emc test reportfaenl.msi.com/ftp/ce documents/notebook/ms-1736x... · page 5 of 124 audix...

of 124

Audix Technology (Wujiang) Co., Ltd. EMC Dept. Report No.: ACWE-E0911006

EMC TEST REPORT For

Micro-Star Int'L Co., Ltd. Notebook PC

Model No.: MS-1736 Marketing Name: CR720

Brand: msi

Prepared for

Micro-Star Int'L Co., Ltd. No.69, Li-De St., Chung-Ho City, Taipei Hsien, Taiwan

Prepared by

Audix Technology (Wujiang) Co., Ltd. EMC Dept. No.1289 Jiangxing East Road, the Eastern Part of Wujiang Economic Development Zone

Jiangsu China 215200

Tel.: +86-512-63403993 Fax : +86-512-63403339

Report Number : ACWE-E0911006 Date of Test : Nov.04~Nov.07, 2009 Date of Report : Nov.11, 2009

of 124


TABLE OF CONTENTS Description Page TEST REPORT VERIFICATION.......................................................................................................4 1 SUMMARY OF STANDARDS AND RESULTS.......................................................................5

1.1 Description of Standards and Results..................................................................................................5 1.2 Description of Performance Criteria....................................................................................................6

2 GENERAL INFORMATION ......................................................................................................7 2.1 Description of Device (EUT) ..............................................................................................................7 2.2 EUT’s Configuration under Test .........................................................................................................7 2.3 Operating Condition of EUT .............................................................................................................15 2.4 Tested Supporting System Details.....................................................................................................15 2.5 Description of Test Facility ...............................................................................................................18 2.6 Measurement Uncertainty .................................................................................................................18

3 CONDUCTED DISTURBANCE MEASUREMENT ..............................................................19 3.1 Test Equipment..................................................................................................................................19 3.2 Block Diagram of Test Setup for AC Mains Port .............................................................................19 3.3 Block Diagram of Test Setup for RJ45 Port......................................................................................20 3.4 Limits for Conducted Disturbance Voltage (EN 55022, Class B).....................................................20 3.5 Test Procedure ...................................................................................................................................21 3.6 Measurement Results.........................................................................................................................22

4 RADIATED DISTURBANCE MEASUREMENT ..................................................................45 4.1 Test Equipment..................................................................................................................................45 4.2 Block Diagram of Test Setup ............................................................................................................46 4.3 Limits for Radiated Disturbance (30MHz~1000MHz) (EN 55022, Class B) ...................................47 4.4 Limits for Radiated Disturbance (1GHz~6GHz) (EN55022, Class B) .............................................48 4.5 Test Procedure ...................................................................................................................................48 4.6 Measurement Results.........................................................................................................................49

5 POWER HARMONICS AND FLICKER MEASUREMENT................................................59 5.1 Test Equipment..................................................................................................................................59 5.2 Block Diagram of Test Setup ............................................................................................................59 5.3 Test Standard .....................................................................................................................................59 5.4 Test Procedure ...................................................................................................................................59 5.5 Test Results .......................................................................................................................................60

6 ELECTROSTATIC DISCHARGE IMMUNITY TEST.........................................................77 6.1 Test Equipment..................................................................................................................................77 6.2 Block Diagram of Test Setup ............................................................................................................77 6.3 Test Standard .....................................................................................................................................77 6.4 Severity Levels and Performance Criterion.......................................................................................77 6.5 Test Procedure ...................................................................................................................................78 6.6 Test Results .......................................................................................................................................78

7 RF FIELD STRENGTH IMMUNITY TEST...........................................................................84 7.1 Test Equipment..................................................................................................................................84 7.2 Block Diagram of Test Setup ............................................................................................................84 7.3 Test Standard .....................................................................................................................................85 7.4 Severity Levels and Performance Criterion.......................................................................................85 7.5 Test Procedure ...................................................................................................................................85 7.6 Test Results .......................................................................................................................................86

8 ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST ........................................89 8.1 Test Equipment..................................................................................................................................89 8.2 Block Diagram of Test Setup ............................................................................................................89 8.3 Test Standard .....................................................................................................................................89 8.4 Severity Levels and Performance Criterion.......................................................................................89 8.5 Test Procedure ...................................................................................................................................90 8.6 Test Results .......................................................................................................................................90

of 124


9 SURGE IMMUNITY TEST.......................................................................................................93 9.1 Test Equipment..................................................................................................................................93 9.2 Block Diagram of Test Setup ............................................................................................................93 9.3 Test Standard .....................................................................................................................................93 9.4 Severity Levels and Performance Criterion.......................................................................................93 9.5 Test Procedure ...................................................................................................................................94 9.6 Test Results .......................................................................................................................................94

10 CONDUCTED DISTURBANCE IMMUNITY TEST.............................................................99 10.1 Test Equipment..................................................................................................................................99 10.2 Block Diagram of Test Setup ............................................................................................................99 10.3 Test Standard .....................................................................................................................................99 10.4 Severity Levels and Performance Criterion.....................................................................................100 10.5 Test Procedure .................................................................................................................................100 10.6 Test Results .....................................................................................................................................101

11 POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST .......................................104 11.1 Test Equipment................................................................................................................................104 11.2 Block Diagram of Test Setup ..........................................................................................................104 11.3 Test Standard ...................................................................................................................................104 11.4 Severity Levels and Performance Criterion.....................................................................................104 11.5 Test Procedure .................................................................................................................................105 11.6 Test Results .....................................................................................................................................105

12 VOLTAGE DIPS AND INTERRUPTIONS IMMUNITY TEST.........................................108 12.1 Test Equipment................................................................................................................................108 12.2 Block Diagram of Test Setup ..........................................................................................................108 12.3 Test Standard ...................................................................................................................................108 12.4 Severity Levels and Performance Criterion.....................................................................................108 12.5 Test Procedure .................................................................................................................................109 12.6 Test Results .....................................................................................................................................109

13 PHOTOGRAPHS......................................................................................................................112 13.1 Photos of Conducted Disturbance Measurement.............................................................................112 13.2 Photos of Radiated Disturbance Measurement................................................................................114 13.3 Photos of Harmonic & Flicker Measurement..................................................................................117 13.4 Photos of Electrostatic Discharge Immunity Test ...........................................................................117 13.5 Photos of RF Field Strength Immunity Test....................................................................................118 13.6 Photos of Electrical Fast Transient/Burst Immunity Test................................................................119 13.7 Photos of Surge Immunity Test .......................................................................................................120 13.8 Photos of Conducted Disturbance Immunity Test...........................................................................121 13.9 Photos of Power Frequency Magnetic Field Immunity Test ...........................................................122 13.10 Photos of Voltage Dips and Interruptions Immunity Test...............................................................123 13.11 Photos of host PC for RJ45 ping test...............................................................................................123 13.12 Photos of WALAN& Bluetooth function test .................................................................................124

APPENDIX I Pre-scan data of radiated disturbance measurement APPENDIX II Photos of EUT

of 124


1 SUMMARY OF STANDARDS AND RESULTS

1.1 Description of Standards and Results The EUT have been tested according to the applicable standards as referenced below.

EMISSION

Description of Test Item Standard Limits Results Conducted disturbance

at main terminal EN 55022/2006+A1/2007 Class B PASS

Conducted common mode disturbance at

telecommunication port EN 55022/2006+A1/2007 Class B PASS

Radiated disturbance EN 55022/2006+A1/2007 Class B PASS

Harmonic current emissions

EN 61000-3-2/2006

Class D PASS

Voltage fluctuations & flicker

EN 61000-3-3/1995 + A1/2001+A2/2005

Pst=1 dc(%)=3.3%

dMax.(%)=4% d(t)>3.3%=500ms

PASS

IMMUNITY (EN55024/ 1998 + A1/2001 + A2/2003)

Description of Test Item Basic Standard Performance Criteria Results

Electrostatic discharge (ESD) IEC 61000-4-2/2008 B PASS

Radio-frequency, Continuous radiated

disturbance IEC 61000-4-3/2008 A PASS

Electrical fast transient (EFT)

IEC 61000-4-4/2004+Corr.1/2006 +Corr.2/2007 B PASS

Surge IEC 61000-4-5/2005 B PASS Radio-frequency,

Continuous conducted disturbance

IEC 61000-4-6/2008 A PASS

Power frequency magnetic field IEC 61000-4-8/2001 A PASS

Voltage dips, >95% reduction B PASS

Voltage dips, 30% reduction C PASS

Voltage interruptions

IEC 61000-4-11/2004

C PASS

of 124


1.2 Description of Performance Criteria

General Performance Criteria Examples of functions defined by the manufacturer to be evaluated during testing include, but are not limited to, the following:

essential operational modes and states; tests of all peripheral access (hard disks, floppy disks, printers, keyboard, mouse, etc.); quality of software execution; quality of data display and transmission; quality of speech transmission.

1.2.1 Performance criterion A

The equipment shall continue to operate as intended without operator intervention. No degradation of performance or loss of function is allowed below a performance level specified by the manufacture when the equipment is used as intended. The performance level may be replaced by a permissible loss of performance. If the minimum performance level or the permissible performance loss is not specified by the manufacturer, then either of these may be deriver from the product description and documentation, and by what the user may reasonably expect from the equipment if used as intended.

1.2.2 Performance criterion B

After the test, the equipment shall continue to operate as intended without operator intervention. No degradation of performance or loss of function is allowed, after the application of the phenomena below a performance level specified by the manufacture, when the equipment is used as intended. The performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is allowed. However, no change of operation state or stored data is allowed to persist after the test. If the minimum performance level (or the permissible performance loss) is not specified by the manufacturer, then either of these may be deriver from the product description and documentation, and by what the user may reasonably expect from the equipment if used as intended.

1.2.3 Performance criterion C

Loss of function is allowed, provided the function is self-recoverable, or can be restored by the operation of the controls by the user in accordance with the manufacture’s instructions. Functions, and/or information stored in non-volatile memory, or protected by a battery backup, shall not be loss.

of 124


2 GENERAL INFORMATION

2.1 Description of Device (EUT) Product ： Notebook PC

Model Number ： MS-1736

Marketing Name ： CR720

Brand ： msi

Applicant ： Micro-Star Int'L Co., Ltd.

No.69, Li-De St., Chung-Ho City, Taipei Hsien, Taiwan

Manufacturer ： MSI ELECTRONICS (KUNSHAN) CO., LTD. No.88 East Qianjin Road, Kunshan City

Date of Receipt of Sample ： Nov.02, 2009

Date of Test ： Nov.04~Nov.07, 2009

2.2 EUT’s Configuration under Test

2.2.1 List of Interface Ports of EUT : USB port*4 RJ-45 port D-Sub port HDMI port Earphone port Microphone port Audio In port E-SATA port. SD/MS/MMC Card Slot DC In

of 124


2.2.2 List of key parts of EUT

Brand Model Number Specification/certificate No.

CPU

Q3GG 2.13GHz

Q3LR 2.26GHz

Q3GB 2.4GHz INTEL

Q3G9 2.53GHz

Main Board

MSI MS-1736

LCD Panel

AUO B173RW01 V0 1600*900

CHIMEI N173O6-L02 1600*900

DRAM

Samsung M471B5673EH1-CF8 2GB DDR3 SODIMM

HMT112S6BFR6C-G7N0 1GB DDR3 SODIMM Hynix

HMT125S6BFR8C-G7N0 2GB DDR3 SODIMM

ODD

HLDS GT30N Super Multi

Sony AD-7560S Super Multi

of 124



HDD

WD1600BEVT-xxCT0 160GB / BSMI No.: D33015

WD2500BEVT-xxZCT0 250GB / BSMI No.: D33015

WD3200BEVT-xxZCT0 320GB / BSMI No.: D33015

WD5000BEVT-xxZAT0 500GB / BSMI No.: D33015

WD1600BEVT-22A23T0 160GB/ BSMI No.: D33015



WD5000BEVT-22A0RT0 500GB/ BSMI No.: D33015

Western Digital

WD6400BEVT-22A0RT0 640GB/ BSMI No.: D33015

MK1655GSX 160GB / BSMI No.: D33003

MK2555GSX AZK 250GB / BSMI No.: D33003

MK3265GSX 320GB / BSMI No.: D33003 TOSHIBA

MK5055GSX 500GB / BSMI No.: D33003

ST9160314AS 160GB / BSMI No.: D33027

ST9250315AS 250GB / BSMI No.: D33027

ST9320325AS 320GB / BSMI No.: D33027 Seagate

ST9500325AS 500GB / BSMI No.: D33027

MJA2160BH 160GB / BSMI No.: D33073

MJA2250BH 250GB/ BSMI No.: D33073

MJA2320BH 320GB/ BSMI No.: D33073 Fujitsu

MJA2500BH 500GB/ BSMI No.: D33073

Battery Pack BTY-L74 (P/N: 91NMS17LD4SU1) 6cell, 11.1Vdc, 4400mAh

Celxpert BTY-L75 (P/N: 91NMS17LF6SU1) 9cell, 11.1Vdc, 6600mAh

Wireless LAN

Atheros AR5B95 (AW-NE785H) NCC No.:CCAE08LP1590T0 WLAN 802.11b/g/n, 2.412GHz~2.462GHz

of 124



Bluetooth Module

msi MS-3870 (Wireless 802.11b/g/n 1T1R+BT2.1 EDR combo slim module)

CSR BSMAN1(MS-3801) 2.402GHz~2.48GHz NCC No.:CCAE09LP0840T0

Touch Pad

SYNAPTICS TM-00300-000 (S78-3700360-SD2) 79.7mm*47.7mm

SENTELIC TPA2D21C99 (S78-3700360-SK9) 79.7mm*47.7mm

Keyboard

Sunrex V111922AK1

WEBCAM

Bison BN29M6SSB-010 1.3M Pixels

AZUREWAVE AM-1C027 1.3M Pixels

AC Adapter

DELTA ADP-65HB BB

I/P:100-240V, 1.5A, O/P: 19Vdc, 3.42A BSMI No.: R33030 DC Cord: Unshielded, Undetachable, 1.8m, 1

ferrite core

LITEON PA-1650-68

I/P:100-240V, 50-60Hz, 2.0A, O/P: 19Vdc, 3.42A BSMI No.: R33275 DC Cord: Unshielded, Undetachable, 1.8m, 1

ferrite core

AC Power

lsheng CIONN-3P Unshielded, Detachable, 1.8m

of 124


2.2.3 Worse Configuration Estimation (SKU#1~SKU#4)

The EUT was estimated to assemble nine configurations (SKU#1~SKU#4) in accordance with key parts listed in section 2.2.2, which were demonstrated to get EMI worst configurations. Finally, SKU#1 were confirmed to be the worst configurations, to which the full EMC compliance test was done, and the test results were recorded in this report.

SKU#1 Brand/Model No./ Specification

CPU INTEL/Q3G9/2.53GHz

LCD Panel AUO/B173RW01 V0 RAM Hynix/HMT125S6BFR8C-G7N0/2GB Battery Pack Celxpert/BYT-L75/6600mAh/9cell

Wireless LAN Atheros/AR5B95(AW-NE785H)/ NCC No.:CCAE08LP1590T0 ,WLAN 802.11b/g/n, 2.4G

HDD WD/WD6400BEVT-22A0RT0/640GB ODD HLDS/GT30N Keyboard Sunrex/V111922AK1

Bluetooth Module CSR/MS-3801(BSMAN1) NCC No.:CCAE09LP0840T0

Touch Pad SYNAPTICS/TM-00300-000/79.7mm*47.7mm main board MSI/MS-1736 WEBCAM Bison/BN29M6SSB-010/1.3M Pixels

AC Adapter

Brand: DELTA I/P:100-240V, 1.5A, O/P: 19Vdc, 3.42A BSMI No.: R33030 DC Cord: Unshielded, Undetachable, 1.8m, 1 ferrite core AC Cord: Unshielded, Detachable, 1.8m

of 124



CPU INTEL/Q3GB/2.4GHz

LCD Panel AUO/B173RW01 V0 RAM Samsung/M471B5673EH1-CF8/2GB Battery Pack Celxpert/BYT-L75/6600mAh/9cell


HDD TOSHIBA/MK5055GSX/500GB ODD Sony/AD-7560S Keyboard Sunrex/V111922AK1

Bluetooth Module CSR/MS-3801(BSMAN1) NCC No.:CCAE09LP0840T0

Touch Pad SYNAPTICS/TM-00300-000/79.7mm*47.7mm main board MSI/MS-1736 WEBCAM Bison/BN29M6SSB-010/1.3M Pixels

AC Adapter

Brand: DELTA I/P:100-240V, 1.5A, O/P: 19Vdc, 3.42A BSMI No.: R33030 DC Cord: Unshielded, Undetachable, 1.8m, 1 ferrite core AC Cord: Unshielded, Detachable, 1.8m

of 124



CPU INTEL/Q3LR/2.26GHz

LCD Panel CHIMEI/N173O6-L02 RAM Hynix/HMT112S6BFR6C-G7N0/1GB Battery Pack Celxpert/BYT-L74/4400mAh/6cell


HDD Seagate/ST9500325AS/500GB ODD HLDS/GT30N Keyboard Sunrex/V111922AK1

Bluetooth Module msi/MS-3870

Touch Pad SENTELIC/TPA2D21C99/79.7mm*47.7mm main board MSI/MS-1736 WEBCAM AZUREWAVE/AM-1C027/1.3M Pixels

AC Adapter

Brand: LITEON I/P:100-240V, 50-60Hz, 2.0A, O/P: 19Vdc, 3.42A BSMI No.: R33275 DC Cord: Unshielded, Undetachable, 1.8m, 1 ferrite core AC Cord: Unshielded, Detachable, 1.8m

of 124


SKU#4 Brand/Model No./ Specification CPU INTEL/Q3GG/2.13GHz LCD Panel CHIMEI/N173O6-L02 RAM Samsung/M471B5673EH1-CF8/2GB Battery Pack Celxpert/BYT-L74/4400mAh/6cell


HDD Fujitsu/MJA2500BH/500GB ODD Sony/AD-7560S Keyboard Sunrex/V111922AK1 Bluetooth Module msi/MS-3870 Touch Pad SENTELIC/TPA2D21C99/79.7mm*47.7mm main board MSI/MS-1736 WEBCAM AZUREWAVE/AM-1C027/1.3M Pixels

AC Adapter

Brand: LITEON I/P:100-240V, 50-60Hz, 2.0A, O/P: 19Vdc, 3.42A BSMI No.: R33275 DC Cord: Unshielded, Undetachable, 1.8m, 1 ferrite core AC Cord: Unshielded, Detachable, 1.8m

of 124


2.3 Operating Condition of EUT

EUT Exercise Program and Condition Operating System Windows 7 Test Program EMC test.exe ; Media Player.exe ; Winthrax

Graphic controllerDisplay scrolling “H” pattern with test resolution 1600*900@60Hz

IDE controller Read/Write operation to USB HDD

Audio controller Play 1kHz audio signal LAN controller Data transfer to host PC

Wireless LAN Send Signal by WLAN software

Bluetooth Send data by Bluetooth software Webcam Operating normally

2.4 Tested Supporting System Details

2.4.1 LCD Monitor #1

Manufacturer ： DELL Model Number ： SP2309Wc Serial Number ： CN-0U781F-64180-95V-002S BSMI ID ： R33037 FCC ID ： FCC By DoC D-Sub Cable ： Shielded, Detachable, 1.8m, bonded 2 ferrite

cores Power Cord ： Unshielded, Detachable, 3.0m

2.4.2 LCD Monitor #2

Manufacturer ： DELL Model Number ： S2409Wb Serial Number ： CN-0W570D-74261-97G-2MAO FCC ID ： FCC By DoC BSMI ID ： R3A002 HDMI Cable ： Shielded, Detachable, 1.8m Power Cord ： Unshielded, Detachable, 2.0m

2.4.3 Earphone & Microphone

Manufacturer ： SOMIC Model Number ： SM-301 Data Cable ： Unshielded, Undetachable, 2.2 m,

2.4.4 Microphone

Manufacturer ： N/A Model Number ： N/A Data Cable ： Unshielded, Undetachable, 2.5m

of 124


2.4.5 Mouse

Manufacturer ： DELL Model Number ： MOC5UO Serial Number ： 10S08R2F FCC ID ： FCC By DoC BSMI ID ： R41108 Data Cable ： Shielded, Undetachable, 1.5m

2.4.6 HDD#1

Manufacturer ： Seagate Model Number ： FreeAgent Pro Serial Number ： 9QM33930 FCC ID ： FCC By DoC Data Cable ： Shielded, Detachable, 1.0m

2.4.7 HDD#2

Manufacturer ： Samsung Model Number ： HM042HI Serial Number ： S07WJ10L607269 FCC ID ： FCC By DoC Data Cable ： Shielded, Detachable, 1.0m

2.4.8 1394 HDD

Manufacturer ： Seagate Model Number ： Dual Firewire 400 Serial Number ： 6QG0XYY1 FCC ID ： FCC By DoC Data Cable ： Shielded, Detachable, 1.0m Power Cable ： Unshielded, Detachable, 2.0m

2.4.9 Printer

Manufacturer ： HP Model Number ： DESKJET3918 Serial Number ： CN64R1N251 BSMI ID ： R33001 USB Cable ： Shielded, Detachable, 1.5m AC Adapter ： HP/090-4397

I/P:100-240V, 50-60Hz, 500mA, O/P: +32Vdc, 500mA max +15Vdc, 530mA max BSMI No.: R33160 AC Cord: Unshielded,Detachable, 1.8m DC Cord: Unshielded, Undetachable, 1.8m, 1 ferrite core

2.4.10 Mini SD Card Adapter (2GB)

Manufacturer ： A-DATA

of 124


Supporting Systems for RJ 45 Ping Test

2.4.11 Host PC

Manufacturer ： Lenovo Model Number ： 2746 BSMI ID ： R33B65 AC Adapter ： M/N: 92P1211

Brand: Lenovo Input: AC 100-240V, 50-60Hz, 2.0A-1.2A Output: DC 20V,3.25A AC Cord: Unshielded, Detachable, 1.0m DC Cord: Unshielded, Undetachable, 1.8m,

1 ferrite core.

2.4.12 RJ 45 Cable *2: Unshielded, Detachable, 25m&2m

2.4.13 AC Power Cord: Unshielded, Detachable, 1.8m

Supporting Systems for WALAN &Bluetooth function Test

2.4.14 Wireless Router

Manufacturer ： TP-LINKModel Number ： TL-WR641G+ Serial Number ： 08307404922 Adapter ： LEI M/N: A41090080-A2

I/P: AC 220V, 50Hz, 150mA , O/P: AC 9V, 50Hz, 0.8A DC Cord: Unshielded, Undetachable, 1.8m

of 124


2.5 Description of Test Facility Name of Firm ： Audix Technology (Wujiang) Co., Ltd. EMC Dept.

Site Location ： No. 1289 Jiangxing East Road, the Eastern Part

of Wujiang Economic Development Zone Jiangsu China 215200

Test Facilities ： No.1 10m semi-anechoic chamber

FCC filing on Aug.21, 2009 Registration No.: 252588 No. 1 conducted shielding enclosure

The Complex Immunity Test Room

RS&CS Test Room

NVLAP Lab Code ： 200786-0 (NVLAP is a NATA accredited body under Mutual Recognition Agreement) Valid until on Sep.30, 2010

DAR-Registration No. ： DAT-P-264/07-00 Valid until on Dec.15, 2012

2.6 Measurement Uncertainty

Test Item Uncertainty Conducted disturbance Measurement ± 2.75dB

± 3.06dB (Horizontal) Radiated disturbance Measurement (Distance: 10m) ± 3.22dB (Vertical)

Remark：Uncertainty = kuc(y)

of 124


3 CONDUCTED DISTURBANCE MEASUREMENT

3.1 Test Equipment

The following test equipment was used during the conducted emission measurement： 3.1.1 For AC Mains Port

Item Type Manufacturer Model No. Serial No. Last Cal. Next Cal. 1. Test Receiver R & S ESCI 100352 2009-01-07 2010-01-06 2. A.M.N R & S ESH2-Z5 100153 2009-03-25 2010-03-24 3. L.I.S.N. Kyoritsu KNW-407 8-1793-4 2009-08-11 2010-08-10 4. Pulse Limiter R&S ESH3-Z2 100605 2009-08-11 2010-08-10 5. 50Ω Coaxial Switch Anritsu MP59B 6200547934 2009-08-11 2010-08-10 6. 50ohm Terminator N/A N/A N/A 2009-03-25 2010-03-24

7. RF Cable Harbour Industries RG400 003 2009-08-14 2010-08-13

3.1.2 For Telecommunication Port Item Type Manufacturer Model No. Serial No. Last Cal. Next Cal.

1. Test Receiver R & S ESCI 100352 2009-01-07 2010-01-06 2. A.M.N R & S ESH2-Z5 100153 2009-03-25 2010-03-24 3. L.I.S.N. Kyoritsu KNW-407 8-1793-4 2009-08-11 2010-08-10

4. I.S.N. FCC FCC-TLISN-T4-02 20497 2009-08-11 2010-08-10

5. 50 ohm Terminator N/A N/A N/A 2009-03-25 2010-03-24 6. 50Ω Coaxial Switch ANRITSU MP59B 6200547934 2009-08-11 2010-08-10 7. Pulse Limiter R&S ESH3-Z2 100605 2009-08-11 2010-08-10

8. RF Cable Harbour Industries RG400 003 2009-08-11 2010-08-10

3.2 Block Diagram of Test Setup for AC Mains Port

AC POWER SOURCE

: POWER LINE: SIGNAL LINE

A.M.N.

LISN50 ohm Terminator

PERSONAL COMPUTER

TEST RECEIVER

PRINTER

PULSE LIMITER

COAXIAL SWITCH

Notebook PC (EUT)

LCD Monitor #1

Earphone & Microphone

Host PC Printer

: FERRITE CORE

LCD Monitor #2

RJ45 USB D-Sub HDMI

HDD*2

: AC Adapter

AC POWER SOURCE

Mouse

1394 HDD

Wireless Router

Test supporting system for WLAN and Bluetooth function test

Microphone

of 124


3.3 Block Diagram of Test Setup for RJ45 Port

3.4 Limits for Conducted Disturbance Voltage (EN 55022, Class B)

3.4.1 Limits for conducted disturbance at the mains ports (Class B) Maximum RF Line Voltage Frequency

Quasi-Peak Level Average Level 150kHz ~ 500kHz 66 ~ 56 dBμV 56 ~ 46 dBμV 500kHz ~ 5MHz 56 dBμV 46 dBμV 5MHz ~ 30MHz 60 dBμV 50 dBμV

Remark 1. If the average limit is met when using a Quasi-Peak detector, the EUT shall be deemed to meet both limits and measurement with the average detector is unnecessary.

2. The lower limit applies at the band edges. 3.4.2 Limits for conducted common mode disturbance at the telecommunication ports (Class B)

Remark 1. If the average limit is met when using a Quasi-Peak detector, the EUT shall be deemed to meet both limits and measurement with the average detector is unnecessary.

2. The lower limit applies at the band edges.

Voltage Limits Current Limits Frequency Quasi-Peak Level Average Level Quasi-Peak Level Average Level0.15MHz ~ 0.5MHz 84 ~ 74 dBμV 74 ~ 64 dBμV 40 ~ 30 dBμA 30 ~ 20 dBμA

0.5MHz ~ 30MHz 74 dBμV 64 dBμV 30 dBμA 20 dBμA

AC POWER SOURCE


A.M.N.

L.I.S.N.50 ohm Terminator

PERSONAL COMPUTER

TEST RECEIVER

PRINTER

PULSE LIMITER

COAXIAL SWITCH

Host PC

: FERRITE CORE

ISN Notebook PC (EUT)

LCD Monitor #1


Printer

HDD*2

LCD Monitor #2

RJ45 USB

USB D-Sub HDMI

AC POWER SOURCE

: AC Adapter

Microphone

1394 HDD

Wireless Router


Mouse

of 124


3.5 Test Procedure The measuring process is according to EN 55022, Class B and laboratory internal procedure TKC-301-015.

3.5.1 For AC Mains Port In the conducted emission measurement, the EUT and all peripheral devices were set up on a non-metallic table which was 0.8 meters height above the ground plane, and 0.4 meters far away from the vertical plane. The EUT was powered by AC mains through Artificial Mains Network (A.M.N), other peripheral devices were powered by AC mains through the second Line Impedance Stabilization Network (L.I.S.N). For the measurement, the A.M.N measuring port was terminated by a 50Ω measuring equipment and the second L.I.S.N measuring port was terminated by a 50Ω resistive load. All measurements were done on the phase and neutral line of the EUT’s power cord. All cables or wires placement were verified to find out the maximum emission.

3.5.2 For Telecommunication Port The setup is the same as conduction besides this, connecting between AE and telecommunication port through ISN. Each phase of telecommunication wire is measured to evaluate the maximum conducted emission in accordance with clause 9 of EN 55022.

The bandwidth of measuring receiver was set at 9 kHz.

The required frequency band (0.15 MHz ~ 30 MHz) was pre-scanned with peak detector, the final measurement was measured with quasi-peak detector and average detector. (If the average limit is met when using a quasi-peak detector, the average detector is unnecessary).

The emission level is calculated automatically by the test system which uses the following equation:

Emission level (dBμV) = Meter-Reading (dBμV) + A.M.N / I.S.N. factor (dB) + Cable loss (dB). (Cable loss include pulse limiter loss)

of 124


3.6 Measurement Results

PASSED. (All the emissions not reported below are too low against the prescribed limits.)

3.6.1 AC Mains Port Measurement Results EUT with the following the worst modes were performed during this section and all the test results are listed in next pages. Test Date:Nov.04, 2009 Temperature: 23.5 Humidity: 45％

Reference Test Data No. Test Configuration

Test Mode Neutral Line

LCD+D-Sub 1600*900@60Hz 58kHz # 1 # 2 Mode 1

LCD+HDMI 1600*900@60Hz 58kHz # 3 # 4


LCD+HDMI 1600*900@60Hz 58kHz # 27 # 28


LCD+HDMI 1600*900@60Hz 58kHz # ※ 63 # 64


LCD+HDMI 1600*900@60Hz 58kHz # 87 # 88 NOTE 1 – ‘※’means the worst test mode. NOTE 2 – The worst emission is detected at 0.17 MHz with emission level of 58.64 dB (μV)

and with QP detector (limit is 65.16 dB (μV)), when the Neutral of the EUT is connected to L.I.S.N.

of 124


of 124


3.6.2 Telecommunication Ports Measurement Results The telecommunication ports contained RJ45 port; all the measurement results are listed in next pages. Test Date: Nov.05, 2009 Temperature: 23.5 Humidity: 45％

Test Configuration

Test Mode Reference Test Data No.

RJ45 10Mbps Full #102

RJ45 10Mbps Half #103

RJ45 100Mbps Full # 104

RJ45 100Mbps Half # 105

Mode 3

‘※RJ45 1000Mbps Full # 106

NOTE 1 – ‘※’means the worst test mode. NOTE 2 – The worst emission is detected at 1.9 MHz with emission level of 55.73 dB (μV) and

with Average detector (limit is 64 dB (μV)), when the RJ45 port of the EUT is connected to I.S.N.

of 124


of 124


4 RADIATED DISTURBANCE MEASUREMENT

4.1 Test Equipment The following test equipment was used during the radiated emission measurement：

(At 10m Semi-Anechoic Chamber) Item Type Manufacturer Model No. Serial No. Last Cal. Next Cal.

1. Spectrum Analyzer Agilent E7405A MY45107028 2009-03-25 2010-03-242. Spectrum Analyzer Agilent E7405A MY45107030 2009-03-25 2010-03-243. Pre-Amplifier Agilent 8447D 2944A10918 2009-08-11 2010-08-104. Pre-Amplifier Agilent 8447D 2944A10922 2009-08-11 2010-08-10

5. Bi-log Antenna

(Horizontal) Schaffner CBL6112D 22251 2009-05-05 2010-05-04

6. Bi-log Antenna

(Vertical) Schaffner CBL6112D 22253 2009-05-05 2010-05-04

7. Test Receiver R&S ESCI 100351 2009-01-07 2010-01-068. 50Ω Coaxial Switch # 1 ANRITSU MP59B 6200547935 2009-08-11 2010-08-109. 50Ω Coaxial Switch # 2 ANRITSU MP59B 6200547937 2009-08-11 2010-08-1010. 50Ω Coaxial Switch # 3 ANRITSU MP59B 6200547938 2009-08-11 2010-08-1011. Microwave amplifier Agilent 8449B 3008A02229 2009-03-25 2010-03-2412 RF Cable Yuhang CSYH 001 2009-08-14 2010-08-1313. RF Cable Yuhang CSYH 002 2009-08-14 2010-08-1314. RF Cable Yuhang CSYH 003 2009-08-14 2010-08-1315. RF Cable Yuhang CSYH 004 2009-08-14 2010-08-1316. RF Cable Yuhang CSYH 005 2009-08-14 2010-08-1317. RF Cable Yuhang CSYH 006 2009-08-14 2010-08-1318. RF Cable Yuhang CSYH 007 2009-08-14 2010-08-1319. RF Cable Yuhang CSYH 008 2009-08-14 2010-08-1320. RF Cable Yuhang CSYH 009 2009-08-14 2010-08-1321. RF Cable Yuhang CSYH 010 2009-08-14 2010-08-13

22. RF Cable Huber+Suhner SUCOFLEX 102 28571 2009-04-01 2010-03-31


of 124


(No. 1 3m Semi-Anechoic Chamber)

Item Type Manufacturer Model No. Serial No. Last Cal. Next Cal. 1 Preamplifier Agilent 8447D 2944A10921 2009-03-25 2010-03-24

2 Spectrum Analyzer Agilent E7405A MY45107604 2009-03-25 2010-03-24

3 Bi-log Antenna (30MHz~1GHz) Schaffner CBL6112D 22250 2009-05-05 2010-05-04

4. Horn Antenna (1GHz~6GHz)

ESCO 3115 00062593 2009-05-05 2010-05-04

5. Test Receiver R&S ESCI 100361 2009-03-25 2010-03-24

6. 50Ω Coaxial Switch Anritsu MP59B 6200547935 2009-08-11 2010-08-10

7. RF Cable Yuhang CSYH 001 2009-08-14 2010-08-138. RF Cable Yuhang CSYH 002 2009-08-14 2010-08-139. RF Cable Yuhang CSYH 003 2009-08-14 2010-08-13

10. RF Cable Yuhang CSYH 004 2009-08-14 2010-08-13



4.2 Block Diagram of Test Setup

4.2.1 Block Diagram of connection between EUT and simulators

AC POWER SOURCE


Notebook PC (EUT)

LCD Monitor #1


Host PC Printer

AC adapter

: FERRITE CORE

HDD*2

LCD Monitor #2 HDMI D-Sub USB RJ45

USB

: AC Adapter

Microphone

1394 HDD

Wireless Router


Mouse

of 124


4.2.2 No. 1 10m Semi-Anechoic Chamber Setup Diagram (Test distance: 10m)

4.2.3 3m Semi-Anechoic Chamber Setup Diagram (Test distance: 3m)

4.3 Limits for Radiated Disturbance (30MHz~1000MHz) (EN 55022, Class B) FREQUENCY DISTANCE FIELD STRENGTHS LIMITS

(MHz) (Meters) (dBμV/m) 30 ~ 230 10 30

230 ~ 1000 10 37 Note： (1) The tighter limit shall apply at the edge between two frequency bands.

(2) Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the E.U.T.

0.8m

10 METERS

ANTENNA ELEVATION VARIES FROM 1 TO 4 METERS

ANTENNA TOWER

GROUND PLANE

TURN TABLE

EUT

0.8m

3 METERS

ANTENNA ELEVATION VARIES FROM 1 TO 4 METERS

ANTENNA TOWER

GROUND PLANE

TURN TABLE

EUT

ABSORBER

of 124


4.4 Limits for Radiated Disturbance (1GHz~6GHz) (EN55022, Class B) FREQUENCY DISTANCE AVERAGE LIMITE PEAK LIMITE

(GHz) (Meters) (dBμV/m) (dBμV/m) 1~ 3 3 50 70 3~ 6 3 54 74

Note： (1) The lower limit applies at the transition frequency.

4.5 Test Procedure The measuring process is according to EN 55022(CISPR Pub. 22) and laboratory internal procedure TKC-301-024. In the radiated disturbance measurement, the EUT and all simulators were set up on a non-metallic turn table which was 0.8 meters above the ground plane. Measurement distance between EUT and receiving antennas was set at 10 meters at 30MHz~1000MHz and 3 meters at 1000MHz~6000MHz. The specified distance is the distance between the antennas and the closest periphery of EUT. During the radiated measurement, the EUT was rotated 360° and receiving antennas were moved from 1 ~ 4 meters for finding maximum emission. Two receiving antennas were used for both horizontal and vertical polarization detection for 30MHz~1GHz, One receiving antennas was used for both horizontal and vertical polarization detection for 1GHz~6GHz (the absorbing material was added when testing of 1GHz~6GHz was done). All cables or wires placement were verified to find out the maximum emission. The bandwidth of measuring receiver (or spectrum analyzer) was set to:

RBW (120 kHz), VBW (1MHz) for QP detector below 1GHz RBW (1 MHz), VBW (1MHz) for Peak detector above 1GHz RBW (1 MHz), VBW (10 Hz) for Average detector above 1GHz

which is defined against CISPR16-1-1 6.4.3 section.

The required frequency band (30 MHz ~ 6000 MHz) was pre-scanned with peak detector; all final measurements were measured with quasi-peak detector below 1GHz, measured with average detector and peak detector above 1GHz. The emission level is calculated automatically by the test system which uses the following equation: 1. For 30-1000MHz measurement:

Emission Level (dBμV/m) = Meter-Reading (dBμV)+Antenna Factor (dB/m)+Cable Loss (dB) 2. For 1000-6000MHz measurement:

Emission Level (dBμV/m) = Meter-Reading (dBμV)+Antenna Factor (dB/m)+Cable Loss(dB) -Pre-amplifier factor (dBμV)

of 124


4.6 Measurement Results PASSED. (All the emissions not reported below are too low against the prescribed limits.)

EUT with four configurations (Mode 1 ~ Mode 4) was pre-measured and the pre-scanned data was attached in appendix I, Therein, the worst case Mode 1 was re-measured. All the measurement results are listed in next pages.

4.6.1 For 30MHz~1GHz Test Date: Nov.06, 2009 Temperature: 24.9 Humidity: 43％




※LCD+HDMI 1600*900@60Hz 58kHz # 3 # 4

NOTE 1 - ‘※’ means the worst test mode. NOTE 2 - 0° was the table front facing the antenna. Degree is calculated from 0° clockwise

facing the antenna. NOTE 3 - The worst emission at horizontal polarization was detected at 959.26MHz with

emission level of 31.57 dBμV/m (limit is 37.00dBμV/m), when the antenna was 1.8m height and the turntable was at 260°. The worst emission at vertical polarization was detected at 963.14 MHz with emission level of 32.04 dBμV/m (limit is 37.00 dBμV/m), when the antenna was 1.4m height and the turntable was at 120°.

of 124


of 124


4.6.2 For 1GHz~6GHz Test Date:Nov.04, 2009 Temperature: 19.8 Humidity: 47％



LCD+HDMI 1600*900@60Hz 58kHz # 17 # 18 Mode 1

LCD+D-Sub1600*900@60Hz 58kHz # 19 # 20

of 124


of 124


5 POWER HARMONICS AND FLICKER MEASUREMENT

5.1 Test Equipment Item Type Manufacturer Model No. Serial No. Last Cal. Next Cal.

1. Compliance Test System #1

California Instrument 5001iX 57305 2009-08-11 2010-08-10

2. Compliance Test System #2

California Instrument PASC-1 72485 2009-08-11 2010-08-10


5.3 Test Standard EN 61000-3-2/2006 and EN 61000-3-3/1995 +A1/2001+A2/2005

5.4 Test Procedure The measuring process is according to EN 61000-3-2/2006 and EN 61000-3-3/1995 +A1/2001+A2/2005 and laboratory internal procedure TKC-301-026.

Compliance Test System #2

Compliance Test System #1

: POWER LINE : SIGNAL LINE

: FERRITE CORE

Notebook PC (EUT)

LCD Monitor #1


Host PC Printer

HDD*2

LCD Monitor #2

USB

USB RJ45 D-Sub HDMI

: AC Adapter

Microphone

1394 HDD

Wireless Router


of 124


5.5 Test Results

5.5.1 The limits for Class D equipment are valid for all applications having an active input power is >75W, due to the EUT measured active input power is <75W, therefore, no limits apply for this equipment according to EN 61000-3-2.

5.5.2 PASSED. (Complied with Class D limit). EUT with the following test modes and configurations was measured and all the test results are listed in next pages. Test Date: Nov.06, 2009 Temperature: 25.2 Humidity: 59％

AC adapter Brand Model Number Test Configuration & Test Mode

#1 DELTA HDP-65HB BB Mode1

(1) LCD+D-Sub 1600*900@60Hz 58kHz (2) LCD+HDMI 1600*900@60Hz 58kHz

#2 LITEON PA-1650-68 Mode 1


of 124


5.5.3 Mode1 & Adapter #1

of 124


of 124


5.5.4 Mode1 & Adapter #2

of 124


of 124


6 ELECTROSTATIC DISCHARGE IMMUNITY TEST


1. ESD Simulator NoiseKen ESS-2000 ESS07X7519 2008-12-23 2009-12-22


6.3 Test Standard EN 55024/1998+A1/2001+A2/2003 【IEC 61000-4-2/2008, Test Level : Contact Discharge: ±4kV, Air Discharge: ±8kV】

6.4 Severity Levels and Performance Criterion

6.4.1 Severity level

Level Test Voltage Contact Discharge (kV)

Test Voltage Air Discharge (kV)

1. 2 2 2. 4 4 3. 6 8 4. 8 15 X Special Special

6.4.2 Performance criterion：B

: AIR /CONTACT DISCHARGE

ESD Simulator

AC SOURCE

: POWER LINE : SIGNAL LINE : FERRITE CORE

Notebook PC (EUT)

LCD Monitor #1


Host PC Printer

HDD*2

LCD Monitor #2

USB

USB RJ45 D-Sub HDMI

: AC Adapter

Microphone

1394 HDD

Wireless Router


Mouse

of 124


6.5 Test Procedure The measuring process is according to EN 55024/1998+A1/2001+A2/2003(IEC 61000-4-2/2008) and laboratory internal procedure TKC-301-020.

6.5.1 Air Discharge： This test is done on a non-conductive surface. The round discharge tip of the discharge electrode shall be approached as fast as possible to touch the EUT. After each discharge, the ESD generator discharge electrode shall be removed from the EUT. The generator is then ret rigged for a new single discharge and repeated 10 discharges each at positive and negative polarity for each reselected test point. This procedure shall be repeated until all the air discharge completed.

6.5.2 Contact Discharge： All the procedure shall be same as 6.5.1. Except that the tip of the discharge electrode shall touch the EUT conductive surfaces & repeated 25 discharges each at positive and negative polarity for each test point before the discharge switch is operated.

6.5.3 Indirect discharge for horizontal coupling plane： At least 25 discharges each at positive and negative polarity shall be applied to the horizontal coupling plane, at points on each side of the EUT. The ESD generator positions vertically at a distance of 0.1m from the EUT and with the discharge electrode touching the coupling plane.

6.5.4 Indirect discharge for vertical coupling plane： At least 25 discharges each at positive and negative polarity shall be applied to the center of one vertical edge of the coupling plane. The coupling plane, of dimensions 0.5m X 0.5m, is placed parallel to, and positioned at a distance of 0.1m from the EUT. Discharges shall be applied to the coupling plane, with this plane in sufficient different positions that the four faces of the EUT are completely illuminated.

6.5.5 For above tests, the voltage was increased from the minimum to the selected test level.

6.6 Test Results PASSED. (Complied with Criterion A) EUT with the following test modes and configurations was tested and all the test results are listed in next pages.


#1 DELTA HDP-65HB BB Mode 1




of 124


Electrostatic Discharge Immunity Test Results Applicant Micro-Star Int'L Co., Ltd. Date of Test 2009.11.06

EUT Notebook PC I/P Volt. AC: 230 V ; 50 Hz

Model No. MS-1736 Temp. 22.9 Humidity 54％ Atmosphere Pressure 101kPa

Test Mode (1) LCD+D-Sub 1600*900@60Hz 58kHz (2) LCD+HDMI 1600*900@60Hz 58kHz

Test Configuration & AC Adapter Mode 1 & Adapter #1

Working Condition Refer to section 2.3 Results PASS

Item Amount of Discharges Discharge Voltage Performance

Criterion ﹢2kV,﹢4kV

Contact Discharge 150 - 2kV, - 4kV

A

﹢2kV,﹢4kV,﹢8kV Air Discharge 1040

- 2kV, - 4kV, - 8kV A

Indirect Discharge ﹢2kV,﹢4kV (HCP)

50 - 2kV, - 4kV

A

Indirect Discharge ﹢2kV,﹢4kV (VCP Front)

50 - 2kV, - 4kV

A

Indirect Discharge ﹢2kV,﹢4kV (VCP Left)

50 - 2kV, - 4kV

A

Indirect Discharge ﹢2kV,﹢4kV (VCP Back)

50 - 2kV, - 4kV

A

Indirect Discharge ﹢2kV,﹢4kV (VCP Right)

50 - 2kV, - 4kV

A

1. Screw×3 Contact discharge 2. Vent×9 Air discharge

3. Touch pad Air Discharge 4. Keyboard×10 Air Discharge

5. Gap×4 Air discharge 6. lockhole Air Discharge

7. USB×4 Air discharge 8. Morphine×3 Air discharge

9. earphone Air discharge 10. SD Air discharge

11. Panel×8 Air discharge 12. express Air discharge

13. Carmera Air discharge 14. LED Air discharge

16 Button×2 Air discharge 16 Power port Air discharge

17 E-SATA Air discharge 18 RJ45 Air discharge

Test Points

19 D-Sub Air discharge 20 HDMI Air discharge

Engineer :Hilary

of 124


Electrostatic Discharge Immunity Test Results Applicant Micro-Star Int'L Co., Ltd. Date of Test 2009.11.06


Model No. MS-1736 Temp. 22.9 Humidity 54％ Atmosphere Pressure 101kPa




Item Amount of Discharges Discharge Voltage Performance

Criterion ﹢2kV,﹢4kV

Contact Discharge 150 - 2kV, - 4kV

A

﹢2kV,﹢4kV,﹢8kV Air Discharge 1040

- 2kV, - 4kV, - 8kV A

Indirect Discharge ﹢2kV,﹢4kV (HCP)

50 - 2kV, - 4kV

A

Indirect Discharge ﹢2kV,﹢4kV (VCP Front)

50 - 2kV, - 4kV

A

Indirect Discharge ﹢2kV,﹢4kV (VCP Left)

50 - 2kV, - 4kV

A

Indirect Discharge ﹢2kV,﹢4kV (VCP Back)

50 - 2kV, - 4kV

A

Indirect Discharge ﹢2kV,﹢4kV (VCP Right)

50 - 2kV, - 4kV

A

1. Screw×3 Contact discharge 2. Vent×9 Air discharge

3. Touch pad Air Discharge 4. Keyboard×10 Air Discharge

5. Gap×4 Air discharge 6. lockhole Air Discharge

7. USB×4 Air discharge 8. Morphine×3 Air discharge

9. earphone Air discharge 10. SD Air discharge

11. Panel×8 Air discharge 12. express Air discharge

13. Carmera Air discharge 14. LED Air discharge

16 Button×2 Air discharge 16 Power port Air discharge

17 E-SATA Air discharge 18 RJ45 Air discharge

Test Points

19 D-Sub Air discharge 20 HDMI Air discharge

Engineer :Hilary

of 124


Photos of Discharge Points:

19 20 18 17 16

7 7

7

2

6 15 5

of 124


7

8 8

8

9

13

11

11

11 11 11

11

11

11

12 10

14

15

5

5

of 124


4

4

4 4 4 4

4

4 4 4

1 1 1

2 2 2

2

2

2

2

2

3

5

of 124


7 RF FIELD STRENGTH IMMUNITY TEST

7.1 Test Equipment

Item Type Manufacturer Model No. Serial No. Last Cal. Next Cal.

1. Signal Generator Agilent 8648C 3847M01438 2009-03-25 2010-03-242. Power Amplifier AR KAW 2180 10088-2 NCR NCR 3. Power Sensor Agilent 8481D MY41093045 2009-01-07 2010-01-06

4. Dual Channel EPM Series Power Meter

Agilent E4419B MY45100928 2009-01-07 2010-01-06

5. Log-Periodic Antenna AR AT1080 0323131 NCR NCR

6. Direction Coupler AR DC6180A 322333 2009-08-11 2010-08-10NCR: Non-Calibration Remark


7.2.1 Block Diagram of connection between EUT and simulators.

AC SOURCE

: POWER LINE : SIGNAL LINE : FERRITE CORE

Notebook PC (EUT)

LCD Monitor #1


Host PC Printer

HDD*2

LCD Monitor #2

USB

USB RJ45 D-Sub HDMI

: AC Adapter

Microphone

HDMI

1394 HDD

Wireless Router


Mouse

of 124


7.2.2 R/S Test Setup

7.3 Test Standard EN 55024/1998+A1/2001+A2/2003 【IEC 61000-4-3/2008, Test Level：2; Field strength: 3V/m】



Level Field Strength V/m

1. 1

2. 3

3. 10

X Special

7.4.2 Performance criterion：A

7.5 Test Procedure The measuring process is according to EN 55024/1998+A1/2001+A2/2003(IEC 61000-4-3/2008) and laboratory internal procedure TKC-301-021. The field sensor is placed on the EUT table (0.8 meter above the ground) which is 3 meters away from the transmitting antenna. Through the signal generator, power amplifier and transmitting antenna to produce a uniformity field strength (3V/m measured by field sensor) around the EUT table from frequency range 80MHz to 1GHzand records the signal generator‘s output level at the same time for whole measured frequency range. Then, put EUT and its simulators on the EUT turn table and keep them 3 meter away from the transmitting antenna which is mounted on an antenna tower and fixes at 1 meter height above the ground. Using the recorded signal generator’s output level to measure the EUT from frequency range 80MHz to 1GHz and both horizontal & vertical polarization of antenna must be set and measured. Each of the four sides of EUT must be faced this transmitting antenna and measures individually.

A CCD camera was put inside the chamber and through its display to monitor the EUT operational situation to judge the EUT performance criterion during measurement.

EUT

0.8 Meter

1 Meter

Anechoic Chamber

Control Room Direction Coupler

Signal Generator Personal Computer

3 Meters

Power Amp.

Power Sensor Power Monitor

of 124


All the scanning conditions are as follows： Condition of Test Remarks -------------------------------------- ----------------------------------

1. Fielded Strength 3V/m (Unmodulated, Severity Level 2) 2. Amplitude Modulated 1kHz, 80%AM 3. Scanning Frequency 80MHz~1GHz 4. Step Size 1% increments 5. The Rate of Sweep 0.0015 decade/s 6. Dwell Time 3 sec.







of 124


RF Field Strength Immunity Test Results

Applicant Micro-Star Int'L Co., Ltd. Date of Test 2009.11.06

EUT Notebook PC I/P Volt. AC: 230 V ; 50Hz

Model No. MS-1736 Temp. 19.9 Humidity 56％

Test Mode (1) LCD+D-Sub 1600*900@60Hz 58kHz (2) LCD+HDMI 1600*900@60Hz58kHz



Frequency Range (MHz)

E.U.T. Position ( Angle )

Ant. Polarity(Hor. or Ver.)

Field Strength (V/m)

Performance Criterion Remark

80~1000 0 H 3 A

80~1000 90 H 3 A

80~1000 180 H 3 A

80~1000 270 H 3 A

80~1000 0 V 3 A

80~1000 90 V 3 A

80~1000 180 V 3 A

80~1000 270 V 3 A

Engineer :Joecy Ma

of 124


RF Field Strength Immunity Test Results




Test Mode (1) LCD+D-Sub 1600*900@60Hz 58kHz (2) LCD+HDMI 1600*900@60Hz58kHz



Frequency Range (MHz)

E.U.T. Position ( Angle )

Ant. Polarity(Hor. or Ver.)

Field Strength (V/m)

Performance Criterion Remark

80~1000 0 H 3 A

80~1000 90 H 3 A

80~1000 180 H 3 A

80~1000 270 H 3 A

80~1000 0 V 3 A

80~1000 90 V 3 A

80~1000 180 V 3 A

80~1000 270 V 3 A

Engineer :Joecy Ma

of 124


8 ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST


1. ECAT system (EFT Module)

KEYTEK E411 0605189 2009-08-11 2010-08-10

2. EFT Clamp KEYTEK CCL 0604287 2009-08-11 2010-08-10


8.2.1 Block Diagram of connection between EUT and simulators. Same as section 7.2.1.

8.2.2 EFT Test Setup

8.3 Test Standard EN 55024/1998+A1/2001+A2/2003 【IEC 61000-4-4/2004+Corr.1/2006+Corr.2/2007, Severity Level：Power Line-±0.5kV, ±1kV(peak); Signal Line-±0.5kV (peak), 5/50ns, 5kHz】


8.4.1 Severity levels Open circuit output test voltage and repetition rate of the impulses

On power port, PE On I/O (input/output) signal, data and control ports Level Voltage peak

kV Repetition rate

kHz Voltage peak

kV Repetition rate

kHz 1. 0.5 5 or 100 0.25 5 or 100 2. 1 5 or 100 0.5 5 or 100 3. 2 5 or 100 1 5 or 100 4. 4 5 or 100 2 5 or 100 Xa Special Special Special Special

To AC Power Supply Network

AC Line (L=50cm)

EUT

ECAT system

Remark: Combination wave generator and decoupling networks are included in test.

TABLE

EFT Clamp

Signal Line

Grounding Wire

10cm insulating support

Grounding Plate

Ground Plane

of 124


Note 1 : Use of 5kHz repetition rates is traditional; however, 100kHz is

closer to reality. Product committees should determine which frequencies are relevant for specific products or product types.

Note 2 : With some products, there may be no clear distinction between power ports and I/O ports, in which case it is up to product committees to make this determination for test purposes.

a “X” is an open level. The level has to be specified in the dedicated equipment specification.

8.4.2 Performance criterion：B

8.5 Test Procedure The measuring process is according to EN 55024/1998+A1/2001+A2/2003(IEC 61000-4-4/2004+Corr.1/2006+Corr.2/2007) and laboratory internal procedure TKC-301-023. The EUT and its simulators shall be placed 0.8m high above the ground reference plane which was a min. 1m*1m metallic sheet with 0.65mm minimum thickness. This reference ground plane shall project beyond the EUT by at least 0.1m on all sides and the minimum distance between EUT and all other conductive structure, except the ground plane beneath the EUT, shall be more than 0.5m.

8.5.1 For AC Mains port The EUT was connected to the power mains by using a coupling device which couples the EFT interference signal to AC power lines, and the length of the power line between the coupling device and the EUT shall be 0.5m or less. Both polarities of the test voltage should be applied during compliance test and the duration of the test can‘t less than 1min.

8.5.2 For telecommunication port The I/O interface cable of the EUT is connected to its simulator through a capacitive coupling clamp that is 0.5 meter long. The capacitive coupling clamp is impressed with burst noise for 1min and indirectly couples burst to I/O interface cable.







of 124


Electrical Fast Transient / Burst Immunity Test Results Applicant Micro-Star Int'L Co., Ltd. Date of Test 2009.11.07






Inject Place: Power Supply Line Inject Place: I/O Cable

Inject Line Voltage (kV) Inject

Time(s) Inject

Method Performance

Criterion Inject Line

Voltage (kV)

Inject Time(s)

Inject Method

Performance Criterion

L1 +0.5, +1.0 60 Direct A I/O +0.25, +0.5 60 Clamp A L1 -0.5, -1.0 60 Direct A I/O -0.25, -0.5 60 Clamp A L2 +0.5, +1.0 60 Direct A L2 -0.5, -1.0 60 Direct A

L1,L2 +0.5, +1.0 60 Direct A L1,L2 -0.5, -1.0 60 Direct A

PE +0.5, +1.0 60 Direct A PE -0.5, -1.0 60 Direct A

L1,PE +0.5, +1.0 60 Direct A L1,PE -0.5, -1.0 60 Direct A L2,PE +0.5, +1.0 60 Direct A L2,PE -0.5, -1.0 60 Direct A

L1,L2,PE +0.5, +1.0 60 Direct A L1,L2,PE -0.5, -1.0 60 Direct A

Engineer: Hilary

of 124


9 SURGE IMMUNITY TEST


1. Plus Immunity Test System

Thermo Electron Corp. EMC pro 0604251 2009-03-25 2010-03-24

2. Coupling

Decoupling Network

Thermo Electron Corp.

CM-I/OCD&HS 0604248 2009-08-11 2010-08-10

3. Coupling

Decoupling Network

Thermo Electron Corp. CM-TELCD 0604221 2009-08-11 2010-08-10



9.2.2 Test Setup

9.3 Test Standard EN 55024/1998 +A1/2001+A2/2003 【IEC 61000-4-5/2005, Test Level：line to earth - ± 2kV (peak), line to line - ± 1kV(peak),

1.2/50 (8/20) Tr/Thµs.】


9.4.1 Test Levels

Level Open-circuit test Voltage +/- 10%, kV

1. 0.5

2. 1.0

3. 2.0

4. 4.0

X Special

9.4.2 Performance Criterion: B

Remark: Test generator includes control center、surge combination and coupler.

80cm To AC Power Supply Network

AC LineEUT

Ground Plane

Coupler/ Decoupler

Telecom. Line

Test Generator

TABLE

of 124


9.5 Test Procedure The measuring process is according to EN 55024/1998 +A1/2001+A2/2003 (IEC 61000-4-5/2005) and laboratory internal procedure TKC-301-022.

For AC Mains ports:

9.5.1 Set up the EUT and test generator as shown on section 9.2.1 & 9.2.2.

9.5.2 For line to line coupling mode, provided a 0.5/1kV 1.2/50 μs current surge (at open-circuit condition) and 8/20 μs current surge to EUT selected points.

9.5.3 At least 5 positive and 5 negative (polarity) tests with a Maximum 1/min repetition rate were conducted during test.

9.5.4 Different phase angles were done individually.

9.5.5 Repeat procedure 9.5.2. to 9.5.4. except the open-circuit test voltages 0.5kV/1kV/2kV for line to earth coupling mode test.

9.5.6 Record the EUT Operating situation during compliance test and decide the EUT immunity criterion for above each test.

For Telecommunication ports:

9.5.7 Set up the EUT and test generator as shown on section 9.2.1 & 9.2.2.

9.5.8 For line to line coupling mode, provided a 0.5/1kV 1.2/50 μs current surge (at open-circuit condition) and 8/20 μs current surge to EUT selected points.

9.5.9 At least 5 positive and 5 negative (polarity) tests with a Maximum 1/min repetition rate were conducted during test.

9.5.10 Repeat procedure 9.5.7. to 9.5.9 for line to earth coupling mode test.

9.5.11 Record the EUT Operating situation during compliance test and decide the EUT immunity criterion for above each test.

9.6 Test Results PASSED. (Complied with Criterion A)

EUT with the following test modes and configurations was tested and all the test results are listed in next pages.






of 124


Surge Immunity Test Results







Input and Output AC Power Port

Location Polarity Phase Angle

No of Pulse Pulse Voltage Performance

Criterion + 0 5 0.5kV, 1.0kV A+ 90 5 0.5kV, 1.0kV A+ 180 5 0.5kV, 1.0kV A+ 270 5 0.5kV ,1.0kV A－ 0 5 0.5kV ,1.0kV A－ 90 5 0.5kV , 1.0kV A－ 180 5 0.5kV , 1.0kV A

L-N

－ 270 5 0.5kV , 1.0kV A+ 0 5 0.5kV, 1.0kV , 2.0kV A+ 90 5 0.5kV, 1.0kV , 2.0kV A+ 180 5 0.5kV, 1.0kV , 2.0kV A+ 270 5 0.5kV, 1.0kV , 2.0kV A－ 0 5 0.5kV, 1.0kV , 2.0kV A－ 90 5 0.5kV, 1.0kV , 2.0kV A－ 180 5 0.5kV, 1.0kV , 2.0kV A

L-PE

－ 270 5 0.5kV, 1.0kV , 2.0kV A+ 0 5 0.5kV, 1.0kV , 2.0kV A+ 90 5 0.5kV, 1.0kV , 2.0kV A+ 180 5 0.5kV, 1.0kV , 2.0kV A+ 270 5 0.5kV, 1.0kV , 2.0kV A－ 0 5 0.5kV, 1.0kV , 2.0kV A－ 90 5 0.5kV, 1.0kV , 2.0kV A－ 180 5 0.5kV, 1.0kV , 2.0kV A

N-PE


L, N-PE

－ 270 5 0.5kV, 1.0kV , 2.0kV A

Engineer: Hilary

of 124


Surge Immunity Test Results Applicant Micro-Star Int'L Co., Ltd. Date of Test 2009.11.07






Telecom Line Coupling No of Performance Line Polarity Pulse

Pulse Voltage Criterion

+ 5 0.5kV,1kV N/A T1 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A R1 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A T2 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A R2 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A T1, R1 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A T2, R2 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A T1, R1, T2, R2 － 5 0.5kV,1kV N/A

[ ]DC Input and Output Power Port ⁄[ˇ ]I/O Signal Cable

No of Performance Location Polarity

Pulse Pulse Voltage

Criterion Differential + 5 0.5kV,1kV N/A

Mode － 5 0.5kV,1kV N/A

Common + 5 0.5kV,1kV A

Mode － 5 0.5kV,1kV A

Engineer :Hilary

of 124


Surge Immunity Test Results







Input and Output AC Power Port

Location Polarity Phase Angle

No of Pulse Pulse Voltage Performance

Criterion + 0 5 0.5kV, 1.0kV A+ 90 5 0.5kV, 1.0kV A+ 180 5 0.5kV, 1.0kV A+ 270 5 0.5kV ,1.0kV A－ 0 5 0.5kV ,1.0kV A－ 90 5 0.5kV , 1.0kV A－ 180 5 0.5kV , 1.0kV A

L-N

－ 270 5 0.5kV , 1.0kV A+ 0 5 0.5kV, 1.0kV , 2.0kV A+ 90 5 0.5kV, 1.0kV , 2.0kV A+ 180 5 0.5kV, 1.0kV , 2.0kV A+ 270 5 0.5kV, 1.0kV , 2.0kV A－ 0 5 0.5kV, 1.0kV , 2.0kV A－ 90 5 0.5kV, 1.0kV , 2.0kV A－ 180 5 0.5kV, 1.0kV , 2.0kV A

L-PE


N-PE


L, N-PE

－ 270 5 0.5kV, 1.0kV , 2.0kV A

Engineer: Hilary

of 124


Surge Immunity Test Results Applicant Micro-Star Int'L Co., Ltd. Date of Test 2009.11.07






Telecom Line Coupling No of Performance Line Polarity Pulse

Pulse Voltage Criterion

+ 5 0.5kV,1kV N/A T1 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A R1 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A T2 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A R2 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A T1, R1 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A T2, R2 － 5 0.5kV,1kV N/A

+ 5 0.5kV,1kV N/A T1, R1, T2, R2 － 5 0.5kV,1kV N/A

[ ]DC Input and Output Power Port ⁄[ˇ ]I/O Signal Cable

No of Performance Location Polarity

Pulse Pulse Voltage

Criterion Differential + 5 0.5kV,1kV N/A

Mode － 5 0.5kV,1kV N/A

Common + 5 0.5kV,1kV A

Mode － 5 0.5kV,1kV A

Engineer :Hilary

of 124


10 CONDUCTED DISTURBANCE IMMUNITY TEST

10.1 Test Equipment Item Type Manufacturer Model No. Serial No. Last Cal. Next Cal. 1. Signal Generator Agilent 8648C 3847M01438 2009-03-25 2010-03-242. Power Amplifier AR KAW 2180 10088-2 NCR NCR 3. Attenuator Agilent 8491B MY39262365 2009-01-07 2010-01-064. CDN-M2 FCC FCC-801-M2-25A 6041 NCR NCR 5. CDN-M3 FCC FCC-801-M3-25A 6042 2009-03-25 2010-03-24

6. Decoupling Network FCC F-203I-23MM-DCN 196 NCR NCR

7. EM Injection Clamp FCC F-203I-03MM 503 2009-03-25 2010-03-24

NCR: Non-Calibration Remark


10.2.1 Block Diagram of connection between EUT and simulators.

Same as Section 7.2.1.

10.2.2 Common Mode Test Setup

EUT AC SourceCDN

Signal Generator

Personal Computer Control System

Ground Reference support

0.1m

Power Amplifier Attenuator

10.2.3 EM Clamp Mode Test Setup

EUTCDN

Signal Generator

Personal Computer Control System

Ground Reference support

Power Amplifier

50Ω

EM InjectionClamp

AE CDN

50Ω

0.1m0.1m

0.1m < L <0.3m

DCN

Attenuator

10.3 Test Standard

EN 55024/1998+A1/2001 +A2/2003 【IEC 61000-4-6/2008, Severity Level：0.15-80MHz, 3V, 80%AM (1kHz)】

of 124



10.4.1 Severity levels Frequency range 0.15MHz - 80MHz

Voltage level (e.m.f.) Level U0

dB(µV) U0 V

1. 120 1 2. 130 3 3. 140 10 Xa Special

a X is an open level. 10.4.2 Performance criterion：A

10.5 Test Procedure The measuring process is according to EN 55024/1998+A1/2001 +A2/2003(IEC 61000-4-6/2008) and laboratory internal procedure TKC-301-027. For AC Mains port

10.5.1 Set up the EUT, CDN and test generators as shown on section 10.2.2.

10.5.2 The EUT and supporting equipment were placed on an insulating support 0.1m high above a ground reference plane. CDN (coupling and decoupling device) was placed on the ground plane making contact with it at about 0.1-0.3m from EUT. Cables between CDN and EUT were as short as possible.

10.5.3 The disturbance signal described below was injected to EUT through CDN.

10.5.4 The EUT operates within its operational mode(s) under intended climatic conditions after power on.

10.5.5 The frequency range was swept from 150 kHz to 80MHz using 3V signal level, and with the disturbance signal 80% amplitude modulated with a 1 kHz sine wave.

10.5.6 The rate of sweep shall not exceed 1.5*10^3decades/s. Where the frequency was swept incrementally, the step size shall not exceed 1% of the start and thereafter 1% of the preceding frequency value.

10.5.7 Recording the EUT Operating situation during compliance testing and decide the EUT immunity criterion. For Telecommunication Port

10.5.8 Set up the EUT, EM Injection Clamp and test generators as shown on section 10.2.3.

10.5.9 The EUT and supporting equipment were placed on an insulating support 0.1m high above a ground reference plane. EM Injection Clamp (coupling and decoupling device) was placed on the ground plane making contact with it at about 0.1-0.3m from EUT. Cables between CDN and EUT were as short as possible.

10.5.10 The DCN was placed on between AE and EUT, the EUT and AE of power through CDN, CDN terminated with 50Ω at the RF disturbance input port.

10.5.11 The disturbance signal described below was injected to EUT though EM Injection Clamp.

10.5.12 Repeat above procedure from 10.5.8 to 10.5.11.

of 124








of 124


Inject Currents Immunity Test Results Applicant Micro-Star Int'L Co., Ltd. Date of Test 2009.11.06

EUT Notebook PC I/P Volt. AC: 230V ; 50Hz





Frequency Range (MHz) Inject Position Strength Performance

Criterion Remark

0.15MHz~80MHz Main 3V A

0.15MHz~80MHz I/O 3V A

I/O:RJ45 Port

Engineer : Joecy Ma

of 124


11 POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST


1. Plus Immunity Test System KEYTEK EMC pro 0604251 2009-03-25 2010-03-24

2. Magnetic Field Immunity Loop FCC F-1000-4-8-/

9/10-L-1M 06008 NCR NCR

NCR: Non-Calibration Mark



11.2.2 Test Setup

Test Generator

Induction CoilEUT

Non-Conductive Table

11.3 Test Standard

EN 55024/1998+A1/2001+A2/2003 【IEC 61000-4-8/2001, Test Level: 50Hz, 1A/m】



Level Magnetic Field Strength Continuous Field A/m 1. 1 2. 3 3. 10 4. 30 5. 100 X Special

11.4.2 Performance criterion：A

of 124


11.5 Test Procedure The measuring process is according to EN 55024/1998+A1/2001+A2/2003 (IEC 61000-4-8/2001) and laboratory internal procedure TKC-301-012. The EUT was placed on 1m high table that above the ground reference plane which is the min. size 1m x 1m and 0.65mm thickness metallic. And subjected to the test magnetic field by using the induction coil of standard dimensions (1m x 1m). The induction coil rotated by 90 degrees in order to expose the EUT to the test field with different orientations. All cables of EUT exposed to magnetic field for 1m of their length.







of 124


Power Frequency Magnetic Field Immunity Test Results Applicant Micro-Star Int'L Co., Ltd. Date of Test 2009.11.07






Power Frequency Magnetic Field Testing Duration Coil Orientation Performance Criterion Remark

50Hz,1A/m 1 Minute X-axis A

50Hz,1A/m 1 Minute Y-axis A

50Hz,1A/m 1 Minute Z-axis A

Engineer: Hilary

of 124


12 VOLTAGE DIPS AND INTERRUPTIONS IMMUNITY TEST


1. Plus Immunity TestSystem KEYTEK EMC pro 0604251 2009-03-25 2010-03-24



12.2.2 Test Setup

12.3 Test Standard EN 55024/1998 +A1/2001 +A2/2003 【IEC 61000-4-11/2004, Severity Level：Voltage dips : Voltage interruptions >95% reduction: 250 periods; Dips 30% reduction: 25periods; >95% reduction: 0.5period】


12.4.1 Preferred severity levels and durations for voltage dips

Classa Test level and durations for voltage dips (ts) (50Hz/60Hz)

Class 1 Case-by-case according to the equipment requirements

Class 2 0% during ½ cycle

0% during 1 cycle

70% during 25/30c cycles

Class 3 0% during ½ cycle

0% during 1 cycle




Class Xb X X X X X a Classes as per IEC 61000-2-4. b To be defined by product committee. For equipment connected directly or indirectly

to the public network, the levels must not be less severe than Class 2. c “25/30 cycles” means “25 cycles for 50Hz test” and “30 cycles for 60Hz test”.

EUT

AC Line

O/P

To AC Power Supply Network

Plus Immunity Test System

I/P

of 124


12.4.2 Preferred severity levels and durations for short interruptions

Classa Test level and durations for short interruptions (ts) (50Hz/60Hz)

Class 1 Case-by-case according to the equipment requirements

Class 2 0% during 250/300c cycles

Class 3 80% during 250/300c cycles

Class Xb X a Classes as per IEC 61000-2-4. b To be defined by product committee. For equipment connected directly or indirectly

to the public network, the levels must not be less severe than Class 2. c “250/300 cycles” means “250 cycles for 50Hz test” and “300 cycles for 60Hz test”.

12.4.3 Performance criterion： 1) Voltage dips >95% reduction performance criterion B. 2) Voltage dips 30% reduction performance criterion C. 3) Voltage interruption >95% reduction performance criterion C.

12.5 Test Procedure The measuring process is according to EN 55024/1998 +A1/2001 +A2/2003 (IEC 61000-4-11/2004) and laboratory internal procedure TKC-301-003.

12.5.1 Set up the EUT and test generator as shown on section 12.2.

12.5.2 The interruption was introduced at selected phase angles with specified duration. There was a 10s minimum interval between each test event.

12.5.3 After each test a full functional check was performed before the next test.

12.5.4 Repeat procedures 12.5.2. & 12.5.3. for voltage dips, only the test level and duration was changed.

12.5.5 Record any degradation of performance.

12.6 Test Results PASSED. (Voltage interruptions complied with criterion B, Voltage dips Complied with criterion A) EUT with the following test modes and configurations was tested and all the test results are listed in next pages.






of 124


Voltage Dips and Interruptions Immunity Test Results Applicant Micro-Star Int'L Co., Ltd. Date of Test 2009.11.07



Test Mode (1) NB+D-Sub 1600*900@60Hz 58kHz (2) NB+HDMI 1600*900@60Hz 58kHz



Type of Test

Test Voltage Phase Angle % Reduction Period

PerformanceCriterion

0 >95% 250 B 45 >95% 250 B 90 >95% 250 B 135 >95% 250 B 180 >95% 250 B 225 >95% 250 B 270 >95% 250 B

Voltage Interruption 230

315 >95% 250 B 0 30% 25 A 45 30% 25 A 90 30% 25 A 135 30% 25 A 180 30% 25 A 225 30% 25 A 270 30% 25 A

230

315 30% 25 A 0 >95% 0.5 A 45 >95% 0.5 A 90 >95% 0.5 A 135 >95% 0.5 A 180 >95% 0.5 A 225 >95% 0.5 A 270 >95% 0.5 A

Voltage Dips

230

315 >95% 0.5 A

Note: The performance criterion “B” means the power supply to the EUT turned off during the test, but it can recover by itself during the test interval.

Engineer :Hilary

of 124


13 PHOTOGRAPHS

13.1 Photos of Conducted Disturbance Measurement

Front View of Conducted Measurement for AC mains port

Side View of Conducted Measurement for AC mains port

of 124


Front View of Conducted Measurement for Telecommunication port

Side View of Conducted Measurement for Telecommunication port

of 124


13.2 Photos of Radiated Disturbance Measurement For 30MHz~1GHz (At No.1 10m Semi-Anechioc Chambera)

Front View of Radiated Disturbance Measurement

Back View of Radiated Disturbance Measurement

of 124


Test Configuration: Mode 1 Test Mode: LCD+HDMI 1600*900@60Hz 58 kHz

Setup with Maximum Detected Emission at Horizontal Polarization

Setup with Maximum Detected Emission at Vertical Polarization

of 124


For 1GHz~6GHz (At 3m Semi-Anechioc Chambera)

Front View of Radiated Disturbance Measurement

Back View of Radiated Disturbance Measurement

of 124


13.3 Photos of Harmonic & Flicker Measurement

13.4 Photos of Electrostatic Discharge Immunity Test

Air Discharge

of 124


VCP & HCP

13.5 Photos of RF Field Strength Immunity Test

Front View of R/S Test

of 124


Back View of R/S Test

13.6 Photos of Electrical Fast Transient/Burst Immunity Test

For AC Mains port

of 124


For Telecommunication port

13.7 Photos of Surge Immunity Test

For AC Mains port

of 124



13.8 Photos of Conducted Disturbance Immunity Test

For AC Mains port

of 124



13.9 Photos of Power Frequency Magnetic Field Immunity Test

of 124


13.10 Photos of Voltage Dips and Interruptions Immunity Test

13.11 Photos of host PC for RJ45 ping test

of 124


13.12 Photos of WALAN& Bluetooth function test

APPENDIX I


APPENDIX I Pre-scan data of radiated disturbance measurement

APPENDIX I-Page 1 of 8


APPENDIX II


APPENDIX II

Photos of EUT

APPENDIX II-Page 1 of 63


Figure 1 General Appearance (Top View)

Figure2

General Appearance (Bottom View)



Figure3 General Appearance (Side View)

Figure4

General Appearance (Side View)



Figure5 General Appearance (Back View, I/O Ports)

Figure6

General Appearance (Left Side, I/O Ports)



Figure7 General Appearance (Right Side, I/O Ports)

Figure8

General Appearance (Battery Remove)



Figure9 Battery (BTY-L75/91NMS17LF6SU1,back View)

Figure10

Battery (BTY-L74/91NMS17LD4SU1,Front View)



Figure11 Battery (BTY-L74/91NMS17LD4SU1,Back View)

Figure12

Cover Remove



Figure13 HDD Remove

Figure14

HDD (TOSHIBA/MK5055GSX/500GB,Front View)



Figure15 HDD (TOSHIBA/MK5055GSX/500GB, Back View)

Figure16

HDD (TOSHIBA/MK1655GSX/160GB)



Figure17 HDD (TOSHIBA/MK2555GSX/250GB)

Figure18

HDD (TOSHIBA/MK3265GSX/320GB, Front View)



Figure19 HDD (TOSHIBA/MK3265GSX/320GB, Back View)

Figure20

HDD (WD/1600BEVT-22ZCT0/160GB)



Figure21 HDD (WD/1600BEVT-22A23T0/160GB, Front View)

Figure22

HDD (WD/1600BEVT-22A23T0/160GB, Back View)



Figure23 HDD (WD/WD2500BEVT-22ZAT0/250GB)

Figure24

HDD (WD/WD5000BEVT-22A0RT0/500GB)



Figure25 HDD (WD/WD5000BEVT-22ZAT0/500GB, 正面)

Figure26

HDD (WD/WD5000BEVT-22ZAT0/500GB,Back View)



Figure27 HDD (WD/WD3200BEVT-22A23T0/320GB, Front View)

Figure28

HDD (WD/WD3200BEVT-22A23T0/320GB, Back View)



Figure29 HDD (WD/WD6400BEVT-22A0RT0/640GB, Front View)

Figure30

HDD (WD/WD6400BEVT-22A0RT0/640GB, Back View)



Figure31 HDD (WD/WD3200BEVT-22ZCT0/320GB, Front View)

Figure32

HDD (WD/WD3200BEVT-22ZCT0/320GB, Back View)



Figure33 HDD (WD/WD2500BEVT-22A23T0/250GB, Front View)

Figure34

HDD (WD/WD2500BEVT-22A23T0/250GB, Back View)



Figure35 HDD (Fujitsu/MJA2160BH/160GB, Front View)

Figure36

HDD (Fujitsu/MJA2160BH/160GB, Back View)



Figure37 HDD (Fujitsu/MJA2250BH/250GB, Front View)

Figure38

HDD (Fujitsu/MJA2250BH/250GB, Back View)



Figure39 HDD (Fujitsu/MJA2320BH/320GB)

Figure40

HDD (Fujitsu/MJA2500BH/500GB，Front View)



Figure41 HDD (Fujitsu/MJA2500BH/500GB，Back View)

Figure42

HDD (Seagate/ST9160314AS/160GB)



Figure43 HDD (Seagate/ST9250315AS/250GB, Front View)

Figure44

HDD (Seagate/ST9250315AS/250GB, Back View)



Figure45 HDD (Seagate/ST9320325AS/320GB)

Figure46

HDD (Seagate/ST9500325AS/500GB, Front View)



Figure47 HDD (Seagate/ST9500325AS/500GB，Back View)

Figure48

ODD Remove &Front View



Figure49 ODD (HLDS/GT30N, Back View)

Figure50

ODD (Sony/AD-7560S, Front View)



Figure51 ODD(Sony/AD-7560S, Back View)

Figure52

Keyboard Remove& Front View



Figure53 Keyboard(Sunrex/V111922AK1 US, Back View)

Figure54

Internal View (Memory &WLAN remove)



Figure55 Memory (Hynix/HMT125S6BFR8C-G7N0, 2GB/Front View)

Figure56

Memory(Hynix/HMT125S6BFR8C-G7N0, 2GB/Back View)



Figure57 Memory (Hynix/HMT112S6BFR6C-G7N0, 1GB)

Figure58

Memory (Samsung/M471B5673EH1-CF8, 2GB/Front View)



Figure59 Memory (Samsung/M471B5673EH1-CF8, 2GB/Back View)

Figure60

WLAN (Atheros/AR5B95/S57-0800290-T46,Front View)



Figure61 WLAN (Atheros /AW-NE785H/S57-0800290-T46,Back View)

Figure62

WLAN& Bluetooth (msi/MS-3870/605-3870-A10,Front View)



Figure63 WLAN& Bluetooth (msi/MS-3870/605-3870-A10,Back View)

Figure64

Bluetooth (CSR/BSMAN1/MS-3801)



Figure65 Frame Remove

Figure66

EMI suppression part



Figure67 EMI suppression part

Figure68





Figure70





Figure72

LCD Panel Remove

3



Figure73 LCD Panel (AUO/B173RRW01,Front View)

Figure74

LCD Panel (AUO/B173RRW01,Back View)



Figure75 LCD Panel (AUO/B173RRW01, Product Label)

Figure76

LCD Panel (CHIMEI/N173O6-L02, Front View)



Figure77 LCD Panel (CHIMEI/N173O6-L02, Back View)

Figure78

LVDS Board(Front View)



Figure79 LVDS Board(Back View)

Figure80

LCD Panel (CHIMEI/N173O6-L02, Product Label)



Figure81

Internal View (EMI suppression part)

Figure82




Figure83 Internal View (EMI suppression part)

Figure84

WebCam (Bison/BN29M6SSB-010)



Figure85

WebCam (AZUREWAVE/AM-1C027, Front View)

Figure86

WebCam (AZUREWAVE/AM-1C027, Back View)



Figure87

Antenna Remove

Figure88

Antenna (Front View)



Figure89 Antenna (Back View)

Figure90

Internal View (Heat Sink&Front View)



Figure91 Heat Sink(Back View)

Figure92

Internal View




Figure94

Touch Pad (SENTELIC/TPA2D2IC99)



Figure95 Touch Pad (SENTELIC/TPA2D2IC99,Back View)

Figure96

Touch Pad (SYNAPTICS/TM-00300-000(S78-3700360-SD2),Front View)



Figure97 Touch Pad (SYNAPTICS/TM-00300-000(S78-3700360-SD2),Back View)

Figure98

Internal View (PCB Board Remove)



Figure99 PCB Board(Front View)

Figure100

PCB Board(Back View)



Figure101

Main Board Remove

Figure102





Figure104





Figure106

USB Port Board (Front View)



Figure107 USB Port Board (Back View)

Figure108

Main Board (Front View)



Figure109 Main Board (Back View)

Figure110

CPU (INTEL/Q3GB/2.4GHz, Front View)



Figure111 CPU (INTEL/Q3GB/2.4GHz, Back View)

Figure112

CPU (INTEL/Q3G9/2.53GHz, Front View)



Figure113 CPU (INTEL/Q3G9/2.53GHz, Back View)

Figure114

CPU (INTEL/Q3LR/2.26GHz, Front View)



Figure115 CPU (INTEL/Q3LR/2.26GHz, Back View)

Figure116

CPU (INTEL/Q3GG/2.13GHz, Front View)



Figure117

CPU (INTEL/Q3GG/2.13GHz, Back View)

Figure118

Main Board (Crystal Oscillator)



Figure119


Figure120




Figure121


Figure122

AC Adapter (LITEON /PA-1650-68, General Appearance)



Figure123

AC Adapter (LITEON /PA-1650-68, Label)

Figure124

AC Adapter (DELTA /ADP-65HB BB, General Appearance)



Figure125

AC Adapter (DELTA /ADP-65HB BB, Label)

Figure126

AC Power Cord

emc test reportfaenl.msi.com/ftp/ce documents/notebook/ms-1736x... · page 5 of 124 audix...

Documents