3: References

3.1 IEEE C37.90-2005 Standard for Relays and Relay Systems Associated with Electric Power Apparatus

3.2 IEEE C37.90.1-2011 Standard for Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated with Electric Power Apparatus

3.3 IEEE C37.90.2-2004 Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers

3.4 IEEE C37.90.3-2001 Standard Electrostatic Discharge Tests for Protective Relays

4.0 Additions and Changes to References

4.1 Additions and Changes to [3.1] IEEE C37.90-2005 Standard for Relays and Relay Systems Associated with Electric Power Apparatus

Clause 3.1.1 Operational temperature range – change to read:

Operational temperature is the temperature of still air measured 30 cm from the surface of the unit (communications networking device) enclosure while in operation and with communications profile 3, as defined in and . For a specified temperature range (for example, –20 °C to +55 °C), a unit shall be able to start up and continue its operation at the specified minimum temperature (i.e., –20 °C) within 5 min after having been de-energized for a sufficient time such that its internal components have cooled to that temperature without condensation. A unit shall also be able to start up and continue its operation within 5 min at the specified maximum temperature (i.e., +55 °C) after having been de-energized for a sufficient time such that its internal components have heated to that temperature. If the unit to be tested is modular, then the configuration to be tested shall be the maximum heat-generating configuration permitted by the manufacturer and include dual power supplies if such a design option is available.

Add: Devices meeting this standard shall be convection cooled and shall not include internal fans or any other means of forced air circulation.

Clause 3.1 DC rated control power inputs – underlined words added:

DC power supplies and auxiliary circuits with dc voltage rating shall be able to withstand continuously the maximum design voltage shown in Error: Reference source not found. They shall be capable of operating successfully over a range from 80% of rated voltage to the maximum design voltage. Power supplies with a wide dc voltage range (i.e., 12 V to 280 V) are encouraged. DC power supplies shall be designed such that they do not apply a ground on either the positive or negative terminal of the station battery connection. It shall be possible for either the positive or negative of the station battery inputs to be externally connected to to the case ground, or other common ground, without damage.

4.2 Additions and Changes to [Ref 3.2] IEEE C37.90.1™-2011 Standard for Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated with Electric Power Apparatus

Clause 6. Equipment to be tested

Test intent – changed to add:

The tests described herein are design tests to be applied to communications networking devices and communication ports in protective relays that can be exposed to conducted or coupled transients under normal installed operating

conditions. It is not the intent of these tests to test an isolated subassembly of a communications networking device unless that subassembly can be used independently and located more than 2 m from the rest of the device.

6.4 Protective relay communication equipment and communications networking devices (underlined words added)

Test points – changed to read:

After the communication system is defined, all points of connection between the communications system and external circuits shall be tested.

Application of test wave – external connection groups underlined words added:

All external connections to the system shall be considered in one of the following four groups, as defined in the IEEE Standards Dictionary: Glossary of Terms & Definitions, and shall be tested:

i) Power supply, including power over Ethernet

ii) Outputs, such as alarms

iii) Digital data

iv) Signal circuits, including connections to radio frequency antennas or via power line communications

7.3 Conditions of tests – changed to read:

The tests shall be made under usual service conditions and energized at rated power supply voltage in accordance with [Ref 3.1]. Typical test setups for small are shown in Error: Reference source not found and Figure 1a (see below), respectively. During the application of the transients, and via external connections (or by any other equally effective methods), the device (or port) shall be placed in transmit and receive modes for approximately equal time.

Figure 1a – Concurrent common mode test for I/O and data circuits, and RF leads

Figure 1a

7.3.6 Power supply values (addition of one word – underlined below)

It is the intent of this test to duplicate as nearly as possible in-service conditions with the device in its energized normal operating state. The input voltage to power supply circuits shall be within specified limits.

Revised Table 6—Test modes and voltage for each external connection group—fast transient test(for IEEE 1613-2011: transverse mode tests on outputs not required, b footnote added)

External connection group Test modes Fast transient testCommon Transverse Voltage to be applied

Power supply Yes Yesb 4 kVOutput Yes No 4 kVa

Data communications Yes No 4 kVa

Signal circuit Yes No 4 kVa

a Applied through capacitive coupling clamp. b May be applied as common mode with one terminal grounded, and repeated with the other terminal grounded.

Add the following Clauses:

7.3.7 Communications conditions during SWC tests

For performance Class 1 equipment, the manufacturer shall declare the communications conditions, stored program or external controls such that the transmit and the receive functions are each activated for essentially equal time during SWC testing. For performance Class 2 equipment, SWC testing shall be conducted with devices under each communications profile shown in , , and/or Table 9 as applicable.

Table 7—Device communications profiles (conditions) during SWC tests for Ethernet equipment with specified ranges of frame size (for example, an Ethernet switch)

Profile Bit rate Frame size Frame rate (loading)

(% of maximum)a

Comments

1 0 0 0 Idle conditions (no communications)2 Maximum Maximum 30 Simulate typical loading3 Maximum Maximum 90 Simulate heavy loading

a “% of maximum” refers to the average throughput maintained during the test compared with the maximum sustainable throughput. The maximum sustainable throughput is the rate above which error-free communication cannot be sustained by the unit under test under normal service conditions.

Table 8—Device communications profiles (conditions) during SWC tests for serial devices without specified ranges of frame size (for example, serial media converters)

Profile Bit rate Comments1 0 Idle conditions (no communications)2 30% of maximum Simulate lower bandwidth communications3 Maximum Simulate higher bandwidth communications

Table 9– Device communications profiles (conditions) during SWC tests for radio frequency (RF) and power line carrier (PLC) equipped devices. Note: Broadband over PowerLine equipped devices shall follow the same profile as PLC equipment.

Profile Bit rate

% of manufacturer’s rating

Comments

1 0 Idle conditions (no communications)

2 30 % Simulate typical loading

3 90 % Simulate heavy loading

Note: The RF signal strength at the device’s RF antenna port shall be no greater than 10 db above the manufacturer’s requirement for its published packet error rate.

3.7 Device performance classes

There shall be two performance classes for devices:

Class 1: This performance class is for communications devices installed in electric power facilities and used for general-purpose communications where temporary loss of communications and/or communications errors can be tolerated during the occurrence of the SWC transients. All devices shall meet Class 1 requirements unless Class 2 is specified by the user or manufacturer.

Class 2: This performance class is for communications devices used in electric power facilities and used for communications where it is required to have error-free, uninterrupted communications during the occurrence of the SWC transients.

Conditions to be met (acceptance criteria)

The device shall be continuously energized from the beginning of the transient tests and until the following post transient test evaluations per Clause 3.8.1 have been completed. The device shall be considered to have passed the oscillatory and fast transient SWC tests if—as a result of the tests—all the conditions listed below are met for the performance class of the device. Note: The SWC and fast transient testing of communication ports of protective relays may occur as a concurrent adjunct to their SWC and fast transient tests.

3.8.1 Conditions to be met by Class 1 and Class 2 devices

i) No loss or corruption of stored memory or data, including active or stored settings, occurs.

ii) Device resets do not occur, and manual resetting is not required.

iii) No changes in the states of the electrical, mechanical, or communication status outputs occur. This includes alarms, status outputs, or targets.

v) No erroneous, permanent change of state of the visual, audio, or message outputs results. Momentary changes of these outputs during the tests are permitted.

vi) During the tests, SCADA analog values shall not change by more than 2% of full-scale values. After the test, accuracy must revert to the manufacturer-claimed accuracy.

vii) No hardware damage has occurred (de-energized test)

3.8.2 .Additional condition to be met by Class 1 devices

The manufacturer shall declare the communications conditions to be initiated on the energized device after completion of the transient tests. Although the details of this communication are not specified in this standard, they shall be adequate to confirm that neither the transmit nor the receive functions of the device were damaged by the application of the transient tests.

3.8.3 Additional conditions to be met by Class 2 devices

Established communications in accordance 3.6.3 shall NOT be disrupted or experience errors during the period the SWC tests are applied.

4.3 Additions and Changes to [Ref 3.3] IEEE C37.90.2 - 2004 Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers

Add to Clause 1.1 Scope: Communication networking devices and the communication ports in protective relays

Add to Clause 6. Device performance classes

There shall be two performance classes for devices during RF susceptibility tests, as follows:

—Class 1. This performance class is for communications devices used for general-purpose electric power communications where temporary loss of communications and/or communications errors can be tolerated during the occurrence of RFI. All devices shall meet class 1 requirements unless class 2 is specified by the user or manufacturer

—Class 2. This performance class is for communications devices used in electric power communications where it is desired to have error-free, uninterrupted communications during the occurrence of RFI.

Test Procedure: For performance Class 1 equipment, the manufacturer shall declare the communications conditions, stored program or external controls such that the transmit and receive functions are each activated for essentially equal time during RF testing. Immediately following the RF tests, and with the device still energized, the device shall meet the requirements in Clause 7.7.1

For performance class 2 equipment, RF testing shall be conducted with devices under each of the communications profiles shown in , , and/or Table 10 as applicable.

Conditions to be met by Class 1 and Class 2 devices while their power supplies are continuously energized following the application of the RF

i) No loss or corruption of stored memory or data, including active or stored settings, occurs.

ii) Device resets do not occur, and manual resetting is not required.

iii) No changes in the states of the electrical, mechanical, or communication status outputs occur. These outputs include alarms, status outputs, or targets.

iv) No erroneous, permanent change of state of the visual, audio, or message outputs results. Momentary changes of these outputs during the tests are permitted.

v) During the tests, SCADA analog values shall not change by more than 2% of full-scale values. After the test, accuracy must revert to the manufacturer-claimed accuracy.

vii) No hardware damage has occurred (confirm when device is de-energized).

Add to Clause 6.4 Criteria for Acceptance: The equipment shall be considered to have passed the RF tests if—during, or as a result of, the tests—all the applicable conditions are met for the performance class of the device. Note: The RF testing of communication ports of protective relays may occur as a concurrent adjunct to the RF testing of those devices

4.4 Changes to [Ref 3.4] IEEE C37.90.2 - 2004 Standard for Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers

Add to Clause 1.1 Scope: and Communication networking devices and the communication ports in protective relays.

Add to Clause 6. Device performance classes

There shall be two performance classes for devices during RF susceptibility tests, as follows:

—Class 1. This performance class is for communications devices used for general-purpose electric power communications where temporary loss of communications and/or communications errors can be tolerated during the occurrence of RFI. All devices shall meet class 1 requirements unless class 2 is specified by the user or manufacturer

—Class 2. This performance class is for communications devices used in electric power communications where it is desired to have error-free, uninterrupted communications during the occurrence of RFI.

Test Procedure: For performance Class 1 equipment, the manufacturer shall declare the communications conditions, stored program or external controls such that the transmit and receive functions are each activated for essentially equal time during ESD testing. Immediately following the ESD tests, and with the device still energized, the device shall meet the requirements in Clause 7.7.1

For performance class 2 equipment, ESD testing shall be conducted with devices under each of the communi cations profiles shown in , , and/or Table 10 as applicable.

Conditions to be met by Class 1 and Class 2 devices while their power supplies are continuously energized following the application of the ESD

i) No loss or corruption of stored memory or data, including active or stored settings, occurs.

ii) Device resets do not occur, and manual resetting is not required.

iii) No changes in the states of the electrical, mechanical, or communication status outputs occur. These outputs include alarms, status outputs, or targets.

iv) No erroneous, permanent change of state of the visual, audio, or message outputs results. Momentary changes of these outputs during the tests are permitted.

v) During the tests, SCADA analog values shall not change by more than 2% of full-scale values. After the test, accuracy must revert to the manufacturer-claimed accuracy.

viii) No hardware damage has occurred (confirm when device is de-energized).

Add to Clause 6.4 Criteria for Acceptance: The equipment shall be considered to have passed the ESD tests if—during, or as a result of, the tests—all the applicable conditions are met for the performance class of the device. Note: The ESD testing of communication ports of protective relays may occur as a concurrent adjunct to the ESD testing of those devices.

5. Vibration and shock

Where control and data acquisition equipment will be subjected to vibration or shock, the user shall express the local vibration environment as constant velocity lines to represent vibration severity levels over a specified frequency range.

Five severity classes are listed in Table 10 as examples in typical locations.

Table 10—Classes of vibration severityClass Velocity v

(mm/s)Frequency range

(Hz)Examples

V.S.1 <3 1 to 150 Control room and general industrial environmentV.S.2 <10 1 to 150 Field equipmentV.S.3 <30 1 to 150 Field equipmentV.S.4 <300 1 to 150 Field equipment including transportationV.S.X >300 — To be specified by the user

Shock phenomena that may occur during handling for operation and maintenance of equipment shall be expressed in terms of an equivalent height of fall. This relationship is shown in .

Table 11—Shock phenomenaHeight of fall (mm) Treatment (hard surface)

25 Light handling50 Light handling, heavy equipment (> 10 kg)

100 Normal handling250 Normal handling, heavy material1000 Rough handling1500 Rough handling, heavy material

6. AC power fault tests (Telecommunication port)

The ac power fault susceptibility test methods and their application to the EUT are adapted from the methods and applications specified in section 4.6 of the Telcordia GR-1089-CORE Generic Requirements Error: Referencesource not found.

6.1 Scope

This sub-clause specifies design tests for type A ports (See Table 16 for port type definition) in communications networking devices that relate to the immunity of these ports to short duration ac power faults. This sub-clause is not intended for fire, fragmentation, or electrical hazard compliance.

6.2 Purpose

The purpose is to establish a common and reproducible basis for evaluating the performance of communications networking devices when subjected to induced ac power faults on communication lines, or direct contact between ac power lines and communication lines.

6.3 Test connections

During testing of each telecommunication port, telecommunication ports adjacent to the port under test are to be terminated as in service.

Type A ports that are not adjacent to the port under test, are to be grounded. Type B ports not adjacent to the port under test, but required for testing, are to be terminated as in service. Other Type B ports that are not necessary for the testing are to be left floating. Other connections such as power and control leads are to be terminated as appropriate for the operating mode(s) of the equipment.

Figure 1 Application of AC power fault test voltage

TEST GENERATOR

EUT

TIP

RING

S1

S2

S3

S4

Limiting resistance(If specified)

VoltageSource

OTHER PORTS(SUCH AS POWER &

CONTROL LEADS)

ADJACENT1 TYPE A & TYPE B PORTS

NON-ADJACENT2 TYPE A PORTS

TERM3

TERM3

Notes:

1- Adjacent ports are ports within the same circuit as the tested port .2- Non-adjacent ports are ports within a circuit isolated from the circuit of the tested port .3- Terminating device , as if in service.

NON-ADJACENT2 TYPE B PORTS REQUIRED

FOR TESTINGTERM3

NON-ADJACENT2 TYPE B PORTS NOT REQUIRED

FOR TESTINGN.C.

CONNECTION SCHEME S1 S2 S3 S4

1 (TIP to Generator, RING to Ground) CLOSED OPEN OPEN CLOSED

2 (RING to Generator, TIP to Ground) OPEN CLOSED

CLOSED OPEN

3 (TIP to Generator, RING to Generator simultaneously) CLOSED OPEN CLOSED OPEN

Table 16—Telecommunication port type definition

Port type DescriptionType A Equipment port(s) directly connected to metallic tip and ring outside-plant

conductors.

Type B Equipment port(s) that does not directly connect to metallic tip and ring outside-plant conductors, but may connect to intra-building communication link(s).

Figure 2 High-Impedance inductive source test circuit

EQUIPMENTUNDERTEST

N2

N1

N2

V1

VT

VR

V

V’

0.1 µF

0.2 µF

0.2 µF

0.15 µF

0.3 µF

0.3 µF

Notes:

1. Equipment to be tested as it would be connected and powered in normal service.

2. The test circuit with the EUT disconnected is prepared for testing by adjusting the voltage V1 until the voltage measured with respect to ground at V, V’, VT or VR equals 600 Vrms. After adjusting V1, either the sixty 5-second applications for test#5 of is applied to the EUT.

3. The capacitors in the test network should have adequate voltage and dissipation ratings.

4. The primary-to-secondary turns ratio (N1:N2) of the transformer is arbitrary, but should be the same on each secondary (line conductor).

5. Source V1 should have a minimum volt-ampere rating of 50 VA.

6.4 Test levels

Table 17—AC power fault test specification

Test Voltage (Vrms)1

Short-Circuit current per conductor

(A)2

Number of repetitions

Duration Primary protection

Connection scheme

1 50 0.33 1 15 min. Removed 1, 2 & 3 of Figure 1

2 100 0.17 1 15 min. Removed 1, 2 & 3 of Figure 1

3 200, 400 and 6003

1 (at 600V) 60 1 s. of each

voltage

Removed 1, 2 & 3 of Figure 1

4 1000 1 60 1 s. Installed 3 of Figure 1

5 See Figure 24

See Figure 2

60 5 s. Removed See Figure 2

6 600 0.5 1 30 s. Removed 1, 2 & 3 of Figure 1

7 440 2.2 5 2 s. Removed 1, 2 & 3 of Figure 1

8 600 3 5 1.1 s. Removed 1, 2 & 3 of Figure 1

9 1000 5 5 0.4 s. Installed 3 of Figure 1

Notes:

1. All sources are 50 or 60 Hz sinusoidal.

2. When performing longitudinal tests, select resistors (as shown in Figure 1) to permit the given current to flow in each conductor under short-circuit conditions.

3. For primary protection other than carbon blocks (or equivalent), the maximum peak voltage of the test may be reduced to the +3 sigma dc breakdown voltage over life measured at less than 2000 volts per second as specified in ANSI/IEEE C62.31 Error: Reference source not found.

4. This test is intended to establish the immunity of an EUT to low-level induced currents. It is applicable to an EUT containing secondary protectors that use gas-tube voltage limiters, gated-type devices (thyristors or sidactors), or other similar devices.

6.5 Test procedure

Tests described in section 6.4 shall be repeated for all operation modes of the tested port. As an example, a modem port shall be tested while it is in the off-hook state, and in the on-hook state.

Sufficient time may be allowed between the application of ac power tests, to permit components to cool.

6.6 Acceptance criteria

During the application of the test sequence to a port, the operation of that port may be disrupted.

The EUT shall not be damaged and shall operate properly without manual intervention or power cycling after each test sequence.

7. Power square voltage injection test (Telecommunication port)

The power square voltage susceptibility test definition are based on voltage transients observed on Type A port (See ) during power fault. Those transients are the result of the operation of a voltage-limiting protection device located in the telecommunication demarcation box.

Annex G describes in more detail the observed voltage transient, captured on-site.

7.1 Scope

This sub-clause specifies design tests for type A ports (See Table 16 for port type definition) in communications networking devices that relate to the immunity of these ports to voltage transients resulting from the operation of a voltage-limiting protection device located in the telecommunication demarcation box.

7.2 Purpose

The purpose is to establish a common and reproducible basis for evaluating the performance of communications networking devices when subjected to high dv/dt voltage transient between the tip and the ring of Type A ports.

7.3 Test connections

The test circuit is identical to the one shown in Figure 1.

During testing of each telecommunication port, telecommunication ports adjacent to the port under test are to be terminated as in service.

Type A ports that are not adjacent to the port under test, are to be grounded. Type B ports not adjacent to the port under test, but required for testing, are to be terminated as in service. Other Type B ports that are not necessary for the testing are to be left floating. Other connections such as power and control leads are to be terminated as appropriate for the operating mode(s) of the equipment.

7.4 Test waveform

The waveform consists of four bursts of eight square pulses (pulse width of 6ms, period of 8 ms), with a pause of 15 seconds between each burst as shown in Figure 3.

Figure 3 Power square voltage waveform

6 ms

200V

8 ms

15 s

0V

Table 1 —Power square voltage level

Voltage (V)1 Short-Circuit current per conductor

(A)2

Number of repetitions

Minimum dv/dt

(MV/sec.)

Primary protection

Connection scheme

200 1 1 20 Removed 1, 2 of Figure 1

Notes:

1. Source voltage waveform defined in Figure 3.

2. When performing longitudinal tests, select resistors (as shown in Figure 1) to permit the given current to flow in each conductor under short-circuit conditions.

7.5 Test procedure

Test shall be repeated for all operation modes of the tested port. As an example, a modem port shall be tested the port while it is in the off-hook state, and in the on-hook state.

7.6 Acceptance criteria

During the application of the test sequence to a port, the operation of that port may be disrupted.

The EUT shall not be damaged and shall operate properly without manual intervention or power cycling after each test sequence.

Bibliography (same as before, but with IEEE C37.90, 90.1, 90.2 and 90.3 deleted, as they are now References)