0000.500 1.000 5.000 10.0000

110

10

20

30

40

50

60

70

80

90

100

Frequency

Leve

l

[MHz]

[dB(uV)]

<Cat_3_TEL_Class A>Limit (QP)Limit (AV)

<New Data>Spectrum (N,PK)Suspected Item(N)Final Item-QP(N)Final Item-AV(N)

Final Result




[ISN: 100 Mbps] Note: Frequencies other than noted above are not significant. These tests are carried out with “ground” & not grounded (floating)” for this model. And all data mentioned on the test-report were most or more severe (critical) result-data of tests during the all tests.

Test instrumentation

Equipment Manufacturer Type Serial No.

Test receiver R&S ESPI3 101012

Artificial Mains network R&S ESV216 100459

ISN Teseq GmbH ISN T800 26081



Standard : ITE: CISPR 22 Class BModel Name : Serial No. : Operator : AC Power : Temp,Humidity:


0.150 30.0000.500 1.000 5.000 10.0000

110

10

20

30

40

50

60

70

80

90

100

Frequency

Leve

l

[MHz]

[dB(uV)]

<Cat_5_TEL_Class A>Limit (QP)Limit (AV)

<New Data>Spectrum (N,PK)Suspected Item(N)Final Item-QP(N)Final Item-AV(N)

Final Result




A2 Disturbance radiation test (30 MHz – 6 000 MHz) Product HIGH DEFINITION NETWORK CAMERA


Serial No. N/A Test Engineer J.G.OK

[ 30 MHz – 1 GHz ]

<Horizontal Mode>

<Vertical Mode>

42.50 V 26.1 40.0 13.998.40 V 34.4 47.0 12.6

296.90 H 35.7 47.0 11.3610.50 H 33.9 47.0 13.1

715 H 30.7 40.0 9.3

otherfrequency

Marg in[dB]

Resu lt[dBµV/m]Source Frequency

[MHz] Pola rization Limit[dBµV/m]

Note: 1) Antenna factor and Cable loss were included in the result. 2) Frequencies other than noted above are not significant. 3) An infrared remote control will be considered as a part of the main unit and be tested together.

4) The symbol”<<” means “lower than 20dB below the limit”.



[ 1 GHz – 6 GHz ]

<Horizontal Mode>

<Vertical Mode>

1.10 H 31.4 40.8 56.0 76.0 24.6 35.21.30 H 33.4 42.6 56.0 76.0 22.6 33.41.48 H 35.1 44.4 56.0 76.0 20.9 31.61.60 V 36 45.1 56.0 76.0 20.0 30.92.90 V 38.1 50.1 56.0 76.0 17.9 25.93.30 V 39.7 51.2 56.0 76.0 16.3 24.8

otherfrequency

PK Limit[dBµV/m]

PK Result[dBµV/m]

PK Margin[dB]

AV Margin[dB]

AV Result[dBµV/m]Source Frequency

[GHz]Pol. AV Limit

[dBµV/m]

Note: 1) Antenna factor and Cable loss were included in the result.

2) Frequencies other than noted above are not significant. 3) An infrared remote control will be considered as a part of the main unit and be tested together. 4) The symbol”<<” means “lower than 20dB below the limit”.



Test instrumentation Bi-Log Ant

Horn Antenna

Schwarzbeck

Schwarzbeck

VULB 9160

9120 D

3266

259

AMPLIFIER

Preamplifier

Preamplifier

Agilent

Hewlett Packard

Agilent

8447D

8447F

8449B

2944A11151

2805A02810

3008A02252

Test Receiver Rohde&Schwarz ESI40 837514/006



A3 Harmonic current emissions / Voltage fluctuations flicker Product HIGH DEFINITION NETWORK CAMERA


Serial No. N/A Test engineer J.G.OK

Harmonic current emissions

The requirement is kept.

Voltage fluctuations flicker

The requirement is kept.


Equipment Manufacturer Type Serial No.

Power Analyzer Voltech PM6000 100006700099

Impedance Network Voltech IEC Network 1B109/9076

AC Power Source PACIFIC 140-AMX 641



Graphic data (1/2):



Graphic data (2/2):



B1 Electrostatic Discharge (ESD) Product HIGH DEFINITION NETWORK CAMERA



T E S T C O N D I T I O N S A N D R E S U L T S

The measurement of the immunity against electrostatic discharge was performed in a shielded room.

- Test not applicable

Test location:

- Shielded room no. 1



- Anechoic chamber no.1


- Full compact chamber

Test specifications:

Discharge voltage Conducted: - 1 kV - 2 kV - 3 kV

- 4 kV - 6 kV - kV

Discharge voltage Air: - 2 kV - 4 kV - 6 kV

- 8 kV - 15 kV - kV

Discharge impedance: - 330 / 150 pF - 150 / 150 pF

Discharge factor: - 1 s

Number of discharges: - 10 at all locations (Air discharge)

- 25 at all locations (Contact discharge)

Kind of discharges: Direct discharge - Air discharge

- Contact discharge

Indirect discharge - Contact discharge

Polarity: - positive - negative



Location of discharge:

- see drawing in Appendix C.

- each location on the surface touchable by hand

- Horizontal Coupling Plane (HCP)

- Vertical Coupling Plane (VCP)

- _____________________________________________

- _____________________________________________

- _____________________________________________

Criteria of compliance: There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of the discharges is permissible, providing that there is no residual change in the EUT or any change in outputs,

which could be interpreted by associated equipment as a change.

The EUT shall meet the acceptance criteria for the functional test, after the conditioning.

Result: Complied Not complied

Note : The same electrostatic discharge levels as defined for EUT are also applied to the

infrared remote controller. During the test the infrared remote control didn’t generate a control signal unintentionally and maintained its functions.

Remarks: During the test, EUT was operated normally.

Test instrumentation Equipment Manufacturer Model Serial No.

ESD Simulator Noise ken ESS-200AX G667105



B2 Radiated Electromagnetic Fields, Keyed carrier Product HIGH DEFINITION NETWORK CAMERA




The measurement of the immunity against radiated fields was performed in a chamber.


Test location:

- Anechoic chamber



Frequency - range: - 27 MHz - 500 MHz - 26 MHz – 1 000 MHz

- 9 kHz - 27 MHz - 80 MHz – 2 700 MHz

- 900 MHz pulse mod.

Field strength: - 1 V/m - 3 V/m

- 10 V/m - V/m

Distance of antenna - EUT: - 1 m - 3 m - m

Modulation: - AM : 80%

- FM : kHz

- sine wave 1 000 Hz

- un-modulated

- Pulse Duty Cycle: 1/2

Frequency step: - 0.0015 decades/s

- 1% / 3 s - 1% / 1 s

Polarization of antenna: - Horizontal - Vertical - circular

Position of EUT: Front, Rear, Right, Left side




Electromagnetic Intensity (V/m) Position Polarity Result

Amplitude Modulation

1

Front side H

Complied

V

Right side H

V

Left side H

V

Rear side H

V

3

Front side H Complied

V

Right side H

V

Left side H

V

Rear side H

V

10

Front side H Complied

V Complied

Right side H Complied

V Complied

Left side H Complied

V Complied

Rear side H Complied

V Complied

Reference H : Horizontality V : Verticality

Remarks: Pulse Modulation: Duty cycle 1/2 Hz Normal operation (A)

During the test, EUT was operated normally.



Criteria of compliance: There shall be no damage, malfunction or change of status due to the conditioning.

Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators occurs at a field strength of 3 V/m. For components of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the picture is allowed at 10 V/m, providing. a) there is no permanent damage or change to the EUT (e.g. no corruption of memory or changes to programmable settings etc.); b) at 3 V/m, any deterioration of the picture is so minor that the system could still

be used; and c) there is no observable deterioration of the picture at 1 V/m.


Test instrumentation Equipment Manufacturer Model Serial No. Vector Signal Generator Rohde & Schwarz SMBV100A 257784 Laser Probe Interface AR FL7000 0331569 Laser Powered Field Probe AR FL7006 0331618 System Interface TDK SI-300 4166 System Interface TDK SI-300 170057 Power Meter Agilent E4419B MY45104546 Audio Analyzer Rohde & Schwarz UPA3 883 770/044 Switch Controller TDK RSM-02 44056 Power Amplifier AR 250W1000AM3 0330823 Log-Periodic Antenna TDK LPDA-0803 130558



B3 Electrical Fast Transients (BURST) Product HIGH DEFINITION NETWORK CAMERA




The measurement of the immunity against fast transients was performed in a shielded room.


Test location:








Pulse Amplitude- - 0.5 kV - 1.0 kV - Coupling Clamp

AC Power Port - 2.0 kV - 4.0 kV - C/D Network

Pulse Amplitude- - 0.5 kV - 1.0 kV

- Coupling Clamp

DC Power Port - 2.0 kV - 4.0 kV - C/D Network

Pulse Amplitude- Signal/Data - 0.5 kV - 1.0 kV - Coupling Clamp

LAN Port - 2.0 kV - ___ kV

Burst frequency: - 5 kHz - 100 kHz - ___

Coupling time: - 120 s - min




Test points of coupling:

name of lines: Power line

type of lines: - shielded - unshielded

status of lines: - passive - active

kind of transmission: - analogue - digital

length of lines: - 2 m

name of lines: LAN Port




Criteria of compliance: There shall be no damage, malfunction or change of status due to the

conditioning. Flickering of an indicator during the application of the bursts is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change.





Equipment Manufacturer Model Serial No.

Burst Simulator Noise ken FNS-105AX F981896

Coupling Clamp Noise ken 15-00001A N/A



B4 Surge Test

Product HIGH DEFINITION NETWORK CAMERA Model / Type No. LNU5110R Client LG Electronics Inc. Serial No. N/A Test engineer J.G.OK


The measurement of the immunity against fast transients was performed in a shielded room.


Test location:









AC Power Port - 2.0 kV - 4.0 kV - C/D Network


DC Power Port - 2.0 kV - 4.0 kV - C/D Network


Non Control Port - 2.0 kV - ___ kV


LAN Port - 2.0 kV - ___ kV

Pulse Amplitude- Process - 0.5 kV - 1.0 kV - Coupling Clamp

Audio/Video Signal Port - 2.0 kV - ___ kV

Source impedance: - 2 + 18㎌ - 12 + 9㎌

- 42 + 0.1㎌ - 42 + 0.5㎌



Number of surges: - 20 times for AC Power port

- 5 times for signal port


Repetition rate: - 60 s - 30 s

Angle: - 0° - 90°

- 180° - 270°


name of lines: Power line




length of lines: - 2 m


name of lines: LAN Port





conditioning. Flickering of an indicator during the application of the surges is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change.





Equipment Manufacturer Model Serial No.

Surge Simulator Noise ken LSS-15SE F970887



B5 Immunity to conducted disturbances Product HIGH DEFINITION NETWORK CAMERA Model / Type No. LNU5110R Client LG Electronics Inc. Serial No. N/A Test engineer J.G.OK




Test location:








Frequency - range: - 0.15 MHz - 100 MHz - MHz

Field strength: - 1 V - 3 V

- 10 V - V

Modulation: - AM : 80%

- FM : kHz

- sine wave 1 000 Hz

- un-modulated

- Pulse 1 Hz (0.5 s ON: 0.5 s OFF)

Frequency step: - 0.0015 decades/s

- 1% / 3 s - 1% / 1 s



Criteria of compliance: There shall be no damage, malfunction or change of status due to the conditioning.

Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators occurs at U0 = 130 dBμV.

For components of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the picture is allowed at U0 = 140 dBμV, providing a) there is no permanent damage or change to the EUT (e.g. no corruption of

memory or changes to programmable settings, etc.), b) at U0 = 130 dBμV, any deterioration of the picture is so minor that the system

could still be used, and c) there is no observable deterioration of the picture at U0 = 120 dBμV.



Tested Point Level [V] Result

Remark Amplitude Modulation Pulse Modulation

Power Line

(M3)

1

Complied

3

10

RJ45 Port

(LAN)

1

Complied

3

10


Signal Generator R&S SML03 101165

Power Meter Agilent E4419B MY45102309

Power Amplifier Amplifier Research 500A100M2 20268

Power Amplifier Amplifier Research 200W1000M3A 20268

DCN FCC F-2031-DCN 30

CDN FCC FCC-801-M3-16A 10056

CDN FCC FCC-801-T4-RJ45 05040



B6 Voltage Dips and Interruptions test Product HIGH DEFINITION NETWORK CAMERA Model / Type No. LNU5110R Client LG Electronics Inc. Serial No. N/A Test engineer J.G.OK




Test location:








Performance appraisal standard

and test level: - 30% - (0.5, 1, 5, 10) cycles - 60% - (0.5, 1, 5, 10) cycles

- 100% - (0.5, 1, 5) cycles - 20% - (0.5, 1, 5, 10) cycles

Number of pulses: - 1 at each level - 3 at each level

- at each level

Recovery time between pulses: - 5 s - 10 s

- s


conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change.





Test level Duration

Cycles Result Remark

20%

0.5 Complied

1 Complied

5 Complied

10 Complied

30%

0.5 Complied

1 Complied

5 Complied

10 Complied

60%

0.5 Complied

1 Complied

5 Complied

10 Complied

100%

0.5 N/A (See Note) The power of EUT is off during the test. After the test, EUT is getting back to the normal operation. 1 N/A (See Note)

5 N/A (See Note)

Note It fully recorded using ancillary power source equipment to content with Manufacturer’s setup manual.


Voltage dip & Simulator Noise Ken VDS-2002 VDS0810221



APPENDIX A. Photographs of EUT A1. Front side of main set

A2. Rear side of main set



APPENDIX B. Photographs of Test Set-up B1. Mains terminal disturbance voltage

B2. Disturbance radiation test (30 MHz – 1 000 MHz)

[10 Mbps]



[100 Mbps]

B3. Disturbance radiation test



B4. Harmonics & Flicker test

B5. Electrostatic Discharge (ESD)



B6. Radiated Electromagnetic Fields

B7. Electrical fast transients / Burst test



B8. Surge test



B9. Conducted disturbance test



B10. Voltage dips and interruptions test



Appendix C. ESD point generated Contact discharge

Air discharge

[Front of main set ]

[Rear of main set]



Constructional data form for EMC testing

Type : HIGH DEFINITION NETWORK CAMERA Model : LNU5110R Rated Voltage : DC 12 V Serial Number : N/A Protection class : CLASS I Rated input power : 10.6 W

Configuration of equipment:

Main Board and Ass`y Rev. Rev. Rev.

Short description of the EUT ( Purpose of system, area of use, function of the system) : HIGH DEFINITION NETWORK CAMERA

Source of Interference : DDR

Internal frequencies : Main Clock DDR : 564 MHz

Noise suppression components : EMI Filter

Measures for electromagnetic shielding : N/A

Pyeongtack, Korea Date: July 25, 2014

Place of issue seal and signature of applicant

emc -- t e s t r e p o r t · electrical fast transients/burst test 1 kv, 2 kv 21 -22 surge test 1...

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