hef4104b_4

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1. Gener al description The HEF4104B is a quad low voltage-to-high voltage translator with 3-state outputs. It provides the capability of interfacing low voltage circuits to high voltage circuits. For example low voltage Local Oxidation Complementary MOS (LOCMOS) and TTL to high voltage LOCMOS. It has four data inputs (A0 to A3), an active HIGH output enable input (OE), four data outputs (B0 to B3) and th eir complements (B0 to B3). Wit h OE = HIGH, the outp uts B 0 to B3 and B0 to B3 are i n the low impedance ON-s tate , either HIGH or LOW as determined by the inputs A0 to A3. With OE = LOW , the outputs B0 to B3 and B0 to B3 ar e in t he high- imped ance OFF- st at e. It uses a common negative supply (V SS ) and separate positive supplies for the inputs (V DD(A) ) and th e outputs (V DD(B) ). V DD(A) mus t al ways bele ss thanorequal toV DD(B) ,even during power turn-on and turn-off. For the permissible operating range of V DD(A) and V DD(B) see Figure 4. Each input protection circuit is terminated between V DD(B) and V SS . This allows the input signals to be driven from any potential between V DD(B) and V SS , witho ut regard to curre nt limiting. When driving from potentials greater than V DD(B) or less than V SS , the c urrent at each input must be limited to 10 mA. It operates over a recommended V DD po wersupplyrange of3 V to15 V re ferenced to V SS (usually ground). Unused inputs must be connected to V DD , V SS , or another input. It is also suitable for use over the full industrial (40 °C to +85 °C) temperature range. 2. Features I Fully static operation I 5 V, 10 V, and 15 V parametric ratings I Standardized symmetrical output characteristics I Inputs and outputs are protected against electrostatic effects I Operates across the full industrial temperature range from 40 °C to +85 °C I Complies with JEDEC standard JESD 13-B I ESD protection: N HBM JESD22-A114E exceeds 2000 V N MM JESD2 2-A115- A exce eds 200 V 3. Applications I Industrial HEF4104B Quad low-to-high voltage translator with 3-state outputs Rev . 04 5 March 2009 Product data sheet

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1. General description

The HEF4104B is a quad low voltage-to-high voltage translator with 3-state outputs. It

provides the capability of interfacing low voltage circuits to high voltage circuits. For

example low voltage Local Oxidation Complementary MOS (LOCMOS) and TTL to high

voltage LOCMOS. It has four data inputs (A0 to A3), an active HIGH output enable input

(OE), four data outputs (B0 to B3) and their complements (B0 to B3).

With OE = HIGH, the outputs B0 to B3 and B0 to B3 are in the low impedance ON-state,

either HIGH or LOW as determined by the inputs A0 to A3. With OE = LOW, the outputs

B0 to B3 and B0 to B3 are in the high-impedance OFF-state.

It uses a common negative supply (VSS) and separate positive supplies for the inputs

(VDD(A)) and the outputs (VDD(B)). VDD(A) must always be less than or equal to VDD(B), even

during power turn-on and turn-off. For the permissible operating range of VDD(A) and

VDD(B) see Figure 4.

Each input protection circuit is terminated between VDD(B) and VSS. This allows the input

signals to be driven from any potential between VDD(B) and VSS, without regard to current

limiting. When driving from potentials greater than VDD(B) or less than VSS, the current at

each input must be limited to 10 mA.

It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS

(usually ground). Unused inputs must be connected to VDD, VSS, or another input. It isalso suitable for use over the full industrial (−40 °C to +85 °C) temperature range.

2. Features

I Fully static operation

I 5 V, 10 V, and 15 V parametric ratings

I Standardized symmetrical output characteristics

I Inputs and outputs are protected against electrostatic effects

I Operates across the full industrial temperature range from −40 °C to +85 °C

I Complies with JEDEC standard JESD 13-B

I ESD protection:

N HBM JESD22-A114E exceeds 2000 V

N MM JESD22-A115-A exceeds 200 V

3. Applications

I Industrial

HEF4104BQuad low-to-high voltage translator with 3-state outputs

Rev. 04 — 5 March 2009 Product data sheet

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Product data sheet Rev. 04 — 5 March 2009 2 of 14

NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

4. Ordering information

5. Functional diagram

Table 1. Ordering information

All types operate from −40 °C to +85 °C.

Type number Package

Name Description Version

HEF4104BP DIP16 plastic dual in-line package; 16 leads (300 mil); SOT38-4

HEF4104BT SO16 plastic small outline package; 16 leads; body width 3.9 mm SOT109-1

Fig 1. Logic symbol Fig 2. Logic diagram

001aag262

B314

B313

B29

B210

B17

B16

B02

B0A0

LEVEL

CONVERTER

3

4

A15

A211

A312

OE

VSS

15

8

VDD(A)

16

VDD(B)

1

001aag264 VDD(A) VDD(B)

LEVEL

CONVERTERA0 B0

B0

LEVEL

CONVERTERA1 B1

B1

LEVEL

CONVERTERA2 B2

B2

LEVEL

CONVERTERA3 B3

B3

LEVEL

CONVERTEROE

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Product data sheet Rev. 04 — 5 March 2009 3 of 14

NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

6. Pinning information

6.1 Pinning

6.2 Pin description

7. Functional description

[1] H = HIGH voltage level; L = LOW voltage level; Z = high-impedance OFF-state.

Fig 3. Pin configuration

HEF4104B

VDD(B) VDD(A)

B0 OE

B0 B3

A0 B3

A1 A3

B1 A2

B1 B2

VSS B2

001aag263

1

2

3

4

5

6

7

8

10

9

12

11

14

13

16

15

Table 2. Pin description

Symbol Pin DescriptionVDD(B) 1 supply voltage port B

B0 to B3 2, 7, 9, 14 complementary data output

B0 to B3 3, 6, 10, 13 data output

A0 to A3 4, 5, 11, 12 data input

VSS 8 common negative supply voltage (0 V)

OE 15 output enable input

VDD(A) 16 supply voltage port A

Table 3. Function table[1]

Control Output

OE Bn Bn

H An An

L Z Z

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Product data sheet Rev. 04 — 5 March 2009 4 of 14

NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

8. Limiting values

[1] IDD is the combined current of IDD(A) and IDD(B).

[2] For DIP16 packages: above Tamb = 70 °C, Ptot derates linearly at 12 mW/K.

[3] For SO16 packages: above Tamb = 70 °C, Ptot derates linearly at 8 mW/K.

9. Recommended operating conditions

10. Static characteristics

Table 4. Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to V SS = 0 V (ground).

Symbol Parameter Conditions Min Max Unit

VDD(A) supply voltage A port A; VDD(A) ≤ VDD(B) −0.5 +18 V

VDD(B) supply voltage B port B; VDD(B) ≥ VDD(A) −0.5 +18 V

IIK input clamping current VI < −0.5 V or VI > VDD(A) + 0.5 V - ±10 mA

VI input voltage −0.5 VDD(A) + 0.5 V

IOK output clamping current VO < −0.5 V or VO > VDD(B) + 0.5 V - ±10 mA

II/O input/output current - ±10 mA

IDD supply current [1] - 50 mA

Tstg storage temperature −65 +150 °C

Tamb ambient temperature −40 +85 °C

Ptot total power dissipation Tamb = −40 °C to +85 °C

DIP16 [2] - 750 mW

SO16 [3] - 500 mW

P power dissipation per output - 100 mW

Table 5. Recommended operating conditions

Symbol Parameter Conditions Min Typ Max Unit

VDD(A) supply voltage 3 - ≤ VDD(B) V

VDD(B) supply voltage ≥ VDD(A) - 15 V

VI input voltage 0 - VDD(A) V

Tamb ambient temperature in free air −40 - +85 °C

∆t/ ∆V input transition rise and fall rate VDD(A)= 5 V - - 3.75 ns/V

VDD(A) = 10 V - - 0.5 ns/V

VDD(A) = 15 V - - 0.08 ns/V

Table 6. Static characteristics

V DD(A) = V DD(B); V SS = 0 V; V I = V SS or V DD(A); unless otherwise specified.

Symbol Parameter Conditions VDD[1] Tamb = −40 °C Tamb = +25 °C Tamb = +85 °C Unit

Min Max Min Max Min Max

VIH HIGH-level

input voltage

|IO| < 1 µA 5 V 3.5 - 3.5 - 3.5 - V

10 V 7.0 - 7.0 - 7.0 - V

15 V 11.0 - 11.0 - 11.0 - V

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NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

[1] VDD is the same as VDD(A) and VDD(B).

[2] IDD is the combined current of IDD(A) and IDD(B).

VIL LOW-level

input voltage

|IO| < 1 µA 5 V - 1.5 - 1.5 - 1.5 V

10 V - 3.0 - 3.0 - 3.0 V

15 V - 4.0 - 4.0 - 4.0 V

VOH HIGH-level

output voltage

|IO| < 1 µA 5 V 4.95 - 4.95 - 4.95 - V

10 V 9.95 - 9.95 - 9.95 - V

15 V 14.95 - 14.95 - 14.95 - V

VOL LOW-level

output voltage

|IO| < 1 µA 5 V - 0.05 - 0.05 - 0.05 V

10 V - 0.05 - 0.05 - 0.05 V

15 V - 0.05 - 0.05 - 0.05 V

IOH HIGH-level

output current

VO = 2.5 V 5 V −1.7 - −1.4 - −1.1 - mA

VO = 4.6 V 5 V −0.52 - −0.44 - −0.36 - mA

VO = 9.5 V 10 V −1.3 - −1.1 - −0.9 - mA

VO = 13.5 V 15 V −3.6 - −3.0 - −2.4 - mA

IOL LOW-level

output current

VO = 0.4 V 5 V 0.52 - 0.44 - 0.36 - mA

VO = 0.5 V 10 V 1.3 - 1.1 - 0.9 - mA

VO = 1.5 V 15 V 3.6 - 3.0 - 2.4 - mA

II input leakage current 15 V - ±0.3 - ±0.3 - ±1.0 µA

IDD supply current all valid input

combinations;IO = 0 A

5 V [2] - 20 - 20 - 150 µA

10 V - 40 - 40 - 300 µA

15 V - 80 - 80 - 600 µA

IOZ OFF-state

output current

HIGH level;

VO = VDD(B)

15 V - 1.6 - 1.6 - 12.0 µA

LOW level;

VO = VSS

15 V - −1.6 - −1.6 - −12.0 µA

CI input capacitance digital inputs - - - - 7.5 - - pF

Table 6. Static characteristics …continued

V DD(A) = V DD(B); V SS = 0 V; V I = V SS or V DD(A); unless otherwise specified.

Symbol Parameter Conditions VDD[1] Tamb = −40 °C Tamb = +25 °C Tamb = +85 °C Unit

Min Max Min Max Min Max

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NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

11. Dynamic characteristics

The shaded area shows the permissible operating range.

Fig 4. VDD(B) as a function of VDD(A)

VDD(A) (V)0 155 10

001aag265

10

5

15

VDD(B)

(V)

0

operating area

Table 7. Dynamic characteristics

T amb = 25 °C; for test circuit see Figure 7 ; unless otherwise specified.

Symbol Parameter Conditions Extrapolation formula[1] Min Typ Max Unit

tPHL HIGH to LOW

propagation delay

An to Bn, Bn; see Figure 5

VDD(A) = VDD(B) = 5 V 143 + 0.55 × CL - 170 340 ns

VDD(A) = VDD(B) = 10 V 69 + 0.23 × CL - 80 160 ns

VDD(A) = VDD(B) = 15 V 57 + 0.16 × CL - 65 135 ns

tPLH LOW to HIGH

propagation delay

An to Bn, Bn; see Figure 5

VDD(A) = VDD(B) = 5 V 143 + 0.55 × CL - 170 340 ns

VDD(A) = VDD(B) = 10 V 69 + 0.23 × CL - 80 160 ns

VDD(A) = VDD(B) = 15 V 62 + 0.16 × CL - 70 140 ns

tTHL HIGH to LOW output

transition time

Bn or Bn; see Figure 6

VDD(A) = VDD(B) = 5 V 10 + 1.00 × CL - 60 120 ns

VDD(A) = VDD(B) = 10 V 9 + 0.42 × CL - 30 60 ns

VDD(A) = VDD(B) = 15 V 6 + 0.28 × CL - 20 40 ns

tTLH LOW to HIGH output

transition time

Bn or Bn; see Figure 6

VDD(A) = VDD(B) = 5 V 10 + 1.00 × CL - 60 120 ns

VDD(A) = VDD(B) = 10 V 9 + 0.42 × CL - 30 60 ns

VDD(A) = VDD(B) = 15 V 6 + 0.28 × CL - 20 40 ns

tPHZ HIGH to OFF-state

propagation delay

OE to Bn, Bn; see Figure 6

VDD(A) = VDD(B) = 5 V - 70 135 ns

VDD(A) = VDD(B) = 10 V - 55 110 ns

VDD(A) = VDD(B) = 15 V - 60 120 ns

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Product data sheet Rev. 04 — 5 March 2009 7 of 14

NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

[1] Typical value of the propagation delay and output transition time can be calculated with the extrapolation formula (CL in pF).

[1] VDD is the same as VDD(A) and VDD(B).

tPLZ LOW to OFF-state

propagation delay

OE to Bn, Bn; see Figure 6

VDD(A) = VDD(B) = 5 V - 70 135 ns

VDD(A) = VDD(B) = 10 V - 55 105 ns

VDD(A) = VDD(B) = 15 V - 55 110 ns

tPZH OFF-state to HIGH

propagation delay

OE to Bn, Bn; see Figure 6

VDD(A) = VDD(B) = 5 V - 195 395 ns

VDD(A) = VDD(B) = 10 V - 95 195 ns

VDD(A) = VDD(B) = 15 V - 80 165 ns

tPZL OFF-state to LOW

propagation delay

OE to Bn, Bn; see Figure 6

VDD(A) = VDD(B) = 5 V - 195 395 ns

VDD(A) = VDD(B) = 10 V - 95 190 ns

VDD(A) = VDD(B) = 15 V - 80 160 ns

Table 7. Dynamic characteristics …continued

T amb = 25 °C; for test circuit see Figure 7 ; unless otherwise specified.

Symbol Parameter Conditions Extrapolation formula[1] Min Typ Max Unit

Table 8. Dynamic power dissipation

V DD(A) = V DD(B), V SS = 0 V; t r = t f ≤ 20 ns; T amb = 25 °C.

Symbol Parameter VDD[1] Typical formula where

PD dynamic power

dissipation

5 V PD = 3000 × fi + Σ(fo × CL) × VDD2 (µW) fi = input frequency in MHz;

fo = output frequency in MHz;

CL = output load capacitance in pF;

Σ(fo × CL) = sum of the outputs;

VDD = supply voltage in V.

10 V PD = 12200 × fi + Σ(fo × CL) × VDD2 (µW)

15 V PD = 31000 × fi + Σ(fo × CL) × VDD2 (µW)

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NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

12. Waveforms

Measurement points are given in Table 9.

Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.

Fig 5. Data input (An) to data output (Bn, Bn) propagation delays and output transition times

001aaj783

An input

Bn output

tPLHtPHL

tPLH tPHL

0 V

VI

VM

VM

VOH

VOL

tTLHtTHL

tTHL

Bn output

VOH

VOL

tTLH

VY

VX

VX

VY

Measurement points are given in Table 9.

Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.

Fig 6. Enable and disable times

001aaj782

tPLZ

tPHZ

outputs off outputs onoutputs on

output

LOW-to-OFF

OFF-to-LOW

output

HIGH-to-OFF

OFF-to-HIGH

OE input

VOH

VOH

VOL

VOL

VI

VSS

tPZL

tPZH

VY

VY

VX

VM

VX

Table 9. Measurement points

Input Output

VI VM VM VX VY tr, tf

VSS or VDD(A) 0.5VDD(A) 0.5VDD(B) 0.1VDD(B) 0.9VDD(B) ≤ 20 ns

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Product data sheet Rev. 04 — 5 March 2009 9 of 14

NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

a. Input waveforms

b. Test circuit

Test data given in Table 10.

Definitions for test circuit:

DUT = Device Under Test;

CL = load capacitance including jig and probe capacitance

RL = load resistance

RT = termination resistance should be equal to the output impedance Zo of the pulse generator;

Fig 7. Test circuit for measuring switching times

VM VM

tW

tW

10 %

90 %

VSS

VI

VI

negative

pulse

positive

pulse

VSS

VM VM

90 %

10 %

tf

tr

tr

tf

001aaj781

001aaj784

VEXT

VDD

VI VO

DUT

CLRT

RL

RL

G

Table 10. Test data

Supplies Input Load VEXT

VDD(A) = VDD(B) tr, tf RL CL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ

5 V to 15 V ≤ 20 ns 1 kΩ 50 pF open VSS VDD(B)

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Product data sheet Rev. 04 — 5 March 2009 10 of 14

NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

13. Package outline

Fig 8. Package outline SOT38-1 (DIP16)

REFERENCESOUTLINE

VERSION

EUROPEAN

PROJECTIONISSUE DATE

IEC JEDEC JEITA

SOT38-495-01-14

03-02-13

MH

c

(e )1

ME

A

L

s e a t i n g

p l a n e

A1

w Mb1

b2

e

D

A2

Z

16

1

9

8

E

pin 1 index

b

0 5 10 mm

scale

Note

1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.

UNITA

max.1 2 b1

(1) (1) (1)b2 c D E e M Z

HL

mm

DIMENSIONS (inch dimensions are derived from the original mm dimensions)

Amin.

Amax. b

max.wMEe1

1.73

1.30

0.53

0.38

0.36

0.23

19.50

18.55

6.48

6.20

3.60

3.050.2542.54 7.62

8.25

7.80

10.0

8.30.764.2 0.51 3.2

inches 0.068

0.051

0.021

0.015

0.014

0.009

1.25

0.85

0.049

0.033

0.77

0.73

0.26

0.24

0.14

0.120.010.1 0.3

0.32

0.31

0.39

0.330.030.17 0.02 0.13

DIP16: plastic dual in-line package; 16 leads (300 mil) SOT38-4

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NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

Fig 9. Package outline SOT109-1 (SO16)

X

w M

θ

AA1

A2

bp

D

HE

Lp

Q

detail X

E

Z

e

c

L

v M A

(A )3

A

8

9

1

16

y

pin 1 index

UNITA

max.A1 A2 A3 bp c D (1) E (1) (1)e HE L Lp Q Zywv θ

REFERENCESOUTLINE

VERSION

EUROPEAN

PROJECTIONISSUE DATE

IEC JEDEC JEITA

mm

inches

1.750.25

0.10

1.45

1.250.25

0.49

0.36

0.25

0.19

10.0

9.8

4.0

3.81.27

6.2

5.8

0.7

0.6

0.7

0.3 8

0

o

o

0.25 0.1

DIMENSIONS (inch dimensions are derived from the original mm dimensions)

Note

1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.

1.0

0.4

SOT109-199-12-27

03-02-19076E07 MS-012

0.0690.010

0.004

0.057

0.0490.01

0.019

0.014

0.0100

0.00750.39

0.38

0.16

0.150.05

1.05

0.0410.244

0.228

0.028

0.020

0.028

0.0120.01

0.25

0.01 0.0040.039

0.016

0 2.5 5 mm

scale

SO16: plastic small outline package; 16 leads; body width 3.9 mm SOT109-1

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NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

14. Abbreviations

15. Revision history

Table 11. Abbreviations

Acronym Description

DUT Device Under Test

ESD ElectroStatic Discharge

HBM Human Body Model

MM Machine Model

Table 12. Revision history

Document ID Release date Data sheet status Change notice Supersedes

HEF4104B_4 20090305 Product data sheet - HEF4104B_CNV_3

Modifications: • The format of this data sheet has been redesigned to comply with the new identity

guidelines of NXP Semiconductors.

• Legal texts have been adapted to the new company name where appropriate.

• Pin names changed throughout the data sheet.

• Section 3 “Applications” added.

• Package SOT74 removed from Section 4 “Ordering information” and Section 13 “Package

outline”.

• Section 8 “Limiting values” and Section 10 “Static characteristics” added, taken from the

HE4000B Family Specifications data sheet.

• Typical temperature coefficient for propagation delays and output transitions removed.

• Section 14 “Abbreviations” added.

HEF4104B_CNV_3 19950101 Product specification - HEF4104B_CNV_2

HEF4104B_CNV_2 19950101 Product specification - HEF4104B_CNV_1

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NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

16. Legal information

16.1 Data sheet status

[1] Please consult the most recently issued document before initiating or completing a design.

[2] The term ‘short data sheet’ is explained in section “Definitions”.

[3] The productstatus of device(s) described in thisdocument may havechanged since this document was published andmaydiffer in case ofmultiple devices.The latestproduct statusinformation is available on the Internet at URL http://www.nxp.com.

16.2 DefinitionsDraft — The document is a draft version only. The content is still under

internal review and subject to formal approval, which may result in

modifications or additions. NXP Semiconductors does not give any

representations or warranties as to the accuracy or completeness of

information included herein andshall have no liabilityfor the consequencesof

use of such information.

Short data sheet — A short data sheet is an extract from a full data sheet

with thesame product type number(s) andtitle. A short data sheet is intended

for quick reference only and should not be relied upon to contain detailed and

full information. For detailed and full information see the relevant full data

sheet, which is available on request via the local NXP Semiconductors sales

office. In case of any inconsistency or conflict with the short data sheet, the

full data sheet shall prevail.

16.3 Disclaimers

General — Information in this document is believed to be accurate and

reliable. However, NXP Semiconductors does not give any representations or

warranties, expressed or implied, as to the accuracy or completeness of such

information and shall have no liability for the consequences of use of such

information.

Right to make changes — NXP Semiconductors reserves the right to make

changes to information published in this document, including without

limitation specifications and product descriptions, at any time and without

notice. This document supersedes and replaces all information supplied prior

to the publication hereof.

Suitability for use — NXP Semiconductors products are not designed,

authorized or warranted to be suitable for use in medical, military, aircraft,

space or life support equipment, nor in applications where failure or

malfunction of an NXP Semiconductors product can reasonably be expected

to result in personal injury, death or severe property or environmental

damage. NXP Semiconductors accepts no liability for inclusion and/or use of

NXP Semiconductors products in such equipment or applications and

therefore such inclusion and/or use is at the customer’s own risk.

Applications — Applications that are described herein for any of these

products are for illustrative purposes only. NXP Semiconductors makes no

representation or warranty that such applications will be suitable for the

specified use without further testing or modification.

Limiting values — Stress above one or more limiting values (as defined in

the Absolute Maximum Ratings System of IEC 60134) may cause permanent

damage to the device. Limiting values are stress ratings only andoperation of

the device at these or any other conditions above those given in the

Characteristics sections of this document is not implied. Exposure to limiting

values for extended periods may affect device reliability.

Terms and conditions of sale — NXP Semiconductors products are sold

subject to the general terms and conditions of commercial sale, as published

at http://www.nxp.com/profile/terms , including those pertaining to warranty,

intellectual property rights infringement and limitation of liability, unless

explicitly otherwise agreed to in writing by NXP Semiconductors. In case of

any inconsistency or conflict between information in this document and such

terms and conditions, the latter will prevail.

No offer to sell or license — Nothing in this document may be interpreted

or construed as an offer to sell products that is open for acceptance or the

grant, conveyance or implication of any license under any copyrights, patents

or other industrial or intellectual property rights.

16.4 Trademarks

Notice: All referenced brands, product names, service names and trademarks

are the property of their respective owners.

17. Contact information

For more information, please visit: http://www.nxp.com

For sales office addresses, please send an email to: [email protected]

Document status[1][2] Product status[3] Definition

Objective [short] data sheet Development This document contains data from the objective specification for product development.

Prel iminary [short] data sheet Qualificat ion This document contains data from the preliminary specification.

Product [short] data sheet Production This document contains the product specification.

7/29/2019 HEF4104B_4

http://slidepdf.com/reader/full/hef4104b4 14/14

NXP Semiconductors HEF4104BQuad low-to-high voltage translator with 3-state outputs

© NXP B.V. 2009. All rights reserved.For more information, please visit: http://www.nxp.comFor sales office addresses, please send an email to: [email protected]

Date of release: 5 March 2009

Document identifier: HEF4104B_4

Please be aware that important not ices concerning this document and the product(s)described herein, have been included in section ‘Legal information’.

18. Contents

1 General description . . . . . . . . . . . . . . . . . . . . . . 1

2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

4 Ordering information. . . . . . . . . . . . . . . . . . . . . 2

5 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2

6 Pinning information. . . . . . . . . . . . . . . . . . . . . . 3

6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3

7 Functional description . . . . . . . . . . . . . . . . . . . 3

8 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4

9 Recommended operating conditions. . . . . . . . 4

10 Static characteristics. . . . . . . . . . . . . . . . . . . . . 4

11 Dynamic characteristics . . . . . . . . . . . . . . . . . . 6

12 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

13 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 10

14 Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 12

15 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 12

16 Legal information. . . . . . . . . . . . . . . . . . . . . . . 13

16.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 13

16.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

16.3 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

16.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 13

17 Contact information. . . . . . . . . . . . . . . . . . . . . 13

18 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14