hanwha techwin europe - emc test report for ce...kes-p-5101-14 rev. 2 kes a4 report revision history...

KES Co., Ltd. C-3701, Simin-daero 365-40,

Dongan-gu, Anyang-si, Gyeonggi-do, 14057, Korea Tel: +82-31-425-6200 / Fax: +82-31-424-0450

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Test report No.: KES-E2-16T0011 Page (1) of (60)

This report shall not be reproduced except in full, without the written approval of KES Co., Ltd. The results shown in this test report refer only to the sample(s) tested unless otherwise stated.

KES-P-5101-14 Rev. 2 KES A4

EMC TEST REPORT For CE Test Report No. : KES-E2-16T0011 Date of Issue : Mar. 03. 2016 Product name : SMART HOME CAMERA Model/Type No. : SNH-V6410PN Variant Model : - Applicant : Hanwha Techwin Co., Ltd. Applicant Address : 1204, Changwon-daero, Seongsan-gu, Changwon-si,

Gyeongsangnam-do, korea

Manufacturer : Tianjin Samsung Techwin Opto-Electronic Co., Ltd. Manufacturer Address : No.11 Weiliu Rd,Micro-Electronic Industrial Park, TEDA, Tianjin,

300385, People's Republic of China Date of Receipt : Jan. 18. 2016 Test date : Jan. 27. 2016 ~ Jan. 28. 2016 Test Results : In Compliance Not in Compliance Tested by Reviewed by

Young Jun, Jo EMC Test Engineer

Dong-Hun, Jang EMC Technical Manager



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REPORT REVISION HISTORY

Date Test Report No. Revision History Mar. 03, 2016 KES-E2-16T0011 Issued

This report shall not be reproduced except in full, without the written approval of KES Co., Ltd. This document may be altered or revised by KES Co., Ltd. personnel only, and shall be noted in the revision section of the document. Any alteration of this document not carried out by KES Co., Ltd. will constitute fraud and shall nullify the document.



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TABLE OF CONTENTS 1.0 General Product Description ................................................................................... 4 1.1 Test Voltage & Frequency ....................................................................................... 5 1.2 Variant Model Differences ....................................................................................... 5 1.3 Device Modifications .............................................................................................. 5 1.4 Equipment Under Test............................................................................................ 5 1.5 Support Equipments .............................................................................................. 5 1.6 External I/O Cabling .............................................................................................. 6 1.7 E.U.T Operating Mode(s) ........................................................................................ 6 1.8 Configuration ........................................................................................................ 7 1.9 Calibration Details of Equipment Used for Measurement ............................................. 8 1.10 Test Facility .......................................................................................................... 8 1.11 Laboratory Accreditations and Listings ..................................................................... 8 2.0 Test Regulations .................................................................................................... 9 2.1 Conducted Emissions at Mains Power Ports ............................................................. 11 2.2 Conducted Emissions at Telecommunication Ports ................................................... 12 2.3 Radiated Electric Field Emissions(Below 1 ㎓) ......................................................... 13 2.4 Radiated Electric Field Emissions(Above 1 ㎓) ......................................................... 14 2.5 Harmonic Current Emissions ................................................................................. 15 2.6 Voltage Fluctuations and Flicker ............................................................................ 16 3.0 Criteria for compliance ......................................................................................... 17 3.1 Electrostatic Discharge......................................................................................... 19 3.2 Radiated Electric Field Immunity ........................................................................... 22 3.3 Electrical Fast Transients/Bursts ............................................................................ 24 3.4 Surge Transients ................................................................................................. 26 3.5 Conducted Disturbance ........................................................................................ 28 3.6 Power Frequency Magnetic Field Immunity ............................................................. 30 3.7 Voltage Dips and Short Interruptions ..................................................................... 32 APPENDIX A – TEST DATA............................................................................................. 34

Conducted Emissions at Mains Power Ports ................................................................ 34 Conducted Emissions at Telecommunication Ports ...................................................... 36 Radiated Electric Field Emissions(Below 1 ㎓) ............................................................ 38

Radiated Electric Field Emissions(Above 1 ㎓) ............................................................ 39 Harmonic Current Emissions and Voltage Fluctuations and Flicker ................................ 43 EUT Internal View – Main Board ............................................................................... 56 EUT Internal View – Sub Board 1 ............................................................................. 57 EUT Internal View – Sub Board 2 ............................................................................. 58 EUT Internal View – Camera Lens ............................................................................ 59



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1.0 General Product Description Main Specifications of E.U.T are:

Main Power AC 230 V / 50 ㎐

I / O Micro SD Card Slot

Frequency 2.4 ㎓

Dimension (85 x 85 x 80) ㎜



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1.1 Test Voltage & Frequency

Unless indicated otherwise on the individual data sheet or test results, the test voltage and frequency was as indicated below.

Voltage 220 Vac 230 Vac 240 Vac 24 Vac Vac Frequency 50 ㎐ 60 ㎐㎐

1.2 Variant Model Differences

Not applicable 1.3 Device Modifications

Not applicable

1.4 Equipment Under Test

Description Model Number Serial Number Manufacturer Remarks

SMART HOME CAMERA SNH-V6410PN -

Tianjin Samsung Electronics Co.,Ltd. EUT

AC/DC Adapter 2ABE010B - Channel Well Technology -

1.5 Support Equipments

Description Model Number Serial Number Manufacturer Remarks

Notebook NT63025J JK9091EF400432X SAMSUNG -

Notebook AC/DC Adapter A13-040N2A CN60BA4400313AD0N843KO243

Chicony Power Technology

(suzhou)Co., Ltd. -

Micro SD Card - - SanDisk 4 GB



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1.6 External I/O Cabling

Start END Cable Spec.

Description I/O Port Description I/O Port Length Shield

SMART HOME CAMERA (E.U.T)

- Notebook - - -

Micro SD Card Slot Micro SD Card

Micro SD Card Slot - -

* Unshielded = U, Shielded = S

1.7 E.U.T Operating Mode(s)

Equipment under test was operated during the measurement under the following conditions:

Test mode Normal operating

Operating Webpage viewer check



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1.8 Configuration

■ AC Main □ DC Main



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1.9 Calibration Details of Equipment Used for Measurement

Test equipment and test accessories are calibrated on regular basis. The maximum time between calibrations is one year or what is recommended by the manufacturer, whichever is less.

1.10 Test Facility

The measurement facility is located at 473-29 Gayeo-ro, Yeoju-si, Gyeonggi-do, 12658, Korea. The sites are constructed in conformance with the requirements of ANSI C63.4 and CISPR Publication 22.

1.11 Laboratory Accreditations and Listings

Country Agency Scope of Accreditation Logo USA FCC 3 & 10 meter Open Area Test Sites and

one conducted site to perform FCC Part 15/18 measurements.

JAPAN VCCI Mains Ports Conducted Interference

Measurement, Telecommunication Ports Conducted Disturbance Measurement and Radiation 10 meter site, Facility for measuring radiated disturbance above 1 ㎓ R-4308, C-4798,

T-2311, G-914 KOREA MSIP EMI (10 meter Open Area Test Site and

two conducted sites) Radio(3 & 10 meter Open Area Test Sites and one conducted site) EMS (ESD, RS, EFT/Burst, Surge, CS, Magnetic, Dips and interruptions)

KR0100 Canada IC

3 & 10 meter Open Area Test Sites and one conducted site

4769B-1

Europe CE EMI (10 meter Open Area Test Site and two conducted sites) Radio(3 & 10 meter Open Area Test Sites and one conducted site) EMS (ESD, RS, EFT/Burst, Surge, CS, Magnetic, Dips and interruptions)

International KOLAS EMI (10 meter Open Area Test Site and two conducted sites) Radio(3 & 10 meter Open Area Test Sites and one conducted site) EMS (ESD, RS, EFT/Burst, Surge, CS, Magnetic, Dips and interruptions)



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2.0 Test Regulations

The emissions tests were performed according to following regulations:

EMC – Directive 2004/108/EC

EN 61000-6-3:2011 EN 61000-6-1:2007

EN 61000-6-4:2007 +A1:2011 EN 61000-6-2:2005

EN 55011:2007 +A1:2010 Group 1 Group 2 Class A Class B

EN 55014-1:2006 +A2:2011

EN 55014-2:1997 +A2:2008

EN 55015:2013

EN 55022:2010 Class A Class B

EN 55024:2010

EN 50130-4:2011 +A1:2014 EN 61000-3-2:2014

EN 61000-3-3:2013

EN 61326-1:2013

VCCI V-3 / 2013,04 Class A Class B

AS / NZS CISPR22:2009 +A1:2010 Class A Class B

47 CFR Part 15, Subpart B / ANSI C63,4-2009 Class A Class B

IC Regulation ICES-003 : 2012 / ANSI C63,4-2014 Class A Class B

CISPR 22:2009 +A1:2010 Class A Class B



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R&TTE – Directive 1999/5/EC

EN 301 489-1 V1,9,2

Equipment for fixed use

Equipment for vehicular use Equipment for portable use

EN 301 489-3 V1,6,1

EN 301 489-9 V1,4,1

EN 301 489-17 V2,2,1

EN 60945:2002



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2.1 Conducted Emissions at Mains Power Ports

Test Date Jan. 27, 2016

Test Location

Electro wave Shieldroom Test Equipment

Used Description Model Number Manufacturer Serial Number Cal. Due

EMI Test Receiver ESR3 R&S 101783 05, 06, 2016

LISN ENV216 R&S 101137 02, 10, 2016

LISN ENV216 R&S 101786 05, 06, 2016

Electro wave Shieldroom - SEMITEC - -

Test Conditions Temperature: 18,7 ℃

Relative Humidity: 37,9 % . Frequency Range of Measurement

150 ㎑ to 30 ㎒ Instrument Settings

IF Band Width: 9 ㎑ Test Results The requirements are:

PASS NOT PASS NOT APPLICABLE

Remarks See Appendix A for test data.



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2.2 Conducted Emissions at Telecommunication Ports

Test Date Not applicable Test Location

Electro wave Shieldroom Test Equipment



LISN ENV216 R&S 101137 02, 10, 2016

LISN ENV216 R&S 101786 05, 06, 2016

8-Wire ISN CAT3 CAT3 8158 Schwarzbeck Mess 8158-0019 04, 02, 2016

8-Wire ISN CAT5 CAT5 8158 Schwarzbeck Mess 8158-0030 04, 02, 2016

8-Wire ISN CAT6 NTFM 8158 Schwarzbeck Mess 8158-0029 08, 14, 2016

Electro wave Shieldroom - SEMITEC - -

Test Conditions Temperature: ℃

Relative Humidity: % Frequency Range of Measurement

150 ㎑ to 30 ㎒ Instrument Settings

IF Band Width: 9 ㎑ Test Results

NOT APPLICABLE





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2.3 Radiated Electric Field Emissions(Below 1 ㎓) Test Date

Jan. 27, 2016 Test Location Open Area Test Site #1 Open Area Test Site #2 Test Equipment



Trilog-Broadband Antenna VULB 9163 SCHWARZBECK 9168-713 05, 15, 2017

Open Area Test Site - KES - -

Antenna Mast - DAEIL EMC - -

Turn Table - DAEIL EMC - -


Relative Humidity: 58,0 % Frequency Range of Measurement 30 ㎒ to 1 ㎓ Instrument Settings IF Band Width: 120 ㎑ Test Results The requirements are:





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2.4 Radiated Electric Field Emissions(Above 1 ㎓) Test Date

Jan. 27, 2016 Test Location Semi Anachoic Chamber #2 Test Equipment


EMI Test Receiver ESU26 R&S 100552 05, 06, 2016

Broadband

Coaxial Preamplifier

BBV 9718 Schwarzbeck

Mess - Elektronik

9718-246 10, 23, 2016

DOUBLE RIDGED HORN ANTENNA SAS-571 A.H.SYSTEM,INC 781 05, 07, 2017

Semi Anachoic Chamber #2 - SEMITEC - -

Antenna Mast - AUDIX - -

Turn Table - AUDIX - -


Relative Humidity: 37,9 % Frequency Range of Measurement 1 ㎓ to 6 ㎓ Instrument Settings IF Band Width: 1 ㎒ Test Results The requirements are:





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2.5 Harmonic Current Emissions Test Date

Jan. 27, 2016

Test Location Electro wave Shieldroom

Test Equipment


AC Source ACS 500 N EM TEST V1024106760 08, 13, 2016

Digital Power Analyzer DPA 500 N EM TEST V1024106759 08, 13, 2016


Relative Humidity: 37,9 % Classification of Equipment for Harmonic Current Emissions Class A Class B Class C(Below 25 W)

Class C(Above 25 W) Class D Test Results The requirements are: PASS NOT PASS NOT APPLICABLE Remarks See Appendix A for test data.



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2.6 Voltage Fluctuations and Flicker Test Date

Jan. 27, 2016

Test Location Electro wave Shieldroom

Test Equipment


AC Source ACS 500 N EM test V1024106760 08, 13, 2016

Digital Power Analyzer DPA 500 N EM test V1024106759 08, 13, 2016


Relative Humidity: 37,9 % Test Results The requirements are: PASS NOT PASS NOT APPLICABLE Remarks

See Appendix A for test data.



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3.0 Criteria for compliance ■ EN 301 489 – 17 The performance criteria are:

•. performance criteria A for immunity tests with phenomena of a continuous nature;

•. performance criteria B for immunity tests with phenomena of a transient nature;

•. performance criteria for immunity tests with power interruptions exceeding a certain time.

The equipment shall meet the performance criteria as specified in the following clauses.

Performance table

Criteria During test After test

A

Shall operate as intended. May show degradation of performance (see note 1). Shall be no loss of function. Shall be no unintentional transmissions.

Shall operate as intended. Shall be no degradation of performance (see note 2). Shall be no loss of function. Shall be no loss of stored data or user programmable functions.

B May show loss of function (one or more). May show degradation of performance (see note 1). No unintentional transmissions.

Functions shall be self-recoverable. Shall operate as intended after recovering. Shall be no degradation of performance (see note 2). Shall be no loss of stored data or user programmable functions.

C May be loss of function (one or more). Functions shall be recoverable by the operator. Shall operate as intended after recovering. Shall be no degradation of performance (see note 2).

NOTE 1:

Degradation of performance during the test is understood as a degradation to a level not below a minimum performance level specified by the manufacturer for the use of the apparatus as intended. In some cases the specified minimum performance level may be replaced by a permissible degradation of performance. If the minimum performance level or the permissible performance degradation is not specified by the manufacturer then either of these may be derived from the product description and documentation (including leaflets and advertising) and what the user may reasonably expect from the apparatus if used as intended.

NOTE 2:

No degradation of performance after the test is understood as no degradation below a minimum performance level specified by the manufacturer for the use of the apparatus as intended. In some cases the specified minimum performance level may be replaced by a permissible degradation of performance. After the test no change of actual operating data or user retrievable data is allowed. If the minimum performance level or the permissible performance degradation is not specified by the manufacturer then either of these may be derived from the product description and documentation (including leaflets and advertising) and what the user may reasonably expect from the apparatus if used as intended.



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Performance criteria for Continuous phenomena applied to Transmitters (CT)

The performance criteria A shall apply.

The EUT shall not unintentional transmission during the test.

The EUT shall continue to run the test program on the notebook to check communication status.

Performance criteria for Transient phenomena applied to Transmitters (TT)

The EUT shall not unintentional transmission after the test.


The performance criteria B shall apply, except for voltage dips of 100 ㎳ and voltage interruptions of 5 000

㎳ duration, for which performance criteria C shall apply.

Performance criteria for Continuous phenomena applied to Receivers (CR)

The performance criteria A shall apply.

The EUT shall not unintentional transmission during the test.


Performance criteria for Transient phenomena applied to Receivers (TR)

The EUT shall not unintentional transmission after the test.


The performance criteria B shall apply, except for voltage dips of 100 ㎳ and voltage interruptions of 5 000

㎳ duration for which performance criteria C shall apply.



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3.1 Electrostatic Discharge

Reference Standard EN 61000-4-2:2009

Test Date

Jan. 28, 2016 Test Location

EMS-ESD: Electro wave Shieldroom Test Equipment


ESD SIMULATOR ESS-2000 Noise Ken ESS05X4620 06, 30, 2016

HCP - Noise Ken - -

VCP - Noise Ken - -


Relative Humidity: 38,2 % Atmospheric Pressure: 101,5 ㎪ Test Specifications Discharge Factor: 1 s Discharge Impedance: 330 ohm / 150 pF Kind of Discharge: Air, Contact (direct and indirect) Polarity: Positive and Negative Number of Discharge: 10 at all locations for Air discharge 10 at all locations for Contact discharge Discharge Voltage: Contact Air HCP VCP 2 ㎸ 2 ㎸ 2 ㎸ 2 ㎸ 4 ㎸ 4 ㎸ 4 ㎸ 4 ㎸ 6 ㎸ 6 ㎸ 6 ㎸ 6 ㎸ 8 ㎸ 8 ㎸ 8 ㎸ 8 ㎸ 15 ㎸ 15 ㎸ 15 ㎸ 15 ㎸ Notes: HCP: Horizontal coupling plane VCP: Vertical coupling plane Required Performance Criteria: B



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Location of Discharge:

Air

Contact

1

2



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Test Data Indirect Discharge

No. Test Point Discharge Method Performance

Remarks Observation 1 HCP Contact Contact Discharge A - 2 VCP Contact Contact Discharge A -

Direct Discharge

No. Test Point Discharge Method Performance

Remarks Observation 1 Micro 5 PIN Port Air Discharge A -

2 Micro SD Card Slot Air Discharge B -

Note: “Blank” = Not performed

Observations: A – No degradation of function B – Distortion/Error of function (self-recoverable)

C – Loss of function

Test Results PASS Required Performance Criteria

NOT PASS Required Performance Criteria Remarks

Distortion of function. (self-recoverable)



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3.2 Radiated Electric Field Immunity

Reference Standard EN 61000-4-3:2006 +A2:2010

Test Date

Jan. 27, 2016 Test Location EMS-RS: Semi Anachoic Chamber #1 Semi Anachoic Chamber #2 Test Equipment


SiGNAL GENERATOR SMB 100A R&S 108252 08, 13, 2016

BROADBAND AMPLIFIER BBA100 R&S 101239 08, 13, 2016

BROADBAND AMPLIFIER 100S1G6M1 AR 579931 08, 13, 2016

POWER METER NRP2 R&S 103475 08, 13, 2016

AVG POWER SENSOR NRP-Z91 R&S 102526 08, 13, 2016

AVG POWER SENSOR NRP-Z91 R&S 102527 08, 13, 2016

Stacked Log.-Per.Antenna STLP 9128 D Schwarzbeck 9128D038 -

DIRECTIONAL COUPLER KYDC-D1070-

DX40 Broadband Telecom KY150001 09, 25, 2016

Semi Anachoic Chamber #2 SEMITEC - -



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Relative Humidity: 37,9 % Atmospheric Pressure: 101,6 ㎪

Test Specifications Antenna Polarization: Horizontal & vertical unless indicated otherwise Antenna Distance: 3 m Field Strength: 1 V/m 3 V/m 10 V/m Frequency Range: 80 ㎒ to 1 ㎓ 1,4 ㎓ to 2,7 ㎓ 80 ㎒ to 2,7 ㎓ Modulation: AM, 80 %, 1 ㎑ sine wave

PM, 1 ㎐ (0,5 s ON : 0,5 s OFF) Frequency step: 1 % step

Dwell Time: 1 s 3 s

# of Sides Radiated: 4

Required Performance Criteria: A

Test Data

Side Exposed Observation Horizontal Vertical Front A A Right A A Back A A Left A A

Note: “Blank” = Not performed


C – Loss of function Test Results PASS Required Performance Criteria


No any function degraded during the test.



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3.3 Electrical Fast Transients/Bursts


Test Date

Jan. 28, 2016 Test Location

EMS-EFT: Electro wave Shieldroom Test Equipment


Ultra Compact Simulator UCS 500 N5 EM TEST V0936105120 07, 14, 2016

Capacitive Coupling Clamp HFK EM TEST 070925 07, 14, 2016

MotorVariac MV2616 EM TEST V0936105123 07, 14, 2016


Relative Humidity: 38,2 % Atmospheric Pressure: 101,5 ㎪ Test Specifications Pulse Amplitude & Polarity: 1.0 ㎸ 2.0 ㎸

(Power Lines) 4.0 ㎸ Pulse Amplitude & Polarity: 0.5 ㎸ 1.0 ㎸ (Signal Lines) 2.0 ㎸ Burst Period: 300 ㎳ 2 s Repetition Rate: 5 ㎑ 100 ㎑ Duration of Test Voltage: 1 min Required Performance Criteria: B



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Test Data

Input a.c. power ports – Coupling/Decoupling Network used

Mode of Application OBSERVATIONS

(+) Burst (㎸) (-) Burst (㎸) L – N A A

Input d.c. power ports – Coupling/Decoupling Network used


(+) Burst (㎸) (-) Burst (㎸) - - -

Signal ports and telecommunication ports – Coupling Clamp used


(+) Burst (㎸) (-) Burst (㎸) - - -

Note: “Blank” = Not performed Observations: A – No degradation of function B – Distortion/Error of function (self-recoverable)



No any function degraded during the test.



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3.4 Surge Transients


Test Date

Jan. 28, 2016 Test Location EMS-Surge: Electro wave Shieldroom Test Equipment




CDN CNV 504N EM TEST V0936105121 04, 01, 2016



Test Specifications Power Lines

Source Impedance: 12 ohm for common mode and 2 ohm for differential mode

Surge Amplitude: Common Mode 0,5 ㎸ 1,0 ㎸ 2,0 ㎸

Differential Mode 0,5 ㎸ 1,0 ㎸

Number of Surges: 5 surges per angle

Angle: 0, 90, 180, 270 (input a.c. power port)

Polarity: Positive & Negative

Repetition Rate: 1 surge per min 1 surge per 30 sec.

Required Performance Criteria: B



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Signal Lines Source Impedance: 42 ohm for common mode

Surge Amplitude: Common Mode 0,5 ㎸ 1,0 ㎸ Number of Surges: 5 Surges

Polarity: Positive & Negative

Repetition Rate: 1 surge per min 1 surge per 30 sec.

Required Performance Criteria: C

Test Data

Power Lines

Line to Line – Differential Mode


(+) Surge (㎸) (-) Surge (㎸) L - N A A L - PE - - N - PE - -

Line to Earth – Common Mode


(+) Surge (㎸) (-) Surge (㎸) - - -

Signal Lines

Line to Earth – Common Mode


(+) Surge (㎸) (-) Surge (㎸) - - -

Note: “Blank” = Not performed Observations: A – No degradation of function B – Distortion/Error of function (self-recoverable)


NOT PASS Required Performance Criteria Remarks No any function degraded during the test.



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3.5 Conducted Disturbance


Test Date

Jan. 28, 2016 Test Location EMS-CS: Electro wave Shieldroom Test Equipment


Continuous Wave Generator CWS 500N1 EM TEST V0936105119 09, 25, 2016

6dB Attenuator ATT6 EM TEST 1208-34 08, 13, 2016

CDN CDN-M2/M3N EM TEST 0909-06 08, 13, 2016

CDN CDN-T2-RJ11 EM TEST 0909-07 08, 13, 2016

CDN CDN-T4 EM TEST 0909-08 08, 13, 2016

CDN CDN-T8RJ45 EM TEST 0909-09 08, 13, 2016

CDN CDN-AF2 EM TEST 0909-10 08, 13, 2016

CDN CDN-AF4 EM TEST 0909-11 08, 13, 2016

EM Injection Clamp EM 101 Liithi 35943 02, 10, 2016





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Test Specifications Frequency range: 150 ㎑ to 80 ㎒ 10 ㎑ to 30 ㎒ 150 ㎑ to 230 ㎒ 10 ㎑ to 100 ㎒ Voltage Level: 1 Vrms 3 Vrms 10 Vrms Modulation: AM, 80 %, 1 ㎑ sine wave

PM, 1 ㎐ (0,5 s ON : 0,5 s OFF) Frequency step: 1 % step Dwell Time: 1 s 3 s Required Performance Criteria: A Test Data

Input a.c. power ports Coupling Location (Line Stressed) Coupling Method Observation

Input a.c. power port CDN ( M2, M3) A

Input d.c. power ports Coupling Location (Line Stressed) Coupling Method Observation

- - -

Signal ports and telecommunication ports Coupling Location (Line Stressed) Coupling Method Observation

- EM Injection Clamp - Notes: CDN = Coupling Decoupling Network EMC = Electro Magnetic Clamp “blank” = Not performed Observations: A – No degradation of function B – Distortion/Error of function (self-recoverable)


NOT PASS Required Performance Criteria Remarks No any function degraded during the test.



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3.6 Power Frequency Magnetic Field Immunity


Test Date Not applicable Test Location EMS-Magnetic: Electro wave Shieldroom Test Equipment


Magnetic coil MS100 EM TEST 0809-10 08, 13, 2016



Current Transformer MC2630 EM TEST 0307-46 08, 13, 2016

Test Conditions Temperature: ℃

Relative Humidity: % Atmospheric Pressure: ㎪

Test Specifications Field Strength: 1 A/m 3 A/m

30 A/m Frequency: 50 ㎐ 60 ㎐ Required Performance Criteria: A



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Test Data

Immersion method

Coil orientation Observation

X - axis - Y - axis - Z - axis -

Proximity method

Coil orientation Observation

- - - - - -

Note: “blank” = Not performed




NOT APPLICABLE



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3.7 Voltage Dips and Short Interruptions


Test Date Jan. 28, 2016 Test Location EMS-Voltage dip: Electro wave Shieldroom Test Equipment



Capacitive Coupling Clamp HFK EM TEST 070925 07, 14, 2016






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Test Specifications & Observations/Remarks Voltage Dips

No. Depth Duration Performance

Remarks Results

1 100 % 0.5 T A -

2 100 % 1 T A -

3 30 % 25 T A -

Short Interruption

No. Depth Duration Performance

Remarks Results

1 100 % 250 T C -

Observations: A – No response observed from E.U.T B – Unit shuts down then automatically restarts when full voltage is

restored. C – Unit shuts down then manually restarts when full voltage is

restored or Loss of function. Test Results PASS Required Performance Criteria

NOT PASS Required Performance Criteria Remarks Refer to the results



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APPENDIX A – TEST DATA Conducted Emissions at Mains Power Ports

[HOT]



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[NEUTRAL]



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Conducted Emissions at Telecommunication Ports [10 Mbps]

N/A



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[100 Mbps]

N/A



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Radiated Electric Field Emissions(Below 1 ㎓)

Frequency Amplitude ANT

Polar.

(H/V)

ANT. Height Correction Factor Corrected

Amplitude

Applicable

Limit Margin

[㏈] [㎒] [㏈㎶] [m]

ANT.

[㏈/m]

Cable

[㏈] [㏈㎶/m] [㏈㎶/m]

133.59 7.24 H 3.75 8.43 2.99 18.66 30.00 11.34

150.00 14.93 V 1.02 8.20 3.17 26.30 30.00 3.70

250.23 11.66 H 3.87 12.41 4.28 28.35 37.00 8.65

350.17 8.44 V 1.43 14.54 5.20 28.18 37.00 8.82

450.29 6.59 V 1.00 16.40 6.18 29.17 37.00 7.83

461.93 6.10 H 4.00 16.57 6.28 28.95 37.00 8.05

* H : Horizontal, V : Vertical



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Radiated Electric Field Emissions(Above 1 ㎓)



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Harmonic Current Emissions and Voltage Fluctuations and Flicker

Average harmonic current results Hn Ieff [A] % of Limit Limit [A] Result 1 15.023E-3 2 663.267E-6 PASS 3 13.795E-3 0.600 2.30 PASS 4 566.419E-6 PASS 5 13.454E-3 1.180 1.14 PASS 6 581.527E-6 PASS 7 13.080E-3 1.699 770.00E-3 PASS 8 539.233E-6 PASS 9 12.550E-3 3.137 400.00E-3 PASS 10 597.509E-6 PASS 11 11.913E-3 3.610 330.00E-3 PASS 12 507.405E-6 PASS 13 11.193E-3 5.330 210.00E-3 PASS 14 452.561E-6 PASS 15 10.357E-3 6.904 150.00E-3 PASS 16 414.710E-6 PASS 17 9.489E-3 7.169 132.35E-3 PASS 18 373.231E-6 PASS 19 8.588E-3 7.252 118.42E-3 PASS 20 384.323E-6 PASS 21 7.638E-3 4.752 160.71E-3 PASS 22 330.232E-6 PASS 23 6.701E-3 4.567 146.74E-3 PASS 24 306.604E-6 PASS 25 5.779E-3 4.280 135.00E-3 PASS 26 293.494E-6 PASS 27 4.871E-3 PASS 28 286.423E-6 PASS 29 4.010E-3 PASS 30 281.507E-6 PASS 31 3.226E-3 PASS 32 248.314E-6 PASS 33 2.522E-3 PASS 34 263.932E-6 PASS 35 1.879E-3 PASS 36 240.290E-6 PASS 37 1.360E-3 PASS 38 223.799E-6 PASS 39 975.750E-6 PASS 40 222.276E-6 PASS

Harmonic currents less than 0.6% of the input current measured under the test conditions, or less than 5 mA, whichever is greater, are disregarded.



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Test Data - Harmonics (continued)

Maximum harmonic current results Hn Ieff [A] % of Limit Limit [A] Result 1 15.865E-3 2 948.237E-6 PASS 3 14.687E-3 0.426 3.45 PASS 4 822.173E-6 PASS 5 14.315E-3 0.837 1.71 PASS 6 849.171E-6 PASS 7 13.932E-3 1.206 1.15 PASS 8 696.200E-6 PASS 9 13.331E-3 2.222 600.00E-3 PASS 10 858.576E-6 PASS 11 12.602E-3 2.546 495.00E-3 PASS 12 680.983E-6 PASS 13 11.797E-3 3.745 315.00E-3 PASS 14 635.654E-6 PASS 15 10.860E-3 4.827 225.00E-3 PASS 16 567.387E-6 PASS 17 9.887E-3 4.980 198.52E-3 PASS 18 535.690E-6 PASS 19 8.863E-3 4.990 177.63E-3 PASS 20 527.827E-6 PASS 21 7.881E-3 4.904 160.71E-3 PASS 22 457.201E-6 PASS 23 6.806E-3 4.638 146.74E-3 PASS 24 427.960E-6 PASS 25 5.880E-3 4.356 135.00E-3 PASS 26 400.480E-6 PASS 27 4.971E-3 PASS 28 392.782E-6 PASS 29 4.128E-3 PASS 30 387.130E-6 PASS 31 3.323E-3 PASS 32 337.639E-6 PASS 33 2.641E-3 PASS 34 349.022E-6 PASS 35 2.008E-3 PASS 36 363.724E-6 PASS 37 1.483E-3 PASS 38 289.514E-6 PASS 39 1.108E-3 PASS 40 393.026E-6 PASS

Harmonic currents less than 0.6% of the input current measured under the test conditions, or less than 5 mA, whichever is greater, are disregarded.



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Test Data - Voltage Fluctuations

MMaaxxiimmuumm FFlliicckkeerr rreessuullttss

E.U.T values Limit Result

Pst 0.033 1.00 PASS

Plt 0.033 0.65 PASS

dc [%] 0.000 3.30 PASS

dmax [%] 0.186 4.00 PASS

dt [s] 0.000 0.50 PASS



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Test Setup Photos and Configuration Conducted Voltage Emissions



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Conducted Emissions at Telecommunication Ports

N/A

N/A



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Radiated Electric Field Emissions(Below 1 ㎓)



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Radiated Electric Field Emissions(Above 1 ㎓)



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Harmonic Current Emissions and Voltage Fluctuations and Flicker

Electrostatic Discharge



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Radiated Electric Field Immunity

Electrical Fast Transients/Bursts



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Surge Transients

Conducted Disturbance



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Power Frequency Magnetic Field Immunity

N/A

Voltage Dips and Short Interruptions



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E.U.T External Photographs

(Top)

(Bottom)



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E.U.T Internal Photographs

(Internal View)



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EUT Internal View – Main Board

(Top)

(Bottom)



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EUT Internal View – Sub Board 1

(Top)

(Bottom)



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EUT Internal View – Sub Board 2

(Top)

(Bottom)



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EUT Internal View – Camera Lens

(Top)

(Bottom)



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Label and Location

[LABEL VIEW]

SMART HOME CAMERA Model No : SNH-V6410PN

Manufacturer : Tianjin Samsung Techwin Opto-Electronic Co., Ltd.

Made in of China

hanwha techwin europe - emc test report for ce...kes-p-5101-14 rev. 2 kes a4 report revision history...

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