highspeed aus dem bereich oszilloskope...•typically >2 gb/s data rate with embedded clock ......
TRANSCRIPT
Markus Stocklas
Digital Vertrieb
Agilent Technologies Böblingen
HighSpeed aus dem Bereich Oszilloskope &
Digitaltechnik
Agilent Oscilloscopes - Industry’s Largest Portfolio
Economy 20MHz – 200MHz
U1600A Series
Handheld
U2700 Series
USB
InfiniiVision 70MHz – 1GHz
7000 Series
3000X Series 6000/6000L Series
Infiniium 600MHz – 80GHz
DCA-X Series
90000 Series
9000 Series
90000 Q-Series
September 1, 2010
Fastest Growing Scope Company
2000X Series
New
New
New
90000 X-Series
Probe amps InfiniiMax III probe
amps – 16 GHz, 20
GHz, 25 GHz, 30 GHz
InfiniiMax III Series Probing System
Precision BNC 50 ohm
adapter
Sampling scope
Adapter
Hi impedance probe
adapter Probe adapters
InfiniiMax III
ZIF (zero
insertion force)
probe head
28 GHz InfiniiMax III
ZIF probe tips
2.92mm /3.5mm/SMA
Probe adapter
28 GHz
Performance verification
& Deskew fixture
Solder-in
Probe head
16 GHz
Probe heads
Browser
30 GHz
• 4 models
• 16 GHz - 30 GHz
• Bandwidth
upgradeable
The 90000 Q-Series Overview Orderable: February 1st / Public Intro April 11th
DSO/DSA 92004Q 92504Q 93304Q 95004Q 95004Q
2 Channel BW 20 GHz 25 GHz 33 GHz 50 GHz 63 GHz
4 Channel BW 20 GHz 25 GHz 33 GHz 33 GHz 33 GHz
Sample Rate (2/4 ch) 80 / 80 GS 160 / 80 GS
Memory Depth
(Std/Max)
20 Mpts DSO / 50 Mpts DSA to 2 Gpts Max Memory
Depth
Noise at 50 mV/div 0.375% 0.435% 0.502% 1.185% >1.185%
Jitter Measurement
Floor
75 fS
Maximum Probing BW 30 GHz
PrecisionProbe
Enabled
Yes to 63 GHz
The Q-Series
Upgradable from 20 GHz to 63 GHz in the
following step:
20 to 25 GHz
25 to 33 GHz
33 to 50 GHz
50 to 63 GHz
The 90000 X to Q Series
Upgradable at two bandwidth points:
20 to 20 GHz
33 to 33 GHz
Upgradeability
InP Benefits
• Captive
process
• High-speed &
high-voltage
• Flat response
• Extensible
InP
Chipset
Trigger IC
ADC Amp
Input Preamp
Sampling DeMux
Probe Amp
Calibration IC
IC Process Performance
Indium Phosphide
Chips
Technology Leveraged from the 90000 X-Series Orderable: February 1st / Public Intro April 11th
Quick Film 3D Packaging
• Custom Agilent
technology
• Exceptional signal
integrity
• Substrate keeps chipset
cool and reliable
InP
Chipset
Trigger IC
ADC Amp
Input Preamp
Sampling DeMux
Probe Amp
Calibration IC
IC Packaging
Technology Leveraged from the 90000 X-Series Orderable: February 1st / Public Intro April 11th
The World’s Fastest
Most Accurate
Oscilloscope
Differentiating Technology…
• Exclusive 33 GHz InP preamplifier
• Packaged for highest signal integrity
• Pipelined A/D architecture
Enables Differentiating Performance…
• True-analog bandwidth to 63 GHz
• Industry leading low-noise & jitter
• Industry’s only 30 GHz probing system
In The World’s Fastest and Most Accurate Scope
InP
Chipset
Trigger IC
ADC Amp
Input Preamp
Sampling DeMux
Probe Amp
Calibration IC
Technology Leveraged from the 90000 X-Series Orderable: February 1st / Public Intro April 11th
5.1 ps rise time (20/80)
60 GHz sine wave
First Demonstrated Measurements at > 60 GHz Orderable: February 1st / Public Intro April 11th
Challenges In Digital Design Today
2.5 Gb/s
5 Gb/s
8 Gb/s
2003 2008
2006 2011
2009 2014
PCI Express
10
HIT 2011 Agilent Restricted
March 2011
Higher Data Rates Are Causing Signal
Integrity (SI) Problems: Signal Integrity = Where the electrical properties of the
interconnects can cause significant distortions in digital signals.
• >1 GHz of bandwidth
• <1 ns risetime
• Typically >2 Gb/s data rate with embedded clock
Signal Integrity = Paying attention to RF effects, ie. Impedance
FPGAs Are Commonplace
Standards Evolve Every 2-3 Years:
Page 11
• ‘Jitter ‘ is another word for shaky, quiver,
tremulous… speaks of degree of instability
of location.
• In the Digital Design world, jitter has been
defined as:
The short term phase variation of the
significant instants of a digital signal from
their ideal positions in time.
What is Jitter?
What is an Eye Diagram?
Page 12
How Do Real Time Scopes Measure Jitter on Data?
Jitter
Trend
NRZ
Serial
Data
Recovered
Clock
Jitter
Spectrum
Units in Time
Units in Time
Jitter
Histogram
Page 13
How Do Real Time Scopes Measure Jitter on Data?
Jitter
Trend
NRZ
Serial
Data
Recovered
Clock
Jitter
Spectrum
Units in Time
Units in Time
Jitter
Histogram
Page 14
Where Does Jitter Come From?
Transmitter Receiver
•Thermal Noise (RJ)
•DutyCycle Distortion (DCD)
•Power Supply Noise (RJ, PJ)
•On chip coupling (PJ)
•Lossy interconnect (ISI)
•Impedance mismatches (ISI)
•Crosstalk (PJ)
•Termination Errors (ISI)
•Thermal Noise (RJ)
•DutyCycle Distortion (DCD)
•Power Supply Noise (RJ, PJ)
•On chip coupling (PJ)
Media
Page 15
Single
transition
The EYE Diagram Unit Interval
Overlaid
transitions
Ideal Sampling Point
x = 0
Eye Crossing
Points
x = Tx = 1/2 T
Left Edge Right EdgeNominal
Sampling Point
E1
E0
Oscilloscope Eye
Probability Density Function
The Eye Diagram and Sampling Point
Total Jitter, JPP
Page 16
What is the Eye Diagram?
1 0 0
0 0 1
0 1 0
0 1 1
0 0 0
1 0 1
1 1 0
1 1 1
Superimposed Bit Sequences
Eye Diagrams
ADVA Training 86100C DCA-J Basics
Page 17
Why Do We Care About Jitter?
A low “Signal to Noise Ratio” causes
errors
– Voltage Noise vertical
fluctuations across the sampling
point
– Undesirable Amplitude Modulation
• Jitter describes the same effect but
horizontally – timing noise
– Jitter horizontal fluctuations
across the sampling point
– Undesirable Phase Modulation
• The only reason we analyze jitter is to Limit the Bit Error Ratio!
Page 18
You can’t know unless you measure the Total
Jitter or measure the jitter components!
Which Eye Has Worse Jitter?
A B
Deterministic
Jitter (DJ)
Random
Jitter (RJ)
Inter-symbol
Interference (ISI)
Duty Cycle
Distortion (DCD)
Signal jitter can be composed of several types from several mechanisms
Periodic
Jitter PJ
Data-Correlated Data-Uncorrelated
Total
Jitter (TJ)
jB(t) jUB(t)
jB(t)=A sin(2pft) jB(t)= d
jUB(t)= Gaussian
jB(t)=f(BW, data)
jB(t)
Decomposing Jitter
Agilent
Fixture De-embedding & Equalization
Source of Measurement Inaccuracies
•impedance mismatches
•probing effects
•smaller geometries
•test cables and adapters
•fixturing
•device packaging, etc.
•SCOPE NOISE FLOOR!
There are multiple ways to offset these measurement impairments.
calibration methods
mathematical signal processing
de-embedding/embedding techniques
Scope noise can be amplified
by de-embedding techniques
PHY PHY
De-embedding – Loss Compensation or
Gain Function (De-convolve)
Tx Rx
Con
ne
cto
r
Con
ne
cto
r
Channel
• Compensate for Probing and Fixture
Loss – Add Margin to Transmitter
Characterization
• PCI Express , SATA, and Custom
• Compliance Requirement for Gen 2, 3 S4P
PHY PHY
Embedding – Loss Function
(Convolve)
Tx Rx
Con
ne
cto
r
Con
ne
cto
r
Channel
Virtual Probe and De-
emphasis/Equalization
• Simulate Channel Loss on
Signal Measured at Tx
• Simulate Equalization/De-
emphasis at Rx
Virtual Probe
Tx
Signal
Rx
Equalization
TP1
TP2
TP3
TP2 TP3
Connector Pin Rx
TP1
Channel.s4p+
conn.s4p+package.s4p
Waveform Transformation
Waveform Transformation maps an acquired waveform to
another waveform mathematically using a transfer function
model of the customer’s system.
The system may be real using actual customer components or
may be virtual. Components may be described using RLC or
S-Parameters. M
Connector Fixture Cable
Digital Source
Cable
Model
Look Here Look Here Look Here
And Look Here!
Product Briefing for N5465A
InfiniiSim Waveform Transformation Toolset enables our
customers to define the measurement environment to obtain
the best measurement possible.
Listen for these words:
- ‘De-Embedding’
- ‘Fixture Removal’
- ‘Cable Insertion’
- ‘Virtual Probing’
- ‘Probe Loading
compensation’ Measure anywhere!
<Product> Position versus other Agilent Products
<Visual of where <product> is positioned in product family>
Probe at BGA
Probe at VIA
De-embed Probe
RT BGA = 390 ps
RT VIA = 183 ps
RT De-embed = 175 ps
Serial Data Equalization Software for
Infiniium Series Oscilloscopes
DFE
CTLE
FFE
automatic tap optimization
Up to 40 Tabs
Transmitter De-emphasis
De-emphasis on, measured at receiver
De-emphasis off, measured at receiver
De-emphasis on, measured at transmitter
• We can account for loss through
the channel at the transmitter with
transmitter de-emphasis.
• De-emphasis is also called pre-
emphasis.
• The amount of de-emphasis may
be programmable.
Key measure is eye quality
Unequalized 1Gb/s Unequalized 3Gb/s
Unequalized 8Gb/s Unequalized 5Gb/s
e(t) is the equalized waveform at time t
r(t-nTD) is the input waveform n tap delays
before the present time
Cn is the nth coefficient (tap)
TD is the tap delay
Each voltage level is multiplied by its corresponding tap value
and then all of these products are summed together to give
the new equalized voltage for the location of interest
Feed-Forward Equalization
Decision Feedback Equalization
V(k) is the correction voltage added to the decision threshold used
when determining the logic value of bit k.
r(t) is the un-
equalized analog
waveform voltage
at time t
s(k – n) is the logic value (either upper
target or lower target) for the bit n tap
delays prior to the current bit
Cn is the nth
coefficient (tap)
Each previous bit used in the algorithm is determined to be either
high or low and is then multiplied by its corresponding tap value.
These voltage/tap products are summed to determine how much
to shift the waveform relative to the logical decision threshold.
Differentiation between FFE & DFE
• Uses voltage levels of the
received waveform associated
with previous and current bits
to correct the voltage level of
the current bit
• 2x taps can open up the eye
dramatically
• Makes logical decisions (zero
or one) and then feeds that
information back to help
determinie whether the current
bit is a 1 or 0.
• The only location of the eye
that a receiver sees is at the
clock (center of the eye).
N5461A SDE software: Equalization for 5Gb/s
Unequalized(5Gb/s): upper left
FFE: lower middle
• 2 taps
• Eye width of 1/3
DFE: lower right
• 3 taps
• Eye width of 0
FFE DFE
Equalizer Setup Window for FFE and DFE settings
Precision Probe Characterize and correct for cable, switch, and test fixture loss using only an oscilloscope
The Importance of a Flat Frequency Response
Why do we care about a flat
frequency response?
- The flatter the response the
more accurately the scope will
depict the signal
- Measurements become more
repeatable
Frequency response of the Agilent 90000 X-
Series
Cables and channels are lossy
Response of cable rated to 20 GHz
Notice that the 3dB down
point is actually at 18 GHz
instead of 20 GHz
Bandwidth roll-off means
attenuated signal at high
bandwidth
Frequency response is not
flat
Every input path in a switch can vary
A real life example:
112 different inputs, every
one with slightly different
loss, phase, and response
characteristics
Measurements can from
channel to channel
Technologies continue to
push us to use more inputs
(for example: PCIE gen3
now has 16 inputs)
How much actual bandwidth does this system have?
Customer thought: 12 GHz BW
Actual: 4.5 GHz BW
Every input path in a switch can vary
A real life example:
112 different inputs, every
one with slightly different
loss, phase, and response
characteristics
Measurements can from
channel to channel
Technologies continue to
push us to use more inputs
(for example: PCIE gen3
now has 16 inputs)
Why is this an issue?
Inaccurate, non-repeatable measurements
Solution?
The solution is to:
1. Understand what the characteristic of the system is, and
2. Compensate for this system variation
Traditional De-embedding Takes Time
Option 1: Six steps (you would need to do the following)
As a result, we tend to choose to ignore the
cable loss and channel variation entirely
Find a VNA
Find someone that knows
how to use a VNA and
measure the cable
Create s-
parameter file
Save s-parameter file to
thumbdrive and load on
scope
Learn waveform
transformation software
and correctly remove
loss Analyze the data
How it works
Agilent’s 90000 X-
Series uses its
world class 200
GHz Indium
Phosphide
technology to
provide a <15ps
edge to the
oscilloscope
Calibration edge is
then measured by
the 90000 X-Series
Lo
ssy c
ab
le is
the
n
me
asu
red
aga
inst th
e
“fast e
dge
”
Fast edge or
Baseline
Edge with
lossy cable
Comparing the
baseline measurement
with the cables
influence, proper
characterization is
done and corrections
can be made
Infiniium’s custom InP
calibration edge
PrecisionProbe: 3 Easy Steps
1. Measure baseline
2. Measure loss due to cable
3. Save File
Cables: The result
Response of cable
with no correction
Corrected cable response
Applied corrected filter
Cable correction results
Before
PrecisionProbe
After
PrecisionProbe
S21 cable loss is removed
through compensation
Rise Time improves from 67 ps to
21 ps!
Jitter results
Before PrecisionProbe
After PrecisionProbe
S21 cable loss is removed through
compensation
Notice how there is 50% less ISI on the
corrected waveform, resulting in less Total
Jitter
The real time eye
Results: More margins!
20% less jitter
33% more eye height
Slightly wider eye
Cabled Environment Benefits
By characterizing and
compensating for cable
loss increased margins.
Higher accuracy
Faster than traditional
VNA/de-embedding method
Probe characteristics are different from probe to
probe
1. InfiniiMax II browser will have
a different voltage transfer
function than in InfiniiMax III
with a browser
2. Two InfiniiMax II’s with a
browser could be different
3. Even changing the span on a
browser can change the
voltage transfer function of a
probe
Measuring the Probe
1. Measure baseline
2. Measure loss due to probe
3. Save File
No probe
Probe
Improve your measurement quality
Probe characterization: final results
Transfer function of probe
with no correction
1. Transfer function is now flat for the entire bandwdith of the probe
2. 6dB of loss is now compensated
Summary:
1. Cables, probes, fixtures, switches
are lossy and cause
measurement errors
2. Traditional de-embedding
technology is time-consuming
and equipment intensive.
3. Precision Probe make de-
embedded incredibly simply.
Uncorrected
Corrected
PrecisionProbe will further
increase your margins without
adding significant time or extra
equipment
Protocol Decode on the Infiniium Series USB 2.0 Example
53
The competition has no
equivalent for any of these
Agilent protocol features.
Payload view Header view
With formatted
frame content
Search by
packet type
Jump to
next search
Multi-tab protocol
viewer, time aligned
with analog
Agilent Decode Ease-of-Use Advantage
This button automatically sets up the
scope parameters for your specific
decode. With this Auto Setup button, you
can be decoding data in less than a
minute.
If you want to see what values were set
during the Auto Setup process or if you
want to change certain parameters, use
this Manual Setup button.
Setup multiple decodes simultaneously
and quickly switch back and forth between
them in the Decode Listing window.
Infiniium Protocol Analysis
Timecorrelated
Protocol detailled level
Search and capture
Multi Serial Bus
Colorcoded representation
Available for ALL (most) serial protocolls:
Supports both MSO Digital and Analog Channels I2C + SPI Example
Using MSO
channels for
protocol decode
Using analog
channels for
protocol decode
View decode in waveform area, or.......
Simultaneous decode of up to 4 Serial Buses
• Protocol trigger/decode sources can come from any of the following:
– 4 analog channels +16 digital + 4 functions + 4 waveform memories
• Anticipated usage primarily for protocols with explicit clocks such as I2C, SPI,
CAN, LIN, MIPI, USB 2.0, RS-232/UART...
InfiniScan – the real nice way to trigger !!
Apply up to 8 Zone to trigger the signal individually
Trigger on Measurement parameters
Find and trigger non-monotic Edges
Serial Pattern Trigger
InfiniScan – the real nice way to trigger !!
• Vinyl record
• Videotape
• Photo Camera
• Cellphone
• CD
• DVD, Blue Ray
• Digital Camera
• Digital Cellphone
1 1 1 1 0 0
1. Analog continues to go digital
2. More integration at lower cost
3. Higher speed and lower power
4. High reliability delivered in less time
Market Trends
Ecosystem
Agilent Digital Test Standards Program
We’re active in standards meetings, workshops, plugfests, and seminars
Our solutions are driven and supported by Agilent experts involved in
international standards committees:
• Joint Electronic Devices Engineering Council (JEDEC)
• PCI Special Interest Group (PCI-SIG®)
• Video Electronics Standards Association (VESA)
• Serial ATA International Organization (SATA-IO)
• USB-Implementers Forum (USB-IF)
• Mobile Industry Processor Interface (MIPI) Alliance
• Optical Internetworking Forum (OIF)
Our customers test with highest confidence and achieve compliance faster
Jim Choate
USB-IF Compliance Committee
USB 3.0 Electrical Test Spec WG
Rick Eads
PCI-Sig Board
Member
Brian Fetz
DisplayPort Phy CTS Editor
VESA Board Member
Min-Jie Chong
SATA/SAS PHY Contributor
MIPI-PHY WG Contributor
The Agilent Pyramid team maintains engagement in the top high tech
standards organizations
Page 64
SATA / SAS Test Challenges
Agilent Restricted
We understand your future requirements, because we help
shape them
Roland Scherzinger
MIPI Contributor
A Digital system: Serial Data Link
Die Bonding
wire/pins
PC
transmission
line
Standard
connector
PC
transmission
line Cable
Standard
connector
Bonding
wire/pins Die
Life Cycle of a Transported bit…
Starts in here… …and ends in here
March 2011 Page 65
HIT 2011 Agilent Restricted
Bit Error Ratio Testers (BERTs) 86100D Infiniium DCA-X
More Info
A range of essential tools—measurement and
simulation—that will help you cut through the
challenges of gigabit digital designs.
HIT 2011 Agilent Restricted
ADS
EMPro, and
SystemVue
Infiniium 90000 X-Series
ENA-TDR
N1930B Physical Layer
Test System (PLTS)
16900 Series Logic Analyzers
Pulse Pattern Generator
66
www.Agilent.com/find/hsd
Blog: http://Signal-Integrity.TM.Agilent.com
March 2011
-or- -or-
SuperSpeed Communication – Physical Layer Focus
Super
Speed
Non-
Super
Speed
Super
Speed
Non-
Super
Speed
TX
TX
RX
RX
TX
RX
TX RX RX TX
Point to point communication, concurrent data flow
Low power mode
Link training
Independent clock domains – both using Spread Spectrum Clocking (SSC)
Transmitter (TX)
• De-emphasis
• 8B/10B coding
• Data scrambling
• Insertion of Skip
Cable / Channel
• Backward compatible
• EMI requirements
• Signal integrity requirements
Receiver (RX)
• Channel equalization
• Clock recovery
• Re-timing
(deletion or insertion of
addition Skips)
How to handle USB 3.0 physical
layer test requirements
October 28, 2009
-or-
Super
Speed
Non-
Super
Speed
RX
TX
TX
RX
-or-
Super
Speed
Non-
Super
Speed
TX
RX
TX
RX
Physical Layer Test Solutions
Trans-
mitter
(TX)
Receiver
(RX) Channel / Cable
• Agilent 90000 series Infiniium
Oscilloscopes
• Agilent U7243A USB 3.0
Transmitter Compliance Test
Software
• Agilent E5071C Network
Analyzer
• 86100C DCA-J TDR
All physical layer tests: test
adapter
• Agilent U7242A USB 3.0 Test
Fixture
How to handle USB 3.0 physical
layer test requirements
October 28, 2009
• Agilent J-BERT N4903B
with
N4916A/B
De-emphasis
Signal
Converter
• Agilent 81250A
ParBERT
• N5990A Automated
Compliance and
Characterization Test
Software
Transmitter Compliance Testing:
Compliance will be measured at the end of the “compliance channel”
SMA termination for TX signals, phase matched SMA cable
Terminate link under test with high speed oscilloscope
Measure transmitted waveform with high speed oscilloscope
Use compliance pattern
1M UI of data
Compute:
eye diagram,
Rj, Dj, Tj@10^-12 BER,
average data rate,
rise/fall time,
Test requirement for SSC Slew Rate
Page 69
USB 3.0 Technical Review
. 2009
SuperSpeed Measurement Requirements
Page 70
USB 3.0 Technical Review
. 2009
Transmitter test requirements
Page 71
USB 3.0 Technical Review
. 2009
Compliance Channels
•Compliance Channels are being developed to test
SQ for worst case channel conditions
•Back panel USB route solution
•Channel loss will dominate
•Front Panel USB route solution
•Reflections will dominate losses
Front Panel
Back Panel
Page 72
USB 3.0 Technical Review
. 2009
USB 3.0 Test fixture
Support for Tx and Rx Testing
– SMA edge launch terminations
– SS A and SS B for host, device or cross hub testing
– USB 3.0 Test Fixtures (available now) – Early Customer Needs and Development
72
Page 73
USB 3.0 Technical Review
. 2009
Normative Transmitter Compliance Test
Setup
DSO 90K
Scope
TP0
Scope SMA
SMA
Scope
Page 74
USB 3.0 Technical Review
. 2009
Page 75
USB 3.0 Technical Review
. 2009
-0.35
Summary report of testing with Statistics
Page 76
USB 3.0 Technical Review
. 2009
TX Compliance Test
With USB Org Test Tool
Agilent TX Compliance and Validation
Solution Report Summary
USB 3.0 Protocol Decode: on scope
Page 77
Eliminate All Doubt:
5Gb/s Test Signal Example
TP
1 Channe
l
50Ω
50Ω
N4915A-005
Switch
trigger
+
- RX
+
- TX
SS
Tes
t Ada
pter
1
4
3
No SSC, Sj / Rj shown on screen shots
2
How to handle USB 3.0 physical
layer test requirements
October 28, 2009
Typical SuperSpeed Link Turn-on Sequence
Power-up
Complianc
e
Rx.
Detect.
Reset
Rx.
Detect.
Active
Rx.
Detect.
Reset
Rx.
Detect.
Active
Polling.
LFPS
Polling.
RxEQ
Polling.
Active
Polling.
Config-
uration
Polling.
Idle
Polling.
LFPS
Polling.
RxEQ
Polling.
Active
Polling.
Config-
uration
Polling.
Idle
Loopback
Loopback
Power-up
warm
reset
warm reset
de-assert
termination
detected
LFPS
handshake
TSEQ
transmitted
TS1
received
TS2
received if directed
multiple states
Host
Device
How to handle USB 3.0 physical
layer test requirements
October 28, 2009
LTSSM states:
Characteristical Eye Closure by Sinusoidal Jitter
BER Scan
Eye Diagram
How to handle USB 3.0 physical
layer test requirements
October 28, 2009
skp skp
s k p skp
s k p s k p
skp skp
skp skp
skp skp
skp skp skp skp
Why is Spread Spectrum Clocking Included in
Receiver Compliance Test? SSC stresses clock recovery and elastic buffer, required for compliance test
Max. SSC deviation is 5000ppm, modulation rate between 30kHz and 33kHz
Nominal data rate: 5Gb/s
Frequency downspread:
5000ppm i.e. 4.975Gb/s
Receiver (RX) elastic buffer
compensates for clock difference
Data with SSC at receiver (RX) pins
-or-
Non-SS
TX
RX SuperSpeed
TX
loop-
back
RX
error
count
read
Original un-modulated data at 5Gb/s
1 1 2
2
Receiver FF
CR
EQ
How to handle USB 3.0 physical
layer test requirements
October 28, 2009
Characteristical Eye Closure by Random Jitter
BER Scan
Eye Diagram
unbounded Rj
bounded Rj
How to handle USB 3.0 physical
layer test requirements
October 28, 2009
Hands-on in der Ausstellung
Herzlichen Dank für Ihr Interesse
Page 84
USB 3.0 Technical Review
. 2009
Thank you for Attending
Questions?