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1 Memory All data sheets are subject to change without notice (631) 567-5600 - Fax: (631) 567-7358 - www.maxwell.com Nuclear Event Detector HSN-2000 ©2005 DDC All rights reserved. 01.07.05 Rev 3 FEATURES: Detects ionizing radiation pulses Tested/certified detection threshold level Adjustable circumvention period 100% testable with built-in test Detection threshold adjustability Single +5V operation Designed-in radiation hardness Compliant to MIL-PRF-38534 Class H 1 Flat pack (F) or DIP (L) packages RADIATION HARDNESS CHARACTERISTICS Dose Rate (operate-through): 1 x 10 12 rad(Si)/sec Total Dose: 1 x 10 6 rad(Si) Neutron Fluence: 5 x 10 13 n/cm 2 Approximate Detection Range: 2 x 10 5 - 2 x 10 7 rad(Si)/sec DDC Specified, Controlled, and Tested DESCRIPTION: DDC's HSN-2000 radiation-hardened Hybrid Nuclear Event Detector (NED) senses ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its output from the normal high state to a low state with a propagation delay time of less than 20 ns. The active low Nuclear Event Detection signal (NED ) is used to initiate a wide variety of circumvention functions, thus prevent- ing upset and burnout of electronic components. The NED output is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps. The HSN-2000 is designed to operate through three critical envi- ronments: ionizing dose rate [10 12 rad(Si)/s], gamma total dose [10 6 rad(Si)], and neutron fluence [5 x 10 13 n/cm 2 ]. In addition, the device is designed to function throughout the transient neutron pulse. The hybrid’s discrete design ensures a controlled response in these radiation environments as well as immunity to latchup. The detection level and functionality of a sample of each HSN- 2000 production lot are tested in an ionizing dose rate environ- ment. A certificate is provided reporting the test results for the production lot. The detection threshold of the HSN-2000 is adjustable within the range of 2 x 10 5 rad(Si)/s to 2 x 10 7 rad(Si)/s. This detection level can be preset by DDC or adjusted by the user. Less than a 30% variation in detection threshold can be expected over the entire operating temperature range. 1. Manufactured for DDC by Teledyne Microelectronic Technologies to MIL-PRF-38534, Class H, no RHA Logic Diagram Detector (Pin Diode) Amplifier Pulse Timer LED Logic Latch 12 4 5 7 6 8 9 14 1 2 13 11 V H V L Threshold Adjust V B BIT GND C RC Flag Reset Flag Reset NEF NED 10 k 10 k

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1

Mem

ory

All data sheets are subject to change without notice

(631) 567-5600 - Fax: (631) 567-7358 - www.maxwell.com

Nuclear Event DetectorHSN-2000

©2005 DDCAll rights reserved.

01.07.05 Rev 3

FEATURES:• Detects ionizing radiation pulses• Tested/certified detection threshold level• Adjustable circumvention period• 100% testable with built-in test• Detection threshold adjustability• Single +5V operation• Designed-in radiation hardness• Compliant to MIL-PRF-38534 Class H1

• Flat pack (F) or DIP (L) packages

RADIATION HARDNESS CHARACTERISTICS

• Dose Rate (operate-through): 1 x 1012 rad(Si)/sec• Total Dose: 1 x 106 rad(Si)• Neutron Fluence: 5 x 1013 n/cm2

• Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec• DDC Specified, Controlled, and Tested

DESCRIPTION:DDC's HSN-2000 radiation-hardened HybridNuclear Event Detector (NED) senses ionizing radiation pulsesgenerated by a nuclear event, such as the detonation of a nuclearweapon, and rapidly switches its output from the normal highstate to a low state with a propagation delay time of less than 20ns. The active low Nuclear Event Detection signal (NED) is usedto initiate a wide variety of circumvention functions, thus prevent-ing upset and burnout of electronic components. The NED outputis also used to initiate both hardware and software recovery. Thishigh-speed, 14-pin hybrid detector is used in electronic systemsas a general-purpose circumvention device to protect memory,stop data processing, and drive power supply switches as well assignal clamps.

The HSN-2000 is designed to operate through three critical envi-ronments: ionizing dose rate [1012 rad(Si)/s], gamma total dose[106 rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, thedevice is designed to function throughout the transient neutronpulse. The hybrid’s discrete design ensures a controlled responsein these radiation environments as well as immunity to latchup.The detection level and functionality of a sample of each HSN-2000 production lot are tested in an ionizing dose rate environ-ment. A certificate is provided reporting the test results for theproduction lot.

The detection threshold of the HSN-2000 is adjustable within therange of 2 x 105 rad(Si)/s to 2 x 107 rad(Si)/s. This detection levelcan be preset by DDC or adjusted by the user. Less than a30% variation in detection threshold can be expected over theentire operating temperature range.

1. Manufactured for DDC by Teledyne Microelectronic Technologies to MIL-PRF-38534, Class H, no RHA

Logic Diagram

Detector(Pin Diode)

Amplifier Pulse Timer

LED

LogicLatch

12457

6

8 9 14 1

2

13

11

VH VLThresholdAdjust

VB

BIT

GND C RC FlagReset

FlagReset

NEF

NED10 kΩ

10 kΩ

Mem

ory

2All data sheets are subject to change without notice

©2005 DDCAll rights reserved.

Nuclear Event Detector HSN-2000

01.07.05 Rev 3

TABLE 1. PIN DESCRIPTION

PIN NUMBER PIN FUNCTION

1 Load Voltage, VL

2 Nuclear Event Detector, NED

3 No Connection

4 External Capacitor

5 External Capacitor

6 Built In Test, BIT

7 Package Ground and Case

8 PIN Diode Bias, VB

9 Threshold Adjust

10 No Connection

11 No Connection

12 No Connection

13 No Connection

14 Hardened Supply Voltage, VH

TABLE 2. ELECTRICAL CHARACTERISTICS

PARAMETER SYMBOL CONDITIONS -55°C < TA < 125°C

MIN MAX UNIT GROUP A SUBGROUP

Hardened Supply Voltage VH 4.5 5.5 V 1,2,3

Hardened Supply Current- Standby 1

- Operational 2

IH VH = 5.5V----

--30

120

mA 1,2,3

Load Voltage VL -- 20 V 1,2,3

Load Current- Standby 1

- Operational 2

IL VL = 20V----

1002.25

µ AmA

1,2,3

PIN Diode Bias Voltage - Standby 1 VB 4.5 20 V 1,2,3

PIN Diode Bias Current - Standby 1 IB -- 100 µ A 1,2,3

Built-In-Test (BIT) 3,4 VIHIIHVILIILtPW

VIH = 4.0V

VIL = 0.5VPin 9 Open, VIH = 4.0V

4.0------10

5.5250.510--

VmAV

µ Aµ s

7,81,2,37,8

1,2,39,10,11

NED VOHVOL

VL = 20V, IOH = -100 µ AIOL = 10 mA

IOL = 100 mA

18.5----

--0.61.0

V 1,2,31,2,3

Radiation Propagation Delay Time 5 tD -- 20 ns

Mem

ory

3All data sheets are subject to change without notice

©2005 DDCAll rights reserved.

Nuclear Event Detector HSN-2000

01.07.05 Rev 3

MECHANICAL DIMENSIONS

Note: All dimensions in inches.

1. Standby mode is the normal state of the device, defined as having the NED output (pin 2) in the “high” state.

2. Operational mode is in effect during the timeout period of the NED signal, characterized by having the NED output in the “low” state, causing the greatest current draw of the device.

3. BIT electrical characteristics are not guaranteed over the radiation range.

4. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it is advised that a series resistor/capacitor combination is used.

5. Guaranteed but not tested over temperature. Time delay, tD, is measured at 50% points from the rising edge of the radiation pulse to the falling edge of the NED output at approximately 10 times the detection level.

0.6000.015 ± 0.003

0.100TYP

0.500MIN

0.495

0.795

0.145 MAX

0.070 ± 0.002

0.010 ± 0.002

14 13 12 11 10 9 8

1 2 3 4 5 6 7

14 13 12 11 10 9 8

1 2 3 4 5 6 7

0.7950.600

0.100 TYP

0.4950.300

0.145 MAX

0.200

0.0160.020

DIA

TOP VIEW

Flatpack Hybrid PackageHSN-500F

DIP Hybrid PackageHSN-500L

All tolerances are ± 0.005 unless specified

Table 2. Notes

Mem

ory

4All data sheets are subject to change without notice

©2005 DDCAll rights reserved.

Nuclear Event Detector HSN-2000

01.07.05 Rev 3

Important Notice:

The specifications presented within these data sheets represent the latest and most accurate information available todate. However, these specifications are subject to change without notice and DDC assumes noresponsibility for the use of this information.

DDC's products are not authorized for use as critical components in life support devices or systemswithout express written approval from DDC.

Any claim against DDC must be made within 90 days from the date of shipment from DDC. DDC’S liability shall be limited to replacement of defective parts.

Product Ordering Options

Model Number

Feature Option DetailsHSN-2000 X

Package

Base Product Nomenclature

L = Dual In-line Package (DIP)F = Flat Pack

Nuclear Event Detector