front end hybrid industrial tester ucl louvain (l. bonnet, v. lemaître, x. rouby) vincent....
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Front end Hybrid Industrial Tester
UCL Louvain (L. Bonnet, V. Lemaître, X. Rouby)
Vincent Lemaitre tracker week 29.01.03
http://www.fynu.ucl.ac.be/themes/he/cms/activities/tracker/hybrids.html
In collaboration with
RWTH Aachen (M. Axer, F. Beissel, T. Franke, J. Mnich)
IRES Strasbourg (JD. Berst, P. Graehling, P.Juillot, C. Maazouzi)
Current measurements
Comparisons between FHIT & ARC & CMS-like :
I(V250) =f(V250) comparisons between test setups
500
600
700
800
900
1000
2.2 2.3 2.35 2.4 2.45 2.5 2.55 2.6
Voltage [V]I(
V250)
[(m
A]
FHIT
ARC
This problem is solved : FEH needs more current when triggered
FHIT does not send triggers while
measuring current consumption
whereas ARC and CMS-like
system do
Electrical Test: limits
These limits can be resized with a multiplicative parameter, common for all limit values (available in configuration file).
I125 one APV biased Vmin [42 ; 78 ] mA
Vnom [48 ; 84 ] mA
Vmax [52 ; 88 ] mA
I250 one APV biased Vmin [220 ; 320 ] mA
Vnom [300 ; 400 ] mA
Vmax [320 ; 420 ] mA
From statistics on FHIT measurements intervals = [m-3s; m+3s] where m is the mean of distribution and s the RMS
Functional Test: limits
Mux test maximal height 255.0 ADC
(Mux output signal height) minimal height 200.0 ADC
minimal difference 5.0 ADC
Pedestal test number of events 1000
cut window (20 % around the mean) 20.0 ADC
Noise test number of events Same data as pedestal test
cut window (around the mean) 20.0 ADC
minimal noise cut 0.2 ADC
maximal noise cut 1.5 ADC
Gain test minimal threshold 20.0 ADC
These are the ARCS parameter All these limits are accessible in the configuration file
FHITS 1.3
New : version 1.3 (updated interface, as asked by industry)
•Display the # of good and bad hybrids of the current day
•All part-numbers accepted 1663 1674 (new firmware)
Conversion to XML
conversion to XML : direct contact with CERN people to fit to their wishes
C – routine being written in Louvain ; not necessary @ industry
proposed scenario• production and tests @ industry ( logfile creation )• delivery @ CERN of hybrids and logfiles (on CD-R)
1 delivery = # FEH + 1 CD (+ copies)
• tests @ CERN (with FHIT logfile creation)
• creation of XML files (by running the C – routine) @ CERN• transfer to database
Number of FHIT set-ups
Laboratory Presently In Addition With ARC in
CERN 1 mono-FHIT Yes
Industry 1 (CT) 1 dual-FHIT No
Industry 2 (1 dual-FHIT) Yes
Strasbourg 1 mono + 1 dual Yes
Aachen 1 mono-FHIT Yes
Louvain 1 mono + 1 dual
Yes
Spares 2 dual-FHIT Yes/No
TOTAL 5 boxes + 8 PCBs 5 boxes + 8 PCBs 3 add. ARC boards
Test procedure
NAIS
NAIS
ERNI
ERNI
SAMTEC
SAMTEC
FHIT
To be tested
@ Industry
@ CERN
• Industry 1: Naked hybrids (w/o APVs)• Industry 2: Hybrids
• Before bonding pitch adapter LINK to DB (XML)
Test setup
Mechanics
New mechanics : -Easier to handle -Insure thermal contact (“cooling”)-Probe for test of bias return line
Cooling contact
Fine positioning plugs
Hybrid
Heavy cover with auto-retractile probe
Pad on hybrid for test of bias return line
Summary
• Difference between set-ups for Current Measurement is understood
• First estimate of Limits for ET and FT have been evaluate (to be continued) • Most recent release of software distributed (FHITS 1.3)
-improved display-all part number included (firmware)
• Agreed procedure for loading FHIT data into DB (almost operational)
• Proposal for the number of FHIT set up
• Test procedure including thermal contact of hybrid and test of bias return line.