gal16v8 - dynamiga.serveftp.net/datasheets/lattice_16v8_gal.pdf · specifications gal16v8 5 1996...

1

1

10 11

20I/CLK

I

I

I

I

I

I

I

I

GND

Vcc

I/O/Q

I/O/Q

I/O/Q

I/O/Q

I/O/Q

I/O/Q

I/O/Q

I/O/Q

I/OE

5

15

FUNCTIONAL BLOCK DIAGRAMFEATURES

PIN CONFIGURATION

• HIGH PERFORMANCE E2CMOS® TECHNOLOGY— 3.5 ns Maximum Propagation Delay— Fmax = 250 MHz— 3.0 ns Maximum from Clock Input to Data Output— UltraMOS ® Advanced CMOS Technology

• 50% to 75% REDUCTION IN POWER FROM BIPOLAR— 75mA Typ Icc on Low Power Device— 45mA Typ Icc on Quarter Power Device

• ACTIVE PULL-UPS ON ALL PINS

• E2 CELL TECHNOLOGY— Reconfigurable Logic— Reprogrammable Cells— 100% Tested/Guaranteed 100% Yields— High Speed Electrical Erasure (<100ms)— 20 Year Data Retention

• EIGHT OUTPUT LOGIC MACROCELLS— Maximum Flexibility for Complex Logic Designs— Programmable Output Polarity— Also Emulates 20-pin PAL ® Devices with Full

Function/Fuse Map/Parametric Compatibility

• PRELOAD AND POWER-ON RESET OF ALL REGISTERS— 100% Functional Testability

• APPLICATIONS INCLUDE:— DMA Control— State Machine Control— High Speed Graphics Processing— Standard Logic Speed Upgrade

• ELECTRONIC SIGNATURE FOR IDENTIFICATION

DESCRIPTION

The GAL16V8D, at 3.5 ns maximum propagation delay time, com-bines a high performance CMOS process with Electrically Eras-able (E2) floating gate technology to provide the highest speedperformance available in the PLD market. High speed erase times(<100ms) allow the devices to be reprogrammed quickly and ef-ficiently.

The generic architecture provides maximum design flexibility byallowing the Output Logic Macrocell (OLMC) to be configured bythe user. An important subset of the many architecture configu-rations possible with the GAL16V8 are the PAL architectureslisted in the table of the macrocell description section. GAL16V8devices are capable of emulating any of these PAL architectureswith full function/fuse map/parametric compatibility.

Unique test circuitry and reprogrammable cells allow completeAC, DC, and functional testing during manufacture. As a result,Lattice Semiconductor guarantees 100% field programmabilityand functionality of all GAL products. In addition, 100 erase/writecycles and data retention in excess of 20 years are guaranteed.

PLCC

GAL16V8

DIP

GAL16V8

Top View

2 20

I/CLKII

I

I

I

I

I

I GND

Vcc

I/O/Q I/O/Q

I/O/Q

I/O/Q

I/O/Q

I/O/Q

I/O/Q

I/O/Q

I/OE

4

6

89 11 13

14

16

18

I/CLK

I

I/O/Q

I

I/O/Q

I

I/O/Q

I

I/O/Q

I

I/O/Q

I

I/O/Q

I

I/O/Q

I

I/O/Q

CLK

8

8

8

8

8

8

8

8

OE

OLMC

OLMC

OLMC

OLMC

OLMC

OLMC

OLMC

OLMC

PR

OG

RA

MM

AB

LE

A

ND

-AR

RA

Y

(64

X 3

2)

I/OE

GAL16V8High Performance E 2CMOS PLD

Generic Array Logic™

Copyright © 1996 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subjectto change without notice.

LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. 1996 Data BookTel. (503) 681-0118; 1-888-ISP-PLDS; FAX (503) 681-3037; http://www.latticesemi.com

16v8_02

Specifications GAL16V8

1996 Data Book2

GAL16V8 ORDERING INFORMATION

Commercial Grade Specifications

PART NUMBER DESCRIPTION

Blank = Commercial I = Industrial

Grade

PackagePowerL = Low Power Q = Quarter Power

Speed (ns)

XXXXXXXX XX X X X

Device Name

_

P = Plastic DIP J = PLCC

GAL16V8D GAL16V8C GAL16V8B

)sn(dpT )sn(usT )sn(ocT )Am(ccI #gniredrO egakcaP

5.3 5.2 0.3 511 JL3-D8V61LAG CCLPdaeL-02

5 3 4 511 PL5-C8V61LAG PIDcitsalPniP-02

511 8V61LAG 5-C JL CCLPdaeL-02

5.7 7 5 1 51 8V61LAG C PL7- PIDcitsalPniP-02

1 51 8V61LAG C JL7- CCLPdaeL-02

511 PL7-B8V61LAG PIDcitsalPniP-02

511 JL7-B8V61LAG CCLPdaeL-02

01 01 7 511 PL01-B8V61LAG PIDcitsalPniP-02

511 JL01-B8V61LAG CCLPdaeL-02

01 01 5.7 55 PQ01-D8V61LAG PIDcitsalPniP-02

55 JQ01-D8V61LAG CCLPdaeL-02

51 21 01 55 PQ51-D8V61LAG PQ51-B8V61LAGro PIDcitsalPniP-02

55 JQ51-D8V61LAG ro JQ51-B8V61LAG CCLPdaeL-02

09 PL51-D8V61LAG ro PL51-B8V61LAG PIDcitsalPniP-02

09 JL51-D8V61LAG ro JL51-B8V61LAG CCLPdaeL-02

52 51 21 55 PQ52-D8V61LAG ro PQ52-B8V61LAG PIDcitsalPniP-02

55 JQ52-D8V61LAG ro JQ52-B8V61LAG CCLPdaeL-02

09 PL52-D8V61LAG ro PL52-B8V61LAG PIDcitsalPniP-02

09 JL52-D8V61LAG ro JL52-B8V61LAG CCLPdaeL-02

)sn(dpT )sn(usT )sn(ocT )Am(ccI #gniredrO egakcaP

5.7 7 5 031 IPL7-C8V61LAG PIDcitsalPniP-02

031 IJL7-C8V61LAG CCLPdaeL-02

01 01 7 031 IPL01-B8V61LAG PIDcitsalPniP-02

031 IJL01-B8V61LAG CCLPdaeL-02

51 21 01 031 IPL51-D8V61LAG ro IPL51-B8V61LAG PIDcitsalPniP-02

031 IJL51-D8V61LAG ro IJL51-B8V61LAG CCLPdaeL-02

02 31 11 56 IPQ02-D8V61LAG ro IPQ02-B8V61LAG PIDcitsalPniP-02

56 IJQ02-D8V61LAG ro IJQ02-B8V61LAG CCLPdaeL-02

52 51 21 56 IPQ52-D8V61LAG ro IPQ52-B8V61LAG PIDcitsalPniP-02

56 IJQ52-D8V61LAG ro IJQ52-B8V61LAG CCLPdaeL-02

031 IPL52-D8V61LAG ro IPL52-B8V61LAG PIDcitsalPniP-02

031 IJL52-D8V61LAG ro IJL52-B8V61LAG CCLPdaeL-02

Industrial Grade Specifications


1996 Data Book3

OUTPUT LOGIC MACROCELL (OLMC)

The following discussion pertains to configuring the output logicmacrocell. It should be noted that actual implementation is ac-complished by development software/hardware and is completelytransparent to the user.

There are three global OLMC configuration modes possible:simple , complex , and registered . Details of each of thesemodes are illustrated in the following pages. Two global bits, SYNand AC0, control the mode configuration for all macrocells. TheXOR bit of each macrocell controls the polarity of the output in anyof the three modes, while the AC1 bit of each of the macrocellscontrols the input/output configuration. These two global and 16individual architecture bits define all possible configurations in aGAL16V8 . The information given on these architecture bits isonly to give a better understanding of the device. Compiler soft-ware will transparently set these architecture bits from the pindefinitions, so the user should not need to directly manipulatethese architecture bits.

The following is a list of the PAL architectures that the GAL16V8can emulate. It also shows the OLMC mode under which theGAL16V8 emulates the PAL architecture.

PAL Architectures GAL16V8Emulated by GAL16V8 Global OLMC Mode

16R8 Registered16R6 Registered16R4 Registered

16RP8 Registered16RP6 Registered16RP4 Registered

16L8 Complex16H8 Complex16P8 Complex

10L8 Simple12L6 Simple14L4 Simple16L2 Simple10H8 Simple12H6 Simple14H4 Simple16H2 Simple10P8 Simple12P6 Simple14P4 Simple16P2 Simple

COMPILER SUPPORT FOR OLMC

Software compilers support the three different global OLMCmodes as different device types. These device types are listedin the table below. Most compilers have the ability to automati-cally select the device type, generally based on the register usageand output enable (OE) usage. Register usage on the deviceforces the software to choose the registered mode. All combina-torial outputs with OE controlled by the product term will force thesoftware to choose the complex mode. The software will choosethe simple mode only when all outputs are dedicated combinatorialwithout OE control. The different device types listed in the tablecan be used to override the automatic device selection by thesoftware. For further details, refer to the compiler softwaremanuals.

When using compiler software to configure the device, the usermust pay special attention to the following restrictions in eachmode.

In registered mode pin 1 and pin 11 are permanently configuredas clock and output enable, respectively. These pins cannot beconfigured as dedicated inputs in the registered mode.

In complex mode pin 1 and pin 11 become dedicated inputs anduse the feedback paths of pin 19 and pin 12 respectively. Becauseof this feedback path usage, pin 19 and pin 12 do not have thefeedback option in this mode.

In simple mode all feedback paths of the output pins are routedvia the adjacent pins. In doing so, the two inner most pins ( pins15 and 16) will not have the feedback option as these pins arealways configured as dedicated combinatorial output.

Registered Complex Simple Auto Mode Select

ABEL P16V8R P16V8C P16V8AS P16V8CUPL G16V8MS G16V8MA G16V8AS G16V8LOG/iC GAL16V8_R GAL16V8_C7 GAL16V8_C8 GAL16V8OrCAD-PLD "Registered"1 "Complex"1 "Simple"1 GAL16V8APLDesigner P16V8R2 P16V8C2 P16V8C2 P16V8ATANGO-PLD G16V8R G16V8C G16V8AS3 G16V8

1) Used with Configuration keyword.2) Prior to Version 2.0 support.3) Supported on Version 1.20 or later.


1996 Data Book4

REGISTERED MODE

In the Registered mode, macrocells are configured as dedicatedregistered outputs or as I/O functions.

Architecture configurations available in this mode are similar tothe common 16R8 and 16RP4 devices with various permutationsof polarity, I/O and register placement.

All registered macrocells share common clock and output enablecontrol pins. Any macrocell can be configured as registered orI/O. Up to eight registers or up to eight I/O's are possible in this

mode. Dedicated input or output functions can be implementedas subsets of the I/O function.

Registered outputs have eight product terms per output. I/O'shave seven product terms per output.

The JEDEC fuse numbers, including the User Electronic Signature(UES) fuses and the Product Term Disable (PTD) fuses, areshown on the logic diagram on the following page.

Registered Configuration for Registered Mode

- SYN=0.- AC0=1.- XOR=0 defines Active Low Output.- XOR=1 defines Active High Output.- AC1=0 defines this output configuration.- Pin 1 controls common CLK for the registered outputs.- Pin 11 controls common OE for the registered outputs.- Pin 1 & Pin 11 are permanently configured as CLK & OE.

Combinatorial Configuration for Registered Mode

- SYN=0.- AC0=1.- XOR=0 defines Active Low Output.- XOR=1 defines Active High Output.- AC1=1 defines this output configuration.- Pin 1 & Pin 11 are permanently configured as CLK & OE.

Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.

D Q

Q

CLK

OE

XOR

XOR


1996 Data Book5

REGISTERED MODE LOGIC DIAGRAM

DIP & PLCC Package Pinouts

1

2

3

4

5

6

7

8

9

11

12

13

14

15

16

17

18

0000

0224

0256

0480

0512

0736

0768

0992

1024

1248

1280

1504

1536

1760

1792

2016

19

XOR-2048AC1-2120

XOR-2049AC1-2121

XOR-2050AC1-2122

XOR-2051AC1-2123

XOR-2052AC1-2124

XOR-2053AC1-2125

XOR-2054AC1-2126

XOR-2055AC1-2127

2824201612840 PTD2128

2191OE

OLMC

OLMC

OLMC

OLMC

OLMC

OLMC

OLMC

OLMC

SYN-2192AC0-2193


1996 Data Book6

COMPLEX MODEIn the Complex mode, macrocells are configured as output onlyor I/O functions.

Architecture configurations available in this mode are similar tothe common 16L8 and 16P8 devices with programmable polarityin each macrocell.

Up to six I/O's are possible in this mode. Dedicated inputs oroutputs can be implemented as subsets of the I/O function. Thetwo outer most macrocells (pins 12 & 19) do not have input ca-

pability. Designs requiring eight I/O's can be implemented in theRegistered mode.

All macrocells have seven product terms per output. One productterm is used for programmable output enable control. Pins 1 and11 are always available as data inputs into the AND array.

The JEDEC fuse numbers including the UES fuses and PTD fusesare shown on the logic diagram on the following page.


Combinatorial I/O Configuration for Complex Mode

- SYN=1.- AC0=1.- XOR=0 defines Active Low Output.- XOR=1 defines Active High Output.- AC1=1.- Pin 13 through Pin 18 are configured to this function.

Combinatorial Output Configuration for Complex Mode

- SYN=1.- AC0=1.- XOR=0 defines Active Low Output.- XOR=1 defines Active High Output.- AC1=1.- Pin 12 and Pin 19 are configured to this function.

XOR

XOR


1996 Data Book7

COMPLEX MODE LOGIC DIAGRAM


0000

0224

0256

0480

0512

0736

0768

0992

1024

1248

1280

1504

1536

1760

1792

2016

PTD

2128

2191

11

12

13

14

15

16

17

18

19

1

2

3

4

5

6

7

8

9

OLMC

OLMC

OLMC

OLMC

OLMC

OLMC

SYN-2192AC0-2193

XOR-2055 AC1-2127

XOR-2054AC1-2126

XOR-2053AC1-2125

XOR-2052AC1-2124

XOR-2051AC1-2123

XOR-2050AC1-2122

XOR-2049AC1-2121

XOR-2048AC1-2120

OLMC

OLMC

2824201612840


1996 Data Book8

SIMPLE MODEIn the Simple mode, macrocells are configured as dedicated inputsor as dedicated, always active, combinatorial outputs.

Architecture configurations available in this mode are similar tothe common 10L8 and 12P6 devices with many permutations ofgeneric output polarity or input choices.

All outputs in the simple mode have a maximum of eight productterms that can control the logic. In addition, each output has pro-grammable polarity.

Pins 1 and 11 are always available as data inputs into the ANDarray. The center two macrocells (pins 15 & 16) cannot be usedas input or I/O pins, and are only available as dedicated outputs.

The JEDEC fuse numbers including the UES fuses and PTD fusesare shown on the logic diagram.

Combinatorial Output with Feedback Configurationfor Simple Mode

- SYN=1.- AC0=0.- XOR=0 defines Active Low Output.- XOR=1 defines Active High Output.- AC1=0 defines this configuration.- All OLMC except pins 15 & 16 can be configured to this function.

Combinatorial Output Configuration for Simple Mode

- SYN=1.- AC0=0.- XOR=0 defines Active Low Output.- XOR=1 defines Active High Output.- AC1=0 defines this configuration.- Pins 15 & 16 are permanently configured to this function.

Dedicated Input Configuration for Simple Mode

- SYN=1.- AC0=0.- XOR=0 defines Active Low Output.- XOR=1 defines Active High Output.- AC1=1 defines this configuration.- All OLMC except pins 15 & 16 can be configured to this function.


Vcc

XOR

Vcc

XOR


1996 Data Book9

SIMPLE MODE LOGIC DIAGRAM


1

11

12

13

14

15

16

17

18

19

2

3

4

5

6

7

9

0000

0224

0256

0480

0512

0736

0768

0992

1024

1248

1280

1504

1536

1760

1792

2016

PTD

2128

2191

8

XOR-2048AC1-2120

OLMC

XOR-2049 AC1-2121

XOR-2050AC1-2122

XOR-2051AC1-2123

XOR-2052AC1-2124

XOR-2053AC1-2125

XOR-2054AC1-2126

XOR-2055AC1-2127

OLMC

OLMC

OLMC

OLMC

OLMC

OLMC

OLMC

SYN-2192AC0-2193

2824201612840


1996 Data Book10

Specifications GAL16V8D

ABSOLUTE MAXIMUM RATINGS (1) RECOMMENDED OPERATING COND.

Commercial Devices:Ambient Temperature (T

A) ............................... 0 to 75°C

Supply voltage (VCC

) with Respect to Ground ..................... +4.75 to +5.25V

Industrial Devices:Ambient Temperature (T

A) ........................... –40 to 85°C

Supply voltage (VCC


Supply voltage VCC

...................................... –0.5 to +7VInput voltage applied .......................... –2.5 to V

CC +1.0V

Off-state output voltage applied.......... –2.5 to VCC

+1.0VStorage Temperature................................. –65 to 150°CAmbient Temperature with

Power Applied ........................................ –55 to 125°C1.Stresses above those listed under the “Absolute Maximum

Ratings” may cause permanent damage to the device. Theseare stress only ratings and functional operation of the deviceat these or at any other conditions above those indicated in theoperational sections of this specification is not implied (whileprogramming, follow the programming specifications).

VIL Input Low Voltage Vss – 0.5 — 0.8 V

VIH Input High Voltage 2.0 — Vcc+1 V

IIL1 Input or I/O Low Leakage Current 0V ≤ VIN ≤ VIL (MAX.) — — –100 µA

IIH Input or I/O High Leakage Current 3.5V ≤ VIN ≤ VCC — — 10 µA

VOL Output Low Voltage IOL = MAX. Vin = VIL or VIH — — 0.5 V

VOH Output High Voltage IOH = MAX. Vin = VIL or VIH 2.4 — — V

L-3 — — 16 mA

IOL Low Level Output Current L-15/-25 — — 24 mA

Q-10/-15/-20/-25

IOH High Level Output Current — — –3.2 mA

IOS2 Output Short Circuit Current VCC = 5V VOUT = 0.5V TA= 25°C –30 — –150 mA

DC ELECTRICAL CHARACTERISTICSOver Recommended Operating Conditions (Unless Otherwise Specified)

SYMBOL PARAMETER CONDITION MIN. TYP. 3 MAX. UNITS

COMMERCIAL

ICC Operating Power VIL = 0.5V VIH = 3.0V L -3 — 75 115 mA

Supply Current ftoggle = 15MHz Outputs Open L-15/-25 — 75 90 mA

Q-10/-15/-25 — 45 55 mA

INDUSTRIAL

ICC Operating Power VIL = 0.5V VIH = 3.0V L -15/-25 — 75 130 mA

Supply Current ftoggle = 15MHz Outputs Open Q -20/-25 — 45 65 mA

1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information.2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by testerground degradation. Guaranteed but not 100% tested.3) Typical values are at Vcc = 5V and TA = 25 °C


1996 Data Book11

tpd A Input or I/O to Comb. Output 1 3.5 3 10 3 15 3 20 3 25 ns

tco A Clock to Output Delay 1 3 2 7.5 2 10 2 11 2 12 ns

tcf2 — Clock to Feedback Delay — 2.5 — 6 — 8 — 9 — 10 ns

tsu — Setup Time, Input or Fdbk before Clk↑ 2.5 — 10 — 12 — 13 — 15 — ns

th — Hold Time, Input or Fdbk after Clk↑ 0 — 0 — 0 — 0 — 0 — ns

A Maximum Clock Frequency with 182 — 57.1 — 45.5 — 41.6 — 37 — MHzExternal Feedback, 1/(tsu + tco)

fmax3 A Maximum Clock Frequency with 200 — 62.5 — 50 — 45.4 — 40 — MHzInternal Feedback, 1/(tsu + tcf)

A Maximum Clock Frequency with 250 — 62.5 — 62.5 — 50 — 41.6 — MHzNo Feedback

twh — Clock Pulse Duration, High 2 — 8 — 8 — 10 — 12 — ns

twl — Clock Pulse Duration, Low 2 — 8 — 8 — 10 — 12 — ns

ten B Input or I/O to Output Enabled — 4.5 3 10 — 15 — 18 — 20 ns

t B OE to Output Enabled — 4.5 2 10 — 15 — 18 — 20 ns

tdis C Input or I/O to Output Disabled — 4.5 2 10 — 15 — 18 — 20 ns

t C OE to Output Disabled — 4.5 1 10 — 15 — 18 — 20 ns

Specifications GAL16V8D

AC SWITCHING CHARACTERISTICSOver Recommended Operating Conditions

UNITS-25

MIN. MAX.

-20

MIN. MAX.

-15

MIN. MAX.

-10

MIN. MAX.PARAM. DESCRIPTIONTEST

COND1.

-3

MIN. MAX.

COM COM COM / IND IND COM / IND

CAPACITANCE (T A = 25°C, f = 1.0 MHz)

SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS

CI Input Capacitance 8 pF VCC = 5.0V, VI = 2.0V

CI/O I/O Capacitance 8 pF VCC = 5.0V, VI/O = 2.0V

*Guaranteed but not 100% tested.


1996 Data Book12

Specifications GAL16V8C







IOL Low Level Output Current — — 16 mA





A) ............................... 0 to 75°C

Supply voltage (VCC


Supply voltage VCC


CC +1.0V







COMMERCIAL


Supply Current ftoggle = 15MHz Outputs Open

INDUSTRIAL

ICC Operating Power VIL = 0.5V VIH = 3.0V L -7 — 75 130 mA

Supply Current ftoggle = 15MHz Outputs Open


Industrial Devices:Ambient Temperature (TA) ........................... –40 to 85°CSupply voltage (VCC) with Respect to Ground ..................... +4.50 to +5.50V


1996 Data Book13

Specifications GAL16V8C


-7

MIN. MAX.

-7

MIN. MAX.

tpd A Input or I/O to 8 outputs switching 1 5 3 7.5 1 7.5 ns

Comb. Output 1 output switching — — — 7 — — ns

tco A Clock to Output Delay 1 4 2 5 1 5 ns

tcf2 — Clock to Feedback Delay — 3 — 3 — 3 ns

tsu — Setup Time, Input or Feedback before Clock↑ 3 — 7 — 7 — ns

th — Hold Time, Input or Feedback after Clock↑ 0 — 0 — 0 — ns

A Maximum Clock Frequency with 142.8 — 83.3 — 83.3 — MHzExternal Feedback, 1/(tsu + tco)

A Maximum Clock Frequency with 166 — 100 — 100 — MHzInternal Feedback, 1/(tsu + tcf)

A Maximum Clock Frequency with 166 — 100 — 100 — MHzNo Feedback

twh — Clock Pulse Duration, High 3 — 5 — 5 — ns

twl — Clock Pulse Duration, Low 3 — 5 — 5 — ns

ten B Input or I/O to Output Enabled 1 6 3 9 1 9 ns

B OE to Output Enabled 1 6 2 6 1 6 ns

tdis C Input or I/O to Output Disabled 1 5 2 9 1 9 ns

C OE to Output Disabled 1 5 1.5 6 1 6 ns

UNITSPARAMETERTEST

COND1.DESCRIPTION

INDCOMCOM

-5

MIN. MAX.

1) Refer to Switching Test Conditions section.2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.3) Refer to fmax Descriptions section. Characterized initially and after any design or process changes that may affect these

parameters.






fmax3


1996 Data Book14

Specifications GAL16V8B

INDUSTRIAL

ICC Operating Power VIL = 0.5V VIH = 3.0V L -10/-15/-25 — 75 130 mA

Supply Current ftoggle = 15MHz Outputs Open Q -20/-25 — 45 65 mA

COMMERCIAL


Supply Current ftoggle = 15MHz Outputs Open L -15/-25 — 75 90 mA

Q -15/-25 — 45 55 mA



A) ............................... 0 to 75°C

Supply voltage (VCC


Supply voltage VCC


CC +1.0V





Industrial Devices:Ambient Temperature (T

A) ........................... –40 to 85°C

Supply voltage (VCC










IOL Low Level Output Current — — 24 mA





1996 Data Book15

Specifications GAL16V8B


tpd A Input or I/O to 8 outputs switching 3 7.5 3 10 3 15 3 20 3 25 ns

Comb. Output 1 output switching — 7 — — — — — — — — ns

tco A Clock to Output Delay 2 5 2 7 2 10 2 11 2 12 ns

tcf2 — Clock to Feedback Delay — 3 — 6 — 8 — 9 — 10 ns

tsu — Setup Time, Input or Fdbk before Clk↑ 7 — 10 — 12 — 13 — 15 — ns

th — Hold Time, Input or Fdbk after Clk↑ 0 — 0 — 0 — 0 — 0 — ns

A Maximum Clock Frequency with 83.3 — 58.8 — 45.5 — 41.6 — 37 — MHzExternal Feedback, 1/(tsu + tco)

fmax3 A Maximum Clock Frequency with 100 — 62.5 — 50 — 45.4 — 40 — MHzInternal Feedback, 1/(tsu + tcf)

A Maximum Clock Frequency with 100 — 62.5 — 62.5 — 50 — 41.6 — MHzNo Feedback

twh — Clock Pulse Duration, High 5 — 8 — 8 — 10 — 12 — ns

twl — Clock Pulse Duration, Low 5 — 8 — 8 — 10 — 12 — ns

ten B Input or I/O to Output Enabled 3 9 3 10 — 15 — 20 — 25 ns

B OE to Output Enabled 2 6 2 10 — 15 — 18 — 20 ns

tdis C Input or I/O to Output Disabled 2 9 2 10 — 15 — 20 — 25 ns

C OE to Output Disabled 1.5 6 1.5 10 — 15 — 18 — 20 ns

UNITS

1) Refer to Switching Test Conditions section.2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.3) Refer to fmax Descriptions section.

-25

MIN. MAX.

-20

MIN. MAX.

-15

MIN. MAX.

-10

MIN. MAX.PARAM. DESCRIPTIONTEST

COND1.

-7

MIN. MAX.






COM COM / IND COM / IND IND COM / IND


1996 Data Book16

SWITCHING WAVEFORMS

Registered OutputCombinatorial Output

OEOEOEOEOE to Output Enable/DisableInput or I/O to Output Enable/Disable

fmax with Feedback

Clock Width

COMBINATIONALOUTPUT

VALID INPUTINPUT orI/O FEEDBACK

tpd

COMBINATIONALOUTPUT

INPUT orI/O FEEDBACK

tentdis

CLK

(w/o fb)1/fmax

twltwh

INPUT orI/O FEEDBACK

REGISTEREDOUTPUT

CLK

VALID INPUT

(external fdbk)

tsu

tco

th

1/fmax

OE

REGISTEREDOUTPUT

tentdis

CLK

REGISTEREDFEEDBACK

tcf tsu

1/fmax (internal fdbk)


1996 Data Book17

fmax DESCRIPTIONS

fmax with Internal Feedback 1/( tsu+tcf)

Note: tcf is a calculated value, derived by subtracting tsu fromthe period of fmax w/internal feedback (tcf = 1/fmax - tsu). Thevalue of tcf is used primarily when calculating the delay fromclocking a register to a combinatorial output (through registeredfeedback), as shown above. For example, the timing from clockto a combinatorial output is equal to tcf + tpd.

fmax with External Feedback 1/( tsu+ tco)

Note: fmax with external feedback is calculated from measuredtsu and tco.

fmax with No Feedback

Note: fmax with no feedback may be less than 1/(twh + twl). Thisis to allow for a clock duty cycle of other than 50%.

SWITCHING TEST CONDITIONS

REGISTERLOGICARRAY

CLK

tsu + th

REGISTERLOGICARRAY

tcotsu

CLK

Test Condition R 1 R2 CL

A 200Ω 390Ω 50pFB Active High ∞ 390Ω 50pF

Active Low 200Ω 390Ω 50pFC Active High ∞ 390Ω 5pF

Active Low 200Ω 390Ω 5pF

CLK

REGISTER

LOGIC ARRAY

tcf

tpd

TEST POINT

C *L

FROM OUTPUT (O/Q) UNDER TEST

+5V

*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE

R 2

R 1

Input Pulse Levels

Table 2-0003/16V8

Input Rise and Fall Times

Input Timing Reference Levels

Ouput Timing Reference Levels

Output Load

GND to 3.0V

1.5V

1.5V

See figure at right3-state levels are measured 0.5V from steady-state active level.

2 – 3ns 10% – 90%

1.5ns 10% – 90%

GAL16V8B and GAL16V8D-10 (and slower) GAL16V8C and GAL16V8D-3

GAL16V8B and GAL16V8D-10/-15/-20/-25 Output LoadConditions (see figure above) GAL16V8C Output Load Conditions (see figure above)

Test Condition R 1 R2 CL

A 200Ω 200Ω 50pFB Active High ∞ 200Ω 50pF

Active Low 200Ω 200Ω 50pFC Active High ∞ 200Ω 5pF

Active Low 200Ω 200Ω 5pF


1996 Data Book18

SWITCHING TEST CONDITIONS, CONTINUED

*CL includes test fixture and probe capacitance.

ELECTRONIC SIGNATURE

An electronic signature is provided in every GAL16V8 device. Itcontains 64 bits of reprogrammable memory that can contain userdefined data. Some uses include user ID codes, revision num-bers, or inventory control. The signature data is always availableto the user independent of the state of the security cell.

NOTE: The electronic signature is included in checksum calcu-lations. Changing the electronic signature will alter the checksum.

SECURITY CELL

A security cell is provided in the GAL16V8 devices to prevent un-authorized copying of the array patterns. Once programmed, thiscell prevents further read access to the functional bits in the de-vice. This cell can only be erased by re-programming the device,so the original configuration can never be examined once this cellis programmed. The Electronic Signature is always available tothe user, regardless of the state of this control cell.

LATCH-UP PROTECTION

GAL16V8 devices are designed with an on-board charge pumpto negatively bias the substrate. The negative bias minimizes thepotential of latch-up caused by negative input undershoots.Additionally, outputs are designed with n-channel pull-ups insteadof the traditional p-channel pull-ups in order to eliminate latch-updue to output overshoots.

DEVICE PROGRAMMING

GAL devices are programmed using a Lattice Semiconductor-approved Logic Programmer, available from a number of manu-facturers. Complete programming of the device takes only a fewseconds. Erasing of the device is transparent to the user, and isdone automatically as part of the programming cycle.

OUTPUT REGISTER PRELOAD

When testing state machine designs, all possible states and statetransitions must be verified in the design, not just those requiredin the normal machine operations. This is because, in systemoperation, certain events occur that may throw the logic into anillegal state (power-up, line voltage glitches, brown-outs, etc.). Totest a design for proper treatment of these conditions, a way mustbe provided to break the feedback paths, and force any desired(i.e., illegal) state into the registers. Then the machine can besequenced and the outputs tested for correct next state conditions.

GAL16V8 devices include circuitry that allows each registeredoutput to be synchronously set either high or low. Thus, anypresent state condition can be forced for test sequencing. Ifnecessary, approved GAL programmers capable of executing textvectors perform output register preload automatically.

INPUT BUFFERS

GAL16V8 devices are designed with TTL level compatible inputbuffers. These buffers have a characteristically high impedance,and present a much lighter load to the driving logic than bipolarTTL devices.

The GAL16V8 input and I/O pins have built-in active pull-ups. Asa result, unused inputs and I/O's will float to a TTL "high" (logi-cal "1"). Lattice Semiconductor recommends that all unusedinputs and tri-stated I/O pins be connected to another active input,VCC, or Ground. Doing this will tend to improve noise immunityand reduce ICC for the device.

Typical Input Pull-up Characteristic

1 . 0 2 . 0 3 . 0 4 . 0 5 . 0- 6 0

0

- 2 0

- 4 0

0

In p u t Vo ltag e (V o lt s)

Inp

ut

Cu

rre

nt

(uA

)

TEST POINT

Z0 = 50Ω, CL = 35pF*FROM OUTPUT (O/Q)UNDER TEST

+1.45V

R1

GAL16V8D-3 Output Load Conditions (see figure at right)

Test Condition R 1 CL

A 50Ω 35pFB High Z to Active High at 1.9V 50Ω 35pF

High Z to Active Low at 1.0V 50Ω 35pFC Active High to High Z at 1.9V 50Ω 35pF

Active Low to High Z at 1.0V 50Ω 35pF


1996 Data Book19

Typ. Vref = 3.2V

Typical Output

Typ. Vref = 3.2V

Typical Input

INPUT/OUTPUT EQUIVALENT SCHEMATICS

POWER-UP RESET

Circuitry within the GAL16V8 provides a reset signal to all reg-isters during power-up. All internal registers will have their Qoutputs set low after a specified time (tpr, 1µs MAX). As a result,the state on the registered output pins (if they are enabled) willalways be high on power-up, regardless of the programmedpolarity of the output pins. This feature can greatly simplify statemachine design by providing a known state on power-up. Be-cause of the asynchronous nature of system power-up, some

Vcc

PIN

Vcc Vref

Active Pull-up Circuit

ESD ProtectionCircuit

ESD ProtectionCircuit

Vcc

PIN

Vcc

PIN

VrefTri-StateControl

Active Pull-up Circuit

Feedback(To Input Buffer)

PIN

Feedback

Data Output

Vcc

CLK

INTERNAL REGISTER Q - OUTPUT

FEEDBACK/EXTERNAL OUTPUT REGISTER

Vcc (min.)

tpr

Internal RegisterReset to Logic "0"

Device PinReset to Logic "1"

twl

tsu

conditions must be met to guarantee a valid power-up reset of thedevice. First, the VCC rise must be monotonic. Second, the clockinput must be at static TTL level as shown in the diagram duringpower up. The registers will reset within a maximum of tpr time.As in normal system operation, avoid clocking the device until allinput and feedback path setup times have been met. The clockmust also meet the minimum pulse width requirements.


1996 Data Book20

GAL 16V8D-3: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS

Normalized Tpd vs Vcc

0.8

0.9

1

1.2

4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Nor

mal

ized

Tpd

Normalized Tco vs Vcc

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Nor

mal

ized

Tco

Normalized Tsu vs Vcc

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Nor

mal

ized

Tsu

Normalized Tpd vs Temp

0.7

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125

Temperature (deg. C)

Nor

mal

ized

Tpd

Normalized Tco vs Temp

0.7

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125


Nor

mal

ized

Tco

Normalized Tsu vs Temp

0.7

0.9

1

1.1

-55 -25 0 25 50 75 100 125

Temperature (deg. C)N

orm

aliz

ed T

su

PT H->LPT L->H

PT H->LPT L->H1.1

PTH->LPT L->H

1.3

1.2

0.8

RISEFALL

PT H->LPT L->H

RISEFALL

Delta Tpd vs # of OutputsSwitching

-0.4

-0.3

-0.2

-0.1

0

1 2 3 4 5 6 7 8

Number of Outputs Switching

Del

ta T

pd (

ns)

Delta Tco vs # of OutputsSwitching

-0.4

-0.3

-0.2

-0.1

0

1 2 3 4 5 6 7 8


Del

ta T

co (

ns)

Delta Tpd vs Output Loading

-2

10

12

14

0 50 100 150 200 250 300

Output Loading (pF)

Del

ta T

pd (

ns)

Delta Tco vs Output Loading

-2

0

14

12

10

8

6

4

2

0 50 100 150 200 250 300

Output Loading (pF)

Del

ta T

co (

ns)

RISEFALL

RISEFALL

RISEFALL

RISEFALL

8

6

4

2

0


1996 Data Book21

GAL 16V8D-3: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS

Vol vs Iol

0

0.25

0.5

0.75

1

0 10 20 30 40

Iol (mA)

Vol

(V

)

Voh vs Ioh

0

1

2

3

4

5

0 10 20 30 40 50

Ioh (mA)

Voh

(V

)

Voh vs Ioh

2.5

2.75

3

3.25

0 1 2 3 4

Ioh (mA)

Voh

(V

)

Normalized Icc vs Vcc

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Nor

mal

ized

Icc

Normalized Icc vs Temp

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125


Nor

mal

ized

Icc

Normalized Icc vs Freq.

0.9

0.95

1

1.05

1.1

1.15

1.2

0 25 50 75 100

Frequency (MHz)

Nor

mal

ized

Icc

Delta Icc vs Vin (1 input)

0

2

4

6

8

10

0 0.5 1 1.5 2 2.5 3 3.5 4

Vin (V)

Del

ta Ic

c (m

A)

Input Clamp (Vik)

0

10

20

30

40

50

60

70

80

90-2 -1.5 -1 -0.5 0

Vik (V)

Iik (

mA

)


1996 Data Book22

GAL 16V8D-10 (and Slower): TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS


0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Nor

mal

ized

Tpd PT H->L

PT L->H


0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)N

orm

aliz

ed T

co

RISEFALL


0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Nor

mal

ized

Tsu PT H->L

PT L->H


0.7

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125


Nor

mal

ized

Tpd

PT H->LPT L->H


0.7

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125


Nor

mal

ized

Tco

RISEFALL


0.7

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125


orm

aliz

ed T

su

PT H->LPT L->H

Delta Tpd vs # of Outputs Switching

-1.2

-1

-0.8

-0.6

-0.4

-0.2

0

1 2 3 4 5 6 7 8


Del

ta T

pd (

ns)

RISEFALL

Delta Tco vs # of Outputs Switching

-1.2

-1

-0.8

-0.6

-0.4

-0.2

0

1 2 3 4 5 6 7 8


Del

ta T

co (

ns)

RISEFALL


-6

-4

-2

0

2

4

6

8

10

12

0 50 100 150 200 250 300

Output Loading (pF)

Del

ta T

pd (

ns) RISE

FALL


-4

-2

0

2

4

6

8

10

12

0 50 100 150 200 250 300

Output Loading (pF)

Del

ta T

co (

ns) RISE

FALL


1996 Data Book23

GAL 16V8D-10 (and Slower): TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS

Vol vs Iol

0

0.2

0.4

0.6

0 10 20 30 40

Iol (mA)

Vol

(V

)

Voh vs Ioh

0

1

2

3

4

5

0 10 20 30 40 50

Ioh (mA)V

oh (

V)

Voh vs Ioh

3

3.2

3.4

3.6

3.8

4

0 1 2 3 4

Ioh (mA)

Voh

(V

)


0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

Supply Voltage (V)

Nor

mal

ized

Icc


0.7

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125


Nor

mal

ized

Icc


0.8

0.9

1

1.1

1.2

1.3

1.4

0 25 50 75 100

Frequency (MHz)N

orm

aliz

ed Ic

c


0

2

4

6

8

0 0.5 1 1.5 2 2.5 3 3.5 4

Vin (V)

Del

ta Ic

c (m

A)

Input Clamp (Vik)

0

10

20

30

40

50

60-2 -1.5 -1 -0.5 0

Vik (V)

Iik (

mA

)


1996 Data Book24



Del

ta T

pd (

ns)

-1

-0.75

-0.5

-0.25

0

1 2 3 4 5 6 7 8

RISE

FALL



Del

ta T

co (

ns)

-1

-0.75

-0.5

-0.25

0

1 2 3 4 5 6 7 8

RISE

FALL


Output Loading (pF)

Del

ta T

pd (

ns)

-2

0

2

4

6

8

0 50 100 150 200 250 300

RISE

FALL


Output Loading (pF)

Del

ta T

co (

ns)

-2

0

2

4

6

8

0 50 100 150 200 250 300

RISE

FALL


Supply Voltage (V)

Nor

mal

ized

Tpd

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

PT H->L

PT L->H


Supply Voltage (V)N

orm

aliz

ed T

co

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

RISE

FALL


Supply Voltage (V)

Nor

mal

ized

Tsu

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

PT H->L

PT L->H



Nor

mal

ized

Tpd

0.7

0.8

0.9

1

1.1

1.2

1.3

-55

-25 0

25

50

75

10

0

12

5

PT H->L

PT L->H



Nor

mal

ized

Tco

0.7

0.8

0.9

1

1.1

1.2

1.3

-55

-25 0

25

50

75

10

0

12

5

RISE

FALL



orm

aliz

ed T

su

0.7

0.8

0.9

1

1.1

1.2

1.3

1.4

-55

-25 0

25

50

75

10

0

12

5

PT H->L

PT L->H

GAL 16V8C-5/-7: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS


1996 Data Book25

GAL 16V8C-5/-7: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS

Vol vs Iol

Iol (mA)

Vol

(V

)

0

0.5

1

1.5

2

0.00 20.00 40.00 60.00 80.00

Voh vs Ioh

Ioh(mA)

Voh

(V

)0

1

2

3

4

5

0.00 10.00 20.00 30.00 40.00 50.00

Voh vs Ioh

Ioh(mA)

Voh

(V

)

3.25

3.5

3.75

4

4.25

0.00 1.00 2.00 3.00 4.00


Supply Voltage (V)

Nor

mal

ized

Icc

0.80

0.90

1.00

1.10

1.20

4.50 4.75 5.00 5.25 5.50



Nor

mal

ized

Icc

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125


Frequency (MHz)N

orm

aliz

ed I

cc

0.80

0.90

1.00

1.10

1.20

1.30

1.40

1.50

0 25 50 75 100


Vin (V)

Del

ta I

cc (

mA

)

0

2

4

6

8

10

0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00

Input Clamp (Vik)

Vik (V)

Iik (

mA

)

0

5

10

15

20

25

30

35

40

45

-2.00 -1.50 -1.00 -0.50 0.00


1996 Data Book26

GAL 16V8B-7/-10: TYPICAL AC AND DC CHARACTERISTIC DIAGRAMS


Supply Voltage (V)

Nor

mal

ized

Tpd

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

PT H->L

PT L->H


Supply Voltage (V)N

orm

aliz

ed T

co0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

RISE

FALL


Supply Voltage (V)

Nor

mal

ized

Tsu

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

PT H->L

PT L->H



Nor

mal

ized

Tpd

0.7

0.8

0.9

1

1.1

1.2

1.3

-55

-25 0

25

50

75

10

0

12

5

PT H->L

PT L->H



Nor

mal

ized

Tco

0.7

0.8

0.9

1

1.1

1.2

1.3

-55

-25 0

25

50

75

10

0

12

5

RISE

FALL



orm

aliz

ed T

su

0.7

0.8

0.9

1

1.1

1.2

1.3

1.4

-55

-25 0

25

50

75

10

0

12

5

PT H->L

PT L->H



Del

ta T

pd (

ns)

-2

-1.5

-1

-0.5

0

1 2 3 4 5 6 7 8

RISE

FALL



Del

ta T

co (

ns)

-2

-1.5

-1

-0.5

0

1 2 3 4 5 6 7 8

RISE

FALL


Output Loading (pF)

Del

ta T

pd (

ns)

-2

0

2

4

6

8

10

0 50 100 150 200 250 300

RISE

FALL


Output Loading (pF)

Del

ta T

co (

ns)

-2

0

2

4

6

8

10

0 50 100 150 200 250 300

RISE

FALL


1996 Data Book27


Vol vs Iol

Iol (mA)

Vol

(V

)

0

0.25

0.5

0.75

1

0.00 20.00 40.00 60.00 80.00 100.00

Voh vs Ioh

Ioh(mA)

Voh

(V

)0

1

2

3

4

5

0.00 10.00 20.00 30.00 40.00 50.00 60.00

Voh vs Ioh

Ioh(mA)

Voh

(V

)

3.5

3.75

4

4.25

4.5

0.00 1.00 2.00 3.00 4.00


Supply Voltage (V)

Nor

mal

ized

Icc

0.80

0.90

1.00

1.10

1.20

4.50 4.75 5.00 5.25 5.50



Nor

mal

ized

Icc

0.8

0.9

1

1.1

1.2

-55 -25 0 25 50 75 100 125


Frequency (MHz)N

orm

aliz

ed I

cc

0.80

0.90

1.00

1.10

1.20

1.30

0 25 50 75 100


Vin (V)

Del

ta I

cc (

mA

)

0

2

4

6

8

10

0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00

Input Clamp (Vik)

Vik (V)

Iik (

mA

)

0

10

20

30

40

50

60

70

80

90

100

-2.00 -1.50 -1.00 -0.50 0.00


1996 Data Book28



Supply Voltage (V)

Nor

mal

ized

Tpd

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

PT H->L

PT L->H


Supply Voltage (V)N

orm

aliz

ed T

co

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

RISE

FALL


Supply Voltage (V)

Nor

mal

ized

Tsu

0.8

0.9

1

1.1

1.2

4.50 4.75 5.00 5.25 5.50

PT H->L

PT L->H



Nor

mal

ized

Tpd

0.7

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125

PT H->L

PT L->H



Nor

mal

ized

Tco

0.7

0.8

0.9

1

1.1

1.2

1.3

-55 -25 0 25 50 75 100 125

RISE

FALL



Nor

mal

ized

Tsu

0.7

0.8

0.9

1

1.1

1.2

1.3

1.4

-55 -25 0 25 50 75 100 125

PT H->L

PT L->H



Del

ta T

pd (

ns)

-2

-1.5

-1

-0.5

0

1 2 3 4 5 6 7 8

RISE

FALL



Del

ta T

co (

ns)

-2

-1.5

-1

-0.5

0

1 2 3 4 5 6 7 8

RISE

FALL


Output Loading (pF)

Del

ta T

pd (

ns)

-2

0

2

4

6

8

10

12

0 50 100 150 200 250 300

RISE

FALL


Output Loading (pF)

Del

ta T

co (

ns)

-2

0

2

4

6

8

10

12

0 50 100 150 200 250 300

RISE

FALL


1996 Data Book29


Vol vs Iol

Iol (mA)

Vol

(V

)

0

0.5

1

1.5

2

0.00 20.00 40.00 60.00 80.00 100.00

Voh vs Ioh

Ioh(mA)

Voh

(V

)0

1

2

3

4

5

0.00 10.00 20.00 30.00 40.00 50.00 60.00

Voh vs Ioh

Ioh(mA)

Voh

(V

)

3.25

3.5

3.75

4

4.25

0.00 1.00 2.00 3.00 4.00


Supply Voltage (V)

Nor

mal

ized

Icc

0.80

0.90

1.00

1.10

1.20

4.50 4.75 5.00 5.25 5.50



Nor

mal

ized

Icc

0.8

0.9

1

1.1

1.2

-55 -25 0 25 50 75 100 125


Frequency (MHz)N

orm

aliz

ed I

cc

0.80

0.90

1.00

1.10

1.20

1.30

1.40

0 25 50 75 100


Vin (V)

Del

ta I

cc (

mA

)

0

2

4

6

8

10

12

0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00

Input Clamp (Vik)

Vik (V)

Iik (

mA

)

0

10

20

30

40

50

60

70

80

90

100

-2.00 -1.50 -1.00 -0.50 0.00

Copyright © 1996 Lattice Semiconductor Corporation.

E2CMOS, GAL, ispGAL, ispLSI, pLSI, pDS, Silicon Forest, UltraMOS, Lattice Logo, L with Lattice Semiconductor Corp. and L(Stylized) are registered trademarks of Lattice Semiconductor Corporation (LSC). The LSC Logo, Generic Array Logic, In-System Programmability, In-System Programmable, ISP, ispATE, ispCODE, ispDOWNLOAD, ispGDS, ispStarter,ispSTREAM, ispTEST, ispTURBO, Latch-Lock, pDS+, RFT, Total ISP and Twin GLB are trademarks of Lattice SemiconductorCorporation. ISP is a service mark of Lattice Semiconductor Corporation. All brand names or product names mentioned aretrademarks or registered trademarks of their respective holders.

Lattice Semiconductor Corporation (LSC) products are made under one or more of the following U.S. and internationalpatents: 4,761,768 US, 4,766,569 US, 4,833,646 US, 4,852,044 US, 4,855,954 US, 4,879,688 US, 4,887,239 US, 4,896,296US, 5,130,574 US, 5,138,198 US, 5,162,679 US, 5,191,243 US, 5,204,556 US, 5,231,315 US, 5,231,316 US, 5,237,218 US,5,245,226 US, 5,251,169 US, 5,272,666 US, 5,281,906 US, 5,295,095 US, 5,329,179 US, 5,331,590 US, 5,336,951 US,5,353,246 US, 5,357,156 US, 5,359,573 US, 5,394,033 US, 5,394,037 US, 5,404,055 US, 5,418,390 US, 5,493,205 US,0194091 EP, 0196771B1 EP, 0267271 EP, 0196771 UK, 0194091 GB, 0196771 WG, P3686070.0-08 WG. LSC does notrepresent that products described herein are free from patent infringement or from any third-party right.

The specifications and information herein are subject to change without notice. Lattice Semiconductor Corporation (LSC)reserves the right to discontinue any product or service without notice and assumes no obligation to correct any errorscontained herein or to advise any user of this document of any correction if such be made. LSC recommends its customersobtain the latest version of the relevant information to establish, before ordering, that the information being relied upon iscurrent.

LSC warrants performance of its products to current and applicable specifications in accordance with LSC’s standardwarranty. Testing and other quality control procedures are performed to the extent LSC deems necessary. Specific testing ofall parameters of each product is not necessarily performed, unless mandated by government requirements.

LSC assumes no liability for applications assistance, customer’s product design, software performance, or infringements ofpatents or services arising from the use of the products and services described herein.

LSC products are not authorized for use in life-support applications, devices or systems. Inclusion of LSC products in suchapplications is prohibited.

LATTICE SEMICONDUCTOR CORPORATION5555 Northeast Moore CourtHillsboro, Oregon 97124 U.S.A.Tel.: (503) 681-0118FAX: (503) 681-3037http://www.latticesemi.com November 1996

gal16v8 - dynamiga.serveftp.net/datasheets/lattice_16v8_gal.pdf · specifications gal16v8 5 1996...

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