flicker noise extraction for scalable mos simulation models · page 18 summary together with the...
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![Page 1: Flicker Noise Extraction for Scalable MOS Simulation Models · Page 18 Summary Together with the measurement of flicker noise ( presented by Falk Korndörfer, IHP), the shown extraction](https://reader034.vdocument.in/reader034/viewer/2022050413/5f89a87e9931440b442cf3e8/html5/thumbnails/1.jpg)
Flicker Noise Extraction forScalable MOS Simulation Models
Dr. Thomas Gneiting
AdMOS GmbH
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Content
Flicker noise equations in modern MOS models
Noise simulation in different simulators
Steps in parameter extraction using a PSP example
Problems to be solved
Summary
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Common Flicker NoiseModels
100 101 102 103 104 105
10-17
10-18
10-19
10-20
10-21
10-22
10-23
10-24
f [Hz]
Sid [A²/Hz]
Frequencyexponent
Start ofthermal noise
100 101 102 103 104 105
10-17
10-18
10-19
10-20
10-21
10-22
10-23
10-24
f [Hz]
Sid [A²/Hz]
DC biasdependency
+ Dimension dependency
The most MOS simulation models provide the following 2 principaldegrees of freedom to adjust the flicker noise behavior.
![Page 4: Flicker Noise Extraction for Scalable MOS Simulation Models · Page 18 Summary Together with the measurement of flicker noise ( presented by Falk Korndörfer, IHP), the shown extraction](https://reader034.vdocument.in/reader034/viewer/2022050413/5f89a87e9931440b442cf3e8/html5/thumbnails/4.jpg)
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BSIM3 Flicker Noise
EFeffOX
AF
DSid
fLC
IKFfS
2)(
*
2
82
2
22
14
14
82
2
10*2
2102
102log
10*2)(
NN
NNOICNNOIBNOIA
fLINTNOILW
LITk
NNNOIC
NNNOIBN
NNOIA
fALINTNOILC
IqTkfS
l
ll
EFeffeff
CLMDSB
lOlO
l
O
EFbulkeffoxe
DSeffB
id
36
2
'
'
104)(,)(
EFeffeff
DStmwi
wimitli
wimitliid
fLW
IVNOIAfS
SS
SSfS
NOIMOD=1,4,5
NOIMOD=2,3,6
Vgs>Vth+0.1:
Vgs<Vth+0.1:
“classic” SPICE model
BSIM3 model
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BSIM4 Flicker Noise
EFeffOX
AF
DSid
fLC
IKFS
2
2*
2
102
2
22
*
*
102
2
,
10*2
2log
10*2)(
NN
NNOICNNOIBNOIA
fLINTNOILW
LITk
NNNOIC
NNNOIBNN
NNNOIA
fALINTNOILC
IqTkfS
l
ll
EFeffeff
CLMDSB
lOlO
l
O
EFbulkeffoxe
DSeffB
invid
102*
2
,
,,
,,
10)(,
)()(
)()()(
NfLW
ITkNOIAfS
fSfS
fSfSfS
EFeffeff
DSBsubVtid
subVtidinvid
subVtidinvid
id
FNOIMOD=0
FNOIMOD=1
Inversion:
SubVth:
“classic” SPICE model
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PSP Flicker Noise
NNNNFCNFB
NN
NNNNFCNNFBNFA
NGCf
IqfS
m
m
m
vsatox
DSTfl
**
*
*2**
*
2
2
2/
2/ln)(
EE
ENEN
EE
ENEN
EE
ENEN
LW
LWNFCLWNVC
LW
LWNFBLWNFB
LW
LWNFALWNFA
Local model:
Scalingequation:
Fixed frequency exponent of 1!
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Noise in ADS
define noise_circ (D G OUT)Flicker_Noise:MAIN D1 G 0 0 \L=10u W=10u Mult=1;; sense the noise currentR:Rdummy D D1 R=1m Noise=no;;convert noise current into anidentical voltageZ_Port:v D1 D OUT 0 Z[2,1]=1R:Raux OUT 0 R=1k Noise=no;end noise_circ
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Noise in Spice, HSPICE
.subckt noise_circ 1 2 5 7MAIN 9 6 0 0 Flicker_Noise+ L=10u W=10u NF=1L2 6 2 1000000C2 5 6 1000000H1 8 0 V1 1R1 7 8 1e-4V1 1 9 0.ends
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Content
Flicker noise equations in modern MOS models
Noise simulation in different simulators
Steps in parameter extraction using a PSP example Measurement (see paper from IHP, Falk Korndörfer)
Determination of the frequency exponent
Determination of bias dependency
Extraction of parameters for scalable noise models shown withan example using the PSP model
Problems to be solved
Summary
*) Based on the work of Knoblinger, Grabinski, Sischka
*)
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Frequency Exponent (1)
100 101 102 103 104 105
10-17
10-18
10-19
10-20
10-21
10-22
10-23
10-24
f [Hz]
Sid [A²/Hz]
EF
If the model provides afrequency exponent, it can bederived from the slope of themeasured curves in logarithmicrepresentation:(Example for SPICE model, the othermodels behave similar)
xmcy
fEFconfS
fconfS
fLC
IKFfS
id
EFid
EFeffOX
AF
DSid
loglog)(log
)(
)(2
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Frequency Exponent (2)
In the real world:
EF must fitseveral deviceswith diff. L, Wsimultaneously
Take intoaccount onlyparts of thecurves due tomeasurementrestrictions.
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DC Bias dependency (1)
100 101 102 103 104 105
10-17
10-18
10-19
10-20
10-21
10-22
10-23
10-24
f [Hz]
Sid [A²/Hz]
Sid [A²/Hz]
0 1 2 3 4
10-17
10-18
10-19
10-20
10-21
Vg[V]
Once the slope is given, the noise values at 1Hz can be determined byextrapolating the measured curve to 1Hz.
EFeffOX
AF
DSid
fLC
IKFfS
2)(
=1 at 1Hz
(Example for SPICE model, the othermodels behave similar)
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DC Bias dependency (2)
3 Steps:
Select range ofcurves todetermine slope
Make curvesslopeless
Apply linearfitting to theselected range ofthe curve anddetermine cross-point at 1Hz
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DC Bias dependency (2)
3 Steps:
Select range ofcurves todetermine slope
Make curvesslopeless
Apply linearfitting to theselected range ofthe curve anddetermine cross-point at 1Hz
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DC Bias dependency (2)
3 Steps:
Select range ofcurves todetermine slope
Make curvesslopeless
Apply linearfitting to theselected range ofthe curve anddetermine cross-point at 1Hz
![Page 16: Flicker Noise Extraction for Scalable MOS Simulation Models · Page 18 Summary Together with the measurement of flicker noise ( presented by Falk Korndörfer, IHP), the shown extraction](https://reader034.vdocument.in/reader034/viewer/2022050413/5f89a87e9931440b442cf3e8/html5/thumbnails/16.jpg)
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DC Bias dependency (2)
3 Steps:
Select range ofcurves todetermine slope
Make curvesslopeless
Apply linearfitting to theselected range ofthe curve anddetermine cross-point at 1Hz
![Page 17: Flicker Noise Extraction for Scalable MOS Simulation Models · Page 18 Summary Together with the measurement of flicker noise ( presented by Falk Korndörfer, IHP), the shown extraction](https://reader034.vdocument.in/reader034/viewer/2022050413/5f89a87e9931440b442cf3e8/html5/thumbnails/17.jpg)
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Parameter Extraction – PSP (1)
Sid(f=1Hz)@ diff Vg,Vd, L, W
SolverSfl(1Hz)=f(Parameter,Dimensions,DC Bias)
Iterative Solutionusing a modifiedLevenberg-Marquardt algorithm
Noise parameters
PSP:PSP1020 Par.L, W, MULTVG, VD
PSP:NFALW, NFBLW,NFCLW
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Parameter Extraction – PSP (2)
1. Simulation withdefault valuesof NFALW,NFBLW,NFCLW
2. Performextraction inca. 1s andrepeatsimulation
Example parameterextraction process:
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Parameter Extraction – PSP (2)
1. Simulation withdefault valuesof NFALW,NFBLW,NFCLW
2. Performextraction inca. 1s andrepeatsimulation
Example parameterextraction process:
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Parameter Extraction – PSP (2)
1. Simulation withdefault valuesof NFALW,NFBLW,NFCLW
2. Performextraction inca. 1s andrepeatsimulation
Example parameterextraction process:
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Parameter Extraction – PSP (3)
Final resultfor 4differenttransistordimensions.
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Problems to be solved
The scalability of the simulation models isstill not good enough.
The PSP scaling equation:
does not allow to modify parametersindependently for L and W. Actually, onlythe product L·W is taken into account.
EE
ENEN
EE
ENEN
EE
ENEN
LW
LWNFCLWNVC
LW
LWNFBLWNFB
LW
LWNFALWNFA
Fitting for smalldevice cannot beimproved in this areawithout the distortionof the other devices.
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Summary
Together with the measurement of flicker noise ( presentedby Falk Korndörfer, IHP), the shown extraction strategy isthe basis of a complete noise modeling method.
The very effective simultaneous extraction of flicker noiseparameters for different devices with different dimensions isthe key improvement of this tool.
The shown methodology for PSP was implemented forcommon MOS models (BSIM3, BSIM4) and can be easilyextended to other models like HiSIM2 etc.
The co-operation between IHP and AdMOS resulted in acommercial available Flicker Noise Modeling Tool. Fordetails, please see:www.admos.de Products Flicker Noise System