history of combinatorial testing

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HISTORY OF SOFTWARE TESTING HISTORY OF SOFTWARE TESTING (C) K. Tatsumi 2012 History of Combinatorial Testing History of Combinatorial Testing (1957: Decision table) 1967: Equivalence partitioning, Boundary value analysis 1970: Cause Effect Graph [Elmendorf] (1983 )1984: Orthogonal array / Combination Table [Satoh, Shimokawa] 1987: Test Case Design Su pport System [Tatsumi] (198x )1992: OATS [Brownlie, Prowse, Ph adke] (1990 )1994: C ATS [Sherwood] (1992 )1994: AE TG [Cohen, et. al] 1998: IP O [Lei, Ta i] 2000: Covering a rrays [Williams] 2000: CTE XL [Daimler Chrystler] (2000 )2004: PI CT [Microsoft] 2007: FireEye 2009: ACTS (IPOG) [Le i, Kuhn] AT&T, Bellcore 1988: Category-partition method [Ostrand, Balcer] 1993: Classification-tree method [Grochtmann, Grimm] (1976: Test Factor An alysis Method) [Fujitsu] (199x )2004: Orthogonal A rray (HAYST method) [Akiyama(Fuji Xerox)] 1980 1990 2000 2010 1950 1960 1970 ‘85 ‘95 ‘05 Combinatorial techniques Input condition analysis techniques (1983 )1985: Orthogonal Latin Squares [R. Mandl] Fujitsu

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History of Combinatorial Testing. ‘95. ‘05. 1950. 1960. 1970. 1980. ‘85. 1990. 2000. 2010. (1983~)1985: Orthogonal Latin Squares [R. Mandl]. 1993: Classification-tree method [ Grochtmann, Grimm ]. (1983 ~ )1984: Orthogonal array / Combination Table - PowerPoint PPT Presentation

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Page 1: History of Combinatorial Testing

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History of Combinatorial TestingHistory of Combinatorial Testing

(1957: Decision table)

~ 1967: Equivalence partitioning, Boundary value

analysis

1970: Cause Effect Graph[Elmendorf]

(1983 ~ )1984: Orthogonal array / Combination Table

[Satoh, Shimokawa]

1987: Test Case Design Support System [Tatsumi]

(198x ~ )1992: OATS[Brownlie, Prowse, Phadke]

(1990 ~ )1994: CATS

[Sherwood]

(1992 ~ )1994: AETG[Cohen, et. al]

1998: IPO[Lei, Tai]

2000: Covering arrays[Williams]

2000: CTE XL[Daimler

Chrystler]

(2000 ~ )2004: PICT[Microsoft]

2007: FireEye 2009:ACTS (IPOG) [Lei, Kuhn]

AT&T, Bellcore

1988: Category-partition method

[Ostrand, Balcer]

1993: Classification-tree method

[Grochtmann, Grimm]

(1976: Test Factor Analysis Method) [Fujitsu]

(199x ~ )2004: Orthogonal Array (HAYST method)

[Akiyama(Fuji Xerox)]

1980 1990 2000 20101950 1960 1970 ‘85 ‘95 ‘05

Combinatorial techniques

Input condition analysis

techniques

(1983 ~ )1985: Orthogonal Latin Squares

[R. Mandl]

Fujitsu